The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices.
The A3050 offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.
TM
Low cost New technology High performance
Cogent ATEA3050
applications ✱ Logic ✱ Memory ✱ FPGA ✱ Consumer soc ✱ Microcontrollers ✱ ASIC
summary The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices.
specications
Digital I/O Channels 512 Max, 32Channels/Board
Parallel Test Site 16
Data Rate 50MHz
Clock Rate 100MHz
Timing Generators 6 edge/Pin
Edge Placement Res. 1nS
Pattern Memory Depth 4M
Strobe Mode Edge/Windows
Pin Electronics Driver -2.0V~+7.0V
Rise/Fall 2.8nS/3V
Min Pulse Width 4nS/5V
Pin Electronics Comparator
-2.0V~+11.0V
Utility Relay 64
Format NRZ/RZ/RO/XOR/INVNRZ/INVRZ/INVRO/INVXOR
APG X-GEN16bits, Y-GEN 16bits, D-GEN 16bits
PMU PPMU,BPMU
DPS 16
OPTIONS
DPS Device Power Supply
HDVI High density VI Source
MT Memory Test Option
APMU Analog Pin Measuerment Unit
ADT Converter Test Option
*All specifications subject to change without notice.
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