© Copyright 2003 Nassda Corporation
OpenAccess 2.0 —A Nassda PerspectiveOpenAccess 2.0 —A Nassda Perspective
Graham Bell, Director of Marketing
©Nassda Corporation
Nanometer Verification FlowNanometer Verification Flow
File based flow in dotted arrows
Direct API and shared in-memory data flow in solid arrows
Nassda will partner with customers and vendors for a full-chip nanometer verification flow
File based flow in dotted arrows
Direct API and shared in-memory data flow in solid arrows
Nassda will partner with customers and vendors for a full-chip nanometer verification flow
OpenAccess DB
SchematicEditor
LayoutEditor
DRC / LVS
LayoutParasitic
Extraction
TransistorNetlist
Pre-layout & Post-layoutSimulation & Analysis
Waveforms, Analysis and Reports
DSPF / SPEF
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Parasitic Detailed Model ViewParasitic Detailed Model View
Resistor Gnd Capacitor Coupling
Capacitor Inductor Mutual
Inductor Resistive
Inductor Diode
Resistor Gnd Capacitor Coupling
Capacitor Inductor Mutual
Inductor Resistive
Inductor Diode
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Detailed Parasitic Modeling in OA 2.0Detailed Parasitic Modeling in OA 2.0
Fast creation of objects• 1.5 million parasitics per minute
Fast parasitic search• 2 seconds to build search table for 1 million
parasitics• Immediate search
Efficient database file size• 1 Million objects < 30Mb
Fast creation of objects• 1.5 million parasitics per minute
Fast parasitic search• 2 seconds to build search table for 1 million
parasitics• Immediate search
Efficient database file size• 1 Million objects < 30Mb
©Nassda Corporation
Detailed Parasitic Processing ResultsDetailed Parasitic Processing Results
No. of Devices
(M)Create
(s)Unload
(s)Load (s)
Find (s)
DB File Size (Mb)
0.1 3 0 2 0 2.80.5 18 1 10 1 13.81 39 3 22 2 27.92 87 6 53 6 57.15 306 15 198 25 144.4
©Nassda Corporation
Next StepsNext Steps
Live databases from customers Pre- and post-layout netlist Browsing and debug capabilities Partnering with others to demonstrate a
nanometer verification flow Future: post-layout design optimization
Live databases from customers Pre- and post-layout netlist Browsing and debug capabilities Partnering with others to demonstrate a
nanometer verification flow Future: post-layout design optimization