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XP-746: ELM characterization in NSTX. R. J. Maqueda Nova Photonics Inc. and the NSTX Research Team. ’07 Results Review July 23-24, 2007 PPPL. XP-746: ELM characterization in NSTX. XP Goals. - PowerPoint PPT Presentation
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XP-746: ELM characterization in NSTX
R. J. MaquedaNova Photonics Inc.
and the NSTX Research Team
’07 Results ReviewJuly 23-24, 2007
PPPL
2
XP-746: ELM characterization in NSTX
• ½ run day on June 5th (17 shots: 124659-124675)
• All 3 ELM Types produced and measuredType I: 124659-124664, 124669Type III: 124665-124668Type V: 124670-124675
• Good diagnostic availability:fast-framing camerasUSXR arrays (JHU)static (ORNL/PPPL) and reciprocating (UCSD) probesreflectometers (UCLA)MIRNOV arrays (PPPL)
XP Summary
XP Goals• Measure and characterize evolution of ELMs observed in NSTX: structure of ELM
perturbed edge, birth of filamentary ELM structures, radial and poloidal/toroidal propagation in SOL, increase of edge turbulence and blobs, and recovery of inter-ELM profiles.
• Obtain profiles for ELM stability evaluation.
3
Shot 124675
TYPE I ELMs
Shot 124667TYPE III ELMs
Shot 124664
TYPE V ELMs
Time (s)
Lo
we
r d
ive
rto
r D
(
a.u
.)
GPI viewD2 puff - D filter
Fish-eye viewno filter
Fast-framing cameras show global and local evolution
4
ELM filamentation after ELM onset
ELM sequence• Mode growth.
• Birth of ELM filaments.
• Filament detachment (except in Type V ELMs).
• Filament radial and poloidal/toroidal propagation in SOL – eventual interaction with plasma facing components.
• Turbulent filamentation and blobs, L-mode like.
• Recovery of H-mode edge.
GPI viewno puff - D
filter
TYPE I ELM
5
TYPE III ELMShot 124667
tELM ~ 275.02 msrsep (cm)
D e
mis
sio
n (
a.u
.)
rsep (cm)
Lp
ol
(cm
)
I/I
Ku
rto
ssis
tELM + [200,300] stELM + [300,400] stELM + [400,500] stELM + [500,600] stELM + [600,700] s
ELM filamentation followed by L-mode like turbulence and blobs
Fluctuation levels, auto-correlation lengths and kurtossis similar to L-mode
6
Summary
XP-746 run time shots and diagnostic availabilty provide excellent
opportunity to meet XP goals
...work in progress...
• Characterization of ELM mode structure, evolution into filaments, and
propagation of filaments in SOL.
• Characterization of ELM filaments and associated transport.
• Characterization of post-ELM turbulence (blobs) and related transport.
• Availability of profile data for stability analysis.