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SVS GROUP OF INSTITUTIONS Bheemaram, Warangal IV B.Tech II-SEM II-MID EXAMINATION SUBJECT: VLSI DESIGN Date: / /2015(AN) Branch: ECE (A & B) Max Marks: 10 Time: 60 Min Answer any Two of the following: 2X5=10 1. a) Write a short notes on Context Addressable Memory (CAM) b) Discuss the parameters influencing low power design? 2. Draw the circuit for four transistors SRAM and explain its working? 3. Illustatere the simultaneous minimization of two functions F(a,b,c,d)=m(0,2,7,10)+d(12,15) F(a,b,c,d)=m(2,4,5)+d(6,7,8,10) implement using suitable PAL. 4. Explain about various system level Test techniques. SVS GROUP OF INSTITUTIONS Bheemaram, Warangal IV B.Tech II-Sem II-MID EXAMINATION SUBJECT: VLSI DESIGN Date: / /2015(AN) Branch: ECE (A & B) Max Marks: 10 Time: 60 Min Answer any Two of the following: 2X5=10 . 1. a) Write a short notes on Content Addressable Memory (CAM)

VLSI Qp for IV Ece a and b for Mid 2

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Page 1: VLSI Qp for IV Ece a and b for Mid 2

SVS GROUP OF INSTITUTIONSBheemaram, Warangal

IV B.Tech II-SEM II-MID EXAMINATIONSUBJECT: VLSI DESIGN

Date: / /2015(AN) Branch: ECE (A & B) Max Marks: 10

Time: 60 Min

Answer any Two of the following: 2X5=10

1. a) Write a short notes on Context Addressable Memory (CAM)

b) Discuss the parameters influencing low power design?

2. Draw the circuit for four transistors SRAM and explain its working?

3. Illustatere the simultaneous minimization of two functions

F(a,b,c,d)=∑m(0,2,7,10)+d(12,15)

F(a,b,c,d)=∑m(2,4,5)+d(6,7,8,10) implement using suitable PAL.

4. Explain about various system level Test techniques.

SVS GROUP OF INSTITUTIONSBheemaram, Warangal

IV B.Tech II-Sem II-MID EXAMINATIONSUBJECT: VLSI DESIGN

Date: / /2015(AN) Branch: ECE (A & B) Max Marks: 10

Time: 60 Min

Answer any Two of the following: 2X5=10

.

1. a) Write a short notes on Content Addressable Memory (CAM)

b) Discuss the parameters influencing low power design?

2. Draw the circuit for four transistors SRAM and explain its working?

3. Illustatere the simultaneous minimization of two functions

F(a,b,c,d)=∑m(0,2,7,10)+d(12,15)

F(a,b,c,d)=∑m(2,4,5)+d(6,7,8,10) implement using suitable PAL.

4. Explain about various system level Test techniques.