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Ursula Marquez de Tino
April 2007
Lead Free Wave and SelectiveSoldering Technologies
Vitronics Soltec
Vitronics Soltec
Surface Mount Technology Lab UIC Binghamton, NY
Agenda
Process Optimization for Wave Soldering INEMI Project
Process Optimization for Selective Soldering Elcoteq Project
Major Concerns with Liquid SolderingTechniques Solder contamination Cu dissolution
Process OptimizationWave Soldering
INEMI Project
Acknowledge
Objective
Impact of process parameters andmaterials on solder joint formation Define process window based on flux
amount, preheat temperatures, contacttime, solder temperature, waveconfiguration, and atmosphere
Materials selection: fluxes, alloys,components and board complexity
Solder Joint Yield: characterize by hole fillusing 5 DX
Taguchi Experiment
Machine Configuration
Test Vehicle
4 Days of Soldering
Analysis of Bridging ? SAC 305
Occurrence of Bridging onQFP
Bridging Through Hole Components
Interactions of ProcessParameters on Bridging
To avoid bridging
Select proper flux amount
Optimal Settings
Open Joints on SOTs
Through Hole Inspection Criteria
ThroughHole
Penetration
Through Hole PenetrationSAC Alloy: Defect at top quartile
(
Optimized Process
Confirmation Run
Influence of Copper Tie - In
Evaluation of Optimized Liquid SolderingTechniques: Wave vs Selective
Test?s objective:Compare Wave soldering,
Multiwave Soldering, andSelectWave Soldering.
SelectWave and Multiwave areSelective Soldering Techniques
Selected Materials
Materials for this experimentwere defined by customer:
Alloy - SAC305 Flux Interflux 2005 C Board finish OSP Board: double sided,SMT/Through Hole components
Phase I: Wave Soldering
Machine Configuration forDelta:
Nozzle spray fluxer FC7(alcohol base flux)
Preheat configuration:Calrod-Forced convection-IRlamps
Combi wave former:Chip + smart wave
Nitrogen on wave(20-40-60 liter/min) Taguchi: 9 runs with
5 repetitions.
The
Smal
ler
the
Bett
er
6.33.21.6
40
30
20
15012090
18013080
40
30
20
265260255
Flux amount Preheat temp
Conveyor speed Solder temp
Wave Soldering - Bridging SOT
The
Larg
erth
eBe
tter
6.33.21.6
250
200
150
100
15012090
18013080
250
200
150
100
265260255
Flux amount Preheat temp
Conveyor speed Solder temp
Thru Hole Filling @ 48 Pins Connector
Flux amount: HighPreheat: medium 120CConveyor speed: medium 130 cm/minSolder temp.: 265 C
Determination of OptimizedParameter Settings for Wave Soldering
Phase I: SelectWave Soldering
Machine configuration formySelective 6748:
Dropjet fluxer: 130 microns(alcohol flux)
Preheat configuration:IR lamps (2 stations)
Select nozzle: 12 mm Nitrogen: 50 l/min Solder drainage
conditioner on
Taguchi: 9 runs with5 repetitions.
Determination of OptimizedParameter Settings for SelectWave Soldering
Flux amount: HighPreheat: low 80 CDrag speed: medium 5 mm/sSolder temp.: 290 C
The
Larg
erth
eBe
tter
5.72.00.7
200
175
150
125
10015011580
10.05.00.5
200
175
150
125
100320290260
Flux amount Preheat temp
Drag speed Solder temp
Select Wave - Thru Hole Penetration
The
Smal
ler
the
Bett
er
5.72.00.7
2.0
1.5
1.0
0.5
0.0
15011580
10.05.00.5
2.0
1.5
1.0
0.5
0.0
320290260
Flux amount Preheat temp
Drag speed Solder temp
Select Wave - Bridging
Low drag speed and high temperatures result in pad lifting.
Phase I: MultiWave soldering
Machine Configuration formySelective 6748:
(preheat conditions similar toSelectWave)
Dropjet fluxer: 130 microns IR lamps (2 stations) Multi plate with 2 nozzles Nitrogen: 200 l/min
Taguchi: 9 runs with5 repetitions.
Determination of OptimizedParameter Settings for MultiWave Soldering
The
Larg
erth
eBe
tter
14.09.73.7
240
225
210
195
180
15011580
531
240
225
210
195
180
320290260
Flux amount Preheat temp
Dip time Solder temp
Multi Wave - Through hole penetration
The
Smal
ler
the
Bett
er14.09.73.7
25
20
15
10
515011580
531
25
20
15
10
5320290260
Flux amount Preheat temp
Dip time Solder temp
Multi Wave - Bridging
Flux amount: HighPreheat: low 80 CDip time: 3 sSolder temp.: 320C
Small flux amount results in webbing, flags, bridging.
Confirming the Optimized Process
All confirmation run boards arenow in thermal cycling chambers.
Thermo cycling 0 to 100 C Pull test pin connector (after thermo
cycling) Cross sections inter metallic's SEM
For: Wave Select Wave Multi Wavesoldering
Tensile Strength Analysis
Instron:Max. load = 5 kNSpeed = 0.5 mm/min (slow to make
to have the crack in the solder)
Failure Mechanisms
Barrel failure Partial solder and barrel failure Solder failure Component failure
Component lead
Solder
Copper barrel Topside fillet
Tens
ileS
treng
th[N
]
320C290C260C
230
220
210
200
190
180
170
Tensile StrengthLead-free solder joint SAC305
SelectWave soldering
SelectWave Soldering
The board material is a regular FR4 material with a low Tg valuenot suitable for lead-free and selective soldering with high temperatures.
Pad lifting and material separation.
Wave SolderingTe
nsile
Stre
ngth
[N]
V=180cm/minV=130cm/minV=80cm/min
300
250
200
150
100
50
Tensile StrengthLead-free solder joint SAC305
Wave soldering
Poor hole filling (at high belt speed) result in lower tensile strength.
MultiWave SolderingTe
nsile
Stre
ngth
[N]
3sec@320C3sec@260C1sec@260C
250
225
200
175
150
Tensile StrengthLead-free solder joint SAC305
MultiWave soldering
Pad lifting is observed when dipped for 3 secondswith a high solder temperature.
Pull Testing - WaveTe
nsile
Stre
ngth
[N]
3000_cycles2000_cycles1000_cycles500_cycles0
250
225
200
175
150
125
Gerjan Diepstraten
Tensile strength after thermal cyclingThermal cycles 0 - 100 C
Wave soldering - 265 C - 3.7 seconds
Cu barrel weaken as TC increases
Pull Testing - SelectWaveTe
nsile
Stre
ngth
[N]
3000_cycles2000_cycles1000_cycles500_cycles0_cycles
250
225
200
175
150
125
Gerjan Diepstraten
Tensile strength after thermal cyclingThermal cycles 0 - 100 C
Select Wave soldering - 290 C - 2.5 seconds
90% mixed and solder failure up to 3000 AATC (90%barrel failures)
Pull Testing - MultiwaveTe
nsile
stre
ngth
[N]
3000_cycles2000_cycles1000_cycles500_cycles0_cycles
400
350
300
250
200
150
100
Gerjan Diepstraten
Tensile strength after thermal cyclingThermal cycles 0 - 100 C
Mutli Wave soldering - 320 C - 3 seconds
90% mixed and solder failure modes as TC increases. Largedeviation at 2000/3000 TC, different failure modes
Soldering TechnologyAffects Process and Yield
Wave Soldering Fast and efficient but, process isdetermined by most challenging requirementresulting in exposing all components, flux, board toexcessive conditions. Allows for through holesoldering and SMD mass soldering.
Wave SelectWave MultiWave
Soldering TechnologyAffects Process and Yield
SelectWave Soldering Flexible and exact but, process can beextended depending on number of joints to be processed.Defects are minimized to low numbers due to control oversoldering angle, flexible contact time per component, and fluxamount. Optimized through hole penetration and bridgeelimination is observed. Boards and components are onlyexposed to minimum requirements.
Wave SelectWave MultiWave
Soldering TechnologyAffects Process and Yield
MultiWave Soldering Faster yet flexible but, processis determined by most challenging board element.
Wave SelectWave MultiWave
Optimized Soldering Process
Each soldering process wasoptimized based on characterizingindividual parameter influence ondefect formation.
This allowed for end user totroubleshoot the defect andimplement a robust solderingprocess for a given solderingtechnique
High solder temperatures mayimpact board lifetime and result inpad lifting.
Lower solder temperatures giveequal or even higher tensile strengthif topside solder fillet is achieved.
Copper leaching depends on contacttime and solder temperature. Moredata will be collected.
WaveFlux amount = 6.3 mg/cm2Preheat temperature = 120 CConveyor speed = 130 cm/minSolder temperature = 265 C
SelectWaveFlux amount = 5.7 mg/cm2Preheat temperature = 80 CDrag speed = 5 mm/secSolder temperature = 290 C
MultiWaveFlux amount = 14.0 mg/cm2Preheat temperature = 80 CDip time = 3 secSolder temperature = 320 C
Major Concerns in LiquidSoldering
Cu Content in Lead-free Alloys The dissolution rate of Cu depends on:
Solder temperature. Copper content in the lead-free alloy
Contamination above 1% has a potential to affectprocess and joint quality
Cu6Sn5 formation Transition from eutectic to pasty range
Alloy Analysis
Contamination Lead Free AlloysSolder Analysis
Cu contamination: usually tolerable up to 1%.Driving cause:Dissolution of Cu from board material.
Fe contamination: maximum amount 0.02%.Can make joint formation brittle.Driving cause:Fe % increases as pot materials dissolve.
? Pb contamination: maximum amount 0.1%.Formation of low melting segments, crackingand other defectsDriving cause:Mix alloys, solderpot contamination
Copper Dissolution
1
23
Copper etched to highlight.Measure copper layer atthree different spots for10 samples.
Copper dissolution:Wave: -24% CuSelect Wave: -8% CuMulti Wave: -35% Cu
Thanks