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Validierung und Verifikation mit der NI Plattform

Sascha Egger

National Instruments Switzerland GmbH

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Today, We’ll Explore:

Validation and Verification

The Challenges of Developing Test and Measurement Systems

Introduction to the NI Automated Test Platform

Scaling Up Production with Parallel Testing

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Validation and Verification

• Validation Tests

• Does the product satisfy its

intended usage?

• Did you build the right

product?

• High level and exploratory

• Example: Usability test

• Verification Tests

• Does the product satisfy its

requirements or design?

• Did you build the product

right?

• Detailed and conclusive

• Example: Manufacturing

test

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MP3 player

Internet/E-mail

Cellular Phone

Digital Camera

Gaming

High resolution

display

Smart Phone

PDA

Today’s Designs: Converging Complexity

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Today’s Challenges: The Traditional Approach

Oscilloscope

Logic Analyzer

Spectrum Analyzer

Digital Multi Meter

(DMM)

Communications Analyzer

LCR Meter

Function

Generator

Power Supply

Pattern Generator

Programmable

Switch

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Traditional Testing Solutions

Challenging to Develop and

Maintain

• Disaggregate hardware

• Closed software solutions

• Conflicting programming approaches

• Limited analysis and visualization

• Hard to integrate new technologies

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Introduction to the NI

Automated Test Platform

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Components of an Automated Test System

NI LabVIEW LabWindows™/CVI Other Software

Measurement Studio, Visual

Studio.NET™, …

RF Measurements Bus Interfaces (GPIB/LXI/Serial)

Signal Generation PC or Embedded Controller

Switching PXI Chassis

Fixturing/

Mass Interconnects

SO

FT

WA

RE

H

AR

DW

AR

E

Test Development Software

NI TestStand Test Management, Test Deployment

IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, …

Test Management Software

Drivers, Services, Hardware Abstraction

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Common Needs

No matter the industry, every company has testing needs for their products to ensure quality. A proper automated testing framework (either built in-house or off-the-shelf) should:

1. Provide a flexible, open test architecture

2. Eliminate programming of common test executive tasks

3. Enable reuse of existing test code

4. Simplify updates and long-term maintenance

5. Accelerate test system development

6. Ensure high test system performance

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Test Executive – Build or Buy?

• Build (in-house) • Pros

– Meets custom needs

– Leveraging of code from current solution

– Utilizes existing developer talent

• Cons

– SW Maintenance

– Training

– Major development effort

– Different groups often create different test executives

• Buy (COTS) • Pros

– Training & certification courses

– Flexible architecture

– Built-in reporting and database logging

– Existing worldwide developer base

• Cons

– Overkill for basic sequencing

– Lack of full control over code base

– Price

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TestStand Accelerates Construction and

Deployment of Advanced Test Architectures

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NI TestStand – Test Management Software

• Graphical development

environment

• Automate tests written in

any language

• Multithreaded sequence

execution

• ASCII, HTML/Web, XML,

and ATML report

generation

• Access, Oracle,

SQL Server database

connectivity

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• Use drag-and-drop

step creation

• View and edit existing

step properties with

fewer clicks

• No programming

needed, just

configuration

Streamlined Sequence Editor

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NI TestStand – Operator Interfaces

• Full Featured and Simple User Interfaces are provided in

NI LabVIEW, NI LabWindows™/CVI, C#, C++, and

VB.NET

• TestStand Deployment Utility builds a simple installer with

necessary dependencies

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Choosing a Development Environment

• Faster/Easier Development and Debugging

– Complete and intuitive graphical environment, hierarchal dataflow-oriented design

• High-Performance Execution – Efficient and fast executables, advanced

multithreading capabilities, proven reliability

• Components – VIs, DLLs, COM, A Reusable/Standard

ActiveX server and component capabilities

• Designed for Engineers – 3rd party bench-top instrument support with

more than 10,000 instrument drivers, powerful visualization capabilities, and scientific analysis tools

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Example Test Application

• Automated Test of a consumer electronic device

• Power On Test and Battery Test

o PXI-Power supply and PXI-Digital Multimeter (DMM)

o OR a PXI-Source Measurement Unit (SMU)

• RF Tests (LTE Test, 802.11b/g/n Test)

o PXI RF-Signal Analyzer

• Audio Test (Mikrophone Test, Speaker Test)

o PXI-DSA

• User Input Test (Button Test)

o PXI- digital I/O Module Unit under Test (UUT)

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Example

UUT

Hardware Drivers

LabVIEW

NI TestStand

Hardware

(. . .) C/C++ .NET other

Software

Call Sound Quality Test.vi

NI-Scope, NI-FGEN, NI-DAQmx etc.

Pass Fail

PXI Digitizer, PXI-FGEN, PXI-DAQ etc.

Call Power Consumption Test.vi Call Memory Test.vi

Hardware

Systemlevel

ADE

Driver

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PXI - The Industry-leading Platform for Test,

Measurement and Control

PXI Controllers Performance embedded – Windows or RT OS

Remote control via desktop or laptop

PXI Chassis Options ranging from low-cost, 4-slot desktop

to high-performance 18-slot rack-mount

PXI Modules >1,500 options from over 60 PXI vendors

Software Flexible driver APIs, example code,

soft front panels and configuration

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Complete PXI Instrumentation Portfolio

Multifunction I/O

FPGA / Reconfigurable I/O

Digital I/O

Analog Input / Output

Vision and Motion

Counter / Timer / Clock

DAQ and Control

Oscilloscopes

High-Speed Digital I/O

Digital Multimeters

Signal Generators

Switching

RF Analyzers & Generators

Instruments

GPIB, USB, LAN

RS232 / RS485

CAN, LIN, DeviceNet

SCSI, Ethernet

VXI - VME

Boundary Scan / JTAG

Interfaces

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Software-Designed Instruments

Typical Modular Instrument Software-Designed Instrument

Software on the PC using the

Instruments API (i.e. IVI or NI-Scope)

Fixed

FPGA

Firmware

FPGA-

Code

Host-Software controlling Instrument

through API or custom interface

Similar hardware architecture and measurement quality

Out-of-the-box

functionality

with FPGA

enhancements

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Software-Designed Instruments:

Detect events faster and deterministically

Dead time

Continuous acquisition and processing

without dead time capturing all events

Missed event

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Demo: Time Domain Mask Trigger

• Acquire only signals (i.e. a glitch) that follow an given

envelope or path

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Demo: Time Domain Mask Trigger

Host FPGA

Application-Specific Host VIs Application-Specific FPGA VIs

Instrument Driver Instrument Driver FPGA VIs

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Fixturing/Mass Interconnects

• Hardware designed for quick

connection and disconnection

with high signal reliability

• Very important for test systems

with large numbers of test points

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Scaling up Production

with Parallel Testing

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Increasing Hardware Utilization with Switching

PXI-2532 8x64 Matrix

DM

M

+

- LED 1 (blue)

LED 2 (white)

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Graphical Configuration

Excel Integration

Easy channel aliasing

Automatic routing

Interactive Debug Panel

Simplified ADE integration

Integrated TestStand deployment

+

NI Switch Executive Intelligent Switch Management Software

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Switch Automation with NI TestStand

Create or import switch

system configuration file into

NI Switch Executive

Configure the Switching

property in NI TestStand to

call preconfigured routes and

route groups

Step 1

Step 2

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Switch Automation with NI TestStand

• Multithreaded Process Models

• Test sequence remains the same

• Add code for switching and code to avoid resource conflicts

Test Sequence for sequential

UUT tests Test Sequence for parallel

UUT tests

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Sequential vs. Parallel vs. Auto-scheduled

Execution

• Simple 1 UUT test fixture

• Extremely simple code structure

• 12 time blocks for 4 units

• Multiple UUTs in parallel

• Switching allows hardware to be shared

• ~30–60% decrease in testing time

• Same HW setup as above

• TestStand auto-schedules resources

• ~15–20% further decrease in testing time

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Resource Usage Profiler

• Provides immediate visualization and performance

statistics for all current executions, threads, and resources

• A fully optimized test should take 4X the longest test time

Sequential Execution Parallel Execution Auto-Scheduled Execution

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• Smaller size

• Higher performance

• Flexible

• Easily upgraded

• User-defined

• Integrated

Synchronization

• Low power consumption

Summary: NI’s Value Proposition

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National Instruments Services and Support

• Technical Support

• Web support resources

• Application engineers worldwide

• Premier support

• Instructor Led Training

• NI TestStand 1 – Test Development

• NI TestStand 2 – Framework Development

• Thousands of engineers trained each year

• Certification

• Certified TestStand Developer (CTD)

• Certified TestStand Architect (CTA)

ni.com/services

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• White papers

• Application notes

• Examples

• Other NI seminars

• Request callback support

• And much more… – ni.com/teststand

– ni.com/pxi