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Portable x-ray diffractometer for
determining residual mechanical stresses
Development and
delivery of X-ray
analytical equipmentAMTERTEK
URAN
2
Determination by methods of non-destructive testing of elastic
deformations of the crystal lattice and calculation of residual and effective
mechanical stresses in parts and structures for various purposes during
their manufacture, operation and repair.
The value determined using the URAN diffractometer serves as the basis
for controlling the level of mechanical stresses in parts and products,
including large-sized ones directly at the place of their operation, in order
to determine the technical condition, and estimate the residual resource.
Necessary tool for evaluating technical
conditions of responsible structures and structures
any sizes and forms without dismantle and destruction
AMTERTEK - development and delivery of x-ray equipment
DESIGNED
URAN
3
ADVANTAGES OF THE X-RAY METHOD
Direct referenceless method
High accuracy and reliability of
determination of mechanical
stresses
Technical standard for calibration
of indirect methods
EVALUATION METHOD
The principle of operation of the X-ray diffractometer is based on the
diffraction of the primary X-ray radiation generated by X-ray tubes, on the
crystal lattice of the material of the object under study and on the
registration of the diffracted X-ray radiation by the detector.
The residual stress is calculated from the strain on the crystal lattice, as
determined by X-ray diffraction.
During deformation of a polycrystalline material under the influence of an
external force, simultaneous compression and stretching occur, which
leads to three-dimensional deformation of the crystal lattice.
AMTERTEK - development and delivery of x-ray equipment
URAN
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As a result, the position of the diffraction maximum changes in comparison
with that without deformation. The voltage is calculated taking into account
the difference of these values.
diffraction peak shift
diffraction maximum
The shooting scheme used
in the diffractometer is the
true “Sin2Ψ” scheme. It
allows high-precision
determination of stresses in
the material, both in
magnitude and in directions
lying in the surface plane.
X-ray diffractometry method introduced in the interstate standard
GOST 32207-2013
AMTERTEK - development and delivery of x-ray equipment
URAN
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Determination of residual mechanical stresses of metallurgy products
Non-destructive testing of the stress-strain state of stamped products and structures
Assessment of the residual life and reliability of cast parts, turbine blades, compressors and turbines discs, springs, polycrystal plates, tanks, reactor shells, car frames, wheel sets, rails, bridges, welds, etc.
Identification of the pre-defect state of critical products, engine components
Detection of stresses caused by laser processing or welding
USING
The research in the laboratory.
AMTERTEK - development and delivery of x-ray equipment
Object of study – pipe
fragment
Investigated areas –
weld and near-weld area
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It is known that technological residual stresses in excess of permissible
values in products with high rigidity in the surface layer can cause cracking,
and with low rigidity - residual deformation, leading to distortion with a
corresponding loss of accuracy of shape or relative position of surfaces. At
the level of stresses within the limits of permissible values of visible
changes, it does not occur, but if the sign of operational loads coincides
with the sign of residual stresses, the product will be destroyed under loads
less than the calculated ones.
Object of study – a wheel of a railway vehicle.
Investigated areas – a disk, a disk-hub transition, a disk-rim transition, etc.
The research is conducted directly in the shop for finished products.
AMTERTEK - development and delivery of x-ray equipment
URAN
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AMTERTEK - development and delivery of x-ray equipment
In many cases, the destruction of structures made of high-strength
materials under variable loads is associated with the effect of residual
stresses (turbine and compressor blades, crankshafts, welds, etc.). Their
formation is associated with non-uniform linear or volumetric
deformations in adjacent volumes of material, aggregate or structure.
Distribution of residual stresses in the depth of the surface layer after various
operations of the technological process of processing:
1 - pre-grinding; 2 - final grinding; 3 - grinding, running; 4 - heat treatment
URAN
σ, MPa
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APPLICATION
Railway transport
Road transport
Aerospace industry
Aviation equipment
Atomic and thermal power plants
Education
Building industry, etc
AMTERTEK - development and delivery of x-ray equipment
URAN
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FEATURES
AMTERTEK - development and delivery of x-ray equipment
The composition of the diffractometer - goniometer, X-ray tube, detector,
laser sensor, control unit, software.
Goniometer combines linear guides with micron displacement and
curved guides with a different radius, which allows you to measure strain
from one point in four directions. The magnitude of the angle 2θ can be
changed manually from 104° to 160° for the analysis of alloys based on
Mn, Al, Ni, Ti, Fe, Co, etc., while re-calibration is not required. The X-ray
tube used in the diffractometer has such a small power (4W) that the
background radiation level when the operator is working does not exceed
the natural one and makes the diffractometer's operation ecologically
safe. The low power of the X-ray tube does not require the selection of
heat flux by water cooling, does not require special radiation protection
and provides a reduction in the dimensions of the goniometer with the
power supply and, accordingly, the total weight of the device.
X-ray tube is combined with a high-voltage power source.
The URAN is the representative of a new generation of portable X-ray
diffractometers, developed by specialists of AMTERTEK according to the
terms of reference issued by Vyksa Steel Works for the control and
evaluation of output at various stages of production. The compact design
of the diffractometer allows you to place it directly on large-sized
samples.
URAN
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AMTERTEK - development and delivery of x-ray equipment
A position-sensitive detector, proportional, sealed off with high
quantum registration efficiency, does not require the supply of a gas
mixture and cooling. The need for scanning is eliminated due to
simultaneous registration in a wide angular range - 28° through 2θ, which
significantly reduces the time taken to obtain a diffractogram and,
accordingly, the time for analysis.
Not afraid to work in an environment with high radiation, unlike
semiconductor detectors.
The laser sensor allows you to perform operational adjustment of the
diffractometer in a contactless manner on any surfaces with an accuracy
of several microns, and also to determine the normal to the surface under
investigation in seconds, using the program.
The control unit contains power sources and diffractometer controls, is
controlled from a computer via a USB interface.
The software manages all the nodes of the diffractometer, provides a
set, display of diffraction patterns, the calculation of residual stresses in
both manual and automatic mode. It has a convenient and intuitive
interface with contextual prompts. The program comes with a database of
many alloys.
The diffractometer is portable, radiation safe. The design of the
measuring system of the diffractometer allows you to determine the
deformation and mechanical stresses at any point of interest to the
complex design of the product without its destruction.
URAN
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ADVANTAGES
AMTERTEK - development and delivery of x-ray equipment
Interface of the program window
Research of parts of virtually any shape and size without dismantling
them, identifying a pre-defect state, the ability to predict the residual
working life of the product, express adjustment of samples on an
arbitrary working surface, low power consumption, non-destructive
analysis, ease of maintenance, use both in the laboratory and in the
workshop.
URAN
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The range of diffraction angles, 2θ 104˚ ÷ 160˚
The angular interval of simultaneous registration, 2θ 20˚
Range of inclination angles, Ψ -45˚ ÷ +45˚
Absolute error of measurement of angular positions of
diffraction peaks, θ± 0.1˚
Equivalent dose rate, not more 0,8 µSv / h
Sensor accuracy ± 9 mkm
X-ray tube target Cr (Cu, Fe optional)
X-ray tube max.power 4 W
X-ray tube cooling air
Detector
positional-sensitive
proportional,
sealed
Input supply 220 V AC / 50 Hz
Power consumption < 50 W
Dimensions (DxWxH):
goniometric device
control block765x560x545 mm
330x240x140 mm
Weight:
goniometric device
control block12 kg
3 kg
AMTERTEK
23 Pokhodnyy proezd, Off 107, Moscow, 125459 Russia.
Tel.+7 (977) 287-6340
https://amtertek.com
E-mail: [email protected]; [email protected]
TECHNICAL DETAILS
The root-mean-square deviation of the definition of diffraction angles, 2θ
± 0.04˚
URAN