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ALD MCP 116 Life Test Update
• MCP 116 - 20µm pore, ANL functionalized, R = 31 MΩ • Single plate in phosphor screen detector on life test system • Pre-scrub imaging vs. voltage • Baked at 145°C for 48 hours (peak pressure 1e-4 torr, final pressure 4e-7 torr) • Post-bake imaging and “gain” vs. voltage • Start scrub 9/10/10, has been going > 95 days (~3 C/cm2) • Scrubbed down to about 20% relative gain, recovered to about 60%, then started a slow decrease which is gradually leveling. • Intermediate imaging and gain vs. voltage at 0.43 C/cm2, 1.74 C/cm2, 3 C/cm2
16 November 2010 J. McPhate – MCP 116 Life Test Update 1
RelaCve Gain vs. Extracted Charge
16 November 2010 J. McPhate – MCP 116 Life Test Update 2
0%
20%
40%
60%
80%
100%
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5
RelaCve Ga
in
Extracted Charge (C/cm2)
ALD MCP 116 Scrub RelaCve Gain vs. Extracted Charge
Photocurrent vs. Voltage (at different scrub epochs)
16 November 2010 J. McPhate – MCP 116 Life Test Update 3
0.01
0.1
1
10
100
1000
10000
0 200 400 600 800 1000 1200 1400 1600
Photocurrent (n
A)
MCP HV (volts)
"Gain" vs. Voltage, ALD MCP 116 Life Test
0.00 C/cm2 (nA)
0.43 C/cm2 (nA)
1.74 C/cm2 (nA)
3.05 C/cm2 (nA)
Values below 0.1nA and above 2000 nA are subject to measurement errors
UV Flats Overview
16 November 2010 J. McPhate – MCP 116 Life Test Update 4
Post-‐Bake 900V
1100V
@ 0.43 C/cm2
1100V
1300V
@ 1.74 C/cm2
1100V
1300V
UV Flat Closeups @ 1.74 C/cm2
16 November 2010 J. McPhate – MCP 116 Life Test Update 5
1100V 800V
Spots are likely to be areas where the ALD overlayer has been removed by cleaning off dust, Very bright spots are field emission, worst one is in a triple point – debris???
ALD MCP 116 Life Test Update
16 November 2010 J. McPhate – MCP 116 Life Test Update 6
Current spikes likely due to bright spots in image flaring up
1µA
0 µA
