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TRANSIENT REFLECTIVITY RESPONSE OF LASER MIRRORSTO ELECTRON BEAM IRRADIATION
by
Kevin A. Stroh
B.S.. Kansas State University, 1984
A MASTER'S THESIS
submitted in partial fulfillment of the
requirements for the degree
MASTER OF SCIENCE
Department of Nuclear Engineering
KANSAS STATE UNIVERSITYManhattan, Kansas
1987
Approved by:
A%£Uu~Major Professor
LD
•T4TABLE OF CONTENTS A112D7 310116
1
.
INTRODUCTION 1
2. REVIEW OF LITERATURE 3
2.1 Transient Radiation Effects on OpticalFibers and Electronic Equipment 3
2.2 Transient Radiation Effects on Laser Mirrors... 5
3. Laser Mirrors 8
3.1 Laser Mirror Types and Construction 8
3.1.1 Dielectric-multilayer MirrorConstruction 9
3.1.2 Metal-coated Mirror Construction 10
3.2 Mirror Optical Characteristics 11
3.2.1 Dielectric Mirror Reflectivitiesand Transmissions 12
3.2.2 Metal-coated Mirror Reflectivitiesand Transmissions 14
4. Experiment Methods and Materials 23
4.
1
Determining the Pre-irradiation MirrorReflectivity 23
4.1.1 Operations of the CARY 2300Spectrophotometer 23
4.2 Mirror Irradiation 25
4.2.1 Preparing for Mirror Irradiation 26
4.2.2 Beam Shots with Block-in andBlock-out 29
4.2.3 Beam Characteristics 30
4.3 Data Recording 30
4.4 Time and Wavelength Calibrations 33
4.4.1 Time Calibration 33
4.4.2 Wavelength Calibration 35
5. Theory of the Experiment and Data Analysis 43
5.
1
Theory of Experimental Optics Arrangement 43
5.1.1 Simplification of Theory 44
5.2 Data Analysis 46
5.2.1 Determining f(X,t) and f(X,t1->t). .. 49
5.2.2 Time Integration 53
5.2.3 Fast-Fourier Transform Analysis ofthe Signal Ratios 56
5.2.3.1 Determining the OptimumE-value for the FourierTransform 57
5.3 Error Analysis 59
5.3.1 Error from Pre-irradiationReflectivity Measurements 59
5.3.2 Error on Signal-Ratio Data 60
5.3.2.1 Mean-Square-ResidualTechnique 60
5.3.2.2 Moving-Mean-Square-ResidualTechnique 62
5.3.3 Error on the TransientReflectivities 66
6. Results 85
6.1 Results from the Signal Ratios 85
6.2 Transient Reflectivity Results 89
7
.
Conclusions and Recommendations 91
7.1 Conclusions on the Dielectric-multi layeredMirrors 91
7.2 Conclusions on the CuAg-coated Mirrors 93
7.3 Conclusions on the Al-coated Mirrors 94
7.4 Recommendations for Future Work 95
ACKNOWLEDGEMENTS 97
REFERENCES 99
APPENDIX A
APPENDIX B
APPENDIX C
APPENDIX D
The Signal-ratio Plots Al
Programs used in Data Analysis Bl
Transient Reflectivity Plots CI
Pre-irradiation Reflectivity Curves for allMirrors listed in Table 3.1 Dl
APPENDIX E: Block-in and Block-out Shot Picture Data El
LIST OF FIGURES
Figure Page
3.1 Theoretical and measured reflectances for atypical dielectric mirror. The theoreticalmodel results include variable angles ofincidence, and indiced of refraction 17
3.2 The spectral reflectance at 10 degrees incidencefor metal-coated mirror 6L 18
3.3 The spectral reflectance at 10 degrees incidencefor metal-coated mirror 2L 19
3.4 The spectral reflectance at normal incidence foran evaporated film of aluminum 20
3.5 The spectral reflectance at normal incidence foran evaporated film of silver 21
3.6 The spectral reflectance at normal incidence foran evaporated film of copper 22
4.
1
The optics plate used to hold the mirrors for thepre-irradiation reflectivity measurements. Themirror sat in the V-notch of the plate with thecoated side of the mirror in the plane of theright-side view 37
4.2 The experimental optics set-up. Note, the spotson the pellicle mirror, A and B, are outside thediverging electron beam. The coated side of thesample mirror faces the pellicle mirror .... 38
4.3 The pulsed xenon light source relative outputversus wavelength 39
4.4 Sample radiochromic dosimetry output for metal-coated mirror 6L. The radiochromic film was shot20 times with the beam used to irradiate mirror6L 40
4.5 Isometric view of a typical laser mirror used inthe experiments. The figure details mirrordimensions and location and size of the beam spotpositions A and B 41
Figure Page
4.6 Sample color photograph of raw data (a) and beamprofile (b) for the electron irradiation ofdielectric mirror 14. The color levels identifythe light intensity level at the camera detector. 42
5.1 The signal ratio and Fourier curve, with E=2, fordielectric mirror 14. II is defined during 25 to41.3 ns 68
5.2 The signal ratio and Fourier curve, with E=3, fordielectric mirror 14. II is defined during 25 to41.3 ns 69
5.3 The signal ratio and Fourier curve, with E=4, fordielectric mirror 14. II is defined during 25 to41.3 ns 70
5.4 The signal ratio and Fourier curve, with E=5, fordielectric mirror 14. II is defined during 25 to41.3 ns 71
5.5 The signal ratio and Fourier curve, with E=6, fordielectric mirror 14. II is defined during 25 to41.3 ns 72
5.6 The signal ratio and Fourier curve, with E=7, fordielectric mirror 14. II is defined during 25 to41.3 ns 73
5.7 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 5.II is defined during 61.1 to 81.2 ns 74
5.8 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 25.II is defined during 61.1 to 81.2 ns 75
Figure Page
5.9 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MHSRES errorestimate is based on a half-window size of 35.II is defined during 61.1 to 81.2 ns 76
5.10 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*{MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 50.II is defined during 61.1 to 81.2 ns 77
5.11 The signal ratio and Fourier curve (solid lines)5
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 75.II is defined during 61.1 to 81.2 ns 78
5.12 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 100.II is defined during 61.1 to 81.2 ns 79
5.13 The signal ratio and Fourier curve (solid lines)
and Fourier curve ± 2*(MMSRES) error estimate(dash-dot lines) for metal-coated mirror 2L,irradiated in position A. The MMSRES errorestimate is based on a half-window size of 150.II is defined during 61.1 to 81.2 ns 80
5.14 A comparison of the MSRES and MMSRES errorestimates for the metal-coated mirror 2L,irradiated in position A. The MMSRES estimateis based on the optimal half-window size, 50. . 81
5.15 The pre-irradiation reflectivity compared to thetransient reflectivity based on the signal ratioin Fig. la for dielectric mirror 14 82
Figure Page
5.16 The pre-irradiation reflectivity compared to thetransient reflectivity based on the signal ratioin Fig. 7a for metal-coated mirror 1L 83
5.17 The pre-irradiation reflectivity compared to thetransient reflectivity based on the signal ratioin Fig. 10a for metal-coated mirror 6L 84
la Signal ratio for II defined in 0.0-5.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A3
lb Signal ratio for II defined in 5.0-10.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A4
lc Signal ratio for II defined in 10.0-15.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A5
Id Signal ratio for* II defined in 15.0-20.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A6
le Signal ratio for II defined in 20.0-25.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A7
If Signal ratio for II defined in 25.0-41.3 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 AS
lg Signal ratio for II defined in 41.3-57.5 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A9
lh Signal ratio for II defined in 57.5-73.8 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 A10
11 Signal ratio for II defined in 73.8-88.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 14 All
2a Signal ratio for II defined in 0-37 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12. irradiatedin position A A13
Figure Page
2b Signal ratio for II defined in 37.0 - 70.5 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A14
2c Signal ratio for II defined in 70-5-104 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A15
2d Signal ratio for II defined in 104-138 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A16
2e Signal ratio for II defined in 138-171 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A17
2f Signal ratio for II defined in 171-205 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A18
2g Signal ratio for II defined in 205-238 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A19
2h Signal ratio for II defined in 283-272 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position A A20
2i Signal ratio for II defined in 272-313 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, Irradiatedin position A A21
3a Signal ratio for II defined in 250-284 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, Irradiatedin position B A23
Figure Page
3b Signal ratio for II defined in 284-317 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A24
3c Signal ratio for II defined in 317-351 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A25
3d Signal ratio for II defined in 351-384 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A26
3e Signal ratio for II defined in 384-418 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A27
3f Signal ratio for II defined in 418-451 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A28
3g Signal ratio for II defined in 451-485 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A29
3h Signal ratio for II defined in 485-518 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A30
3i Signal ratio for II defined in 518-552 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A31
3j Signal ratio for II defined in 552-593 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 12, irradiatedin position B A32
Figure Page
4a Signal ratio for II defined in 0.8-20.9 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A34
4b Signal ratio for II defined in 20.9-41.0 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A35
4c Signal ratio for II defined in 41.0-61.1 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A36
4d Signal ratio for II defined in 61.1-81.2 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A37
4e Signal ratio for II defined in 81.2-101 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A38
4f Signal ratio for II defined in 101-121 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A39
4g Signal ratio for II defined in 121-142 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A40
4h Signal ratio for II defined in 142-162 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A41
4i Signal ratio for II defined in 162-183 nstime region and 12 defined during -160-0.8 nsregion for dielectric mirror 13, irradiatedin position A A42
Figure Page
5a Signal ratio for II defined in 0.25-33.8 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A44
5b Signal ratio for II defined in 33.8-67.3 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A45
5c Signal ratio for II defined in 67.3-101 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A46
5d Signal ratio for II defined in 101-134 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A47
5e Signal ratio for II defined in 134-168 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A48
5f Signal ratio for II defined in 168-201 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A49
5g Signal ratio for II defined in 201-235 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A50
5h Signal ratio for II defined in 235-268 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A51
5i Signal ratio for II defined in 268-293 nstime region and 12 defined during -50-0.25 nsregion for dielectric mirror 13, irradiatedin position B A52
6a Signal ratio for II defined in 0-37 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A54
Figure Page
6b Signal ratio for II defined in 37-70.5 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A55
6c Signal ratio for II defined in 70.5-104 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A56
6d Signal ratio for II defined in 104-138 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A57
6e Signal ratio for II defined in 138-171 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A58
6f Signal ratio for II defined in 171-205 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A59
6g Signal ratio for II defined in 205-238 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A60
6h Signal ratio for II defined in 238-272 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A61
61 Signal ratio for II defined in 272-313 nstime region and 12 defined during -30-0 nsregion for dielectric mirror 26 A62
7a Signal ratio for II defined in 0.0-5.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A64
7b Signal ratio for II defined in 5.0-10.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A65
7c Signal ratio for II defined in 10.0-15.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A66
7d Signal ratio for II defined in 15.0-20.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A67
Figure Page
7e Signal ratio for II defined in 20.0-25.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A68
7f Signal ratio for II defined in 25.0-41.3 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A69
7g Signal ratio for II defined in 41.3-57.5 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A70
7h Signal ratio for II defined in 57.5-73.8 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A71
71 Signal ratio for II defined in 73.8-88.0 nstime region and 12 defined during -40-0 nsregion for dielectric mirror 1L A72
8a Signal ratio for II defined in 0.8-20.9 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A74
8b Signal ratio for II defined in 20.9-41.0 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A75
8c Signal ratio for II defined in 41.0-61.1 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A76
8d Signal ratio for II defined in 61.1-81.2 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A77
8e Signal ratio for II defined in 81.2-101 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A78
Figure Page
8f Signal ratio for II defined in 101-121 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A79
8g Signal ratio for II defined in 121-142 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A80
8h Signal ratio for II defined in 142-162 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L. irradiatedin Positon A A81
8i Signal ratio for II defined in 162-183 nstime region and 12 defined during -160-0.8 nsregion for metal-coated mirror 2L, irradiatedin Positon A A82
9a Signal ratio for II defined in 0.25-33.8 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A84
9b Signal ratio for II defined in 33.8-67.3 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A85
9c Signal ratio for II defined in 67.3-101 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A86
9d Signal ratio for II defined in 101-134 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A87
9e Signal ratio for II defined in 134-168 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A88
Figure
9f Signal ratio for II defined in 168-201 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A89
9g Signal ratio for II defined in 201-235 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A90
9h Signal ratio for II defined in 235-268 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A91
91 Signal ratio for II defined in 268-293 nstime region and 12 defined during -50-0.25 nsregion for metal-coated mirror 2L, irradiatedin Positon B A92
10a Signal ratio for II defined in 0.0-5.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A94
10b Signal ratio for II defined in 5.0-10.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A95
10c Signal ratio for II defined in 10.0-15.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A96
lOd Signal ratio for II defined in 15.0-20.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A97
lOe Signal ratio for II defined in 20.0-25.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A98
lOf Signal ratio for II defined in 25.0-41.3 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A99
lOg Signal ratio for II defined in 41.3-57.5 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A100
Figure Page
lOh Signal ratio for II defined in 57.5-73.8 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A101
101 Signal ratio for II defined in 73.8-88.0 nstime region and 12 defined during -40-0 nsregion for metal-coated mirror 6L A102
11a Signal ratio for II defined in 0-37 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A104
lib Signal ratio for II defined in 37-70.5 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A105
lie Signal ratio for II defined in 70.5-104 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A106
lid Signal ratio for II defined in 104-138 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A107
lie Signal ratio for II defined in 138-171 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A108
llf Signal ratio for II defined in 171-205 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A A109
llg Signal ratio for II defined in 205-238 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L. irradiatedin position A A110
llh Signal ratio for II defined in 238-272 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position A Alll
Figure Page
Hi Signal ratio for II defined in 272-313 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L. irradiatedin position A A112
12a Signal ratio for II defined in 250-284 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A114
12b Signal ratio for II defined in 284-317 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A115
12c Signal ratio for II defined in 317-351 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A116
12d Signal ratio for II defined in 351-384 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A117
12e Signal ratio for II defined in 384-418 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A118
12f Signal ratio for II defined in 418-451 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A119
12g Signal ratio for II defined in 451-485 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A120
12h Signal ratio for II defined in 485-518 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A121
Figure Page
12i Signal ratio for II defined in 518-552 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L. irradiatedin position B A122
12j Signal ratio for II defined in 552-593 nstime region and 12 defined during -30-0 nsregion for metal-coated mirror 7L, irradiatedin position B A123
13a The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. la,
(0.0-5.0 ns), for dielectric mirror 14 C3
13b The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. lb,
(5.0-10.0 ns), for dielectric mirror 14 C4
13c The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. lc,(10.0-15.0 ns), for dielectric mirror 14 C5
13d The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. Id,(15.0-20.0 ns), for dielectric mirror 14 C6
13e The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. le,(20.0-25.0 ns). for dielectric mirror 14 C7
13f The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. If,(25.0-41.3 ns), for dielectric mirror 14 C8
13g The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. lg,(41.3-57.5 ns). for dielectric mirror 14 C9
13h The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. lh,(57.5-73.8 ns), for dielectric mirror 14 C10
131 The pre-irradiation reflectivity comparedto the transient reflectivity based on Fig. 11,(73.8-88.0 ns), for dielectric mirror 14 Cll
Figure Plage
13j The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13a fordielectric mirror 14 C12
13k The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13b fordielectric mirror 14 C13
131 The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13c fordielectric mirror 14 C14
13m The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13d fordielectric mirror 14 C15
13n The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13e fordielectric mirror 14 C16
13o The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13f fordielectric mirror 14 C17
13p The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13g fordielectric mirror 14 C18
13q The expanded view of the pre-irradiation andtransient reflectivities of Fig. 13h fordielectric mirror 14 C19
13r The expanded view of the pre-irradiation andtransient reflectivities of Fig. 131 fordielectric mirror 14 C20
14a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2a. (0.0-37.0 ns), for dielectricmirror 12 in position A C22
14b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2b. (37.0-70.5 ns), for dielectricmirror 12 in position A C23
Figure Page
14c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2c. (70.5-104 ns). for dielectricmirror 12 in position A C24
14d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2d. (104-138 ns). for dielectricmirror 12 in position A C25
14e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2e. (138-171 ns). for dielectricmirror 12 in position A C26
14f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2f. (171-205 ns), for dielectricmirror 12 in position A C27
14g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2g. (205-238 ns), for dielectricmirror 12 in position A C28
14h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 2h. (238-272 ns), for dielectricmirror 12 in position A C29
141 The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 21. (272-313 ns), for dielectricmirror 12 In position A C30
14j The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14a fordielectric mirror 12 in position A C31
14k The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14b fordielectric mirror 12 in position A C32
141 The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14c fordielectric mirror 12 in position A C33
Figure
14m The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14d fordielectric mirror 12 in position A C34
14n The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14e fordielectric mirror 12 in position A C35
14o The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14f fordielectric mirror 12 in position A C36
14p The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14g fordielectric mirror 12 in position A C37
14q The expanded view of the pre-irradiation andtransient reflectivity of Fig. 14h fordielectric mirror 12 in position A C38
14r The expanded view of the pre-irradiation andtransient reflectivity of Fig. 141 fordielectric mirror 12 in position A C39
15a The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3a,(250-284 ns), for dielectric mirror 12 inposition B C41
15b The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3b,(284-317 ns), for dielectric mirror 12 inposition B C42
15c The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3c,(317-351 ns). for dielectric mirror 12 inposition B C43
15d The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3d,(351-384 ns). for dielectric mirror 12 inposition B C44
15e The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3e,(384-418 ns), for dielectric mirror 12 inposition B C45
Figure Page
15f The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3f,(418-451 ns), for dielectric mirror 12 inposition B C46
15g The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3g,(451-485 ns), for dielectric mirror 12 inposition B C47
15h The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3h,(485-518 ns). for dielectric mirror 12 inposition B C48
151 The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 31.(518-552 ns), for dielectric mirror 12 inposition B C49
15j The pre-irradiation reflectivity compared tothe transient reflectivity based on Fig. 3J,(552-593 ns) , for dielectric mirror 12 inposition B C50
15k The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15a fordielectric mirror 12 in position B C51
151 The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15b fordielectric mirror 12 in position B C52
15m The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15c fordielectric mirror 12 in position B C53
15n The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15d fordielectric mirror 12 in position B C54
15o The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15e fordielectric mirror 12 in position B C55
15p The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15f fordielectric mirror 12 in position B C56
Figure
15q The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15g fordielectric mirror 12 in position B C57
15r The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15h fordielectric mirror 12 in position B C58
15s The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15i fordielectric mirror 12 in position B C59
15t The expanded view of the pre-irradiation andtransient reflectivities of Fig. 15J fordielectric mirror 12 in position B C60
16a The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4a,(0.8-20.9 ns), for dielectric mirror 13 inposition A C62
16b The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4b,(20.9-41.0 ns), for dielectric mirror 13 inposition A C63
16c The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4c,(41.0-61.1 ns), for dielectric mirror 13 inposition A C64
16d The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4d,(61.1-81.2 ns), for dielectric mirror 13 inposition A C65
16e The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4e,(81.2-101 ns). for dielectric mirror 13 inposition A C66
16f The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4f,(101-121 ns), for dielectric mirror 13 inposition A C67
Figure
16g The pre-irradiatlon ref lecitivity compared to
the transient reflectivity based on Fig. 4g,(121-142 ns), for dielectric mirror 13 inposition A 068
16h The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4h,(142-162 ns). for dielectric mirror 13 inposition A C69
16i The pre-irradiation ref lecitivity compared tothe transient reflectivity based on Fig. 4i,(162-183 ns), for dielectric mirror 13 inposition A C70
16j The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16a fordielectric mirror 13 in position A C71
16k The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16b fordielectric mirror 13 in position A C72
161 The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16c fordielectric mirror 13 in position A C73
16m The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16d fordielectric mirror 13 in position A C74
16n The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16e fordielectric mirror 13 in position A C75
16o The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16f fordielectric mirror 13 in position A C76
16p The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16g fordielectric mirror 13 in position A C77
16q The expanded view of the pre-irradiation andtransient reflectivities of Fig. 16h fordielectric mirror 13 in position A C78
Figure
16r The expanded view of the pre-irradiation andtransient reflectivities of Fig. 161 fordielectric mirror 13 in position A CT9
17a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5a (0.25-33.8 ns) for dielectricmirror 13 in position B C81
17b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5b (33.8-67.3 ns) for dielectricmirror 13 in position B C82
17c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5c (67.3-101 ns) for dielectricmirror 13 in position B C83
17d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5d (101-134 ns) for dielectricmirror 13 in position B C84
17e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5e (134-168 ns) for dielectricmirror 13 in position B C85
17f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5f (168-201 ns) for dielectricmirror 13 in position B C86
17g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5g (201-235 ns) for dielectricmirror 13 in position B C87
17h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 5h (235-268 ns) for dielectricmirror 13 in position B C88
17i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 51 (268-293 ns) for dielectricmirror 13 in position B C89
Figure
17j The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17a fordielectric mirror 13 in position B C90
17k The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17b fordielectric mirror 13 in position B C91
171 The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17c fordielectric mirror 13 in position B C92
17m The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17d fordielectric mirror 13 in position B C93
17n The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17e fordielectric mirror 13 in position B C94
17o The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17f fordielectric mirror 13 in position B C95
17p The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17g fordielectric mirror 13 in position B C96
17q The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17h fordielectric mirror 13 in position B C97
17r The expanded view of the pre-irradiation andtransient reflectivities of Fig. 17i fordielectric mirror 13 in position B C98
18a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6a (0.0-37 ns) for dielectricmirror 26 C100
18b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6b (37.0-70.5 ns) for dielectricmirror 26 C101
Figure
18c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6c (70.5-104 ns) for dielectricmirror 26 C102
18d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6d (104-138 ns) for dielectricmirror 26 C103
18e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6e (138-171 ns) for dielectricmirror 26 C104
18f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6f (171-205 ns) for dielectricmirror 26 C105
18g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6g (205-238 ns) for dielectricmirror 26 C106
18h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6h (238-272 ns) for dielectricmirror 26 C107
18i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 6i (272-313 ns) for dielectricmirror 26 C108
18j The expanded view of the pre-irradiationand transient reflectivities of Fig. 18afor dielectric mirror 26 C109
18k The expanded view of the pre-irradiationand transient reflectivities of Fig. 18bfor dielectric mirror 26 C110
181 The expanded view of the pre-irradiationand transient reflectivities of Fig. 18cfor dielectric mirror 26 Clll
Figure Page
18m The expanded view of the pre-irradiationand transient reflectivities of Fig. 18dfor dielectric mirror 26 C112
18n The expanded view of the pre-irradiationand transient reflectivities of Fig. 18efor dielectric mirror 26 C113
18o The expanded view of the pre-irradiationand transient reflectivities of Fig. 18ffor dielectric mirror 26 C114
18p The expanded view of the pre-irradiationand transient reflectivities of Fig. 18gfor dielectric mirror 26 C115
18q The expanded view of the pre-irradiationand transient reflectivities of Fig. 18hfor dielectric mirror 26 C116
18r The expanded view of the pre-irradiationand transient reflectivities of Fig. 181for dielectric mirror 26 CI 17
19a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7a (0.0-5.0 ns), for metal-coatedmirror 1L C119
19b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7b (5.0-10.0 ns) . for metal-coatedmirror 1L C120
19c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7c (10.0-15.0 ns), for metal-coatedmirror 1L C121
19d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7d (15.0-20.0 ns), for metal-coatedmirror 1L C122
19e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7e (20.0-25.0 ns), for metal-coatedmirror 1L C123
Figure Page
19f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7f (25.0-41.3 ns), for metal-coatedmirror 1L C124
19g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7g (41.3-57.5 ns), for metal-coatedmirror 1L C125
19h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 7h (57.5-73.8 ns), for metal-coatedmirror 1L C126
19i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 71 (73.8-88.0 ns), for metal-coatedmirror lL C127
20a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8a (0.8-20. 9ns), for metal-coatedmirror 2L, in position A C129
20b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8b (20.9-41.0 ns), for metal-coatedmirror 2L. in position A C130
20c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8c (41.0-61.1 ns). for metal-coatedmirror 2L, in position A C131
20d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8d (61.1-81.2 ns). for metal-coatedmirror 2L, in position A C132
20e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8e (81.2-101 ns), for metal-coatedmirror 2L, in position A C133
Figure Page
20f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8f (101-121 ns), for metal-coatedmirror 2L, in position A C134
20g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8g (121-142 ns), for metal-coatedmirror 2L, in position A C135
20h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 8h (142-162 ns), for metal-coatedmirror 2L, in position A C136
20i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 81 (162-183 ns), for metal-coatedmirror 2L, In position A C137
21a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9a (0.25-33.8 ns) . for metal-coatedmirror 2L, in position B C139
21b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9b (33.8-67.3 ns), for metal-coatedmirror 2L, in position B C140
21c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9c (67.3-101 ns), for metal-coatedmirror 2L, in position B C141
21d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9d (101-134 ns). for metal-coatedmirror 2L, in position B C142
21e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9e (134-168 ns). for metal-coatedmirror 2L, in position B C143
Figure
21f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9f (168-201 ns), for metal-coatedmirror 2L, in position B CI44
21g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9g (201-235 ns). for metal-coatedmirror 2L, in position B C145
21h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9h (235-268 ns), for metal-coatedmirror 2L. in position B C146
21i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 9i (268-293 ns) . for metal-coatedmirror 2L, in position B C147
22a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 10a (0.0-5.0 ns), for metal-coatedmirror 6L C149
22b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 10b (5.0-10.0 ns), for metal-coatedmirror 6L C150
22c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 10c (10.0-15.0 ns). for metal-coatedmirror 6L C151
22d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lOd (15.0-20.0 ns), for metal-coatedmirror 6L C152
22e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lOe (20.0-25.0 ns), for metal-coatedmirror 6L C153
Figure
22f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lOf (25.0-41.3 ns), for metal-coatedmirror 6L C154
22g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lOg (41.3-57.5 ns). for metal-coatedmirror 6L C155
22h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lOh (57.5-73.8 ns), for metal-coatedmirror 6L C156
22i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 101 (73.8-88.0 ns), for metal-coatedmirror 6L C157
23a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 11a (0.0-37.0 ns) , for metal-coatedmirror 7L in position A C159
23b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lib (37.0-70.5 ns). for metal-coatedmirror 7L in position A C160
23c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lie (70.5-104 ns). for metal-coatedmirror 7L in position A C161
23d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lid (104-138 ns) , for metal-coatedmirror 7L in position A C162
23e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. lie (138-171 ns). for metal-coatedmirror 7L in position A C163
Figure Page
23f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. llf (171-205 ns), for metal-coatedmirror 7L in position A C164
23g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. llg (205-238 ns). for metal-coatedmirror 7L in position A C165
23h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. llh (283-272 ns) . for metal-coatedmirror 7L in position A C166
23i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. Ill (272-313 ns). for metal-coatedmirror 7L in position A C167
24a The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12a (250-284 ns), for metal-coatedmirror 7L in position B C169
24b The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12b (284-317 ns). for metal-coatedmirror 7L in position B C170
24c The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12c (317-351 ns), for metal-coatedmirror 7L in position B C171
24d The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12d (351-384 ns), for metal-coatedmirror 7L in position B C172
24e The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12e (394-418 ns), for metal-coatedmirror 7L in position B C173
Figure j^ge
24f The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12f (418-451 ns), for metal-coatedmirror 7L in position B C174
24g The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12g (451-485 ns), for metal-coatedmirror 7L in position B C175
24h The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12h (485-518 ns) , for metal-coatedmirror 7L in position B C176
24i The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12i (518-552 ns). for metal-coatedmirror 7L in position B C177
24j The pre-irradiation reflectivity comparedto the transient reflectivity based onFig. 12j (552-593 ns), for metal-coatedmirror 7L in position B C178
1 Pre-irradiation reflectivity for dielectricmirror number 14 D2
2 Pre-irradiation reflectivity for dielectricmirror number 12 D3
3 Pre-irradiation reflectivity for dielectricmirror number 13 D4
4 Pre-irradiation reflectivity for dielectricmirror number 26 D5
5 Pre-irradiation reflectivity for dielectricmirror number 1L D6
6 Pre-irradiation reflectivity for metal-coated mirror number 2L 07
7 Pre-irradiation reflectivity for metal-coated mirror number 6L D8
8 Pre-irradiation reflectivity for metal-coated mirror number 7L D9
1. Introduction
Since the advent of the Strategic Defense Initiative (SDI),
questions have appeared on reliability of key components exposed to
radiation fields. Regardless whether the radiation fields originate
from cosmic-ray background, enemy attack, or from nuclear reactions
in the system, the SDI system components and laser mirrors must
retain integrity and reliability In order to function within design
parameters. In addition, mirror radiation damage could be an
important problem in nuclear-pumped lasers, free-electron lasers and
inertlal-conf inement fusion laser systems. The goal of the work was
to assess the radiation effects on the mirrors as a function of dose
and dose rate.
Another purpose of the research was to determine the transient
reflectivity response of laser mirrors when the mirrors were exposed
to a variety of currents and charges. The researchers looked for
statistically significant deviations from the pre-irradlation mirror
reflectivity.
The scope of the work is limited to high energy and
flux-density electrons to simulate both an electron field and the
secondary effects from a gamma-ray field. The high energy and
flux-density electron fields were generated using an electron linear
accelerator (LINAC)
.
Three different types of laser mirrors were used in the
experiments. All of the mirrors were produced by coating a
fused-slllca substrate ( 5 cm diameter, 1 cm thick circular
2
cylinder). Coatings over the substrate were either a thin layer of
aluminum, a thicker layer of silver on top of a copper layer, or
multiple layers of Al„03+Si0
2dielectric material.
Previous work on radiation damage to laser mirrors has
addressed long-term and transient damage and damage mechanisms.
Although the ultimate question on radiation damage may be answered
for the steady-state case, knowledge of mirror transient behavior
and annealing processes is not completely researched (17).
Transient radiation damage studies of various materials have
been conducted by several authors. However, the specific questions
regarding radiation damage to laser mirrors, their coatings and
substrates is poorly understood. Although some comparisons to
previous work are outlined in the review of literature chapter, no
other papers directly cover the type of work summarized in this
thesis.
3
2. Review of Literature
Transient radiation damage has been investigated for many
materials and forms of radiation. Of the available papers, the most
useful include transient studies on fiber optics, dielectric
electronics, and laser mirrors with a silicon-dioxide substrate.
Unfortunately, the number of papers discussing the transient effects
for the materials of interest represent a small fraction of the
works covering transient radiation damage. The number of useful
papers is further reduced when the time interval of the observed
transient, type of radiation and irradiated material are considered.
Papers cited in the review section were found through an
extensive search of DOE and DOD unclassified documents and the
INSPEC data base. The reports used in section 2.1 are a subset of
the wealth of material available from studying transient effects on
optical fibers and electronic equipment. Conversely, the material
in section 2.2 represents the bulk of information available on
transient properties of mirrors. In all papers reporting transient
behavior, the transient absorption was based on changes in
transmit tance, not reflectance.
2.1 Transient Radiation Effects on Optical Fibers and ElectronicEquipment
Because relatively few papers address transient radiation
damage to laser mirrors, the review of literature was expanded to
cover transients in fiber-optic cables and electronics. Most of the
papers dealing with transient effects of radiation on ceramic
4
electronics resulted from underground nuclear-weapons testing. The
papers covering transient effects on electronics provide good
theoretical bases for understanding the effects of nuclear-weapon
radiation on ceramic or glass optical components (18) (19) (21).
The information from weapons tests is useful for the research
described in this thesis because the radiation fluences incident on
the mirror during operation would be of the same magnitude of those
present in a weapons test (4).
The goal of the fiber-optic research was to determine the
effects of wavelength, fluence, and fiber history on the
transmission of the fiber. The same effects are important in the
study of laser mirror transients. A study on the effects of
ultraviolet radiation on fused-silica optical fibers showed a
"...sharp, quasiexponential transmission decay immediately upon
exposure to 248 nm excimer pulses." The transmission was observed
to drop in the fused-silica fibers as a result of irradiation with a
KrF excimer beam at 248 nm. Furthermore, the fibers took between
two to three weeks to return to 10% of their original
pre-irradiation transmissions after irradiation at 1 Hz to 25 Hz
with 15 ns pulses of laser light having a fluence of a few mj/cm .
The transient effects of the ultraviolet radiation on the
fused-silica fiber-optic cable became more apparent as the KrF
excimer laser pulse repetition rate was reduced (20). Host
importantly, transient absorption was observed in the
silicon-dioxide cable at 248 nm.
5
A study by Hopkins et. al. detected transient behavior in
several fibers of various construction when the fibers were exposed
to 22 HeV electrons in 40 ns to 50 ns pulses from the EG&G electron
linear accelerator (LINAC) . Although the total charge in each pulse
was around 9 nC, enough electrons were present to cause a
significant transient radiation effect in the nanosecond time
region.
Hopkins also stated the energies required to displace a silicon
or oxygen atom creating a color center are 260 keV and 160 keV,
respectively. However, the number of silicon and oxygen
displacements were small in comparison to the number of free
electrons present from irradiation. Hopkins stated both free
electrons and color centers were responsible for most of the reduced
transmission (15). Although the fibers were not constructed of
silicon dioxide exclusively, similar transient effects would be
expected for silicon dioxide fibers exposed to electron pulses.
The effects of intense radiation on optical fibers In short
times, less than 100 ns, were studied by Lyons, et. al. (16). Lyons
reported some success in describing the transient light attenuation
of optical fibers given doses on the order of 1 Mrad, using a
recombination model.
2.2 Transient Radiation Effects on Laser Mirrors
A paper by Brannon et. al. is one of very few sources of
information on the effects of reactor radiation on the optical
6
properties of laser mirrors. According to Brannon, Induced
absorption from radiation can be removed by annealing. Furthermore,
the induced absorption depends on the total ionization dose instead
of displacements from neutron Irradiation. The results of Brannon
verified earlier work by Compton and Arnold confirming the ionizing
radiation plays a significant role in radiation damage to fused
silica for most situations. However, the utility of the results of
Brannon are limited because the transients effects were sought on
the microsecond time scale, not the nanosecond scale, and the
radiation Included gamma-rays and neutrons (17) (22).
In other closely related work. Mace and Gill observed transient
visible absorption In fused silica at 514 nm when irradiated with
200 ns pulses of electrons. Mace and Gill observed no visible
transient effect on aluminum-coated or dielectric mirrors at 514 nm
(23).
In another study using 7940 fused silica, Siegel and Grissom
observed transient absorption at 210 nm when irradiating samples
with 50 ns pulses of electrons. No absorption was seen at
wavelengths above 300 nm (24) (25).
Finally, Brannon notes the transient absorption coefficient at
257 nm for 7940 fused silica exposed to reactor radiation is smaller
than the coefficients for MgF„, BaF„, or sapphire. The latter
materials were all considered possible substrate materials. "This
implies that 7940 fused silica Is the best choice of materials for
reactor-pumped lasers that operate at a wavelength near 257 nm"
(17). In the case of the KrF laser operating at 248 nm, the
fused-slllca substrate Is expected to exhibit a measurable transient
response to electron irradiation. However, the expected transient
response would be less than transients observed for the other
substrate materials mentioned above.
8
3. Laser Mirrors
3.1 Laser Mirror Types and Construction
Three mirror types were used in the experiments, all having a
fused-silica substrate. Coatings were either a thin layer of
aluminum, a layer of silver on top of a layer of copper or
dielectric multilayers of Al-O, and SiO„. All mirrors were right
circular cylinders 5.0 cm in diameter and 1.0 cm thick. The mirrors
used in the experiments, their coatings and identification numbers
are listed in Table 3.1.
Table 3.1 The construction of the metal-coated mirrors (MCM) anddielectric-multilayered mirrors (DMM) used in the transient radiationeffects study.
MirrorIdentification MCM or DMM
Coating Thickness
Aluminum Copper
(nm)
Silver
1L MCM 100 190
2L MCM 100 200
6L MCM 200
7L MCM 200
12 DMM
13 DMM
14 DMM
26 DMM
3.1.1 Dielectric-multilayer Mirror Construction
The dielectric-multilayer mirrors were designed for a KrF
eximer laser operating at 248 nm. The mirror coatings from the
fused-silica substrate to the atmosphere are given by:
S[(HL)24
H(L)2]AIR (3.1)
where
and
S = Fused-silica substrate.
H = High refractive-index material. (Al-O,) .
L = Low refractive-index material, (Si0„) ,
AIR = Surrounding air medium.
That is. the fused-silica substrate is followed by twenty-four
layers of (HL) , one layer of H and finally a double layer of L. The
quarter-wavelength design thicknesses and refractive indices for the
dielectric mirror layers and substrate are givien in Table 3.2.
Table 3.2 The refractive indices and design thicknesses for thequarter-wavelength coatings and substrate of the dielectric-multilayer mirrors for the KrF eximer laser.
Layer orSubstrate
RefractiveIndex
DesignThickness (nm)
Fused Silica
H (A12 3)
1.50
1.66
1.0 E+07
37.3
L (Si02 )
,2 1
10
1.46
1.46
42.5
84.9
3.1.2 Metal-coated Mirror Construction
The mirror coatings from the fused-silica substrate to the
atmosphere for the aluminum-coated mirrors are given by:
S[A1]AIR
where S = Fused-silica substrate,
and Al = Aluminum coating.
Similarly, for the copper-and-silver-coated mirrors, the
following formula applies:
(3.2)
where
and
S[CuAg]AIR
S Fused-silica substrate,
Cu Copper coating,
Ag = Silver coating.
(3.3)
1 oThe final half-wave length layer L serves to protect the mirrorfrom environmental threats, e.g., corrosive excimer-laser gases.
11
As a short-hand notation the copper-and-silver-coated mirrors
are called CuAg mirrors. The short-hand notation does not imply the
copper and silver are bound chemically. The design thicknesses and
refractive indices for the substrate and coatings for the
metal-coated mirrors are given in Table 3.3.
Table 3.3 The design thicknesses and refractive indices for thesubstrate and coatings of the metal-coated mirrors. The optical propertiesfor the evaporated metal coatings are taken from Ref. 26.
Layer orSubstrate
Wavelength(nm)
RefractiveIndex
ExtinctionCoefficient
DesignThickness
(nm)
Fused Silica 248 1.50 1.0 E+07
Aluminum 260 0.19 2.85 200
Copper 200 0.94 1.51 100
Silver 260 1.45 1.35 200
3.2 Mirror Optical Characteristics
Optical properties of interest in the experiment were limited
to pre-irradiation reflectivities and transient reflectivities at
near-normal incidence. As the reader may verify by checking the
12
experiment geometry in Fig. 4.2, the transient transmission could
2not be obtained. The pre-irradiation reflectivity for the
metal-coated and dielectric mirrors was measured using a CARY 2300
spectrophotometer at the Air Force Weapons Laboratory, Kirtland Air
Force Base. The complete set of pre-irradiation mirror
reflectivities is found in Appendix D. Except when stated
elsewhere, all reflectivities were measured with the incident light
source ten degrees off normal.
A companion work on the permanent effects of electron beam
irradiation of laser mirrors was carried out by Scronce (1). The
mirrors used by Scronce were of the same design as the mirrors used
in the transient study, summarized here.
3.2.1 Dielectric Mirror Reflectivities and Transmissions
A theoretical model, developed by Scronce, for the dielectric-
multilayer mirrors, produced analytical reflectivities comparable to
the experimentally obtained reflectivities. By accounting for
variable indices of refraction and source light angle of incidence,
Scronce was able to to match the thoeretical and experimentally
m> transient transmission measurements were made because themirrors were placed immediately in front of the LINAC beam portwindow. The mirror placement immediately in front of the beamwindow was necessary to insure the mirrors were exposed to themaximum dose and dose rate. Placing the mirrors further from thebeam port window would have reduced the dose and dose rate at theirradiation spot because of beam divergence.
13
determined peak reflectivities for the dielectric-multilayer mirrors
to within 1.6% at half maximum. However, the off-peak interference
patterns did not match at the relative maxima and minima, suggesting
the need for further refinements in the theoretical model (1).
Pre-irradiation theoretical reflectivities for various angles
of spectrophotometer light source incidence and the experimentally
measured reflectivity for a typical dielectric-multilayer mirror are
shown in Fig. 3.1. Although the reader may be able to identify
slight variations between the experimentally measured reflectivity
in Fig. 3.1 and the reflectivity curve for other dielectric mirrors,
the variations are believed to be insignificant with respect to the
theoretical model from Scronce (1).
The general expression describing conservation of energy for
light incident upon a surface is given by Eq. (3.4),
1 = R + (T + A) (3.4)
where T Transmission,
R Reflectivity,
and A = Absorption.
Because the experimental design allows for measurement of mirror
reflectivity only, the transmission and absorption terms are shown
as the combined term (T + A)
.
The dielectric mirror transmission can be estimated by solving
Eq. (3.4) for (T + A) given the reflectivity, or found by
14
experimentally measuring the transmission in a spectrophotometer.
No significant differences were noticed in comparing the measured
transmission to the transmission found using Eq. 3.4 for the
dielectric mirrors used in the steady-state study. Thus,
pre-irradiation transmissions of the mirrors in Table 3.1 can be
found by using Eq. 3.4. The transmissions found using Eq. 3.4 are
accurate to within a few percent of the experimentally-measured
transmissions for the dielectric mirrors.
3.2.2 Metal-coated Mirror Reflectivities and Transmissions
Typical pre-irradiation reflectivities for the two types of
metal-coated mirrors are shown in Fig. 3.2 and 3.3. The mirror
reflectivities were determined spectrophotometrically using the CARY
2300' s double-bounce technique described in section 4.1.1.
Theoretical reflectivities for the metal-coated mirrors can be
derived given the refractive indices for the coatings as a function
of wavelength. Hecht and Zajac state the reflectance of a metal
plate is given by Eq. (3.5):
R(M={(ne(X)-l)/(n,(X)+ l)}*{(n.(X)-l)/(n
c(X) + l)}* (3.5)
where R = Reflectivity of the metal mirror,
ncH Complex index of refraction = n^-in
nj and nj = Real numbers,
and
X = Wavelength.
i = Square root of -1.
15
Equation (3.5) is constrained to the simplest case of normal
incidence and an index of refraction of unity for the medium of
incident light. Although empirical relations for the complex index
of refraction are available, comparisons of the metal-coated mirror
reflectivities will be based on Fig 3.4. 3.5 and 3.6 taken from
Hecht and Zajac (2) (3).
Figures 3.4, 3.5 and 3.6 show the spectral reflectance at
normal incidence for metal film coatings of silver, aluminum and
copper (2). The reader will notice many similarities in comparing
the typical aluminum-coated mirror of Fig. 3.2 to the
aluminum-coated mirror of Fig. 3.4.
Also, by comparing Fig. 3.3 to Fig. 3.5 and 3.6, the reader
will notice the thickness of the silver on the copper- and
silver-coated mirrors accounts for most of the reflectivity. The
silver is the dominant reflecting medium while the copper acts as an
adhesive between the fused-silica substrate and silver layer.
According to H.J. Donnert, the mirror manufacturers found the silver
layer would not adhere to the fused-silica substrate without an
interface material, like copper, to join both materials (4).
Because the silver layer dominates, the copper and silver-coated
mirrors can be approximated by a single-layered silver mirror,
without concern for the optical properties of the copper underlayer.
Although the technique used in section 3.2.1 can accurately
predict the pre-irradiation transmission for the dielectric mirrors.
16
no similar technique is available to predict the the transmission
for the metal-coated mirrors because the metal coatings have
non-zero absorption.
17
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23
4. Experimental Methods and Materials
Before any mirrors could be irradiated, pre-irradlation mirror
reflectivity had to be measured. Then the mirrors could be exposed
to radiation from the electron linear accelerator, LINAC, and tested
for transient radiation damage or statistically significant
deviations from the pre-irradiation
reflectivity.
4.1 Determining the Pre-irradiation Mirror Reflectivity
For each mirror the square of the reflectivity was measured
using a CARY 2300 spectrophotometer at the Air Force Weapons
Laboratory, Kirtland Air Force Base. The CARY 2300 can perform
three basic measurements: reflectivity squared, transmission, and
optical density. The CARY 2300 is incapable of measuring the
reflectivity of a sample directly because the spectrophotometer
source light bounces off the sample twice before being measured in a
photo-multiplier tube (PMT).
4.1.1 Operations of the CARY 2300 Spectrophotometer
Before measuring the reflectivity of a sample mirror, the
mirror is placed in the spectrophotometer sample chamber and on the
optics plate shown in Fig. 4.1. Once the mirror face is aligned on
the optics plate in the chamber, the CARY 2300 spectrophotometer
uses one of to three lamps to generate the light incident on the
sample mirror. The lamps cover the infrared and near-infrared
24
(tungsten), visible (quartz-Iodide), and ultraviolet (hydrogen)
wavelength regions with the quartz-iodide lamp overlapping
wavelengths in the infrared and ultraviolet regions. The CARY 2300
varies the size of an aperture depending on the lamp intensity so
the light intensity incident on the sample mirror remains roughly
constant for a given wavelength.
In measuring the square of the mirror reflectivity, the CARY
2300 uses a double-bounce technique. In the double-bounce technique
the source light hits one mirror location approximately 10 degrees
off the mirror normal. Then, the reflected light coming from the
sample mirror is reflected back to the sample mirror to a second
location but still at 10 degrees off normal. Finally, the light
coming from the second reflection off the sample mirror is collected
in the photomultiplier tube of the CARY 2300.
Mirror reflectivity could be found by taking the square root of
the PMT signal before the signal is recorded on the
spectrophotometer strip-chart. But, because the strip-chart curves
needed to be digitized for input to a personal computer regardless
of original data form, no circuit to take the square root of the PMT
signal was installed. Instead, each reflectivity-squared curve, i.e.
the unaltered PMT signal recorded on the strip-chart, was digitized
by eye and converted to a reflectivity curve using the HP 9816
personal computer.
Initial reflectivity measurements on all mirrors were conducted
between 200 and 900 nm at the slowest strip-chart speed. The
25
Initial measurements showed no absorption centers, so chart speed
was increased for subsequent measurements. After determining the
mirrors had no absorption centers, the reflectivity spectrum was
recorded only in the region of interest between 200 run and 371 nm
for both the dielectric mirrors and for the metal-coated mirrors.
The complete set of pre-irradiation reflectivities for all mirrors
is found in Appendix D.
4.2 Mirror Irradiation
All mirrors were irradiated using an electron linear
accelerator at the EG&G Irradiator Facility, Goleta, California.
Due to the complexity of performing a single irradiation and the
details behind preparing the LINAC for an irradiation, only the
basic steps in irradiating a mirror will be covered. Thus, the
specific accelerator settings required for each electron beam pulse
will not be discussed because the accelerator settings were solely
under the control of the EG&G employees.3
However, the beam
alignment and energy, mirror placement and optics arrangement were
controlled by the researchers and will be discussed.
Tfote, additional preparation was needed for installation of a watercooling system for the LINAC beam port on the longer pulses andhigher current irradiations. The water cooling system was installedto prevent the beam port window from melting during the long pulseand high current irradiations.
26
All mirrors, except dielectric mirror 26. were irradiated with
one single pulse of electrons from the LINAC. Mirror 26 was exposed
to multiple irradiations because of its use in optics alignment.
4.2.1 Preparing for Mirror Irradiation
Before any mirrors could be irradiated, the experiment's
optical components needed to be set up and properly aligned. The
aligned optical components and the supporting electronic equipment,
shown in Fig. 4.2. are identified in Table 4.1:
Table 4.1 A list of the optical components of Fig. 4.2. theirmanufacturers and serial numbers.
Equipment Name
Video Cameramodel C1000 type 18
Temporal Dispersermodel C1370-01
High Voltage PowerSupply model C1307
Monochromatorcat. no. 82-498
U.V. Flash Lamp
Trigger Input toFlash Lamp
Camera Power SupplyCI000
Polyprocessor FrameImage Analysis System
Manufacturer ID/Serial Number
Hamamatsu Tu Co. Ltd. 38027479
Hamamatsu Tu Co. Ltd. 83038034
Hamamatsu Tu Co. Ltd. 83038034
Jarrell Ash, Div. of 728427Fisher Scientific Co.
Chelsea Instruments Ltd. L59109
Chelsea Instruments Ltd. 127
Hamamatsu Tu Co. Ltd. 83027479
Hamamatsu Tu Co. Ltd. 8303003
27
2 Inch CylindricalOptics Holder
Quartz Condensing Lensf= 0.2 mPulsed Xenon LightSource Model 3021
Keyboard & Monitor
Ealing
Ealing
Chelsea Instruments Ltd. FX108AU
Hamamatsu Tu Co. Ltd. 8303003
The equipment on the optical table (see Fig. 4.2) was aligned
in two steps. First, with a sample mirror mounted in the optics
holder, the xenon flash lamp was fired manually until the flash
passed through a condensing lens, off a pellicle mirror and formed a
spot on the sample mirror roughly 1.6 cm in diameter. Next, the
xenon flash lamp was fired manually until the streak camera
detector, i.e. the video camera, output was maximized. The light
signal received at the streak camera originated at the xenon lamp,
had passed through two condensing lenses and an aperture and
reflected once off the sample mirror and twice off the pellicle
mirror. The relative output for the pulsed xenon light source is
shown in Fig. 4.3.
After aligning the equipment on the optical table, the spot the
xenon flash lamp hit the sample mirror had to be aligned with the
LINAC electron beam spot, also about 1.6 cm in diameter. The
electron beam alignment was accomplished using a HeNe laser and a
piece of aluminum foil covered with a phosphor.
28
In a previous set of experiments, dielectric mirror 26 was used
as a target for beam alignment. Thus, dielectric mirror 26 was
chosen again for alignment of the beam for the transient
experiments. With mirror 26 in the optics holder, the xenon lamp
was fired until the light from the xenon lamp was centered on the
HeNe laser beam. Next a phosphor-coated aluminum sheet was placed
over the beam port window of the LINAC. By firing the LINAC and
adjusting the beam with a series of electromagnets, the LINAC beam
and the laser beam were aligned based on the location of the glowing
beam spot on the phosphor-coated aluminum sheet. After turning the
accelerator off. mirror 26 was removed and replaced with a pristine
sample mirror, coated side facing the pellicle mirror. Finally,
before the pristine mirror could be Irradiated, an edge of the
mirror was marked with a pencil or pen to align the mirror with a
similar line on the optics holder. Alignment of the mirror in the
optics holder was necessary for post-irradiation steady-state
studies for Scronce (1).
Periodically after beam alignment and just prior to the
irradiation of a mirror at a unique dose and dose rate, radiochromic
film was attached to the surface of mirror 26 to check beam shape,
intensity, and strength. With mirror 26 in the optics holder, the
mirror and the radiochromic film were exposed to a series of beam
pulses. Then, the radiochromic film was developed by the EG&G
personnel, yielding an average pulse shape, strength, and intensity.
If the pulse shape strength or Intensity did not check with their
29
expected shape or values, appropriate adjustments were made to the
LINAC by the controller. A sample output of the radiochromlc
dosimetry is shown in Fig. 4.4.
4.2.2 Beam Shots with Block-in and Block-out
With the mirror alignment completed and beam shape, strength
and intensity confirmed, the pristine mirror in the optics holder of
Fig. 4.2 was irradiated with a beam of electrons. Mirror
irradiation consisted of two LINAC shots, one with a large copper
block in the path of the electron beam (block-in) and the other shot
with the copper block out of the path of the electron beam
(block-out).
The block-in shots allowed the researchers to estimate the
amount of noise associated with each electron pulse. With the
block-in, none of the electron beam made its way through the copper
block to the mirror. Thus, the signal received at the detector and
recorded on magnetic tape was a combination of noise, xenon
spectrum, condensing lens transmissions and mirror reflectivities.
The block-out pulse did the actual irradiation of the mirror
i.e. with no copper block to absorb the electron beam, the beam hit
the mirror. For mirrors irradiated once, the beam hit the mirror in
position A (see Fig. 4.5). However, mirrors irradiated twice were
shot in position A, then rotated in the optics holder to irradiate
position B. The signal received at the detector for the block-out
shots was a combination of noise, xenon spectrum, mirror
30
reflectivities, lens transmissions and the transient reflectivity
effects of the electron beam pulse.
4.2.3 Beam Characteristics
The mean energy of the electrons leaving the LINAC beam port
window was 16.5 MeV. The electron beam was focused to irradiate a
circular area about 1.6 cm in diameter. The beam was Gaussian in
shape and could be approximated by a square wave in pulse length.
For confirmation of the beam shape profile, see Fig. 4.4. A sample
black-and-white photograph showing a typical beam pulse shape, pulse
length, and net current for the block-out irradiation of dielectric
mirror 14 is shown in Fig. 4.6.
4.3 Data Recording
For each block-out and block-in shot, the monochromator
repeatedly scanned through a preset window of wavelengths while the
video camera recorded during a preset time interval determined by
the temporal disperser. In most cases, the time window began before
the electron pulse initiated. For example, for dielectric mirror 13
irradiated in position A, the time window included data values
recorded 30 ns before the beam hit the mirror to 313 ns after beam
initiation. In the figures of Appendix A, all times are reported
with respect to the pulse initiation. Thus, for dielectric mirror
13 irradiated in position A. the time intervals reported begin at
-30 ns and end at 313 ns.
31
The data collected at the streak camera detector were made of
471 scanllnes each with 512 channel values. Each channel value
corresponds to a specific time while each scanllne corresponds to a
wavelength. Time and wavelength calibrations will be taken up In
the following section. A sample of data from the block-out file of
dielectric mirror 14 Irradiated in position A is shown in Table 4.2.
The light Intensity versus wavelength and time data were
collected at the streak camera detector and sent to EG&G's VAX-11
Computer for analysis. Once in the computer memory, the data were
analyzed on the Hamamatsu monitor and dumped to magnetic tape. For
the studies mentioned in the thesis, the data were recorded in
binary format on the VAX tape, read from the VAX tape at Kansas
State University and restored on a tape compatible with the KSU
computer system. The program used to strip the binary data from
EG&G's VAX tape is listed in Appendix B.
In addition to the data on magnetic tape, color pictures
representing the data stored on magnetic tape were taken by the EG&G
personnel. The color levels on the pictures represent the varying
light intensities seen at the streak camera detector versus time and
wavelength. A sample color photograph for the block-out Irradiation
of dielectric mirror 14 is shown in Fig. 4.6. A complete set of
color photographs can be found in Appendix E.
32
Table 4.2 Sample data from scanllne number 10 for theblock out irradiation of mirror 14.
icanl i no Number 1082 90 103 99 78 0779 06 or. 84 110 10193 SO 03 07 88 C3
101 87 03 04 7 7 89_cr, 70 79 80 71 77
131 0-1 79 77 61 07
69 76 09 98
Ofl LOS 104 100 96 84 7666 79 75 07 90 77 9307 102 84 92 90 82 9077 83 82 03 79 87 7572 76 72 99 93 06 8200 60 95 111 06 78 7505 65 03 00 78 70 6300 01 83 75 03 66 7074 73
7177C6
G676
8283
5673
6264
79 60 67 60
«l 61 70 62 G2 73SO 68 68 61 G2 53 65 57 66 61 71 59 69
63 68 51 69 60 53 5661 57 60 59 64 60 6037 51 " « S7 62 68 04 71 46 in r,l al r," S " « g M CI 60 60 60 S
"S 606 ' SI 42 66 59 67 G6 71 41 ti it I, i. .,
7007
62 46 67 07 70 03
72 04 07 70 6363 Gl 54 72 60
,00 92 03 90 98102 86 99 98 |]6117 139 125 ion 93127 in 110 128 106
66 73 72 77 63 60 72 91 104 9395 75 77 86 90 65 05 75 02 8409 102 127 116 91 03 05 00 02 9305 or, 106 121 97 100 05 04 92 116119 no 114 170 107 137 144 135 131 MO122 132 130 126 125 113 104 105 91 11 7122 107 117 115 113 M 112 116 115 100
33
4.4 Time and Wavelength Calibrations
4.4.1 Time Calibration
Time calibration of the block-out and block-in data files was
based on the time interval settings of each irradiation. Table 4.3
lists the time interval data were recorded for each block-out and
block-in shot for the mirrors in Table 3.1.
Table 4.3 The block-out and block-in time intervals for eachmirror of Table 3.1 and the block-out pulse length and mean current. Thetime interval defines the start and end of data recording.
MirrorNumber
IrradiationPosition
Time Interval(ns)
Start End
Block-
Pulse Length(ns)
-out
Mean Current(A)
1L A -40.0 to 88.0 20.0 5.0
2L A -160 to 183 200 0.225
2L B -50.0 to 293 200 0.225
6L A -40.0 to 88.0 20.0 5.0
7L A -30.0 to 313 500 0.225
7L B 250 to 593 500 0.225
12 A -30.0 to 313 500 0.225
12 B 250 to 593 500 0.225
13 A -160 to 183 200 0.225
13 B -50.0 to 293 200 0.225
34
W A -40.0 to 88.0 20.0 5.0
26 A -30.0 to 313 500 0.225
To find the time, in ns, corresponding to a channel for any of
the 512 channels in a block-in or block-out data file, Eq. 4.1 was
used.
t(CH) = tw* (CH - 1) / 511 + t (4.1)
where t B The time from the initiation of the electron beam pulse(ns),
lw- The time interval of Table 4.3, (ns).
CH Channel number (integer from 1 to 512).
and tQm The starting time in the time interval of Table 4.3,
(ns).
For example, for mirror 1L, the time corresponding to channel
40 is found by using Eq. 4.1:
Given: tw
from Table 4.3 is 88.0-(40.0) or 128 ns. the time
interval for the irradiation,
and * fr°m Table 4.3 is -40.0 ns, the starting time in
the time interval
.
Substituting values,
t(40) = 128 ns * (40-l)/511 + (-40.0 ns)
35
yields t(40) = -30.2 ns, i.e. 30.2 ns before the electron pulse hit
the sample mirror. Similarly, at channel 161, t(161) equals
0.33 ns, roughly the start of the electron beam hitting the mirror.
Channel 241 corresponds to 20.1 ns after the beam initiated firing
on the mirror and also marks the end of the electron beam pulse for
mirror 1L. Finally, channel 512 marks the end of data recording,
88.0 ns after the initiation of the electron beam.
4.4.2 Wavelength Calibration
The wavelength calibration found using a mercury lamp spectrum
and a least-squares fit is given in Eq. 4.2 =
X(SC) = -0.361 nm * SC + 375.1 nm (4.2)
where X = Wavelength, (nm)
,
and SC = Scanline number (integer from 10 to 480).
For the 480 scanlines per data file, the wavelength range spans from
201 nm to 371 nm. Equation 4.2 is a linear least-squares fit based
on the known wavelengths of the mercury lamp spectrum and
corresponding scanline numbers read off the Hamamatsu monitor.
Unfortunately, a check of the wavelength calibration given by
Eq. 4.2 was impossible due to a recording error on the VAX magnetic
tape. The researchers hoped to check the initial calibration based
on the values read from the monitor by using the mercury lamp
spectrum recorded in the same format as the irradiation data.
However, an error in recording occurred, thus leaving the
36
researchers with the calibration In Eq. 4.2. The loss of the mercury
spectrum was not catastrophic because the researchers recorded the
necessary information to perform the calibration in a separate log.
The difference between the two calibrations was expected to be
insignificant.
37
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20 ns pulse, 5 A, 20 pulses, 601 x 11 nm filter
Lamp set to 3.60 V, Peak dose = 2.102Total Integrated dose 0.56 MRad cm
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Flg. 4.4 Sample radlochromlc dosimetry output for metal-coated mirror 6L. The radiochromic film was shot20 times with the beam used to irradiate mirror6L.
41
(a)
SHHKAll £ ii
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BB ggjggg
(b)
Fig. 4.6 Sample color photographs of raw data (a)
and beam profile (b) for the electronirradiation of dielectric mirror 14. Thecolor levels identify the light intensitylevel at the camera detector.
43
5. Theory of the Experiment and Data Analysis
The purpose of this section is to detail the theory and data
analysis directly related to the design of the experiment. The
optical theory is used in interpreting the light intensity seen at
the streak camera detector, while the theory on data analysis is
developed to provide transient mirror reflectivity.
5.1 Theory of Experimental Optics Arrangement
The theory of the experiment is based on the optics design
shown in Fig. 4.2. From Fig. 4.2. the signal light intensity versus
wavelength and time seen at the streak camera for a block-in pulse,
i.e. a beam shot where the electron beam does not irradiate the
mirror but is stopped in a copper block, is given by Eq. 5.1.
I(X.t) = I(X.t) * T(X.t) * T(X,t) * R(X.t) * R(X,t)2 * L(X. t) (5.1)
SCDi FL LI L2 PM P
where IsCDi
= slSnal light intensity seen at the streak camera
detector for the block-in irradiation.
IFL ~ Xenon light intensity leaving the xenon flash lamp,
T^j Transmission for the condensing lens in line with
the xenon flash lamp and pellicle mirror,
T, 9 = Transmission for the condensing lens in line with
the pellicle mirror and streak camera detector,
Rp„ The pristine sample mirror reflectivity.
44
Rp * The pellicle mirror reflectivity,
L = A factor estimating the fractional loss of lightfrom the xenon flash lamp due to geometry and othermechanisms, £ L £ 1,
t = Time,
and X Wavelength.
Similarly, for a block-out irradiation, i.e. an irradiation where
the electron beam is incident on the mirror, the signal light
intensity seen at the streak camera detector is given by Eq. 5.2.
2I(X,t) = I(X,t) * T(X,t) * T(X,t) * R{X,t) * R(X,t) * L(X. t) (5.2)SCDo FL LI L2 IM P
Where ISCDo
= SiSna l light intensity seen at the streak camera
detector for the block-out irradiation,
Ryu The sample mirror reflectivity under irradiation
from the electron beam.
and all previous definitions for the other variables hold. Color
photographs, representing the digitized data of the block-in and
block-out shots, are presented In Appendix E.
5.1.1 Simplification of Theory
Although Eq. 5.1 and 5.2 are exact, their utility is
questionable because the functional form of many of the variables is
45
unknown, e.g. the analytical form of T(X.t). To utilize theLI
equations to their full potential, several simplifications are used
to obtain the signal ratio. (See Section 5.2 for the definition of
the signal ratio.)
First, the optical properties of the critical spots on the
pellicle mirror and the condensing lenses did not change as a result
of the block-in or block-out shots because neither were exposed to
the LINAC electron beam. The pellicle mirror and condensing lens
placement were partly based on electron beam divergence. The EG&G
personnel determined the electron beam divergence using an electron
transport code. Based on the transport code results, the condensing
lenses and critical reflecting spots on the pellicle mirror were
placed out of the diverging electron beam path. The critical
reflecting spots on the pellicle mirror are labled A and B in
Fig. 4.2. Because the condensing lenses and critical spots on the
pellicle mirror are not affected by the electron beam, their optical
properties were not altered from the irradiation.
"Tfote, the pellicle mirror was exposed to the electron beam duringblock-out irradiation but not at the critical points shown in Fig.4.2. Using the electron range techniques described in Faw et. al.,the residual range of the 15 MeV electrons used in the experimentsis easily calculated (7). For 15 MeV electrons, an approximatevalue of electron range in the mirror's fused-silica substrate is7.5 g/cm (8) (9). Assuming negligible effects from mirror coatingsand using tabulated densities of dry air and fused silica of0.0012 g/cm and 2.16 g/cm3 respectively, the residual range of a15 MeV electron incident on a 1 cm thick fused-silica substrate iscalculated to be 5.34 g/cm2 (10). That is, the 15 MeV electronsincident on the mirrors have enough energy remaining after leavingthe mirror to travel about 4500 cm in dry air. Thus, the electron
46
Secondly, the xenon lamp intensity did vary, but not
dramatically, from block-in to block-out shots. According to the
bulb manufacturer, Chelsea, "...there is a shot-to-shot fluctuation
on lamp output of up to some 1% peak to peak", resulting from arc
discharging starting at a slightly different place on the end
electrodes (5). According to Moore, Davis and Coplan the spectral
output of the xenon bulb varies slightly during the flash and
exhibits the spectral features of the fill gas. xenon, for the flash
energy used in the experiment (6). By designing the experiment to
measure the relative change in reflectivity, the ratio of data
values represented by the signal ratios is devoid of any dependence
possible light intensity fluctuations of the xenon lamp. Even if
the shot-to-shot fluctuations were significant, the signal ratios
described in Section 5.2 would account for the variation with the
normalization function A(X)
.
5.2 Data Analysis
The transient reflectivity for the mirror was assumed to be of
the form of Eq. 5.3:
R(X.t) = R(X) * f(X,t) (5.3)T SS
beam hit and possibly interacted with the pellicle mirror. Theelectron range technique was confirmed at the EG&G IrradiatorFacility by the LINAC operators using an electron transport code.
47
where R_ = Transient mirror reflectivity.
and t = Function describing the relation between thepre-irradiation and transient reflectivities alsocalled the transient signal response function.f(X.t) is calculated from the block-in andblock-out data files as shown in section 5.2.1.
If the transient response of the laser mirrors was desired for
a specific time and wavelength inclusive in the data files, the
block-in and block-out data files could have been consulted.
Alternatively, the color pictures showing the streak camera signal
light intensity versus time and wavelength could have been used.
However, neither analysis technique is very useful. The error from
using individual observations at a given time and wavelength is
largely due to the presence of auto-correlated error. Secondly,
the photograph technique is too crude to produce quantitative
results.
See Fig. 4.6 for a sample color photograph detailing the time andwavelength dependence of the block-out signal light intensity fordielectric mirror 14.
7The error for a given data point is called auto-correlated ifdependent on the error or value of previous data. Almost everysignal-ratio plot in Appendix A demonstrates auto-correlation withrespect to the Fourier transform curve, the model of thesignal-ratio data. If the error were random, one would expectnearly the same number of signal-ratio data points randomlydistributed above and below the Fourier curve. However, thesignal-ratio data do not fall randomly above or below the Fouriercurve, thus suggesting auto-correlation.
48
Bearing in mind the statistical problems associated with
analyzing signal light intensities for single data points, the
researcher's main concerns became the general trends of the
transient signal response function over discrete pre-determined time
intervals. The block-out and block-in data files were integrated
over pre-determined time intervals and used to calculate the average
behavior of the transient signal response function. Then, the
average transient mirror reflectivity was calculated based on the
behavior of the transient signal response function for the same time
interval
.
The time integration of Eq. 5.3 was warranted for a second
reason, error analysis. Although the transient reflectivity is
hidden in the noise of the block-in and block-out data files, too
much auto-correlated noise is present to confidently predict
transient reflectivity behavior. By integrating over pre-determined
time intervals, the transient signal response function for a single
wavelength and time is lost, but the average behavior of f(X,t) in
the time region is now known. In addition, the error for the time
integrated region is usually smaller than the error associated with
a single time and wavelength observation. See section 5.3 for
details on error analysis.
To obtain the estimate for the transient reflectivity, during a
defined time interval, the steady-state reflectivity was multiplied
by the averaged value of the transient signal response function also
integrated over the same time interval, as stated in Eq. 5.4:
49
R(X.t1-> t
2) = R(X) * f(X,tr> t
2 )
ss(5.4)
where R(X,tj -> t_) = The average transient reflectivity for time
region tj -> t
f(X.tj -> tg) = The average transient signal response
function for time region t1
-> t„, also
called the signal ratio for the time region,
and tj & t2
= Time limits of the pre-determined time
regions defined in Table 5.1. (t1
< t„).
5.2.1 Determining f(X,t) and ffX.tj -> t„)
Notice f(X,t) could be found by taking the ratio of block-in
and block-out signal data as stated in Eq. 5.5.
f(X,t) = I(X,t) / I(X.t) / A(X)SCDo SCDi
(5.5)
where A(X) is defined as
t=t
A(X) = I(X).t) dt /SCDo
I(X).t) dt (5.6)SCDi
where tg
= The starting time, t., in region number one of
Table 5.1.
'e
The ending time. t„ , in region number one of
Table 5.1.
50
and all other variables are defined from previous equations. For
example, for dielectric mirror 14. t and t are -40.0 ns ands e
0.0 ns, respectively.
Now Eqs. 5.5 and 5.6 can be simplified.
f(X,t) = C2(X) * R(X.t) / (C1(X) * R(X,t) * A(X)) (5.7)IM PM
t=t
A(X,t) = R(X,t) dt /PM
t=t t=t
R(X,t) dt * C3(X) (5.8)IM
respectively, where C1(X). C2(X) , and C3(X) are constants with
respect to time resulting from applying simplifications of section
5.1.1 to Eq. 5.5 and 5.6. Furthermore, C3(X) = C2(X)/C1(X). Note,
C1(X), C2(X) and C3(X) cancel after substitution of Eq. 5.8 into
Eq. 5.7 leaving a ratio of transient and pre-irradiation mirror
reflectivity integrals.
For a given wavelength. A(X) is the ratio of the integrals of
block-out and block-in reflectivities before the electron beam has
hit the mirror. The need for the function A(X) is twofold: First,
without A(X), Eq. 5.5 could yield artificially high or low values of
f(X,t) depending on the measured signal light intensities.
Secondly, no difference in mirror reflectivities is expected before
the electron beam hits the mirror. That is, the signal light
intensity, measured at the streak camera detector, before the beam
hits the mirror should be the same for block-out and block-in
51
irradiations. A(\) affects f(X,t) by accounting for any differences
in the measured signal light intensities from a block-out to a
block-in irradiation occuring before the beam has hit the mirror.
Also. A(X) accounts for any differences in the xenon lamp
intensity between block-out and block-in shots. Although the second
simplification of section 5.1.1 is reasonable, the light emitted
from the xenon flash lamp could unexplainably vary between block-in
and block-out shots. A(X) is a normalizing factor used to match the
pre-irradiation and transient signals, contained in the block-in and
block-out files, respectively, in the time region prior to the time
the beam hits the mirror.
To find ffX.tj -> tg ) from f(X,t). integrate Eq. 5.7 over the
time region tj -> t„. Namely,
f(X.tj -> t2) =
f(X,t) dt tj i t £ tj
otherwise.
(5.9)
Now, substituting Eq. 5.7 and 5.8 into 5.9 yields the signal ratio
for tjit$ t2 .
52
f(X,tj -> t2 ) R(X.t) dt /
IMR(X,t) dtPM
R(X,t) dt /IM
R(X,t) dtPM
(5.10)
A complete set of signal ratios is contained in Appendix A.
Note, the ordinate axis label identifies the signal ratio as
Il(out)*I2(in)/(Il(in)*I2(out)). The II and 12 labels are
short-hand notation for the integrals of the signal light intensity
terms in Eq. 5.10. In the expression, II and 12 cover the different
time regions defined in Table 5.1. with 12 always defined as region
one. The (out) and (in) designations differentiate between the
block-out and block-in beam shots. From left to right, the
integrals in Eq. 5.10 are Il(out), Il(in), I2(out) and I2(in).
In addition to the signal ratios, two sets of error bars and
the inverse of a fast-Fourier transform of the signal-ratio data are
plotted. The significance of the error bars is outlined in the
error analysis section, section 5.3, while the necessity of the
fast-Fourier transform analysis is covered in section 5.2.3.
53
5.2.2 Time Integration
To calculate the signal ratio, ffX.t, -> t ), the block-in and
block-out data files were integrated with respect to time over
defined time regions. In the preliminary analysis of the block-out
and block-in data, the effects of noise on the data were obvious and
pronounced. To reduce the effects of noise on the transient data.
Eq. 5.3 was integrated over the time regions listed in Table 5.1.
Three numerical integration techniques were tried for
integrating the block-in and block-out data until the best technique
was determined. The three methods used for numerical integration
were the Romberg, trapezoidal and simple-summation techniques.
After finding the optimal integration technique, trapezoidal
integration, all subsequent integrations were carried out using the
optimal technique. A discussion on the integration techniques and
their accuracies is found in reference 12. A listing of the
computer programs used to perform the numerical integrations is
ofound in Appendix B.
gAlthough the Romberg integration technique promises to yield thebest estimate for the tightly-packed spiked data, the additionalcomputer effort and cost did not warrant the added accuracy. Infact, the maximum relative error, in comparing the simple-summationtechnique with the Romberg technique, computed using
Error = - ^0InberS Estimate - Simple-Summation Estimate /Romberg Estimate
was 0.005. Thus, even the crudest estimator of the integral, thesimple-summation technique, gave nearly identical results comparedwith the Romberg estimate. The differences between the Romberg andtrapezoidal estimates were negligible.
54
All three techniques provided nearly identical estimates for
the total integral over all times for the block-in and block-out
data. Thus, because the techniques were nearly Identical and the
trapezoid technique differs from the simple-summation technique only
at endpoint evaluation, the trapezoidal technique was chosen the
best integral estimator.
Table 5.1 Time regions used for the time integration of the block-outand block-in shots. The times t^ and t„ represent the start and
end of the time region, respectively. Also listed in the table are themirrors numbers, with corresponding irradiation positions, having thattime region division type.
Mirror Irradiation Time Region Region Time RegionNumber Position Division Type Number
(ns)
«2
(ns)
14 A I 1 -40.0 to 0.01L A 2 0.0 to 5.06L A 3 5.0 to 10.0
4 10.0 to 15.05 15.0 to 20.06 20.0 to 25.07 25.0 to 41.38 41.3 to 57.59 57.5 to 73.810 73.8 to 88.0
12 A II 1 -30.0 to 0.026 A 2 0.0 to 37.07L A 3 37.0 to 70.5
4 70.5 to 1045 104 to 1386 138 to 1717 171 to 2058 205 to 2389 238 to 27210 272 to 313
55
12 B III9
1 -30.0 to 0.07L B 2 250 to 284
3 284 to 3174 317 to 3515 351 to 3846 384 to 4187 418 to 4518 451 to 4859 485 to 51810 518 to 55211 552 to 593
13 A IV 1 -160 to 0.82L A 2 0.8 to 20.9
3 20.9 to 41.04 41.0 to 61.15 61.1 to 81.26 81.2 to 1017 101 to 1218 121 to 1429 142 to 16210 162 to 183
I3 B V 1 -50.0 to 0.252L B 2 0.25 to 33.8
3 33.8 to 67.34 67.3 to 1015 101 to 1346 134 to 1687 168 to 2018 201 to 2359 235 to 26810 268 to 293
9For time region III, the region number one files are the same asregion one files for the position A shots of the same mirror. Forexample, for mirror 7L, position B. the region one files used in Eq.5.10 are the same files used for mirror 7L, position A.
56
5.2.3 Fast-Fourier Transform Analysis of the Signal Ratios
Before Eq. 5.4 could be used to predict the transient behavior
of the laser mirrors, the noise in the signal ratios needed to be
lessened or removed. According to Aubanel and Oldham the signal-
ratio data could be smoothed using moving-average, least-squares or
Fourier-transform techniques (11). Both the least-squares and
Fourier methods were tried for noise reduction. This researcher
found the least-squares method was ineffective in predicting a
statistically significant fit to the signal-ratio data, even up to
tenth degree polynomials. Instead, the smoothed signal-ratio
curves from the Fourier transform provided a better prediction of
the transient signal ratios of Eq. 5.4.
The Fourier-transform technique used the filter function, f, ,
suggested by Reference 11, to remove high frequency noise. Namely,
fk
1 - (WE)2 k = 1,2,3, ...E-l
k = E.E+1 N-l(5.11)
Because the least-squares method was ineffective, the details ofthe technique are not included. The least-squares method used toanalyze the signal-ratio data sought polynomial fits up to the tenthdegree. In order for a given polynomial model to be judged the bestfit for a given model, the t-test statistics for highest orderparameter in the next two polynomial models needed to beinsignificant at the 95% confidence level. Polynomial models wereused exclusively in the least-squares analyses.
57
where
(N-l)/2 when N Is oddE =
N/2 when N is even
and k ranges from zero to the number of data values, N, minus one.
f^ is a commonly used digital filter function used to remove high
frequency noise found in the recording of electronic data.
The smaller the value chosen for E, the more denuded of high
frequencies the signal-ratio data became. Figures 5.1 to 5.6
illustrate the effects of varying E on the signal-ratio data of
dielectric mirror 14, irradiated in position A, during time region
seven.
5.2.3.1 Determining the Optimum E-value for the Fourier Transform
In choosing the best value of E for a particular Fourier
transform of a signal ratio, an F-test was performed comparing the
variances about the transform curve for E = 2 and E = 3. If the
F-ratio was greater than 1.164, the critical F-statistic for 470
degrees of freedom in the numerator and denominator, the E = 2 model
was rejected. If E = 2 was rejected, the F-ratio would be
The critical F statistic for 470 degrees of freedom in thenumerator and denominator was calculated using SAS, a statisticalprogramming language, and confirmed using an International Math andScience Library routine named MDGAM. All statistics, unlessotherwise stated are at the 95% confidence level.
58
re-calculated for the E = 3 model. Then, if the F-ratio Is less
than the critical F-statistic, the E = 3 model would be accepted.
For example, in Fig. 5.1. the original signal-ratio data and
Fourier transform with E=2 are plotted. Similarly, in Fig. 5.2, the
original signal-ratio data and the Fourier transform with E=3 are
plotted. The variances of the original signal data about the E=2
and E=3 Fourier transforms are 89.1 and 76.8 respectively. The
variances correspond to an F-statistic of 1.159, i.e. insignificant
with respect to the critical statistic of 1.164. Thus, the E=3
model is not significantly different than the E=2 model and the E=2
model is accepted.
The variance about the Fourier transform curves are calculated inthe same manner as the mean square of residuals is found inleast-squares analysis. That is.
I(fjtx.tj -> t
2 ) -^(x.tj -> t2 ))
5
1=1
N - 1
where f^X.tj -> t2 ) is the signal ratio at X ,
Hj(X,tj -> tg) is the Fourier estimate of the signal ratio
at X ,
2a is the estimate for the population variance,
and i=l to N data values. (N = 471 for the signal-ratiofiles.)
59
For all but one signal ratio, the E=2 Fourier transform was
accepted. Finally, the Fourier transform curves were substituted
for the signal-ratio term in Eq. 5.4 and used to calculate the
transient reflectivity for the laser mirrors. The transient mirror
reflectivities are found in Appendix C. Sample transient
reflectivity curves for each mirror type are found in Fig. 5.15 to
Fig. 5.17.
5.3 Error Analysis
Error analysis will be broken into three sections: error on
pre-irradiation reflectivity measurements, error on the signal
ratios and error on the transient reflectivities.
5.3.1 Error from Pre-irradiation Reflectivity Measurements
A source of error, not taken into account in the final
transient reflectivity curves, partly resulted from the digitizing
of the CARY 2300 strip-chart output. When the data from the
strip-chart needed analysis and digitization, no mechanical or
computer digitizer was available for use. Thus, the strip chart
curves were digitized by hand, i.e. numerical values were assigned
to points on the strip-chart curve using the naked eye. Next, the
digitized points were fed into the HP 9816 computer before being
plotted.
An estimate of 4% relative error was made for the error
resulting from using the plotting program, manual digitization of
60
the strip-chart data, and the CARY 2300. The error estimate is
based on the thickness of the line plotted on the strip-chart, the
effects of the natural cubic spline routine in the HP plotting
program, and the performance of the CARY 2300 spectrophotometer.
Once plotted, the pre-irradiation reflectivity curves were
assumed invariable, i.e., no error bars were assigned to the
pre-irradiation reflectivity curves. Instead, the reflectivity
curves were treated as constants in the propagation of error from
the signal-ratio files. Treatment of the curves as constants is
allowable considering the magnitude of the error resulting from the
signal-ratio data.
5.3.2 Error on Signal Ratio Data
5.3.2.1 Mean-Square-Residual Technique
Two techniques were used to assign error to the signal-ratio
data. In the first technique, the population mean square residual,
MSRES, is calculated using Eq. 5.12:
HSRES = SSRES / (N - df) (5.12)
N
where SSRES =J
(f.^.tj -> t2 ) - ^ (X.tj -> t
2))2
.
i=l
the sum of squares due to residual,
N = The number of data points in thesignal-ratio file (=471).
61
df = The degrees of freedom associated with thefast-Fourier transform,
fj(X.tj -> t_) = The signal ratio at X ,
and p.fAj.t -> t_) = The fast-Fourier transform estimate at X .
The definition for the HSRES is taken from least-squares theory and
poses a problem for evaluation using the Fourier analysis. In
least-squares analyses u would be defined as the predicted value
at Xj during tj -> tg. However, because the least-squares technique
failed to supply fits to the signal-ratio data, fl, was re-deflned as
stated above. The difficulty in evaluating Eq. 5.12 arises in
assigning the proper degrees of freedom, df , in the denominator. In
the least-squares method, the form of the regression function and
Its associated degrees of freedom are known, while for the Fourier
technique neither are known.
A general rule-of-thumb allows for the estimation of the
degrees of freedom associated with a given curve. Stated in
equation form,
df rs L + 1
where L is defined as the number of times the second derivative of
the curve changes sign when evaluated in the defined range of data.
Furthermore, the number of sign changes can be approximated by the
number of bends in the curve. Of course the use of the rule should
be limited to estimating the degrees of freedom (14).
62
For most of the signal-ratio Fourier curves, the number of
bends do not exceed six. Thus, the denominator of Eq. 5.12 would
vary from 465 to 470 depending on the individual Fourier-transform
curves. To standardize the error computation, Eq. 5.12 was
simplified to
MSRES ^ SSRES / 470 (5.13)
because the effect of varying the degrees of freedom was minimal in
comparison to the size of the SSRES and N.
The population estimate of the standard deviation, the square
root of the mean square residual, was calculated and used to form
one set of error bars on the signal-ratio plots. Because no
repeated measurements were made, the standard deviation, based on
the total population of data, is an acceptable standard deviation
for each signal-ratio data value. For the signal-ratio plots in
Appendix A, an approximate 95% confidence interval about the
Fourier-transform line, based on the MSRES error estimate, is
represented by the dash-dot lines. The dash-dot lines are
plus-or-minus two times the square root of the mean-square-residual
error estimate.
5.3.2.2 Moving-Mean-Square-Residual Technique
The other set of error bars on the signal-ratio plots resulted
from developing a moving-mean-square-residual technique, MMSRES.
63
The MMSRES defines a MSRES for a data point Inside a window of data
points, instead of the whole population (13).
To calculate the MMSRES for a data point in the signal-ratio
file. MMSRES, begin by numbering the 470 signal-ratio data points
from 1 to 470, e.g.
:
12 3 i-1 i i+1 468 469 470
Next, define a half-window size, NN, about the data point i and look
at the window defined by i and NN.
i-NN i-NN+2 i-1 i i+1 i+NN-2 i+NN
i-NN-1 i+NN-1
In the window defined by NN and i, there are 2(NN) + 1 data points.
The moving mean square residual for data point i is defined in Eq.
5.14:
I(f^tj -> tj) - MjCX.^ -> t
2 ))2
MMSRES. = — — (5 i 4 \I 2 * NN l *"
where the summation is taken over the full-window region, 2(NN) + 1
data points.
In evaluating the moving mean square residual for i-NN < 1 or
i+NN>N, the window size is adjusted to account for the loss of data
64
values on the shortened side. For example, with NN=50 and i=l , the
summation over nearest neighbors covers data points 1 to 51 . For
i=2, the summation covers data points 1 to 52 and so on until the
window reaches its full size at i=51 . Similarly, when calculating
the MMSRES for 1=425, the summation over nearest neighbors covers
points 375 to 470. Written another way.
i+NN
MMSRES1JSL
} (fjCX.tj -> t2 ) -HjCX.tj -> t
2 ))2
and
MHSRESj = J^ 1"™
i + NN - 1
for KNN (5.15)
N(=470)
I (fjCX.tj-^) - Uj (X,tr>t2))
2
i + NN - 1
for i > 470-NN (5.16)
Finally, to obtain the estimate of one standard deviation about data
point i, the square root of the MMSRES is taken.
The advantage of using the MMSRES technique lies in the shape
of the signal-ratio plots. The reader should notice from the
signal-ratio plot in Fig. 5. 14 the MSRES technique was very crude in
estimating error in the upper wavelength region of the plot. The
crudeness stems from accounting for the whole population variation
65
even though the variation about the Fourier-transform line for a
window of data points could be smaller. That is, the variance is
not constant within the signal-ratio data from low to high
wavelengths.
To understand the effects of window size on the value of the
error assigned to each signal-ratio data value, one must compare
various window sizes. For example. Fig. 5.7 shows the signal-ratio
data and Fourier-transform line for metal-coated mirror 2L,
irradiated in position A. with the block-out. Also shown on the
graph is a plot of the Fourier-transform line plus or minus two
times the square root of the MMSRES with a half-window size, NN, of
5. Although, with NN=5, the MMSRES technique seems to adequately
describe the error in the upper wavelength region, the first
derivative of the error associated with the lower wavelengths is
13discontinuous. Conversely, in Fig. 5.13 with NN=150, the MMSRES
technique adequately describes the lower wavelength error, while the
error for the upper wavelength signal ratios is overestimated.
Thus, an intermediate half-window size of fifty was found to be the
optimum size. The MMSRES technique adequately described the error
throughout all wavelengths with NN=50. The effect on the MMSRES for
various NN is seen in Fig. 5.7 to 5.13.
The first derivative of the error is expected to be continuousbecause it describes a real system.
66
In comparing the error estimates from the two techniques.
MMSRES and MSRES. the MMSRES technique tends to give smaller error
bands when the magnitude of the signal ratio dampens out. The
researcher believes the MMSRES describes the error for the signal
ratio of Fig. 5.14 better than the MSRES. Although, the MMSRES
technique yields larger error bars in the lower wavelengths than the
MSRES. the increase is not significantly different.
Finally, an approximate 95% confidence interval about the
Fourier-transform curve, based on the MMSRES variance estimate, is
plotted with a triple-dash on the signal-ratio plots of Appendix A.
The triple-dash curves are the Fourier curve estimate at data point
Aj plus-or-minus two times the square root of the MMSRES variance at
point Xj. The MMSRES technique for estimating error was used in the
propagation of error to find the transient reflectivities. All
errors assigned to the transient reflectivities result from the
MMSRES technique.
5.3.3 Error on the Transient Reflectivities
As stated earlier in section 5.3.1, the pre-irradiation,
reflectivity is assumed constant and error free with respect to
error propagation. Using standard error propagation techniques, the
error associated with the transient reflectivity equals the product
of the transient reflectivity and two times the square root of the
moving mean square residual at a given wavelength. That is, the
67
error bars around any transient reflectivity are found using
Eq. 5.17,
RpCX.tj -> t2) ± RggCX) * 2(MMSRES (X. t, -> t
2 ))0.5
(5.17)
Because the MMSRES values for a signal-ratio file are not
continuous, a natural cubic spline program was used to evaluate the
pre-irradiation reflectivity at the same wavelengths as the MMSRES.
The transient reflectivity plots in Appendix C show the transient
reflectivity curves and the associated error based on the MMSRES
technique, and Eq. 5.4 and 5.17. In addition, the pre-irradiation
reflectivity is also shown on each plot of Appendix C. The MMSRES
technique error bars represent an approximate 95% confidence
interval about the transient reflectivity.
68
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85
6. Results
The results of the experiment are broken into two categories:
the results based on the signal ratios, and the transient
reflectivity results. Note, for all irradiations, the energy of the
incident electrons in the beam was about 16.5 MeV.
6.1 Results from the Signal Ratios
As mentioned before, the complete set of signal-ratio plots for
the time intervals defined in Table 5.1 are listed in Appendix A.
The main results to be drawn from the plots of the signal-ratio
files are the regions where the signal ratio deviates significantly
from unity.
Significant deviation occurs when the Fourier transform curve
plus or minus two times the square root of the MMSRES error estimate
falls outside of a signal ratio equal to unity. Ideally, for no
transient effect, the signal ratio equals one. Listed in Table 6.1
are the wavelength regions the signal ratio has statistically
significantly deviated from unity for each mirror.
86
Table 6.1 Time and wavelength regions of statistically significantdeviations from unity of the Fourier transform of the measuredsignal ratio plus or minus two times the square root of the MMSRESfhe time region numbers and division types corresponding to thestatistically significant time regions are defined in Tables 5 1 andb.2. respectively. The irradiation positions are defined inFig. 4.5. Also listed under the mirror number is the pulse length.
t and mean current, I of the electron beam in the block-outirradiation.
Statistically Sifrnif irant-
MirrorNumber
Irradiation RegionPosition Number
Time Region
( ns)
Wavelength Region( nm )
1L
T = 20 ns
A 3
I = 5 A
5.0 to 10.0 343 to 371
2L
t = 200 ns
A
I = 225 mA
None None
2L
t = 200 ns
B
I = 225 mA
None None
6L
t = 20 ns
A
1= 5 A
None None
7L
T = 500 ns
A 234
5678
F= 225 mA
0.0 to 37.037.0 to 70.570.5 to 104104 to 138138 to 171171 to 205205 to 238
342 to 371332 to 371328 to 371330 to 362314 to 371
None346 to 371
87
7L 3
4
56
7
8
910
11
500 ns I = 225 mA
12 4
5
6
7
8
910
t = 500 ns
12
I = 225 mA
2
3
A
56
7S
91011
500 ns I = 225 mA
13 5
6
789
10
284 to 317317 to 351351 to 384384 to 418418 to 451451 to 485485 to 518518 to 552552 to 593
70.5 to 104104 to 138138 to 171171 to 205205 to 238238 to 272272 to 313
250 to 284284 to 317317 to 351351 to 384384 to 418418 to 451451 to 485485 to 518518 to 552552 to 593
61.1 to 81.281.2 to 101101 to 121121 to 142142 to 162162 to 183
324 to 371316 to 371300 to 352278 to 350298 to 346288 to 350276 to 350280 to 371280 to 344
261 to 371279 to 371274 to 360264 to 371271 to 371263 to 371256 to 371
266 to 371254 to 371254 to 371248 to 371256 to 371248 to 371236 to 371246 to 371242 to 371259 to 371
291 to 359274 to 371278 to 371272 to 371270 to 371274 to 371
200 ns I = 225 mA
88
13 B 4 67.3 to 101 286 to 3595 101 to 134 284 to 3716 134 to 168 286 to 3667 168 to 201 None
8 201 to 235 270 to 37113
9 235 to 268 276 to 371*10 268 to 293 276 to 371'
T = 200 ns I = 225 mA
14 A 6 20.0 to 25.0 282 to 3717 25.0 to 41.3 262 to 3718 41.3 to 57.5 250 to 371
T = 20 ns T = 5 A
26 A 8 205 to 238 280 to 3719 238 to 272 266 to 37110 272 to 313 257 to 371
T = 500 ns I = 225 mA
The statistically significant wavelength and time regions
define the times and wavelengths of significant transient response
from the mirror. With the exception of the noted time and
wavelength regions of dielectric mirror 13 irradiated in position B.
all of the significant regions mark increases in the signal ratio.
For example, the measured signal-ratio curve deviated significantly
13For dielectric mirror 13. irradiated in position B. the Fourier
curve plus or minus two times the square root of the MMSRES wasstatistically significant and less than unity. For all otherstatistically significant wavelength regions, the transient signalwas greater than unity.
89
above unity during the time region 20 ns to 25 ns in wavelengths
282 nm to 371 nm for dielectric mirror 14. irradiated in position A.
The interpretation of the statistically significant deviations from
a unity signal ratio is taken up in the conclusions section.
6.2 Transient Reflectivity Results
In interpreting the transient reflectivity curves in
Appendix C. note the statistically significant deviation regions
listed in Table 6.1 are the same regions found by inspecting the
transient reflectivity curves. The regions of significant deviation
of transient reflectivity from the pre-irradiation reflectivity
match with the Table 6.1 regions because the pre-irradiation
reflectivity of Eq. 5.4 is assumed error free.
As stated earlier, by assuming the pre-irradiation reflectivity
in Eq. 5.4 is a function of wavelength without an assigned error
resulting from computer analyses, digitization, or spectrophotometer
performance, the reflectivity can be treated as a constant in the
propagation of error in the equation. Thus, the signal-ratio curves
could be viewed as transient reflectivities with pre-irradiation
reflectivities of unity for all wavelengths. The pre-irradiation
reflectivity, if lacking an error estimate, does not affect the
predicted transient reflectivity or associated error bars. Thus,
the regions of statistically significant deviation of transient
reflectivity from the pre-irradiation reflectivity match the regions
of Table 6.1.
90
For example, for dielectric mirror 14, the signal ratio
deviated from unity significantly in time regions 6, 7. and 8. The
estimate of the transient reflectivity deviated in the same time
regions and corresponding wavelengths as the signal ratio. Thus,
the reader need only look at the signal-ratio plots to know the time
region and wavelengths of any statistically significant deviation.
However, if an estimate of the magnitude of the change in
reflectivity is desired, the reader should consult the transient
reflectivity curves.
91
7. Conclusions and Recommendations
The effects of radiation on the mirrors will be discussed
according to mirror variety because each mirror type exhibltied
statistically significant transient response. The conclusions are
based on the available data and should not be treated as the
absolute answer to whether transient radiation damage occurs without
substantiating studies.
7.1 Conclusions on the Dlelectric-mul tilayered Mirrors
According to H.J. Donnert. the significant transient response
demonstrated by the dielectric mirrors could be due to the mirrors
taking on the properties of a metal-coated mirror (4). Prior to
Irradiation, the electrons present on the dielectric mirror
reflecting surface were primarily occupied in the covalent bonds of
the coating materials. The mirror behaved like a ceramic, meaning
the conduction band was sparsely populated. According to the
hypothesis, upon irradiation, the high-energy electrons from the
beam gave the dielectric material a populated conduction band
similar to a metal. For a short time, less than 400 ns to 500 ns.
the mirror would exhibit the reflecting properties of a metal-coated
mirror because of an Increase in electrons in the conduction band.
The hypothesis suggests the dielectric mirror behaves like a
metal-coated mirror by displaying a non-zero conductivity and a
complex index of refraction. Verification of the hypothesis might
92
be found in using a complex index of refraction for the dielectric
mirrors in the theoretical model of Scronce (1).
The temporary metallic behavior explained the measured increase
in the intensity of the reflected light. At lower wavelengths,
where the reflectivity of the pristine dielectric mirror was close
to unity, the light intensity could have increased due to the
de-excitation of the electrons deposited on the mirror surface or
the secondary electrons created by electron bombardment. Note, no
statistically significant deviations resulted in a transient
reflectivity greater than unity.
The measured light intensity increased for the upper
wavelengths for two reasons. First, the light intensity probably
increased from the induced metallic properties. As the dielectric
mirror behaved like a metal mirror, the reflectivity for the upper
wavelengths was characterized by a metal more than the dielectric.
Because the reflectivity was small for the dielectric mirror the
induced metallic reflectivity represented an increase in the signal
light intensity. Also, the same process of electron de-excitation
probably contributed to the increase in measured signal light
intensity.
Statistically significant deviations from the pre-irradiation
reflectivity were observed for all of the dielectric-multi layered
mirrors. From a practical standpoint, the transient behavior
appeared as an increase in mirror reflectivity for all mirrors
except dielectric mirror 13. irradiated in position B. This
93
researcher does not claim an actual Increase in reflectivity
occurred because the transient measurements are not absolute.
However, the researcher does claim the signal light intensity
increased under irradiation at the wavelengths listed in Table 6.1.
For dielectric mirror 13. irradiated in position B,
the statistically significant decrease in signal light intensity is
not completely understood. Because no other dielectric mirror
exhibited similar behavior, one is tempted to dismiss the
unsubstantiated observation. However, possibilities of defective
mirror construction, improper alignment, or rapid de-excitation of
the electrons emitting in the upper wavelengths could explain the
transient behavior.
7.2 Conclusions on the CuAg-coated Mirrors
The CuAg-coated mirrors exhibited the least amount of transient
response. In only one time region for mirror 1L. the transient
reflectivity deviated significantly from the pre-irradiation
reflectivity. This researcher views the CuAg-coated mirrors the
least likely to exhibit transient radiation damage.
Although the electron beam may have affected the CuAg mirrors,
the effects were masked by the beam strength with respect to the
number of conduction electrons on the mirror surface. The number of
electrons in the beam was on the order of 10E+11 to 10E+12. compared
to about 10E+19 present in the conduction band of the mirror
coatings. By accounting for beam electrons not interacting at the
94
surface of the mirror or passing through the mirror, the magnitude
of the beam electrons interacting at the coating surface is further
reduced
.
Thus, the number of electrons interacting with the metal
coating was much less than the number of conduction electrons. The
increase in electron density would not change the reflecting surface
properties from the pre-irradiation metallic characteristics. That
is. the pre-irradiation reflectivity was based on the properties of
a metal reflector. The presence of more electrons resulting from
irradiation only enhances the pre-irradiation metallic reflectivity
behavior.
7.3 Conclusions on the Al -coated mirrors
At first, the same reasoning used in concluding the CuAg-coated
mirrors were unaffected by the electron beam would seem to apply for
the Al-coated mirrors. Aluminum-coated mirror 6L seemed to confirm
the 10E+12 electrons present in the beam did not significantly
affect the 10E+18 valence electrons in the irradiated beam spot or
the 10E+19 valence electrons on a pure aluminum mirror surface. The
lack of transient response indicated the electron beam did not
effect mirror 6L significantly.
However, aluminum-coated mirror 7L displayed significant
transient response in both position A and B. In comparing current,
beam pulse length and number of electrons incident on the mirror,
one would expect significant transient behavior to occur with mirror
95
6L before mirror 7L, I.e. the dose-rate, and total dose of electrons
was greater for mirror 6L than mirror 7L.
One theory suggests the surrounding atmosphere played an
important role in determining the transient response of the mirrors.
By allowing exposure of the aluminum-coated mirrors to the
atmosphere, the aluminum metal was oxidized. Thus, instead of
having a pure aluminum reflecting surface, the reflecting surface of
the mirror became a composite of metallic aluminum and aluminum
oxide. Because some of the valence electrons of the pure aluminum
would be occupied in covalent bonds with oxygen, the number of
conduction band electrons would be reduced. As the density of
aluminum oxide molecules at the reflecting surface increased, the
mirror reflectivity would change from metallic to dielectric in
behavior. The theory suggests significant oxidization of the
aluminum mirror surface has occured and the mirror now behaves as a
dielectric mirror.
7.4 Recommendations for Future Work
In order to confirm the conclusions stated above and to improve
on the experimental results, the following are recommended:
1. Repeat the experiments using identically constructedmirrors and dose and dose rates to confirm, statisticallymirror transient behavior.
2. Perform periodic reflectivity measurements on pristinemirrors stored in either an oxidizing or inert atmospheresto detect changes in mirror reflectivity subject tostorage. Mirror degradation with exposure to various
96
atmospheres contributed to reflectivity changes in arelated work by Ferrel (26).
3. Verify experimentally the normalization factor A(X) tobe time independent by studying the transient behavior ofthe xenon lamp output.
4' md
d?n
iT £" eXPerlment to ™™"™ transient transmissionand to confirm when the mirrors no longer statisticallydeviate from pre-irradlation behavior.
To measure transient transmission, modifications of the
existing LINAC facility would be necessary to compensate for
electron beam divergence. In order to insert the required detectors
behind the mirror to measure transient transmission, the mirror
would have to be moved farther away from the beam port window. To
maintain the same dose and dose rate of electrons, the electron beam
divergence would have to be controlled, possibly with another series
of electromagnets.
97
ACKNOWLEDGEMENTS
The author thanks the Air Force Systems Command, the Air Force
Office of Scientific Research, and Universal Energy Systems. Inc.
for providing the opportunity to spend an enriching summer at the
Frank J. Seller Research Laboratory. USAF Academy. Colorado Springs,
CO. Additional thanks go to the members of the Lasers and Aerospace
Mechanics Directorate, in particular Majors Albert Alexander and
Terry Deaton. for aiding in the research. The author acknowledges
the support from Mr. Charles Bowles and Lt. Col. Jack Fannin for
their help in using the VAX-11 computer system.
The author thanks the employees of EG&G in Goeleta. CA. for
their assistance in using their electron LINAC facility: Paul A.
Zagarino. Stephen S. Lutz. Steven G. Iverson. Steven A. Jones. Ron
Sturges, and Paul E. Nash.
The author gratefully acknowledges the support and patience of
Mr. Roger Gurke of the Department of Physics. Dr. John Boyer of
Statistics and the entire staff of the Department of Nuclear
Engineering: Dr. N.D. Eckhoff. Dr. H.J. Donnert, Dr. R.E. Faw.
Dr. J.K. Shultis. Dr. J.F. Merklln and Dr. G.G. Simons. Without
their help and guidance, the study would have been exceedingly more
difficult.
My fellow graduate students. Mr. Mark A. Ferrel. Mr. Gary W.
Scronce and Mr. W. Gu are thanked for their support and efforts
instrumental to the completion of the study.
98
Next, the author thanks Ms. Connie Schmidt for her help in
preparing the thesis.
A special thanks goes to Dr. Hermann Donnert for introducing
the area of research to the author and his guidance throughout the
graduate school program.
Finally, I thank my wife Stephanie and my parents for their
encouragement and support throughout my graduate studies.
99
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2 3+Si0
2Mirrors in the Ultraviolet Region",
M.S. Thesis, 1986 (unpublished).
2. E. Hect and A. Zajac, Optics . 4th ed. (Addison-Wesley, DonHills, Ontario, Canada), 1979, p. 88.
3. H. Anders, Thin Films in Optics , translated by J. N. Davidson,(Focal Press Limited, English Edition), 1967.
4. H. J. Donnert, Kansas State University, (privatecommunication)
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5. "Pulsed Xenon Light Source Type 3021", Chelsea InstrumentsLimited, (London), (unpublished).
6. J. H. Moore, C. C. Davis and M. A. Coplan, Building ScientificApparatus, (Addison-Wesley. Reading, Massachusetts) 1983, pp191-194.
7. R. E. Faw, A. B. Chilton and J. K. Shultis, Principles ofRadiation Shielding. (Prentice-Hall, Englewood Cliffs. NewJersey), 1984. pp. 67-74.
8. L. Katz and A. S. Penfold. Rev. Mod. Phys. 24. 28 1952.
9. M. J. Berger and S. M. Seltzer, "Tables of Energy Losses andRanges of Electrons and Positrons". N.A.S.A. . 1964.
10. CRC Handbook of Chemistry and Physics. 58th ed. (CRC PressCleveland, Ohio), 1978. p. B-155.
11. E. E. Aubanel and K. B. Oldham. "Fourier Smoothing", BYTE Feb1985. pp. 207-218.
12. R. W. Hornbeck. Numerical Methods . (Prentice-Hall, EnglewoodCliffs. New Jersey), 1975.
13. J. Boyer, Kansas State University, (private communications).
14. J. Boyer, Regressi on and Correlation . Kansas State University1985, (unpublished).
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100
16. P. B. Lyons, L. D. Looney and J. W. Ogle. "Radiation-InducedTransient Attenuation of PCS Fiber", presented at PHOTON '83international conference on optical fibers and theirapplications, Paris. France, 1983.
17. P. J. Brannon, R. W. Morris, and J. B. Gerardo,"Nuclear-radiation-induced absorption in optical materials-presented at the SPIE Southwest Conference on Optics, 1985.'
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Radiation Effects in Insulators and Semiconductors". (HughesAircraft Co., Fullerton. California), 1964.
'
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400?405tOrS "' IEEE TranS
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20. E. A Neyis. "Alteration of the transmission characteristics offused silica optical fibers by pulsed ultraviolet radiation".fcr-Ii. vol. 540 Southwest Conference on Optics. 1985.
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I'- £',Frankovoskv and H. Shatzkes. "Study of Effect ofHigh-Intensity Pulsed Nuclear Radiation on Electronic Parts andMaterials
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'H
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24'
48,\STia£' "* °' L"
G^isson•
Bul1-*" Ceram
-Soc
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rtMeB'
G' "' Slge1
'
Jr " BuH- *"• Phys
-Soc
-vo1
'13 '
26. JL A. Ferrel. "The Effects of Radiation on the OpticalCharacteristics of (Si0
2+Zr0
2on Si Substrate) Mirrors", M.S.
Thesis, Kansas State University. 1986 (unpublished).
27. American Institute of Physics Handbook. 3rd
ed. . AmericanInstitute of Physics, (McGraw-Hill, Inc.), 1972, p. 6-1246—134, 6—149. '
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Appendix B: Programs used in data analysis
B2
Program "BINTOASCII" used to convert binary datainto ASCII format for the KSU Mainframe.
B3
PROCRAM 8INT0ASCII Convert binary direct access files
VERSION:
FACILITY:
ABSTRACT:
ENVIRONMENT:
AUTHOR
:
1-001
Standalone Program
This program is used to convert 944 block binary directaccess Streak Camera data files to ASCII form.
Mark Probert, ECfcC Energy Measurements, 130 Robin Hill Road,Ooleta, CA 93117 CREATION DATE: 27-May-1986
! FUNCTIONAL DESCRIPTION:
Convert 944 block Streak Camera binary files to ascii.The program should be installed as a VMS foreign command:
S BINTOASCII :== tdisk: [directory]BINTOASCII.EXE
The only input needed on the command line is the name ofa binary file, eg. S BINTOASCII LPA304.DAT . An outputfile with the same filename but an extension of ".TXT"will be used
.
Streak Camera video
IXS
I
s s s s sc c c c c
a a a a a
n1
n
1
n
1
n
1
n
1
ni
n
i
n
i
n n
es
© e e
ca 512 integer *2 binary nos
.
n
|
na
V \1 ' 1
t V
wave length
M
JfSrf;*K
Cam,ra.
ima90 If* digitized video frame consistingof 512 by 512 pixels. 612 pixels in the time directionform a scanline. Each scanline is at a constant »avelength.
A scanline is stored as 512 integer. 2 binary values. Sinceeach record in the data file contains 512 bytes and we areusing integer. 2 data, it takes t«o records to make up acomplete scanline.
These particular Streak Camera files have g44 512-byte
ah^fU"" S'Th
; !:rs
Tl,° r"cords "ntain informationabout the image and the last 842 records contain pairs ofrecords. The first record contains 2 data items. Thet.rst two bytes contain the integer. 2 variable IXS and thesecond two bytes contain the integer. 2 variable IXE. Thesevariables tell the the range of scanlines saved from theStreak Camera image, i.e. IXS is the scan number of the first
J1;? '» th ° ';'«( ?"<" IXE is the last. These numbersneeded because a full image need not be saved into a data
ill J II"FeSt
°Jthe first rec ° rd 's garbage, and so is
all of the second record in the file.
Note that the polaroid images included with this packagehave rotated the image pi/2 radians counter-clockwise.
IMPLICIT INTECER (A-Z)
C Variable DeclarationsINTECER.2 BUFFER (256)INTECER.2 IXS, IXECHARACTER.132 INFILE, OUTFILE
C Function DeclarationsLOGICAL. 4 IS_0DD
EQUIVALENCE (IXS , BUFFER (1)
)
EQUIVALENCE (IXE , BUFFER (2)
)
C Open the Input FileSTATUS • LIBJCET FOREICN(INFILE, ,LEN 1
C Open the Outout Fi leI = INDEX(INFILE,'.)OUTFILE = INFILE(1:I)//'TXT'OPEN <2,FILE=0UTFILE,TYPE='NEW',CARRIACEC0NTR0L='LIST-)
C£?
ai!.
th° ima 9» frame informationREAD(l'l) BUFFERWRITE(2,1000) IXS, IXELINE NUMBER = IXSREADT.1'2) BUFFER I Carban.
1000 FORMAT(2I10) 'l'arba 9"
C Read the scanlinesDO I = 3,844
IF(IWRITE
(
(2 io?6) SarE;),T
MENi °o°
thi> •* »«
KB! |i:}S8J MbER I
!
L.t^em ^ow".^1
fin.'., .re .
B5
__ LINE_NUMBER = LINE NUMBER.ltNO IF "READ(1>I) BUFFERDO J = 1,256,16
END ^ITE f2 ' 1030) (BUFFER{K),K=J,j.l5)
END DO
1010 FORMAT(Al)
}«S FORMAT 'Sc.nl in. Number ',13)1030 F0RMAT(l6iS) '
CLOSE (2)CLOSE (l)
GO TO 9999
9900 TYPE 9910, INFILE(1:LEN)9910 FORMAT (• Tn. ttii 'mU.- couid Bot b. „,.„„,..)9999 CONTINUE
END
!
i
FUNCTION IS_ODD(INT_VAL)
Determine if INT_VAL is an odd number
IMPLICIT INTECER (A-2)I = INT VAL/2
^L
F
SW= :^J8
EQ - !) THEN
endV000 - FALSE -
RETURNEND
jconl ine NumberC? 90 103
B6
99 70 07 77 03 07 Ult 105 104 10001 UO 101 93 03 05 66 79 75 070/ 00 03 92 70 05 97 102 84 92
_6fi 70 79 00 71 77 00 07 07 72*M 01 79 77 01 07 91 CG CO 0001 M 03 07 77 72 59 75 66 03rM 70 01 CI 01 G9 76 09 9C 00
_7/ 76 75 51 95 01 U3 56 03 717 * 63 C9 59 56 62 50 40 73 CC70 CO 76 71 75 74 RC 61 CO b560 19 C9 0? 79 69 79 54 79 6967 7S 75 CO 50 52 71 75 C9 40
_'» 65 CI 70 62 02 73 62 45 51
fi3 13 03 79 87 7S7C 72 99 93 06 02CO Bl 111 ac 78 7SII 83 00 70 70 6301 03 75 03 66 7873 7/ GO 02 56 6?71 66 76 63 73 G*
62 72 50 60
69 CO 53 SG
6770
UO 70 81 Gl
J10 92 03 99102 CC117 13912 7 119
113 64 61 67 60 59 64 CO52 CO G4 71 45 46 65 C464 CI GO CO CO 70 54 44G7 66 71 43 51 40 73 6454 GG 49 65 67 61 59 6753 G6 65 41 72 64 67 70n 67 7G CS G3 61 54 7207 70 03 05 66 54 50 716a 70 7G 71 77 05 74 66GO 73 72 77 63 Gtl 7? 9105 76 77 OG 93 C5 05 7510 102 127 no 91 93 95 99H OS 10G 121 97 100 05 04
119 110 111 170 107 137 144 135m 132 130 1?6 125 113 104 105122 107 117 115 11.1 95 112 116
6059
99 90 116 117 119 110 114 170 107 137 144 135 131 140117106
Sample output of BINTOASCII
B7
Program "INOUT" used to compare the simple-summation,trapezoidal, and Romberg integration techniques.
QOOOOHOOCMMKMMlDHOOODHOOOIKMKKXMMXMKKMlOOOOOOOdClOOOOOOOOOOOIMKMWIIMMMlO)MC THIS PROGRAM CALCULATES THE TOTAL INTEGRAL. OVER ALL TIMES. OFC THE SIGNAL LIGHT INTENSITIES. THE PROGRAM CALCULATES THE INTEGRALC OVER THE STARTING AND ENDING TIMES DEFINED IN TABLE 4.3 FOR EACHC DATA FILE. THE PROGRAM IS EXECUTED FROM AN EXEC PROGRAM.CC THE PROGRAM USES THREE TECHNIQUES TO NUMERICALLY ESTIMATE THEC VALUE OF THE TOTAL TIME INTEGRAL. THE SIMPLE-SUMMATION.C TRAPEZOIDAL. AND ROMBERG TECHNIQUES. EACH TECHNIQUE IS DEFINED INC REFERENCE 12.
C NOTE THE ROMBERG TECHNIQUE DIVIDES THE FILE INTO FOURTHS SO THEC REQUIRED SPACING NEVER EXCEEDS THE SPACING AVAILABLE.OWKMMMHIOOOOOOCXlHDOOOOOOOOOOHHnDOOHHOdllCMMMKMmOHIIKOOnDlKllXMKMMKKMIOlMCC SET VARIABLES TO DOUBLE PRECISIONC AND DEFINE THE INPUT AND OUTPUT FILES (FN=4 AND 6 RESPECTIVELY)
REAL*8 T(8,8.4).Xl(16,32).TRAP(8.8).X(512),SUM,TOTAL,REL.LAMDAINTEGER START.FINI.I.J.K.L.M.II.KK.FNCHARACTER*30 STRINGFN=4
CC READ THE STARTING AND ENDING SCANLINE NUMBERS FOR THE INTEGRATIONC FOR TOTAL INTEGRATION OVER ALL TIMES, START=1 AND FINI=470C200 READ(FN,110)START.FINICC PRINT TO THE OUTPUT FILE THE HEADERS AND STARTING AND FINISHINGC SCANLINE NUMBERS.C
WRITE(6. 150)START.FINIWRITE(6,170)WRITE(6.170)WRITE(6,160)WRITE(6. 170)
CC READ IN THE SIGNAL LIGHT INTENSITY DATA INTO ARRAY X(I)C NEXT CALCULATE THE SIMPLE-SUMMATION INTEGRAL ESTIMATE BY SUMMINGC OVER ALL X(I).C
KK=0DO 100 II=START,FINITOTAL=O.0D0READ(FN,130)STRINGREAD(FN,130)STRING
DO 1 1=1,321 READ(FN.120)(X1(J.I).J=1,16)
DO 6 J=1.16DO 5 1=1.32
B9
M=(I-1)*16+JX(M)=X1(J.I)
5 TOTAL=TOTAL+X(M)6 CONTINUECC INITIALIZE TRAPEZOIDAL AND ROMBERG ESTIMATES TO ZERO (T AND TRAP)
DO 30 1=1.8DO 20 J=1.8
DO 10 K=l,4T(I.J,K)=0.0D0
10 TRAP(I.J)=0.0D020 CONTINUE30 CONTINUECC CALCULATE THE ROMBERG ESTIMATE OF THE ENDPOINT CONTRIBUTION OFC EACH OF THE FOUR REGIONS.C
T(1.1.1)=64.0DO*X(128)T(1.1.2)=64.0D0*(X(128)+X(256))T( 1 . 1 .3)=64. 0DO*(X(256)+X(384)
)
T(1,1.4)=64.0D0*(X(384)+X(512))CC CALCULATE THE COLUMN ESTIMATES FOR THE ROMBERG TECHNIQUE AND THEC TRAPEZOIDAL ESTIMATEC
DO 50 J=2.8DO 40 K=l,4
I=J-140 T(1,J.K)=(T(1.1.K)+SUM(X.J.K)*128.0D0)/(2.0D0»*(J-1))50 CONTINUE
DO 70 J=1.8DO 60 K=l,4
60 TRAP(1.J)=T(1,J.K)+TRAP(1,J)70 CONTINUE
DO 80 L=2,880 CALL ROMBER(TRAP.L)CC CALCULATE RELATIVE ERROR BASED ON SUMMATION AND ROMBERG INTEGRALSC AND PERFORM WAVELENGTH CALIBRATION BEFORE PRINTING RESULTSC
REL=100.0D0KDABS(TRAP(8. 1)-T0TAL)/TRAP(8, 1)LAMDA=-0.361D0*(II)+375. 108D0WRITE(6. 175)LAMDA. TOTAL. II,TRAP(8. 1) ,RELIF( II . LT. 179)WRITE(7 . 180JLAMDA, TRAP(8 , 1 )/l . 0DO4IF(II.GT.170.AND.II.LT.340)WRITE(8,180)LAMDA,TRAP(8.1)/1.0D04IF(II.GT.330)WRITE(9, 180)LAMDA.TRAP(8. 11/1 .0D04IF(KK.NE.5)GOT090WRITE(6,170)KK=0
BIO
90 KK=KK+1100 CONTINUECC FORMAT STATEMENTSC110 F0RMAT(I5,I5.I5)120 F0RMAT(16F5.0)130 FORMAT( 19A)140 F0RMAT(F5.0,I5)150 FORMAT('TIME INTEGRATION FOR SCANLINES ',13,' TO ',13)160 FORMAT( ' WAVELENGTH (NM) SUM OF DATA SCANLINE **
C BEST ROMBERG % REL-ERROR')170 FORMAT( "
)
175 F0RMAT(5X.F7.2.5X,F12.2.4X.I12.6X.F12.2.5X.F6.3)180 F0RMAT(3X,F9.5,5X.F9.5)
IF(FN.EQ.5)G0T0 190FN=5GOTO 200
190 STOPENDDOUBLEFRECISIONFUNCTION SUM(X.J.K)
CC CALCULATE APPROPRIATE SUM FOR THE ROMBERG TRIANGLE BASED ONC CURRENT GRID SIZE PARAMETER L.C
REAL*8 X(512)INTEGER J.K.L.DELTAX.ML=2.0D0>«(J-1)-1DELTAX= 128/(L+1)SUM=O.0D0DO 10 1=1.
L
M=I*DELTAX+(K-1 )*12810 SUM=SUM+X(M)
RETURNENDSUBROUTINE ROMBER(TRAP.L)
CC CALCULATE THE NEXT MEMBER OF THE ROMBERG TRIANGLEC
REAL*8 TRAP(8.8)INTEGER K.L.II=9-LDO 10 K=l . I
10 TRAP(L.K)=DEXP(DLOG(4.0DO)*(L-1)+DLOG(TRAP(L-1,K+1))-CXCC(4.0DO**C(L-l)-1.0D0))-DEXP(DLOG(TRAP(L-l.K))-a>LOG(4.0DO**(L-l)-1.0D0))RETURNEND
Bll
KANSAS STATE UNIVERSITY VM/S? CMS
NTEGRATION F OR SCANLINES 10 TO 139
SNGTH CNH) SUM OF DATA SCANLINc * BEST ROMSSRG I RSL-ERROR
371.50 33009.00 10 33014.54 0.017371.14 3-637.00 11 34553.09 0.061370.7a 36309.00 12 36712.50 0.253370.41 33519.00 13 38543.71 0.C64370. OS 42196.00 14 42116.93 0.133369.69 45255.00 15 45243.33 0.C25
369.33 49253.00 16 49355.01 0.116363.97 53051.00 17 53189.16 0.135363.61 53354.00 18 5S393.26 0.057363.25 52359.00 19 62454. 4S 0.105367.39 66306. 00 20 66382.34 0.115
367.53 63826.00 21 63763.42 0.091367.17 73105.00 22 73192.41 0.114365.80 75470.00 i3 75660.0. 0.013366.46 73753.00 24 73766.21 o.eio355.08 79505.00 23 79852.35 0.053
365.72 33042.00 25 33214.43 0.207365.36 35009.00 27 55069.23 0.071365.00 37706.00 28 37655.43 0.053364. 64 33012.00 29 875=1.09 0.035364.26 d5526.00 30 39=36.62 0.0 = 3
363.92 59946.00 31 59923.31 0.020363. 56 91626.00 32 91571.46 0.060363.19 93025.00 33 53239.43 0.230362.83 93235.00 34 93180.71 0.112362.47 95423.00 35 55530.91 0.105
362.11 57321.00 36 57297.72 0.024361.75 96365.00 J7 97023.51 0.163361.39 53133.00 38 53114.21 0.015351.03 9779o.OO 39 97955.63 5.14=360.67 57017.00 -0 56934.70 0.033
350.31 94130.00 -1 94253.33 C.1J1359.95 92536.00 42 92713.33 0.039359,53 91757.00 43 51593.33 0.C64359.22 91410.00 44 91548.54 0.151353.86 91342.00 45 91900.49 0.C64
359.50 92765.00 45 92724.17 0.044353.14 92=10.00 -7 92733.34 0. 157357.78 52235.00 -3 92063.44 0.154357.42 91*22.00 49 922-2.63 0.34 5357.06 52726.00 5 52573.95 0.051
Sample output from program "INOUT"
B12
Program "TRANS" used to calculate' the timeintegrations for the signal-ratio plots.
B13
C K)OC)C)OC)l»KMH»)nrilWir)«1nnricw.n.wwwwiriiwwwwwwww.,.„, ""•mmHt]tHHItlt)IHII]l][H]lHHC THIS PROGRAM CALCULATES THE INTEGRAL OVER A DEFINED TIME SEGMENTC USING THE TRAPEZOIDAL ESTIMATE. THE USER MUST DEFINE THE NUMBERC OF INTEGRATING REGIONS. NIR. AND THE STARTING AND ENDING CHANNELC NUMBER FOR EACH OF THESE REGIONS. SEE THE SAMPLE HEADER INPUTC FILE IMMEDIATELY FOLLOWING THE PROGRAM. RECALL THE SCANLINEC NUMBERS DEFINE SPECIFIC WAVELENGTHS WHILE THE CHANNEL NUMBERSC DEFINE SPECIFIC TIMES FOR THE SIGNAL INTENSITY DATA. THE PROGRAMC ALSO CALCULATES THE INTEGRAL OF THE SIGNAL LIGHT INTENSITY FORC DEFINED WAVELENGTHS IN THE SOFT (THE SIGNAL LIGHT INTENSITY ASC FUNCTION OF TIME) CALCULATIONS. THE PROGRAM IS EXECUTED FROM ANC EXEC FILE.
cC BEGIN BY DEFINING THE PRECISION AND THE INPUT AND OUTPUT FILESC INPUT FN=4. OUTPUT FN=6. AND 10 TO 32.C
REAL*8 TOT( 100). Xl(16. 32). X(512).S0FT(512). TOTAL. TIME.TSTARTSSWL.EWL.LAMDAINTEGER IR(100).START,FINI,I.J.K.L,M.N,II.FN,KK.NIR.
$FLAG.FN2.NPAGECHARACTER*30 STRINGFN=4
CC READ IN HEADER DATA AND TIME CALIBRATION INFORMATION (TIME &C TSTART)C200 READ(FN.110)START.FINI. NIR, TIME.TSTART
DO 10 1=1,51210 SOFT(I)=O.ODO
FLAG=0READ(FN. 190)(IR(I) , 1=1 .NIR+1)READ(FN.*)SWL.EWLWRITE(6.170)WRITE(6, 150)START,FINIWRITE(6.170)WRITE(6.170)WRITE(6.160)WRITE(6.170)KK=0
CC READ IN THE SIGNAL LIGHT INTENSITY DATAC
DO 100 II=START.FINIDO 15 1=1, NIR
15 TOT(I)=O.ODOTOTAL=0.0D0READ(FN.130)STRINGREAD(FN,130)STRING
B14
DO 1 1=1,321 READ(FN.120)(X1(J.I),J=1,16)
DO 6 J=1.16DO 5 1=1,32
M=(I-1)*16+JX(M)=X1(J,I)
5 TOTAL=TOTAL+X(H)6 CONTINUE
TOTAL=TOTAL-(X(1 )+X(512) )/2 . ODO
CC NOW, FOR EACH INTEGRATED TIME REGION. CALCULATE THE AREA USINGC THE TRAPEZOIDAL ESTIMATE.C
DO 50 J=1,NIRDO 40 I=IR(J).IR(J+1)
40 TOT(J)=T0T(J)+X(I)TOT(J)=TOT(J)-(X(IR(J))+X(IR(J+l)))/2.0D0
50 CONTINUECC PERFORM A WAVLENGTH CALIBRATION. IF THE WAVELENGTH IS OUTSIDE OFC THE REGION DEFINED FOR THE WAVELENGTH INTEGRATION, DO NOT INCLUDEC THE SIGNAL LIGHT INTENSITY DATA IN THE WAVELENGTH INTEGRATIONC ESTIMATE.C
LAMDA=-0.361D0>«(II)+375. 108D0IF(LAMDA.LT.SWL)GOT0 70IF(LAMDA.CT.EWL)GOTO 70FLAG=1
CC PERFORM INTEGRATION OVER DEFINED WAVELENGTH BAND I.E.C SWL<LAMDA<EWL.CC NEXT PRINT OUT THE RESULTS OF THE WAVELENGTH AND TIME INTEGRATIONSC
DO 60 1=1,51260 SOFT(I)=X(I)+SOFT(I)70 WRITE(6,175)LAMDA, TOTAL/1. 0D04,TOT(l)/1.0D04.TOTf21/l 0D04
DO 80 1=1. NIRFN2=9+I
80 WRITE(FN2,180)LAMDA,T0T(I)/1.0D04IF(KK.NE.5)G0T090WRITE(6.170)KK=0
90 KK=KK+1100 CONTINUE
WRITE(6,170)109 IF(FLAG.EQ.0)GOTO 300
WRITE( 1.170)WRITE( 1,170)WRITE( 1,170)
315
WRITE(1,171)SWL.EWLWRITE( 1,170)WRITE( 1,181)WRITE( 1,170)WRITE( 1.170)
CC PERFORM TIME CALIBRATION FOR HARD COPYC
DO 108 1=1,512108 WRITE(1.191)TSTART+TIME*(I-1),S0FT(I)CC FORMAT STATEMENTSC110 F0RMAT(3I5,2E10.3)120 FORMAT(16F5.0)130 F0RMAT(19A)150 FORMAT(TIME INTEGRATION FOR SCANLINES \I3,- TO 13)160 FORMATC WAVELENGTH (NM) TRAP INTEGRAL TOTf 1)
$T0T(2)'
)
170 FORMAT( ' '
)
171 FORMATf •WAVELENGTH INTEGRATION OVER ',F7.2.• TO ' F7 2)175 F0RMAT(2X,F7.2,14X,F7.2.7X,F7.2,9X.F7.2)180 F0RMAT(2F7.2)181 FORMATC TIME(NS) WAVELENGTH INTEGRAL')190 FORMAT( 11 15)191 F0RMAT(2F9.2)300 ENDC BELOW IS A SAMPLE HEADER FILE USED TO SUPPLY THE BASICC INFORMATION NECESSARY FOR PROGRAM EXECUTION. IN THE FIRST LINEC NUMBERS CORRESPOND TO :
C 1&2. STARTING AND ENDING SCNALINES FOR CURRENT INTEGRATION f 10C 139)C 3. THE NUMBER OF DEFINED TIME REGIONS (10)C 485. THE TIME PER CHANNEL SLOPE AND THE STARTING TIME FOR THE TIMEC CALIBRATION (0.67 AND 250)CC ON THE SECOND LINE THE ELEVEN NUMBERS ARE USED TO DEFINE THEC CHANNEL NUMBERS WHERE ONE TIME REGION ENDS AND THE OTHER STARTSC THE NUMBER OF DATA POINTS ON THIS LINE ALWAYS EQUALS THE NUMBER OFC. INTEGRATING REGIONS PLUS ONE.CC FINALLY. ON THE LAST LINE, THE STARTING AND ENDING WAVELENGTHSC SWL AND EWL, ARE GIVEN FOR INTEGRATION OF THE SIGNAL LIGHTC INTENSITY OVER WAVELENGTH.CC NOTE THE PRECISION OF EACH DATA POINT IN THE HEADER AFFECTS PROPERC EXECUTION. DEFINE ALL VALUES ACCORDING TO PROPER PRECISION.
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El
Appendix E: Block-in and Block-out IrradiationPicture Data
E2
Each picture in Appendix E is identified by a three-digit filenumber following the letters "LPA" appearing on the lower right-handcorner of each picture just above the color-intensity scale. Usethe information in Table El to identify a specific irradiation.
The color levels on the photographs represent the signal lightintensity seen at the video camera as a function of time andwavelength. The origin of each data set is found in the lowerright-hand corner of each photograph. The wavelength and timescales are the abscissa and ordinate, respectively. The thirddimension, color level, represents the signal light intensity.
Table El The LPA file numbers for the block-in and block-outirradiations and their corresponding page numbers.
Mirror Block Irradition LPA File PageNumberNumber Position Position Number
14 in A 313 E7out A 314
12 in A 210 E3out A 211in B 212 E4out B 213
13 in A 303 E5out A 304in B 305 E6out B 306
26 in A 100 E3out A 102
1L in A 317 E8out A 318
2L in A 307 E6out A 308in B 309 E7out B 310
6L in A 315 E8out A 316
7L in A 214 E4out A 215in B 216 E5out B 217
E3
F,4
HI • l| Ml |
Et
a^pfgf^e^^^^^* »ii 1
r 11
E7
E8
TRANSIENT REFLECTIVITY RESPONSE OF LASER MIRRORSTO ELECTRON BEAM IRRADIATION
by
Kevin A. Stroh
B.S., Kansas State University, 1984
AN ABSTRACT OF A MASTER'S THESIS
submitted in partial fulfillment of the
requirements for the degree
MASTER OF SCIENCE
Department of Nuclear Engineering
KANSAS STATE UNIVERSITYManhattan, Kansas
1987
'
ABSTRACT
The transient effects of electron radiation on dielectric and
metal-coated mirrors was studied to estimate transient mirror
reflectivity. The electron radiation came from single short-time
(20 ns to 500 ns) pulses with mean currents from 225 mA for the
longer pulses to 5 A for the shorter pulses. High fluences of
15 MeV electrons were used to simulate the effects of a high fluence
gamma-rays and the secondary electron effects caused by gamma-rays.
The goal of the irradiations was to measure the transient
reflectivity of the dielectric, aluminum, and silver-on-copper
coated mirrors, determine statistically significant deviations from
pre-irradiation reflectivities, and note if any differences occured
at important wavelengths. The dielectric mirrors were designed to
operate in a KrF excimer laser system at 248 nm. The results of the
investigation suggest the electron beam had a significant transient
effect on the aluminum and dielectric mirrors. Estimates of the
transient reflectivity versus wavelength were plotted. The
estimates were based on ratios of pre-irradiation and transient
light intensities measured at a streak camera detector.
.