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High PerformanceHigh Resolution ICP-MS
Thermo ScientificELEMENT 2 & ELEMENT XR
Part of Thermo Fisher Scientific
m a s s s p e c t r o m e t r y
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
An Instrument for every Application
A success story around the world with over 500 instrumentsinstalled, for example:
Thermo Scientific ELEMENT 2/XRHigh Performance High Resolution ICP-MS
Belgium: OCAS.Research centre for the application of steelwith New Wave laser ablation system.
www.ocas.be
Sweden: ALS Scandinavia AB.Scandinavia’s leading contract lab withEmma Engström.
www.analytica.se
Canada: Seastar Chemicals Inc.A manufacturer of high purity chemicalswith Dr. Brad McKelvey.
www.seastarchemicals.com
USA: Micron Technology Inc.Advanced semiconductor solutions withKevin Coyle.
www.micron.com
Germany: Institute for Transuranium Elements.Shown with a glovebox for radioactivesample measurements.
http://itu.jrc.ec.europa.eu/
USA: Desert Research Institute.Hydrologic Sciences Division withSteve Lambert.
www.dri.edu
• Multielement analysis across the periodic table coveringa mg/L to sub pg/L concentration range– Compatible with inorganic and organic solutionmatrices and solids
• High mass resolution to access spectrally interfered isotopes– Produces unambiguous elemental spectra
• A multielemental detector for transient signals– For example, CE, HPLC, GC, FFF and laser ablation
• High precision isotope ratios– Independent of interferences or interfered isotopes
• Fully automated tuning and analysis– In conjunction with a comprehensive, customizablequality control system
• Reliability and robustness to serve as a 24 / 7 productioncontrol tool– Highest sample throughput
• Highest flexibility and accessibility toserve as an advanced research tool
The unequivocal separation of analyte ionsfrom spectral interferences is a prerequisiteof accurate and precise analysis. High massresolution is the universal means for thisseparation.
Spectral interferences are the mainlimitation of ICP-MS. The argon plasma gas,water, acid and the sample matrix itself cancombine to introduce a wide range of poly-atomic ion species. The resultant interferingspecies may have the same nominal massas an analyte ion and thus return a falselyhigh value for the analyte. Numerousstrategies have been used in order to try tominimize or circumvent the formation ofthese spectral interferences. These includemathematical corrections, special sampleintroduction systems, special plasmaparameters and collision/dynamic reactioncells to neutralize part of the interferences.High resolution with a sector-field massspectrometer simply distinguishes the analytefrom interference by difference in mass.
The capability of high mass resolution isa feature unique to the ELEMENT 2/XRproduct lines. This ability can be used forquantification and isotope ratio analysis fornearly the whole periodic table, and inalmost all matrices.
Even in a sample matrix as simple asultra pure water (UPW), interferencesdo exist especially at low analyteconcentration levels:
High Mass Resolution
27.95Mass [u]
27.94 27.96 27.97 27.98 27.99 28.00 28.01
28Si
12C16O
14N2
43.90Mass [u]
28Si16O
12C16O2
44Ca
43.92 43.94 43.96 43.98 44.00
Silicon in UPW, Medium Resolution
Phosphorus in UPW, Medium Resolution
Calcium in UPW, Medium Resolution
30.94 30.95 30.96 30.97 30.98 30.99 31.00 31.01Mass [u]
15N16O
14N16OH
30.94 30.95 30.96 30.97 30.98 30.99 31.00 31.01Mass [u]
31P
Zoom in
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
The more complex the sample matrix, thewider the range of interferences that willoccur. The main advantage of high massresolution as a technique to remove spectralinterferences is that it is not just limited to aparticular type of interference. With highmass resolution, iron at m/z 56 is easilyseparated in a simple matrix from 40Ar16O aswell as in more complex matrices from, forexample, 40Ca16O or 12C2
16O2.Arsenic at m/z 75 can be determined in
HCl, separated from the 40Ar 35Cl interference,or, in a matrix containing Ca and chloride,from 40Ca35Cl.
Matrices such as mineral acids andorganic solvents, which form a plethora ofspectral interferences, can be easilyanalyzed using the high resolution mode.
High resolution results in simple clearspectra and does not create newinterferences.
Iron in Liquid Crystal Matrix, Cold Plasma, Medium Resolution
Zinc in H2SO4 (10 % w/w), High Resolution
Nickel Isotopes in Groundwater, Medium Resolution
Mass [u]
32S32S
32S16O2
63.89 63.90 63.91 63.92 63.93 63.94 63.95 63.96 63.97
Mass [u]
64Zn
63.89 63.90 63.91 63.92 63.93 63.94 63.95 63.96 63.97
Zoom in
Mass [u]
40Ar16O
55.80 55.85 55.90 55.95 56.00 56.05 56.10
56Fe
12C216O2
59.88
Mass [u]
32S16O12C
59.90 59.92 59.94 59.96 59.98 60.90 60.92 60.94 60.96 60.98 61.92 61.92 61.94 61.96 61.9860.88 61.88
60Ni
46Ca16O43Ca16OH
44Ca16OH
61Ni62Ni
44Ca16O
Resolution Specification(10 % peak valley definition)3 fixed resolutions:Low Resolution > 300Medium Resolution > 4000High Resolution > 10000
Principle
The ELEMENT 2 is a doublefocusing magnetic sector fieldICP-MS.
Plasma and InterfaceThe argon plasma ion source and samplinginterface of the ELEMENT 2/XR are atground potential1. This enables thestraightforward coupling of peripherals likeHPLC, CE, GC and laser ablation. Theinterface reduces the initial kinetic energyspread from ~20 to ~5 eV by capacitivelydecoupling the plasma from the load coil,using a grounded guard electrode. Thisreduced energy spread increases the iontransmission and delivers superiorsensitivities at all resolutions.
The ion transfer optics focus the ionsfrom the plasma interface on the entranceslit of the double focusing analyzer. The iontransfer optics are designed for lowbackground, highest sensitivity andminimum mass bias at maximum stability 2.
High ResolutionThe ELEMENT 2/XR is able to fullyautomatically change between three fixedresolutions by switching the positions of theentrance and exit slits in < 1 s. The patenteddesign of the fixed slit mechanism3 offersmaximum stability and reproducibility ofresolutions.
1 Patent issued: US 5552599, GB 22824792 Patent issued: US 56251853 Patent issued: US 5451780, GB 2281438
• Ion Transfer OpticsGuarantees a flat response curve,low background and high sensitivity
• 3 fixed resolutions:R = 300R = 4000R = 10000
• Highly laminated, water cooledmagnet, m/z: 7 - 240 - 7 in < 150 ms
• 25 ppm/8 hour mass stability
HRMRLR
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
• Simultaneous measurement in analogand counting modes
• > 109 linear dynamic range (ELEMENT 2)• > 1012 linear dynamic range (ELEMENT XR)• < 0.2 cps dark noise• Fully automatic cross calibration
• Interface at ground potential• Easily changeable cones• Resistant against chemicals
• Torch with Guard Electrode (GE)The GE decreases the ion energy spread, thus increasingion transmission. This and the high acceleration voltageused in a sector field ICP-MS results in increasedsensitivity. The GE is also required for Cold Plasmameasurements
Mass SeparationThe magnetic field disperses ions accordingto their mass and energy. The magnet usedin the ELEMENT 2/XR is specificallydesigned for use in ICP-MS applications. It isrelatively small (sufficient for the mass range0 – 260 u), highly laminated and efficientlywater-cooled for the highest mass stability.Changing of the magnetic field is controlledby a magnetic field regulator with a newhigh power stage, which delivers the fastestscan speed ever possible with a magneticsector field instrument 4.
After passing through the magnetic fieldthe ions enter the electrostatic analyzer forenergy focusing. The combination of themagnetic and electrostatic fields results in thedouble focusing, high resolution properties ofthe ELEMENT 2/XR.
Detection SystemThe ELEMENT 2 is equipped with a discretedynode detector system. Rather than havingthe ion beam directly strike the detector toinitiate an electron cascade, the secondaryelectron multiplier implemented in theELEMENT 2 uses a conversion dynode at -8kV, producing a uniform response across themass range. The detector is linear over nineorders of magnitude – from ppq to ppmconcentrations. The quantification of traceand major elements is therefore possible ina single analysis.
Another step aheadThe detection system of the ELEMENT XRincreases the linear dynamic range to > 1012
orders of magnitude by incorporating asingle Faraday detector.
4 Thermo Scientific Technical NoteTN30074_E
Resolution
Low ResolutionLow resolution (R = 300) is used for theanalysis of non-interfered isotopes. In thismode the ELEMENT 2‘s sensitivity is thehighest of all commercially available ICP-MS instruments. Additionally, the flat toppeak shape is an advantage for highprecision isotope ratio measurements.
Medium ResolutionMedium resolution (R = 4000) guaranteesinterference-free analysis for most elementsin the majority of sample matrices. Forexample, transition elements are routinelymeasured in medium resolution due to theformation of many interfering polyatomicspecies in the mass range 24 – 70 u.
High ResolutionHigh resolution (R = 10000) is used for theanalysis of elements in the mostchallenging sample matrices. For example,high resolution is used to separate As andSe from argon dimer interferences andargon chloride interferences in chlorinematrices, heavy rare earth elements fromlight rare earth element oxides in geologicalmatrices, platinum group elements fromargon-transition metal molecular species,and/or the oxides of Hf, Ta and W.
115.2
350000
300000
250000
200000
150000
100000
50000
0114.6 114.7 114.8
Inte
nsity
[cps
]
114.9Mass [u]
115.0 115.1
35000
30000
25000
20000
15000
10000
0114.88 114.89 114.90
Inte
nsity
[cps
]
6000
5000
40000
30000
20000
10000
0
Inte
nsity
[cps
]
Mass [u]114.91 114.92
114.895 114.900Mass [u]
114.905 114.910
100 ng/L 115In, Low Resolution
100 ng/L 115In, Medium Resolution
100 ng/L 115In, High Resolution
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
Since the change in mass resolution isachieved by changing the width of theentrance and exit slits of the massspectrometer, the instrumental sensitivityof a high resolution ICP-MS is dependenton the resolution mode used. Therefore,the ELEMENT 2/XR with three fixedresolutions has three sensitivities: the widerthe slit, the higher the sensitivity.
Fixed sensitivity ratio between resolutions:independent of mass and matrix.
Even in high resolution mode, the intrinsicsensitivity of the ELEMENT 2/XR providessub ppt detection limits.
0194.85
Mass [u]
Inte
nsity
[cps
]
1000
2000
3000
4000
5000
6000
7000
194.90 194.95 195.00 195.05 195.10
179Hf16O
195Pt
052.0
Mass [u]
Inte
nsity
[cps
]
10000
20000
30000
40000
50000
60000
52Cr
52.2 52.4 52.6 52.8 53.0
40Ar12C
37Cl16O53Cr
0168.86
Mass [u]
Inte
nsity
[cps
]
50000
100000
150000
200000
250000
169Tm
153Eu16O
168.88 168.90 168.92 168.94 168.96 168.98 169.00
100 µg/L Hafnium, 100 ng/L Platinum, High Resolution
Chromium in Blood, Medium Resolution
Thulium in Europium Matrix, High Resolution
Sensitivity SpecificationLow Resolution (R = 300)
115In > 1x106 cps/ppbMedium Resolution (R = 4000)
115In > 1x105 cps/ppbHigh Resolution (R = 10000)
115In > 1.5x104 cps/ppbBackground in all 3 resolutions < 0.2 cps
Sensitivity and Stability
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
225.4 225.6 225.8 226.0 226.2 226.4Mass [u]
Inte
nsity
[cps
]
bkg<0.2 cps
226Ra
bkg<0.2 cps
0.22.05.01.50.60.30.30.040.030.061.3
Medium52CrMedium47Ti
High155GdHigh75AsMedium79BrMedium66ZnMedium63Cu
Low151EuLow107AgLow90ZrLow23Na
ResolutionLoD [ng/L]in solution
Concentration [ppq]0
Nor
mal
ized
Inte
nsity
[ppq
]
1 2 3 4 5 60
1
2
3
4
5
6
Sensitivity and Low BackgroundIt is obvious that the highest instrumentalsensitivity is essential to achieve the lowestdetection limits. However, it is the signal tonoise ratio that dictates the detection limit.The ELEMENT 2/XR guarantees an off-peakbackground of < 0.2 cps for all threeresolutions. Detection limits in the fg/Lrange are possible.
Detection Limits in ComplexMatricesEven in cases where the lowest detectionlimits are not the goal, the exceptionallyhigh sensitivity of the ELEMENT 2/XR offersan important advantage. With the highersensitivity, higher dilution factors forcomplex matrices can be used withoutsacrificing detection limits.
Sensitivity and ‘Dilute and Shoot’The requirement for matrix separation forsamples such as seawater, mineral acids ororganic solvents is replaced by a simpledilution. Using this ‘dilute and shoot’approach, the matrix load on the sampleintroduction system, plasma and interface isreduced. This is also particularly importantfor the analysis of nuclear sample matriceswhere the minimization of waste is ofparamount importance.
Mineral Water, undiluted (5 % HNO3), ~200 fg/L Radium, Low Resolution
Detection Limits in 50 mg/L Uranium
226Ra, External Calibration, 1, 4, 6 pg/L, R2 = 1.000
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
120
100
80
60
40
20
00 5 10 15
Concentration [ppt]-5
Inte
nsity
[cps
]
5.1 ng/L As
50
60
70
80
90
100
110
Cu Zr Ag Ba Tl Cr Mn Li Na Feelement
Reco
very
[%]
4.0
4.2
4.4
4.6
4.8
5.0
5.2
5.4
5.6
5.8
6.0
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16analysis #
conc
entr
atio
n[p
pt]
Sn120(LR)2.5%
Fe56(MR)2.2%
As75(HR)4.1%
Signal Stability 2 Hours Low,Medium and High Resolution: 5 ng/L
Signal Stability and DetectionLimitsSector field ICP-MS offers superior iontransmission stability due to the highacceleration voltage (-8 kV) and excellentfocusing properties.
In combination with the high sensitivity,low background, interference-freemeasurements and an advanced sampleintroduction system, the ELEMENT 2/XRdelivers the lowest detection limits –independent of the sample matrix. Theresulting low detection limits combined withhighest stability at single digit ppt level enablequantification at the lowest concentrations.
Standard Addition Analysis of Arsenic in HCl (10 % v/v)
1 ng/L Spike Recovery UPW
Stability Specifications< 1 % RSD in 10 minutes< 2 % RSD in 1 hour
Mass Stability
The mature design of theELEMENT 2 delivers the fastestscan speed ever for a magneticsector field ICP-MS. With theELEMENT 2 a jump from 7 to 240to 7 is realized in < 150 ms.
ScanningRoutine scanning is performed by acombination of magnetic and electric jumps.
The ELEMENT 2/XR has the uniquecapability to scan +30 % from the magnetmass by decreasing the accelerationvoltage. The magnetic field is kept constantwhile the acceleration voltage is varied.This ingenious combination of scantechniques delivers the fastest scanningever realized by a sector field ICP-MS.
Mass StabilityThe ELEMENT 2/XR guarantees the highestmass stability of any ICP-MS. This enablesfast peak top jumping analyses rather thanscanning across the whole peak, thussignificantly decreasing analysis times. Acombination of mature hardware andintelligent software guarantees massstability in high resolution, which makesmass calibration a rare event.
The synthesis of these characteristicscombined with high sensitivity, allowing shortintegration times, makes the ELEMENT 2/XRthe fastest sector field ICP-MS ever.
The scan speed of the ELEMENT 2 incombination with the high sensitivityopens the dimension of its use as adetector for fast transient signals.
SpecificationsMass stability: 25 ppm / 8 hoursMagnetic scan speed: m/z 7 to 240 to 7 < 150 ms
10
9
8
7
6
5
4
3
2
1
0
7
238
0 50 100 150 200 250
Time (ms)
Coil Current (A) Mass (m/z)
5ms 5 ms
5ms5ms 5ms
m/z 7-23875ms
m/z 238- 750ms
m/z 238- 750 ms
m/z 7-23875ms
77.921
77.92
77.919
77.918
77.917
77.916
77.915
77.914
77.913
Cent
roid
Mas
s
Analysis
y-scale is equivalent to peak width in high resolutiom
Timing for a Full Magnet Cycle
12-Hour Mass Stability for 78Se in high resolutionTherm
oScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
Ion Detection System
The goal of real life analysis isthe simultaneous determinationof major and trace elements.
The ELEMENT 2 is equipped with a discretedynode detection system that enables thequantification of both trace and majorelements in a single analysis across adynamic range of 109.
The ELEMENT 2 detector systemincorporates a conversion dynode at -8 kV.The high acceleration to -8 kV results in amass independent detector response,enabling fully automatic cross calibrationbetween the counting and analog modes.
No user interaction is necessary.
The automatic cross calibration ensures aconstantly updated detector response at alltimes – ready for the unexpected sample!
Additionally the detector enables themeasurement of large isotope ratios. Withthe minor isotope in counting mode and theabundant isotope in analog mode the highestprecision and accuracy can be obtained.
Another step aheadThe most recent high resolution ICP-MS, theThermo Scientific ELEMENT XR, opensanother dimension of linearity in ICP-MS.Incorporating a single Faraday detector inaddition to the discrete dynode detector offers> 12 orders of magnitude linear dynamicrange. Herewith the dream of analyzingultra-trace elements and matrix elementswithin the same analysis becomes true!
Extremely short integration times of < 1ms in analog and Faraday mode, and 0.1 msin counting mode in combination with aswitching time of 1 ms between analog andfaraday mode, makes the ELEMENT XR theperfect tool for transient signals such asthose from laser ablation.
SpecificationsDynamic Range > 109 with automaticgain calibration (ELEMENT 2)
Dynamic Range > 1012 with automaticgain calibration (ELEMENT XR)
ELEMENT 2 Ion Detection System
ELEMENT XR Ion Detection System
e-
m +
countingsignal
Ions
Electrons
analogsignal
SEMConversionDynode
countinganalog
12345
The ELEMENT 2/XR SoftwareThe ELEMENT 2/XR software controls andmonitors all instrument functions for ICP-MS analysis. This includes data acquisitionand auto-tuning of the ELEMENT 2/XR.
The software also provides the fullrange of quantification procedures requiredin elemental analysis (qualitative,quantitative, semi-quantitative, isotopedilution) as well as isotope ratio and timeresolved analysis modes.
Controlling and Tuning
• Autotuning of all parameters, includingICP parameters, torch position, lenses andmultiplier voltage
• Fully automated and configurable plasmastart and stop sequence
• Easy autosampler setup using a graphicaldisplay of the autosampler
Setup of Methods• Intuitive and easy selection of target
isotopes in periodic table or spreadsheetdisplay modes
• Automatic, customizable isobaricinterference correction
• Spreadsheet style ‘click-and-drag’ cellfill down
Creating and Running Sequences
• Intuitive and easy creation of sampleanalysis sequences in graphical orspreadsheet display modes
• Integrated powerful QA/QC package thatmeets internationally regulatedrequirements including US EPA 200.8 and6020. The flexible editor included can beused to define specific QA/QC criteria inany laboratory.
Displaying Results and Creation
Displaying Results and Creationof Reports
• Real time display of spectra, calibrationcurves, fully quantitative results and timeresolved analyses
• On-line export of time resolved data inseveral formats (ASCII, GRAMS,Spectacle, GLITTER, ANDI and Xcalibur®
for further analysis in third party programs
The Software Suite
The ELEMENT 2/XR software is a state-of-the-art, simple to use software suite taking advantage of thereliability and stability of Windows™ XP Professional. The software package is optimized for the needs ofthe routine analyst, providing stability and ease of use for basic operation of the ELEMENT 2/XR, and yetretains the flexibility for advanced operation.
Due to the use of the Windows™ XP Professional operating system and standardized programming, thedata system computer can be easily connected to a network, enabling data transfer and allowing remotecontrol of the ELEMENT 2/XR.
•Remote Control & Diagnostic
•Setting & Read-Back of All Instrument Parameters
Instrument Startup and Autosampler Control
ThermoScientific
ELEMEN
T2/XR
High
Performance
High
ResolutionICP-M
S
Product Specification14
1
63
88
79
106
174
12510367
3736
141 33
Specifications and Installation RequirementsSensitivity (Concentric Nebulizer) > 1 x 109 counts per second (cps)/ppm In
Detection Power < 1 ppq for non-interfered nuclides
Dark Noise < 0.2 cps
Dynamic Range > 109 linear with automatic gain calibration (ELEMENT 2)> 1012 linear with automatic gain calibration (ELEMENT XR)
Mass Resolution 300, 4000, 10,000 (10 % valley, equivalent to 5 % height);600, 8000, 20,000 (FWHM)
Signal Stability < 1 % RSD over 10 minutes< 2 % RSD over 1 hour
Scan Speed (magnetic) m/z 7 to 240 to 7 < 150 ms
Scan Speed (electric) 1 ms/jump, independent of mass range
Oxide and Doubly Charged Ions ratio measuredBaO+/Ba+ < 0.002Ba2+/ Ba+ < 0.03
Power 3-phase, 230/400 V ±10 %,50/60 Hz fused 32 A per phasePower consumption: ~9 kVA
Environment Temperature 18 – 24 °C (64 – 75 °F)Humidity 50 – 60 %, noncondensing,non-corrosive
Cooling Water ~ 200 l/hTemperature 10 – 20 °C4 – 6 bar (43 – 65 psi)
Argon Purity 99.996 min.18 L/minRegulated pressure 8 –10 bar (116 –145 psi)Uninterrupted argon supply recommended
Plasma Exhaust 1 x 6 cm Ø; 90 m3/h(Argon + suspended sample)
Electronics Exhaust 2 x 15 cm Ø; 800 m3/h
ELEMENT 2 and ELEMENT XR:, Footprint and Dimensions(all dimensions in cm)
The use of an Inductively Coupled Plasmasource (ICP) is the accepted and mostpowerful technique for the analysis andquantification of trace elements in both solidand liquid samples. Its applications rangefrom routine environmental analyses to thematerials industry, geological applications toclinical research and from the food industryto the semiconductor industry.
Thermo Fisher Scientific is the onlyinstrument manufacturer to offer the fullrange of Inductively Coupled PlasmaSpectrometers (ICP, Quadrupole and SectorField ICP-MS) to satisfy every aspect ofplasma spectrometry from routine to highlydemanding research applications.
Develop your lab from the easy-to-useThermo Scientific iCAP ICP to the highperformance Thermo Scientific XSERIES 2Quadrupole ICP-MS and up to the ultra-sophisticated ELEMENT 2 and NEPTUNESector Field ICP-MS instruments. Eachinstrument combines leading-edgetechnology, fit for purpose and affordabilitywith a tradition of quality, longevity,accuracy and ease of use.
For direct analysis of conductivematerials down to the parts per billion(ppb), Thermo Fisher Scientific also offersGlow Discharge technology: the ThermoScientific ELEMENT GD.
Plasma Capabilities from Thermo Fisher Scientific
BR30027_E 11/08C
Thermo Fisher Scientific (Bremen) GmbHis certified DIN EN ISO 9001:2000
©2008 Thermo Fisher Scientific Inc. All rights reserved.Windows is a registered trademark of MicrosoftCorporation in the United States and possibly othercountries. All other trademarks are the property ofThermo Fisher Scientific Inc. and its subsidiaries.
Specifications, terms and pricing are subject to change.Not all products are available in all countries. Pleaseconsult your local sales representative for details.
Thermo ScientificELEMENT 2/XR Sector Field ICP-MS orELEMENT GD Glow Discharge ICP-MS
Thermo ScientificXSERIES 2 ICP-MS
Thermo ScientificiCAP ICP
Thermo ScientificNEPTUNE Multicollector ICP-MS
In addition to these offices, ThermoFisher Scientific maintains a networkof representative organizationsthroughout the world.
Africa+43 1 333 5034 127 • [email protected]
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