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The Power to Amaze.
CADFEM SUISSE USERS’ CONFERENCE 2016
THERMAL, MECHANICAL AND ELECTRICAL
DESIGN OF A POWER INVERTER USING ANSYS
WORKBENCH
Klaus Neumaier, Yafan Zhang
June 16, 2016
2
• Introduction
– Fairchild Semiconductor (FCS)
– Package & System Simulation
• Device Under Test
• Design Data Import
• Parasitics Extraction (Ansys Q3D)
• Structural Model (Ansys Mechanical)
• Electronics Cooling (Ansys Icepak)
Agenda
3
Fairchild Semiconductor
Technology Development Centre Munich Products:
Analog, Logic & Optoelectronic Devices
Discrete Semiconductors
Power Semiconductor Modules
Packages:
Big variety of packages, standard and Fairchild specific module packages
Applications:
Motion Control, Mobile, Automotive,
Energy Conversion (esp renewable), Power Supplies, Consumer, Lightning
Technology Development Centre
Munich
4
Introduction
• ANSYS WB : integrated modeling and solver tools (different types of
analyses)
Modeling: DesignModeler, SpaceClaim + Solid Edge, E/CAD
Structural: ANSYS Mechanical + ANSYS Moldflow, LS-Dyna
Thermal: ICEPAK, Simplorer
Electrical: Simplorer, Q3D + PSPICE, TCAD
• Power Electronics Packaging Simulation Goal:
Multi-Level & Multi-Domain Modeling
• Device Under Test: Optimization of a large current density and highly
parallelized 3-phase reference board for motor drive applications
(ref. PCIM Europe 2016, 10-12 May, Nuremberg, Germany)
5
Device Under Test
Motor drive power
• Need for compact high power (> 5kW) motor drive applications that enable fast
switching and good thermal management
• 3-phase 100V/100A design presented, 10 parallel FDMD85100 devices in parallel for
each phase (can be operated up to 480 A) => 30 packages on the PCB
FDMD85100: Accommodates two
FCS N-channel PowerTrench MOSFETS
6
Design Data Import in WB
E/CAD
OUT1
Thermal
Pad
Driver
PGND
PGND
Top Layer
10x H
B M
OS
FE
T
Signal Bus
Drain
OUT1
Connector
SpaceClaim Bottom
Layer
CA
D
FDMD85100
PowerTrench® MOSFET
Leadframe
2x MOSFET (soldered)
Overmolded S
Iwa
ve
Improved
Data
Exchange by
ANSYS R17
by
integrating
SpaceClaim
7
• Problem: Influence of board parasitics on losses and undesired oscillations
• ANSYS Q3D was used for PCB parasitics extraction
• In doing so, one can avoid
– oscillations originating from parasitics in the main power loop
– Large parasitics on the source side of the switching device which can
heavily impact losses
Parasitic Extraction
8
Parasitic Extraction
Total Loop
inductance
Source-Ground
Parasitic
Undesired turn on
osciallations
And losses
Using 3-D simulation Lp optimization can be conducted
9
Parasitic Extraction Self inductance, nH Point 1 Point 2 30MHz
1 D D1 3.2249
2 D D5 3.2072
3 D D10 3.45
4 D1 D5 2.4024
5 D5 D10 2.3837
Self inductance, nH Point 1 Point 2 30MHz
1 G1 S1 1.97167
2 G1 S5 2.5771
3 G1 S10 0.41862
4 G2 S1 0.341715
Dendrite structure for
improved parasitics
Shortening of
dentride arms
10
Material Input Data
Structural Model – Metal Fraction
Extraction
Cadence
*.brd file
1. E/CAD data mapped on regular grid => homogenized metalization
Layer Top Layer Dielectric Layer Bottom
2. Homogenized data mapped on FE Mesh
Assign
FR4
11
Structural Analysis – Equivalent Material
Properties
Layer Top Layer Dielectric
Layer Bottom
Assign
FR4
Structural Simulation
ds.dat includes 664 Material
Definitions !
Thermal Simulation
ds.dat includes 664 Material
Definitions !
Obtained Equivalent Material
Properties are assigned to elements
• Equivalent Material Properties can not be visualized in WB
• ds.dat files shows the definitions and assignment to
elements
• Limitation: Vias are generally filled (no Cu plating)
• No problem for structural investigations
• For thermal analyses provide ‚equivalent‘ material
properties
12
Structural Model – Thermal Analysis
Layer Bottom
° C
Top Bottom
Cut Plane Through Package
Vias and Traces are not visible in
thermal contours
Static Thermal Analysis
Tambient = 23 °C
Convection: α=10 W/m² (estimate)
Radiation: ε=0.8
P/MOSFET = 0.8 W DC (worst case estimate)
48 W total
Thermal Improvements needed !
13
Structural Model – Thermomechanical
Results
Layer Bottom
Uz [mm]
Static Structural Analysis
• Temperature results are mapped from thermal investigation
• All material properties are linear-elastic
• PCB mechanically fixed at center
• Warpage of maximum 0.8 mm offers capabilities to accomodate all
packages in a common heat sink
10X Scale
SEquiv[MPa]
Warpage
Stress (w/o Packages)
Highest Stresses in Chip-Solder
Interface and Package Attach
Mesh does not meet the
requirements for Package-Level
Reliability investigation SEquiv[MPa]
14
System Thermal Analysis using ICEPAK
Thermal Measurement Setup
Tamb=23°C
Natural Convection Cooling
Loadcase 1: Single Package @
P/MOSFET = 0.22 W, 0.42 W, 0.66 W,
0.93 W, 1.19 W
Loadcase 2: Three Packages @
P/MOSFET = 0.475 W
• Meshing strategy: local mesh assemblies
• Assemblies reflect objects orthogonal bounding
• ICEPAK modeling limitated in terms of object rotation
• 25 Mio Cells needed
Orthogonal bounding box
assemblies only
PCB
packages
Assembly Problem
15
System Thermal Analysis
PCB Modeling by E/CAD Data Import
Traces Bottom Layer
Vias
Layers
Vias
Rth
Plates
Traces Top Layer
16
System Thermal Analysis
PCB Material Modeling
z-plane
xy-plane
% metal
z-plane
Top
Dielectric
Bottom
ANSYS computes virtual
material (taken from FR-4 and
Cu) for vias
board_config.dat
K_eff
[W/mK]
17
System Thermal Analysis
z-plane
Single Package
Test
3-package
Test
System Thermal Analysis of 30 packages
THANK YOU