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The Next Generation in System Design

The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

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Page 1: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

The Next Generation in System Design

Page 2: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

“The primary motivation for using a system simulator

is to establish the right system architecture and

suitable specifications for the underlying components.

The sooner the engineering team has an accurate

understanding of system performance before

committing to hardware, the faster it can move

the product to manufacturing and ultimately into

the hands of consumers.”

Ted Miracco, Executive Vice President, AWR

FEATURES

• Fully integrated into AWR Design Environment™

• Integrates circuit and system designs

in one simulation platform

• Fast system simulations

• Support for complex measurements

• Extensive core model library

• Enhanced radio-frequency (RF)

behavioral models

• Seamless integration with test and

measurement (T&M) equipment

• Multi-rate complex envelope engine

• Automatic synchronization of

component delays

• RF models account for mismatch and

voltage standing wave radio (VSWR) effects

BENEFITS

• Reduces the number of design iterations,

speeding time-to-market

• Reduces system cost by ensuring against

overspecification of components

• Eliminates simulation bottlenecks

• Reduces development and production

turnaround cycles

• Cutting edge models provide the most

accurate representation of complex

communications systems

NEW IN 2004

• RF budget analysis for calculating cascaded

performance of the RF link

• Phase lock loop (PLL) simulation blocks for

interactive investigation of the dynamics of

frequency synthesizers and frequency and

phase modulators

• Core enhancements including tighter

integration with Analog Office™ design suite

and Microwave Office™ design suite

• Adaptive behavioral models and

enhanced measurements

• Support for Linux platform

• Code division multiple access 2000

(cdma2000) signal source model

• Digital video broadcast (DVB) signal

source model

Page 3: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

Visual System Simulator:

The Next Generation in System Design

Applied Wave Research, Inc. (AWR™) has established itself as a leading worldwide

provider of high-frequency electronic design automation (EDA) software. The company

has developed a revolutionary, future-facing product architecture and open system

platform that embodies years of knowledge and expertise in RF, microwave, and

millimeter wave design applications and delivers an unprecedented level of design

automation and productivity improvement not offered in any other design system on

the market today. AWR has introduced some of the most exciting and compelling high-

frequency design tools in the industry, while completely resetting expectations on how

fast a software developer can react to the needs of its customers. As a result of its

industry-leading product innovation and customer responsiveness, AWR has established

a loyal worldwide customer base that continues to expand rapidly.

The primary motivation for using a system simulator is to establish the right system

architecture and formulate suitable specifications for each of the underlying

components. Accomplishing this goal allows companies to reduce their time-to-market

by eliminating iterations and rework, and reduce system cost by ensuring that

components are not over-specified and more expensive than necessary. The sooner

the engineering team has an accurate understanding of system performance before

committing to hardware, the faster it can move the product into manufacturing and

ultimately into the hands of consumers.

AWR Design Environment

Built on an advanced software architecture, the unique core technology in the AWR

Design Environment is a modern object-oriented data model that is inherently open

and flexible compared to legacy design tools. The AWR Design Environment elevates

the product development process by allowing the entire engineering team to effortlessly

integrate Visual System Simulator™ (VSS) system designs into one platform with Analog

Office for RFIC design, Microwave Office for monolithic microwave integrated circuit

(MMIC), and TestWave™ for simulation with test and measurement equipment. This

provides an accurate understanding of the impact of today's complex modulated RF

signals and "real world" circuit performance. The result is a truly revolutionary design

approach that enables interactive trade-offs between system requirements and circuit

implementation.

SALES

2000 2001 2002 2003

AWR Annual Sales

TestWave

Analog & RFICDesign

Microwave IC, Module& PCB Design

Communications Subsystems Design

t

t

t t

t

t

tTestWave

Page 4: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

Visual System Simulator Design Suite

Visual System Simulator is a comprehensive software suite for the design of complete,

end-to-end communications systems. The VSS technology uses an advanced, time-based

simulation engine coupled with circuit simulation tools that enable systems and circuit

designers to work together within a single environment to perform interactive, top-down

analysis of analog and digital communications systems. The software can incorporate either

high-level behavioral models or detailed transistor-level circuit designs from AWR’s Analog

Office and Microwave Office software suites. VSS also offers seamless integration with AWR’s

TestWave instrument interface software. This enables engineers to perform analysis at the

system level, where hardware measurements are incorporated through a bi-directional link

to popular test and measurement equipment.

VSS effectively gives the entire engineering organization the “big picture,” including the

RF impairments in the presence of complex modulated signals. The solution reduces time-to-

market by providing a single integrated environment wrapped in an intuitive, easy-to-use

interface. VSS allows users to transcend the system hierarchy and easily move from very high

levels of abstraction right down to the details—from simulations that include layout parasitics

to the incorporation of measured data, for example, bit error rate (BER), adjacent channel

power ratio (ACPR), error-vector magnitude (EVM), or signal-to-noise ratio (SNR).

VSS technology enables designers to easily make critical system performance measurements,

accurately analyze the impact of RF components on modulated signals, and make cost-

effective trade-offs between system and circuit specifications.

"In the design of our state-of-the-

art wireless systems, VSS2003

has been instrumental in our

understanding of the performance

of our mesh networking cells.

Our design team has been very

pleased with the support we

have received from AWR and

their commitment to our

company's success."

Jay Kruse

Design Engineer

Tropos Networks

Page 5: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

Blazingly Fast System Simulations

VSS, with its core algorithmic advantages, provides an

extremely fast simulation engine that reduces overhead

and eliminates simulation bottlenecks. The software

combines a data-driven approach with novel block-

processing techniques to efficiently manage the flow of

data between blocks. In addition, elastic first-in-first-out

(FIFO) buffers are used to streamline the flow of data

and eliminate wait states. VSS automatically establishes the proper alignment of symbol data

for BER analysis, so users can rapidly change components without recalculating the delay.

And VSS supports asynchronous data transfer, thus naturally handling multi-rate processing.

Support for Complex Measurements

The complexity of signals used in today’s wireless communications products creates unique

design challenges. Conventional measurements for characterizing non-ideal components

are inadequate to address the actual system specifications that drive product development.

Reducing development and production turn-around cycles and speeding time-to-market

demands a flexible interactive system- and circuit-savvy computer-aided engineering (CAE)

environment. VSS was designed to meet the needs of both systems and circuit engineers

by providing an extensive library of built-in measurements such as BER, ACPR, EVM, SNR,

and complex cumulative distribution functions (CCDF). Users can quickly determine how

a component will behave while operating under real world conditions.

Core Model Library

VSS2004 offers a vastly expanded library of core elements

as well as optional application-specific libraries that

support the latest emerging standards such as 3G,

GSM/EDGE, 802.11, cdma2000, and DVB. These elements

can be used to build an accurate representation of the

most complex communications systems. The library

includes improved encoders/decoders (including Viterbi,

Reed-Solomon, convolutional and others),

modulators/demodulators, and filters.

Page 6: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

The enhanced RF behavioral models in VSS2004 provide

advantages for RF/analog engineers who typically use multiple

tones to analyze the nonlinearities of an RF link. The new

VSS2004 behavioral amplifier and mixer models enable

engineers to monitor and predict the harmonics and

intermodulation products in the out-of-band regions as well

as near the carrier frequency.

Inclusion of VSWR effects is important for accurate analysis

of RF/analog subsystems. While traditional system simulators by definition assume ideally

matched interconnection between models, VSS2004 models can now take impedance

mismatches into account. This patent-pending capability is a result of AWR proprietary

research and development efforts, and enables designers to monitor resulting spurs and

account for impedance mismatch of the entire RF link.

RF Budget Analysis

RF budget analysis is AWR’s unique new solution to enable designers for the first time

to calculate cascaded performance of the RF link. This new addition to VSS system

measurements takes the software to a higher level of RF subsystem analysis. Traditional

RF/analog system analysis commonly requires several tools to achieve a complete analysis

of end-to-end performance. For example, the engineering team may use one tool for EVM

measurements and another for calculating cascaded noise figure (NF) and output IP3 (OIP3).

With VSS2004, engineering teams now have an efficient and comprehensive platform

for making RF cascaded calculations at interior points of the RF link to perform an EVM

measurement, all within a single system diagram. Working in one environment provides a

seamless flow of information between traditional systems engineers and RF/analog engineers.

VSS2004 with RF budget analysis is an even more powerful tool that enables the engineering

team to perform trade-off studies in order to balance performance parameters such as gain

distribution, spurious levels, and receiver sensitivity. With VSS2004 designers can quickly

discover systems deficiencies and eliminate design turns.

“VSS was an effective integrative

and analytical tool for exploring

an alternate implementation

of modulation for our products,

allowing serious assessment

of the proposed modulation in

a short amount of time. AWR

support was excellent.”

John Lane

Engineering Consultant

Page 7: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

PLL Simulation Blocks

Phase lock loops (PLLs) are an integral part of communications systems.

The integration of dedicated behavioral PLL blocks into VSS2004 provides

the ability to interactively investigate the dynamics of frequency synthe-

sizers and frequency/phase modulators and demodulators.

The PLL models are designed to give engineers access to high-level

parameters such as the charge-pump current and voltage-frequency gain

(Kvco) of the voltage control oscillator (VCO). Users can choose from

several behavioral filter models that are representative of both passive and active topologies.

After the behavioral loop filter parameters have been determined, engineers can take the

design a step further by replacing this filter with a Microwave Office circuit design.

Through simulations, engineers can establish practical PLL design guidelines. For example,

they can determine the PLL’s stability, phase margin, open- and closed-loop frequency

response, bandwidth, and pole locations. Transient simulation (both fast and accurate) can

be performed to visualize settling time or an abrupt change in the divide-by-N ratio. Using

VSS2004 blocks, the designer can account for many of the non-idealities encountered in

practical PLL implementations. The nonlinear tuning table of a VCO can be imported into

VSS2004 together with its phase noise. Ultimately, the best loop bandwidth, phase noise,

transient response, and phase margin can be determined by working with the VSS2004 PLL

behavioral blocks.

Core Enhancements for 2004

AWR continues to enhance the integration of VSS with Analog Office and Microwave Office

design suites through the AWR Design Environment. VSS2004 provides users with a seamless

connection to incorporate directly into the system diagram both oscillator phase noise and

mixer spur measurements obtained from circuit designs. Upon completion of an oscillator’s

phase noise analysis in Microwave Office, its single-sideband phase noise profile can be

directly imported into the VSS phase noise model. In VSS, for example, the effect of the

phase noise on bit error rate (BER) performance can be determined. A circuit-level mixer

design can be accurately simulated in VSS by exporting the spur analysis results as an MxN

spur table into the system “file based” mixer.

Page 8: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

In addition, the VSS nonlinear amplifier model has been improved, incorporating the

simulation of frequency-dependent characteristics such as those found in ultra wideband

(UWB) systems.

Adaptive behavioral models such as least-mean-square (LMS) and recursive-least-square (RLS)

equalizers have also been added. One use of an equalization system is to compensate for

transmission-channel impairments such as frequency-dependent phase and amplitude

distortion. Besides correcting for channel frequency-response anomalies, an equalizer can be

used to cancel the effects of multipath signal components. The resulting equalizer coeffi-

cients that are generated can be exported to external files to be used, for example, in a

stand-alone finite impulse response filter (FIR).

Core models, such as a lookup table, variable gain amplifier (VGA), and align block, are

found in VSS2004. One use of the lookup table is to simulate the function of a variable

voltage attenuator (VVA) or, more generically, for simulating a nonlinear transfer function.

The VGA model can be used to analyze the behavioral characteristic of an automatic gain

control (AGC) system. The align block analyzes two signals, a reference signal and a

degraded version of the reference signal, for timing alignment and gain and phase

distortion. The signals are then delayed as necessary to time-align the signals on output.

The corrupted signal is gain- and phase-compensated to minimize the effects of gain and

phase distortion. Typically this model is used prior to making an EVM measurement.

Additional signal sources intended for use when performing RF link analysis and/or

conformance testing have been added to the extensive list of VSS2004 models. The new

models are similar to the existing 802.11a/b/g signal generators in that they use the proper

“The unique open, integrated

environment provided in VSS

enabled us to study the effects

of the non-linear distortion on

our communications link margin

using real digital modulated

analog waveforms.”

Stephan VanFleteren

Senior Lead Engineer

General Dynamics Advanced

Information Systems

Page 9: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

modulation and have the correct spectral qualities. The new models consist of DVB and

cdma2000 signal sources. Engineers can also take advantage of the wide range of VSS

primitive models such as forward-error-correction (FEC) and add additional features to these

signal sources. A third-generation (3G) design studio exists for engineers who want to create

3G wideband CDMA (WCDMA) frequency division duplex (FDD) “bit accurate” signals.

VSS2004 measurements have been enhanced as necessary. Root raised cosine filtering (RRC)

is added to the ACPR measurement window to meet the needs of engineers performing 3G

WCDMA FDD conformance testing. The direct importation of spectral masks has also been

added to the VSS measurement window. This feature is particularly useful for engineering

teams performing conformance tests using today’s wireless communication signals.

In addition, through the use of systems annotations, engineers can monitor at each node

in the system such metrics as the signal-to-noise ratio (SNR), signal power, and signal delay.

Seamless Integration with Test and Measurement Equipment

Through the AWR Design Environment, AWR’s TestWave software integrates T&M equipment

with VSS, providing wireless system designers with a complete integration of the design

process. Together, VSS2004 and TestWave combine schematic simulation, test signal

generation, and test and measurement verification. This capability enables designers to

perform computer trade-off studies with "hardware-in-the-loop." Accessing these two

previously disjointed phases of the development process from the same environment

saves time.

Page 10: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

In addition to the TestWave interface, add-in blocks that interface directly from the VSS

system diagrams display in the element browser like other VSS blocks. In essence, VSS can

import signals from T&M or export signals to T&M directly from system diagrams using

TestWave software.

The TestWave tool integrates VSS software with a wide variety of popular test equipment

from manufacturers such as: Anritsu Wiltron, Rohde & Schwarz, Marconi Instruments,

Fluke/Philips, Tektronix, Boonton, LeCroy, Yokogawa, IFR, Wandel & Goltermann,

Advantest, Hewlett Packard, and Agilent Technologies. Equipment types supported by the

TestWave product include network analyzers, spectrum analyzers, modulation analyzers,

and oscilloscopes.

Hardware DUT

TestWave

Page 11: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

SYSTEM REQUIREMENTS AND SUPPORTED PLATFORMS

AWR products support Windows NT4, 2000, XP, and Linux. For more information on product pricing and availability

call 310-726-3000 or visit the AWR website at www.mwoffice.com.

PRODUCT MAINTENANCE AND SUPPORT

Applied Wave Research provides maintenance and support policies that deliver outstanding online, e-mail, and telephone

customer services, as well as significant upgrades and enhancements on a yearly basis. For more information on product

maintenance and support, call 310-726-3000 or visit the AWR website at www.mwoffice.com.

“VSS 2004 offers new features and tighter

integration with our system and RF/microwave

software suites, making it easier than ever

for designers to work together within a single

environment to perform interactive, top-down analysis

of analog and digital communications systems.”

Joel Kirshman

Market Segment Manager, Communications System Design, AWR

Page 12: The Next Generation in System Design · design challenges. Conventional measurements for characterizing non-ideal components are inadequate to address the actual system specifications

US Corporate Office:

Applied Wave Research, Inc.

1960 East Grand Avenue, Suite 430

El Segundo, CA 90245

Tel: (310) 726 3000

Fax: (310) 726 3005

Email: [email protected]

Website: www.mwoffice.com

AWR Europe

Applied Wave Research, Ltd.

Lyon Court, 3rd Floor

Walsworth Road

Hitchin, Herts SG4 9SX United Kingdom

Tel: +44 (0) 870 220 2334

Fax: +44 (0) 870 220 2336

Email: [email protected]

Website: www.mwoffice.com

AWR Japan

Cybernet Systems Co., Ltd.

Sumitomo Fudosan Otowa Bldg. 9-3

Otsuka 2-chome Bunkyo-ku,

Tokyo 112-0012

Tel: (03) 5978 5460

Fax: (03) 5978 6081

Email: [email protected]

Website: www.cybernet.co.jp/products/eda/awr

AWR Authorized Representative:

Call to discuss your specific requirements, arrange a demonstration, or to receive an evaluation CD.

AWR, the AWR logo, Microwave Office, Visual System Simulator, TestWave, Analog Office, AWR Design Environment, EMSight, EM

Socket and, Intelligent Net are trademarks of Applied Wave Research, Inc., Copyright © 2004. All Rights Reserved. All other marks

are the property of their respective holders.

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