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1 The Challenges of Lithography Jack Chen NanoPatterning Technology Co.

The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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Page 1: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

1

The Challenges of Lithography

Jack Chen

NanoPatterning Technology Co.

Page 2: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

2

2019/3/1 LETI Lithography Workshop 2019

INTERNET OF THINGS

We are creating the future!

Page 3: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

What we want

• Faster, lighter

• More integrated functions

• Less power dissipation

• Cheaper

• Custom design/Personalized design

• Privacy and Security

Page 4: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

Moore’s Law Keep Going…

Page 5: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

IC Knowledge cost models: Chip industry is succeeding in

scaling density and costs.

(Source: Scotten Jones presentation at 2017 SEMI ISS)SEMI Industry Strategy Symposium (ISS)

Page 6: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

ITRS roadmap 2000ITRS roadmap 2005ITRS roadmap 2009

Page 7: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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“The limit of lithography will not be in resolution but in economy.”

– Dr. Burn J. Lin, in 1987

Page 8: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

8

All about Money / Time!

• R&D, Capital investment and Readiness in time

Page 9: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

9

2019/3/1 LETI Lithography Workshop 2019

(111): 1cm (111): 0° + 60 °

Innovation-1: Immersion stop 157nm

Burn Lin, Plenary talk in

Immersion Workshop

2002, Antwerp

nquartz=1.56

nwater=1.44

nresist=1.75

First scanner was

ready to ship!

Page 10: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

10

2019/3/1 LETI Lithography Workshop 2019

Innovation-2: SADP push out EUV

Page 11: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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All about Money / Time!

• R&D, Capital investment and Readiness in time

• Wafer cost

• Cycle time

𝐶𝑜𝑛𝑡𝑟𝑖𝑏𝑢𝑡𝑖𝑜𝑛 𝑜𝑓 𝐶𝑎𝑝𝑖𝑡𝑎𝑙 𝑡𝑜 𝑊𝑎𝑓𝑒𝑟 𝑐𝑜𝑠𝑡 =𝐶𝑎𝑝𝑖𝑡𝑎𝑙 𝑑𝑒𝑝𝑟𝑒𝑐𝑖𝑎𝑡𝑖𝑜𝑛

𝑇ℎ𝑟𝑜𝑢𝑔ℎ𝑝𝑢𝑡 × 𝑈𝑝𝑡𝑖𝑚𝑒

Page 12: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

12

Tool price doubles every ~4.5yrs

120M @ 2018

Page 13: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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275wph @ 2018

NXT:2000i

125wph @ 2018

NXE:3400B

Area Throughput doubles every ~ 7.4yrs

Page 14: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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EUV may not save cost!

Wafer cost > 4x of ArFi

Wafer cost >6x of ArFi

Page 15: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

15

Resist Performance trade off Throughput!

Jack Chen, EUVL Symposium 2015

Peter De Bisshop, IMEC 2015

Page 16: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

16

Hi-NA EUV has a half field!

Half field or double masks!

Page 17: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

17

EUV simplify process and shorten cycle time!

Similar cost!

Page 18: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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EUV simplify overlay tree!

Page 19: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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• “The limit of lithography will not be in resolution but in economy.”

– Dr. Burn J. Lin, in 1987

• “The devil is in the mask!”

– Dr. Burn J. Lin, in 2007

Page 20: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

20

All about Money / Time!

• R&D, Capital investment and Readiness in time

• Wafer cost

• Cycle time

𝐶𝑜𝑛𝑡𝑟𝑖𝑏𝑢𝑡𝑖𝑜𝑛 𝑜𝑓 𝐶𝑎𝑝𝑖𝑡𝑎𝑙 𝑡𝑜 𝑊𝑎𝑓𝑒𝑟 𝑐𝑜𝑠𝑡 =𝐶𝑎𝑝𝑖𝑡𝑎𝑙 𝑑𝑒𝑝𝑟𝑒𝑐𝑖𝑎𝑡𝑖𝑜𝑛

𝑇ℎ𝑟𝑜𝑢𝑔ℎ𝑝𝑢𝑡 × 𝑈𝑝𝑡𝑖𝑚𝑒

𝐶𝑜𝑛𝑡𝑟𝑖𝑏𝑢𝑡𝑖𝑜𝑛 𝑜𝑓 𝑀𝑎𝑠𝑘 𝑡𝑜 𝑊𝑎𝑓𝑒𝑟 𝑐𝑜𝑠𝑡 =𝑀𝑎𝑠𝑘 𝑐𝑜𝑠𝑡

𝑊𝑎𝑓𝑒𝑟𝑠 #

Transistor cost? Chip/function/device price!

Mask cost

Page 21: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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Escalating cost of a mask-set

Page 22: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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TSMC Mask and Wafer Counts13

0nm

90nm

65nm

40nm

28nm

20nm

16nm

10nm

7nm

5nm

Mask layers Cut/Block masks80

70

60

50

40

30

20

10

0

Process node

No

. o

f M

ask

s

Source: IC Knowledge LLC

Page 23: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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Less Masks doesn’t save money!

Page 24: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

24

Anthony Yen EUVL Symposium 2013

Pellicle

life time!

Page 25: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

25

EUV Pellicle Life Time is concern!Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing

defects. -- M. Lercel, 2017

• The fragile <30-nm membrane has to be strong enough to

against high G-force, thermal loading, and H*!

• Broken pellicle becomes flake particles inside the scanner

• Re-mounting pellicle takes long time due to inspection!

Page 26: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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Unhealthy Eco-System!

• Sole (EUV) scanner supplier, and very expensive EUV scanner

• Only 3 giant ICMs

• Mask inspection, pellicle, and new resists still need further development

• Can only pre-test at IMEC and a few academic sites

• High risk in developing new materials

• Extremely high mask cost for new product development and prototyping

Page 27: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

27

Stronger resist is required, but…

(Source: JSR Micro)

Page 28: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

28

2019/3/1 LETI Lithography Workshop 2019

10/7nm

TSMC SamsungIntel

Risk or Opportunity?

Page 29: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

• Niche applications for < 100nm Lithography

• Prototyping and low-volume special applications using existing 8” or 12” Si technology

• 5G mmWave, RFID on III-V wafers

• Photonics, flat optics, spectral filters

• Large size devices, ex: NIL mold

Demand for Maskless Lithography

Mapper Blanker chip

Single metalens focuses

all colors of the rainbow in

one point

Low volume for

each custom design!

Page 30: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

Unique ID for Chip Security

• Industrial infrastructure

• IoT gadgets

• Digital rights management

• Mobile storage

• Smart cards

• Automotive

• Aviation

• Medical

• Postal

• Retail

• Defense spare IC’s for

20+ year old equipment

• Luxury goods

• Bank bills, coins

Data security

Traceability

Anti-counterfeiting

Wafer IC design Unique block

Page 31: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

MEB300 University-Industry Alliance

Location: NTHU, Hsinchu

Leading-edge Suppliers and toolsSecurity IC for IoT,

Foundry service for

prototyping

Experts

Dr. Burn LinProf. PW Chiu

Jack Chen

Since Oct’17

by FLX1200

Member companies

including ICMs, III-V

foundry, Optronics…

Page 32: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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2019/3/1 LETI Lithography Workshop 2019

Summary

• Giving enough money and time, with all experts and efforts in this SPIE society, any lithography issues can be resolved!

• Impressive progress of EUV pellicle and NIL!

• EUV, mask-based lithography is a game for rich, big companies and only good for high volume products.

• Considering economy, if no absolutely advantage shown in time, then the existing technology with the least change will most likely do.

• To incubate the innovative niche applications, masklesslithography with resolution <50nm is crucial.

Page 33: The Challenges of Lithography€¦ · EUV Pellicle Life Time is concern! Jack Chen, EUVL Symposium 2015 EUV Pellicle: film produced without printing defects. -- M. Lercel, 2017 •

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Thank you for attention!