Technical Overview Accelerate time‑to‑market for LTE … · The PXT includes a suite of LTE RF measurements that may be used for characterization, calibration, and ... It provides

Agilent PXT E6621ALTETM Wireless Communications Test Set

Technical Overview

Accelerate time‑to‑market for LTE UE designs

The PXT instrument represents a significant breakthrough in LTE UE testing. It incorporates flexible base station/network emulation and RF parametric tests into one integrated unit and extends Agilent’s unmatched portfolio of LTE test solutions for development and verification.

The PXT includes a suite of LTE RF measurements that may be used for characterization, calibration, and verification purposes.

With realistic base station/network emulation, the PXT LTE test set offers a controlled environment which can be used to verify network attach, idle and connected mode operation and functional performance such as throughput. The PXT provides maxi‑mum flexibility to configure a range of connection and network parameters so enabling test, stress, and debug of the protocol and data handling capabilities of designs including DL 2x2 MIMO and handovers (future). Optional software applications are

available to enable more detailed protocol and application testing and analysis.

With this exciting product, Agilent helps get designs to market faster and more efficiently, and continues to provide comprehensive tools for all stages of the product lifecycle.

Agilent LTE Design and Test Portfolio – Greater insight. Greater confidence.

Figure 1. Agilent PXT E6621A LTE wireless communications test set

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Signaling Test Items

• Support for multiple 3GPP LTE dated specifications

• Settable frequency, power, modulation schemes, bandwidth, grant/allocation

• Attach, connection, reconfiguration, authentication, NAS and RRC security

• High data throughput using internal test mode or end to end IP data – Up to 102.05 Mbps, Cat 3 downlink

• Transmission Modes 1‑4, SISO, Tx diversity, open loop MIMO and closed loop MIMO operation

• UE reporting for ACK/NACK’s lost packets, CQI, PMI, RI, UCI

• LTE to LTE handovers (future)

• I‑RAT 2G/3G/cdma2000® handovers when connected to Agilent 8960 lab applications (future)

• LTE real‑time protocol logging and analysis

• Highly configurable detailed signaling control with LTE message editor application

Figure 2. N6050A LTE mobile test software L1/L2 status screen

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UE Receiver (DL) Test

• Measurements based on 3GPP 36.521 requirements

• Measurements in UE test mode, end to end data test or with UE set to receive only

• High data throughput using internal test mode or end to end IP data – Up to 102.05 Mbps, Cat 3 downlink


• Display of UE reports (CQI, PMI, RI, UCI and Power Headroom, Buffer Reporting)

• 2x2 Downlink MIMO channel with wide‑band and sub‑band CQI per code

• Built‑in traffic generation for UE downlink test

• ACK/NACK/Lost packet reports (per code with MIMO)

• DL Error Rate % (text and graphical)

• DL instantaneous throughput (text and graphical)

Figure 3. N6052A category 3 downlink MIMO throughput – 102.05 Mbps

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UE Transmitter (UL) Test

• Measurements based on 3GPP 36.521 requirements

• Measurements in test mode, end to end data test or with UE set to transmit only


• Channel Power, Power Spectrum, Power Vs Time, Flatness

• Occupied Bandwidth

• Spectrum Emission Mask

• Adjacent Channel Power

• Constellation, EVM

• Frquency and timing error

• Received I/Q data

• UL instantaneous throughput

Figure 4. N6051A constellation and EVM measurement

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LTE Message Editor

LTE message editor is a highly flexible tool for configurability of layer 3 mes‑sages (RRC and NAS). It provides detailed parameter control offering far more flexibility than a normal onebox tester.

• Create and modify scenario files for download into the PXT

• Complete control over all settings including system, network and base station information

• Send erroneous messages to test UE responses

• Easy to use, with intuitive tree menu structure for message management

• Share scenarios during collaborative test development and for faster troubleshooting

Figure 5. Absolute signaling flexibility with message editor

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LTE Protocol Logging and Analysis

LTE protocol logging and analysis are essential tools for debugging interoper‑ability issues inevitable with evolving radio technologies such as LTE. Even relatively simple tests such as UE attach can become frustrating without the tools to adequately debug and resolve issues.

• Real time logging and post capture analysis of all layers from L1 to NAS

• Message filtering – sort data by protocol layer

• View detailed decodes down to bit level

• Application programming interface (API, future)

Figure 6. Real time logging and post capture analysis of all layers from L1 to NAS

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Product Configuration

The flexible PXT instrument can be used in a variety of configurations.

• Optional PXT instrument hardware and firmware to configure the instrument for maximum flexibility or minimum cost

• Additional PC and applications to further extend flexibility, debug and analysis

• (future) Connections to Agilent 8960 with lab applications for 2G/3G/CDMA2000 I‑RAT handover testing

N6062A-1TPLTE message editor

N6061A-1TPLTE protocol logging and analysis

PC E6621A–OPCEngineering PC

N6052A 1FPLTE functional and application test

N6051A 1FPLTE RF Parametric test

N6050A 7FPN6050AS-1SY/1RYLTE FDD base station emulation

E6621A PXT503, 506, 2D2, BB1PXT Instrument

Figure 7. Maximum flexibility to satisfy all configuration needs

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Basic RF or signaling test The PXT can be used as a stand‑alone bench top instrument for essential LTE RF measurements based on 3GPP 36.521 while on a data connection. Hardware and instrument firmware options enable maximum configurability and flexibility while keeping cost to a minimum.

PXT Wireless Communications Test Set (E6621A)

UEUL

DL

Figure 8. LTE RF measurement configuration

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LTE protocol functional test The basic PXT instrument configuration can be used for protocol functional test, however maximum flexibility and coverage is significantly extended by the addition of several options.

• LTE message editor will provide maximum L3, RRC and NAS flexibility

• LTE protocol logging will add extensive debug and analysis for those difficult to diagnose issues

• (future) An Agilent 8960 running Lab Applications (LA’s) can be connected to provide 2G/3G/CDMA2000 cell capability enabling I‑RAT handover test.

Optional message editor software (N6062A) providing extensive signaling options and flexibility for download to PXT


UEUL

DL

PC E6621A–OPC

NASRRC IP

PDCPRLCMACPHY

NASRRC IP

PDCPRLCMACPHY

NASRRC

Optional protocol logging (N6061A) for complete protocol debug and analysis

Optional Agilent 8960 running lab applications for I‑RAT Handovers (future)

RF

Figure 9. LTE protocol functional test configuration

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End to end application test Data throughput in the real world can only be adequately replicated in the laboratory by utilizing real user data in realistic true‑life test scenarios. The PXT provides full data connection between UE and the PXT rear panel LAN connec‑tor, allowing the simple addition of user supplied external data servers for full end to end data test. With this configuration it is possible to stress the UE to its maximum testing throughput test processing power and exercising the LTE protocol stack completely from application layer to PHY.


UEUL

DL

PC E6621A–OPC

NASRRC IP

PDCPRLCMACPHY

NASRRC IP

PDCPRLCMACPHY

RF

NASRRC

Optional protocol logging (N6061A) for complete protocol debug and analysis

Application Server PC


IP network

IP

MAC (ethernet)

PHY

IP

MAC (ethernet)

PHY

Ethernet


Figure 10. LTE end to end application test using external servers

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PXT frequency rangeE6621A PXT Wireless communications test setE6621A‑503 Frequency Range from 500 MHz to 3.0 GHzE6621A‑506 Frequency Range from 500 MHz to 6.0 GHz

Other PXT optionsE6621A‑2D2 Downlink 2x2 MIMO (required)E6621A‑BB1 Enhanced baseband processing (Adds hardware

required for 2‑cell and higher UL data throughput)

PXT application optionsN6050A LTE mobile test softwareN6050A‑7FP LTE FDD base station emulation (required)N6051A‑1FP LTE RF parametric test with test mode signalingN6052A‑1FP LTE functional and application test

PC for N6061A and N6062AE6621A‑0PC Desktop PC, high performance

PC application optionsN6061A‑1TP LTE protocol logging and analysis N6062A‑1TP LTE message editor

Software and technical support contractThe N6050AS LTE mobile test software ‑ software and technical support contract (STSC) entitles the user to software updates and technical support for the E6621A PXT firmware N6050A, N6051A, N6052A LTE mobile test software, N6061A LTE protocol logging and analysis software and the N6062A LTE message editor software. N6050AS‑1SY LTE mobile test software – 1 year STSC (required).

Extend the term of the contract to:N6050AS‑2SY LTE mobile test software – 2 year STSC N6050AS‑3SY LTE mobile test software – 3 year STSC

Start‑up assistancePS‑S20‑01 1 day start‑up assistance

Repair optionsR‑51B‑001‑C 1 year Return‑to‑Agilent warranty (required option)R‑51B‑001‑3C 1 year Return‑to‑Agilent warranty extended to 3 yearsR‑51B‑001‑5C 1 year Return‑to‑Agilent warranty extended to 5 years

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E6621A Specifications

The PXT will meet its warranted performance after one hour within the stated environmental operating range plus one hour after turn on. Unless otherwise stated all specifications are valid over the operating temperature range. Supplemental characteristics are intended to provide additional information, useful in applying the instrument by giving typical (expect‑ed), but not warranted, performance parameters at room temperature (20 to 30 °C). These characteristics are shown in italics.

Signal analyzer specificationsFrequencyFrequency range 500 MHz to 3.0 GHz (E6621A‑503)

500 MHz to 6.0 GHz (E6621A‑506)Frequency setting resolution 1 Hz Frequency accuracy Same as frequency reference

AmplitudeMeasurement input level range –70 to +27 dBmLevel accuracy ±0.75 dB Level flatness ±1.4 dB (at +23 dBm over 20 MHz bandwidth)Spectral Purity < –70 dBc

PerformanceCarrier leakage accuracy ±0.8 dB at –40 dBmEVM accuracy 2.5% at –40 dBmOccupied bandwidth accuracy 1.4 MHz, 3 MHz: 30 kHz

5 MHz, 10 MHz: 100 kHz 15 MHz, 20 MHz: 300 kHz

ACP accuracy ±0.8 dBSEM accuracy ±1.5 dB

Signal generator specificationsFrequencyFrequency range 500 MHz to 3.0 GHz (E6621A‑503)

500 MHz to 6.0 GHz (E6621A‑506)Frequency resolution 1 Hz (0.5 –1.3 GHz)

2 Hz (1.3 – 3.3 GHz) 4 Hz (3.3 – 6.0 GHz)

Frequency accuracy Same as frequency reference

AmplitudeCW Level range –110 to –10 dBmLevel setting resolution 0.1 dBLevel accuracy ±0.75 dBLevel flatness ±0.75 dB (over 20 MHz bandwidth)

PerformanceEVM accuracy 0.7%ACP ≤ –50 dBc at adjacent channelHarmonics ≤ –25 dBc (1.3 GHz to 3.3 GHz)

≤ –20 dBc (3.3 GHz to 6.0 GHz) For level ≤ –0 dBm minus internal loss

Sub‑harmonics ≤ –30 dBc (3.3 GHz to 4.0 GHz) ≤ –25 dBc (4.0 GHz to 6.0 GHz)

Non‑harmonic spurious ≤ –70 dBc, offsets > 100 kHz (0.5 GHz to 3.3 GHz) ≤ –65 dBc, offsets > 100 kHz (3.3 GHz to 6.0 GHz)

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Publication title Pub numberMove Forward to What’s Possible in LTE Brochure 5989‑7817EN

Related Agilent Literature

Maximum data throughputData throughputUE test mode or end‑to‑end IP connection

102.05 Mbps (CAT3) DL;20 Mbps UL

General specificationsRF input/output impedance 50 Ω (nominal)RF input/output VSWR < 2.0:1Maximum safe input level +27 dBmInterfaces USB, LAN, GPIB (future), trigger in/out, IQ/IF

inputs/outputs, Reference input/outputRF reference input/output 10 MHzFrequency reference accuracy ± 1E-6Aging per year 5x10E-8 (–20 to 70 °C)Temperature stability 2x10E-8 CPower requirement 100 to 240 Vac, 50/60 HzSize (w x d x h) 444 mm x 600 mm x 222 mmWeight 27.6 kg maximum with all possible optionsOperating temperature 0 to 50 °CStorage temperature –20 to 70 °C

E6621A Specifications

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Product specifications and descriptions in this document subject to change without notice.

© Agilent Technologies, Inc. 2010Printed in USA, August 31, 20105990‑6434EN

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Technical Overview Accelerate time‑to‑market for LTE … · The PXT includes a suite of LTE RF measurements that may be used for characterization, calibration, and ... It provides