AUGUST 2006 | VOLUME 1 | NUMBER 3 54

TOOLS & TECHNIQUES UPDATE

Checking out a tipBudgetSensors® have introduced a new

calibration standard for determining

the condition of atomic force

microscope (AFM) tips. BS-Tipcheck is

an AFM sample comprising an

extremely wear-resistant coating

deposited on a Si chip. The granular,

sharply peaked topography of the thin

film is ideal for reverse imaging of the

tip of an AFM probe. In this way, the

BS-Tipcheck sample offers a fast

method to compare and categorize the

shape and sharpness of different AFM

probe tips. It can also be used with

commercial software for tip

characterization.

Contact: www.budgetsensors.com

Enhanced analysis suiteOxford Instruments has released the

latest version of its INCA microanalysis

suite, a platform for X-ray analysis in

scanning and transmission electron

microscopes. Issue 17 includes new

processes and enhancements that

improve and simplify the functionality

of the software. Quantmap allows the

quantitative mapping of samples from

data collected using Smartmap.

Spectrum Examiner is a tool designed

to ensure elements from minor phases

in a sample are identified in an intuitive

way. INCAFeature has been updated to

make sample areas easier to define and

edit. The spectrum reconstruction

overlay function can be used with

transmission electron microscopy for

elemental peak analysis.

Contact: www.oxford-instruments.com

Versatile calorimetersSENSYS is a family of differential

scanning calorimetry (DSC) instruments

for thermal analysis from SETARAM

Instrumentation. Samples can be

studied in an open, closed, or gas-tight

crucible; under vacuum, atmospheric, or

high-pressure conditions; and in

oxidizing, reducing, wet, or corrosive

gas flows. The sample is surrounded by

rings of thermocouples, so almost all

the heat emitted from or absorbed by

the sample is measured. The

instruments can be configured for

horizontal or vertical DSC, connected to

a symmetrical microbalance, or coupled

to an evolved gas analyzer such as a

mass spectrometer, gas chromatograph,

or surface area measurement device.

Contact: www.setaram.com

New molecular beam probeeliminates contaminationPurpose-designed for condensable molecular beam

monitoring, the XBS molecular beam epitaxy probe

from Hiden Analytical integrates a unique electron

bombardment ioniser with the Hiden 3F series

quadrupole system for simultaneous monitoring of

multiple beam sources at any predetermined position

within a wide 70° cone of acceptance. Species-specific

analogue signals are then used for beam intensity

output to the user’s source control modules.

The probe is totally enclosed in a stainless steel shroud

to inhibit probe contamination, with dual plane,

custom-configured beam defining aperture plates

dedicated to simultaneous monitoring of multiple

molecular beam sources with no direct contact with

internal probe surfaces.

With the stainless steel bellows-sealed linear motion

drive, the probe can be fine-adjusted for optimum

positional alignment and fully retracted to eliminate

substrate shadowing. All vacuum materials are fully

ultrahigh vacuum compatible and bakeable to 300°C,

with Cu surfaces specifically excluded from the

construction.

Contact: www.HidenAnalytical.com

Tabletop instrument movesbeyond optical microscopyThe TM-1000 Tabletop Microscope from Hitachi High-

Technologies bridges the gap between optical and

electron microscopy.

It offers ten times better magnification and resolution

than conventional optical microscopes, with a hundred

times improvement in depth of field. The TM-1000

detector also shows contrast arising from differences

in average atomic number, so different phases in

materials can be distinguished.

No preparation is required for hydrated, oily, or

nonconducting samples, and specimens up to 70 mm

in diameter and 20 mm thick can be analyzed.

The microscope has a magnification range of

20-10 000x and up to 40 000x using digital zoom

capabilities. The instrument comes with autofocus,

autobrightness, and autocontrast functions. The

TM-1000 is designed to be easy to use and has a built-

in measurement function that allows dimensional

information to be acquired quickly.

This performance makes it a real alternative to optical,

stereo, and confocal laser scanning microscopes for

applications in many sectors, from materials science to

the life and food sciences.

Contact: www.hitachi-hitec-uk.com

AFM for all Pacific Nanotechnology has introduced a new atomic

force microscopy (AFM) system with improved

hardware and software. The Nano-R2™ system

consists of the stage unit, controller, and a master

computer backed with dual monitors for observing

both the sample surface and probe.

There is a choice of probe. Users can select the

conventional light-lever AFM scanner or the crystal

force microscope scanner, which is more suited to

routine topography measurements.

Nano-R2 also comes with two image acquisition

software packages for novice and expert users, called

EZMode™ and X’Pert™ respectively. The ease of probe

placement and alignment together with sample

positioning make the microscope simple to use.

Contact: www.pacificnanotech.com

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