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Quantitative Phase Technology DigitalMicrograph Plug-in QP t Magnetic Field of (PrCaSr)Mn 3 O [2] Magnetization vector map Atomic Resolution Phase Image of Si 3 N 4 [4] Zero defocus Minimum amplitude QPt derives a phase image only from three ordinary bright-field images based on the Transport of Intensity Equation (TIE), and eliminates artifacts in a defocused image. QPt employs Quantitative Phase Imaging (QPI) technology based on Fast Fourier Transform (FFT) [1], and provides a solution to phase contrast electron microscopy. Key Features www.hremresearch.com / [email protected] / +81(493)35 3919 HREM Research Inc. (PrCaSr)Mn 3 O: courtesy Masaya Uchida. MINS, Tsukuba; Silicon Nitride: courtesy of Christian Kisielowski, NCEM, Berkeley. Credits: Reference: [1] D. Paganin and K.A. Nugent, Phys. Rev. Lett. 80 (1998) 2586-2589. [2] K. Ishizuka and B. Allman, Microscopy Today 13 (2005) 22-24. [3] X.Z. Yu, Y. Onose, N. Kanazawa, J H. Park, J. H. Han, Y. Matsui, N. Nagaosa and Y. Tokura, Nature 465 (2010) 901-904. [4] K. Ishizuka and B. Allman, J. of Electron Micros. 54 (2005) 191-197. Under-focus image Phase image 200 nm Skyrmion crystal structure in Fe 0.5 Co 0.5 Si [3] 2 nm QPt Basic Performs Image Alignment Derives a phase image at the middle plane (in-focus). QPt (in addition to Basic) Generates a magnetic/electric field (left and middle) Generates a knife edge (Schlieren) image QPt Pro (32bit only): Emulates Differential Interference Contrast, Zernike Phase Contrast, Hoffman Modulation Contrast and Dark-field images HREM module: Corrects spherical-aberration from atomic-resolution image (right)

t Quantitative Phase Technology QP - HREM Research · Quantitative Phase Technology! QP t ... (FFT) [1], and provides a solution to phase contrast electron microscopy. ! ... QPt5.ppt

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Quantitative Phase Technology!D

igit

alM

icro

grap

h P

lug-

in

QP t

Magnetic Field of (PrCaSr)Mn3O [2]!

Magnetization vector map!

Atomic Resolution Phase Image of Si3N4 [4]!

Zero defocus!

Minimum amplitude!

QPt derives a phase image only from three ordinary bright-field images based on the Transport of Intensity Equation (TIE), and eliminates artifacts in a defocused image. !QPt employs Quantitative Phase Imaging (QPI) technology based on Fast Fourier Transform (FFT) [1], and provides a solution to phase contrast electron microscopy. !

Key Features!

www.hremresearch.com / [email protected] / +81(493)35 3919! HREM Research Inc.

(PrCaSr)Mn3O: courtesy Masaya Uchida. MINS, Tsukuba;!Silicon Nitride: courtesy of Christian Kisielowski, NCEM, Berkeley.!

Credits:!

Reference:![1] D. Paganin and K.A. Nugent, Phys. Rev. Lett. 80 (1998) 2586-2589. [2] K. Ishizuka and B. Allman, Microscopy Today 13 (2005) 22-24. [3] X.Z. Yu, Y. Onose, N. Kanazawa, J H. Park, J. H. Han, Y. Matsui, N. Nagaosa and Y. Tokura, Nature 465 (2010) 901-904. [4] K. Ishizuka and B. Allman, J. of Electron Micros. 54 (2005) 191-197.!

Under-focus image!

Phase image!

200 nm

Skyrmion crystal structure in Fe0.5Co0.5Si [3]

2 nm

◆ QPt Basic !Performs Image Alignment!Derives a phase image at the middle plane (in-focus).!

◆ QPt (in addition to Basic)!Generates a magnetic/electric field (left and middle)!Generates a knife edge (Schlieren) image!

◆ QPt Pro (32bit only): Emulates Differential Interference Contrast, Zernike Phase Contrast, Hoffman Modulation Contrast and Dark-field images!◆ HREM module: Corrects spherical-aberration from atomic-resolution image (right)