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STUDY OF EUV SPECTRA FROM AL X- PINCH AND WIRE ARRAY IMPLOSIONS
PRODUCED ON THE 1 MA “ ZEBRA” AT UNR
P.G. Wilcox, A. S. Safronova, V. L. Kantsyrev, U. I.Safronova, K. Williamson
University of Nevada, Reno, NV USAK. Struve, B. Jones, C. Deeney*, P.D. LePell**
Sandia National Laboratories, Albuquerque, NM USA
HEDP Summer School 2007 , 29 July-4 Aug. , UCSD San Diego ,CA
ABSTRACT
It is well known that implosions of X-pinches and wire arrays produce powerful laboratory x-ray sources. X-ray spectroscopy is a very useful
tool for diagnostics of X- and Z-pinch plasmas at stagnation while EUV spectroscopy seems to be an appropriate tool of diagnosing the plasma before and after the stagnation. Though x-ray spectra that characterize the stagnating plasmas are intensively used for X- and Z-pinch plasma diagnostics the EUV spectra are not yet studied in detail.
In the present work a collection of EUV spectra from implosions of very different X- and Z-pinch loads on the 1MA Zebra generator at UNR is presented for the first time. Specifically, the loads were Al X - pinches, cylindrical wire arrays (with a small portion of NaF coating), and planar wire arrays ( see [1-2] for the details of the experiments).
Non-LTE kinetic model of Al that was recently used to model X-ray K-shell Al spectra from the planar wire arrays[3] was applied here to calibrate and identify the EUV spectra. Preliminary plasma parameters were computed. Similar and different features of the EUV spectra from the above-mentioned loads were identified and analyzed. Future work is discussed.
• The kinetics modeling of Al spectra depends on the plasma conditions (parameters Te , Ne).
• The atomic dataset was generated for the new Al model and used as an input to SCRAM ( non-LTE collisional –radiative kinetics code [4] )to model the Z-pinches spectra[3].
• It includes the ground states of all ions from neutral to bare nucleus.
• Energy level structures and complete radiative and collisional coupling data are calculated by the FAC atomic structure code [5].
• The levels are fully coupled by radiative decay and radiative recombination, collisional excitation and ionization, Auger decay and their reverse rates.
• All collisional rates are calculated by integrating collision cross sections over a Maxwellian electron distribution function.
Kinetics Modeling
Aluminum kinetics model
Collisional ionization, three-body recombination, & radiative recombination
Auger decay & dielectronic recombination
Radiative decay, collisional excitation & de-excitation
B-like
(15 lev.)
Be-like
(98 levels)
Li-like
(153levels)
He-like
(178 levels)
H-like
(36 levels)
Bare
Atomic data is generated using the FAC atomic structure package developed by M.F. Gu[5]
C-like
(41lev.)
N-like(70 lev.) O-like
(85 lev.)
Al -like
(4lev.)
Mg-like
(35lev.)
Na-like
(5 lev.)
F-like
(60lev.)Ne-like
(37lev.)
n = 2- 4n = 2- 3
n = 2- 6 n = 2- 7
n = 2- 3n = 2- 3
n = 2- 3n =2- 3
The X- and Z-pinch loads usedin experiments on 1 MA “Zebra”at UNR
• Al X-pinches with 2 and 4 wires from Al 5056 (95% Al and 5% Mg) and Al 1100 (99% Al) alloys
• Cylindrical wire arrays with NaF coating
• Planar wire arrays
X-Pinch and Planar Array
Shot # Load Material
432 X pinch,2w Al(1100)
468 X pinch,4w Al(5056)
785Cylindrical Array,8 w
Al(5056) + 5 %NaF
796Planar Array, 10w Al(5056)
787 Cyl.Arr.,8w Al(5056) + 5 %NaF
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty
Lambda
Al-IX , 200 ev , d20Al-VIAl-VIIAL-X
Modeling of EUV spectra from different Aluminum Ionization Stages
(Te = 200ev , Ne = 10²º cm-3)
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al-V,200ev,d20Al-VIAl-VIII
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,X,0-70A,200ev,20
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
Wavelength,A0
I,au
Al-XI ,200ev,0-70A,d20
0 10 20 30 40 50 60 70 80
0.0
0.2
0.4
0.6
0.8
1.0
I,a
u
Wavelength,A0
Al-IX,200ev,d20,0-70A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
Wavelength,A0
Al,VI,50ev,d20,0-100AAl,VII,50ev,d20,0-100AAl,VIII,50ev,d20,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
lenght,Ao
Al,IX,50ev,d20,0-100AAl,X, 50ev,d20,0-100AAl,XI,50ev,d20,0-100A
Modeling of EUV spectra from Aluminum VI-XI (Te = 50ev ,100ev ; Ne=10²º cm-3)
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
Wavelength,A0
Al,VI,100ev,d20 ,0-100AAl,VII,100ev,d20 ,0-100AAl,VIII,100ev,d20 ,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
Wavelength,A0
Al,IX,100ev,d20 ,0-100AAl,X,100ev,d20 ,0-100AAl,XI,100ev,d20 ,0-100A
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,VI,150ev,d20.0-300Al,VII,150ev,d20.0-300Al,VIII,150ev,d20.0-300
0 50 100 150 200 250 300
0.0
0.2
0.4
0.6
0.8
1.0
I
Wavelength,A0
Al,IX,150ev,d20.0-300Al,X,150ev,d20.0-300Al,XI,150ev,d20.0-300
Modeling of Ionization Stages in Aluminum (Te = 150ev ,200ev ; Ne = 10²º cm-3 )
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
Wavelength,A0
Al,VI,200ev,d20,0-100AAl,VII,200ev,d20,0-100AAl,VIII,200ev,d20,0-100A
0 20 40 60 80 100
0.0
0.2
0.4
0.6
0.8
1.0
Inte
nsi
ty,a
u
Wavelength,A0
Al,IX,200ev,d20,0-100AAl,X,200ev,d20,0-100AAl,XI,200ev,d20,0-100A
References for the Indentification
6. R. Kelly,Atomic and Ionic Spectrum Lines below 2000 Å ,Vol. 16 (1987)
7. NIST -- http://physics.nist.gov/asd3.
8. Non-LTE Al modeling
9. A.Shevelko,L.Shmaenok et al, Physica Scripta,vol. 57, pp 276 – 282 (1998).
10. S.Hoory,U.Feldman at al,Journal of the Optical Society of America, vol.60, #11 (1970)
11. R. Stuik , PhD Thesis , Tech. University, Eindhoven, The Netherlands
Al EUV spectrum from “Sparky” *
0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
In
te
nsity,a
u
Wavelength,A0
Sparky
39.6 AAl X
104 AAl VI
* For details about UNR table-top Z-pinch & laser plasma facility see [12]
0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
In
ten
sity,au
Wavelength,A0
Sparky
39.6 A
Al X
78 AAl VIII
107AAl VI
88 AAl VI 104 A
Al VI
126 A Al V
Al EUV (“ Sparky”) line identification
___________________________________________________________
Al IX, X I I I I
_____________________________________________________
Al VIII II I
______________________________________________________
Al V , VI I I I I I
0 50 100 150 200 250 300
0
20
40
60
80
100
120
140
160
180
200
In
ten
sity,au
Wavelength,A0
Sparky
Al EUV (“ Sparky”) line identification
List of the Identified Lines
AL X Ref. 2s2p – 2p4p 6,7,8,9,10
2s2p – 2s3d 6,7,8,9,10
AL IX
2s2p² - 2s2p3d 6,7,8,9
AL VI Ref.
2s²2p4 - 2s²2p³3d 6,7,8,9,11 2s²2p4 - 2s²2p³3s 6,7,8,9,11
Al V
2s²2p5 - 2s²2p4(¹D)3s 6,7,11
2s²2p5 - 2s²2p4(3P)3s 6,7,11 AL VIII
2s²2p² –2s² 2p3d 6,7,8,9 2s2p³ – 2s2p²3s 6,7,8,9
Comparison and
Identification
of the Al EUV “Zebra” Shots
Sparky
Zebra
796
_Wavelength, A_ 50 ________100_A_____150________200_________>
Al V,VI ,VIII I I I I II II
(Pl.Ar.,10w)
Zebra 787
Sparky
_Wavelength, A____50_________100_A__________150 ________________>
Al V,VI ,VIII I I I I II II
(Cyl.Arr.,8w)
Zebra
432
Zebra
796
_Wavelength, A___ __50_______100_A______150 ____________>
Al V,VI ,VIII I I I I I I II
(Pl.Ar.,10w)
(X,2w)
Zebra
796
Zebra
785
_Wavelength, A________50________100_A______150_______>
Al V,VI ,VIII I I I I II II
(Pl.Ar.,10w)
(Cyl.Arr.,8w)
Zebra
796
Zebra
787
Wavelength, A_50_______100_A______150____________>
Al V,VI ,VIII I I I I I I II
(Pl.Ar.,10w)
(Cyl.Arr.,8w)
Conclusions
Non - LTE kinetic model of Al is used to model EUV Al spectra.
Preliminary plasma parameters (Te =200ev, Ne=10²º cm-3) are computed.
The different spectral features of EUV spectra from the Aluminum loads in experiments on “Zebra” are identified and analyzed .
Predominantly low ionization stages that we found in “Zebra” shots indicate relatively lower Te than on “Sparky”.
Higher ionization stages lines are widely broadened due to the increased number of collisions in denser “Zebra” plasma ( in
comparison with “Sparky”).
Future Work
• 1.Modification of the model to include high Rydberg
states for Li~, B~, and C~ Aluminum.
• 2.Modeling of EUV spectra from “Zebra” and analysis of
plasma parameters with connection to the type of load.
• 3. Analysis of EUV spectra from wire Z- and X- pinch
loads.
References and Acknowledgments 1. V.L. Kantsyrev, A. S. Safronova et al, IEEE transactions on plasma science , vol. 34, No.2 (Apr. 2006). 2. B. Jones, C. Deeny, V.Kantsyrev et al, ICOPS 2006, CP808. 3. A.S.Safronova, V.L. Kantsyrev et al , HEDP 3(2007) pp.237-2415 4. S.B. Hansen. PhD Dissertation, University of Nevada,Reno (2003). 5. M.F. Gu. , AIP conference proceedings; 730: 127 (2004). 6. R. Kelly,Atomic and Ionic Spectrum Lines below 2000 Å ,Vol. 16 (1987) 7. NIST -- http://physics.nist.gov/asd3. 8. Non-LTE Al modeling 9. A.Shevelko,L.Shmaenok et al, Physica Scripta,vol. 57, pp 276 – 282 (1998). 10.S.Hoory,U.Feldman at al,Journal of the Optical Society of America, vol.60, #11 (1970) 11. R. Stuik , PhD Thesis , Tech. University, Eindhoven, The Netherlands 12. V.L. Kantsyrev, D. A. Fedin et al,Proc. of SPIE, vol. 59180W, pp. 1-7 ( 2005).
* This work was supported by NNSA under DOE Cooperative Agreements DE-FC52-06NA27588, DE-FC52- 06NA27586,and DE-FC52-06NA27616.Sandia is a multi-program laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy under Contract DE-AC04- 94AL85000 .