18
Smart & Quality Memory Module SQRAM Product Line Roadmap & Sales Kit Embedded Core Group H2, 2011

Smart & Quality Memory Module

  • Upload
    salma

  • View
    33

  • Download
    0

Embed Size (px)

DESCRIPTION

Smart & Quality Memory Module. SQRAM Product Line Roadmap & Sales Kit . Embedded Core Group H2, 2011. DRAM Market Status. Worldwide DRAM revenue in 2011 is forecast to decline to US$35.5 billion, down 11.8% from US$40.3 billion in 2010 Samsung shares over 40% DRAM market. - PowerPoint PPT Presentation

Citation preview

Page 1: Smart & Quality Memory Module

Smart & Quality Memory Module

SQRAM Product Line Roadmap & Sales Kit

Embedded Core GroupH2, 2011

Page 2: Smart & Quality Memory Module

DRAM Market Status Worldwide DRAM revenue in 2011 is forecast to

decline to US$35.5 billion, down 11.8% from US$40.3 billion in 2010

Samsung shares over 40% DRAM market

Page 3: Smart & Quality Memory Module

Wide Temperature Module Market

Brand Chip type Cost Availability Lead Time

SQRAM Samsung (sorting) Low Good 2 weeks

Swissbit Samsung (sorting) Median Good 8 weeks

Other TW venders

Promos Wide temperature chip Median Bad 2 weeks

Micron Wide temperature chip High Median 2 weeks

Page 4: Smart & Quality Memory Module

Samsung Memory Chip

Thermal Sensor

30u Golden Finger

10G Anti-Vibration

Page 5: Smart & Quality Memory Module

Developing PlanningAvailable

2011 2012

SO-D

IMM

Lo9n

g-DI

MM

-20 ~ 70°C -20 ~ 85°C -40 ~ 85°C

SQRAM Product Roadmap

SQR-SD3I• SO-DIMM DDR3 RAM

module• Samsung C Die• 1G / 2G / 4G 1333MHz• -40 ~ 85C temperature

SQR-LD3R• Long-DIMM DDR3 RAM

module• Samsung chip• Register support

Q4‘11

SQR-SD3T• SO-DIMM DDR3 RAM

module• Samsung C Die• 1G / 2G / 4G 1333MHz• -40 ~ 85C temperature• Thermal Sensor supportQ4‘11

SQR-SD2I• SO-DIMM DDR2 RAM

module• 128X8 Samsung F Die• 1G / 2G 667MHz• -40 ~ 85C temperature

SQR-LD3E• Long-DIMM DDR3 RAM

module• Samsung chip• ECC support

Q4‘11

SQR-SD2T• SO-DIMM DDR2 RAM

module• 128X8 Samsung F Die• 1G / 2G 667MHz• -40 ~ 85C temperature• Thermal Sensor supportQ4‘11

Page 6: Smart & Quality Memory Module

Moduleware: Thermal Monitor

Functionality: ECC, Register, Thermal Sensor

Chipset: Samsung (Sorting)

Supports Interface: SO-DIMM, LONG-DIMM

DRAM Standard: DDR2 667MHz, DDR3 1333MHz

Temperature: -40C ~ 85C

SQRAM Overview

Longevity: TBD

Module Supplier: Transcend

Regulation: CE, FCC

Page 7: Smart & Quality Memory Module

Industrial Grade Memory Module Testing Process

– Commercial grade tested good modules– Vibration– Sampling test under -40 (ambient) , sampling rate ~10% (MIL-STD-105E)℃– Testing program under +85 (ambient)℃– Chamber -40 ~ +85 (ambient)℃ ℃– Testing Program

Vibration Heater+85C

Chamber-40C

StaticChamber-40~85C

Testing Program

SamplingTesting

RoomTemp.

TestingProgram

Page 8: Smart & Quality Memory Module

Testing Process Description

The purpose of vibration is to reveal the non-robust module

PASS/Fail will be determined by the next 3 testing step (chamber -40 , heater 85 , room temp. test)℃ ℃

Vibration

Condition• 10~50 Hz• 2 mm amplitude• 10G• 2 min/cycle , total 5cycle

Page 9: Smart & Quality Memory Module

Testing Process Description

Sampling test– Sample rate: base on MIL-STD-105E, around 10% per 100 pc module– Criterion: all samples should pass the testing

Test program– test coverage: memtest and RST– 32 / 64 bit kernel

Test time: 15 minutes / 1GB module PASS Criterion: No error bit detected

VibrationChamber-40C

Page 10: Smart & Quality Memory Module

Test Program Function Stuck On test for detecting data bit which always fix high level Stuck Off Test for detecting data bit which always fix low level Random Address Test for random access test Random Data Test for random data write/read verification Address-Line Test for internal address decoder circuit test Walking Bit Test for data line leakage detection One and Zero Data Test for dram hard fail detect test Worse Data Background Test for dram process defect test write

various data ex, 0xaa / 0x55 / 0xcc / 0x33 / 0x99 / 0x66 … Un-cachable Memory Test – Disable the cache of CPU to avoid the

cache interference of memory test

Page 11: Smart & Quality Memory Module

PASS Criterion Display Error Chip / Error Counts / Error Address

and Error Bit

Page 12: Smart & Quality Memory Module

Testing Process Description

85℃ Test program

– test coverage: memtest and RST– 32 / 64 bit kernel

Test time: 15 minutes / 1GB module PASS Criterion: No error bit detected

VibrationChamber-40C

Heater+85C

Page 13: Smart & Quality Memory Module

Testing Process Description

Test time: 235 min / cycle Test cycle: 25 => -40 => 85 => 25℃ ℃ ℃ ℃ Refer to figure1 at page6 PASS/Fail will be determined by the next testing step

(room temp. test)

VibrationChamber-40C

Heater+85C

StaticChamber-40~85C

Page 14: Smart & Quality Memory Module

Static Chamber

Page 15: Smart & Quality Memory Module

Testing Process Description

Room temp. Test program (Transcend owned development) Test time : 6 minutes / 1GB module PASS Criterion: No error bit detected

VibrationChamber-40C

Heater+85C

StaticChamber-40~85C

RoomTemp.

Page 16: Smart & Quality Memory Module

SQRAM ModuleWare

Page 17: Smart & Quality Memory Module

Thermal Monitoring SUSI driver/API required Support by Monitoring utility & SUSIAccess Function

– Configuration: Set warning temperature threshold Set warning response (alarm, hibernate, shutdown)

– User Interface Monitor from system tray Event log

Page 18: Smart & Quality Memory Module

Thank You.