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Slicing the UniverseCCDs for MUSE
Roland Reissa, Sebastian Deiriesa, Jean Louis Lizona, Manfred Meyera, Javier Reyesa,
Roland Baconb, François Hénaultb, Magali Loupiasb
(a) European Southern Observatory (http://www.eso.org)Karl-Schwarzschild-Str. 2 D-85748 Garching by Munich, Germany
(b) CRAL - Observatoire de Lyon, 9 avenue Charles André, 69230 Saint-Genis-Laval, France
SDW 2005, Taormina Reiss et al., Slicing the Universe 2
Slicing the UniverseCCDs for MUSE
FO Tower IFUs Tower (X 3)
IFUs (X 2)
IFUs (X 2)
IFUs (X 2)
IFUs (X 2)
IFUs Tower baseplate
Nasmyth Platform basefloorNasmyth Platform basefloor
FO baseplate
MUSEAdaptiveOpticsSystem
Calibra-tionUnit
Calibra-tionUnit
Alignmenttools &
telescopesimulator
Nasmythflange
simulator(movable)
Nasmythflange plane
Field-Splitter
De-rotator
Re
lay
Op
tics
CalibrationPickups
1 & 2
Instrument baseframe
• MUSE (Multi Unit Spectral Explorer) is built by a consortium of European institutes(ESO, Göttingen, Leiden, Lyon, Toulouse, Zürich).
• 2nd generation instrument for the VLT.
• Integral field spectrometer for the Nasmyth focus.
• 24 Integral Field Units (IFU).
• 24 cryostats with one 4k x 4k CCD attached to IFUs.
SDW 2005, Taormina Reiss et al., Slicing the Universe 3
Compact CCD Head
• Low Frequency Pulse Tube Cooler.• Standard head for future ESO instruments.
SDW 2005, Taormina Reiss et al., Slicing the Universe 4
New General detector Controler (NGC)
R2 = R1R4
R3C1
R1
Q2
Q1
OUT-
OUT+from CCD Output
VDD
L1
Q3
Cascode CCD Buffer Stage• 2x gain of single buffer• Differential output
NGC configuration• One board per detector
SDW 2005, Taormina Reiss et al., Slicing the Universe 5
Detector Requirements
Item Value Remarks
Detector format 4096 x 4096or 2x 2048 x 4096
Pixel size 15 x 15 µm^2
QE 465 – 570 nm 85% min; 90% goal
QE 610 – 800 nm 85% min; 90% goal
QE 800 – 930 nm 60% min; 70% goal
Fringing < 10 % Peak-to-peak of avg. sensitivity
Fringe stability < 1% Within 24 hours
Flat field stability < 1% Per night
Charge diffusion < 0.1 pixel FWHM equivalent gaussion convolution
Surface flatness < 20 µm pp