1/98

SIM Regional Comparison of AC-DC VOLTAGE TRANSFER DIFFERENCE

SIM.EM-K6a, SIM.EM-K9, SIM.EM-K11 and

SIM.EM-Supplementary 120 V / 53 Hz

FINAL REPORT

January 2004 – December 2004

Final Repor

1. Int

2. De

3. Tr

4. Pa

5. Ci

6. M

7. En

8. M

9. Re

10. De

11. Lin

12. C

13. A

14. R Append

rt

troduction

efinition of the

ravelling stand

articipants

irculation of th

easurement m

nvironmental

easurement r8.1 SIM. EM8.2 SIM. EM8.3 SIM. EM8.4 120 V / 5

eference valu

egree of equiv10.1 Degree10.2 Degree10.3 Degree10.4 Degree

nk with the CC11.1 Link SIM11.2 Link SIM11.3 Link SIM

Corrective acti

Acknowledgem

References

dix A. Reports

e measurand

dard descripti

he travelling s

methods

conditions du

results -K6a results -K9 results -K11 results

53 Hz supplem

e

valence of equivalenc of equivalenc of equivalenc of equivalenc

CEM key comM.EM-K6a - CM.EM-K9 - CCM.EM-K11- Cons

ments

s of the partici

CO

on

standard

ring transport

mentary point

ce SIM. EM-Kce SIM. EM-Kce SIM. EM- Kce 120 V / 53

mparison CCEM-K6a CEM-K9 CEM-K11

pants

ONTENTS

tation

results

K6a K9 K11 Hz suppleme

SIM. AC-DC

entary point

C Voltage Tra

Pa 3 3 4 7 8 9 10 1011111212 13 1415161820 2022242628

28 29 30

nsfer Differen

2/

age

0

0 1 1 2 2

3

4 5 6 8 0

0 2 4 6 8

8

9

0

nce

/98

Final Repor

1. Introdu In the Sistehaving calibNMIs haveCCEM-K9 a Three compcapabilities test points Comparison Additionallypower/energ CENAM volwas agreedlaboratories The comparDraft A wasadded and t 2. Definiti The measur

δ = (Vwhere:

δ isVac Vdc

The measur

rt

uction

ma Interamerbration and me participatedand CCEM-K1

parisons, SIM of the remain

were selectns, through th

, a fourth cogy meter calib

lunteered to pd that the cos with participa

risons starteds issued by ththe final resul

ion of the m

red quantity is

Vac - Vdc) / Vd

s the ac-dc vois the rms vis the dc inptransfer stan

rement points

SIM.EM-K

3 V / 1 kHz3 V / 20 kH3 V / 100 k3 V / 1 MH

ricano de Metmeasurement d in the CCE11.

M.EM-K6a, SIMning NMIs in ed to link the three NMIs

mparison, SIbration capab

provide the tramparison refation in the ke

d in January 2he pilot laborats are reporte

measurand

s the ac-dc vo

dc

oltage transferalue of the ac

put voltage whndard as Vac

s for the differe

6a SIM.EM

z Hz kHz z

1 kV / 1 1 kV / 101 kV / 201 kV / 501 kV / 10

trología (SIM) capabilities iEM Key Com

M.EM-K9, SIM the SIM regihe results of participating

M.EM-Suppleilities.

avelling standferences valuey comparison

004 and the matory and wased in this docu

oltage transfer

r difference ofc input voltagehich when rev.

ent compariso

Table I.-K9 SIM. kHz 0 kHz 0 kHz 0 kHz 00 kHz

100 100 100 100

) there are sen the ac-dc vmparisons of

M.EM-K11, weon, in ac-dc f such compin both.

ementary, wa

dard (TS) andes were to bns.

measurements reviewed byument.

r difference of

f the travellinge versed produc

ons are show

. Test points

.EM-K11

mV / 1 kHz mV / 20 kHz mV / 100 kHz mV / 1 MHz

SIM. AC-DC

everal Nationavoltage transff ac-dc trans

ere proposedvoltage transarisons with

as proposed,

to pilot and cbe based on

ts were concluy the participa

f the travelling

g standard

ces the same

n in Table I.

SIM.EM-Su

120 V / 53

C Voltage Tra

al Metrology Ifer differencesfer differenc

to assess thfer difference the equivale

in support of

coordinate the the results p

uded in Deceants in 2006, c

g standard:

mean output

upplementary

Hz

nsfer Differen

3/

nstitutes (NM, but only thr

ce, CCEM-K6

e measuremee. The proposent CCEM K

f the SIM NM

e comparisonprovided by t

mber 2004. Tcomments we

voltage of the

nce

/98

MIs) ree 6a,

ent sed Key

MIs

n. It the

The ere

e

Final Repor

3. Travell The travellinfor voltage m Description:Model: Serial Numb Accessories

DescModSeria DescModSeria

DescModSeria

DescModSeria

The travellindevice sincuncertainty The followintravelling stevaluated [2

rt

ing standa

ng standard wmeasurement

: AC792

ber: 568

s: cription:

del: al Number:

cription: del: al Number:

cription: del: al Number:

cription: del: al Number:

ng standard ce 1995. Theobtained by t

ng graphs shotandard in 202], shown in d

rd descript

was an ac-dc ts.

-DC Transfer2A 85005

belongs to the stability obhe pilot labora

ow the measu003 and duridashed lines,

tion

thermal trans

r Standard F

1000 V 792 A-75685005 Power P792 A-75370005 Power P792 A N/A HandboN/A N/A

he pilot laborabserved is wiatory.

urements thang the compis good enoug

sfer standard,

luke (with a ty

Range Resis002 5

Pack, Fluke 001 5

Pack Cable, F

ook Fluke 792

atory, CENAMithin the man

at the pilot labparison in 20gh to serve as

SIM. AC-DC

model Fluke

ype-Nm/type-

stor, Fluke

Fluke

2A

M, who has mnufacturer´s

boratory made04. The graps a travelling s

C Voltage Tra

792A, fitted w

-Nf adapter at

maintained caspecification

e before the dphics show tstandard.

nsfer Differen

4/

with accessor

ttached)

alibration of tand within t

departure of that the stabi

nce

/98

ies

his the

the lity

Final Repor

-10-8-6-4-202468

1018

/02/

03

δ[µ

V/V]

0

5

10

15

20

25

30

18/0

2/03

δ[µ

V/V]

-15-10

-505

10152025

18/0

7/03

δ[µ

V/V]

rt

09/0

5/03

28/0

7/03

16/1

0/03

3 V /

09/0

5/03

28/0

7/03

16/1

0/03

3 V / 1

06/1

0/03

25/1

2/03

1 k

04/0

1/04

24/0

3/04

12/0

6/04

/ 1 kHz

04/0

1/04

24/0

3/04

12/0

6/04

100 kHz

14/0

3/04

02/0

6/04

kV / 1 kHz

12/0

6/04

31/0

8/04

19/1

1/04

12/0

6/04

31/0

8/04

19/1

1/04

21/0

8/04

09/1

1/04

-6-4-202468

1012

δ[µ

V/V]

-60

-40

-20

0

20

40

60δ

[µV/

V]

-20-15-10

-505

10152025

δ[µV

/V]

SIM. AC-DC

18/0

2/03

09/0

5/03

28/0

7/03

28/0

6/03

17/0

8/03

06/1

0/03

25/1

1/03

3

18/0

7/03

06/1

0/03

C Voltage Tra

16/1

0/03

04/0

1/04

24/0

3/04

3 V / 20 kHz

25/1

1/03

14/0

1/04

04/0

3/04

23/0

4/04

3 V / 1 MHz

25/1

2/03

14/0

3/04

1 kV / 10 k

nsfer Differen

5/

12/0

6/04

31/0

8/04

19/1

1/04

z

12/0

6/04

01/0

8/04

20/0

9/04

02/0

6/04

21/0

8/04

09/1

1/04

kHz

nce

/98

19/1

1/04

09/1

1/04

09/1

1/04

Final Repor

-30

-20

-10

0

10

20

3018

/07/

03

δ[µ

V/V]

-35

-25

-15

-5

5

15

25

35

18/0

7/03

δ[µ

V/V]

-35-25-15-55

152535

25/1

1/03

δ[µ

V/V]

rt

06/1

0/03

25/1

2/03

1 k

06/1

0/03

25/1

2/03

1 kV

14/0

1/04

04/0

3/04

23/0

4/04

100 mV

14/0

3/04

02/0

6/04

kV /20 kHz

14/0

3/04

02/0

6/04

/ 100 kHz

12/0

6/04

01/0

8/04

20/0

9/04

V / 1 kHz

21/0

8/04

09/1

1/04

21/0

8/04

09/1

1/04

20/0

9/04

09/1

1/04

29/1

2/04

-30

-20

-10

0

10

20

30

δ[µ

V/V]

-10

-5

0

5

10

15

20δ[

µV/V

]

-35

-25

-15

-5

5

15

25

δ[µ

V/V]

SIM. AC-DC

18/0

7/03

06/1

0/03

19/0

4/01

28/0

7/01

05/1

1/01

13/0

2/02

5

5

5

5

5

5

5

25/1

1/03

14/0

1/04

04/0

3/04

10

C Voltage Tra

25/1

2/03

14/0

3/04

02/0

6/04

1 kV / 50 kH

24/0

5/02

01/0

9/02

10/1

2/02

20/0

3/03

120 V / 53 H

04/0

3/04

23/0

4/04

12/0

6/04

00 mV / 20 kH

nsfer Differen

6/

02/0

6/04

21/0

8/04

09/1

1/04

Hz

28/0

6/03

06/1

0/03

14/0

1/04

23/0

4/04

Hz

01/0

8/04

20/0

9/04

09/1

1/04

Hz

nce

/98

09/1

1/04

01/0

8/04

09/1

1/04

09/1

1/04

29/1

2/04

Final Repor

4. Particip

NRC

NIST

INME

INTI

UTE

CENA

-20

-10

0

10

20

30

40

50

25/1

1/03

δ[µV

/V]

rt

pants

NatioCont

NatioCont

ETRO InstitCont

InstitCont

AdmCont

AM CentCont

14/0

1/04

04/0

3/04

23/0

4/04

100 m

onal Researctact: Peter Filonal Institute tact: Thomas

Joseph tuto Nacionaltact: Giovann

Edson Atuto Nacionaltact: Lucas D

Héctor Lministración Na

tact: Alfredo SDaniel S

tro Nacional dtact: Sara Ca

12/0

6/04

01/0

8/04

20/0

9/04

m V / 100 kH

h Council, Caipski, Peter.Fof Standard a Lipe, ThomasKinard, Josep de Metrologiaa Borghi, gba

Afonso, eafon de Tecnologi Lillo, ldili@iLaiz , laiz@intacional de UsSpaggiari, asSlomovitz, d.sde Metrologíampos, scamp

20/0

9/04

09/1

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Hz

anada Filipski@nrc-cand Technologs.lipe@nist.goph.Kinard@nia, Normalizaςalmeida@inmnso@inmetro.ía Industrial, Anti.gov.ar ti.gov.ar

sinas y Transmspaggiari@uteslomovitz@ie

a, México (Pilopos@cenam.

0

20

40

60

80

100

120

δ[µ

V/V]

SIM. AC-DC

cnrc.gc.ca

gy, USA ov st.gov

ςao e Qualidametro.gov.br .gov.br Argentina

misiones Eléce.com.uy ee.org ot Laboratory)mx

25/1

1/03

14/0

1/04

04/0

3/04

1

C Voltage Tra

ade Industrial,

ctricas, Urugu

)

23/0

4/04

12/0

6/04

00 mV / 1 MH

nsfer Differen

7/

Brazil.

ay

01/0

8/04

20/0

9/04

09/1

1/04

Hz

nce

/98

09/1

1/04

Final Repor

5. Circula A measuremclearing the Each laborato CENAM carry the trduring the Brazil-Mexic The pilot lawhole compfive laboratlaboratory pstandard is

In order to cthe customstravelling sta During the laboratory, dates of the

rt

ation of the

ment period oe customs, rec

atory, except after measureravelling stan

customs cleco-Argentina w

boratory sentparison was ctories, the traperformed theshown on Ta

Participant

CENAM (NIST (Unite

CENAM (INTI (ArgUTE (Ur

INMETROCENAM (NRC (C

CENAM (

conduct the cs proceduresandard, as ea

circulation othe receiving

e travelling sta

travelling

of six weeks fceiving, prepa

CENAM, meaement at NISTdard when s

earance. Fligwere financed

t the travellingarried out wit

avelling stande last measurble II.

Table II. Sc

Laboratory

(Mexico) ed States) (Mexico) gentina) ruguay) O (Brazil) (Mexico) anada) (México)

omparison in for their portach country ha

of the travellig laboratory aandard.

standard

for each partiaration, makin

asured the traT, NRC and t

sent to Southht tickets Md by the grant

g standard tohout an undu

dard returnedrements in De

chedule follow

Date of

DecJanuary a

Febru4th March18th May

JunAu

SeptembeNov

a timely fasht of entry to gad different pr

ng standard and the pilot

icipant was ag measureme

avelling standathe South Am America, toexico-Argentit from the Org

o the first parte delay during to the pilot

ecember 2004

wed by the trav

f measuremen

cember 2003 and Februaryuary 27th 2004h To 16th Apri to 22nd June

ne 25th 2004 ugust 2004 er to Octobervember 2004

ion, it was heget the importrocedures and

there was alaboratory, to

SIM. AC-DC

greed upon. ents and shipp

ard once. Themerican NMIs.

avoid any pina-Mexico, Uganization of t

ticipating labog the 2004. Alaboratory in

4. The sched

velling standa

nts T tra

2004 C4 Cl 2004 2004

2004 CC

elpful that the ation permissd different pe

a constant coo communica

C Voltage Tra

This period inping to the ne

e travelling sta It was agreed

possible damaUruguay-Brazthe American

oratory in JanAfter the measn November ule followed b

ard.

Transport of thavelling stand

Courier ServicCourier ServicHand CarriedHand CarriedHand CarriedHand Carried

Courier ServicCourier Servic

participant lasion prior to triods of answ

ontact betweeate the depar

nsfer Differen

8/

ncluded time ext laboratory.

andard returnd upon to hanage and delazil-Uruguay a States.

nuary 2004. Tsurements in t2004. The pby the travelli

he dard

ce ce d d d d ce ce

boratories knhe arrival of t

wer.

en the sendirture and arriv

nce

/98

for .

ned nd-ays and

The the ilot ing

ew the

ing val

Final Repor

6. Measur The participan Appendix All participavoltage of standard. Twthe travellinDC voltage the thermalpoints, in wAC,DC+,AC For frequenconnector, tNIST used CENAM usespecial asyconnector. To calibratetheir source Only four laINTI decideerror. See s

Laboratory

NIST

INTI

UTE INMETRO

CENAM

NRC SJTC: SingPMJTC: PlaTTS: ThermRVD: ResisRR: Range

rt

rement met

pants were reqx A of this doc

ants used a twtheir standarwo participang standard. F to the instrum drift; NRC rewhich case N

C,DC-,AC exclu

ncies below the travelling as a plane ed as plane ommetrical tee

e the travellinges of traceabil

aboratories paed to withdrawsection 12 for

T

y SIM.EM-

SJTC

1 V SJTC TTS Fluke

1 V PMJT 400 Ω

MJTC + 400

le Junction Thanar Multijuncmal Transfer Sstive Voltage D Resistor

thods

quested to sucument. The f

wo channel mrds and an 8ts used nanov

Five participanment under teseported using NRC appliedusively.

1 MHz, NIS standard beiof reference of reference te, having as

g standard thity are shown

articipated in aw their results corrective act

Table III.a StanSta

-K6a C

+ RR 792A TC + RR

0 Ω RR 1 V

hermal Convection Thermal Standard Divider

ubmit a detailefollowing infor

method. Three8 ½ digits mvoltmeters to nts used two st. Two partic the sequence the sequen

T used as png connectedthe center ohe center of aone arm a ty

e participating in Table III b

all comparisos from the cotions.

ndards used forandard used for

SIM.EM-K9SJTC + RR

PMJTC + 100 kΩPMJTC + 200 kΩ

1 V SJTC + RTTS Fluke 791,5 V PMJTC

124 kΩ RR

V PMJTC +200

erter Converter

ed report of thrmation was e

e participantsultimeter to r read both thesources with

cipants indicate AC, DC+, Dce AC,DC+,A

plane of refed to it by a typof a type-N tea type-N Teeype-GR874 c

g laboratories.

ons. NIST paromparison SIM

r measuring ther measuring the9 R

Ω RR Ω RR

PMM

RR 1 V92A TC + R

Tm

kΩ RR

SIM. AC-DC

heir measuremextracted from

used a nanoread the outpe output of the an external rted the AC-DC

DC-, AC, exceAC,DC-,AC. C

erence the cepe-GR874 –toee connector connector an

connector and

s used the sta

rticipated in SM.EM-K6a, af

e travelling stae travelling stan

SIM.EM-K11

MJTC - 10:1 RVicropotentiomete

Ballantine V SJTC - 10:1 RVTTS Fluke 792A

TTS Fluke 792A –icropotentiomete

H12 205 Ω SJTC

C Voltage Tra

ments, which m the reports.

ovoltmeter to put voltage oeir standard arelay to applyC sequence upt for the 1 kV

CENAM used

enter of a tyo –type-N ada. INTI, UTE, nd NRC usedd as the othe

andards show

SIM.EM-K6a after discoverin

ndard ndard

SIM.EM-S

VD er PMJ

VD 1 V SA TTS F– er 1 V PMJT

MJTC

nsfer Differen

9/

are attached

read the outpof the travelliand the output the AC and t

used to minimV measureme

d the sequen

ype-GR874 Tapter. At 1 M INMETRO ad the center oer arm a type

wn in Table III

and SIM.EM-Kng a systema

Supplementary

JTC + RR

SJTC + RR Fluke 792A

TC + 30 kΩ RR

C+ 6 kΩ RR

nce

/98

as

put ing t of the ize ent nce

Tee Hz

and of a e-N

I a,

K9. atic

LN

I

U

I

C

N

Final Repor

Laboratory NIST

INTI

UTE

INMETRO

CENAM

NRC NRC and Nduring the cthe Physikcalibrated band step do The reportstravelling sta 7. Environ A temperatambient conhad an effec 8. Measur This sectionwith a covesections 9 reported by

rt

SIM.EM-K6a

PTB at 3 V

PTB at 3 V PTB at 1 V

Step up in voltaprocedure

NIST have thecomparison. INkalisch Technby the PTB atown procedure

s show that andard were

nmental co

ure, humiditynditions duringct on the stab

rement res

n summarizesrage factor ofand 10 the e the participan

Ta

Own realization

Ste

PSte

age Ste

eir own calculaNTI, UTE, INMnische Bundt the comparies to derive th

in all laboraat (23 ± 1) °C

onditions d

y and pressurg the transpo

bility of the TS

ults

s the results ref k =2, exceptexpanded uncnts, at a confi

Table III. b SouSIM.EM-K9

n PTB at 3 V

ep up in voltage procedure

PTB at 100 V ep up in voltage

procedure PTB at 1 kV PTB at 1 V

ep up in voltage procedure

able standardMETRO and esanstalt (PTison test poinhe values of th

atories the enC and (45 ± 1

uring trans

re data loggert. There was

S and thus influ

eported by tht for UTE whocertainty is edence level o

urces of tracea

Ste

Ste

P

Ste

Own realizatio

ds to provide CENAM usedTB) standard

nts. INTI, UTEheir working s

nvironmental 5) % of R.H.

sportation

er traveled ws no evidenceuenced the fin

e participantso reported thevaluated, tak

of 95,45 %.

SIM. AC-DC

ability SIM.EM-K11

PTB at 1 V p down in voltag

procedure PTB at 3 V

p down in voltagprocedure

PTB at 100 mV PTB at 1 V

p down in voltag procedure

on

traceability tod standards wds. INMETRE and CENAMstandards at 3

conditions d

ith the travele that the envinal measurem

s. They reporteir results withking into acco

C Voltage Tra

SIM.

ge S

ge S

ge S

o the working whose values RO standardsM performed 3 V, 1 kV and

during the ca

ling standardironmental co

ments.

ted the expanh a coverage ount the degr

nsfer Differen

10/

EM-Supplemen

PTB at 3 V Step up in voltag

procedure PTB at 100 V

Step up in voltagprocedure

PTB at 120 V PTB at 1 V

Step up in voltagprocedure

standards usare traceable

s were direcvoltage step 100 mV.

alibration of t

d to monitor tondition chang

nded uncertainfactor of k=1.

rees of freedo

nce

/98

ntary

e

e

e

sed e to ctly up

the

the ges

nty . In om

Final Repor

8.1 SIM

8.2 SIM

Labo

N

INM

CE

N

rt

M.EM-K6a. res

Table IV. R

Laboratory i

NIST

UTE

INMETRO

CENAM

NRC

M.EM-K9 resu

Table V. R

oratory i

NIST

INTI 4th

UTE 18t

METRO 28

ENAM 7

NRC

sults

Results at 3 V,

Calibrdat

Jan to Fe

18th May to200

28th June to200

3rd to 20th Au

Sept to O

ults

Results at 1 kV,

Calibrationdate

Jan to Feb 20

March to 16th A

th May to 22nd Ju

8th June to 28th J

7th to 24th Augus

Sept to Oct 2

ac-dc voltage

ration te

eb, 2004

22nd June, 04 o 28th July, 04

ugust, 2004

Oct, 2004

ac-dc voltage

n

004 δi Uδ

April 2004 δi Uδ

une 2004 δi uδ

uly 2004 δi Uδ

st 2004 δi Uδ

2004 δi Uδ

transfer differe

δ 1 kHz

δi 0.0Uδi 3.2δi 3.0uδi 5.5δi 1.0Uδi 4δi 0.9Uδi 6δi 0.3Uδi 1.2

transfer differe

δ

1 kHz 10 10

δi 11.6 5.2

δi 16 4

δi 11 5

δi 18

5.7 δi 15 6.7

δi 10

SIM. AC-DC

ence δi and its

SIM.EM-K6a δi and Uδi (k=2,0)

20 kHz 0 2.0 2 3.2 0 6.0 5 5.4 0 4.0 4 4 9 2.5 6 6 3 2.5 2 2.8

ence δI and its

SIM.EM-K9 δi and Uδi (k=2,00 kHz 20 kH

4 11.7 143.2 620 310 112 1

0 -18 1

4.2 315 12.9 -210 1

C Voltage Tra

uncertainty Uδ

3 V ) µV/V 100 kHz 1

16.0 8.5

18.0 9.5

13.0 5

16.3 8

16.5 7.2

s uncertainty Uδ

1 kV 0) µV/ V z 50 kHz 1 -18 .1 15.4 .1 -1.7 33 37 11 11 -2 -9 18 18

.9 3.3 17 27 .2 -10.6 10 13

nsfer Differen

11/

δi.

MHz 1.0

17.2 3.0 30

-22.0 32 4.4 38 10 17

δi.

100 kHz -35

23.4 10.5

74

-25 42

3.9 27

-18 25

nce

/98

Final Repor

8.3 SIM

8.4 SIM

rt

M.EM-K11 res

Table VI. Re

Laboratory

INTI

UTE

INMETRO

CENAM

NRC

M.EM-Supplem

Table VII. Re

La

IN

sults

esults at 100 m

i Calibrdat

4th March to200

18th May to200

28th June to200

26th to 30200

Sept to200

mentary poin

esults at 120 V

aboratory i

INTI 4

UTE

NMETRO 2

CENAM 7

NRC

V, ac-dc voltag

ration te

o 16th April 04 U 22nd June 04 o 28th July 04 U

0th August 04 Uo Oct 04 U

nt at 120 V / 5

V, ac-dc voltage

Calibration date

4th March to 16t

April 2004

18th May to 22nd

June 2004

28th June to 28tJuly 2004

7th to 24th Augus2004

Sept to Oct 2004

ge transfer diffe

SIMδi an

1 kHz δi 8.7 Uδi 12.6 δi 14.0 uδi 7.5 δi 8.0 Uδi 8.0

δi 7.5 Uδi 23 δi 9.5 Uδi 9.5

53 Hz

e transfer differ

e SIM.EM-S

δ and

th δi Uδi

d δi uδi

h δi Uδi

st δi Uδi δi

Uδi

SIM. AC-DC

erence δI and i

M.EM-K11 100 mnd Uδi (k=2,0) µV

20 kHz 1003.0 13

-2.0 7.7

-2.0 8.0

-6.0 23

-1.8 8.5

rence δI and its

Supplementary Uδ (k=2,0) µV

53 Hz 2.2 12 2.0 7.0 3.0 14 2.3 11 4.3 2.7

C Voltage Tra

ts uncertainty U

mV V/ V 0 kHz 1 MHz

19.0 14.025 75

18.0 2618 52

18.0 79.013.0 98.0

21.6 59.923 42

24.1 75.010.3 23.0

s uncertainty U

y 120 V V/ V

nsfer Differen

12/

UδI.

z 0 5 6 2 0 0

9 2 0 0

Uδi ,

nce

/98

Final Repor

9. Referen The referenlaboratories

where: iuδ

The standar

The measuhave their standards. The expand

where k waof freedom a

where νeff a

associated w

rt

nce value

nce value, δSs that took par

δSIM

is the standa

rd uncertainty

rement resultown calculab

ded uncertaint

s estimated aas:

υ

are the effecti

with the δi.

SIM, was calcurt in the corres

n

1i=i

n

1i=ii

w

w=

δ

∑

∑M

rd uncertainty

y of the refere

=uSIMδ

ts of NRC, Nble standards

ty of the refere

SIMUδ =

at a confidenc

∑ ∑=

⎜⎜

⎝

⎛=

n

1i

effυ

ve degrees o

ulated as thesponding CCE

iwwith =

y associated w

nce values, u

∑n

1=iiw

1

NIST and INTs and INTI ha

ence value w

SIMkuδ=

ce level of 95,4

∑=⎟⎟

⎠

⎞4

n1i i

i

4

i

i

SIM

υ

uw

w

u

δ

δ

δ

of freedom of

e weighted mEM key comp

2

iu1

δ=

with the repor

SIMuδ

, was ev

I were considas traceability

as evaluated

45 % taking in

4

the δ SIM and

SIM. AC-DC

mean [3] of thparison; these

rted δi values.

valuated as [3

dered indepey to the valu

as:

nto account th

iδυ are the

C Voltage Tra

he reported v are NIST, NR

(1)

3][4] :

(2)

ndent; since ues of the un

(3)

he reported e

(4)

effective deg

nsfer Differen

13/

values from tRC and INTI.

NRC and NIncorrelated P

ffective degre

rees of freedo

nce

/98

the

ST TB

ees

om

Final Repor

10. Degre The degree ( δ SIM) wa

For the laboestimated a

For the laboestimated a

where kDi, foof 95,45 %,

For laboratoas:

υ

rt

ee of equiva

of equivalencas evaluated a

oratories withoas[4]:

oratories withas[4]:

or laboratorie taking into ac

ories that con

⎢⎢

⎣

⎡=eff

i*uδ

υ

alence

ce (Di) betweeas follows:

Di = δ

out contributio

ik=U DiD

h contribution

ik=U DiD

s without conccount the eff

4eff uδυ

υ =

ntributed to the

∑=

− n1i i

i

i

ww(1

δυ

en the i-th par

δi -δ SIM

on to the refe

2SIM

2i

u+u δδ

to the refere

22SIMi

u-u δδ

ntribution to thfective degree

SIM

SIM

i

i

i

eff

4D

4

uu

δ

δ

δ

δ

υ+

e reference v

∑+=

⎢⎢

⎣

⎡

+⎥⎥

⎦

⎤

n

1ii

D4

i

u)

u4

rticipant with r

rence value,

ence value, th

he reference ves calculated a

value, the effe

∑=

n1i i

i

i

i wwu

δ

δ *

υ

SIM. AC-DC

respect to the

the expanded

he expanded

value, was esas,

ective degrees

⎥⎥

⎦

⎤4

C Voltage Tra

e reference va

(5)

d uncertainty

(6)

uncertainty o

(7)

stimated at a c

(8)

s of freedom

(9)

nsfer Differen

14/

alue

of Di ( iDU ) w

of Di ( iDU ) w

confidence lev

were calculat

nce

/98

was

was

vel

ted

Final Repor

10.1 Degre At 3 V, theCorrelationsthe referenc Degree of equ

δ SIM.EM-K6a

LaboratoryNIST

UTE INMETROCENAM NRC

Degree of eq

δ SIM.EM-K6a =

LaboratoryNIST UTE INMETRO CENAM NRC

Degree of equ

δ SIM.EM-K6a = 1

Laboratory i NIST UTE INMETRO CENAM NRC

rt

ee of equival

reference vas between thece value, had

uivalence Di and

3 V / 1 k= 0.3 µV/V ;

SUδ

y i δi Uδi 0.0 3.23.0 5.5

O 1.0 4.00.9 6.00.3 1.2

uivalence Di an

3 V / 20 = 2.3 µV/V ; Uδ i δi Uδi

2.0 3.2 6.0 5.4 4.0 4.0 2.5 6.0 2.5 2.8

uivalence Di an

3 V / 10016.3 µV/V ;

SUδ

δi Uδi

16.0 8.518.0 9.513.0 5.016.3 8.016.5 7.2

lence SIM.EM

alues were eve results were neither tracea

d its uncertaint

kHz

K6a-SIM.EM =1.2 µV

i Di DU2 -0.3 35 2.7 10 0.7 40 0.6 62 0.0 0

nd its uncertain

kHz

K6a-SIM.EMδ = 2.1 µ

Di iDU-0.3 3.7 11.7 0.2 0.2

nd its uncertain

kHz

K6a-SIM.EM= 5.8 µV

i Di UD

5 -0.3 6.75 1.7 20.10 -3.3 7.50 0.0 9.82 0.2 4.8

M-K6a

valuated as the not consideability to the v

ty iDU at 3 V / 1

V/V

iD

3.0 1.3 4.2 6.2 0.4

nty iDU at 3 V / 2

µV/V

i

2.4 11.2 4.6 6.4 1.9

ty iDU at 3 V / 10

V/V

i k 2.1 1 2.0 2.0 2.0 2.1

he weighted mered becausevalues of NRC

kHz, in µV/V; f

0 kHz, in µV/V

00 kHz, in µV/V

-10-505

1015

NIS

T

Diµ

V/V

-10-505

1015

NIS

T

Diµ

V/V

-25-15

-55

1525

Diµ

V/V

SIM. AC-DC

mean of the the laborator

C nor to the va

for k=2.0

; for k=2.0

V.

NIS

T

UTE

Laboratory

3

UTE

Laborato

3 V

NIS

T

UTE

Labora

3

C Voltage Tra

values from Nries that did nalues of NIST

INM

ETR

O

CE

NA

M

y i

3 V/ 1 kHz

INM

ETR

O

ory i

V/ 20 kHz

INM

ETR

O

atory i

3 V/ 100 kHz

nsfer Differen

15/

NRC and NISnot contribute

T.

CE

NA

M

NR

C

CE

NA

M

NR

C

CE

NA

M

NR

C

nce

/98

ST. e to

NR

C

Final Repor

Degree of equ

δ SIM.EM-K6a = 5

LaboratoryNIST UTE INMETRO CENAM NRC

The results 100 kHz, areported va 10.2 Degre For the poinNIST and INtraceability tstandards a Correlation levels, sincprocedures effects of th Degree of equ

δ SIM.EM-K9

LaboratoNIST INTI UTE INMETRCENAM NRC

rt

uivalence Di and

3 V / 1 M5.6 µV/V ;

SIMUδ

y i δi U1.0 173.0 30

-22.0 324.4 3810.0 17

at 3 V show and 5 µV/V alues and the r

ee of equival

nts at 1 kV, thNTI. As mentto the PTB st

at 1 kV.

between UTEe they are tr that these N

he correlation

uivalence Di and

1 kV / 9= 7.6 µV/V ; U

ory i δi

10.0 5.2 4.0

RO 5.0 5.7

6.7

d its uncertaint

MHz

K6a-M.EM= 12.4 µV

Uδi Di U7.2 -4.6 10.0 -2.6 62.0 -27.6 38.0 -1.2 47.0 4.4 1

a degree of eat 1 MHz, excreference valu

lence SIM.EM

he reference ioned in the pandards at 10

E, INMETRO raceable to P

NMIs conductebetween the

d its uncertaint

1 kHz

K9-SIM.EMδ = 6.9 µ

Uδi Di 11.6 2.4 16.0 -2.4 11.0 -3.6 18.0 -2.6 15.0 -1.9 10.0 -0.9

ty iDU at 3 V / 1

V/V

iDU k

2.6 2.1 2.4 2.0 4.8 2.0 0.5 2.0 2.3 2.1

quivalence locept for one ue are within t

M-K9

values were point 6 of this00 V, 3 V and

and CENAMPTB standarded in order tolaboratories a

ty iDU at 1 kV /1

µV/V

UDi 9.5 14.8 23.5 19.5 16.2 7.4

MHz, in µV/V.

ower than 3 µVlaboratory atthe uncertaint

evaluated ass document, th 1 V, whereas

may exist wds. It should o scale from at 1 V and 3 V

1 kHz, in µV/V;

-75-55-35-15

5254565

Diµ

V/V

-30-20-10

01020

Diµ

V/V

SIM. AC-DC

V/V at 1 kHz,t 1 MHz. All ty reported by

s the weightedhe values of Us INMETRO h

ith respect tobe considere1 V or 3 V u

V can be cons

for k=2.0

NIS

T

UTE

Labora

NIS

T

INTI

Labo

1

C Voltage Tra

4 µV/V at 20the difference

y the participa

d mean of vaUTE, INTI anhave traceabl

o INTI values,ed, that the vup to 1 kV, eidered neglig

INM

ETR

O

atory i

3 V/ 1 MHz

UTE

INM

ETR

O

ratory i

kV /1 kHz

nsfer Differen

16/

0 kHz, 4 µV/Ves between t

ants.

alues from NRd CENAM hae values to P

at 1 V and 3voltage step ensures that tible at 1 kV.

CE

NA

M

NR

C

CE

NA

M

NR

C

nce

/98

V at the

RC, ave TB

3 V up the

Final Repor

Degree of equ

δ SIM.EM-K9= 3

Laboratory iNIST INTI UTE INMETRO CENAM NRC

Degree of equ

δ SIM.EM-K9= -0.

Laboratory NIST INTI UTE INMETRO CENAM NRC

Degree of equ

δ SIM.EM-K9= -12

Laboratory iNIST INTI INMETRO CENAM NRC

rt

uivalence Di and

1 kV / 13.3 µV/V ;

SIMUδ

i δi

4.0 13.2 210.0 10.0 14.2 12.9 1

uivalence Di and

1 kV / 27 µV/V ;

SIM.EUδ

i δi U1.0 146.1 3311.0 11-2.0 183.9 17-2.2 10

uivalence Di and

1 kV / 52.9 µV/V ;

SIMUδ

δi Uδ

-18.0 15-1.7 37-9.0 183.3 27

-10.6 13

d its uncertaint

10 kHz

K9-M.EM= 7.2 µV/V

Uδi Di 1.7 0.7 90.0 -0.1 22.0 6.7 28.0 -3.3 15.0 0.9 10.0 -0.4 7

d its uncertaint

20 kHz

K9-EM= 8.0 µV/V

Uδi Di U.1 1.7 11.0 6.8 33.0 11.7 23.0 -1.3 19.0 4.6 18.0 -1.5 6.2

d its uncertaint

50 kHz

K9-M.EM= 9.7 µV/V

δi Di U.4 -5.1 1.0 11.2 3.0 3.9 2.0 16.2 2.0 2.3

ty iDU at 1 kV /1

V

UDi k 9.4 2.0 20.9 2.2 25.5 2.0 19.6 2.0 16.3 2.0 7.8 2.2

ty iDU at 1 kV /2

UDi k .8 2.0 .1 2.1 .8 2.0 .9 2.0 .6 2.1 2 2.0

ty iDU at 1 kV /5

V

UDi k 12.2 2.0 37.1 2.1 20.6 2.0 28.0 2.2 8.9 2.0

10 kHz, in µV/V

20 kHz, in µV/V

50 kHz, in µV/V

-35-25-15-55

152535

Diµ

V/V

-30-20-10

010203040

Diµ

V/V

-40-20

0204060

Diµ

V/V

SIM. AC-DC

.

.

NIS

T

INTI

La

1 k

NIS

T

INTI

Labo

NIS

T

INTI

Labora

C Voltage Tra

UTE

INM

ETR

O

boratory i

kV/ 10 kHz

UTE

INM

ETR

O

oratory i

1 kV/ 20 kHz

INTI

INM

ETR

O

atory i

1 kV/ 50 kHz

nsfer Differen

17/

INM

ETR

O

CE

NA

M

INM

ETR

O

CE

NA

MC

EN

AM

nce

/98

NR

CN

RC

NR

C

Final Repor

Degree of equ

δ SIM.EM-K9= -25

Laboratory iNIST INTI INMETRO CENAM NRC

The results12 µV/V at values and 10.3 Degre At 100 mV,mentioned iand 1 V, wh Correlation 3 V, but tuncertainty correlation b At the CCEthe humidity Degree of equ

δ SIM.EM-K

LaboratoINTI UTE INMETRCENAM NRC

rt

uivalence Di and

1 kV / 15.2 µV/V ;

SIMUδ

δi Uδ

-35.0 2310.5 74-25.0 423.9 27

-18.0 25

at 1 kV sho20 kHz; 17 µthe reference

ee of equival

the referencein section 6, thereas INMET

between UTEhe measuremat 1 V and

between the l

EM K-11 errory coefficients

uivalence Di and

100 mV 11= 9.2µV/V ; U

ory i δi

8.7 14.0

RO 8.0 7.5

9.5

d its uncertaint

00 kHz

K9-M.EM= 16.8 µV/

δi Di U.4 -9.8 1.0 35.7 7.0 0.2 4.0 29.1 3.0 7.2 1

ow a degree µV/V at 50 kHe value are wit

lence SIM.EM

e values werehe values of U

TRO have trac

E, INMETROment process3 V is very aboratories ca

rs were consiof the travellin

d its uncertaint

/ 1 kHz

K11-SIM.EMUδ =7.8 µ

Uδi Di 12.6 -0.5 7.5 4.8 8.0 -1.2 23.0 -1.7 9.5 0.3

ty iDU at 1 kV /1

/V

UDi k

16.6 2.0 79.1 2.2 46.0 2.0 30.5 2.1 18.9 2.0

of equivalencHz and 36 µV/thin the uncer

M-K11

e evaluated aUTE, INTI andceable values

and CENAMs, associatedlow comparean be conside

dered due tong standard, b

ty iDU at 100 mV

µV/V UDi 10.2 17.1 11.1 24.5 5.8

100 kHz, in µV/V

ce smaller th/V at 100 kHzrtainty reporte

s the weighted CENAM havs to PTB stand

M may exist wd with the std with the unered negligible

the power subut they have

V /1 kHz, in µV/

-50-30-101030507090

110

Diµ

V/V

-35-25-15-55

1525

Diµ

V/V

SIM. AC-DC

V

an 4 µV/V az. All the diffeed by the parti

ed mean of vave traceabilitydards at 100 m

with respect totep down prncertainty at e at 100 mV.

upply voltagee been consid

/V; for k=2.0

NIS

T

INTI

Labora

1

INTI

UTE

Labora

1

C Voltage Tra

at 1 kHz; 7 µrences betweicipants.

alues from NRy to the PTB smV.

o the INTI varocedures, en100 mV. The

e and to the teered insignific

INTI

INM

ETR

O

atory i

1 kV/ 100 kHz

UTE

INM

ETR

O

atory i

100 mV/ 1 kHz

nsfer Differen

18/

µV/V at 10 kHeen the report

RC and INTI. standards at 3

lues at 1 V ansures that te effects of t

emperature acant [9].

CE

NA

M

NR

C

CE

NA

M

NR

C

z

nce

/98

Hz; ted

As 3 V

and the the

and

NR

CN

RC

Final Repor

Degree of equ

δ SIM.-EM-K

LaboratoINTI UTE INMETRCENAMNRC

Degree of equ

δ SIM.EM-K

LaboratINTI UTE INMETRCENAMNRC

Degree of equ

δ SIM.-EM-K

LaboratINTI UTE INMETROCENAM NRC

rt

uivalence Di and

100 mV /K11= -0.4 µV/V ;

ory i δi

3.0 -2.0

RO -2.0 -6.0

-1.8

uivalence Di and

100 mV / K11= 23.4 µV/V ;

ory i δi

19.0 18.0

RO 18.0 21.6

24.1

uivalence Di and

100 mV K11=69.8 µV/V ; Utory i δi U

14.0 726.0 5

O 79.0 959.9 475.0 2

d its uncertaint

/ 20 kHz

K11-SIM.EMUδ = 7.

Uδi Di 13.0 3.4 7.7 -1.6 8.0 -1.6 23.0 -5.6 8.5 -1.4

d its uncertaint

100 kHz

K11-SIM.EMUδ = 9.9

Uδi Di 25.0 -4.4 18.0 -5.4 13.0 -5.4 23.0 -1.8 10.3 0.7

d its uncertaint

/ 1 MHz

K11-SIM.EMUδ = 23.

Uδi Di 75.0 -55.8 52.0 -43.8 98.0 9.2 42.0 -9.9 23.0 5.2

ty iDU at 100 mV

.3 µV/V

UDi 11.1 17.2 10.8 24.4 4.7

ty iDU at 100 mV

9µV/V

UDi 23.5 37.9 16.3 25.2 4.0

ty iDU at 100 mV

.1 µV/V

UDi 73.2 108.4 102.7 47.9 6.9

V /20 kHz, in µV

V /100 kHz, in µ

V /1 MHz, in µV

-35-25-15-55

1525

Diµ

V/V

-65-45-25

-51535

Diµ

V/V

-200-150-100-50

050

100150

Diµ

V/V

SIM. AC-DC

V/V; for k=2.0

V/V; for k=2.0

V/V; for k=2.0

INTI

UTE

Laborato

1

INTI

UTE

Laborat

10

INTI

UTE

Laborat

10

C Voltage Tra

INM

ETR

O

ory i

00 mV / 20 kH

UTE

INM

ETR

Otory i

00 mV / 100 kH

UTE

INM

ETR

O

tory i

00 mV / 1 MHz

nsfer Differen

19/

CE

NA

M

NR

C

Hz

CE

NA

M

Hz

CE

NA

M

NR

C

nce

/98

NR

CN

RC

NR

C

Final Repor

The results6 µV/V at 1and the refe10.4 Deg At 120 V anINTI. The vaUTE have tr Correlation long measulow comparlevel can be Degree of equ

δ SIM.EM-1.9= 4

LaboratoryINTI UTE INMETRO CENAM NRC

The resultsdifferences the participa 11. Link w The resultsevaluating tparticipantscomparison The link bereference va D iilink S

δ=

rt

at 100 mV s00 kHz, and

erence value aree of equiva

nd 53 Hz, thealues of INTI raceable valu

between UTEurement procered with the ue considered n

uivalence Di and

120 V /.2 µV/V ;

SIM.EUδ

y i δi U2.2 122.0 73.0 142.3 114.3 2

s at 120 V shbetween the

ants.

with the CC

s of CCEM-Kthe difference in the SIM reference va

etween a resualue of the co

(=- KCRVSIMδδ

show a degresmaller than are within thealence at 120

e reference va and CENAMes to PTB sta

E, INMETROess, associatencertainty at negligible at 1

d its uncertaint

/ 53Hz

1.9 EM=2.8 µV/V

Uδi Di U2.0 -2.0 127.0 -2.2 144.0 -1.2 141.0 -1.9 11.7 0.1 0

how for all p reported valu

CEM Key Co

K6a, CCEM-Kes between thcomparison,

alue (KCRV) w

ult of an i-thorresponding C

+)- SIMi SIMδδ

ee of equivale55 µV/V at 1 uncertainty r

0 V/ 53 Hz

alue was eva are traceable

andards at 10

and CENAMed with the vo120 V. The ef

120 V.

ty iDU at 120 V

UDi k 2.3 2.1 4.5 2.0 4.5 2.0 1.5 2.0 0.6 2.1

participants aues and the

omparison

K9 and CCEhe pairs of la not participawere calculate

laboratory paCCEM key co

-(+ KCRVSIM δδ

ence smaller MHz. All theeported by th

luated as thee to the PTB 0 V and 120 V

M may exist woltage step upffects of the c

/53 Hz, in µV/V

degree of ereference val

EM-K11 key boratories, on

ating in the Ced.

articipating inomparison is

)V

-20-15-10-505

1015

Diµ

V/V

SIM. AC-DC

than 5 µV/V e differences e participants

e weighted mestandards at V, respectivel

with respect to procedures,

correlation be

V

equivalence sue are within

comparisons nly the differeCCEM compa

n the SIM comestimated usi

INTI

UTE

Labor

C Voltage Tra

at 1 kHz, 6 µbetween the

s.

ean of values1 V, whereasy.

o INTI valuesmakes the untween the lab

smaller than 3n the uncertai

are availablences betweearisons, and

mparison withing (10) [5].

(10)

UTE

INM

ETR

O

atory i

120 V / 53 Hz

nsfer Differen

20/

µV/V at 20 k reported valu

s from NRC as INMETRO a

s at 1 V, but tncertainty at 1boratories at 1

3 µV/V. All tnty declared

le. Rather then the resultsthe CCEM k

h respect to t

CE

NA

M

nce

/98

kHz ues

and and

the 1 V 1 V

the by

han s of key

the

NR

C

Final Repor

where:

SIMiδ

KCRVδ

SIMi -SIM δδ

KCR SIM - δδ

The last tedeterminatio

Equation (1

The weighte

Each differe

between ref

The uncerta

Finally the u

rt

RV

erm of (10) on of the refer

δ(δ KCSIM -

1) is equivale(

ed mean of th

KSIM- δδ

ence Di has its

ference value

Ci(u D

ainty of the we

(u δ

uncertainty of

U

is the repo

is the referis the decomparisoin the sectis the diffeterm will breference v

can be evarence values

(δ) iiCRV CCE=

ent to: KCRVSIM - δ(δ

he differences

∑n

1i=Ci

KCRV

(D=

s own uncerta

s was estima

i)SIMiCCEM=D-

eighted mean

)KCRVSIM=−δδ

D link i is equa

2Di Dlink

ukU =

orted value of

rence value ogree of equ

on with respection 10 of this erence betwebe evaluated values of the

aluated usingof SIM and C

)δKCRVEM-

CCEMii D=)

between the

∑n

1i=

2

CCEMi(D

2SIMiCCEM

1/u

)/uD- (D

ainty,SIMiDu , u

ted as the roo

2SIMiD u+u

of the differe

∑n

1i= iDiD(2

SIMu

11

−

al to:

2-( KSIMSIMi

u+ δδ

the i-th labora

of the correspouivalence of ct to the refere document (Deen the referusing the we

laboratories p

the values CCEM:

δ(δ SIMiSIM--

SIMiD-

reference va

)SIMiD-

SIM.iCCEMi )D-D

CCEMiDu , then t

ot of the sum

2CCEMiD

nces between

)CCEM

)KCRV

SIM. AC-DC

atory participa

onding CCEMthe i-th laboence value of

Di), rences valueseighted meanparticipating in

of the labo

)M

lues equals

the expanded

square of the

n reference va

C Voltage Tra

ating in the SI

M comparison,oratory particf SIM compar

s of both comn of the differn both compa

ratories parti

(11)

(12)

(13)

d uncertainty o

iDu as follow

(14)

alues is then:(15)

(16)

nsfer Differen

21/

M compariso

, cipating in Srison, evaluat

mparisons. Trences betwearisons, [5].

icipating in t

of the differen

ws:

nce

/98

n,

SIM ted

his een

the

nce

L

L

Final Repor

with k=2, becomparison 11.1 Link S

Link with the C

LaboUTE INMECENA

3 V / 1 kHz SIM.EM-K6a

CCEM-K6a

NIST NRC

Link with the C

LaboUTE INMECENA

3 V / 20 kHzSIM.EM-K6a

CCEM-K6a

NIST NRC

rt

ecause the pas were report

SIM.EM-K6a –

CCEM-K6a, Di

3 V / 1 kratory i Di lin

2.6ETRO 0.6AM 0.5

KCRVδ 0.3 0.0

CCEM-K6a, Di

3 V / 20 kratory i Di lin

4.2ETRO 2.2AM 0.7

z KCRVδ 2.3 0.9

articipants repted at k =2.0.

– CCEM-K6a

link and its unc

Hz k UDi link 11.1 4.2 6.1

KCRVU δ

1.2 0.4

link and its unc

kHz k UDi link 11.1 4.8 6.6

KCRVU δ

2.1 0.5

ported results

certainty U Di li

SIMiD

-0.3 0.0

certainty U Di li

SIMiD

-0.3 0.2

at k =2.0 and

ink, at 3 V / 1 kH

SIMiDU

3.0 0.4

ink, at 3 V / 20 k

SIMiDU

2.4 1.9

-11-6-149

14

Dil

ink

µV/V

-14-9-416

1116

Di l

ink

µV/V

SIM. AC-DC

d the referenc

Hz, in µV/V

CCEMiD

-0.2 -0.1

kHz, in µV/V

CCEMiD

0.4 0.5

UTE

Laborat

3

UTE

Labor

C Voltage Tra

ces values at

CCEMiDU

1.0 0.6

CCEMiDU

1.2 1.1

INM

ETR

O

tory i

3 V / 1 kHz

INM

ETR

O

ratory i

3 V / 20 kHz

nsfer Differen

22/

SIM and CCE

CE

NA

MC

EN

AM

nce

/98

EM

L

L

Final Repor

Link with the C

LaboUTE INMECENA

3 V / 100 kHSIM.EM-K6a

CCEM-K6a

NIST NRC

Link with the C

LaboUTE INMECENA

3 V / 1 MHzSIM.EM-K6a

CCEM-K6a

NIST NRC

rt

CCEM-K6a, Di

3 V / 100

ratory i Di lin3.0

ETRO -2.0AM 1.3

Hz KCRVδ

16.3 7.2

CCEM-K6a, Di

3 V / 1 Mratory i Di lin

-8.2ETRO -33.2AM -6.8

z KCRVδ

5,6 121

link and its unc

kHz

k UDi link 20.2

0 8.4 10.5

KCRVU δ

5.8 1.0

link and its unc

MHz k UDi link

2 62.6 2 36.7 8 42.1

KCRVU δ

12,4 6,7

certainty U Di li

SIMiD

-0.3 0.2

certainty U Di li

SIMiD

-4,6 4,4

ink, at 3 V / 100

SIMiDU

6.7 4.8

ink, at 3 V / 1 M

SIMiDU

12,6 12,3

-20-10

01020

Di l

ink

µV/V

-85-65-45-25

-5153555

Di l

ink

µV/V

SIM. AC-DC

kHz, in µV/V

CCEMiD

1.2 1.4

Hz, expressed

CCEMiD

8,0 -10,0

UTE

Laborat

3 V

UTE

Laborat

3

C Voltage Tra

CCEMiDU

1.7 1.7

d in µV/V

CCEMiDU

20 11

INM

ETR

O

ory i

V / 100 kHz

INM

ETR

O

tory i

3 V / 1 MHz

nsfer Differen

23/

CE

NA

MC

EN

AM

nce

/98

L

L

Final Repor

11.2 Link

Link with the C

LaboUTE INMECENA

1 kV / 1 kHzSIM.EM-K9

CCEM-K9

NIST NRC INTI

Link with the C

LaboUTE INMECENA

1 kV / 10 kHSIM.EM-K9

CCEM-K9

NIST NRC INTI

rt

k SIM.EM-K9 –

CCEM-K9, Di lin

1 k V / 1 ratory i Di lin

-2.3ETRO -1.3AM -0.6

z KCRVδ 7.6 0.2

CCEM-K9, Di lin

1 k V / 10ratory i Di lin

9.7ETRO -0.3AM 3.9

Hz KCRVδ 3.3 -2.3

– CCEM-K9

nk and its unce

kHz k UDi link

3 24.8 3 21.3 6 18.3

KCRVU δ

6.9 3.1

nk and its unce

kHz k UDi link 26.7

3 21.5 18.5

KCRVU δ

7.2 3.4

ertainty U Di link

SIMiD

2.4 -0.9 -2.4

ertainty U Di link

SIMiD

0.7 -0.4 -0.1

k, at 1 kV / 1 kH

SIMiDU

9.5 7.4 14.8

k, at 1 kV / 10

SIMiDU

9.4 7.8 20.9

-30-20-10

0102030

Di l

ink

µV/V

-25-15-55

15253545

Dil

ink

µV/V

SIM. AC-DC

Hz, in µV/V

CCEMiD

7.2 0.3 -4.7

kHz, in µV/V

CCEMiD

3.9 3.7 -2.3

UTE

Labora

1

UTE

Laborat

C Voltage Tra

CCEMiDU

16.8 9.6 13.8

CCEMiDU

16.8 9.5 15.7

INM

ETR

O

atory i

1 kV / 1 kHz

INM

ETR

O

ory i

1 kV / 10 kHz

nsfer Differen

24/

CE

NA

MC

EN

AM

nce

/98

L

L

Final Repor

Link with the C

LaboUTE INMECENA

1 kV / 20 kH

SIM.EM-K9 CCEM-K9

NIST NRC INTI

Link with the C

LaboINMECENA

1 kV / 50 kH

SIM.EM-K9 CCEM-K9

NIST NRC INTI

rt

CCEM-K9, Di lin

1 k V / 20ratory i Di lin

17.2ETRO 4.2AM 10.1

Hz KCRVδ

-0.7 -5.2

CCEM-K9, Di lin

1 k V / 50 ratory i Di lin

ETRO 7.0AM 19.3

Hz KCRVδ

-12.9 -19.9

nk and its unce

kHz k UDi link

2 25.2 21.8 1 20.3

KCRVU δ

8.0 3.7

nk and its unce

kHz k UDi link 23.5 3 29.4

KCRVU δ

9.7 5.0

ertainty U Di link

SIMiD

1.7 -1.5 6.8

ertainty U Di link

SIMiD

-5.1 2.3 11.2

k, at 1 kV / 20 k

SIMiDU

11.8 6.2 33.1

k, at 1 kV / 50

SIMiDU

12.2 8.9 37.1

-22-12-28

18283848

Dil

ink

µV/V

-25-15

-55

1525354555

Di l

ink

µV/V

SIM. AC-DC

kHz, in µV/V

CCEMiD

5.7 6.0 -5.0

kHz, in µV/V

CCEMiD

-3.3 7.9 -4.1

UTE

Labora

1

INM

ETR

O

L

1 k

C Voltage Tra

CCEMiDU

15.9 9.4 19.7

CCEMiDU

20.9 11.0 23.6

INM

ETR

O

atory i

1 kV / 20 kHz

Laboratory i

kV / 50 kHz

nsfer Differen

25/

CE

NA

MC

EN

AM

nce

/98

L

L

Final Repor

Link with the C

LaboINMECENA

1 kV / 100 kSIM.EM-K9CCEM-K9

NIST NRC INTI

11.3 Link SI

Link with the C

LaboUTE INMECENA

100 mV / 1 k

SIM.EM-K11 CCEM- K11 INTI NRC

rt

CCEM-K9, Di lin

1 k V / 100ratory i Di lin

ETRO -2.5AM 26.4

kHz KCRVδ

9 -25.2 -53.1

M.EM-K11- CC

CCEM-K11, Di

100 mV / 1ratory i Di lin

5.2ETRO -0.8AM -1.3

kHz KCRVδ

9.2 -0.5

nk and its unce

0 kHz k UDi link

5 50.0 4 35.8

KCRV

U δ

16.8 10.0

CEM-K11

link and its unc

1 kHz k UDi link 18.1

8 12.8 3 25.1

KCRV

U δ

7.8 2.3

ertainty U Di link

SIMiD

-9.8 7.2 35.7

certainty U Di li

SIMiD

-0.5 0.3

k, at 1 kV / 100

SIMiDU

16.6 18.9 79.1

ink, at 100 mV

SIMiDU

10.2 5.8

-60-40-20

0204060

Dil

ink

µV/V

-28-18

-82

1222

Dil

ink

µV/V

SIM. AC-DC

0 kHz, in µV/V

CCEMiD

-6.1 -0.7 -2.7

/ 1 kHz, in µV

CCEMiD

-0.1 0.7

INM

ETR

O

1

UTE

Labora

100

C Voltage Tra

V

CCEMiDU

27.4 21.8 38.7

V/V

CCEMiDU

9.9 4.8

Laboratory i

kV / 100 kHz

INM

ETR

O

atory i

0 mV / 1 kHz

nsfer Differen

26/

CE

NA

M

CE

NA

M

nce

/98

L

L

Final Repor

Link with the C

LaboUTE INMECENA

100 mV / 20

SIM.EM-K11 CCEM- K11 INTI NRC

Link with the C

LaboUTE INMECENA

100 mV / 10

SIM.EM-K11 CCEM- K11 INTI NRC

rt

CCEM-K11, Di

100 mV / 20ratory i Di lin

-1.1ETRO -1.1AM -5.1

kHz KCRδ

-0.4-0.3

CCEM-K11, Di

100 mV / 10ratory i Di lin

-2.5ETRO -2.5AM 1.1

00 kHz Kδ

231

link and its unc

0 kHz k UDi link 18.2 12.5 24.9

RV KCRV

U δ

4 7.3 3 2.9

link and its unc

00 kHz k UDi link

5 38.0 5 17.8 26.0

KCRV KC

U δ

3.4 9.9.6 4.5

certainty U Di li

V

SIMiD

3.4 -1.4

certainty U Di li

CRV

SIMiD

9

5

-4.40.7

ink, at 100 mV /

SIMiDU

11.1 4.7

ink, at 100 mV /

M

SIMiDU

4 23.5 4.0

-35-25-15

-55

1525

Dil

ink

µV/V

-45-30-15

0153045

Di l

ink

µV/V

SIM. AC-DC

/ 20 kHz, in µV

CCEMiD

0.9 -0.2

/ 100 kHz, in µ

CCEMiD

-0.23.5

UTE

Labora

100

UTE

Labora

100 m

C Voltage Tra

V/V

CCEMiDU

9.8 5.6

µV/V

M U

2

INM

ETR

O

atory i

0 m V / 20 kHz

INM

ETR

O

atory i

mV / 100 kHz

nsfer Differen

27/

CCEMiD

20.8 6.6

CE

NA

M

z

CE

NA

M

nce

/98

L

Final Repor

Link with the C

LaboUTE INMECENA

100 mV / 1

SIM.EM-K11 CCEM- K11 INTI NRC

12. Correc ConcerningKlonz from are shown declared.

Laboratory

INTI

PTB

13. Ackno CENAM ackand dealingnext labora

rt

CCEM-K11, Di

100 mV / 1ratory i Di lin

-34.1ETRO 18.9AM -0.2

MHz Kδ

69-

ctive action

the INTI resuPTB, at that tin the follow

INTIδ

INTIU δ

PTBδ

PTBU δ

owledgeme

knowledges tg with administory. Thanks

link and its unc

MHz k UDi link 1 110.7 9 105.1 2 56.6

KCRV KC

U δ

9.8 23-7 27

ns:

ults at 3 V, lasime INTI coming table, the

ac-dc vo

1 kHz

0.1

2.0

0.1

1.0

ents

the participanstrative proced are given to

certainty U Di li

CRV

SIMiD

.1

7

-55.85.2

st July 2007, tmpared their mey are in agr

oltage transfer dδi and Uδi (k=2,

20 kHz

0.3

3.0

0.5

1.0

ts for their timdures for cleao the participa

ink, at 100 mV

M

SIMiDU

8 73.2 6.9

the ac-dc tranmeasurement reement with

difference at 30) µV/V

z 100 kH

2.8

12.0

3.7

3.0

me invested iaring customsants for the c

-160-110

-60-104090

Dil

ink

µV/V

SIM. AC-DC

/ 1 MHz, in µV

CCEMiD

-30.013.0

nsfer laboratoat 3 V againsthe PTB res

V

Hz 1 MH

-27.4

40.0

-19.7

10.0

n doing meas and sending comments ma

UTE

Labora

100 m

C Voltage Tra

V/V

M U

0 0

ory of INTI wat the PTB val

sults, within th

Hz

4

0

7

0

surements, pr the travellingade on the p

INM

ETR

O

tory i

mV / 1 MHz

nsfer Differen

28/

CCEMiD

62 32

s audited by ues. The resuhe uncertaint

reparing repog standard to tprotocol and t

CE

NA

M

nce

/98

Dr. ults ies

orts the the

Final Repor

drafts. Specand INTI, be CENAM thais also grateit possible to The collaboprotocol and 14. Refere [1] Guide

measu(MRA)

[2] Mary G [3] Dietric [4] BIPM,

Measu [5] Liefrin

JansseM., PoEURO40, Te

[6] Reyma

compa [7] Klonz

level o [8] C.J. v

transfe [9] K.E. R

transfe [10] A. Pol

rt

cial acknowleecause thank

anks Dr. Haroefully acknowo hand carry t

oration of Dr. d on the Draft

ences

lines for CIurements stan). March 1999

Gibbons Natre

ch, C.F., “Unc

IEC, IFCCurement”, (19

k F., Dierikxen J.-T., Jeanower O., Ras

OMET projectech. Suppl., 0

ann D., Linarison BIPM.E

M., CCEM-Kof uncertainty,

an Mullem, Eer standards a

Rydler and V. er difference a

etaeff. CCEM

dgement is gs to their part

old Sanchez, awledged the fin

the travelling

David Avilésts is gratefully

PM key comndards and o9.

ella. NBS. Ex

certainty, Calib

, ISO, IUPA93)

x E.F., Heimenneret B., Jenso Alonso Ft no 429: Co1004

nk between EM-K11.b, Me

K6.a: key com, Metrologia, 2

E.F. Dierikx anat selected fre

Tarasso. CIPat low voltage

M–K9 compari

given to the paticipation the l

at the Institutonancial suppostandard in S

s and Dr. Reny acknowledge

mparison (Aof measureme

xperimental S

bration and Pr

AC, IUPAP,

eriks J.W., Ensen H.D., He.I., Reymannmparison of

the comparetrologia, 200

mparison of ac2002, 39, Tec

nd J.P.M. de equencies bet

PM key compes. Final repor

son of ac-dc h

articipants in ink could be e

o Costarricenort of the OrgaSouth America

né Carranza ed.

Appendix F tents certificate

Statistics. Augu

robability”, 19

OIML “Guide

klund G., Floetland P.O., L D., Selçik S10 V electro

rison EUROM3, 40, Tech. S

c-dc voltage tch. Suppl., 010

Vreede. Keytween 1 MHz

arison CCEMrt. March 2007

high voltage s

SIM. AC-DC

the CCEM Kextended to th

nce de Electricanization of Aa.

from CENAM

to the “Mutues issued by

ust, 1963

991.

e to the Ex

ouda I., FuncLindic M., Lo-S., Streit J., onic voltage s

MET.EM.BIPMSuppl., 01005

ransfer stand002.

comparison to 100 MHz.

M –K11 and C7

standards. Fin

C Voltage Tra

Key comparisohe other SIM-

cidad, for his American Stat

M, for their co

ual recogniti national met

xpression of

ck T., HelistöHive J.-P., NiVrabcek P.,

standards, M

M-K11.b and5

dards at the lo

CCEM.K6.c oFinal Report

CCEM-K11.1 o

nal report.

nsfer Differen

29/

ons; NRC, NI-region NMIs.

collaborationtes, which ma

omments on t

on of nationtrology institut

Uncertainty

ö P., Jakab icolas J., NunWaldmann W

etrologia, 200

d the ongoi

owest attainab

of ac-dc voltaFebruary 200

of ac-dc Volta

nce

/98

ST

n. It ade

the

nal tes

in

A., nes W., 03,

ing

ble

age 05.

age

Final Repor

rt

RA

REPOPA

PPEORT

ARTI

NDIX

TS OFCIPA

SIM. AC-DC

X A F THANTS

C Voltage Tra

HE S

nsfer Differen

30/

nce

/98

31/98

32/98

33/98

34/98

35/98

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END OF THE REPORT