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Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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Page 1: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

Si8000m / Si9000e 2014 - Upcoming Features

June 2014 - Richard Attrill

© Polar Instruments 2014

Page 2: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

2

New Features

Calculating Effective Er (EEr) and Velocity of Propagation (Vp)

More results option

Effective Er and Velocity of Propagation results

© Polar Instruments 2014

Page 3: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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New Features

Using the Vp result with the CITS Controlled Impedance Test System Editor

Velocity of Propagation results in Si8000m

Velocity of Propagation setting in CITS880

© Polar Instruments 2014

Page 4: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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New Features

Via Checks: now included with the Si8000mVia Stub CheckIt is sometimes overlooked that, from a signal integrity standpoint, unconnected via stubs have a far larger effect on the signal than the geometry of the via itself.This simple-to-use ‘traffic light’ feature will offer guidance as to whether the via stub will have a significant impact.Please view this application note for more info: AP8166

Via Pad / Anti-Pad CalculationThe anti-pad is the void area between the pad and the copper of the plane. It should be designed so that it maintains the impedance of a transmission line as it passes through the plane. This option guides the user to the pad / anti-pad diameters that should be used.Please view this application note for more info: AP8166

© Polar Instruments 2014

Page 5: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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New Features

Trace conductivity: now possible to enter as conductivity or resistivity Trace ConductivityIt is now possible to enter either conductivity or resistivity, the parameters are chained together, entering either field will auto calculate the other.

© Polar Instruments 2014

Page 6: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

6

New Features

Track Resistance Calculator enhancements (TRC is a licensed option) Launch optional TRC from the toolbar

© Polar Instruments 2014

Page 7: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

7

New Features

Track Resistance Calculator enhancements

Both trace resistivity (Ohm Metres) and conductivity (Siemens / m) now supported

Trace resistivity automatically passed from the Si9000e to the TRC alongside the other parameters (W1, W2, T1, LL)

The TRC will now display both resistivity and conductivity values under Edit materials, and as with the Si9000e you can enter either value and the reciprocal value is calculated.  The TRC built-in library of materials has a new entry for Copper (Electro Deposited).

© Polar Instruments 2014

Page 8: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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New Features

Extended Substrate Data enhancements

The Extended Substrate Data options have changed.  When the ‘Multiple Er / TanD / Causal Er’ checkbox is selected the Loss Tangent is now disabled to indicate that it is not used when Extended Substrate Data is enabled. Please view this application note for more info: AP8184

© Polar Instruments 2014

Page 9: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

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New Features

Extended Substrate Data enhancements (continued)

The Extended Substrate Data option supports two modes:

Multiple Table Entries: from the laminate vendor data sheet add each Freq vs Er / TanD data point. A maximum of 10 table entries are allowed.

Single Table Entry: to enforce causal modelling using the Svensson - Djordjevic method add a single Freq vs Er / TanD entry to the table. An entry at 1GHz is recommended.

New Import / Export Substrate Table options will allow the selected table to be exported to a file (.EST) and then imported by other Si9000e users. 

© Polar Instruments 2014

Page 10: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

10

New Features

New Alpha and Beta plots, useful for users of Polar Atlas SPP

© Polar Instruments 2014

Page 11: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

11

New Features

Update information

The Si8000m and Si9000e 2014 releases will be available for download during July. We will mail you as soon as it is available.

Polarcare customers are entitled to update to the latest version of their licensed product at any time whilst their Polarcare is active. We recommend that Polarcare users attempt to keep within 2 years of the latest release to ensure that updating is as smooth as possible.

Latest release version numbers for all Polar software are noted in AP608.

Please contact [email protected] for update information or if you would like to renew or reinstate your Polarcare support contract.

© Polar Instruments 2014

Page 12: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

Thank you

© Polar Instruments 2014

Page 13: Si8000m / Si9000e 2014 - Upcoming Features June 2014 - Richard Attrill © Polar Instruments 2014

For more information:

Contact Polar now: Phone

USA / Canada / MexicoKen Taylor ( 503) 356 5270

Asia / PacificTerence Chew +65 6873 7470

UK / EuropeNeil Chamberlain +44 23 9226 9113

Germany / Austria / Switzerland Hermann Reischer +43 7666 20041-0

www.polarinstruments.com

© Polar Instruments 2014