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Semiconductor Introduction ENGI 242 ELEC 222

Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

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Page 1: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

Semiconductor Introduction

ENGI 242ELEC 222

Page 2: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 2

Specification Symbol Notation Standard

Type of value Symbol Subscript

Instantaneous value of time varying value Lower case Lower case

Instantaneous total value Lower Case Upper case

RMS or effective value Upper Case Lower case

Maximum or average value, dc value Upper Case Upper Case

Page 3: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 3

Factors effecting Resistivity

Page 4: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 4

Ge and Si single-crystal structure

Page 5: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 5

Atomic structure: (a) germanium; (b) silicon

Page 6: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 6

Energy levels: discrete levels in isolated atomic structures

Page 7: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 7

Conduction and valence bands of an insulator; semiconductor; and conductor.

Page 8: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 8

Antimony impurity in n-type material

Page 9: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 9

Effect of donor impurities on the energy band structure

Page 10: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 10

Boron impurity in p-type material.

Page 11: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 11

Electron versus hole flow.

Page 12: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 12

(a) n-type material; (b) p-type material.

Page 13: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 13

p-n junction with no external bias

Page 14: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 14

No-bias conditions for a semiconductor diode

Page 15: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 15

Forward-biased p-n junction

Page 16: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 16

Reverse-bias conditions for a semiconductor diode

Page 17: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 17

Reverse-biased p-n junction

Page 18: Semiconductor Introduction ENGI 242 ELEC 222. January 2004ENGI 242/ELEC 2222 Specification Symbol Notation Standard Type of valueSymbolSubscript Instantaneous

January 2004 ENGI 242/ELEC 222 18

As the reverse bias voltage becomes greater, the charge stored in the depletion region increases.