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    Index Number: ___________________

    Specimen Paper

    TEL204/05 Semiconductor Device P!"ic"

    Time: # $our"

    In"truction" to candidate":

    1. Please check that this question paper consists of six (6) printed pages beforeyou begin the examination.

    2. Anser any ! questions in the anser booklet pro"ided.

    #. $on%programmable electronic calculator may be used.

    &. 'ou may refer to the Appendix for formulas and physical constants.

    !. 'ou are not alloed to remo"e this question paper from the examination "enue.

    opyright 2*1# +,-

    2%

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    TEL204/05

    %ue"tion & '20 mar(")

    (a) /ketch the crystal structure for simple cubic structure and body%centeredcubic structure. 0! marks

    (b) he diamond lattice structure is the basic building block in silicon.(i) alculate the number of atoms in one cell of a diamond structure.0! marks

    (ii) alculate the density of atoms in silicon in terms of atomsm#.0! marks

    (c) he energy le"els in the hydrogen atom as proposed by 3ohr ha"ediscrete energy le"els ith principal quantum number n as shon in thefigure belo.

    4igure 1

    5i"en that the electron energy in the hydrogen atom 26.13n

    En

    = e7

    8etermine the energy released hen an electron mo"es from energyle"els 9#to 91. 0! marks

    %ue"tion 2 '20 mar(")

    (a) 5i"en to doped silicon samples : and '. /ample : doped ith 1610

    nitrogen atomscm 3 ; /ample ' doped ith 5 1013 aluminum atomscm3 .

    (i) /tate the type of semiconductor for sample : and sample '.0& marks(ii) 4ind the ma

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    TEL204/05

    %ue"tion # '20 mar(")

    (a) A rectangular germanium block ith the dimensions as shon in the figure belohas a resisti"ity of 1*#m at 2*B.

    4igure 1(i) 4ind the resistance beteen the square ends.

    0& marks

    (ii) 4ind the resistance beteen the rectangular ends.0& marks

    (iii) A 1*mA current flos beteen the rectangular ends. 4ind the number ofelectrons passing the silicon block per second.

    0& marks

    (b) 3riefly explain the reason direct band gap semiconductor is more suitable to beused in optoelectronics applications. /ketch and label the energy band diagramof a direct band gap semiconductor and an indirect band gap

    semiconductor.0> marks

    %ue"tion 4 '20 mar(")(a) (i) +hat are the important points of CeisenbergDs uncertainty principleE

    06 marks (ii) he uncertainty in the position of a particle ha"ing mass ?.11x1*%#1=g is >F

    4ind the uncertainty in the momentum 02

    hxp = of the particle.

    0& marks (iii) An electron is mo"ing ith a "elocity of 1x1*Gcms. 8etermine its associated

    de 3roglie a"elength 0Hhp here h is PlanckDs constant and p is

    momentum. 0! marks

    (b) 5i"en a sample of intrinsic silicon and a sample of intrinsic germanium ithsame dimensions for both samples. At room temperature hich sample hashigher resisti"ityE Iustify your anser.

    0! marks

    #

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    TEL204/05

    &

    &%

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    TEL204/05

    %ue"tion 5 '20 mar(")

    (a) 3riefly describe the particle in a box model in quantum mechanics. 02 marks

    (b) Sketch the initial a"e functions for the first four energy states in a one%

    dimensional particle in a box gi"en that 9*is the energy at ground state (nH1).

    Label your diagram clearly. [8 marks]

    (c) esium chloride (sl) is a typical body%centred cubic ionic structure ith the@adelung constant J H 1.G62G. Kt is gi"en that its aoH *.#!6 nm and n H 1*.!.4ind theL

    (i) 3inding energy energy of sl in terms of e7. 0# marks(ii) @olar ohesi"e energy of sl in terms of kJ/mol. 0# marks

    (d) he energy difference beteen the !d and 6s suble"els in gold accounts for its

    color. Assuming this energy difference is about 2.G e7 explain hy gold has a

    arm yello color.. [4 marks]

    %ue"tion * '20 mar(")

    (a) 4or an Al%/i,2%/i capacitor the doping of the substrate is $aH1*1&cm%# and the

    oxide thickness is >2F. 5i"en that the flat band "oltage 743is M *.& 7 calculate

    at strong in"ersion

    (i) the surface potential

    0& marks

    (ii) the maximum depletion layer idth

    02 marks

    (iii) the gate "oltage

    0& marks

    (b) Nualitati"ely explain ho the oxide charges affect the threshold "oltage.

    0& marks

    (c)Oist to differences beteen ionic, covalent and metallic bonds. 06

    marks

    !

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    TEL204/05

    +ppendix I

    P!"ica, con"tant"

    3oltmann constant k = 1 38 10 23. I=

    Planck constant 341063.6

    =h Is9lementary charge C1060.1 19=q

    Permitti"ity in "acuum o =

    8 85 10 12

    . F / m

    Permeability in "acuum o =

    4 10 7

    H / m

    9lectron rest mass mo =

    9 11 10 31

    . kg

    hermal "oltagekT

    q = 0 0259. V (at T H #**=)

    able 1L Properties of semiconductors and insulator (at #**= unless otherise noted)

    Propert! -nit" Si .e .a+" Si2Lattice constant nm *.!*G *.!6!G! *.!6!#2 %

    Density gcm# !.** Q 1*22 &.&2 Q 1*22 2.21 Q 1*222.2* Q1*22

    Energy gap at300 K

    e7 1.12& *.6G 1.&2 > M ?

    Energy gap at 0K

    e7 1.1G* *.G&& 1.!2 %

    Relativepermittivity

    % 11.G 16.* 1#.1 #.?

    Intrinsic carrierconcentration cm# 1.&! Q 1*1* 2.& Q 1*1# ?.* Q 1*6 %Electron lattice

    mobilitycm27s 1&1G #?** >>** 2*

    Hole latticemobility

    cm27s &G1 1?** &** 1*>

    Effective densityof states in

    conduction bandcm# 2.> Q 1*1? 1.*& Q 1*1? &.G Q 1*1G %

    Effective densityof states in

    valence bandcm# 1.*& Q 1*1? 6.* Q 1*1> G.* Q 1*1> %

    Electroneffective mass

    mn*mo 1.*> *.!! *.*6> %

    Hole effectivemass

    mp*mo *.>1 *.# *.! %

    Electron affinity e7 &.*! &.** &.*G 1.*

    6

    G%

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    TEL204/05

    +ppendix II

    ormu,a" Seet

    Binding energy )1

    1)(4

    (00

    2

    na

    eB =

    Molar cohesive energy C = B

    (2NA

    Kn the photoelectric effect the cutoff

    a"elength

    hc

    c =

    he maximum kinetic energy

    K hhc

    max = =

    he stopping potentiale

    KV

    s

    max=

    he minimum frequency of photon

    h

    Ef

    g=

    he energy bandgap of /i

    T

    TEE gg

    +

    =

    2)0(

    Kntrinsic carrier concentration of

    silicon ]exp[2kT

    ENNn

    g

    vci

    =

    oncentration of ma