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(A2LA Cert. No. 4184.01) 03/26/2021 Page 1 of 45
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. No. 26, 40th Street
Thao Dien Ward, Thu Duc City, Ho Chi Minh City VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 28 6281 8479
CALIBRATION
Valid To: February 28, 2023 Certificate Number: 4184.01 In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this laboratory at the location listed above as well as the satellite laboratory location listed below to perform the following calibrations1, 8: I. Acoustical
Parameter/Equipment
Range
CMC2 (±)
Comments
Sound Level Meter – (@ 1 kHz)3
(94 and 114) dB
0.59 dB
KQT-33K3-4-2911-1, BK Cal 73
II. Chemical
Parameter/Equipment
Range
CMC2 (±)
Comments
Conductivity Meter3
1 µS/cm 100 µS/cm 1413 µS/cm
0.25 µS/cm 2.2 µS/cm 5.5 µS/cm
KQT-CD-01 manufacturer’s manual, standard solution
pH Meter3
4.01 pH 7.00 pH 10.00 pH
0.021 pH 0.021 pH 0.021 pH
KQT-17-20SC-42 manufacturer’s manual, standard solution
(A2LA Cert. No. 4184.01) 03/26/2021 Page 2 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Refractometer3
(5 to 85) % Brix Up to 10 % Salinity
0.13 % Brix 0.12 % Salinity
KQT-RE-01 manufacturer’s manual, Hanna HI96801
Turbidity Meter3
(15 to 750) NTU
3.8 % + 0.02 NTU
KQT-TU-01 manufacturer’s manual, Hanna HI98703
TDS Meter3
0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS
0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS
KQT-CD-01 reference conductivity standard solution
Dissolved Oxygen Meter
(0.0 to 50.0) mg/L
0.5 mg/L
KQT-DO-01 manufacturer’s manual standard solution Hanna HI9147
Hydrometer
(0.600 to 2.000) g/cm3
0.003 g/cm3
DLVN 293: 2016, manufacturer’s manual standard hydrometers
Alcoholmeter
Up to 100 % V
0.4 % V
DLVN 106: 2012 manufacturer’ manual standard alcoholmeter
(A2LA Cert. No. 4184.01) 03/26/2021 Page 3 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Gas Detectors H2S CO CH4 C4H8 C4H8 O2 O2 CO2 CO2 NH3 NO2 C2H4 SO2
0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %
6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %
KQT-17-20SY-06, manufacturer’s manual, standard gas
III. Dimensional
Parameter/Equipment
Range
CMC2 (±)
Comments
Angle Meter/Clinometer
Up to 90°
1.4'
KQT-33K6-4-157-1, angle block set
Calipers3
Up to 500 mm (>500 to 2000) mm
0.015 mm/m + 0.0078 mm 0.027 mm/m + 0.0022 mm
KQT-33K6-4-552-1, gauge block grade 0 +1, caliper checker
Depth Gages3
Up to 1000 mm
0.017 mm/m + 0.007 mm
KQT-33K6-4-17-1, gauge block grade 0 +1
Coordinate Measuring Machines (CMM) 3 – 3-Axis Linearity Only
X: (10 to 900) mm Y: (10 to 900) mm Z: (10 to 500) mm
19 µm/m 19 µm/m 19 µm/m
Manufacturer’s manual, gauge block grade 0 +1
(A2LA Cert. No. 4184.01) 03/26/2021 Page 4 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Micrometers3
Up to 1000 mm
0.024 mm/m + 1 µm
KQT-33K6-4-15-1, gauge block grade 0 +1
Dial Indicator3/Dial Test Indicator3
Up to 1 mm (1 to 200) mm
0.006 mm/m + 1.1 µm 0.01 mm/m + 1.7 µm
KQT-IN-01, gauge block grade 0 +1, Mitutoyo UDT-3
Dial Bore Gages3
Up to 500 mm
0.01 mm/m + 1.7 µm
KQT-IN-01, gauge block grade 0 +1
Gage Blocks3
(1 to 25) mm (>25 to 100) mm (>100 to 600) mm
0.31 µm 0.0049 mm/m + 0.3 µm 0.0057 mm/m + 0.8 µm
KQT-33K6-4-1-1, Pratt & Whitney B Mahr ULM-1000E
Height Gages3
Up to 900 mm
0.026 mm/m + 0.6 µm
KQT-33K6-4-1626-1, gauge block grade 0 +1
Holtest
(6 to 75) mm
0.012 mm/m + 0.8 µm
KQT-HT-01 setting ring
Microscope, Measuring3 Profile Projector/Optical Comparator3
Up to 500 mm
0.004 mm/m + 2.5 µm
KQT-33K6-4-1268-1, manufacturer’s manual, KLC source procedure, standard glass scale
Pin/Plug Gages3
Up to 100 mm
0.0048 mm/m + 0.33 µm
KQT-33K6-4-121-1, Pratt & Whitney B Mahr ULM-1000E
Thread Plug Gage
Up to 100 mm
0.032 mm/m + 0.22 um
KLC source procedure, Mahr ULM-1000E
(A2LA Cert. No. 4184.01) 03/26/2021 Page 5 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Setting Rings
Up to 150 mm
0.002 mm/m + 0.5 µm
KQT-33K6-4-2-1, Mahr ULM-1000E
Thread Ring Gage
Up to 125 mm
0.027 mm/m + 0.22 µm
KLC source procedure, Mahr ULM-1000E
Surface Plate Flatness – Repeatability Only3, 4
[(12 x 12) to (48 x 96)] in
50 µin
KQT-17-20MD-14, repeat-o-zero
Thickness Gages/Feeler Gages and Thickness Films3
Up to 50 mm
0.1 mm/m + 0.8 µm
KQT-TH-01, gauge block grade 0 +1
Steel Ruler
Up to 2000 mm
0.06 mm
DLVN 283:2015 standard glass scale
Measuring Tape
Up to 100 m
0.6 mm
KQT-MT-01 DLVN 266: 2015 standard glass scale standard weight
Distance & Length Measuring Instruments
Up to 50 m
0.003 m
KQT-D&L-01 laser distance meter
Precision Level/Square Level/Sprit Level
0.02 mm/m 0.05 mm/m 0.1 mm/m
0.026 mm/m 0.037 mm/m 0.062 mm/m
KQT-PL-01 DLVN 120: 2013 standard precision level
(A2LA Cert. No. 4184.01) 03/26/2021 Page 6 of 45
IV. Electrical – DC/Low Frequency
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Current – Generate3 Up to 2.2 mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (1.5 to 11) A (11 to 500) A
(20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 20 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (45 to 65) Hz (65 to 500) Hz (0.5 to 1) kHz 45 Hz to 1 kHz
0.2 mA/A + 0.035 µA 0.2 mA/A + 0.035 µA 0.2 mA/A + 0.11 µA 1.5 mA/A + 0.65 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.55 µA 1.4 mA/A + 5 µA 0.2 mA/A + 3.5 µA 0.2 mA/A + 2.5 µA 0.2 mA/A + 3.5 µA 1.3 mA/A + 10 µA 0.3 mA/A + 35 µA 0.5 mA/A + 80 µA 8.5 mA/A + 160 µA 0.8 mA/A+ 2 mA 1.2 mA/A+ 2 mA 3.8 mA/A + 2 mA 0.6 mA/A + 100 mA
KQT-17-20AQ-101, KLC source procedure manufacturer’s manual, Fluke 5720A Fluke 5500A Fluke 5500A w/ 5500/coil
(A2LA Cert. No. 4184.01) 03/26/2021 Page 7 of 45
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Current – Measure3 (5 to 100) μA 100 μA to 10 mA (10 to 100) mA 100 mA to 1 A Up to 2000 A
(10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (50 to 1000) Hz
4.6 mA/A + 0.03 µA 1.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 4.6 mA/A + 0.2 µA 1.7 mA/A + 0.2 µA 0.7 mA/A + 0.2 µA 0.4 mA/A + 0.2 µA 4.6 mA/A + 20 µA 1.7 mA/A + 20 µA 0.7 mA/A + 20 µA 0.4 mA/A + 20 µA 4.6 mA/A + 0.2 mA 1.9 mA/A + 0.2 mA 0.97 mA/A + 0.2 mA 1.2 mA/A + 0.2 mA 3.1 mA/A
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A HP 3458A + high voltage divider + Kyoritsu 2009R
(A2LA Cert. No. 4184.01) 03/26/2021 Page 8 of 45
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Voltage – Generate3 Up to 220 mV 220 mV to 2.2 V (2.2 to 22) V (22 to 220) V 220 V to 1.1 kV
40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 1000) kHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz 50 Hz to 1 kHz
0.11 mV/V + 7 µV 0.26 mV/V + 7 µV 0.59 mV/V + 17 µV 1.1 mV/V + 20 µV 3.4 mV/V + 45 µV 0.06 mV/V + 8 µV 0.10 mV/V + 10 µV 0.14 mV/V + 30 µV 0.52 mV/V + 80 µV 2.1 mV/V + 0.3 mV 0.06 mV/V + 0.05 mV 0.10 mV/V + 0.1 mV 0.13 mV/V + 0.2 mV 0.35 mV/V + 0.6 mV 1.9 mV/V + 3.2 mV 0.07 mV/V + 0.6 mV 0.10 mV/V + 1 mV 0.14 mV/V + 2.5 mV 0.09 mV/V + 3.5 mV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A
AC Voltage – Measure3 (0 to 10) mV (10 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V 100 V to 1 kV
10 Hz to 20 kHz 40 Hz to 1 kHz 40 Hz to 1 kHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (50 to 100) kHz 10 Hz to 20 kHz 40 Hz to 1 kHz
2.8 mV/V + 0.04 mV 0.2 mV/V + 2 μV 0.1 mV/V + 20 μV 0.8 mV/V + 0.4 mV 0.1 mV/V + 0.2 mV 0.2 mV/V + 0.2 mV 1.0 mV/V + 0.2 mV 0.2 mV/V + 2 mV 0.5 mV/V + 20 mV
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 9 of 45
Parameter/Equipment
Range
CMC2, 6 (±)
Comments
Capacitance – Generate3 (@ 1 kHz)
(330 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 11) µF (11 to 33) µF (33 to 110) µF (110 to 330) µF 330 µF to 1.1 mF
5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF 4.8 mF/F + 30 nF 6.1 mF/F + 0.1 µF 8.2 mF/F + 0.3 µF 12 mF/F + 0.3 µF
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5500A
DC Current – Generate3
(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 2.2 A (2.2 to 11) A (11 to 500) A
110 μA/A + 6 nA 52 μA/A + 40 nA 69 μA/A + 0.7 µA 110 μA/A + 12 µA 710 μA/A + 330 µA 0.7 mA/A + 17 mA
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A Fluke 5500A Fluke 5500A w/ 550/coil
DC Current – Measure3
(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A (1 to 2000) A
110 µA/A + 0.8 nA 49 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 6.6 mA/A + 1.5 mA
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 3458A HP 3458A + Shunt + Kyoritsu 2009R
DC Voltage – Generate3
(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V
14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV 11 µV/V + 0.7 mV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 10 of 45
Parameter/Equipment
Range
CMC2, 5, 6 (±)
Comments
DC Voltage – Measure3
(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 10) kV
12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV 1.7 %
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, Fluke 8845A, HP 3458A HP3458A + HV divider
Power Analyzer/Meter3
Up to 10 kW
0.13 %
KQT-33K1-4-1683-1, KLC source procedure, manufacturer’s manual, Fluke 5500A
Resistance – Generate3
(0.001 to 1) Ω (1 to 100) Ω (0.1 to 10) kΩ 10 kΩ to 1 MΩ (1 to 100) MΩ
0.21 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 1.5 mΩ/Ω
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, standard resistance HARS-X-9-0.001 IET HRRS-B5-1M-5KV
Resistance – Measure3
(0 to 10) Ω (10 to 100) Ω 100 Ω to 1 kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ
0.03 mΩ/Ω + 0.05 mΩ 0.017 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 5 mΩ 0.016 mΩ/Ω + 50 mΩ 0.029 mΩ/Ω + 2 Ω 0.073 mΩ/Ω + 100 Ω
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 11 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Oscilloscopes3 – Square Wave Signal 10 Hz to 10 kHz Leveled Sine Wave Time Markers
1.8 mV to 105 Vp-p 50 kHz to 100 MHz (100 to 300) MHz 5 s to 100 µs (50 to 2) µs 1 µs to 20 ns 10 ns to 2 ns
16 mV/V + 0.1 mV 0.3 mHz/Hz 2 mHz/Hz 6.9 ms/s 17 ms/s 14 ms/s 1.8 ms/s
KQT-CG-7, KLC source procedure, manufacturer’s manual, Fluke 5500A
Gauss Meters3
3 mT 50 mT 300 mT
2.3 % 2.8 % 3.6 %
KQT-33K1-4-1658-1 manufacturer’s manual magnetic tool
Hipot/Withstanding Testers3
(0.5 to 20) kV (0.5 to 100) mA
1.7 % 1.4 %
KQT-33K1-4-181-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + TOS 1200 + Tektronix P6015A
Insulation Testers3
(0 to 10) kV (0 to 200) MΩ (0.2 to 100) GΩ
1.1 % 0.2 % 1.6 %
KQT-33K2-4-33-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + standard resistance
LCR Meters3
(0 to 200) MΩ (0 to 1000) pF 1 mH to 900 mH
0.4 % 0.14 % 2.3 %
KQT-33K1-4-1260-1, KLC source procedure, manufacturer’s manual, LCR standard
Metal Detector3 – Ferrous Brass
(0.5 to 2.0) mm (0.4 to 2.0) mm
0.0009 mm 0.0009 mm
KQT-ME-01, manufacturer’s manual, precision balls
(A2LA Cert. No. 4184.01) 03/26/2021 Page 12 of 45
V. Electrical – RF/Microwave
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
RF Power – Measuring Instruments3 (-70 to 20) dBm (-30 to 20) dBm
100 kHz to 18 GHz 50 MHz to 26.5 GHz
0.54 dBm 0.39 dBm
KQT-33K4-4-715-1, KLC source procedure, manufacturer’s manual, HP 8340B monitored w/ Agilent N1911A w/ 8485A or E4412A
RF Power – Measure3 (-70 to 20) dBm (-30 to 20) dBm
100 kHz to 18 GHz 50 MHz to 26.5 GHz
0.54 dBm 0.39 dBm
KQT-33K4-4-105-1, KLC source procedure, manufacturer’s manual, Agilent N1911A w/ E4412A or 8485A
VI. Fluid Quantities
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Air Speed/Velocity Meters
Up to 30 m/s
0.21 m/s
KQT-33K6-4-1769-1, velocity standard
Air/Mass Flow Meters3
(0.1 to 1) lpm (>1 to 30) lpm (>30 to 2500) lpm
0.03 % lpm 1.7 % lpm 2.3 % lpm
KQT-33K6-4-1769-1A, mini-AP buck flow calibrator M30B
Flow Meter for Liquid
Up to 1000 lpm
(0.0015V) lpm + 4.2 lpm
KQT-33K6-4-1769-1A, flow rate rig, magnetic flowmeter
(A2LA Cert. No. 4184.01) 03/26/2021 Page 13 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Viscosity Meter
(100 to 200 000) cP
1.5 %
KQT-17-20MV-01 standard solution
Burets
(100 to 1000) µL (1 to 10) mL (10 to 500) mL
1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight E2 + balance
Pipettes
(10 to 100) µL (100 to 1000) µL (1 to 10) mL (10 to 500) mL
5.2 mL/L 1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight E2 + standard scale
Volumetric Flasks
(0 to 1000) mL (1000 to 5000) mL
0.17 mL/L 0.14 mL/L
KQT-VO-01, standard weight E2 + standard scale
VII. Mechanical
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Balances and Scales3 Class I and II Class III and IV
(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 6 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 150) kg (150 to 2000) kg
0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 68 g 130 g 0.41 kg
KQT-BA-01, OIML R76-1 standard weights
Durometer – Spring Force Type A – B – O Type C – D – DO
Up to 4.5 kg Up to 4.5 kg
0.5 % 0.1 %
KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight E2 + standard scale
(A2LA Cert. No. 4184.01) 03/26/2021 Page 14 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Force Tester3
Up to 98 kN Up to 2 kgf Up to 10 000 kgf
0.25 % 0.06 % 0.25 %
KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 + load cell
Hardness Testers3 – Indirect Verification of Rockwell Hardness Testers
HRBW: Medium High HRC: Medium High
0.93 HRBW 0.92 HRBW 0.5 HRC 1.1 HRC
DLVN 63:2000, manufacturer’s manual, indirect verification per ASTM E18 using hardness standard
Hardness Testers3 – Indirect Verification of Vickers Hardness Testers
285 HV 502 HV 700 HV
7.1 HV 13 HV 18 HV
DLVN 63:2000, manufacturer’s manual
Mass/Weights Class F1, F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2, and M3
(1 to 500) g (0.5 to 5) kg (5 to 20) kg
0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.0084 mg/g
KQT-SW-01, OIML R111-1, standard weight E2 + standard scale
Particle Counter3/Dust Monitor
(0.3 to 10) µm (0.001 to 10.000) mg/m3
13 % 13 %
KQT-LCP-2800, particle counter digital dust monitor
(A2LA Cert. No. 4184.01) 03/26/2021 Page 15 of 45
Parameter/Equipment
Range
CMC2, 5, 7 (±)
Comments
Pressure – Measuring Equipment3 Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/Manometer
(-12 to 300) psi Up to 10 000 psi (4 to 20) mA Up to 1100 hPa
0.06 % 0.7 % 0.06 %
DLVN 76: 2001, KQT-17-20MP-06, KLC source procedure, Fluke 718 Seri + module + Fluke 1G
Surface Roughness and Surface Roughness Testers3
0.48 µm 2.97 µm 3.02 µm
0.7 µm 0.9 µm 0.7 µm
KQT-33K6-4-2021-1, manufacturer’s manual, Mitutoyo 178-602 + Federal reference standard
Tachometers – (Clockwise only)
Up to 5000 rpm
1.5 rpm
KQT-17-20MA-03, Ideal 1790
Torque Drivers and Wrenches3
Up to 2000 N·m
1.3 %
KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100, Insize IST-2200 N·m
Torque Analyzers
Up to 10 N·m
0.13 %
DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights
Vibration Meter3 – Acceleration Velocity Displacement Frequency
10 m/s2 10 mm/s 10 µm 159.2 Hz
0.37 m/s2 0.48 mm/s 0.83 µm 1.8 Hz
KQT-33K1-4-19-1, vibration standard
(A2LA Cert. No. 4184.01) 03/26/2021 Page 16 of 45
VIII. Optical
Parameter/Equipment
Range
CMC2, 5, 6, 7 (±)
Comments
Nominal Illumination3 – Measure and Measuring Equipment
(10 to 100) lux (100 to 1000) lux (1000 to 20 000) lux
2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux
KQT-33K4-4-475-1, Chroma CL-200A
Chroma Meter
(X, Y, L, A, B)
0.08°
Manufacturer’s manual KQT-CH-01 color standard
UV/Vis Spectrometer
(190 to 1100) nm (0 to 2) Abs
0.24 nm 0.0043 Abs
KQT-SP-01, DLVN 91:2001, ASTM E - 925 spectrometer Cal standard
X-Ray Analyzer
As: 0.0017 % Au: 0.26 µm Br: 0.143 % Cd: 0.0146 % Cl: 0.038 % Cr: 0.004 51 % Cu: 9.2 µm Hg: 0.000 99 % Ni: 9.6 µm Pb: 0.006 97 % S: 0.064 % Sb: 0.0086 % Sn: 0.0099 % Zn: 0.117 %
As: 0.000 12 % Au: 0.06 µm Br: 0.008 % Cd: 0.005 % Cl: 0.006 % Cr: 0.000 19 % Cu: 0.5 µm Hg: 0.000 085 % Ni: 0.5 µm Pb: 0.000 25 % S: 0.01 % Sb: 0.0007 % Sn: 0.0006 % Zn: 0.004 %
Manufacturer’s manual KQT-XRF-01 low-density polyethylene standard X-ray thickness standard (Au, Cu, Ni)
Radiometer
Up to 500 mW/cm2
6.8 %
KQT-33K4-4-576-1, manufacturer’s manual, lumen dynamics R2000
Gloss Meter3
(20-60-85)°
1.3 GU
KQT-GL-01, manufacturer’s manual, standard gloss
(A2LA Cert. No. 4184.01) 03/26/2021 Page 17 of 45
VIII. Thermodynamics
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Temperature/Humidity Meter – Humidity Temperature
(0 to 90) % RH (-40 to 70) ºC
2.0 % RH 0.5 ºC
KQT-33K5-4-84-1 JIEO tech TH-ME JIEO tech TH-KE 065 + Data logger Vaisala HMP75 Vaisala HMI41
Temperature – Measure3
(-40 to -25) ºC (-25 to 300) ºC (300 to 650) ºC (650 to 1600) ºC
0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC
KQT-CG-13, manufacturer’s manual, Fluke 9142 + Fluke 5609 + Fluke 725 (Keithley 740) + Type K, S + LK LAB LC LT408
Thermometer and Temperature Meter3
(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC
0.012 ºC 0.15 ºC 0.4 ºC
KQT-33K5-4-42-1, DLVN 137 and 138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB – LC LT408
IR Temperature – Measuring Instruments3
(-18 to 150) ºC (150 to 982) ºC
1.6 ºC 1.3 ºC
KQT-33K4-4-615-1, DLVN 124:2003, Omega BB701 + BB-4A
Chamber/Dry Oven3 – Humidity Temperature
(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C
1.9 % RH 2.5 % RH 0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 Data logger + Vaisala HMI110
Steam Sterilizer & Autoclave
(-40 to 140) °C (0 to 5) bar
0.16 °C 0.06 bar
KQT-AC-01 temperature and pressure data logger
(A2LA Cert. No. 4184.01) 03/26/2021 Page 18 of 45
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Liquid Bath3
(-50 to 200) °C (200 to 400) °C
0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 data logger
IX. Time & Frequency
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Frequency – Measure3
0.1 Hz to 12.4 GHz
2.3 parts in 108 Hz
KLC source procedure, manufacturer’s manual: Agilent 53132A
Frequency – Measuring Instruments3
1 Hz to 80 MHz 10 MHz to 26.5 GHz
14 parts in 106 Hz 6.5 parts in 108 Hz
KLC source procedure, manufacturer’s manual: Agilent 33250A, Agilent 8340B
Stopwatch & Timer
Up to 10 800 seconds
0.037 seconds
KQT-ST&T -01 Universal frequency counter
(A2LA Cert. No. 4184.01) 03/26/2021 Page 19 of 45
SATELLITE LABORATORY
KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. 11 Huu Nghi Blvd.
VSIP Bac Ninh, Phu Chan Commune, Tu Son Town, Bac Ninh VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 8 6281 8479
CALIBRATION I. Acoustical
Parameter/Equipment
Range
CMC2 (±)
Comments
Sound Level Meter – (@ 1 kHz)3
(94 and 114) dB
0.59 dB
KQT-33K3-4-2911-1, BK Cal 73
II. Chemical
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Conductivity Meter3
1 µS/cm 100 µS/cm 1413 µS/cm
0.25 µS/cm 2.2 µS/cm 5.5 µS/cm
KQT-CD-01 manufacturer’s manual, standard solution
pH Meter3
4.01 pH 7.00 pH 10.00 pH
0.021 pH 0.021 pH 0.021 pH
KQT-17-20SC-42 manufacturer’s manual, standard solution
Refractometer3
(5 to 85) % Brix Up to 10 % Salinity
0.13 % Brix 0.12 % Salinity
KQT-RE-01, manufacturer’s manual, Hanna HI96801
Turbidity Meter3
(15 to 750) NTU
3.8 % + 0.02 NTU
KQT-TU-01 manufacturer’s manual, Hanna HI98703
(A2LA Cert. No. 4184.01) 03/26/2021 Page 20 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
TDS Meter3
0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS
0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS
KQT-CD-01 reference conductivity standard solution
Hydrometer
(0.600 to 2.000) g/cm3
0.003 g/cm3
DLVN 293: 2016, manufacturer’s manual standard hydrometers
Alcoholmeter
Up to 100 % V
0.4 % V
DLVN 106: 2012 manufacturer’ manual standard alcoholmeter
Gas Detectors H2S CO CH4 C4H8 C4H8 O2 O2 CO2 CO2 NH3 NO2 C2H4 SO2
0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %
6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %
KQT-17-20SY-06, manufacturer’s manual, standard gas
III. Dimensional
Parameter/Equipment
Range
CMC2 (±)
Comments
Calipers3
Up to 1000 mm
0.005 mm/m + 0.008 mm
KQT-33K6-4-552-1, gauge block grade 0 + 1, caliper checker
(A2LA Cert. No. 4184.01) 03/26/2021 Page 21 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Coordinate Measuring Machines (CMM)3 – 3-Axis Linearity Only
X: (10 to 900) mm Y: (10 to 900) mm Z: (10 to 500) mm
19 µm/m 19 µm/m 19 µm/m
Manufacturer’s manual, gauge block grade 0 + 1
Depth Gages3
Up to 1000 mm
0.017 mm/m + 0.007 mm
KQT-33K6-4-17-1, gauge block grade 0 +1
Dial Indicator3
Up to 200 mm
0.01 mm/m + 1.7 µm
KQT-IN-01, gauge block grade 0 +1
Dial Test Indicator3
Up to 1 mm
0.006 mm/m + 1.1 µm
KQT-IN-01, Mitutoyo UDT-3
Dial Bore Gages3
Up to 500 mm
0.01 mm/m + 1.7 µm
KQT-IN-01, gauge block grade 0 +1
Gage Blocks3
(1 to 10) mm (10 to 100) mm (100 to 250) mm
0.31 µm 0.0049 mm/m + 0.3 µm 0.0057 mm/m + 0.8 µm
KQT-33K6-4-1-1, Pratt & Whitney B
Height Gages3
Up to 900 mm
0.026 mm/m + 0.6 µm
KQT-33K6-4-1626-1, gauge block grade 0 +1
Micrometers3
Up to 1000 mm
0.024 mm/m + 1 µm
KQT-33K6-4-15-1, gauge block grade 0 +1
Microscope – Measuring3
Up to 300 mm
0.004 mm/m + 2.5 µm
KQT-33K6-4-1268-1, manufacturer’s manual, KLC source procedure, standard glass scale
(A2LA Cert. No. 4184.01) 03/26/2021 Page 22 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Pin/Plug Gages3
Up to 100 mm
0.0048 mm/m + 0.33 µm
KQT-33K6-4-121-1, Pratt & Whitney B
Profile Projector/Optical Comparator3
Up to 500 mm
0.003 mm/m + 2.3 µm
KQT-33K6-4-1268-1, manufacturer’s manual, KLC source procedure, standard glass scale
Surface Plate Flatness – Repeatability Only3, 4
[(12 x 12) to (48 x 96)] in
50 µin
KQT-17-20MD-14, repeat-o-zero
Thickness Gages3
Up to 12 mm
0.67 µm
KQT-TH-01, gauge block grade 0 + 1
Holtest
(6 to 75) mm
0.012 mm/m + 0.8 µm
KQT-HT-01 setting ring
Distance & Length Measuring Instruments
Up to 50 m
0.003 m
KQT-D&L-01 laser distance meter
(A2LA Cert. No. 4184.01) 03/26/2021 Page 23 of 45
IV. Electrical – DC/Low Frequency
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Current – Generate3 (0 to 2.2) mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (1.5 to 11) A (11 to 500) A
(20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (20 to 40) Hz 40 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 20 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz 45 Hz to 65 Hz 65 Hz to 500 Hz (0.5 to 1) kHz 45 Hz to 1 kHz
0.2 mA/A + 0.035 µA 0.2 mA/A + 0.035 µA 0.2 mA/A + 0.11 µA 1.5 mA/A + 0.65 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.35 µA 0.2 mA/A + 0.55 µA 1.4 mA/A + 5 µA 0.2 mA/A + 3.5 µA 0.2 mA/A + 2.5 µA 0.2 mA/A + 3.5 µA 1.3 mA/A + 10 µA 0.3 mA/A + 35 µA 0.5 mA/A + 80 µA 8.5 mA/A + 160 µA 0.8 mA/A + 2 mA 1.2 mA/A + 2 mA 3.8 mA/A + 2 mA 0.6 mA/A + 100 mA
KQT-17-20AQ-101, KLC source procedure manufacturer’s manual, Fluke 5720A + 5500A Fluke 5720A + 5500A w/ coil
(A2LA Cert. No. 4184.01) 03/26/2021 Page 24 of 45
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Current – Measure3 (5 to 100) μA 100 μA to 10 mA (10 to 100) mA 100 mA to 1 A Up to 500 A
(10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (50 to 1000) Hz
4.6 mA/A + 0.03 µA 1.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 0.7 mA/A + 0.03 µA 4.6 mA/A + 0.2 µA 1.7 mA/A + 0.2 µA 0.7 mA/A + 0.2 µA 0.4 mA/A + 0.2 µA 4.6 mA/A + 20 µA 1.7 mA/A + 20 µA 0.7 mA/A + 20 µA 0.4 mA/A + 20 µA 4.6 mA/A + 0.2 mA 1.9 mA/A + 0.2 mA 0.97 mA/A + 0.2 mA 1.2 mA/A + 0.2 mA 3.1 mA/A
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A HP 3458A + high voltage divider
AC Voltage – Generate3 (0 to 220) mV 220 mV to 2.2 V (2.2 to 22) V (22 to 220) V
40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 1000) kHz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz
0.11 mV/V + 7 µV 0.26 mV/V + 7 µV 0.59 mV/V + 17 µV 1.1 mV/V + 20 µV 3.4 mV/V + 45 µV 0.06 mV/V + 8 µV 0.10 mV/V + 10 µV 0.14 mV/V + 30 µV 0.52 mV/V + 80 µV 2.1 mV/V + 0.3 mV 0.06 mV/V + 0.05 mV 0.10 mV/V + 0.1 mV 0.13 mV/V + 0.2 mV 0.35 mV/V + 0.6 mV 1.9 mV/V + 3.2 mV 0.07 mV/V + 0.6 mV 0.10 mV/V + 1 mV 0.14 mV/V + 2.5 mV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 25 of 45
Parameter/Range
Frequency
CMC2, 6 (±)
Comments
AC Voltage – Generate3 220 V to 1.1 kV
50 Hz to 1 kHz
0.09 mV/V + 3.5 mV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A
AC Voltage – Measure3 (0 to 10) mV (10 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V 100 V to 1 kV
10 Hz to 20 kHz 40 Hz to 1 kHz 40 Hz to 1 kHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (50 to 100) kHz 10 Hz to 20 kHz 40 Hz to 1 kHz
2.8 mV/V + 0.04 mV 0.2 mV/V + 2 μV 0.1 mV/V + 20 μV 0.8 mV/V + 0.4 mV 0.1 mV/V + 0.2 mV 0.2 mV/V + 0.2 mV 1.0 mV/V + 0.2 mV 0.2 mV/V + 2 mV 0.5 mV/V + 20 mV
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A
Parameter/Equipment
Range
CMC2, 6 (±)
Comments
Capacitance – Generate3 (@ 1 kHz)
(330 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 11) µF (11 to 33) µF (33 to 110) µF (110 to 330) µF 330 µF to 1.1 mF
5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF 4.8 mF/F + 30 nF 6.1 mF/F + 0.1 µF 8.2 mF/F + 0.3 µF 12 mF/F + 0.3 µF
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5500A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 26 of 45
Parameter/Equipment
Range
CMC2, 5, 6 (±)
Comments
DC Current – Generate3
(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 2.2 A (2.2 to 11) A (11 to 500) A
110 μA/A + 6 nA 52 μA/A + 40 nA 69 μA/A + 0.7 µA 110 μA/A + 12 µA 710 μA/A + 330 µA 0.7 mA/A + 17 mA
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A + Coil 50
DC Current – Measure3
(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A
(1 to 2000) A
110 µA/A + 0.8 nA 49 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 6.6 mA/A + 1.5 mA
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 3458A HP 3458A + Shunt + Kyoritsu 2009R
DC Voltage – Generate3
(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V
14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV 11 µV/V + 0.7 mV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Fluke 5720A + 5500A
DC Voltage – Measure3
(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 10) kV
12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV 1.7 %
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual Fluke 8845A HP 3458A HP3458A + high voltage divider
Power Analyzer/ Meter3
Up to 10 kW
0.13 %
KQT-33K1-4-1683-1, KLC source procedure, manufacturer’s manual, Fluke 5500A
Resistance – Generate3
(0.001 to 1) Ω (1 to 100) Ω (0.1 to 10) kΩ 10 kΩ to 1 MΩ (1 to 100) MΩ
0.21 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 1.5 mΩ/Ω
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, standard resistance HARS-X-9-0.001 IET HRRS-B5-1M-5KV
(A2LA Cert. No. 4184.01) 03/26/2021 Page 27 of 45
Parameter/Equipment
Range
CMC2, 5, 6 (±)
Comments
Resistance – Measure3
(0 to 10) Ω (10 to 100) Ω 100 Ω to 1 kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ
0.03 mΩ/Ω + 0.05 mΩ 0.017 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 5 mΩ 0.016 mΩ/Ω + 50 mΩ 0.029 mΩ/Ω + 2 Ω 0.073 mΩ/Ω + 100 Ω
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 3458A
Oscilloscopes3 Square Wave Signal 10 Hz to 10 kHz Leveled Sine Wave Time Markers
1.8 mV to 105 Vp-p 50 kHz to 100 MHz (100 to 300) MHz 5 s to 100 µs (50 to 2) µs 1 µs to 20 ns (10 to 2) ns
16 mV/V + 0.1 mV 0.3 mHz/Hz 2 mHz/Hz 6.9 ms/s 17 ms/s 14 ms/s 1.8 ms/s
KQT-CG-7, KLC source procedure, manufacturer’s manual, Fluke 5500A
Gauss Meters3
3 mT 50 mT 300 mT
2.3 % 2.8 % 3.5 %
KQT-33K1-4-1658-1 manufacturer’s manual magnetic tool
Hipot/Withstanding Testers3
(0 to 20) kV (0 to 100) mA
1.7 % 1.4 %
KQT-33K1-4-181-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + TOS 1200 + Tektronix P6015A
Insulation Testers3
Up to 10 kV Up to 200 MΩ (0.2 to 100) GΩ
1.1 % 0.2 % 1.9 %
KQT-33K2-4-33-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + standard resistance
LCR Meters3
Up to 200 MΩ Up to 1000 F (1 to 900) mH
0.4 % 0.14 % 2.3 %
KQT-33K1-4-1260-1, KLC source procedure, manufacturer’s manual, LCR standard
(A2LA Cert. No. 4184.01) 03/26/2021 Page 28 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Metal Detector3 – Ferrous Brass
(0.5 to 2.0) mm (0.4 to 2.0) mm
0.0009 mm 0.0009 mm
KQT-ME-01, manufacturer’s manual, precision balls
V. Electrical – RF/Microwave
Parameter/Range
Frequency
CMC2 (±)
Comments
RF Power – Measuring Instruments3 (-70 to 20) dBm (-30 to 20) dBm
100 kHz to 18 GHz 50 MHz to 26.5 GHz
0.54 dBm 0.39 dBm
KQT-33K4-4-715-1, KLC source procedure, manufacturer’s manual, HP 8340B monitored w/ Agilent N1911A w/ 8485A or E4412A
RF Power – Measure3 (-70 to 20) dBm (-30 to 20) dBm
100 kHz to 18 GHz 50 MHz to 26.5 GHz
0.54 dBm 0.39 dBm
KQT-33K4-4-105-1, KLC source procedure, manufacturer’s manual, Agilent N1911A w/ E4412A or 8485A
VI. Fluid Quantities
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Air Speed/Velocity – Measuring Equipment
Up to 30 m/s
0.21 m/s
KQT-33K6-4 1769-1, velocity standard
(A2LA Cert. No. 4184.01) 03/26/2021 Page 29 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Air/Mass Flow Meters3
(0.1 to 1) lpm (>1 to 30) lpm (>30 to 2500) lpm
0.03 % lpm 1.7 % lpm 2.3 % lpm
KQT-33K6-4-1769-1A, mini-AP Buck flow calibrator M30B flow rate standard meter magnetic flowmeter
Viscosity Meter
(100 to 200 000) cP
1.5 %
KQT-17-20MV-01 standard solution
Burets
(100 to 1000) µL (1 to 10) mL (10 to 500) mL
1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight E2 + balance
Pipettes
(10 to 100) µL (100 to 1000) µL (1 to 10) mL (10 to 500) mL
5.2 mL/L 1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight E2 + standard scale
Volumetric Flasks
(0 to 1000) mL (1000 to 5000) mL
0.17 mL/L 0.14 mL/L
KQT-VO-01, standard weight E2 + standard scale
VII. Mechanical
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Durometer – Spring Force Type A – B – O Type C – D – DO
Up to 4.5 kg Up to 4.5 kg
0.5 % 0.1 %
KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight E2 + standard scale
(A2LA Cert. No. 4184.01) 03/26/2021 Page 30 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Balances and Scales3 – Class I and II Class III and IV
(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 6 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 150) kg (150 to 2000) kg
0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 68 g 130 g 0.41 kg
KQT-BA-01, OIML R76-1 standard weight
Force Tester3
Up to 98 kN Up to 2 kgf Up to 10 000 kgf
0.25 % 0.08 % 0.25 %
KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 + load cell
Hardness Testers3 – Indirect Verification of Rockwell Hardness Testers
HRBW: Medium High HRC: Medium High
0.93 HRBW 0.92 HRBW 0.5 HRC 1.1 HRC
DLVN 63:2000, manufacturer’s manual, Indirect verification per ASTM E18 using hardness standard
Hardness Testers3 – Indirect Verification of Vickers Hardness Testers
285 HV 502 HV 700 HV
7.1 HV 13 HV 18 HV
DLVN 63:2000, manufacturer’s manual
(A2LA Cert. No. 4184.01) 03/26/2021 Page 31 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Mass/Weights – Class F1, F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2 and M3
(1 to 500) g (0.5 to 5) kg (5 to 20) kg
0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.0084 mg/g
KQT-SW-01, OIML R111-1, standard weight E2 + standard scale
Particle Counter3/Dust Monitor
(0.3 to 10) µm (0.001 to 10.000) mg/m3
13 % 13 %
KQT-LCP-2800, particle counter digital dust monitor
Pressure3 – Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/ Manometer
(-12 to 300) psi Up to 10 000 psi (4 to 20) mA Up to 1100 hPa
0.06 % 0.7 % 0.06 %
DLVN 76: 2001, KQT-17-20MP-06, KLC source procedure, Fluke 718 Seri + module + Fluke 1G
Surface Roughness and Surface Roughness Testers3
2.97 µm 18.9 µin 119.5 µin
0.9 µm 5 µin 5 µin
KQT-33K6-4-2021-1, manufacturer’s manual, Mitutoyo 178-602 + federal reference standard
Torque Drivers and Wrenches3
Up to 2000 N·m
1.2 %
KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100
Torque Analyzers
Up to 350 N·m
0.13 %
DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights, insize IST-2200 N·m
(A2LA Cert. No. 4184.01) 03/26/2021 Page 32 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Vibration Meter3 – Acceleration Velocity Displacement Frequency
10 m/s2 10 mm/s 10 µm 159.2 Hz
0.37 m/s2 0.48 mm/s 0.83 µm 1.8 Hz
KQT-33K1-4-19-1, vibration standard
VIII. Optical
Parameter/Equipment
Range
CMC2, 5, 7 (±)
Comments
Nominal Illumination3 – Measure and Measuring Equipment
(10 to 100) lux (100 to 1000) lux (1000 to 20 000) lux
2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux
KQT-33K4-4-475-1, Chroma CL-200A
Radiometer
Up to 500 mW/cm2
6.8 %
KQT-33K4-4-576-1, manufacturer’s manual, lumen dynamics R2000
UV/Vis Spectrometer
(190 to 1100) nm (0 to 2) Abs
0.24 nm 0.0043 Abs
KQT-SP-01, DLVN 91:2001, ASTM E - 925 spectrometer calibration standard
X-ray Analyzer
As: 0.0017 % Au: 0.026 µm Br: 0.143 % Cd: 0.0146 % Cl: 0.038 % Cr: 0.004 51 % Cu: 9.2 µm Hg: 0.000 99 % Ni: 9.6 µm Pb: 0.006 97 % S: 0.064 % Sb: 0.0086 % Sn: 0.0099 % Zn: 0.117 %
As: 0.000 12 % Au: 0.06 µm Br: 0.008 % Cd: 0.005 % Cl: 0.006 % Cr: 0.000 19 % Cu: 0.5 µm Hg: 0.000 085 % Ni: 0.5 µm Pb: 0.000 25 % S: 0.01 % Sb: 0.0007 % Sn: 0.0006 % Zn: 0.004 %
KQT-XRF-01 low-density polyethylene standard, x-ray thickness standard (Au, Cu, Ni)
(A2LA Cert. No. 4184.01) 03/26/2021 Page 33 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Gloss Meter3
(20-60-85)°
1.3 GU
KQT-GL-01, manufacturer’s manual, standard gloss
Chroma Meter
(X, Y, L, A, B)
0.08°
Manufacturer’s manual KQT-CH-01 color standard
IX. Thermodynamics
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Temperature/Humidity Meter –
Humidity Temperature
(0 to 90) % RH (-40 to 70) ºC
2.0 % RH 0.5 ºC
KQT-33K5-4-84-1 JIEO tech TH-KE 065 + Data logger + Vaisala HMI41 Vaisala HMP75
Temperature – Measure3
(-40 to -25) ºC (-25 to 300) ºC (300 to 650) ºC (650 to 1600) ºC
0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC
KQT-CG-13, manufacturer’s manual, Fluke 9142 + Fluke 5609 + Fluke 725 (Keithley 740) + Type K, S + LK LAB – LC LT408
Thermometer and Temperature Meter3
(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC
0.35 ºC 0.16 ºC 0.4 ºC
KQT-33K5-4-42-1, DLVN 137&138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB – LC LT408
IR Temperature – Measuring Instruments3
(-18 to 150) ºC (150 to 982) ºC
1.6 ºC 1.3 ºC
KQT-33K4-4-615-1, DLVN 124:2003, Omega BB701 + BB-4A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 34 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Chamber/Dry – Oven3 Humidity Temperature
(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C
1.9 % RH 2.5 % RH 0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 Data logger + Vaisala HMI110
Steam Sterilizer & Autoclave
(-40 to 140) °C (0 to 5) bar
0.16 °C 0.06 bar
KQT-AC-01 temperature and pressure datalogger
Liquid Bath
(-50 to 200) °C (200 to 400) °C
0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 data logger
X. Time & Frequency
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Frequency – Measure3
0.1 Hz to 12.4 GHz
2.3 parts in 108 Hz
KLC source procedure, manufacturer’s manual: Agilent 53132A
Frequency – Measuring Instruments3
1 Hz to 80 MHz 10 MHz to 26.5 GHz
14 parts in 106 Hz 6.5 parts in 108 Hz
KLC source procedure, manufacturer’s manual: Agilent 33250A Agilent 8340A
Stopwatch & Timer
Up to 10 800 seconds
0.037 seconds
KQT-ST&T -01 universal frequency counter
(A2LA Cert. No. 4184.01) 03/26/2021 Page 35 of 45
SATELLITE LABORATORY
KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. #259, Pham Hung Street
Hoa Xuan Ward, Cam Le District, Da Nang City VIETNAM
Tran Minh Cuong (Kevin) Phone: 84 8 6281 8479
CALIBRATION
I. Acoustical
Parameter/Equipment
Range
CMC2 (±)
Comments
Sound Level Meter – (@ 1 kHz)3
(94 and 114) dB
0.59 dB
KQT-33K3-4-2911-1, BK Cal 73
II. Chemical
Parameter/Equipment
Range
CMC2 (±)
Comments
Conductivity Meter3
1 µS/cm 100 µS/cm 1413 µS/cm
0.25 µS/cm 2.2 µS/cm 5.5 µS/cm
KQT-CD-01 manufacturer’s manual, standard solution
pH Meter3
4.01 pH 7.00 pH 10.00 pH
0.021 pH 0.021 pH 0.021 pH
KQT-17-20SC-42 manufacturer’s manual, standard solution
Hydrometer
(0.600 to 2.000) g/cm3
0.003 g/cm3
DLVN 293: 2016, manufacturer’s manual standard hydrometers
(A2LA Cert. No. 4184.01) 03/26/2021 Page 36 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Refractometer3
(5 to 85) % Brix Up to 10 % Salinity
0.13 % Brix 0.12 % Salinity
KQT-RE-01 manufacturer’s manual, Hanna HI96801
TDS Meter3
0.000 066 % TDS 0.0066 % TDS 0.0933 % TDS
0.000 0013 % TDS 0.000 02 % TDS 0.000 29 % TDS
KQT-CD-01 reference conductivity standard solution
Alcoholmeter
Up to 100 % V
0.4 % V
DLVN 106:2012 manufacturer’ manual standard alcoholmeter
Viscosity Meter
(100 to 200 000) cP
1.5 %
KQT-17-20MV-01 standard solution
Gas Detectors H2S CO CH4 C4H8 C4H8 O2 O2 CO2 CO2 NH3 NO2 C2H4 SO2
0.0025 % 0.0050 % 50 % LEL 0.001 % 0.01 % 12 % 20.9 % 2 % 0.2 % 0.0025 % 0.0005 % 0.001 % 0.001 %
6.6 % 2.7 % 2.8 % 2.3 % 2.3 % 2.4 % 2.3 % 2.3 % 2.3 % 5.8 % 12 % 12 % 12 %
KQT-17-20SY-06, manufacturer’s manual, standard gas
(A2LA Cert. No. 4184.01) 03/26/2021 Page 37 of 45
III. Dimensional
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Calipers3
Up to 500 mm
0.005 mm/m + 0.008 mm
KQT-33K6-4-552-1, gauge block grade 0 + 1, caliper checker
Depth Gages3
Up to 500 mm
0.017 mm/m + 0.007 mm
KQT-33K6-4-17-1, gauge block grade 0 +1
Dial Indicator3
Up to 200 mm
0.01 mm/m + 1.7 µm
KQT-IN-01, gauge block grade 0 +1
Distance & Length Measuring Instruments
Up to 50 m
0.003 m
KQT-D&L-01 laser distance meter
Holtest
(6 to 75) mm
0.012 mm/m + 0.8 µm
KQT-HT-01 setting ring
Height Gages3
Up to 500 mm
0.026 mm/m + 0.6 µm
KQT-33K6-4-1626-1, gauge block grade 0 +1
Micrometers3
Up to 500 mm
0.024 mm/m + 1 µm
KQT-33K6-4-15-1, gauge block grade 0 +1
Surface Plate Flatness – Repeatability Only3, 4
[(12 x 12) to (48 x 96)] in
50 µin
KQT-17-20MD-14, repeat-o-zero
Thickness Gages/Feeler Gages and Thickness Films3
Up to 50 mm
0.1 mm/m + 0.8 µm
KQT-TH-01, gauge block grade 0 +1
(A2LA Cert. No. 4184.01) 03/26/2021 Page 38 of 45
Parameter/Equipment
Range
CMC2 (±)
Comments
Microscope, Measuring3 Profile Projector/Optical Comparator3
Up to 500 mm
0.004 mm/m + 2.5 µm
KQT-33K6-4-1268-1, manufacturer’s manual, KLC source procedure, standard glass scale
IV. Electrical – DC/Low Frequency
Parameter/Equipment
Range
CMC2, 6 (±)
Comments
DC Current – Generate3
(0 to 220) μA 220 μA to 22 mA (22 to 220) mA 220 mA to 1 A
110 μA/A + 6 nA 52 μA/A + 40 nA 70 μA/A + 0.7 µA 110 μA/A + 12 µA
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Keithley 2450
DC Current – Measure3
(0 to 100) μA 100 μA to 1 mA (1 to 10) mA (10 to 100) mA (0.1 to 3) A (3 to 100) A
110 µA/A + 0.8 nA 50 µA/A + 5 nA 47 µA/A + 50 nA 67 µA/A + 0.5 µA 150 µA/A + 10 µA 7.2 mA/A
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 34401A HP 34401A w/ L&N 4361 Shunt
DC Voltage – Generate3
(0 to 220) mV 220 mV to 2.2 V (2.2 to 11) V (11 to 22) V (22 to 200) V
14 µV/V + 0.7 µV 8.1 µV/V + 1.4 µV 5.6 µV/V + 5 µV 5.6 µV/V + 9 µV 8.1 µV/V + 90 µV
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, Keithley 2450
DC Voltage – Measure3
(0 to 100) mV 100 mV to 1V (1 to 10) V (10 to 100) V (100 to 1000) V
12 µV/V + 0.35 µV 9.3 µV/V + 0.4 µV 9.3 µV/V + 1 µV 12 µV/V + 40 µV 12 µV/V + 0.15 mV
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual HP 34401A
(A2LA Cert. No. 4184.01) 03/26/2021 Page 39 of 45
Parameter/Equipment
Range
CMC2, 5, 6 (±)
Comments
Capacitance – Generate3 (@ 1 kHz)
(100 to 500) pF (0.5 to 1.1) nF (1.1 to 3.3) nF (3.3 to 11) nF (11 to 33) nF (33 to 110) nF (110 to 330) nF 330 nF to 1.1 µF (1.1 to 3.3) µF (3.3 to 10) µF
5.2 mF/F + 10 pF 1.4 mF/F + 10 pF 1.2 mF/F + 10 pF 1.5 mF/F + 10 pF 3.1 mF/F + 100 pF 3.2 mF/F + 100 pF 3.1 mF/F + 300 pF 3.4 mF/F + 1 nF 4.2 mF/F + 3 nF 4.5 mF/F + 10 nF
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, decade capacitor AEMC-BC05
Resistance – Generate3
(0.001 to 1) Ω (1 to 100) Ω (0.1 to 10) kΩ 10 kΩ to 1 MΩ (1 to 100) MΩ
0.21 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 0.12 mΩ/Ω + 2 mΩ 1.5 mΩ/Ω
KQT-17-20AQ-101, KLC source procedure, manufacturer’s manual, standard resistance HARS-X-9-0.001 IET HRRS-B5-1M-5KV
Resistance – Measure3
(0 to 10) Ω (10 to 100) Ω 100 Ω to 1 kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ
0.03 mΩ/Ω + 0.05 mΩ 0.017 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 0.5 mΩ 0.015 mΩ/Ω + 5 mΩ 0.016 mΩ/Ω + 50 mΩ 0.029 mΩ/Ω + 2 Ω 0.073 mΩ/Ω + 100 Ω
KQT-17-20AH-06, KLC source procedure, manufacturer’s manual, HP 34401A
LCR Meters3
(0 to 200) MΩ (0 to 1000) pF (1 to 900) mH
0.4 % 0.14 % 2.3 %
KQT-33K1-4-1260-1, KLC source procedure, manufacturer’s manual, LCR standard
Power Analyzer/Meter3
Up to 10 kW
0.13 %
KQT-33K1-4-1683-1, KLC source procedure, manufacturer’s manual, Fluke 5500A
Metal Detector3 – Ferrous Brass
(0.6 to 2.5) mm (0.4 to 3.2) mm
0.0009 mm 0.0009 mm
KQT-ME-01, manufacturer’s manual, precision balls
(A2LA Cert. No. 4184.01) 03/26/2021 Page 40 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Hipot/Withstanding Testers3
(0.5 to 20) kV (0.5 to 100) mA
1.7 % 1.4 %
KQT-33K1-4-181-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + TOS 1200 + Tektronix P6015A
Insulation Testers3
(0 to 10) kV (0 to 200) MΩ (0.2 to 100) GΩ
1.1 % 0.2 % 1.6 %
KQT-33K2-4-33-1, KLC source procedure, manufacturer’s manual, Kikusui 149-10A + standard resistance
V. Fluid Quantities
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Air Speed/Velocity
Up to 30 m/s
0.21 m/s
KQT-33K6-4-1769-1, velocity standard
Viscosity Meter
(100 to 200 000) cP
1.5 %
KQT-17-20MV-01 standard solution
Burets
(100 to 1000) µL (1 to 10) mL (10 to 400) mL
1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight F1 + balance
Pipettes
(100 to 1000) µL (1 to 10) mL (10 to 400) mL
1.1 mL/L 0.2 mL/L 0.1 mL/L
KQT-VO-01, standard weight F1 + balance
Volumetric Flasks
(0 to 1000) mL (1000 to 4000) mL
0.17 mL/L 0.14 mL/L
KQT-VO-01, standard weight F1 + standard scale
(A2LA Cert. No. 4184.01) 03/26/2021 Page 41 of 45
VI. Mechanical
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Balances and Scales3 – Class II Class III and IV
(0 to 50) g (50 to 200) g (200 to 500) g 500 g to 2 kg (1 to 10) kg (10 to 50) kg (50 to 100) kg (100 to 300) kg
0.2 mg 1.4 mg 1.2 mg 15 mg 8.2 g 19 g 67 g 130 g
KQT-BA-01, OIML R76-1 standard weight
Durometer – Spring Force Type A – B – O Type C – D – DO
Up to 4.5 kg Up to 4.5 kg
0.5 % 0.1 %
KQT-33K6-4-1362-1, ASTM D2240 partial calibration, standard weight F1 + standard scale
Force Tester3
Up to 49 kN Up to 2 kgf Up to 5000 kgf
0.25 % 0.08 % 0.25 %
KQT-17-20MF-04, DLVN 109:2002, KLC source procedure, standard weight E2 +load cell
Mass/Weights – Class F2, M1, M2 and M3 Class F2, M1, M2 and M3 Class M1, M2 and M3
(1 to 500) g (0.5 to 10) kg (5 to 20) kg
0.2 mg + 1.7 mg/g 1.1 mg + 9.2 mg/g 0.03 g + 0.084 mg/g
KQT-SW-01, OIML R111-1, standard weight F1 + standard scale
(A2LA Cert. No. 4184.01) 03/26/2021 Page 42 of 45
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Pressure3 – Gauges/Pressure Switch/Safety Valve Pressure Transmitter Barometer/Manometer
(-12 to 300) psi Up to 10 000 psi (4 to 20) mA Up to 1100 hPa
0.06 % 0.7 % 0.06 %
DLVN 76: 2001, KQT-17-20MP-06, KLC source procedure, Fluke 718 Seri + module + Fluke 1G
Torque Drivers and Wrenches3
Up to 2000 N·m
1.3 %
KQT-33K6-4-2930-1, KLC source procedure, mount LTT-2100, Insize IST-2200 N·m
Torque Analyzers
Up to 10 N·m
0.13 %
DLVN 110:2002, KLC source procedure torque wheel with E2+M1+F1 weights
VII. Optical
Parameter/Equipment
Range
CMC2, 6, 7 (±)
Comments
Chroma Meter
(X, Y, L, A, B)
0.08°
Manufacturer’s manual KQT-CH-01 color standard
Nominal Illumination3 – Measure and Measuring Equipment
(10 to 100) lux (100 to 1000) lux (1000 to 20 000) lux
2.8 % + 0.1 lux 2.8 % + 1 lux 2.8 % + 10 lux
KQT-33K4-4-475-1, Chroma CL-200A
UV/Vis Spectrometer
(190 to 1100) nm (0 to 2) Abs
0.24 nm 0.0043 Abs
KQT-SP-01, DLVN 91:2001, ASTM E – 925 spectrometer calibration standard
(A2LA Cert. No. 4184.01) 03/26/2021 Page 43 of 45
Parameter/Equipment
Range
CMC2, 5, 7 (±)
Comments
X-ray Analyzer
As: 0.0017 % Au: 0.26 µm Br: 0.143 % Cd: 0.0146 % Cl: 0.038 % Cr: 0.004 51 % Cu: 9.2 µm Hg: 0.000 99 % Ni: 9.6 µm Pb: 0.006 97 % S: 0.064 % Sb: 0.0086 % Sn: 0.0099 % Zn: 0.117 %
As: 0.000 12 % Au: 0.06 µm Br: 0.008 % Cd: 0.005 % Cl: 0.006 % Cr: 0.000 19 % Cu: 0.5 µm Hg: 0.000 085 % Ni: 0.5 µm Pb: 0.000 25 % S: 0.01 % Sb: 0.0007 % Sn: 0.0006 % Zn: 0.004 %
Manufacturer’s manual KQT-XRF-01 low-density polyethylene standard, x-ray thickness standard (Au, Cu, Ni)
VIII. Thermodynamics
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
Temperature/Humidity Meter – Humidity Temperature
(0 to 90) % RH (-40 to 70) ºC
2.0 % RH 0.5 ºC
KQT-33K5-4-84-1 JIEO tech TH-KE 065 + Data logger + Vaisala HMI41 + Vaisala HMP75
Temperature – Measure3
(-40 to -25) ºC (-25 to 300) ºC (300 to 650) ºC (650 to 1300) ºC
0.012 ºC 0.07 ºC 0.6 ºC 1.8 ºC
KQT-CG-13, manufacturer’s manual, Fluke 725 + Type K Keithley 740 + LK LAB – LC LT408
Thermometer and Temperature Meter3
(-40 to -25) ºC (-25 to 150) ºC (150 to 650) ºC
0.35 ºC 0.15 ºC 0.4 ºC
KQT-33K5-4-42-1, DLVN 137&138: 2004, KLC source procedure, E instrument TCS650 + Fluke 9142 + Fluke 5609 + Fluke 725 + LK LAB - LC LT408
(A2LA Cert. No. 4184.01) 03/26/2021 Page 44 of 45
Parameter/Equipment
Range
CMC2, 7 (±)
Comments
IR Temperature – Measuring Instruments3
(-18 to 150) ºC (150 to 982) ºC
1.6 ºC 1.3 ºC
KQT-33K4-4-615-1, DLVN 124:2003, Omega BB701 + BB-4A
Chamber/Dry Oven3 – Humidity Temperature
(0 to 90) % RH (90 to 100) % RH (-50 to 200) °C (200 to 400) °C
1.9 % RH 2.5 % RH 0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 data logger + Vaisala HMI110
Steam Sterilizer & Autoclave
(-40 to 140) °C (0 to 5) bar
0.16 °C 0.06 bar
KQT-AC-01 temperature and pressure datalogger
Liquid Bath3
(-50 to 200) °C (200 to 400) °C
0.6 °C 1.2 °C
KQT-CHDO-2015 ASTM D 5374 -1999 data logger
____________________________________________
1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration.
3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.
4 Surface plate calibrations are only offered as a partial calibration that is limited to repeat readings that
reflect local variations in flatness, as agreed upon by the customer as documented during the contract negotiation process in compliance with ISO/IEC 17025:2017, section 7.1.
5 In the statement of the CMC, percentages are percent of reading, unless otherwise indicated. In the statement of the CMC, V is defined as volume measured.
(A2LA Cert. No. 4184.01) 03/26/2021 Page 45 of 45
6 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification.
7 The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.
8 This scope meets A2LA’s P112 Flexible Scope Policy.
For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.
Accredited Laboratory
A2LA has accredited
KIM LONG CALIBRATION AND TECHNOLOGIES CO. LTD. Ho Chi Minh City, VIETNAM
for technical competence in the field of
Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories. This laboratory also meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for a
defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
Presented this 30th day of March 2021 _______________________ Vice President, Accreditation Services For the Accreditation Council Certificate Number 4184.01 Valid to February 28, 2023