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SCientium Analyze Solutions Inspiring research inspiring you

Scientium Analyze Sloutions 831 Lane No. 9, Devi Nagar, Near Metro Piller No. 79,

New Sanganer Road, Sodala, Jaipur - 302019

M. No. - +91-9549651012

www.scientiumanalyze.com, scientifictesting@hotmail.com,

scientiumanalyze@gmail.com

Resolve your queries, it’s our priority

Scientium Analyze Solutions provides various sort of testing and

analysis services at single place. We respect the needs of our

customers and devoted towards swift, decisive outcomes while

keeping up its surely.

Our dedicated and protuberant expert team is passionate towards

resolving your every single issue regarding testing and analysis.

Despite the fact that you are not satisfied with results, our experts are

here to help you and comprehend your query.

In testing area, Scientium Analyze Solutions is performing a great

job in the field of materials characterization. Here, we are putting

forth the best testing facility on a solitary platform for all academics

and industrial customers with cost-effective and high striking

precision.

Highly experts of SAS team are doing first time on the map, analysis

of the tested specimens with remarkable accuracy. We are constantly

here to encourage with a wide range of materials analysis with the

priority of time. You can also discuss your inquiries unquestionable

with our exceedingly committed Scientium expert's team and can get

the precious and valuable solution.

TESTING

Synthesis Structural Analysis Compositional Analysis Electromagnetic Analysis Spectral Analysis Mechanical Analysis

Services at work for you…

C O N N E C T I N G Y O U R R E S E A R C H T O T H E T E C H N O L O G Y R E S O U R C E S Y O U N E E D

Synthesis

RF/ DC sputtering E- beam & Physical vapor deposition (PVD) Chemical vapor deposition (CVD) Low pressure chemical vapor deposition (LPCVD) Plasma enhanced chemical vapor depostion

(PECVD) Reactive ion etching (RIE)

Structural Analysis X-ray diffractometer (XRD) Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) Atomic force microscopy (AFM) Surface profilometer 3-D optical profiler Finite stress measurement (FSM) Scanning tunneling microscopy (STM) Magnetic force microscopy (MFM) Raman spectroscopy/PL

Compositional Analysis Energy dispersive Spectroscopy (EDS) X-ray photoelectron spectroscopy (XPS) Glow discharge spectroscopy (GDS) Atomic absorption spectroscopy (AAS) Mass spectroscopy

Electromagnetic Analysis

IV-probe station Impedance analyzer Scanning tunneling microscopy (STM) Magnetic force microscopy (MFM) Hall effect measurement Nuclear Magnetic resonance (NMR) Vibrating-sample magnetometer (VSM)

Spectral Analysis FTIR UV-Vis spectrometer Fluorescent spectrometer TGA

Mechanical Analysis DMA UTM Micro-hardness testing

XRD

Data profile fitting, Curve fitting, Curve smoothing, Baseline correction

Peak analysis (indexing), Element and compound analysis, hkl (phase) determination, Space group identification, and Phase quantification

Particle size analysis, Lattice strain measurement, mass absorption coefficient, and Lattice parameters

Rietveld refinement for single and multiphase

XPS

Data curve fitting, Curve smoothing, Baseline correction, Quantification (at %), Gaussian curve fitting and smoothing

Deconvolution of compounds/materials, Etched depth profile fitting for depth analysis

Information about the molecular environment (oxidation states, chemical states, covalently bonded atoms)

SPM

Surface morphology in 2D and 3D Performa, Particle analysis, Roughness calculation, Gaussian curve fitting, Depth analysis, Power spectral density analysis, Step size analysis by using Atomic Force Microscopy

Graphical representation of tunneling Current Voltage plot with the expelling of noise by Scanning Tunneling Microscopy

Nanoindentation data interpretation by evaluating various hardness parameters as spring constant, and total force

Our Eye-catching experts are delivering the study of Magnetic domain distribution on the sample surface as magnetic dipole-dipole interaction by using Magnetic Force Microscopy

ANALYSIS XRD XPS SPM TEM SEM Others

CUSTOM SOLUTIONS

Techno logy co nsult ing

provides a tota l end to end

so lut ion.

You ca n d iscuss yo ur inquir ies

unquest iona ble with our

exceedingly committed

Sc ient ium expert ' s team and

can get the precious and

va lua ble so lut io n. Yo u can

l ikewise carry o ut the fa c i l i t y

for manuscript

preparat ion with the proper

layout o f the f igures a n d p lots

in ma nuscr ipt by o ur technica l

experts.

TEM

Particle size measurement and Distribution curve

Grain size measurement and Distribution curve

Dislocations and Stacking Fault Density measurement

HR image indexing Polycrystalline SAED

pattern indexing Single crystal SAED

pattern indexing with phase identification

SEM

Particle size measurement and Distribution curve

Grain size measurement and Distribution curve

Flexible solutions for your research needs….

www.scientiumanalyze.com