S E E HARDNESS ASSURANCE TEST - Infineon … · IRUH3301A2AK Single-Event Test Report December 2009 International Rectifier currently does not have a DSCC approved Radiation Hardness

Product Device Package

MFG Type Type

Die MFG Wafer IRMFG Part # Number Part #

HoneyWell SSEC RIC3301 4

C02R279K-1

Penn State NA 2 C021520K

Bias 1:

Bias 2:

Bias 3:

Bias 4:

International Rectifier QF414Hi-Rel Products Associated Procedure: T030062G Rev. A

Finished Product Information

IR IRUH3301A2AK H916391Voltage Regulator FlatPack

Adj reg configured for a 3.3V output. Nominal input 5.0V

MFG LotNumber

MFGPart #

IMRNumber

69593

MFG LotNumber

31173_001

Serial number 86, 97, 87, 95 Vin =6.8V, Load =1.5A, Board 1. Temperature ~22C and >100C

08-05158

SERIAL NUMBERS TESTED PER BIAS TYPE

Bias 1 Conditions:

56635

DieTechnology

SOI CMOS IVBipolar Planar

Bias 3 Conditions: Serial number 43 and 28 Vin =6.8V, Load =2.75A, Serial number 62 and 52 Vin =6.8V, Load =0.06A, Board 2.

Temperature ~22C and >100C

Bias 2 Conditions:

ProductDescription

Die Information

Serial number 43 and 28 Vin =3.8V, Load =2.75A, Serial number 62 and 52 Vin =3.8V, Load =0.06A, Board 2. Temperature ~22C and >100C

Page 2

Bias 4 Conditions:

Serial number 86, 97, 87, 95 Vin =3.8V, Load =1.5A, Board 1.Temperature ~22C and >100C

S E E HARDNESS ASSURANCE TEST

Radiation Lot Assurance Test Rev. A

In-Flux:Yes

Serial Ion Beam LET Energy FluenceNumber Specie Type

86 Au 15A 85.4 2247 1.00E+0697 Au 15A 85.4 2247 1.00E+0695 Au 15A 85.4 2247 1.00E+0687 Au 15A 85.4 2247 1.00E+06

86 Kr 15A 27.8 1032 1.00E+0697 Kr 15A 27.8 1032 1.00E+0695 Kr 15A 27.8 1032 1.00E+0687 Kr 15A 27.8 1032 1.00E+06

86 Xe 15A 11.7 1512 1.00E+0697 Xe 15A 11.7 1512 1.00E+0695 Xe 15A 11.7 1512 1.00E+0687 Xe 15A 11.7 1512 1.00E+06

43 Au 15A 85.4 2247 1.00E+0628 Au 15A 85.4 2247 1.00E+0662 Au 15A 85.4 2247 1.00E+0652 Au 15A 85.4 2247 1.00E+06

43 Kr 15A 27.8 1032 1.00E+0628 Kr 15A 27.8 1032 1.00E+0662 Kr 15A 27.8 1032 1.00E+0652 Kr 15A 27.8 1032 1.00E+06

International Rectifier QF414Hi-Rel Products Associated Procedure: T030062G Rev. A

Test Method Test Specification Non -in-flux:JESD57 T09176G Yes

Page 3

1. A detailed log of each run is attached to this lot disposition on form QF416.

1.0E4 to 1.0E5 5

1.0E4 to 1.0E5 71.0E4 to 1.0E5 7

1.0E4 to 1.0E5 4

71.0E4 to 1.0E5

1.0E4 to 1.0E5 4

1.0E4 to 1.0E5 4

1.0E4 to 1.0E5 8

41.0E4 to 1.0E5

41.0E4 to 1.0E5 41.0E4 to 1.0E5

1.0E4 to 1.0E51.0E4 to 1.0E5

41.0E4 to 1.0E5

51.0E4 to 1.0E5

Flux RangeRUN SUMMARY1

1.0E4 to 1.0E5

Number of Runs

161.0E4 to 1.0E5 71.0E4 to 1.0E51.0E4 to 1.0E5

1.0E4 to 1.0E544

QF414

4

45

IRUH3301A2AK

Single-Event Test Report

December 2009

International Rectifier currently does not have a DSCC approved Radiation Hardness Assurance Program for MIL-PRF-38534.

SEE Test Report

IRU3301A2AK

December 2009

205 Crawford St, Leominster, Ma 01453 Tel: 976-534-5776 www.irf.com 2

Table of Contents

Introduction ………………………………………………. 3 Test Plan …………………………………………………. 4 Results ……………………………………………………. 5 Summary …………………………………………………..11 Conclusion………………………………………………….11 Appendix A – Transient Waveforms Appendix B – Electrical Data Appendix C – Test Plan Appendix D – Test Procedure Appendix F – Log Sheets

SEE Test Report

IRU3301A2AK

December 2009


INTRODUCTION

On December 15, International Rectifier Corp. (IR) tested the IRUH3301A2AK for Single Event Effects (SEE) hardness. The irradiation was performed at Texas A&M Cyclotron Test Facility. The SEE testing was conducted to determine the effects of various Ion species Gold (Au), Krypton (Kr) and Xenon (Xe) had on the IRUH3301A2AK Ultra Low Drop Adjustable Positive Linear Regulator. The testing conditions consisted of varying input voltages, resistive loads and temperature of the device in situ. The IRUH3301A2AK parts were soldered in place and had the recommend capacitance and layout conditions specified in the data sheet specification. The devices were exposed to the selected ion beams to characterize single event transients (SET) and determine if there will be any single event latch-ups (SEL) and single event burn out (SEB). The energy levels, Linear Energy Transfer (LET), and the range of penetration for all ion particles chosen are defined in the table shown below.

Ion Species

Ions Energy

(MeV) Angle (

o)

Effective LET

(MeV (mg/cm2))

Range in Si (μ)

84Kr 1032 0 27.8 134

129Xe 1512 0 51.5 120

197Au 2247 0 85.4 118

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IRU3301A2AK

December 2009


TEST PLAN The complete Test Plan is located in Appendix B. In summary, the SEE test plan varied the input voltage, load current and temperature of the device (table 1). The adjustable regulator was configured as a 3.3V nominal output.

Input Voltage

(V) Load Current (A) Device Case Temp

6.8 1.5 ~25C

3.8 1.5 ~25C

6.8 1.5 ~100C

3.8 1.5 ~100C

6.8 2.75 ~25C

3.8 2.75 ~25C

6.8 2.75 ~100C

3.8 2.75 ~100C

6.8 0.06 ~25C

3.8 0.06 ~25C

6.8 0.06 ~100C

3.8 0.06 ~100C

Table 1: Test Conditions Single Event Transient data was collected for each run, while the devices were being exposed to gold, krypton and xenon specie. Each device selected was tested at least twice to monitor both positive and negative transients. All transients greater than 50mV were counted and recorded. The 50mV threshold was due to a limitation of the Keithley 776 programmable counter device, but another factor was the noise level of the equipment and the surrounding area, which was between 20mV-30mV.

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December 2009


RESULTS All devices were tested to a maximum LET of 85.4 MeV and did not have any occurrence of single event latch-up (SEL) over the entire input voltage, load current and temperature conditions. During all SEE runs, none of the devices under exposure experienced any catastrophic event. Single Event Transient (SET) data shows a relationship between the input voltage and the amplitude of the transient. When the IRUH3301A2AK regulator’s input voltage was set to 6.8V, the amplitude of the transients were approximately 150mV. When the input voltage was set to 3.8V the transient’s amplitude was approximately 60mV. The figure 1 - 4 below, show the relationship of input voltage to amplitude of transients. Figure 5, shows a typical negative transient. Figure 6, shows a unique transient only captured once during all the SEE testing and Figure 7, shows a small oscillation transient captured in all different types of test conditions.

Figure 1: Run 26, Serial number 95, Vin = 6.8V, Load = 1.5A.

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December 2009


The positive transient of figure 1 (serial #95) is approximately 150mV in amplitude, which is the worst transient experienced for a 6.8V input voltage and 1.5A test condition. Figure 2 below, show the same serial number as figure 1(serial #95), but the input voltage changed to 3.8V, all other conditions remained the same. The transient amplitude was lowered to approximately 62mV.

Figure 2: Run 34, Serial number 95, Vin = 3.8V, Load = 1.5A

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December 2009


Figure 3: Run 53, Serial number 62, Vin = 6.8V, Load = 0.06A Figure 3, shows a transient of approximately of 150mV. The load condition was changed to 60mA and the input voltage was set to 6.8V. In contrast, Figure 4 below, is the same serial number (Serial #62), but the input voltage was changed to 3.8V. The transient shows the amplitude to be approximately 62mV. The result shows a relationship with input voltage and transient amplitudes.

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December 2009


Figure 4: Run 63, Serial number 62, Vin = 3.8V, Load = 0.06A.

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December 2009


Figure 5: Run 40, Serial number 28, Vin =6.8, load =2.75A. Negative transients occurred during SEE testing and are displayed in Figure 5. The transient amplitude is approximately 42 mV, which is much smaller than the ~150mV for other transients with an input voltage of 6.8V.

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December 2009


Figure 6: Run 23, Serial number 87, Vin = 6.8V, Load = 1.5A. The transient shown in figure 6 is the only one with the unique shape in all the SEE testing. The amplitude is again approximately 150mV.

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December 2009


Figure 7: Run 1, Serial number 95, Vin = 6.8V, Load = 1.5A. The waveform in figure 7 shows a another type of transient captured during SEE testing with all different types of test conditions. The IRUH3301A2AK was exposed to gold, krypton and xenon. The test results explained above were for gold, but the results for krypton and xenon were similar. During testing we noticed that the oscilloscope and counter detected transients when the shutter of the cyclotron was opened and closed. We proved the above theory in the last 3 runs, where we moved the beam off the IRUH3301A2AK device and then opened and closed the shutter of the cyclotron. We did this test three times and captured a small number of counts on the detector. The next step was running the part with no beam applied and found no counts on the

SEE Test Report

IRU3301A2AK

December 2009


detector. This proves there is some noise or EMI associated with the shutter opening and closing. We believe this noise effected an increase in the number of counts in the test results with larger than thirty counts. Appendix A has a table listing the worst transient counts per run. Following the table is a list of figures showing the transients experienced in that particular run.

SUMMARY Eight devices of part number IRUH3301A2AK, a positive adjustable hybrid regulator were evaluated for Single-Event Latch-Up (SEL), Single-Event Burnout (SEB) and Single-Event Transients (SET) with heavy ions. International Rectifier conducted the SEL, SEB and SEL tests on December 15, 2009 at Texas A&M University. Both the input and output of the device under test were monitored for voltage change, current change, and transients. The devices were exposed to gold, krypton and xenon ions in open-air with a heat sink applied to every device under test. The data indicates no Single Event Latchup (SEL) or Single Event Burnout (SEB) up to a LET of 85.4 MeV under three resistive loads of 60mA, 1.5A and 2.75A, two input voltages of 3.8V and 6.8V and two temperatures of 22C and >100C.

Transients were captured and recorded at a period of ~30us / frame. Post irradiation tests resulted in all devices passing their specified limits.

CONCLUSION Part number IRUH3301A2AK was characterized for SET with a variety of different test conditions and the results conclude the worst transient found was ~150mV (Figure 1). The counting of transient per test condition found there to be no dependence on test condition or specie irradiated. One observation was the transient amplitude dependence on the input voltage applied to the regulator. When the input voltage was set to 6.8V, rather than 3.8V, higher amplitude transient were observed. The IRUH3301A2AK was exposed to gold, krypton and xenon and did not have a Single Event Latch-up or Single Event Burn-Out (SEB) occur.

SEE Test Report

IRU3301A2AK

December 2009


Appendix A

Transient Waveforms

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December 2009


RUN ION LET

TEMP deg C

PART # S/N SKT #

Load (A)

Vin (V)

Transient Count +

Threshold

Transient Count -

Threshold # SPECIE MeV.cm

2/mg

8 Au 85.4 22C IRHU3301A2AK 97 2 1.5 6.8 14

9 Au 85.4 22C IRHU3301A2AK 87 3 1.5 6.8 54

11 Au 85.4 22C IRHU3301A2AK 95 4 1.5 6.8 12

17 Au 85.4 >100C IRHU3301A2AK 86 1 1.5 6.8 14

20 Au 85.4 >100C IRHU3301A2AK 97 2 1.5 6.8 55

23 Au 85.4 >100C IRHU3301A2AK 87 3 1.5 6.8 47

26 Au 85.4 >100C IRHU3301A2AK 95 4 1.5 6.8 26

27 Au 85.4 >100C IRHU3301A2AK 95 4 1.5 6.8 38

40 Au 85.4 >100C IRHU3301A2AK 28 3 2.75 6.8 23

46 Au 85.4 >100C IRHU3301A2AK 52 4 0.06 6.8 8

50 Au 85.4 >100C IRHU3301A2AK 28 3 2.75 6.8 12

53 Au 85.4 >100C IRHU3301A2AK 62 2 0.06 6.8 14

80 Kr 27.8 22C IRHU3301A2AK 62 2 0.06 6.8 10

90 Kr 27.8 >100C IRHU3301A2AK 87 3 1.5 6.8 10

97 Kr 27.8 22C IRHU3301A2AK 87 3 1.5 6.8 9

101 Xe 11.7 >100C IRHU3301A2AK 86 1 1.5 6.8 7

108 Xe 11.7 >100C IRHU3301A2AK 95 4 1.5 6.8 5

Table of runs with transient counts

SEE Test Report

IRU3301A2AK

December 2009


Run 8; is a negative transient response for gold specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied.

SEE Test Report

IRU3301A2AK

December 2009


Run 9; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

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December 2009



SEE Test Report

IRU3301A2AK

December 2009


Run 11 is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 17; is a positive transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied

SEE Test Report

IRU3301A2AK

December 2009



SEE Test Report

IRU3301A2AK

December 2009



SEE Test Report

IRU3301A2AK

December 2009



SEE Test Report

IRU3301A2AK

December 2009


Run 27; is a negative transient response for gold specie. Channel 1 is the output voltage with a 1.5A, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 40; is a negative transient response for gold specie. Channel 1 is the output voltage with a 2.75A, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 46; is a positive transient response for gold specie. Channel 1 is the output voltage with a 60mA, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 50; is a Negative transient response for gold specie. Channel 1 is the output voltage with a 2.75A, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 53; is a transient response for gold specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 53; is a transient response for gold specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8Vapplied.

SEE Test Report

IRU3301A2AK

December 2009


Run 80; is a positive transient response for krypton specie. Channel 1 is the output voltage with a 60mA load, Channel 0 is the input voltage with 6.8V applied.

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IRU3301A2AK

December 2009


Run 90; is a negative transient response for krypton specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied.

SEE Test Report

IRU3301A2AK

December 2009


Run 97; is a positive transient response for krypton specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied.

SEE Test Report

IRU3301A2AK

December 2009


Run 101; is a positive transient response for xenon specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied.

SEE Test Report

IRU3301A2AK

December 2009


Run 108; is a positive transient response for xenon specie. Channel 1 is the output voltage with a 1.5A load, Channel 0 is the input voltage with 6.8V applied.

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December 2009


Appendix A

Electrical Data

SEE Test Report

IRU3301A2AK

December 2009


Electrical Test Data (Pre and Post SEE)

Te

st N

am

e

Socket C

ontin

uity

Vre

f (Vin

=3.3

V,Io

=50m

A)

Vout (V

in=

3.8

V,Io

=50m

A)

Vout (V

in=

3.8

V,Io

=3A

)

Vout (V

in=

5.8

V,Io

=50m

A)

Vout (V

in=

5.8

V,Io

=3A

)

Over C

urre

nt L

atc

hup

Tim

ed L

atc

h O

ff

Dro

pout V

olta

ge

Shutd

ow

n T

hre

shold

On

Shutd

ow

n T

hre

shold

Off

Vout @

Shutd

ow

n

Loop S

tability

V

in=

3.8

V@

50m

A

Loop S

tability

Vin

=3.8

V@

3A

Loop S

tability

Vin

=5.8

V@

50m

A

Loop S

tability

Vin

=5.8

V@

3A

Test Number 1.1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Lower Limit 7.2 0.788 2.462 2.462 2.462 2.462 3.5 0.0001 0 0.8 0.8

-100 0 0 0 0

Upper Limit 16.8 0.812 2.537 2.537 2.537 2.537 15 1 0.4 1.2 1.2 100 15 16 16 17 Units mA V V V V V A mS V V V mV mVpp mVpp mVpp mVpp Site #

Serial #

Bin

Pre SEE

1 28 1 12.378 0.804 2.492 2.494 2.492 2.495 9.57 0.01625 0.381 1.04 0.97 2.9 6.78 7.86 8.14 7.86

1 52 1 12.516 0.801 2.5 2.501 2.5 2.501 9.27 0.01669 0.374 1.05 0.97 2.9 7.86 6.78 7.86 8.14

1 62 1 12.49 0.809 2.524 2.525 2.524 2.525 9.47 0.01745 0.351 1.05 0.98 2.7 7.59 7.32 7.86 7.32

1 87 1 12.359 0.8 2.495 2.497 2.495 2.497 9.38 0.01693 0.319 1.03 0.96 2.8 7.86 7.59 8.14 8.14

1 95 1 12.211 0.797 2.485 2.485 2.485 2.486 9.97 0.01844 0.331 1.03 0.96 2.6 7.86 7.32 7.86 7.32

1 43 1 12.455 0.802 2.502 2.502 2.502 2.503 9.68 0.01776 0.284 1.04 0.96 2.9 7.86 8.41 8.14 8.14

1 86 1 12.624 0.807 2.516 2.517 2.516 2.517 9.38 0.01595 0.299 1.04 0.97 2.6 7.86 7.32 7.86 7.59

1 97 1 12.345 0.802 2.501 2.502 2.502 2.502 9.58 0.01738 0.344 1.04 0.97 2.9 7.86 7.86 8.41 7.86

Post SEE

1 86 1 12.772 0.806 2.514 2.515 2.514 2.514 9.58 0.01746 0.241 1.04 0.97 2.7 7.86 7.86 8.14 8.14

1 97 1 12.488 0.802 2.503 2.504 2.503 2.504 9.88 0.01868 0.222 1.05 0.98 2.7 7.05 7.32 7.59 7.32

1 95 1 12.279 0.796 2.482 2.482 2.482 2.483 10.38 0.02024 0.213 1.03 0.96 2.7 7.59 7.86 7.32 7.05

1 87 1 12.512 0.802 2.501 2.502 2.501 2.502 9.58 0.0172 0.254 1.03 0.97 2.7 7.59 7.32 7.59 7.86

1 28 1 12.508 0.797 2.487 2.488 2.487 2.488 9.97 0.01835 0.238 1.04 0.97 2.7 7.59 7.86 7.59 7.32

1 62 1 12.609 0.809 2.525 2.525 2.525 2.526 9.88 0.01815 0.23 1.05 0.98 2.7 7.05 7.86 7.86 7.59

1 43 1 12.669 0.802 2.504 2.505 2.504 2.505 9.68 0.01757 0.221 1.04 0.97 2.7 7.59 8.14 8.14 7.59

1 52 1 12.634 0.802 2.502 2.503 2.502 2.503 9.58 0.01714 0.223 1.05 0.97 2.8 7.86 7.32 7.59 7.59

SEE Test Report

IRU3301A2AK

December 2009


Appendix B

Test Plan

SEE Test Report

IRUH3301A2AK

December 2009


Test Plan

1.0 Purpose The purpose of this test is to qualify this product for single event latch-up and single event transients.

2.0 Test Responsibility International Rectifier shall be responsible for conducting the tests, which shall be performed at Texas A&M’s Cyclotron facility. International Rectifier shall be responsible for the final Test Report.

3.0 Test Facility 3.1 Accelerator The Texas A&M Cyclotron shall be used to provide the necessary ion species and energy. 3.2 Test Equipment The necessary test equipment including the test interface board, cables, power supplies, etc… shall be provided by IR. IR shall provide the equipment needed to handle the individual test devices.

4.0 Test Devices 4.1 The IRHU3301A2AK devices are planned for SEE evaluation and all SEE test

specifications should be referred to the T090176G. 4.2 All devices shall be built in their respective packages. Devices shall be properly packed in static-free containers. 4.3 All devices shall be verified for correct electrical performance (baseline) prior to SEE testing.

5.0 Test Method Mil- PRF-38534 shall be used to establish procedure for all testing described herein.

6.0 Test Report The Test Report shall include the following information:

a. Device type(s), serial numbers, wafer lot identification (per active component)

b. Test dates and personnel names c. Facility, source type d. Schematic of test circuit e. Insitu bias conditions f. Comments and observations g. Pre and Post Electrical data h. Summary descriptive including graphs (if applicable)

7.0 Record Keeping All single event exposure information shall be recorded on the data file and used to correlate data from different exposure levels. The TAMU facility shall provide a hardcopy and a softcopy summary of all exposure runs showing key parameters such as; LET and ion specie, flux rate, fluence level, time duration for exposure, and comments regarding the tests including observations or deviations from the plan.

SEE Test Report

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December 2009


SEE Test Rack

SEE Test Report

IRUH3301A2AK

December 2009


SEE DUT BOARD

SEE Test Report

IRUH3301A2AK

December 2009


Appendix C

Test Procedure

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December 2009


Table 4: Single Event Effects Test Requirements 6

Test Information

Bias Condition

Vin = 3.8V, 6.8V

Load = 60mA, 1.5A and 2.75A

Program Card Number NA

Board Number 09-130-TF

Test Program TS_09026_IRUH3301A2A_REV200

Test Console 04-134-TC

Chamber Air

Temperature TC = 100C +/-3C, DUT clamped to Aluminum Heatsink and Tcase is monitored with a

themocouple.

15A MeV Beams Texas A&M only

Ion Specie LET Energy Range Average Flux Total Fluence Angle Deg Beam Length

Gold 85.4 2247 118.1

1.00E+04

1.00E+06 0.000 30mm 1.00E+06

Krypton 27.8 1032 134

1.00E+04

1.00E+06 0.000 30mm 1.00E+06

Xenon 11.7 1512 120

1.00E+04

1.00E+06 0.000 30mm 1.00E+06

SEE Test Report

IRUH3301A2AK

December 2009


TEST CIRCUIT

F2_1 F1_1

U1

72

63

1 8

54

VIN_AGND_B

VOUT_BSHDN

GND_A VIN_B

VOUT_AAdj

C10.1uF

R11560 C10

1.0uF

J2SMA

1

2354

C11100uF

C12100uF

C4100uF

C3100uF

C21.0uF

R32.0-RH025-25W

R50.2 RH025-25W

C90.1uF

J4SMA

1

2354

Scope probe Ch1

Scope probe Ch2and Counter

SEE Test Report

IRUH3301A2AK

December 2009


Appendix D

Log Sheets

SEE Test Report

IRUH3301A2AK

December 2009


SEE Test Report

IRUH3301A2AK

December 2009


DATE : 12/15/09 OPERATORS : D. Lisiewicz, J. Brandt, W. Hu FACILITY : TEXAS A&M PAGE 1 OF __5__

RUN ION LET ENERGY RANGE AVG FLUX

FLUENCE ANGLE

BEAM D T

EM

P d

eg

C

PART # Cross Section

S/N SKT #

Load (A)

Vin (V)

Transient Count +

Threshold

Transient Count -

Threshold

Comment

# SPECIE

MeV.cm

2/mg

MeV μm #/ cm

2/sec

#/ cm2 deg mm

1 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 86 1 INVALID

RUN


RUN


RUN


RUN

5 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 8.0E-06 86 1 1.5 6.8 8

6 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

7 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 9.0E-06 97 2 1.5 6.8 9

8 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.4E-05 97 2 1.5 6.8 14

9 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 5.4E-05 87 3 1.5 6.8 54

10 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.30E-05 87 3 1.5 6.8 13

11 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.20E-05 95 4 1.5 6.8 12

12 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 3.0E-06 95 4 1.5 6.8 3

13 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.00E-06 86 1 1.5 3.8 1

SEE Test Report

IRUH3301A2AK

December 2009


14 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 86 1 1.5 3.8 0

15 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 86 1 INVALID

RUN


RUN

17 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.4E-05 86 1 1.5 6.8 14


RUN

19 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 3.0E-06 86 1 1.5 6.8 3

20 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 5.50E-05 97 2 1.5 6.8 55


RUN

22 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 97 2 1.5 6.8 2

23 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 4.7E-05 87 3 1.5 6.8 47

24 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 7.0E-06 87 3 1.5 6.8 7


RUN

26 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.6E-05 95 4 1.5 6.8 26

27 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 3.8E-05 95 4 1.5 6.8 38

28 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.6E-05 86 1 1.5 3.8 16

29 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 86 1 1.5 3.8 2

30 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 97 2 1.5 3.8 0

31 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.2E-05 97 2 1.5 3.8 12

SEE Test Report

IRUH3301A2AK

December 2009


32 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 87 3 1.5 3.8 0

33 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 87 3 1.5 3.8 2

34 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 3.0E-06 95 4 1.5 3.8 3

35 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 95 4 1.5 3.8 21

INVALID RUN

Supply collapsed


RUN

37 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 6.0E-06 43 1 2.75 6.8 6

38 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 43 1 2.75 6.8 1

39 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 8.0E-06 28 3 2.75 6.8 8

40 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 2.3E-05 28 3 2.75 6.8 23

41 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 5.0E-06 62 2 0.06 6.8 5


RUN

43 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 4.0E-06 62 2 0.06 6.8 4

44 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-05 52 4 0.06 6.8 10

45 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 2.0E-06 52 4 0.06 6.8 2

46 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 8.0E-06 52 4 0.06 6.8 8

47 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 43 1 2.75 6.8 INVALID

RUN

48 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 7.0E-06 43 1 2.75 6.8 7

49 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 4.0E-06 43 1 2.75 6.8 4

SEE Test Report

IRUH3301A2AK

December 2009


50 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.2E-05 28 3 2.75 6.8 12

51 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 3.0E-06 28 3 2.75 6.8 3


RUN

53 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.4E-05 62 2 0.06 6.8 14

54 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 62 2 0.06 6.8 1

55 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 52 4 0.06 6.8 1

56 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.1E-05 52 4 0.06 6.8 11


RUN

58 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 43 1 2.75 3.8 0

59 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 43 1 2.75 3.8 0

60 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 4.0E-06 28 3 2.75 3.8 4

61 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.1E-05 28 3 2.75 3.8 11


RUN

63 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 6.0E-06 62 2 0.06 3.8 6

64 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 8.0E-06 62 2 0.06 3.8 8

65 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 52 4 0.06 3.8 1

66 Au 85.4 2247 118.1 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.2E-05 52 4 0.06 3.8 12

67 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 43 1 2.75 6.8 2

SEE Test Report

IRUH3301A2AK

December 2009


68 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 9.0E-06 43 1 2.75 6.8 9

69 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 28 3 2.75 6.8 1

70 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 7.0E-06 28 3 2.75 6.8 7

71 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 62 2 0.06 6.8 2

72 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.7E-05 62 2 0.06 6.8 17

73 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.1E-05 52 4 0.06 6.8 11

74 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 9.0E-06 52 4 0.06 6.8 9

75 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 3.0E-06 43 1 2.75 6.8 3

76 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 43 1 2.75 6.8 1

77 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 43 1 INVALID

RUN

78 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 28 3 2.75 6.8 1

79 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 6.0E-06 28 3 2.75 6.8 6

80 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-05 62 2 0.06 6.8 10

81 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 3.0E-06 62 2 0.06 6.8 3

82 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 52 4 0.06 6.8 1

83 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 52 4 0.06 6.8 1

84 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 4.0E-06 86 1 1.5 6.8 4

85 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 86 1 INVALID

RUN

SEE Test Report

IRUH3301A2AK

December 2009


86 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

87 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 2.0E-06 97 2 1.5 6.8 2

88 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 97 2 1.5 6.8 1

89 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 87 3 1.5 6.8 0

90 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-05 87 3 1.5 6.8 10

91 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 95 4 1.5 6.8 1

92 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-05 95 4 1.5 6.8 10

93 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

94 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

95 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 97 2 1.5 6.8 1

96 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 7.0E-06 97 2 1.5 6.8 7

97 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 9.0E-06 87 3 1.5 6.8 9

98 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 2.0E-06 87 3 1.5 6.8 2

99 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 95 4 1.5 6.8 0

100 Kr 27.8 1032 134 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 9.0E-06 95 4 1.5 6.8 9

101 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 7.0E-06 86 1 1.5 6.8 7

102 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 86 1 1.5 6.8 INVALID

RUN

103 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

SEE Test Report

IRUH3301A2AK

December 2009


104 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 4.0E-06 97 2 1.5 6.8 4

105 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 97 2 1.5 6.8 1

106 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 87 3 1.5 6.8 1

107 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 87 3 1.5 6.8 1

108 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 5.0E-06 95 4 1.5 6.8 5

109 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 >100C IRHU3301A2AK 1.0E-06 95 4 1.5 6.8 1

110 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 3.0E-06 86 1 1.5 6.8 3

111 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.0E-06 86 1 1.5 6.8 1

112 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 3.0E-06 97 2 1.5 6.8 3

113 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 4.0E-06 97 2 1.5 6.8 4

114 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 3.0E-06 87 3 1.5 6.8 3

115 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.2E-05 87 3 1.5 6.8 12

116 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 2.0E-06 95 4 1.5 6.8 2

117 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 4.0E-06 95 4 1.5 6.8 4

118 Xe 11.7 1512 120 2.29E+04 1.00E+06 0 30 22C IRHU3301A2AK 1.5 6.8 Shutter

experiment


experiment


experiment

Documents

S E E HARDNESS ASSURANCE TEST - Infineon … · IRUH3301A2AK Single-Event Test Report December 2009 International Rectifier currently does not have a DSCC approved Radiation Hardness