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Resonant X-ray Diffraction (REXD) where Diffraction meets Spectroscopy Yezhou Shi Department of Materials Science and Engineering, Stanford University 7 th SSRL School on Synchrotron X-ray Scattering Techniques June 3, 2014

Resonant X-ray Diffraction (REXD)

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Page 1: Resonant X-ray Diffraction (REXD)

Resonant X-ray Diffraction (REXD)

where Diffraction meets Spectroscopy

Yezhou Shi

Department of Materials Science and Engineering, Stanford University

7th SSRL School on Synchrotron X-ray Scattering Techniques

June 3, 2014

Page 2: Resonant X-ray Diffraction (REXD)

outline

1. motivation: why do we/you care?

2. technique: how does this work?

3. design experiments: what to consider?

Page 3: Resonant X-ray Diffraction (REXD)

site-specific chemical information

important to understanding properties o materials property depends directly on site occupancies

o complex oxides: multiple sites, multiple cations & anions

perovskite: ABO3 spinel: A2BO4

Page 4: Resonant X-ray Diffraction (REXD)

o elemental/chemical selectivity

• different elements and/or oxidation states

o site selectivity:

• site A vs. site B

• substitution vs. interstitial

requirements of an ideal technique

Page 5: Resonant X-ray Diffraction (REXD)

o relatively fast to perform and can refine both elemental and site information

o refine a variety of structural parameters (occupancy, strain, displacement, etc…)

o limitations

• have to deal with all phases/structures in the sample

• elements with similar z chemical selectivity lost

• Alternative: neutron scattering best with large mass

Large-range diffraction +

Rietveld refinement

Page 6: Resonant X-ray Diffraction (REXD)

outline

1. motivation: why do we/you care?

2. technique: how does this work?

3. design considerations

Page 7: Resonant X-ray Diffraction (REXD)

principles of resonant X-ray diffraction

2)( hklFEI )(2),( lzkyhxi

i

iihkl eEQfxF

1 2( ) ( ) ( )of f Q f E if E

Bragg (h,k,l)

site selectivity element

selectivity

Page 8: Resonant X-ray Diffraction (REXD)

model fitting to extract site occupancies

2)( hklFEI )(2),( lzkyhxi

i

iihkl eEQfxF

real part: f1

imag. Part: f2 Combine the best of two worlds:

simultaneously chemical and structural info.

occupancy

Page 9: Resonant X-ray Diffraction (REXD)

data collection: diffraction scans at

various incident X-ray energies

ϕ incident x-ray

(tunable energy) diffracted x-ray

sample

Co K edge

Page 10: Resonant X-ray Diffraction (REXD)

The other half of the story:

experimentally determined f1 & f2

KKT

imaginary: f2 real part: f1

measured spectra

near the abs. edge Absorption

coefficients

Stitched to

theoretical values

Page 11: Resonant X-ray Diffraction (REXD)

outline

1. motivation: why do we/you care?

2. technique: how does this work?

3. design considerations

Page 12: Resonant X-ray Diffraction (REXD)

designing your experiments:

practical considerations

o is resonant diffraction the tool? • Sr vs Ti in STO • Fe vs Ti in Fe doped STO • 0.1% doped Fe?

Page 13: Resonant X-ray Diffraction (REXD)

designing your experiments:

practical considerations (cont’d)

o ideally, single phase with known composition

o can you identify one or a set of Bragg peaks to extract site-

specific information?

o trade off between absorption and diffracted intensity

• textured thin films: easiest to work with

• powder/nanocrystals: fine

• polycrystalline film: diffraction too weak

Material/Mass More Less

Absorption More (bad) Less (good)

Diffraction Singal Strong (good) Weak (bad)

Page 14: Resonant X-ray Diffraction (REXD)

designing your experiments:

drawbacks and limitations

o insensitive to low Z elements or O vacancy (generally true to

hard X-ray based techniques)

o relatively long data acquisition time (30 to 50 energies per

element 6 to15 hrs) – plan your experiments carefully

o model fitting is required to understand the data (no

commercial software to do this)

Page 15: Resonant X-ray Diffraction (REXD)

designing your experiments:

resources at SSRL

o in-situ experiments possible (elevated T, gas environments…)

o “sweet spot” elements: Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge

• K edges readily accessible with large photon flux

o who to talk to?

• Kevin Stone, Badri Shyam and me

beamline # motors sample form comments

2-1 Two-circle Powder / nanocrystals Less crowded

10-2 Four-circle Thin film/single crystal Sufficient for most purposes

7-2 Six-circle Thin film/single crystal Strange geometries available

Page 16: Resonant X-ray Diffraction (REXD)

BONUS (Example):

Mn occupancies in Cr2MnO4 spinels

Page 17: Resonant X-ray Diffraction (REXD)

spinel structure and anti-site defects

• two structurally inequivalent sites: tetrahedral vs. octahedral

• intrinsic anti-site defects created by cross-substitution

4

2

2

3 ][)( OBA TdOh

4121 ][)( OBABA Td

yy

Oh

xx

acceptor

states

donor

states

2

OhB 3

TdA(222)

peak

(422)

peak

Page 18: Resonant X-ray Diffraction (REXD)

spinel oxide thin film fabrication

• pulsed laser deposition of

Cr2MnO4 on top of SrTiO3

single crystal substrate

• two different compositions

from two PLD targets

•XRD confirm the film is

biaxially textured

ϕ

SrTiO3 substrate (a = 3.9 Å)

Cr2MnO4 (a = 8.4 Å)

2θ/ω scan: Out-of-plane

ϕ scan: in-plane

Page 19: Resonant X-ray Diffraction (REXD)

Cr2MnO4 spinel: spectroscopy offers

a qualitative yet incomplete picture

Shi, Y. et al, Chem. Mater., 2014, 26 (5), pp 1867–1873

Cr edge: Cr (III) only Mn edge: (II) + (III)

1 2 1 4( ) [ ]Oh Td

x x y yMn Cr Mn Cr O

Page 20: Resonant X-ray Diffraction (REXD)

site-dependent chemical shifts near Mn edge

• chemical shift related to Mn oxidation states

• a larger shift is observed for MnOh than the MnTd in both samples

screen and actually point where the dips

Cr2MnO4

theoretical edge: 6539 eV

Td site dip: 6546 eV Oh site dip: 6549 eV

Cr1.5Mn1.5O4

Td Td

Oh Oh

Page 21: Resonant X-ray Diffraction (REXD)

fitted site occupancies for Cr2MnO4

Shi, Y. et al, Chem. Mater., 2014, 26 (5), pp 1867–1873

• how do we know Mn are indeed (II) on Td sites

and (III) on Oh sites?

compare dip position and fine features

• Td site data (422 reflections) are very similar to

the simulated REXD of Fe2MnO4 with Mn(II)

• Oh site data (222 reflections) are very similar to

the simulated REXD of Mn2O3 with Mn(III)

Page 22: Resonant X-ray Diffraction (REXD)

fitted site occupancies for Cr2MnO4

• compare Mn edge data to references: Td site is Mn(II) whereas Oh site

is Mn(III)

• four data sets are fitted independently to give site occupancies –

occupancies sum up to unity for both sites

Shi, Y. et al, Chem. Mater., 2014, 26 (5), pp 1867–1873

Page 23: Resonant X-ray Diffraction (REXD)

complimentary information from

absorption & emission spectroscopies N

orm

aliz

ed a

bso

rban

ce XES @ SSRL 6-2

No

rmal

ized

inte

nsi

ty

XAS @ SSRL 4-1

Film

Composition

(XRF)

Site Occupancies

(REXD)

Calculated Mn

Ox. States

(REXD)

Averaged Mn

Ox. States

(XANES)

Averaged Mn

Ox. States

(XES)

Cr1.83Mn1.17O4 Cr1.7Mn1.3O4 2.23 ± 0.02 2.13 ± 0.12 2.25 ± 0.04

Cr1.33Mn1.67O4 Cr1.4Mn1.6O4 2.38 ± 0.03 2.26 ± 0.11 2.33 ± 0.04

Page 24: Resonant X-ray Diffraction (REXD)

Thank you for your attention.