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1 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Relative Permittivity Variation Surrounding PCB Via Hole Structures SPI2008 Avignon France May 12-15, 2008 Lambert Simonovich [email protected]

Relative Permittivity Variation Surrounding PCB Via Hole

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Page 1: Relative Permittivity Variation Surrounding PCB Via Hole

1 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures

Relative Permittivity Variation Surrounding PCB Via Hole StructuresSPI2008 Avignon France May 12-15, 2008Lambert [email protected]

Page 2: Relative Permittivity Variation Surrounding PCB Via Hole

2 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

IntroductionIntroduction

Present IC technology advancements are allowing Present IC technology advancements are allowing data rates beyond 6 data rates beyond 6 Gb/sGb/s

PCB through hole via parasitics becoming more of a PCB through hole via parasitics becoming more of a factor affecting BER performancefactor affecting BER performance

Accurate via modeling and topology simulation are a Accurate via modeling and topology simulation are a mustmust

All models and methodologies require defining All models and methodologies require defining relative permittivity (relative permittivity (εεrr ) or dielectric constant () or dielectric constant (DkDk) of ) of material surrounding the via hole structurematerial surrounding the via hole structure

Page 3: Relative Permittivity Variation Surrounding PCB Via Hole

3 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

PCB Fabrication OverviewPCB Fabrication Overview

Conventional PCB laminates are fabricated with Conventional PCB laminates are fabricated with a weave of Ea weave of E--glass fiber yarns (glass fiber yarns (Dk 6.6 @ 1MHzDk 6.6 @ 1MHz) ) and resin (and resin (Dk 3.2 @ 1MHzDk 3.2 @ 1MHz) [1]) [1]

Effective Effective DkDk is a function of glass to resin ratio is a function of glass to resin ratio of laminates used in the PCB stackupof laminates used in the PCB stackup

For FRFor FR--4 PCBs an effective 4 PCBs an effective DkDk of 4.3 is often of 4.3 is often used for trace etch impedance calculationsused for trace etch impedance calculations

Page 4: Relative Permittivity Variation Surrounding PCB Via Hole

4 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

N4000-6 TM Dielectric Properties Table [1], [2]

Style Glass / Laminate ThicknessRatio(mils)

ResinContent(%)

YarnCount(threads/inch)

YarnPitch

(mils)

106 1.4/2.0 69.0 56x56 17.9x17.9

1080 2.3/3.0 62.0 60x40 16.7x21.3

2113 2.9/4.0 54.5 60x56 16.7x17.9

2116 3.8/4.0 43.0 60x58 16.7x17.2

7628 6.8/8.0 44.4 44x32 22.7x31.3

Resin Fiberglass Weave

Fiberglass weaves vs. resin content illustration. Smaller glass diameter and thread count results in higher resin content, while larger glass diameter and thread count results in lower resin content.

2113106 7628

Fiberglass Weave Fiberglass Weave vsvs Resin ContentResin Content

Page 5: Relative Permittivity Variation Surrounding PCB Via Hole

5 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

FiberglassWarp/Fill

Resin

Via 1 Via 2

Dielectric Property Between ViasDielectric Property Between Vias

Page 6: Relative Permittivity Variation Surrounding PCB Via Hole

6 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

++++

----

E-field

Higher glass to resin ratio between charges => Higher effective

dielectric constant

Higher glass to resin ratio between charges => Higher effective

dielectric constant

VSVS

ViasVias EtchEtch

E-field Resin

Fiberglass

Laminate Weave EffectLaminate Weave Effect

Lower glass to resin ratio between charges => Lower effective

dielectric constant

Lower glass to resin ratio between charges => Lower effective

dielectric constant

Page 7: Relative Permittivity Variation Surrounding PCB Via Hole

7 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Laminate Weave Effect of Via Hole StructureLaminate Weave Effect of Via Hole Structure

Page 8: Relative Permittivity Variation Surrounding PCB Via Hole

8 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Case Study ObjectiveCase Study Objective

To study the effect of relative permittivity To study the effect of relative permittivity surrounding a PCB via hole structuresurrounding a PCB via hole structure

Validate transmission line via model correlation Validate transmission line via model correlation to measured resultsto measured results

Page 9: Relative Permittivity Variation Surrounding PCB Via Hole

9 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

PCB Coupon Under Test

Device Under Test

12

43

Agilent NS230A VNA

Via Pair1A, 1B

Via Pair2A, 2B

Test SetupTest Setup

Page 10: Relative Permittivity Variation Surrounding PCB Via Hole

10 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

6”8-9-8 (mils) Diff Pair

Layer 2NELCO 4000-13TM

Stub270 mils

Via14 mils

Via1AVia1B

Via2AVia2B

Test Coupon TopologyTest Coupon Topology

Page 11: Relative Permittivity Variation Surrounding PCB Via Hole

11 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Data and ResultsData and Results

Resonant frequency nulls due to the via stub length occur at odd harmonics of the ¼ wave frequency null

Effective relative permittivity (a.k.a.

calculated by [5];

= 6.46

Where: c = Speed of light (1.18E10 inches/sec); Stub_Length (0.270) inches; f = ¼ wave frequency (13.00GHz/3)

dielectric constant Dk) can be

2

*_*4 ⎥⎦

⎤⎢⎣

⎡=

flengthStubcDk

Page 12: Relative Permittivity Variation Surrounding PCB Via Hole

12 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

StriplineStriplineLayerLayer

¼¼ WaveWaveFrequencyFrequency

(GHz)(GHz)

33rdrd

HarmonicHarmonicFrequencyFrequency

(GHz)(GHz)

Via/StubVia/StubLengthsLengths(Mils)(Mils)

Calculated Calculated DkDk

0202 4.34.3 13.013.0 14/269.914/269.9 6.466.46

1010 6.36.3 18.918.9 105.7/178.1105.7/178.1 6.906.90

2020 18.418.4 N/AN/A 219.6/64.3219.6/64.3 6.206.20

L2

L10

Stub = 269.9 milsStub = 178.1 mils

L20

Stub = 64.3 mils

Via = 14 milsVia = 105.7 mils

Via = 219.6 mils

Data and ResultsData and Results

Page 13: Relative Permittivity Variation Surrounding PCB Via Hole

13 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Differential Pair Via ModelDifferential Pair Via Model

Modeled as differential pair transmission lines

Analogous to a twin-round-wire wire structure

Zvstub

Zv

Dk

⎟⎟

⎜⎜

⎛−⎟

⎠⎞

⎜⎝⎛+

Ω= 1

22ln120 2

rs

rs

DkZdiff

Where: Zdiff = Differential impedance; Dk = Dielectric constant; s = center-to-center space of vias; r = radius of drill [6]

s

r

2ZdiffZv =

Odd mode via impedance (Zv)

Page 14: Relative Permittivity Variation Surrounding PCB Via Hole

14 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Via Impedance CalculationVia Impedance Calculation

⎟⎟

⎜⎜

⎛−⎟

⎠⎞

⎜⎝⎛+

Ω= 1

22ln120 2

rs

rs

DkZdiff

⎟⎟

⎜⎜

⎛−⎟

⎠⎞

⎜⎝⎛+

Ω= 1

2859

2859ln

4.6120 2

Ω= 65

Ω==== 5.32265

2ZdiffZoddZv

Page 15: Relative Permittivity Variation Surrounding PCB Via Hole

15 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

ADS Simulation Correlation TopologyADS Simulation Correlation Topology

Measured

Model

Probe

Via 1A,B

Via 2A,B

Probe

Diff Pair Etch

Page 16: Relative Permittivity Variation Surrounding PCB Via Hole

16 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

ADS Simulation Correlation ResultsADS Simulation Correlation ResultsDk = 6.4 Dk = 3.8

-- Measured -- Simulated-- Measured -- Simulated

Page 17: Relative Permittivity Variation Surrounding PCB Via Hole

17 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

Conclusions Conclusions

Due to the fiberglass weave effect surrounding Due to the fiberglass weave effect surrounding differential pair vias, the relative permittivity is differential pair vias, the relative permittivity is higher than the dielectric surrounding wiring etch higher than the dielectric surrounding wiring etch within the same PCB stackupwithin the same PCB stackup

Using the correct value of dielectric constant Using the correct value of dielectric constant has shown better accuracy for via modeling has shown better accuracy for via modeling during topology simulationsduring topology simulations

Page 18: Relative Permittivity Variation Surrounding PCB Via Hole

18 SPI2008 Relative Permittivity Variation Surrounding PCB Via Hole Structures Lambert Simonovich

ReferencesReferences

1. Scott Mc Morrow, Chris Heard, “The Impact of PCB Laminate Weave on the Electrical Performance of Differential Signaling at Multi-Gigabit Data Rates”, Design Con 2005.

2. Park Electrochemical Corp. , http://www.parkelectro.com3. Gustavo Blando, Jason R. Miller, Istvan Novak, “Losses Induced by Asymmetry in Differential

Transmission Lines”, DesignCon 2007.4. Howard Johnson, Martin Graham, “High Speed Digital Design, a Handbook of Black Magic”.5. Howard Johnson, Martin Graham, “High Speed Signal Propagation, Advanced Black Magic”.6. Eric Bogatin, “ Signal Integrity Simplified”7. Stephen C. Thierauf , “High-Speed Circuit Board Signal Integrity”8. Lee Ritchey, “"Right the First Time, A Practical Handbook on High Speed PCB and System

Design, Volume 1 & 2"9. Taras Kushta, Kaoru Narita, Tomoyuki Kaneko, Takanori Saeki, and Hirokazu Tohya,

“Resonance Stub Effect in a Transition From a Through Via Hole to a Stripline in Multilayer PCBs”, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, VOL. 13, NO. 5, MAY 2003.

10. Miroslav Pajovic, Jinghan Yu, and Dragan Milojkovic, “Analysis of Via Capacitance in Arbitrary Multilayer PCBs”, IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, VOL. 49, NO. 3, AUGUST 2007.