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Chapter 1
1.1 G.A. Somorjai: Principles of Suiface Chemistry (Prentice Hall, Englewood Cliffs, NJ 1972) F. Garcia-Moliner, F. Flores: Introduction to the Theory of Solid Suifaces (Cambridge Univ. Press, Cambridge 1979) G.A. Somorjai: Chemistry in Two-Dimensions (Cornell, Ithaca 1981) A. Zangwill: Physics at Suifaces (Cambridge Univ. Press, Cambridge 1988) D.P. Woodruff, T.A. Delchar: Modem Techniques of Suiface Science (Cambridge Univ. Press, Cambridge 1986) M. Lannoo, P. Friedel: Atomic and Electronic Structure of Surfaces, Springer Ser. Surf. Sci., Vol. 16 (Springer, Berlin, Heidelberg 1991) M. Prutton: Introduction to Suiface Physics (Clarendon, Oxford 1994) H. Liith: Suifaces and Inteifaces of Solid Materials, 3rd edn. (Springer, Berlin, Heidelberg 1995)
1.2 Suiface Physics of Materials, ed. by J.M. Blakely (Academic, New York 1975) Handbook of SUlfaces and Inteifaces, ed. by L. Dobrzynski (Garland STPM Press, New York 1978) Interactions of Atoms and Molecules with Solid Suifaces, ed. by V. Bortolani, N.H. March, M.P. Tosi (Plenum, New York 1990) Suiface Analysis Methods in Materials Science, ed. by D.J. O'Connor, B.A. Sexton, R. St.C. Smart, Springer Ser. Surf. Sci., Vol. 23 (Springer, Berlin, Heidelberg 1992) Suiface Science: The First Thirty Years, ed. by C.B. Duke (North-Holland, Amsterdam 1994)
1.3 The Chemical Physics of Solid Suifaces and Heterogeneous Catalysis, ed. by D.A. King, D.P. Woodruff (Elsevier, Amsterdam) Chemistry and Physics of Solid Surfaces, I, ed. by R. Vanselow, S.Y. Tong (CRC, Cleveland, 1977), II, ed. by R. Vanselow (CRC, Cleveland, 1979), III, ed. by R. Vanselow, W. England (CRC, Cleveland, 1982) Chemistry and Physics of Solid Suifaces IV and V, ed. by R. Vanselow, R. Howe, Springer Ser. Chern. Phys., Vols. 20 and 35 (Springer, Berlin, Heidelberg 1982 and 1984) Chemistry and Physics of Solid Suifaces VI-VIII, ed. by R. Vanselow, R. Howe, Springer Ser. Surf. Sci., Vols. 5, 10 and 22 (Springer, Berlin, Heidelberg 1986, 1988 and 1990) Physics of Solid Suifaces, in Landolt-Bornstein Solid State Physics, ed. by G. Chiarotti, Vols. 24A, Band C (Springer, Berlin, Heidelberg 1993, 1994 and 1995)
Chapter 2
2.1 H.J. Leamy, G.H. Gilmer, K.A. Jackson: Surface Physics of Materials, ed. by J.M. Blakely (Academic, New York 1975), Vol. I
2.2 M.J. Sparnaay: Surf. Sci. Rep. 4,101 (1984) A.I. Rusanov: Surf. Sci. Rep. 23, 173 (1996)
2.3 R. Shuttleworth: Proc. Phys. Soc. (London) A 63, 444 (1950) P.R. Couchman, W.A. Jesser, D. Kuhlmann-Wilsdorf, J.P. Hirth: Surf. Sci. 33,429 (1972) D.E. Wolf, R.B. Griffiths: Phys. Rev. B 32, 3194 (1985)
2.4 L.D. Landau, E.M. Lifshitz: Statistical Physics, Vol. 5, (Pergamon, Oxford 1959)
586 References
Statistical Physics I: Equilibrium Statistical Mechanics by M. Toda. R. Kubo, N. Saito and II: Non equilibrium Statistical Mechanics by R. Kubo, M. Toda, N. Hashitsume, 2nd edn., Springer Ser. Solid-State Sci., Vols. 30 and 31 (Springer, Berlin, Heidelberg 1992)
2.5 C. Herring: Phys. Rev. 82, 87 (1951), and Structure and Properties of Solid Sutfaces, ed. by R. Gomer, C.S. Smith (Univ. Chicago Press, Chicago 1952)
2.6 G. Wulff: Z. Krist. 34, 449 (1901) see also J. Villain, A. Pimpinelli: Physique de la Croissance Cristalline (Eyrolles, Paris 1995)
2.7 M. Drechsler, F. Nicholas: J. Phys. Chern. Sol. 28,2609 (1967) 2.8 J. Friedel: Ann. Phys. Paris 1, 257 (1976) 2.9 1.D. Weeks: In Ordering in Strongly Fluctuating Condensed Matter Systems, ed. by Riste
(Plenum, New York 1980) J. Lapujou1ade: Surf. Sci. Rep. 20, 191 (1994)
2.10 H. van Beijeren, I. Nolden: In Structure and Dynamics of Sutfaces II, ed. by W. Schommers, P. von Blanckenhagen, Topics Curro Phys., Vol. 43 (Springer, Berlin, Heidelberg 1987) E.H. Conrad, T. Engel: Surf. Sci. 299/300, 391 (1994)
2.11 W.K Burton, N. Cabrera: Disc. Faraday Soc. 5, 33 (1949) 2.12 W.K Burton, N. Cabrera, F.C. Frank: Phil. Trans. Roy. Soc. (London) A 243, 299 (1951) 2.13 KA. Jackson, C.E. Miller: 1. Cryst. Growth 40, 169 (1977) 2.14 P. Nozieres: Lecture notes at the College de France (1984) unpublished
P. Nozieres, F. Gallet: J. de Physique 48, 353 (1987) 2.15 V.V. Voronkov: Soviet Phys. Cryst. 11,259 (1966) 2.16 L. Onsager: Phys. Rev. 65, 117 (1944) 2.17 WJ. Shugard, J.D. Weeks, G.H. Gilmer: Phys. Rev. Lett. 41, 1399 (1978) 2.18 S.T. Chui, J.D.Weeks: Phys. Rev. B 14,4978 (1976) 2.19 K Binder, D.W. Heermann: Monte Carlo Simulation in Statistical Physics, 2nd edn., Springer
Ser. Solid-State Sci., Vol. 80 (Springer, Berlin, Heidelberg 1992) D.W. Heermann: Computer Simulation Methods in Theoretical Physics, 2nd edn. (Springer, Berlin, Heidelberg 1990)
2.20 N. Metropolis, A.W. Rosenbluth, M.N. Rosenbluth, A.H. Teller, E. Teller: 1. Chern. Phys. 21, 1087 (1953)
2.21 V. Rosato, G. Ciccoti, V. Pontikis: Phys. Rev. B 33, 1860 (1986) 2.22 H. van Beijeren: Phys. Rev. Lett. 38,993 (1977) 2.23 1.M. Kosterlitz, DJ. Thouless: J. Phys. C 6,1181 (1973)
J.M. Kosterlitz: J. Phys. C 7,1046 (1974) 2.24 S. Balibar, B. Castaing: J. de Physique, Lett. 41, L 329 (1980); Surf. Sci. Rep. 5, 87 (1985)
J.E. Avon, L.S. Balfour, L.G. Kupfer, J. Landau, S.G. Libson, L.S. Schulman: Phys. Rev. Lett. 45,814 (1980) P.E. Wolf, F. Gallet, S. Balibar, E. Rolley, P. Nozieres: J. de Physique 46,1987 (1985) F. Gallet, P. Nozieres, S. Balibar, E. Rolley: Europhys. Lett. 2, 701 (1986)
2.25 1.C. Heyraud, J.l. Metois: Acta Met. 28, 1789 (1980); Surf. Sci. 128,334 (1983); Surf. Sci. 177, 213 (1986); 1. Cryst. Growth 82,269 (1987)
2.26 L. Pedemonte, G. Bracco, R. Tatarek: Surf. Sci. 377/379, 524 (1997) 2.27 J. Villain, D.R. Grempel, J. Lapujoulade: J. Phys. F 15, 804 (1985)
H.J. Schulz: J. de Physique 46,257 (1985) 2.28 B. Salanon, F. Fabre, D. Gorse, J. Lapujoulade, W. Selke: J. Vac. Sci. Technol. A 6, 655 (1988)
F. Fabre, D. Gorse, B. Salanon, J. Lapujoulade: J. de Physique 48, 2447 (1987) B. Salanon, F. Fabre, J. Lapujoulade, W. Selke: Phys. Rev. B 38, 7385 (1988)
2.29 E.H. Conrad, L.R. Allen, D.L. Blanchard, T. Engel: Surf. Sci 187,265 (1987) E.H. Conrad, R.M. Aten, D.S. Kaufman, L.R. Allen, T. Engel, M. den Nijs, E.K Riedel: J. Chern. Phys. 84, lOIS (1986); Erratum, 85, 4756 (1986)
2.30 A.A. Chernov: Modern Crystallography III, Springer Ser. Solid-State Sci., Vol. 36 (Springer, Berlin, Heidelberg 1984)
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Chapter 3
3.1 G.A. Somorjai: Principles of Surface Chemistry (Prentice Hall, Englewood Cliffs, NJ 1972) p. 14
3.2 G.A. Somorjai, M.A. van Hove: Adsorbed monolayers on solid surfaces. Structure and Bonding 38 (Springer-Verlag, Berlin, Heidelberg 1979)
3.3 J.w. Chung, S.C. Ying, P.I. Estrup: Phys. Rev. Lett. 56, 749 (1986) 3.4 J. Sokolov, F. Jona, P.M. Marcus: Solid State Comm. 49, 307 (1984) 3.5 D.A. King, Physica Scripta T4, 34 (1983) and references therein 3.6 D. Wolf, H. Jagodzinski, W. Moritz: Surf. Sci. 77,2654 (1978)
G. Binnig, H. Rohrer, C.H. Gerber, E. Weibel: Surf. Sci. 131, L379 (1983) 3.7 a) D.E. Eastman: J. Vac. Sci. Techno1. 17,492 (1980) and references therein
b) G. Binnig, H. Rohrer, F. Salvan, C.H. Gerber, A. Bar6: Surf. Sci. 152, 17 (1985) 3.8 B. Lang, RW. Joyner, G.A. Somorjai: Surf. Sci. 30, 440 (1972) 3.9 D.P. Woodruff, T.A. De1char: Modem Techniques of Surface Science (Cambridge Univ. Press,
Cambridge 1986) 3.10 E.W. Miiller: Z. Phys. 131, 136 (1951) 3.11 a) R Gomer: Field Emission and Field Ionization (Harvard Univ. Press, Cambridge MA 1961)
and Surf. Sci. 299/300, 129 (1994) b) T.T. Tsong: Surf. Sci. Rep. 8,127 (1988) and references therein and Surf. Sci. 299/300,153
(1994) G.L. Kellog: Surf. Sci. Rep. 21,1 (1994)
3.12 G. Binnig, H. Rohrer: Helv. Phys. Acta 55, 726 (1982) 3.13 Scanning Tunneling Microscopy: IBM J. Res. Dev. 30, 353-440 (1986)
Scanning Probe Microscopy: Beyond the Images, ed. by S. Gauthier, C. Joachim (Les Editions de Physique, Les Ulis 1992) Scanning Tunneling Microscopy I-III, 2nd edn., ed. by H.-J. Giintherodt, R. Wiesendanger, Springer Ser. Surf. Sci. Vol. 20, 28, 29 (Springer, Berlin, Heidelberg 1994, 1995 and 1996)
3.14 J. Tersoff, D.R. Hamann: Phys. Rev. B 31, 805 (1985) 3.15 S. Rousset, S. Gauthier, O. Sibou1et, W. Sacks, M. Belin, J. Klein: Phys. Rev. Lett. 63,1265
(1989) 3.16 a) J.B. Pendry: Low Energy Electron Diffraction (Academic, London 1974), Surf. Sci. 299/300,
375 (1994), Surf. Sci. Rep. 19,87 (1993) b) M.A. Van Hove, W.H. Weinberg, C.-M. Chan: Low-Energy Electron Diffraction, Springer
Ser. Surf. Sci., Vo1. 6 (Springer, Berlin, Heidelberg 1986) M.A. Van Hove, S.Y. Tong: Surface Crystallography by LEED, Springer Ser. Chern. Phys., Vo1. 2 (Springer, Berlin, Heidelberg 1979) S.Y. Tong: Surf. Sci. 299/300, 358 (1994) M.A. Van Hove, W. Moritz, H. Hover, P.I. Rous, A. Wander, A. Barbieri, N. Materer, U. Starke, G.A. Somorjai: Surf. Sci. Rep. 19, 191 (1993)
3.17 M. Henzler: Surf. Sci. 19, 159 (1970) 3.18 R.G. Jones, D.P. Woodruff: Vacuum 31, 411 (1981) 3.19 C.R Brundle: Surf. Sci. 48,99 (1975) 3.20 D.W. Jepsen, P. M. Marcus, F. Jona: Phys. Rev. B 5,3933 (1972)
P.M. Marcus, J.E. Demuth, D.W. Jepsen: Surf. Sci. 53,501 (1975) E. Lang, K. Miiller, K. Heinz, M.A. Van Hove, R.I. Koestner, G.A. Somorjai: Surf. Sci. 127, 347 (1983)
3.21 I. Estermann, O. Stern: Z. Phys. 61,95 (1930) 3.22 a) Helium Atom Scattering from Surfaces, ed. by E. Hulpke, Springer Ser. Surf. Sci., Vo1. 27
(Springer, Berlin, Heidelberg 1992) G. Comsa: Surf. Sci. 299/300, 77 (1994)
b) A.M. Lahee, W. Allison, RF. Willis, K.H. Rieder: Surf. Sci. 126,654 (1983) 3.23 N. Garcia, J. Ibanez, J. Solana, N. Cabrera: Surf. Sci. 60, 385 (1976) 3.24 N. Esbjerg, J.K. Norskov: Phys. Rev. Lett. 45, 807 (1980) 3.25 D. Gorse, B. Salanon, F. Fabre, A. Kara, J. Perreau, G. Armand, J. Lapujoulade: Surf. Sci.
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3.26 P. Eisenberger, W.e. Marra: Phys. Rev. Lett. 46,1081 (1981) 3.27 R.W. James: The Optical Principles of the Diffraction of X-Rays in the Crystalline State II
(Bell, London 1967) 3.28 I.K. Robinson: Surface crystallography. In Handbook on Synchrotron Radiation, Vol. 3, ed. by
D.E. Moncton, G. Brown (North-Holland, Amsterdam 1987) R. Feidenhans'l: Surf. Sci. Rep. 10, 105 (1989)
3.29 I.K. Robinson: Phys. Rev. B 33, 3830 (1986) 3.30 R. Feidenhans'l, J.S. Pedersen, M. Nielsen, F. Grey, R.L. Johnson: Surf. Sci. 178,927 (1986) 3.31 J. Bohr, R. Feidenhans'l, M. Nielsen, M. Toney, R.L. Johnson, I.K. Robinson: Phys. Rev. Lett.
54, 1275 (1985) 3.32 e.S. Fadley: Physica Scripta T17, 39 (1987) and references therein 3.33 T. Fujikawa: J. Phys. Soc. Jap. 50,1321 (1981); ibid. 51, 251 (1982); 54, 2747 (1985) 3.34 D. Sebilleau, G. Treglia, M.e. Desjonqueres, D. Spanjaard, e. Guillot, D. Chauveau,
J. Lecante: J. de Physique 49, 227 (1988) 3.35 S. Kono, S.M. Goldberg, N.F.T. Hall, C.S. Fadley: Phys. Rev. Lett. 41,117 (1978) 3.36 M. Sagurton, E.L. Bullock, R. Saiki, A. Kaduwela, e.R. Brundle, C.S. Fadley, 1.1. Rehr: Phys.
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3.37 A. Liebsch: Phys. Rev. B 13,544 (1976) D.K. Saldin, G.R. Harp, X. Chen: Phys. Rev. B 48, 8234 (1993)
3.38 1.1. Barton, C.C. Bahr, Z. Hussain, S.W. Robey, L.E. Klebanoff, D.A. Shirley: 1. Vac. Sci. Technol. A 2,847 (1984) K.C. Prince, B. Ressel, C. Astaldi, M. Peloi, R. Rosei, M. POlcik, C. Crotti, M. Zacchigna, C. Comicioli, C. Ottaviani, C. Quaresima, P. Perfetti: Surf. Sci. 377/379, 117 (1997)
3.39 A. Fricke: Phys. Rev. 16,202 (1920) 3.40 G. Hertz: Z. Phys. 3, 19 (1920) 3.41 P. Kronig: Z. Phys. 70, 317 (1931); 75,191,468 (1932) 3.42 D.A. Sayers, E.A. Stern, F.W. Lytle: Phys. Rev. Lett. 27,1204 (1971)
E.A. Stern, S.M. Heald: Handbook on Synchrotron Radiation, Vol. 1, ed. by Koch (NorthHolland, Amsterdam 1983) Chap. 10
3.43 S. Brennan, J. Stohr, R. Jaeger: Phys. Rev. B 24, 4871 (1981) 3.44 P.L. Cowan, J.A. Golovchenko, M.F. Robbins: Phys. Rev. Lett. 44, 1680 (1980)
1. Zegenhagen: Surf. Sci. Rep. 18, 199 (1993) 3.45 E.A. Stern: J. de Physique C 8, 47,3 (1986) and references therein 3.46 T.E. Madey, D.L. Doering, E. Berte1, R. Stockbauer: Ultramicroscopy 11, 187 (1983) 3.47 J.F. Van der Veen: Surf. Sci. Rep. 5, 199 (1985) 3.48 M. Gautier, G. Renaud, L. Pham Van, B. Villette, M. Pollak, N. Thromat, F. Jollet,
J.P. Duraud: J. Am. Ceramic Soc. 77, 323 (1994)
Chapter 4
4.1 Lord Rayleigh: Proc. London Math. Soc. 17, 4 (1887) 4.2 B.C. Clark, D.C. Gazis, R.F. Wallis: Phys. Rev. 134, 1486 (1964) 4.3 D.G. Castner, G.A. Somorjai, J.E. Black, D. Castiel, R.F. Wallis: Phys. Rev. B 24,1616 (1981) 4.4 G. Treglia, M.e. Desjonqueres: J. Phys. 46, 987 (1985) 4.5 R.F. Wallis: Prog. Surf. Sci. 4, 223 (1973), Surf. Sci. 299/300, 612 (1994)
M.G. Lagally: In SUiface Physics of Materials II, ed. by J.M. Blakely (Academic, New York 1975) Suiface Phonons, ed. by W. Kress, F.W. de Wette, Springer Ser. Surf. Sci., Vol. 21 (Springer, Berlin, Heidelberg 1991) K.P. Bohnen, K.M. Ho: Surf. Sci. Rep. 19,99 (1993) I.Yu. Sklyadneva, G.G. Rusina, E.V. Chulkov: Surf. Sci. 377/379, 313 (1997)
4.6 R.E. Allen, G.P. Alldredge, F.w. de Wette: Phys. Rev. B 4,1661 (1971)
4.7 R Stoneley: Proc. Roy. Soc. (London) A 232, 447 (1955) 4.8 D. Castiel, L. Dobrzynski, D. Spanjaard: Surf. Sci. 59, 252 (1976) 4.9 A. Blandin, D. Castiel, L. Dobrzynski: Sol. St. Commun. 13, 1175 (1973) 4.10 A. Fasolino, G. Santoro, E. Tossatti: Phys. Rev. Lett. 44,1684 (1980) 4.11 G. Allan, M. Lannoo: Phys. Rev. B 37, 2678 (1988)
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4.13 J. Szeftel, S. Lehwald: Surf. Sci. 143, 11 (1984) 4.14 J. Szeftel: Surf. Sci. 152-153,797 (1985) 4.15 J.E. Black, D.A. Campbell, RF. Wallis: Surf. Sci. 105, 629 (1981) 4.16 J.W.M. Frenken, J.F. van der Veen, G. Allan: Phys. Rev. Lett. 51,1876 (1983) 4.17 J.P. Toennies: Physica Scripta, T 19,39 (1987), Europhys. News 23, 63 (1992)
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ChapterS
5.1 J. Bardeen: Phys. Rev. 49, 653 (1936) 5.2 J. Friedel: Phil. Mag. 43, 153 (1952) 5.3 A. Brager, A. Schuchowitzky: Act. Physicochim. (USSR) 21,13 (1946); 21,1001 (1946)
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p.272 5.9 E.P. Wigner: Phys. Rev. 46,1002 (1934) 5.10 L. Hedin, S. Lundqvist: J. Phys. C 4, 2064 (1971)
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598 References
Appendix A
A.l G. Breit. H.A. Bethe: Phys. Rev. 93, 888 (1954) A.2 See, for instance, L.I. Schiff: Quantum Mechanics, 3rd, edn. (MacGraw-Hill, New York 1968)
p.353 A.3 J. Friedel: Phil. Mag. 43, 153 (1952): Nuovo Cimento, Suppl. 7, 287 (1958)
Appendix B
B.I R. Haydock, V. Heine, MJ. Kelly: J. Phys. C 5, 2845 (1972) R. Haydock: Solid State Physics 35, 296 (Academic, New York 1980) G. Grosso, G. Pastor-Parravicini: Adv. in Chemical Physics, LXll, 81 (1985)
B.2 F. Cyrot-Lackmann: Analyse de 1a structure electronique des systemes desordonnes dans l' approximation des liaisons fortes, Dissertation, Orsay (1968) J.P. Gaspard, F. Cyrot-Lackmann: J. Phys. C 6, 3077 (1973)
B.3 P. Turchi, F. Ducastelle, G. Treglia: J. Phys. CIS, 2891 (1982)
AppendixD
D.1 N.D. Lang: In Theory of the Inhomogeneous Electron Gas, ed. by F. Lundqvist, N.H. March (Plenum, New York 1981)
Appendix F
F.l I. Adawi: Phys. Rev. 134, A 788 (1964) F.2 G.D. Mahan: Phys. Rev. B 2, 4334 (1970) F.3 W.L. Schaich, N.W. Ashcroft: Sol. State Commun. 8, 1959 (1970); Phys. Rev. B 3, 2452 (1971) F.4 C. Caroli, D. Lederer-Rozenblatt, B. Roulet, D. Saint-James: Phys. Rev. B 8,4552 (1973) F.5 J.B. Pendry: Surf. Sci. 57,679 (1976) F.6 P.J. Feibelman, D.E. Eastman: Phys. Rev. B 10,4932 (1974) F.7 D. Spanjaard, D.W. Jepsen, P.M. Marcus: Phys. Rev. B 15, 1728 (1977)
Appendix G
G.l N.D. Lang: Phys. Rev. Lett. 55, 230 (1985): Phys. Rev. B 34,5947 (1986) N.D. Lang: In Scanning Tunneling Microscopy III, 2nd edn. ed. by H.-J. Giintherodt, R. Wiesendanger, Springer SeT. Surf. Sci. Vol. 29 (Springer, Berlin, Heidelberg 1994)
G.2 J. Bardeen: Phys. Rev. Lett. 6, 57 (1961) G.3 J. Tersoff, D.R. Hamann: Phys. Rev. B 31, 805 (1985) G.4 A. Selloni, P. Carnevali, E. Tosatti, C.D. Chen: Phys. Rev. B 31, 2602 (1985) G.5 C. Caroli, R. Combescot, P. Nozieres, D. Saint-James: J. Phys. C 4, 916 (1971)
C. Caroli, R. Combescot, D. Lederer, P. Nozieres, D. Saint-James: J. Phys. C 4, 2598 (1971) T.E. Feuchtwang: Phys. Rev. B 10,4121 (1974)
G.6 C. Noguera: J. Microscopy 152, 3 (1988)
AppendixK
K.I L.D. Landau, E.M. Lifshitz: Theory of Elasticity (Pergamon, Oxford 1959) K.2 C. Kittel: Introduction to Solid State Physics (Wiley, New York 1971)
Subject Index
Absorption cross-section 94 threshold 94
Activation energy for surface diffusion, see Chemisorption
Adatom 48, see also adsorption Adsorbate-adsorbate interactions, see
Interactions between adsorbates Adsorption 411-528
binding energy 411-528 isosters 414-415 isotherms 416-432
Bethe 430 Brunauer, Emmett and Teller (BET)
420-423 Fowler 424 Fowler-Guggenheim 430 Gibbs 414 Langmuir 417-420, 528-529
see also Physisorption, Chemisorption Advacancy 48 Affinity energy 455-458,468,473,477,488 501 Al(OOI) ,
electronic band structure 210-215 photoemission 385-386
Anderson-Grimley-Newns Hamiltonian 425, 455, 458-469, 473-474, 492, 499, 518, 532-533,580-581
Angle-Resolved Photoemission Extended Fine Structure (ARPEFS) 92-93, 149
Angle-Resolved Ultra-Violet Photoemission Spectroscopy (ARUPS) 378-387
Appelbaum and Hamann method 303-308 ARPEFS, see Angle-Resolved Photoemission
Extended Fine Structure ARUPS, see Angle-Resolved Ultra-Violet
Photoemission Spectroscopy Ashcroft pseudopotential 306 ASOS, see Solid On Solid models Asymmetric dimer model, see Si(I00) Asymptotic reconstruction, see reconstruction Asymptotic relaxation, see relaxation Atom diffraction 75
Atom scattering 74-78, 512 Atomic form factor 79 Atomic scattering factor 72-73, 88, 90, 543 Auger spectroscopy 98-99,378, 387,438
Back-bond surface states 271,276 Bardeen tunneling formalism 571 BCSOS, see Solid On Solid models Bethe isotherms, see Adsorption BET (Brunauer, Emmett, Teller) isotherms, see
Adsorption Binding energy of an adatom, see adsorption,
Physisorption, Chemisorption Bloch theorem 64,219,259,285,286 Bloch waves
evanescent 287,291,379,567-568 generalized 287-288,291,292,307,379,
567-568 propagating 287,379,567-569
Bond length of an adatom, see Chemisorption Born-Haber cycle 374-375 Born-Mayer potential 241,251,492,500 Born von Karman boundary conditions 164,
167,310,317,320,347,397 Bragg diffraction 43,437
condition 82, 85, 145 peak 79,85-86 rod 64,80
Bragg-Williams approximation condensation transition 423-427,529-530 order-disorder transition 435-438, 530 roughening transition in the lattice gas
model 35-36 Brillouin zone
surface 53-57 surface adapted 204,210-211,569 two-dimensional 54
Broken bond model 31,32,34,495 Buckling model, see Si(I11) Bulk modulus of homopolar semi
conductors 267
Cauchy relation 114 Channeling of ions 101
600 Subject Index
Characteristic function 228 Charge-charge response function 358 Charge-potential response function
bulk 317, 359 surface 330,343-344,448
Chemisorption activation energy for surface diffusion 452,
454,496,501-502,504,515-516 bondlength 452-453,488,495,500-503 charge transfer 452,455-458,466,492,518,
523 energy 411-528 function 460, 463, 519 site 452-453,472-473,488,495, 501-502 vibration frequencies 452, 505-514 see also Interactions between adsorbates
Cohesive energy homo polar semi-conductors 265-267 transition metals 238-242,491
Collective electronic excitations, see Plasmons Compton scattering 85 Condensation phase transition 416,423-432 Contact potential 393 Continued fraction technique 545-552
electrons 220,223-224, 228, 498, 532-533 phonons 134-137
Core level energy shifts, see Surface core level binding energy shifts and Surface core level spectroscopy
Correlation energy 178-187,251,295,355-370, 409,475-477,492,498-504,523,556
Corrugated hard wall model 75-78 Coulomb integral 232,366-367,409,456-459,
467,499,501,538 Crystal field integrals 218,219,242,257 Crystal truncation rods 85-86 Cu(I00) flat surface 408-409 Cu(I00) stepped surface 43 Cu(110) 381-384 Cu(lll) 353-355
Dangling bond (or orbital) 269-274, 277-283 Debye frequency 143 Debye model 141 Debye temperature
bulk 140-143 surface 140--143, 146
Debye-Waller factor 71,91,98,143-152 in atom scattering 147 in low energy electron diffraction 145-146 in photoelectron diffraction 147-149 in surface extended X-ray absorption fine
structure 150-152 in X-ray scattering 147
Density functional formalism, see Local density functional formalism
Deshybridization energy 270 DGSOS, see Solid On Solid models Dielectric function 312-318,324,338,446,449,
554, 560 longitudinal 554-556 transverse 554-556
Diffraction at surfaces 63-86 pattern 64-86,101-104 rods 64-83
Diffusion factor, see Scattering factor Dimer model, see Si(I00) Dipolar approximation 90, 94, 561
selection rules 91, 96 Dipole-dipole interaction 438-439, 523-524 Dipole layer 174,185, 188,233-234 Dipole-surface interaction 439-440 Dispersion curves
electrons 189-215,219,370,378-389,527 complex 198,286-287,353
phonons 113-114,119,123,128-131 plasmons
bulk 319 Surface 323-335
Dispersion forces, see Van der Waals forces Displacement correlation function 143, 145, 150 Dissociative chemisorption of molecules
454-455,504-505 Drude model 315,319,322,407-408 Dynamical matrix 106-108, 134, 549
reduced 112, 127 Dynamical polarizability 442-443,446,
450-451,578-579 Dyson equation 515,562
EAPFS, see Electron Appearance Potential Fine Structure
EELS, see Electron Energy Loss Spectroscopy Effective medium theory 77,451,475-491,
508-512 generalized 534, 536
Elastic constants 114, 121 in cubic crystals 581-584
Elastic energy 584 Elastic force constants, see Force constants Elastic strain 581-582 Elastic stress 121, 582-583, see also Surface
excess stress Elastic waves 583-584, see also Rayleigh waves Electron Appearance Potential Fine Structure
(EAPFS) 100, 101 Electron Energy Loss Spectroscopy (EELS)
128-131,371,392,453,508,512
Electron mean free path 71-72,88,91,98-99, 371,379,381,569-570
Electron reflectivity 351-355 Electron Spectroscopy of Chemical Analysis
(ESCA) 371 Electron Stimulated Ion Desorption Angular
Distribution (ESDIAD) 101 Embedding energy
in chemisorption 486-491 in jeUium 475-478 in real medium 478-486
Equilibrium shape of crystal 7-16,44,45, 395 of a step 29, 46
Equivalent core approximation 374 ESCA, see Electron Spectroscopy for Chemical
Analysis ESDIAD, see Electron Stimulated Ion
Desorption Angular Distribution Ewald construction 64-65,80-81 EXAFS, see Extended X-ray Absorption Fine
Structure Exchange energy 177-187,295,361-365,
367-368,475-477,501,556 Exchange integral 367-368 Extended X-ray Absorption Fine Structure
(EXAFS) 93-99,104-105
Facetting 13-15 FEM, see Field Emission Microscopy Field Emission Microscopy (FEM) 394,453 Field evaporation 58 Field Ion Microscopy (FIM) 57-60, 452, 501,
515-517 FIM see Field Ion Microscopy Fluorescence signal 98-99 Force constants
angular 111, 112 central 107-110,508,510-512,514
Force theorem 399-401 Fowler adsorption isotherm, see Adsorption Fowler-Guggenheim adsorption isotherm, see
Adsorption Fredholm formula 360, 558-559 Frequencyequation 122 Friedeloscillations 169, 397,485,490 Friedel's sum rule 466,476,492,543-544
GaAs(110) 391-392 Gamma plot (y-plot) 7-16,41,44,395 Gibbs adsorption equation 414 Gibbs adsorption isotherm, see Adsorption Gibbs equimolecular dividing surface 5 Green function matrix method 514-515
Subject Index 601
Green operator (or function) 134-135,222-226, 365,459-471,518-519,545-551,562-566, 580-581
GR matrix method 77
Harmonic approximation 106, 108, 505, 508, 549
Harrison model 269-270,273,279-283,407 Hartree approximation 359 Hartree-Fock approximation 178, 364, 366,
458,462,464,466-468,499,515,580-581 Hartree-Fock energy 364, 368 Hartree potential 184,247,372 Height correlation function 18-19,26,29,
39-40 Helium diffraction 75-78 Herring construction 13-15 Heteropolar semiconductors 265, 268, 284-285 High index surfaces, see Stepped surfaces Homopolar semiconductors 215-217,254-283 Hooke's law 111,583 Hopping integrals
d bands 235-238 definition 219 sp bands 255-258 see also Tight-binding approximation
Hubbard hamiltonian 361-370,409,499 Hiickel method 217,515 Hydrogen on transition metals 489-490, 537
lABS, see Inelastic Atom Beam Scattering Image potential 185, 338-355, 456-457 Image surface states 348-355, 387 - 389,
408-409 Inelastic Atom Beam scattering (lABS) 128,131,
512 In Sb(11l) 86-87 Integrated intensity in X-ray scattering, see
X-ray scattering Integrated photoemission, see Photoemission
spectroscopy Interaction between adsorbates
dipolar 523-524 elastic 524-525 electronic 517-523
direct 522-523,537-538 indirect 518-522
Interatomic forces, see Force constants Intersite density of states 365 Inverse Photoemission Spectroscopy
isochromat 387 k-resolved (KRIPES) 387-389
Ion Desorption Angular Distribution, see ESDIAD and PSDIAD
602 Subject Index
Ionization energy 374,455-458,468,473, 501 Ionization field 58 Ion scattering 101 Ising model 34-36,431 Isoster, see Adsorption Isosteric heat of adsorption 414-415,419-420,
427,431 Isotherm, see Adsorption
Jellium model chemisorption 455,469-474, 520 electronic states 163-188 embedding energy 475-478 image potential 339-346 Physisorption 445-452 plasmons 311-335
Jones zone 216-217
Kelvin method 393 Kink 19-29,46,47,48
energy 20-21 Kohn-Sham method 183-188,556 Koopmans's theorem 372 Kosterlitz-Thouless transition 40-41 KRIPES, see Inverse Photoemission
Spectroscopy
Langmuir isotherm, see Adsorption Lattice
coincidence 69 rationally related 68-69, 85 simply related 68-69
Lattice gas model 34-37,423-438 Laue condition 80 Layer KKR method, see Propagation matrix
method LDOS, see Local Density of States LEED, see Low Energy Electron Diffraction Leman-Friedel model 258-267 Lippmann-Schwinger equation 471,562-563 Local charge neutrality condition 233-234,243,
268,367,373,492-495,499,521 Local density functional formalism 77, 177-181,
334,399-401,556-557 chemisorption 469-491 image potential 338-355 semi-infinitejellium 181-188 validity 356-361
Local Density of States (LDOS) at point r 61,301-302,389-390,526,575,577 in tight-binding method 220-234, 243-254,
363-367,375,459-463,492-493,499-500,521
Long range order parameter 433-438, 530
Low Energy Electron Diffraction (LEED) 70-74,271,292-294,301-303,355,385,437, 452,513,526,566
Madelung energy 232 Maxwell equations
in matter 312-313,553-554 in vacuum 552-553
Mean free path, see Electron mean free path Mean square displacements 140-152,159-161
relative 147-152 Metal electronic structure
jellium model 163-180 KKR method 294-303 nearly free electron model 188-215 tight-binding model 235-254 see also Plasmons, Image potential
Metropolis algorithm, see Monte-Carlo method Microcalorimetry 452 Mo(llO) and (100) 246,254,303 Molecular model for semiconductors 258-259,
262-263,268-271 Moments of a density of states 223, 226-229,
240,243,493,497,520-521,552-554 Theorem of 404
Monte-Carlo method 38-40, 432, 437 in roughening transition 38-40 Metropolis algorithm 38
Muffin-tin approximation 163,210,284, 294-298,385,526
Multilayer reconstruction, see Reconstruction Multilayer relaxation, see Relaxation Multiphoton photoemission 355 Multipole surface plasmons 335
Nearly free electron model 163,188-217, 304-305, 352-355
bulk electronic states 188-196 surface electronic states 197-215,401
Normal vibration modes 159-161
One particle excitation spectrum 467 Optical selection rules 380-385,409, see also
Dipolar selection rules Optical transition matrix element 90, 92, 94,
377-380,560-562,566 Order-disorder transition, see Phase transition Oscillator strength 442, 446, 579 Oxygen
overlayer on Ni(loo) 525-528 on transition metals 489-490
Partition function 28, 137, 417-438 Patterson function 83-87
Phase transition condensation 416,423-432,529, order-disorder 416,432-438,517, 525, 530 roughening 15-43
PhD, see Photoelectron Diffraction Phonon, see Vibration modes Photoelectric effect 86-87 Photoelectron Diffraction (PhD) 86-93, 380 Photoemission spectroscopy 370-387,409-410
calculation of intensities 385 core level 371-377 integrated 377-378 selection rules 363-366, 409 valence states 377-387 see also Inverse photoemission spectroscopy
Photon Stimulated Ion Desorption Angular Distribution (PSDIAD) 101
Physisorption 411,416-452,487 pi (n)-bonded chain model, see Si(111) Pinning potential 15, 19,25, 27 Plasmons
bulk 311-320,335-338,449 Surface 310-311,320-335,338,407,408
Primitive cell 48 Projected bulk band structure 214-215,
276-277,384 Propagation matrix method 284-294
layer KKR method 284,294-303,385, 526-528
pseudo-potential method 306-310 Pseudo-potential method 163, 264, 303-310,
472-473
Quasi-chemical model 427-431,437
Random Phase Approximation (RPA) bulk plasmons 316-320,335-338 exchange-correlation energies 356-361 surface plasmons 329-335, 338
Rayleigh waves 120-123,129,130-131,153,154 Reciprocallattice 53-57,63-86 Reconstruction 49-51,68,102-104,124,243
asymptotic 125-127 multilayer 125-127,254 see also InSb(111), Si(I00, Si(1l1), W(OOI)
Recursion method 545-547 Relaxation 49,51,124,243,251-254,524
asymptotic 125-127 multilayer 125-127,254
Richardson formula 354 Roughening transition 15-43
lattice gas model 34-37 renormalization approach 28-29 solid on solid (SOS) models 37-43 temperature 15,29, 36-40,43
Subject Index 603
RPA, see Random Phase Approximation
Scanning tunneling microscopy (STM) 60-62, 275,389-392,452,571-578
Scattering factor, see Atomic scattering factor Scattering phase shifts 73, 89-90, 96-98, 298,
476-477,540-544 Secondary electrons 86, 376, 378, 394 SEELFS, see Surface Electron Energy Loss Fine
Structure Self-energy 370,467-468,499 Semi-conductor electronic structure
nearly free electron model 215-217 tight-binding model for the bulk 254-269 tight-binding modelfor surfaces 267-284,373
SEXAFS, see Surface Extended X-ray Absorption Fine Structure
Shift integral, see Crystal field integrals Shockley surface states 199,354-355,388-389,
409 Si(lOO)
ideal 275-278 (2 x I) reconstructed with asymmetric
dimers 281-285 (2 xl) reconstructed with symmetric
dimers 278-280 Si(lll)
ideal 271-272 (2 x 1) reconstructed, buckling model
272-274 (2 xl) reconstructed, n bonded chain
model 274-275,407 SIRS, see Surface Infra-Red Spectroscopy Slab methods
phonons 119-120, 134 electrons 220,308-310
Slater-Koster parameters 219 d bonds 236-238 pd bonds 494 sd bonds 494 sp bonds 255-256
Soft phonon 125, 156-157 Solid On Solid (SOS) models 36-40
Absolute (ASOS) 37, 39-40 Body-Centered (BCSOS) 40 Discrete Gaussian (DGSOS) 38-40
SOS, see Solid On Solid models Spectral densities of vibration modes 133-137
bulk 133-140 local 133-137,138,141,157-158,512-513
Sp3 hybrids 256-264,268,271, 275-279 SRS, see Surface Raman Spectroscopy Step 8, 16, 19,27,29,43-48, 53, 66-68
energy 8,22,24,31-33,41,43,44,405,406
604 Subject Index
equilibrium shape 29 roughening 29-43
Stepped surfaces 8, 43, 53, 62, 66-68, 104 STM, see Scanning Tunneling Microscopy Strain, see Elastic Strain Stress, see Elastic Stress Structure factor 79 Surface Brillouin zone 53-57, 101
adapted 204,210-211,569 Surface core level binding energy shifts 92, 268,
371-377, 503 Surface core level spectroscopy 245, 371-377,
452,492 Surface deformations 6-7
elastic 6-7 plastic 6-7
Surface dipole layer, see Dipole layer Surface electron density 168-169, 173-174,
182-183 Surface Electron Energy Loss Fine Structure
(SEELFS) 100-101 Surface electronic energy 170, 175-176,
184-187, 247-254, 360-361, 366-369, 405-406,491
Surface electronic resonances 162,210,220,222 Surface electronic states
definition 162 nearly free electron model 188,197-215,401,
408,409 tight-binding approximation 220, 222, 224 at semi-conductor surfaces 268-284 propagation matrix method 287,291,
301-303,307-308 in Al 210-215,310,385-386 experiments 370,378-379,384-385,388-389,
392 see also Image surface states, Shockley surface
states, Tamm surface states Surface excess stress 6-7 Surface excess thermodynamical quantities 4-7,
412-413 enthalpy 6,413 entropy 6,413 free energy 5-41,395-413 internal energy 6, 16, 413 work 7
Surface Extended X-ray Absorption Fine Structure (SEXAFS) 93-99, 452
Surface heat capacity 6 Surface Infra-Red Spectroscopy (SIRS) 128 Surface photoelectric effect 385, 560 Surface plasmons, see Dispersion curves,
Plasmons Surface Raman Spectroscopy (SRS) 128
Surface reciprocal lattice 54, 63-86 Surface reflectivity 79 Surface segregation energy 375 Surface vibrational thermodynamical functions
entropy 137-139, 158-159 free energy 137-139 internal energy 137,139-140,158-159 specific heat at constant volume 137, 139-140
Surstructures 51-53,68-71 notations 51-53
susceptibility, see Charge potential response function
Synchrotron radiation 78, 94, 100
Ta(llO) and (100) surface core level shifts 375-377
Tamm surface states 225 Terrace, Ledge, Kink (TLK) model 48 Thermal desorption 452 Thermal diffuse scattering 85, 145 Thermionic emission 394 Thomas Fermi Approximation 181-183 Thomas-Fermi-Dirac-Gombas model
182-183,398-399 Thomson formula 79 Tight-binding approximation
chemisorption 491-505,509-513,520-523, 536-537
correlations 361-370 formalism 217-234,545-552 semiconductors 254-284, 406 transition metals 235-254, 372-373, 402-406
TLK model, see Terrace, Ledge, Kink model T matrix 565-566 Total photoemission yield 98-99 Tunnel effect 60 Tunneling current 60-61,571-578 Two dimensional Bloch theorem 64 Two dimensional Bravais lattices 49-50 Two dimensional Brillouin zone 53-57 Two dimensional Ewald construction 64-65 Two dimensional lattices 48, 68-69 Two dimensional point groups 49 Two dimensional reciprocal lattice 53-57 Two dimensional space groups 49
Ultra-violet Photoelectron Spectroscopy (UPS) 378, 380, 453
theory 559-570 Umklapp process 380,383 UPS, see Ultra-violet Photoelectron
Spectroscopy
Van der Waals forces 75,411,438-452,487, 531-532
Van Hove singularity 230,245 Vibrating capacitor method 393 Vibration modes
of adsorbates 452,505-514 bulk 112-114 surface 114-123,128-131,153-155
Vicinal surfaces, see Stepped surfaces Viriual bound states 462,473,478
W(OOI) reconstruction 102 W(1IO) and (100) surface core level
shifts 375-377 Wentzel-Kramers-Brillouin (WKB)
approximation 577
Subject Index 605
WKB, see Wentzel-Kramers-Brillouin approximation
Work function 61,183,187-188,393-394,452, 455,466,492
Wulff construction 11-13,44,45, 395
XPS, see X-ray Photoelectron Spectroscopy X-ray Photoelectron Spectroscopy (XPS) 377,
380,453 X-ray scattering
at grazing incidence 78-86 integrated intensity 80-83
X-ray standing wave method 100