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Reconfigurable, High Density, High Speed, Radiation Hardened FPGA Technology MAPLD2009 S.Ramaswamy 1 , Leonard Rockett 1 , D. Bostedo 1 Rajit Manohar 2 , Clinton W. Kelly, IV 2 , John Lofton Holt 2 , V. Ekanayake 2 , Dan Elf Ken LaBel 3 , Melanie Berg 3 1 BAE SYSTEMS, 9300 Wellington Road, Manassas, VA, 20110, USA 2 Achronix Semiconductor Corporation, 333 W. San Carlos Street, San Jose, CA, 95110, U 3 NASA Goddard, 8800 Greenbelt Road, Greenbelt, MD, 20771, USA &

Reconfigurable, High Density, High Speed, Radiation Hardened FPGA Technology MAPLD2009 S.Ramaswamy 1, Leonard Rockett 1, D. Bostedo 1 Rajit Manohar 2,

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Reconfigurable, High Density, High Speed, Radiation Hardened FPGA Technology

MAPLD2009

S.Ramaswamy1, Leonard Rockett1, D. Bostedo1 Rajit Manohar2, Clinton W. Kelly, IV2, John Lofton Holt2, V. Ekanayake2, Dan Elftmann2

Ken LaBel3, Melanie Berg3 1BAE SYSTEMS, 9300 Wellington Road, Manassas, VA, 20110, USA2Achronix Semiconductor Corporation, 333 W. San Carlos Street, San Jose, CA, 95110, USA3NASA Goddard, 8800 Greenbelt Road, Greenbelt, MD, 20771, USA

&

&2

Agenda

RHFPGA Roadmap

RHFPGA Product Features

Achronix Technology Overview

BAE Radiation Hardened Process Technology Overview

RHFPGA Product Features

Summary

&3

BAE Systems Radiation Hardened FPGA Roadmap

• Heritage: Actel ONO RH1280 and RH1020

• Anti-fuse technology, non-volatile

• 0.8 µm RH CMOS, 5V Supply

• In production since 1996, over 25,000 shipped

• M2M Anti-fuse Technology:

• 250K-gate (RHAX250-S)

• RH15 CMOS, 1.5 V Core / 3.3 V I/O

• Flight Orders in 2009

• High Density, re-configurable, non-volatile

• Radiation Hardened, high speed

• RH15 CMOS, 1.5 V Core / 3.3 V I/O

• Hardware Verification in 4Q 2009

Rad Hard FPGA Product

Past

Present

Future

Re-installin progress

Entry Vehicle

&4

RHFPGA - RadRunner Technology Highlights

Product Name

Reconfigurable Achronix picoPIPE Radiation Hardened FPGA Acceleration Technology

– 200 MHz System Performance

– SRAM-based FPGAs

– Field reprogrammable Built-in Redundancy Voting Circuits (RVC) transparently protect the user design from Single Event

Effects (SEE)

Built with proven Rad Hard 150 nm CMOS Technology (RH15) from BAE Systems

– Configuration Memory based upon proven BAE Systems hardened SRAM cell technology

– Total-dose tolerance greater than 1 Mrad • Upset rate of less than 1E-12 upsets per bit-day

• Prompt dose levels are >1E9 rad/sec

Mil-Spec Temperature Operation -55 °C to 125 °C

Full Compatibility with Existing EDA Tools

&5

Achronix Company Overview

Privately held fabless semiconductor company founded in New York in 2004

Achronix received $34.4M Series A funding in January 2007

Completed $52.1M Series B funding in October 2008

Founders developed technology in 1998 at Cornell University

Headquartered in San Jose, CA

Partnerships with the world leading foundry TSMC, and numerous IP & EDA vendors

65 nm commercial FPGA silicon from TSMC completed Qualification and is currently shipping

Partnership with BAE Systems to develop RadHard FPGAs

Series of Patents protect key IP

Achronix Corporate Overview

&

Reconfigurable RHFPGA Proof of Concept

6

POC ReadyOption for QML Qualification

Commence Enhancement of the FPGA

Key Roles to support Reconfigurable RHFPGA Proof of Concept:

NEPP:(NASA Electronic Parts and Packaging)

Radiation Testing• TID• SEE

• PROTON

Product Definition

&7

Achronix RHFPGA Technology

&8

Achronix Core Technology

Core contains ‘picoPIPE’ technology used for both logic and routing– You do not need to know the details in

order to benefit from this

Fully synchronous I/O ‘frame’ surrounds the core

picoPIPE technology is used to implement synchronous hardware – A design is input using a HDL such as

RTL

– The RTL does not need to be targeted to picoPIPE technology

Achronix FPGA

Globally-clockedlogic

‘frame’

picoPIPElogic core

Looks like a regular FPGA, but has approx 4x throughput

&9

Friday, April 21, 2023

D1 D Q

CLK

D Q

Globally clocked pipeline stage

Traditional Data Tokens

CLK

D1

Q1

Active edge Active edge

In globally-clocked logic, a data value at a clock edge can be considered as a “Data Token”

– Only valid data (data at a clock edge) is propagated

– Hence each register outputs a new Data Token (value) at every clock edge

Traditional FPGA

01Q1 Q2

1

&10

Friday, April 21, 2023

picoPIPE Data Tokens

Data 1

Data 0

Acknowledge

Data 1 Valid Data 1 Reset

Data 0 Valid Data 0 Reset

Acknowledge Valid

IDLE Acknowledge Data ResetData Valid IDLE Data Valid Acknowledge Data Reset IDLE

Acknowledge Reset

Acknowledge Valid

Acknowledge Reset

Phase

Data 0

Data 1

Acknowledge

picoPIPE pipeline stage

TxRx TxRx1

picoPIPE logic also communicates with Data Tokens– Each data token uses 2 signals

instead of 1– Data Token transfers use a four

phase handshake– Data validation (clock-like

functionality) is performed using acknowledge instead of a global clock

0

Achronix FPGA

&11

Friday, April 21, 2023

Pipelining Increases Throughput

Traditional FPGA Globally Clocked Logic is not balanced The clock rate must allow for the slowest

path in the entire clock domain Any combinatorial logic faster than the

slowest path (by definition, all remaining logic) waits for the slowest one to finish

Globally-clocked Logic

1.5

GH

z3

75

MH

z

Achronix FPGA Achronix technology allows fine-grained

pipelining Allows data rate to be much faster Pipelining also allows more data values in

flight Equates to faster throughput

Tra

ditio

nal

Ach

roni

x

picoPIPE Logic

0ps .67ns 1.3ns 2.0ns 2.7ns 3.3ns 4ns 4.7ns 5.3ns 6ns 6.7ns 7.3ns 8ns 8.7ns 9.3ns 10ns 10.7ns

D Q D QD Q

clk

1234

12345678910111213141516

&12

Interconnect

RLB RLB RLB

RLB RLB RLB

RLB RLB RLB

Fam

iliar

Sili

con

4-inputLUT

4-inputLUT

4-inputLUT

4-inputLUT

4-inputLUT

4-inputLUT

4-inputLUT

4-inputLUT

Familiar Silicon & Familiar Tools

Traditional 4-input LUT architecture– With GHz performance

SRAM-based reprogrammable FPGA– Uses BAE’s Radiation

Hardened SRAM cell

Synplify-Pro and Mentor Precision Synthesis Flows

Full compatibility with existing third party simulation, debug, and verification toolsF

amili

ar T

ools

&13

Copy 1

Copy 2

Loca

l Vot

ing

Distance avoids both being affected

by same event

Achronix Patented SEE Mitigation Methodology: Redundancy Voting Circuits (RVC)

Local voting waits until both copies agree– no SEE, values will agree at the voter,

tokens propagate

– When SEE occurs values won’t agree at voter, local voter blocks token propagation

– After event energy dissipates the upset

circuit value is resolved to the correct value and tokens propagate

Redundancy Voting Circuits (RVC)– Two copies of all circuits are implemented

– Copies are non-adjacent to avoid the risk of a single upset affecting both

– Every stage (combinatorial and state) has local voting mechanism

&14

RadRunner Process & Packaging Technology

&15

RadRunner Technology

RadRunner Key Technology Features:Process RH15FThin Oxide / DGO Devices 26 Å / 70 ÅVdd Options 1.5 V / 3.3 VMetal Levels 7Capacitors YesResistors YesMask Levels 33 P1, M1 - OPC CA, CT – Phase ShiftPackage Interface

Product Die Size

Package Type

C4

21.4mm x 21.4mm

624 CCGA

&16

16M SRAM – Next-Generation Strategic RH SRAM

RH15 Process Maturity - Memory

Transistors 113,070,511HVT NFETS 74,422,289HVT PFETS 38,645,756DGO NFETS 1,630DGO PFETS 836R2 Resistors 36,410,528

Q2 Capacitors 18,205,264

Total ILCs 1,063,783,005CA 298,967,451CT 226,146,395V1 212,067,749V2 242,233,858V3 82,209,612V4 1,011,258V5 506,746V6 639,936

Configuration Memory Cell for RadRunner uses the 16M SRAM Cell

Access Time 15-20 ns

Process Technology 0.15 µm CMOS

Die Size 16 mm by 16 mm

Power Supply 1.5 V + / - 10% core2.5 or 3.3 V + / - 10% I/O

Power Dissipation 10 mW/MHz at 1.5V (per die)100 mW standby

Temperature Range -55°C to +125°C

Packaging 23.2 mm by 26.2 mm by 6.0 mm100 pin Flat Pack (5-high stack)

Radiation Hardness Total Ionizing Dose > 1Mrad(Si)Prompt Dose > 1E9 rad(Si)/secSEU < 1E-12 errors / bit-day (W.C. 90% GEO)Latch-up: Immune

ESD Class 2

Screening level Prototype and Flight flows

Organization 2Mx8 die – single chip package2Mx32 4-high package2Mx40 5-high package512Kx32 die – single chip package

&17

RadRunner Package

CGA Package– 624 Total I/O

– Substrate– ceramic 32.5 mm x 32.5 mm

– 25 x 25 Column Grid Array

– 1.27 mm Pitch

– 624 Total I/O

• 223 Signal

192 General Purpose (96 LVDS pairs)

31 Single Ended dedicated I/O

• 4 VCIO / 4 VCREF / 4 VREF

• 182 VDD15 / 18 VDDIO / 4 AVDD

• 184 GND / 1 SR (Seal Ring)

16 Low Inductance Flip Chip Capacitors

Hermetic Seam Weld Sealing– Provides Thermal Enhancement Option

&18

RadRunner Product Features

&19

Die Size: 21.4mm x 21.4mm

Asynchronous Blocks

• Reconfig. Logic Blocks (RLB)

• Routing Resources

• BRAM

Synchronous Blocks

• General Purpose I/O Banks

• Clock and Reset I/O Banks

• PLL

• FPGA Configuration Unit (FCU)

RadRunner Functional Blocks

PLL

General Purpose I /Os

Boundary Elements (BEs)

Bou

ndary

Ele

men

ts (

BEs)

Bou

ndary

Ele

men

ts (

BEs)

Boundary Elements (BEs)

General Purpose I /Os

CLK I/O

CLKI /O

CLK I/O

Genera

l Purp

ose

I/O

s

Genera

l Purp

ose

I/O

s

CLKI /O

CFG

RLB

s

RLB

s

RLB

s

Blo

ck R

AM

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

RLB

s

ds002_06_v01

PLLsPLLPLLs

Synchronous Asynchronous Blocks (SAB)

• Synchronous to Asynchronous Converter (SAC)

• Asynchronous to Synchronous Converter (ASC)

&20

RadRunner Functional Highlights

Logic Capacity

– 8,640 4-input Look-Up Tables (LUT)

– Ten 200 MHz 18 Kb Two Port (RW) RAM Blocks

Proven Radiation Hardened PLLs (4)

– Reference Frequency range: 22 to 500 MHz

– Output Frequency Range: 25 to 350 MHz

– Lock Time: 200 µs

I/O Capacity and Features

– 192 User Programmable I/Os

– Programmable keeper circuit – Programmable Drive Strengths

– Schmitt Trigger Receivers

– Supported I/O Standards

• LVTTL 3.3 V

• LVCMOS 1.8 V / 2.5 V / 3.3 V

• LVDS 2.5 V with On-Die-Termination

• PCI 3.3V

• SSTL 1.8 V / 2.5 V

• HSTL 1.8 V

– Dedicated SpaceWire I/O Data and Strobe (DS) Clock Recovery Circuits to support link transfer rates up to 125 Mbps

&21

04/21/23

Proposed Achronix RadRunner Product Feature Set

Dev

ice

R

esou

rces

Pac

kage

RadRunner Family (150 nm)

&22

RadRunner BRAM

Each RadRunner device features 10 instances of 18,432 bit Block RAM (BRAM) deployed in a vertical column

The RadRunner Block RAM is implemented with a synchronous BAE memory block wrapped within Achronix asynchronous interface circuits

The block RAM supports two ports, one for writing and one for reading (1W, 1R)

Initialization– Initial content of the block RAMs will be

loaded during device configuration

– Read Port output will be initialized to all zeros 

– Data output from last read is retained when read port enable is not asserted

Feature Value

Block RAM Size 18 Kb

Organization 16K x 1, 8K x 2, 4K x 4, 2048 x 9, 2048 x 8, 1024 x 18, 1024 x 16, 512 x 36, 512 x 32

Performance 200 MHz

Physical Implementation

Single column in device

Number of Ports Two ports (1 read and 1 write)

Port Access Synchronous

Contention

Mitigation

Simultaneous Read and Write access from the same address location is not supported

&23

RadRunner SpaceWire Support

The SpaceWire standard1 provides a point-to-point full-duplex serial data communications link

The simple circuitry requirements, low power consumption, and high-link speeds have led to an increased usage of the SpaceWire links and networks

The embedded SpaceWire clock and data recovery circuits support data rates from 2 to 125 Mbps

Each of the 4 I/O banks have dedicated LVDS I/O pairs with hard-wired connections to the received clock-and-data-recovery protocol for the SpaceWire Strobe and Data signals

When not used as SpaceWire I/O pins, these I/O are available as normal general-purpose I/Os

The on-die LVDS termination allows a RadRunner FPGA to interface directly with other SpaceWire capable devices

Link Start Pattern

D

S

Q

QSET

CLR

D

Q

QSET

CLR

D D1

D0

XOR Recovered Clock

Receiver Embedded Logic

FPGA picoPIPE Logic Fabric

Device LVDS Inputs

D

S

XOR Recovered Clock

0 1 1 1 0 1 0 0 1 0 00

SpaceWire Clock & Data Recovery Embedded Circuit

1 European Space Agency Standard: ECSS-E-50-12A

SPACEWIRE

LOCAL

SP

AC

EW

IRE

SP

AC

EW

IRE

SPACEWIRE

LOCALDEVICE

SPACEWIRE

LOCAL

SP

AC

EW

IRE

SP

AC

EW

IRE

SPACEWIRE

LOCALDEVICE

SPACEWIRE

LOCAL

SP

AC

EW

IRE

SP

AC

EW

IRE

SPACEWIRE

LOCALDEVICE

SPACEWIRE

LOCAL

SP

AC

EW

IRE

SP

AC

EW

IRE

SPACEWIRE

LOCALDEVICE

SPACEWIRE LINK

SPACEWIRE LINK

SPACEWIRELINK

SPACEWIRE LINK

SPACEWIRE LINK

SPACEWIRE LINKSPACEWIRE LINK NETWORKMANAGERS

PA

CE

WIR

E

SP

AC

EW

IRE

&24

Overview of Device Configuration Methodology

RadRunner devices may be configured via one of three available options:– IEEE 1149.1 JTAG (via Bitporter)– SPI Flash (on-board Flash

Programming via Bitporter)

– CPU 8 Bit Parallel Interface The Bitporter hardware connects to the

host computer (Linux or Windows) through one of two available options:– Universal Serial Bus (USB) – 10/100 Ethernet port

The Bitporter connects directly to the chip via an EJTAG compliant connector

Bitporter control software can be run from either the Windows or Linux operating systems– Available as a stand-alone utility

or integrated into the ACE environment

EJTAG compliant connector

2.54 mm

1413

2.54 mm

21

Top View PCB

0.64 mm

5.84 mm

Side View PCB

1

Signal Positions

GNDTRST*

GNDTDI

GNDTDO

GNDTMS

GNDTCK

keyNC

VIONC

Pin 12 removed to allow for key

&25

Friday, April 21, 2023

Block Diagram of Configuration Checker

Configuration Data Checker Description– A Finite State Machine (FSM) within the FPGA

Configuration Unit (FCU) manages the process of checking the validity of the configuration bits • CFG_CHK_ENABLE is a dedicated external static input

signal to enable or disable the checking process when the FCU state machine enters user mode

• A Programmable delay counter allows user to specify delay between configuration check cycles

– When enabled the configuration-data checker runs in the following sequence:• A 32-bit Cyclic Redundancy Code (CRC32) is calculated

for the configuration data of the RadRunner Core configuration bits (except the BRAM)

The ACE tools compute a CRC32 signature which gets loaded into the part during the configuration process

When this CRC32 signature gets included in the calculation the resulting CRC32 quotient should result in a fixed value ─ 32’h0704DD7B

• An XOR chain computes the parity of the S-Frame configuration bits

S-Frame configuration bits get stored in a manner similar to a serial shift register

The final parity result of the S-frame calculation is compared to a pre-determined (by ACE) value

• CFG_MEM_ERR, an external device output will be asserted when either the CRC32 or XOR parity computation are incorrect

S-F

ram

e

Achronix Radrunner FPGA

FCU

picoPIPE Logic Fabric

FPGA Core Configuration (minus BRAM) CRC-32

check

S-Frame configuration bits (serial shift registers)

Q

QSET

CLR

D

Q

QSET

CLR

D

Q

QSET

CLR

D

Q QS

ET

CLR

D

Q QS

ET

CLR

D

Q QS

ET

CLR

D

Q QS

ET

CLR

D

Q QS

ET

CLR

D

Q QS

ET

CLR

D

Q

Q SET

CLR

D

Q

Q SET

CLR

D

Q

Q SET

CLR

D

Q

QSET

CLR

D

Q

QSET

CLR

D

Q

QSET

CLR

D

QQS

ET

CLR

D

QQS

ET

CLR

D

QQS

ET

CLR

D

QQS

ET

CLR

D

QQS

ET

CLR

D

QQS

ET

CLR

D

FCU

Delay Set

FSM

CRC CheckParity bit Check

Config check error

&26

SUMMARY

Program Fulfills Critical Need for Reconfigurable RH FPGAs for Strategic Applications

Excellent Partnership between BAE Systems and Achronix Ongoing

Initial Achronix Commercial Chip First Pass Success

Test Chip Functionality Demonstrated, Radiation Testing Successful

RadRunner Completing Fabrication

Proof-Of-Concept Demonstration to be completed 4Q09