Acquisition of Surface-Enhanced Confocal Raman-AFM

Chang Y. Ryu, Rensselaer Polytechnic Institute, DMR 0722563

The state-of-art confocal Raman-AFM instrument allowed us to simultaneously characterize the topographic morphology and chemical structure information of organic semiconducting materials (e.g. pentacene in the figure).

Pentacene has been studied for the flexible display applications as an active layer for organic thin film transistor. We are currently investigating the correlation between the AFM morphology and chemical Raman spectra.

Raman spectra (white and green lines)

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AFM surfacetopography

An example of flexible display(Source: Plastic Logic/ www.pbs.org)

H. Yang and C. Y. Ryu et al. J. Phys. Chem. C (2008)To be appeared as a cover article Pentacene

layer

Sourceelectrode

Drainelectrode

Using hack saw blade and laser/frequency generator that are readily available in high school classroom, we have designed the macro tabletop Atomic Force Microscopy (AFM) simulators that have been widely disseminated to high school educators through the collaboration with the “NanoEd” Educational portal site. The students can measure the amplitude of oscillation of reflected LASER light at known coordinates to map out the surface features of the sample. We also participated in “Exploration in Nanoscale Science and Engineering” Workshop at RPI to introduce the AFM simulator to middle/high school students and their parents.

Acquisition of Surface-Enhanced Confocal Raman-AFM

Chang Y. Ryu, Rensselaer Polytechnic Institute, DMR 0722563

http://www.nanoed.org/lessons/Macro_AFM_Simulator/

▲ Our work “Macro tabletop AFM simulator” was introduced in “NanoEd” Educational Resource Portal site

Explorations in Nanoscale S&E(September, 2007)

High school physics teacher (Mr. Paul Fedoroff) and I gave a presentation about AFM with a demonstration of the AFM simulator to middle and high students and their parents.

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