Quartet Digital Training Workbook

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  • 8/10/2019 Quartet Digital Training Workbook

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    S Y S T E M S C O R P O R A T I NO

    Toolbox Digital Applications

    Training Workbook

    061-6016-10

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  • 8/10/2019 Quartet Digital Training Workbook

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    Table of Contents

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 TOC-1

    Table of Contents

    Introduction

    ToolBox Digital Applications Class . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-2Course Ob ectives. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-3

    Lecture and Lab Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-4

    Day 1: Hardware Overview and Software Basics . . . . . . . . . . . . . . . . . . Intro-4

    Day 2: Introduction to Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . .Intro-4

    Day 3: More about Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-5

    Day 4: Swav files, Patref Files and Testing the 245 Device . . . . . . . . . . Intro-5

    Day 5: Developing the 245 Program for Contact Testing . . . . . . . . . . . . Intro-5

    Day 6: Looping and Dynamic IDDTesting . . . . . . . . . . . . . . . . . . . . . . . . Intro-6

    Day 7: Parallel Testing, Mux Mode, and User Debug Commands . . . . .Intro-6

    Da 8: Multisite Testin and Macros . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-6Credence Quartet/Duo/Vista Products . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-7

    Glossary of Terms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-8

    Illustration of FICM and Tester Hardware:. . . . . . . . . . . . . . . . . . . . . . . .Intro-9

    Lab Fixture, Devices, and Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-10

    LAB Fixture Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Intro-10

    Lab Device 377 Octal D Latch Flip/Flop . . . . . . . . . . . . . . . . . . . . . . . . Intro-11

    Lab Device LS245 Bi-directional Transceiver . . . . . . . . . . . . . . . . . . . .Intro-12

    Day 1 - Hardware and Software Overview

    ESD Grounding Connections: Important Notice . . . . . . . . . . . . . . . . . . . . . . . . 1-2

    Duo and Quartet System Architecture. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-3

    Block Diagram for Duo/Quartet . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-4

    System Block Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-5

    Duo/Quartet Basic Block Dia ram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-6

    Device Power Supply Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-7

    Common Module (CM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-8

    Common Module Block Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-9

    Support Module (SM) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-10

    FICM Pattern Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-11Memory Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-12

    Drive Formats . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-13

    Inhibit Formats. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-14

    Compare Formats and Error Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-15

    Compare Strobe Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-16

    Pin Group Card . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-17

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    Pin Group Basic Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-18

    Pin Group I/O Pin Layout . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-19

    PMU (Parametric Measurement Unit) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-20

    DC Testing with the PMU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-21Using the PMU for a Voltage Measurement . . . . . . . . . . . . . . . . . . . . . . . 1-21

    Using the PMU for Current Measurement. . . . . . . . . . . . . . . . . . . . . . . . . 1-22

    Active Loads . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-23

    Ports for External E uipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-27

    Software / Workstation Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-28

    Standard dot Files for Each User . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-28

    Common UNIX Operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    File description: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    Common file types: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    Help: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    Disk Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    Directory (listing and creating): . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-29

    Locatin files with the find command: . . . . . . . . . . . . . . . . . . . . . . . . . 1-30

    Searching files for words: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-30

    Finding differences between files: . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-30

    Setting Defaults: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-30

    Copying files:. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-31

    Deleting files:. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-31

    Redirection (sends or gets information from a file during run time): . . 1-31

    Pipes (used to link commands together): . . . . . . . . . . . . . . . . . . . . . . 1-31

    Compiling simple c programs: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-32

    Listin and stoppin processes: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-32

    Who and finger commands: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-32

    Line printer and line printer que commands:. . . . . . . . . . . . . . . . . . . . 1-32

    Looking at your environment set-up: . . . . . . . . . . . . . . . . . . . . . . . . . . 1-32

    Creating aliases and symbols in your .cshrcfile: . . . . . . . . . . . . . . . . 1-33

    Using system calls: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-33

    Finding unresolved symbols in c files: . . . . . . . . . . . . . . . . . . . . . . . . . 1-33

    Unique UNIX Commands for Toolbox . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-34

    Building a Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-35

    Usin VTC and VTL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-35Using a makefile to compile and link a program:. . . . . . . . . . . . . . . . . 1-35

    What if I have several programs in one directory? . . . . . . . . . . . . . . . 1-36

    Running the Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-37

    Running a program from the tester monitor: . . . . . . . . . . . . . . . . . . . . 1-37

    Running a tester from a remote workstation: . . . . . . . . . . . . . . . . . . . 1-37

    Shortcuts for Running Remotely . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-38

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    Table of Contents

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    Shutting Down or Rebooting a Tester . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-39

    Setting Up xterm Windows . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-40

    A modified .xinitrcfile: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-40

    A portion of a modified .mwmrcfile: . . . . . . . . . . . . . . . . . . . . . . . . . . 1-40Common Modifications to the .login File . . . . . . . . . . . . . . . . . . . . . . . . . . 1-41

    Using setenvfor environment variables/modify the lib search path:. . 1-41

    Specifying locations for pattern, spec, and patref files: . . . . . . . . . . . 1-41

    Introduction to Primitives and Elementals . . . . . . . . . . . . . . . . . . . . . . . . . 1-42

    Log, Pause, and Over Flags . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-43

    Examples of Tester Setup Elementals. . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-45

    Using the Text Editors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-50

    Getting Started . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-51

    Building and Running a program. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-53

    Translating the Swav File to a Pattern File . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-54

    Building a Program With the vtc and vtl Commands . . . . . . . . . . . . . . . . . . . . 1-55

    Compiling the Source Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-55

    Linkin the Pro ram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-55

    Building a Program With a Makefile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-56

    Running the Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-57

    Setting Up and Editing a Response File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-58

    Using the help Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-60

    Using the log Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-61

    Using the script Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-62

    Examples of the pstat and tstat commands. . . . . . . . . . . . . . . . . . . . . . . . . . . 1-63

    pstat Command When Paused on a Functional Test . . . . . . . . . . . . . 1-64

    tstat When Paused on a Functional Test . . . . . . . . . . . . . . . . . . . . . . . 1-65

    Using pause, pstat, and tstat Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-66

    Using the FICM Command to Read and Modify Pattern. . . . . . . . . . . . . . . . . 1-69

    Using GDebug. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-70

    Using GDebug (continued) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-71

    Using the TestBLAZE Toolkit - PatternTool . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-74

    Creating an auto.dbg File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-85

    Day 2- Programming and Debug Basics

    Introduction to the SWAV File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-2

    Files Used in Executable Programs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-3

    Pad Vector. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-5

    Functional Contact swav file (contact.swav) . . . . . . . . . . . . . . . . . . . . . . . . 2-6

    Swav file for the normal patterns (basic_377.swav) . . . . . . . . . . . . . . . . . . 2-7

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    Pattern Loading. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-9

    Basic_377_cpin.c file: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-11

    Using the cpin file. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-13

    Example of Using Several create_pins . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-14The Main Section . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15

    initialize_tester() . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15

    test_device() . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15

    shutdown_device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15

    summary() . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-15

    Program Flow Diagram of the Credence Main . . . . . . . . . . . . . . . . . . . . . 2-16

    Testing the 377 flip/flop . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-17

    Basic_377.c Program Listing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-18

    Loading the Pattern Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-18

    Using a Pin Rather than a Pinlist. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-21

    Setup timing for contact pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-22

    Display of Functional Test Timing Using the WaveformTool . . . . . . . . 2-23

    Setup DC conditions for contact testin . . . . . . . . . . . . . . . . . . . . . . . 2-24

    Run the functional contact test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-25

    Setup DC conditions for normal testing. . . . . . . . . . . . . . . . . . . . . . . . 2-25

    Normal functional test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-26

    Measuring AC Values . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-27

    Setup Time Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-29

    Propagation Delay Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-31

    DC Parametric Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-33

    VohTest using pmu_test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-34

    VohTest usin pmu_measure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-35

    Vol Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-35

    IiihTest . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-36

    End of the test procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-37

    Example of Help Available from the Debugger . . . . . . . . . . . . . . . . . . . . . . . . 2-38

    Command Examples. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-39

    Using the pinlist Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-39

    Thepstat,and tstat commands at start of test_device() . . . . . . . . . . . . . . 2-40

    The pstat and tstat after setting up the pins . . . . . . . . . . . . . . . . . . . . 2-41

    An Example of the lo Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-42Network at the Credence Fremont Training Facility . . . . . . . . . . . . . . . . . . . . 2-43

    Network at the Credence Hillsboro Training Facility . . . . . . . . . . . . . . . . . . . . 2-44

    Using the LOG and PAUSE Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-45

    Troubleshooting PMU VOH or VOL failures: . . . . . . . . . . . . . . . . . . . . 2-46

    Troubleshooting ac test failures: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-46

    Troubleshooting dc tests that use the level_measure elemental: . . . . 2-46

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    Troubleshooting functional tests: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-47

    Other debug commands for all of the above tests: . . . . . . . . . . . . . . . 2-47

    Objectives of Todays Lab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-48

    Getting Started . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-49Create the program: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-49

    Translate the .swavfile to a pattern file: . . . . . . . . . . . . . . . . . . . . . . . 2-50

    Causing a linking failure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-51

    Runnin the Emulator . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-52

    Using Debug Commands to Load the Pattern. . . . . . . . . . . . . . . . . . . . . . 2-54

    Use of the pause, pstat, and tstat commands. . . . . . . . . . . . . . . . . . . . . . 2-56

    Using the log command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-56

    Changing the Active Load Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-58

    Running the Program in the Emulator with CodeCenter . . . . . . . . . . . . . . 2-59

    Running a Program on the Tester . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-60

    Getting Onto the Tester . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-60

    Using the ffor, fedge, and strobe Commands . . . . . . . . . . . . . . . . . . . 2-60

    Usin the TestBLAZE Toolkit - WaveformTool. . . . . . . . . . . . . . . . . . . . . . . . . 2-62

    Using the tm Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-71

    Using the Scope on an offline workstation. . . . . . . . . . . . . . . . . . . . . . . . . 2-72

    Using the Software Scope on the tester. . . . . . . . . . . . . . . . . . . . . . . . . . . 2-73

    Showing the Effects of the Inhibit Bit with the Scope . . . . . . . . . . . . . . . . 2-74

    Scope Display of Inhibit Bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2-75

    Day 3- External Specification Files, Shmoo Plots

    Using an External Specification File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-2

    Example Spec File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-3

    Example 1: Sample Spec Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-4

    Continuous Active Loads. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-5

    Example 1 (continued). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-6

    Test time effects of using specs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-7

    Example 2: Using specs for Run Control . . . . . . . . . . . . . . . . . . . . . . . . . . 3-8

    level_measure example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-14

    Checking for an override setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-16

    Checking for a datalog setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-16

    The should_I_run() Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-17

    Another example of specs for logging control . . . . . . . . . . . . . . . . . . . . . . 3-18

    Script Output Showing Use of Spec Values . . . . . . . . . . . . . . . . . . . . . . . 3-20

    Using the save spec and load spec Commands . . . . . . . . . . . . . . . . . 3-23

    Using Verbose Datalogging. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-24

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    Shmoo Plots . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-25

    Using the TestBLAZE Toolkit - ShmooTool . . . . . . . . . . . . . . . . . . . . . . . . 3-28

    Header. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-31

    Axis . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-34Tracking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-37

    Display. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-39

    Composite Shmoo. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-42

    Executin ShmooTool from Within a Test Pro ram. . . . . . . . . . . . . . . 3-45

    Shmoo Plot Setup File Syntax. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-46

    Script File Showing How to Use the ShmooDebugger Command . . . . . . 3-47

    Creating a Shmoo Plot from Scratch. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-48

    Running a Previous Setup: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-49

    Adding a Tracking Variable to a Shmoo Plot. . . . . . . . . . . . . . . . . . . . . . . 3-53

    Using the Shmoo Mode Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-54

    Basic Steps for Analyzing a Device Failure . . . . . . . . . . . . . . . . . . . . . . . . . . 3-55

    Troubleshooting PMU VOHor VOLfailures: . . . . . . . . . . . . . . . . . . . . . 3-56

    Troubleshootin AC test failures: . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-56

    Troubleshooting DC tests that use the level_measure() elemental: . . 3-57

    Troubleshooting functional tests:. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-57

    Other debug commands for all of the above tests: . . . . . . . . . . . . . . . 3-57

    Objectives of Todays Lab: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-58

    Preparing the Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-58

    Linking problems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-59

    Getting the program running with the Emulator . . . . . . . . . . . . . . . . . . . . 3-60

    Using Specs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-61

    Usin the set and sum debu commands. . . . . . . . . . . . . . . . . . . . . . . . . 3-61

    Using the wave command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-62

    Changing the timeset memory with the FICM debug command . . . . . 3-64

    Using the ShmooTool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-65

    Using the Shmoo debugger command . . . . . . . . . . . . . . . . . . . . . . . . 3-68

    Level Measure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-69

    Scope Command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3-69

    Using the log usr1 Command (use the Emulator) . . . . . . . . . . . . . . . . 3-69

    Day 4- Swav and Patref Files

    Characteristics and Features of the .swav File . . . . . . . . . . . . . . . . . . . . . . . . . 4-2

    Standard Pattern Characters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-2

    Pin Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-3

    The patdumpUtility . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-4

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    Edited patdumpinput: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-4

    Edited patdumpoutput:. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-4

    Creating .ctim, .cmrk, and .patref files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-5

    Timing and Format Information in a .swav File . . . . . . . . . . . . . . . . . . . 4-6377_ctim.c file generated by swav2pat -L 377.swav. . . . . . . . . . . . . . . . . . 4-7

    Pattern References . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-8

    377_cmrk.c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-10

    377.patref . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-11

    Using patrefs and a Call to the .ctim File in a Test Program. . . . . . . . . . . 4-12

    ExecTool Showing patref Debug Commands . . . . . . . . . . . . . . . . . . . . . . 4-14

    Using the ficm load and patref load Commands . . . . . . . . . . . . . . . . . 4-15

    Static Idd testing with the PMU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-16

    Example of using the setup_supply_for_iddq() function . . . . . . . . . . . . . . 4-17

    Prepare the Program for Day 4 Lab . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-20

    Using the sum, system and set Commands . . . . . . . . . . . . . . . . . . . . . . . 4-20

    Using the ExecTool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-21

    Usin the patref Command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-24

    Detecting and fixing typical DUT failures. . . . . . . . . . . . . . . . . . . . . . . . . . 4-24

    Problem One: Functional Test Failure . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-25

    Solution to Fixing Problem One. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-26

    Problem Two: Another Functional Test Failure . . . . . . . . . . . . . . . . . . . . . 4-30

    Problem Three: Time Measurement Failure . . . . . . . . . . . . . . . . . . . . . . . 4-33

    Problem Four: Yet Another Time Measurement Failure . . . . . . . . . . . . . . 4-35

    Problem Five: VohFailure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-37

    Day 4 Lab Part Two: Testing the 245 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-39

    Lab Device 74ACT245 Bi-directional Transceiver. . . . . . . . . . . . . . . . . . . 4-40

    SWAV File for the 245 Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-41

    245template.c File. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-44

    Testing the 245 Device . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4-46

    Day 5 - Multiple Pattern File Loading, Continuity Testing and Libraries

    Multiple Pattern Loading . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-2

    Patterns Used in the Multiload Example . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3

    patfile1.swav . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-3patfile2.swav . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-4

    patfile3.swav . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5

    patfile4.swav . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-5

    Multiple Pattern Load Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-6

    Multiple Pattern File Loading Program Example . . . . . . . . . . . . . . . . . . . . . 5-7

    Load the first pattern and patref file . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-9

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    Load the second pattern and patref file. . . . . . . . . . . . . . . . . . . . . . . . . 5-9

    Load the third pattern and patref file . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-9

    Load the fourth pattern and patref file . . . . . . . . . . . . . . . . . . . . . . . . . .5-11

    PatternTool Display of All the Pins in SM1 and SM3. . . . . . . . . . . . . . 5-12Continuity Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13

    Continuity Testing Considerations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-16

    Swav File for Functional Contact Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-17

    Contact Example Pro ram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-18

    Contact Testing Using a PMU . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-19

    STDF Datalogging. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-20

    Reading Binary STDF Data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-21

    Creating and Using a User Library . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-23

    1. Creating and building the library . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-23

    2. Modify the program makefile in the to include the user library:. . . . . . . 5-24

    3. Modify .login to add your library to the LD_LIBRARY_PATH: . . . . . . . . 5-24

    Avoiding common library problems: . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-24

    Puttin ob ect code into a librar : . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-25

    Add More Tests to Your Program . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-26

    Contact Testing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-27

    DC Parametric Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-28

    AC Parametric Tests . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-29

    Using the collect flag and vtanalyze (Using the Emulator) . . . . . . . . . . . . 5-30

    Gather the collection data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-30

    Analyze the results using vtanalyze. . . . . . . . . . . . . . . . . . . . . . . . . . . 5-30

    STDF Datalogging (Using the Emulator). . . . . . . . . . . . . . . . . . . . . . . . . . 5-31

    Creatin a User Librar Usin the Emulator . . . . . . . . . . . . . . . . . . . . . . 5-32

    Day 6 - Looping and Dynamic IDD Testing

    Loops and Repeats. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-2

    Loop Controller Architecture . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-3

    Loop Controller Rules . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-4

    Example 1: Repeat operation with control word set to loop_pack . . . . . . . 6-5

    FICM read of repeat using control loop_pack . . . . . . . . . . . . . . . . . . . . . . . 6-6

    FICM read of repeat with the second loop set to 500 . . . . . . . . . . . . . . . . . 6-7

    FICM read showing effects of second repeat set to 500. . . . . . . . . . . . . . . 6-8

    Example 2: Repeat with control word set to loop_expand . . . . . . . . . . . . . 6-9

    Example 3: Loop with control word set to "loop_pack" . . . . . . . . . . . . . . . 6-10

    FICM Read with control word set to loop_pack. . . . . . . . . . . . . . . . . . . . . .6-11

    Loop with Control Word set to loop_pad. . . . . . . . . . . . . . . . . . . . . . . . . 6-12

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    Loop with Control Word set to loop_pad . . . . . . . . . . . . . . . . . . . . . . . . . . 6-13

    Example of loop with control word set to loop_expand . . . . . . . . . . . . . . 6-14

    Reading Looping Commands with PatternTool . . . . . . . . . . . . . . . . . . . . . 6-15

    Example of pattern_endversus endmarker . . . . . . . . . . . . . . . . . . . . . . 6-16Example swav File Using Markers . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-17

    swav File Using pattern and pattern_end Instead of Markers . . . . . . . 6-18

    Patdump of the "Marker Only" File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-19

    Patdump of the "Patterns" File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-20

    8-bit Repeats. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-21

    Dynamic IDDTesting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-22

    Dynamic IDDswav File for 377 Flip Flop . . . . . . . . . . . . . . . . . . . . . . . . . . 6-23

    FICM read of dyn377.pat. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-24

    Dynamic Idd and Static Idd using the PMU . . . . . . . . . . . . . . . . . . . . . . . . 6-25

    Script File Output dyn377 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-29

    Viewing a Loop Advance with the PatternTool . . . . . . . . . . . . . . . . . . . . . 6-33

    Write a 245 Dynamic IDD procedure. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6-35

    Usin Loop Debu Command for Viewin the Part with a Scope . . . . . . . 6-36

    Using a Scope to View a loop_advance Routine. . . . . . . . . . . . . . . . . . . . 6-38

    Day 7 - Advanced Testing Procedures

    Creating User Debug Tools . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-2

    Step 1: User debug routine "dl" . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-2

    Step 2: Integrate into the debugger . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-5

    Step 3: Register the function in the test program . . . . . . . . . . . . . . . . . . . . 7-5Execution Tool Showin User Debu Commands. . . . . . . . . . . . . . . . . . . . 7-6

    Multiplexing Pins . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-7

    Class Exercise: Create a 100MHz Clock. . . . . . . . . . . . . . . . . . . . . . . . 7-8

    Mux Mode and FICM bit control . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-9

    Setting Mux Mode timing for the 377. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-10

    Mux Mode Pattern File . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-11

    Patdump of mux377.patFile . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-12

    Patdump of mux377 for Non-Window Pins . . . . . . . . . . . . . . . . . . . . . . . . 7-12

    Parallel PMU Operations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-13

    Objectives of todays lab:. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-14Adding and making user debug commands . . . . . . . . . . . . . . . . . . . . . . . 7-14

    VOHTest Using Parallel Pinlist Technique . . . . . . . . . . . . . . . . . . . . . . . . . 7-16

    Using the TestBLAZE MarginTool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-18

    The Menu Bar . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-21

    Adding a New Margin Setup . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-23

    Settings Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-24

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    Display Page . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-25

    Setup-Window Tool Bar. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-26

    Plot-Window Tool Bar . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-29

    Day 8 - Multisite Testing and Macros

    Multisite Testing. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-2

    Multisite Program for the 377 Flip Flop . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-3

    IDDTest using the DPS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-6

    Multisite functional test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-7

    Multisite single pin PMU Vohtest. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-8

    Multisite parallel PMU Vohtest . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-9

    Multisite TPLH Test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-10

    Multisite shutdown and summar Functions . . . . . . . . . . . . . . . . . . . . .8-11Program Using Macros . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-12

    macro377.h . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-13

    Example Program (using macros) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-14

    Call to macros . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-15

    Enabling Probers and Handlers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-16

    Modify your 245 Program to Run as a Multisite Program . . . . . . . . . . 8-18

    Backing Up Student Files . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-19

    Using Diskettes on Sun Systems . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8-20

    Examples

    callback_measure Elemental . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example-2

    cm.c. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example-2

    Specs used in this program: . . . . . . . . . . . . . . . . . . . . . . . . . . . Example-5

    Script File of callback_measure Elemental Use . . . . . . . . . . . . . . . Example-7

    Callback Shmoo Function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example-9

    Test Pro ram cb.c . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Example-9

    Shmoo Callback Function Used in the cb.c Program . . . . . . . . . . Example-12

    Script File Output of Shmoo Using a callback Shmoo Function . . Example-13

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    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 Intro-1

    Introduction

    Introduction

    This section will introduce you to the Toolbox Basic Applicationscourse and present some useful background information.

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    Introduction

    Intro-2 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    NOTES:

    Toolbox Digital Applications Class

    Welcome to the Toolbox Digital Applications Class. The class has been

    designed to cover the needs of a wide range of customers. ProductEngineers mostly want to know about the program analysis tools. TestEngineers need to learn this material and also learn about the testerhardware and software. This class assumes that students have abackground in device testing, UNIX, and the C programming language. Itdoes not teach test engineering basics, but instead teaches users how toprogram and use the Credence Quartet, Duo and Vista test systems.

    This course is not intended to teach you how to be a system administrator,nor does it cover setting up a production floor. If your company has justbought their first Credence Quartet tester, you will need the help of a

    Credence Field Applications Engineer to properly set up your site.

    The class philosophy is that users learn by doing, so the lecture material isset up to allow efficient use of lab time. Students use existing programs forthe first three days to learn the basics and to learn how to analyze devicefailures, as well as address compile and run-time errors. For the rest of theclass, students write a program for another device. Each day students addnew features to the program. The two devices tested in this class are a 377flip/flop and a 245 bi-directional transceiver. These devices were chosenbecause they are simple, and allow students to easily make changes on thetester and see the effect. The 377 teaches students to work with a clocked

    device. The 245 teaches students to work with I/O pins and tristate testing.

    During the course, feel free to ask any questions about the material, labs,or lectures, and to voice any concerns about material not covered. Ourintent is to make you competent and confident using Credence testsystems. We will do our utmost to satisfy your training requirements.

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    Course Objectives

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 Intro-3

    NOTES:

    Course Objectives

    This class is intended to teach Credence Quartet, Duo, and Vistatest

    system users the following:1. How to use the manuals.

    2. Basic hardware overview for Test Engineers.

    3. How to write a program containing functional, DC, and AC tests.

    4. How to build a program using either vtc, vtl, or the makefiletemplate.

    5. How to use the Emulator.

    6. How to make use of user libraries.

    7. How to use specs and patrefs.

    8. How to set up pattern loops.

    9. How to implement multiple pattern loads.

    10.How to use the basic command-line debug commands.

    11.How to use the graphical debugger (GDebug).

    12.What tools to use for various kinds of failures.

    13.How to use the Scope and Wave tools.

    14.How to create Shmoo plots.

    15.How to do parallel PMU testing.

    16.How to do multisite testing.

    17.How to use the TestBLAZEutilities, including PatternTool,WaveformTool, ShmooTool, ExecutionTool, and MarginTool.

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    Introduction

    Intro-4 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    NOTES:

    Lecture and Lab Outline

    Day 1: Hardware Overview and Software Basics

    Objectives:

    Review the configuration of the tester hardware.

    Review general UNIX operations.

    Learn the basics of building, loading, running and datalogging aprogram.

    Become familiar with primitives and elementals.

    Lab: Learn some simple UNIX commands; practice editing with Sun

    Textedit, Crisp, or vi; use the make command to build programs; andlearn to use basic debug tools.

    Day 2: Introduction to Programming

    Objectives:

    Become familiar with the .swavfile.

    Learn how to program the tester to perform standard device tests (IDD,IIL/IIH, VOH/VOL, AC, DC, and functional).

    Learn the functions required in a Credence Toolboxprogram(initialize_tester(), test_device(), and shutdown_device()).

    Become familiar with key debug commands.

    Learn how to troubleshoot device failures.

    Lab: Compile, link, download and run a simple program with command lineand graphical debug tools.

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    Introduction

    Intro-6 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    NOTES:

    Day 6: Looping and Dynamic IDDTesting

    Objectives:

    Learn to implement loops and repeats. Learn about the use of patternand markers.

    Learn about dynamic IDDtesting.

    Lab: Modify the 245 .swavfile to include a loop until advance routine.

    Day 7: Parallel Testing, Mux Mode, and User Debug Commands

    Objectives:

    Learn to write a user debug command. Learn about the mux mode.

    Learn how to do parallel PMU testing.

    Lab: Add a user-defined debug command; use parallel testing to do a VOHtest on the 245; use the margins debug routine; and use the mux mode.

    Day 8: Multisite Testing and Macros

    Objectives:

    Learn about multisite testing.

    Learn to use macros.

    Lab: Finish all lab exercises; back up files.

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    Credence Quartet/Duo/Vista Products

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 Intro-7

    Credence Quartet/Duo/Vista Products

    1. The DUOand Vistacan be configured with either a 256 pin or 512pin test head. The xp designator in the product name indicates thelarge test head.

    2. The DUOand Quartetslast digital support module contains amaximum of 64 pins. The other 64 pins are replaced by an analogsupport module.

    3. The VistaVisionxp, DUOxp and Quartet can have more thanone analog support module.

    4. All systems require a minimum of one digital support module with 32digital pins. The pin cards supported by each support modulecontain eight IO pins per card.

    5. Digital pins may be added to a Vistasystem 8 at a time. Digitalpins may be added to a Duoor Quartetsystem 16 at a time.

    6. Each analog support module supports any combination of eight

    analog instruments (AWG, ACP, DCP, etc.).

    7. If your system is old enough it may be labeled LT1000/1001/1101.These systems were originally built by Tektronix prior to 1990.

    ProductTotal

    DigitalPins

    Pins PerModule

    Number SupportModules

    Timesets CPU

    Digital Analog Cycle Edge

    VistaVision 192 64 3 1 16 16 SPARC

    VistaVisionxp 448 64 6-7 1-2 16 16 SPARC

    VistaLogic 256 64 4 0 16 16 SPARC

    VistaLogicxp 512 64 8 0 16 16 SPARC

    DUOxp 448 - 512 128 3-4 1-2 16 16 SPARC

    DUO 192 - 256 128 2 1 16 16 SPARC

    Quartet 512 128 3-4 1-2 16 16 SPARC

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    Introduction

    Intro-8 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    NOTES:

    Glossary of Terms

    DUT Device Under Test

    Toolbox Credence software package

    Vector One line of a truth table

    SWAV file Credence format ASCII pattern file

    FICM Force/Inhibit/Compare/Mask pattern

    T0 The arbitrary period boundry assigned bythe tester

    Test An operation where the result is Pass/Fail

    Measurement An operation where the result is ameasured value

    Parallel PMU Taking multiple measurements at theOperations same time using several PMUs

    Multisite Testing Testing 2-8 parts in parallel

    GDebug Graphic debug tool

    CodeCenter Third party C debug tool

    CrispEditor Third party text-editing tool

    TestBLAZE Additional GUI-based debug tools

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    Glossary of Terms

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 Intro-9

    Illustration of FICM and Tester Hardware:

    Pattern Symbol FICM bits Action

    1 1001 force a one and mask

    0 0001 force a zero and mask

    H 0110 inhibit and check for output high

    L 0100 inhibit and check for output low

    X 0101 inhibit and mask

    Z 0111 inhibit and mask

    ASCII file

    10HL

    00LL

    11HH

    01LH

    swav2pat

    func1.swav func1.pat

    Binary

    FICM data

    DUT

    I (Inhibit bit)

    F (Force bit)

    C (Compare bit)

    M (Mask bit)

    (Credence Translator)

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    Introduction

    Intro-10 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    Lab Fixture, Devices, and Specifications

    LAB Fixture Diagram

    Since the PMUs are sensitive to capacitive loading, it is necessary todisconnect the decoupling caps and the power supply before using thePMU for a static IDDtest. The relays are normally closed. PS1, PS2 and thedecoupling caps will be disconnected if the program includes aclose_fixture_relays()command. The user can then use the PMU for a staticIDDmeasurement

    1

    2

    3

    4

    5

    6

    7

    8

    9

    10 11

    12

    13

    14

    15

    16

    17

    18

    19

    20

    DUT SOCKET #1

    I/O #11

    I/O #12

    I/O #13

    I/O #14

    I/O #15

    I/O #16

    I/O #17

    I/O #18

    I/O #24

    I/O #23

    TP1

    TP2

    TP3

    1

    2

    3

    4

    5

    6

    7

    8

    9

    10 11

    12

    13

    14

    15

    16

    17

    18

    19

    20

    DUT SOCKET #2

    I/O #25

    I/O #26

    I/O #27

    I/O #28

    I/O #29

    I/O #30

    I/O #31

    I/O #32

    I/O #33

    I/O #34

    I/O #35

    I/O #36

    I/O #41

    I/O #42

    I/O #43

    I/O #44

    I/O #45

    I/O #50

    I/O #53

    TP4

    TP5

    Ground

    TEXTOOL 20 PIN

    DIP SOCKET

    TEXTOOL 20 PIN

    DIP SOCKET

    I/O #1

    I/O #2

    I/O #4

    I/O #5

    I/O #6

    I/O #3

    I/O #9

    I/O #8

    I/O #7

    Ground

    1 8

    54

    3.01uF .1uF

    RC23

    PS3

    NC

    COTO 2911-05-321

    COIL

    PS1

    PS3_S

    BOTTOM VIEW OF RELAY

    DEVICE DECOUPLINGPS1_S

    1 8

    54

    3.01uF .1uF

    RC53

    PS3

    NC

    DEVICE DECOUPLING COTO 2911-05-321

    COIL

    PS2

    PS2_S

    PS3_S

    BOTTOM VIEW OF RELAY

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    Lab Fixture, Devices, and Specifications

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 Intro-11

    NOTES:

    Lab Device 377 Octal D Latch Flip/Flop

    DQ

    CK

    DQ

    CK

    DQ

    CK

    DQ

    CK

    DQ

    CK

    DQ

    CK

    DQ

    CK

    DQ

    CK

    1 2 3 4 5 6 7 8 9 10

    11121314151617181920

    VDD Clock

    Q1 Q2 Q3 Q4

    Q5Q6Q7Q8

    D1 D2 D3 D4

    D5D6D7D8

    Enable Gnd

    The 377 is a positive edge triggered flip/flop. When the enable pinis a logic one, the flip/flop will not change state.

    Enable Data Clock Q

    1 X X Same State

    0 1 1 H

    0 0 1 L

    0 X 0 Same State

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    Introduction

    Intro-12 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    Lab Device LS245 Bi-directional Transceiver

    19

    2 3 4 5 6 7 8 9 10

    12141516171820

    A1 A2 A3 A4 A5 A6 A7 A8

    B1 B2 B3 B4 B5 B6 B7 B8Vdd

    Gnd

    En

    Dir

    11

    1

    The 245 sends information from either the A pins to the Bpins, or from the B pins to the A pins, depending on the stateof the Dir pin. If the enable pin is a logic one, all the A and Bpins are tri-stated.

    Enable not Direction A pins B pins

    0 1 1 H

    0 1 0 L

    0 0 H 1

    0 0 L 0

    1 X Z Z

    13

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    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 1-1

    DAY 1

    Hardware and Software Overview

    The objectives of todays lecture and lab are as follows:

    Review the configuration of the tester hardware.

    Learn the basics of compiling, linking and running aprogram.

    Use the make command to build programs.

    Become familiar with primitives and elementals.

    Experiment with the TestBLAZE PatternTool.

    Learn some simple UNIX commands.

    Practice editing with Sun Textedit, Crisp, or vi.

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    DAY 1: Hardware and Software Overview

    1-2 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    NOTES:

    ESD Grounding Connections: Important Notice

    The Duo and Quartet Test Systems incorporate CMOS technology and are

    sensitive to electrostatic discharge (ESD).

    Grounding connections are located on the system's rack and test head.Any time a board is removed from the system, ESD ground straps must beworn, and the board must immediately be placed in a static-proof container.

    Grounding connections are provided inside the doors on each rack, bothfront and back, and on each side of the test head, next to the manipulatorscradle connection.

    The arrows in the diagram above indicate the location of these groundingconnections.

    Grounding connections are provided inside the doors on each rack, both front and back. Alsoone is provided on each side of the test head, next to the manipulator's cradle connection.

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    Jan2

    000

    Toolb

    oxDigitalA

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    ork

    book

    061-6

    016-1

    0

    1-3

    NOTES

    :

    Test Head

    SunMonitor

    Keyboard & Mouse

    RGB

    ProgramDevelopment

    Station

    Manipulator

    FacilityNetwork

    MicroHub

    Testers 2-7

    Ethernet

    DUTCal or Cal2

    Asymtek Automove

    Controller

    SR 620

    HP 3458A

    Tester Rack

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    DAY 1: Hardware and Software Overview

    1-4 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    Block Diagram for Duo/Quartet

    The CPU controller transfers programming instructions to the CommonModule via the VME Bus. The Common Module controls up to 4 SupportModules, therefore, up to 512 pins per test head. Each Support Modulecontrols two Pin Modules within each of two heads. The Pin Modulescontrol 64 pins and have 8 Pin Electronic cards and one Pin ModuleDistribution card. Each Pin Electronic card controls 8 I/O pins and oneParametric Measurement Unit (PMU).

    Common Module Support Module Pin Module

    Controller I/O Cycle Length Generator (T) Drivers

    ROM Sequencers Timeset Pointer Memory Comparators

    Functional Test Control PPM Memory Active Loads

    1 GHz Master Oscillator Pattern Control PMUs

    A/D Converter for PMU Error Control Timing Generators

    Analog Reference Rails(Vista/Duo only)

    SCAN Memory (optional)

    Pin Module#1

    64 I/O Pins

    Pin Module

    #264 I/O Pins

    Pin Module#3

    64 I/O Pins

    Pin Module#4

    64 I/O Pins

    Pin Module#5

    64 I/O Pins

    Pin Module#664 I/O Pins

    Pin Module#7

    64 I/O Pins

    Pin Module#8

    64 I/O Pins

    CommonModule

    Sun CPU

    VME I/O

    DMA-W

    VME Bus

    SupportModule

    #1

    SupportModule

    #2

    SupportModule

    #3

    SupportModule

    #4

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    Duo and Quartet System Architecture

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 1-5

    System Block Diagrams

    1. Workstation configuration options

    a. File server (cluster environment).b. Stand-alone workstations.

    2. ACS (Automatic Calibration Station, also known as Cal)

    a. The ACS is used to calibrate the system.

    3. The ACS is also used to verify system accuracy. The user can run aquick verify without using the ACS or calibration fixture.

    4. The Rack

    a. The SPARCcontroller is used to distribute the test programinstructions to the appropriate boxes.

    b. Each DPS power supply assembly can contain up to 7 voltage orcurrent supplies.Each power supply assembly also contains a V/I monitor that canmeasure the voltage and current coming from any supply.

    c. The Common Module contains railsthat are used by all the pins.

    d. Support module

    Each Support Module controls 64 I/O pins (Vista) or 128 I/O pins(Duo/Quartet). Main functions are:

    Generate T-zeros to mark the cycle time.

    Contain the FICM data for 64 (Vista)/128 (Duo//Quartet) pins.

    Each support module is independent of the others.5. Test head

    a. Each group of 64/128 pins is controlled by a Support Module.

    512 pin systems - One Common Module and 4 SupportModules.

    256 pin systems - One Common Module and 2 SupportModules.

    b. Each pin module is made up of 8 pin group cards. Each pin groupcard contains 8 drivers and comparators and one PMU(Parametric Measurement Unit).

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    1-6

    Too

    lboxDigitalA

    pplic

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    orkb

    ook

    061-6

    01

    6-1

    0

    Jan2

    000

    Device PowerSupplies

    CommonModule

    DigitalSupportModule

    #1

    Rack

    Enable

    DC to Load

    DC from Load

    Test H

    DCSupplies

    SupportingHead #1

    GPIB

    3 Phase AC

    Monitor

    To Ethernet

    DMA2

    CM

    I/O

    VME BusController

    ControllerSun Sparc 20

    I/O

    I

    CS

    S

    HandlerBin BoxACS

    Power

    GPIBTrig System

    Autocal

    RS 232

    Bin

    Teal PowerConditioner

    To Bin Box

    To Handler

    AC

    Controller

    On/Off

    & Fault LEDs

    AnalogPower

    Monitor#1

    PowerSequencer

    #1

    AC

    AC

    Control

    S/M

    Triggers

    GPIB

    RS

    232 Serial & Parallel Cont.

    DigitaModu(Pins

    Digita

    Modu(Pins 6

    DigitaModu

    (Pins 12

    DigitaModu

    (Pins 19

    DigitaModu

    (Pins 25

    DigitaModu

    (Pins 32

    AnaloModu

    (Pins 38

    AnaloModu

    (Pins 44

    MXI bus

    RS

    232

    Isolated PowerSupply

    Ins Outs

    F

    200KHz

    100

    KHz

    DigitalSupportModule

    #2

    DigitalSupportModule

    #3

    AnalogSupportModule

    #2

    AnalogSupportModule

    #1

    F

    TF

    TF

    F

    Trig/Flag

    Connects

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    Duo and Quartet System Architecture

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 1-7

    Device Power Supply Block Diagram

    The 1151 Device Power Supply (DPS) has a GPIB communication boardthat communicates to the Sun SPARC controller. The DPS mainframe cansupport up to 7 power supplies in a single unit. All slots, except for the firstslot, support any power supply module. By changing the config.confile,users can configure the system any way they wish. The programmablevoltage/current sources available are:

    The Voltage/Current monitor is used to measure the voltage and currentoutput of the supplies.

    PS# Voltage PS# Current

    1171 7.5V 4 amp 1174 7.5V 200mA

    1172 15V 2 amp 1181 200mA 30V

    1173 30V 1 amp

    Logic DACs Output

    Power Module #1

    Logic DACs Output

    Power Module #2

    Logic DACs Output

    Power Module #3

    Logic DACs Output

    Power Module #4

    Logic DACs OutputPower Module #5

    Logic DACs Output

    Power Module #6

    Logic DACs Output

    Power Module #7

    Voltage/Current Monitor V/I Monitor Matrix

    + S

    +-- S

    + S

    +-- S

    + S

    +-- S

    + S

    +-- S

    + S+-- S

    + S

    +-- S

    + S

    +-- S

    DPSCPU

    GPIBfrom

    VMEBus

    (Slot 1)

    (Slot 2)

    (Slot 3)

    (Slot 4)

    (Slot 5)

    (Slot 6)

    (Slot 7)

    (Slot 8)

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    DAY 1: Hardware and Software Overview

    1-8 Toolbox Digital Applications Workbook 061-6016-10 Jan 2000

    Common Module (CM)

    The common module affects all the pin cards and support modules. From

    the test engineers point of view, the most important aspect of the commonmodule are the twelve DACs that come out of the common module and areconnected to twelve rails that go all around the test head. These rails arededicated to a particular task.

    Rails 1 through 8 are used for setting drive levels on the I/O pin driver.

    Rail 9 is used as a reference voltage to develop the PMU current whenusing the PMU force current option.

    Rail 10 is used as a force voltage for the PMU during a FVMI test.

    Rails 11 and 12 are used either as compliance voltages for the forcecurrent PMU operations, or as commutative voltages for the active

    loads.

    The next page shows a block diagram of the Common Module.

    high drive level

    low drive level

    DRIVER_RAIL1 (rails 1 and 2)

    DRIVER_RAIL2 (rails 3 and 4)

    DRIVER_RAIL3 (rails 5 and 6)

    DRIVER_RAIL4 (rails 7 and 8)

    Each driver can be connected to one ofthe four rails. The rail consist of a high

    drive and low drive levels 7.5v to -2.5v.The low drive can be set higher than thehigh drive.

    PMU

    force Irail

    compliance V

    compliance V

    PMU

    (FVMI)

    force V railactiveloads

    pull-downcommutative V

    pull-upcommutative V

    Note: The commutative voltage for the PMU force I operation and thecommutative voltage for the active loads share the same rails.

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    Common Module (CM)

    Jan 2000 Toolbox Digital Applications Workbook 061-6016-10 1-9

    Common Module Block Diagram

    OffsetDAC

    GainDAC

    GainCorrectionMemory

    4:1Mux

    OffsetCorrectionMemory

    Gain

    Offset

    A/D(12 Bits)

    Parallelto

    Serial GainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    GainGainDAC

    OffsetReg.

    GainReg.

    OffsetDAC

    DAC

    In

    Gain

    From PinModules

    (1-4)

    System PMU A/D Convertor

    Analog I/O(*Slots 9-12)

    12 Bits In

    12 DACs Total

    8 Used for Driver Rails2 Used for Active Loads2 Used for PMUs

    System Reference Rails (12)

    * Note: One Analog I/O Bd is required

    for each 256 Pins, per test head.

    A 512 pin system has two Analog I/Os.

    ControllerI/O

    (Slot 1)

    ROMSequencer

    #2(Slot 4)DMA2

    (Slot 5)

    ROM

    Sequencer#1(Slot 2)

    FromVMEBus

    Master Clock Distribution

    (Slot 14)

    1 GHzMaster

    Oscillator

    FanoutDriver

    123456

    78

    + -

    1 GHz to

    Support

    Modules

    123

    456

    78

    Run to

    AnalogSupport

    Modules

    FanoutDriverMT_Run

    5 200 MHz To FTC

    FICM Data Bus w/ FICM

    Control Lines and Pin List Enables

    3 Serial Data Lines& Serial Control Lines

    16 Bit Data Bus w/ ControlLines andS/M & Slot Enables

    To Pin

    Modules

    Start MT_Run

    Functional Test Stop

    Manual Stop

    Error Stop

    Sequence Length Stop

    Stop

    Start/Stop Control Logic

    Trigger Register

    Trigger CounterTC

    Trigger to

    Rear Panel

    Functional Test Control(Slot 7)

    Start up Logic

    FanoutDriver

    Start_FTTo

    Dig.

    S/M

    + -

    + -

    + -

    + -

    Data In

    200 MHz

    from MCD

    Cal Control Linesto FTC Bd

    DriversCal Control Lines

    from ROM Seq #2 Trigger and

    Control Lines to

    Cal Connector

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    NOTES:

    Support Module (SM)

    1. Pin group card (Controlledby Support Module)

    The pin group card contains eight driver and comparator ICs.Contained inside each driver chip are four edge generators.

    The edge generators are:

    a. Force rise and fall edge generator.

    b. Inhibit start and stop edge generator.

    c. An edge timing-set register containing 16 values per edge.

    d. Formatting controls for the inhibit and force logic.

    2. Pattern memory

    FICM information (256 bits by 256K, 1MB, 4MB, or 16MB):F - force a logic one or zero.I - If set to a logic one, the Credence driver will be tristated.

    C - Check for a logic high, low, or tristate condition.

    M - If true, causes the comparator to mask all errors.

    3. Cycle timeset (4 bits by either 256K, 1MB, 4MB, or 16MB)

    Each vector causes the support module to pick one of 16 pre-setcycle times. The resulting T-zero is used by all of the pin group cardscontrolled by the support module.

    4. Edge timeset bits (4 bits by either 256K, 1MB, 4MB, or 16MB)

    The SM sends the edge timeset bits to the pin group cards. All thepin group cards will use the same edge timeset address, but edgetimeset 0 on one pin can be set to a different value than edgetimeset 0 on another pin. However, allthe pins in a SM operate at thesame cycle time.

    5. Vector trigger bit

    If this is set, a trigger appears at the vector trigger jack in the front ofthe tester, and internally on the analog instruments (if installed).

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    000

    T zero

    T zero

    cycle

    F

    I

    C

    M

    Cycle Timing-set Memory

    Edge Timing-set Memory

    Special Function Memory

    Loop Controller

    0

    15

    CycleTiming-set

    Memory

    PPM Memory 256k,1Meg, or 4 MB

    sets ofFICMdata

    SUPPORT MODULE

    force rise counter

    force fall counter

    Force Edgetimesetmemory

    0

    15

    R F

    inhibit start counte

    Inhibit Edgetiming-setmemory

    15

    R F

    F

    Inhib

    Driver IC

    Comparator IC

    counter

    T zero to all64 pins (Vista)

    CompareStrobe TimesetMemory

    0

    15

    strobe 1 strobe 2

    0

    strobe 1

    strobe 2T0

    to allpins

    128 pins(Duo/Quartet)

    64 or128

    inhibit stop counter

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    Drive Formats

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    NOTES:

    Drive Formats

    Driver waveform formats are governed by a set of rules as shown below.

    Edge generators on the pin cards create a set of rising and falling edges.Depending on the format, these edge generators are used to create awaveform.

    DNRZ

    If the pattern is a 1, generate a rising edge.

    If the pattern is a 0, generate a falling edge.

    RZ

    If the pattern is a 1, generate both a rising and falling edge.

    If the pattern is a 0, generate a no edge.

    R1

    If the pattern is a 1, generate no edge.

    If the pattern is a 0, generate both a falling and rising edge.

    PLS/F1/F0

    Disregard pattern data; force a pulse, logic one, or logic zero,respectively.

    Vector Data T0 1 T0 0 T0

    DNRZ

    RZ

    R1

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    NOTES:

    Inhibit Formats

    The inhibit circuitry is controlled by a combination of pattern, formatting,and inhibit timing edges. For a complete list of formats see theset_inhibit_edges()elemental in the Toolbox Users Manual. Some of theinhibit formats are:

    FON

    In this format the drivers are enabled all the time.

    FOFF

    In this format the drivers are turned off all the time.

    DNRI

    If the inhibit pattern is a 1, the drivers are inhibited when the start

    inhibit edge occurs. If the inhibit pattern is a 0, the drivers are turnedon when the stop inhibit edge occurs.

    The dotted line indicates that the Credence driver is in a highimpedance state.

    inhibitformat

    inhibit pattern

    start inhibit edge

    stop inhibit edge

    16inhibitedge

    timesetmemory

    Force Data

    1 H 0 L L

    Driver

    00001

    00101

    F I C M

    1 1 0 0 1

    H 0 1 1 0

    0 0 0 0 1

    L 0 1 0 0

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    Compare Formats and Error Detection

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    Compare Formats and Error Detection

    1. Errors are detected if:

    a. The output is less than the high compare and an H is in the

    pattern.b. The output is greater than the low compare and an L is in the

    pattern.

    c. The output is outside the area defined by the high and lowcomparator and a Z is in the pattern.

    2. The comparator format can be set to MASK, TRISTATE, or NORMAL

    a. NORMAL format

    If there is an H in the pattern, the comparator checks for validhigh.

    If there is an L in the pattern, the comparator checks for a validlow.

    If there is a Z or X in the pattern, the comparator is masked.

    b. TRISTATE format

    If there is an H in the pattern, the comparator checks for validhigh.

    If there is an L in the pattern, the comparator checks for a validlow.

    If there is a Z in the pattern, the comparator checks for a validtristate condition.

    If there is an X in the pattern, the comparator is masked.3. You can operate the comparator in edge, window, or double strobe

    mode.

    a. EDGE Mode

    Only one edge is generated. The comparator only looks at theDUT output when the edge goes true.

    b. Window Mode

    The comparator is enabled for the time between the two comparestrobes.

    c. Double Strobe Mode

    The two strobes act as two separate single edge strobes allowingfor two compares in one cycle.

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    NOTES:

    Compare Strobe Modes

    L H Z X 0

    VOH

    VOL

    edge mode

    L H Z X 0

    VOH

    VOL

    window mode

    L H Z X 0

    VOH

    VOL

    double strobe

    L L H Z Z

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    Pin Group Card

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    NOTES:

    Pin Group Card

    1. Two relays:

    a. I/O relay connects the comparator and driver to the DUT.

    b. PMU relay connects the PMU to the DUT.

    c. One control line will provide ground for external relays. Thissignal is set low by the command close_fixture_relays().

    2. Driver inputs:

    a. FICM data

    b. Drive levels

    3. Force history tracks the last 24 bits of force pattern data.

    4. Four edge generators (2 force and 2 inhibit).

    5. Comparator:

    a. Active loads built into the comparator chip.

    b. Two edge generators standard (one edge generator on oldersystems).

    6. T0 is the enable for all the generators.

    7. The PMU can be connected to all the I/O pins on the pin group card.

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    1-1

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    Jan2

    000

    Programmable Resistance

    +

    -

    2 Compare Edge Generators

    Compare Open

    Compare CloseError Detection & Expect

    Circuitry

    Error History Register

    Deskew Delay Circuits

    F Start

    F StopS

    R

    Timing Set Memory

    (16 Addresses per Generator)

    Mux

    I Start

    I StopS

    R

    Neptune ASIC (8 per PG)

    Driver

    Comparator

    (8 per PG)

    Enable

    Hi

    Lo

    TS Bit 0

    TS Bit 1

    Force

    Inhibit

    Mask

    TS Bit 2

    TS Bit 3

    T

    E & O

    Compare

    Ma_Clk

    E & O

    Timing

    Set

    Buffers

    Pattern

    Buffers

    Clock

    Dist.

    Triton (8 per PG)

    Hi/Lo

    On/Off

    Compare High

    Compare Low

    F

    I

    C

    M

    TS

    Sel

    T

    Ma_Clk

    Correction

    Memories for

    Timing Edges

    Data In

    E

    I

    I

    E

    Mux

    E

    I

    I

    EPMU Analog Out

    Error Out

    PMU Ref and Clamp Rails

    PMU Analog Reference Out

    PMU Circuitry(1 per PG)

    PMU Amp

    6 Driver Edge Generators

    Force Start

    Force Stop

    Inhibit Start

    Inhibit Stop

    Mux Start Mux Stop

    Force, Inhibit & Mux

    Formatters

    Deskew Delay Circuits ActiveLoad

    Pull Up Ref

    Pull Down Ref

    Drive Hi Ref

    Drive Low Ref

    Compare Hi Ref

    Compare Low Ref

    1 Sample & Hold

    Reference DAC per PG

    Cal

    DAC10 Sample & Holds

    per Pin

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    Pin Group Card

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    NOTES:

    Pin Group I/O Pin Layout

    Reed 3

    Reed 1

    Reed 7

    Reed 5

    PMU Guard

    Reed 4Reed 2

    Reed 8

    Reed 6

    Analog GND

    Ground

    Ground

    Ground

    Ground

    I/O Pin 7

    Ground

    I/O Pin 5

    I/O Pin 3

    I/O Pin 1

    Ground

    Ground

    Ground

    I/O Pin 8

    Ground

    I/O Pin 6

    I/O Pin 4

    I/O Pin 2

    PMU Remote Sense

    PinGrou

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    NOTES:

    PMU (Parametric Measurement Unit)

    1. The PMU can be used to FVMI or FIMV.

    2. There is one PMU for every 8 pins (1 per pin card).3. 8 pins can be ganged together (e.g. ganged leakage test).

    The user can measure 32 DUT pins at one time on a 256 pin tester or 64DUT pins on a 512 pin tester without shorting any two DUT pins to thesame PMU. The 32/64 PMUs are read serially by the ADC in the common

    module.

    After the measurements are made, the PMUs can be reconnected to adifferent set of pins and new measurements taken. The user can measureall 256/512 DUT pins with eight iterations.

    ADCcommonmodule

    PMU#2

    PMU relays IO pins 1-8

    PMU relays IO pins 9-16

    DUT

    PMU#1

    Mux

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    DC Testing with the PMU

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    NOTES:

    DC Testing with the PMU

    Using the PMU for a Voltage Measurement

    When performing voltage measurements, you can load the DUT by:

    1. Using the active loads (maximum current 25 mA).

    2. Using the PMU force current option (maximum current 100 mA).

    3. Wiring up an external load on the load board.

    DUT I/O Relay

    VDDPS1

    User Load

    PS2

    external

    PS3

    IOcontrolline

    relay

    voltmeter

    Driver

    PMURelay

    PMU Force I

    Comparator

    Active Load

    DUT

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    NOTES:

    Using the PMU for Current Measurement

    1. There are several current ranges: 100 nA, 1 A, 10 A, 100 A, 1 mA,25 mA, and 100 mA.

    2. The force voltage comes from a rail and can be any voltage between2.5V and 7.5V.

    Because there is one PMU for every eight tester channels, you can gang upto eight DUT pins on one PMU.

    DUT I/O Relay

    VDDPS1

    User Load

    PS2

    external

    PS3

    IOcontrolline

    relay

    currentmeter

    Driver

    PMURelay

    Comparator

    force

    voltage

    DU

    T

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    Active Loads

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    NOTES:

    Active Loads

    1. Active loads control the amount of load current.

    There are 256 pull-up setpoints and 256 pull-down setpoints. Eachsetpoint is composed of a voltage and a current. Each setpoint iscalibrated by the system. Credence guarantees the setpoint currentwhen the DUT is at the setpoint voltage.

    Before running a test, the user enables a pull-up and pull-down loadby selecting the setpoint with the set_active_loads()elemental. Theselected setpoint biases the active load current FETs. The load willonly be applied if the inhibit bit is a 1. SHown below is an example ofprogramming the active loads.

    set_active_loads

    (

    allq, /* Pinlist */

    PULL_BOTH, /* Mode */

    0.003, /* Sink Current */

    0.5, /* Sink Setpoint */

    1.5, /* Sink Clamp */

    -0.003, /* Source Current */

    4.0, /* Source Setpoint */

    1.5 /* Source Clamp */

    );

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    Active Loads

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    NOTES:

    Normal Mode

    The active load follows the pattern. When comparing for a high, the pull-down load is applied. When comparing for a low, the pull-up load is

    applied.

    As soon as the compare strobe occurs, the load disappears and theappropriate active load is turned on for the next cycle.

    Setpoint Bias forSink Current

    Control

    Setpoint Bias forSource Current

    Control

    DUT

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    NOTES:

    Pull-up Mode

    Applies the sink current to the DUT. This could be used in a VOLtest.

    Pull-down mode

    Applies the source current to the DUT. This could be used in a VOHtest.

    Setpoint Bias for

    Sink CurrentControl

    DUT

    Setpoint Bias forSource Current

    Control

    DUT

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    Active Loads

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    Ports for External Equipment

    Handler 1

    Handler 2

    Bin Box 1

    Bin Box 2

    DMA-WController

    DMA-WController

    GPIBController

    National

    Instruments

    Channel 2Channel 1

    Channel 1 Channel 2

    12345678 12345678

    Bin BoxHandler

    Circuit

    Breaker

    PerformanceTechnologies

    VME

    BusReset

    VME

    BusFLT

    0-fSelect

    Status

    0 1 2 3

    MVME 340B Motorola

    CDROM

    Cartrid

    ge

    Tape

    Drive

    To C/M Controller I/O

    To DMA2 No Connection

    No Connection

    To DPS, Cal, & Rear Panel

    To Bin Box

    Front View of VME Controller

    To Handler

    S BusSCSI to CD Rom

    & Tape Drive

    To Monitor

    SerialParallel

    Controller

    Serial0 1 2 3 4 5 6 7

    Status

    On

    Off

    ISDN

    Parallel Port

    Ethernet/Audio Port Two Serial Ports (A/B)

    Twisted PairEthernet

    Fast SCSIKb

    Blank

    Blank MXI Bus

    SBus SUN Serial I/O

    RGB Out

    To KeyboardTo Network (10BaseT)

    Rear View of SPARCstation

    7

    6

    5

    4

    3

    2

    1

    Null Modems Attached

    MXI Bus toCal Connector

    RS232 to CalConnector

    0 Terminal 1

    1 Prober1 port2 Serial Printer3 Prober 24-8 Aux Ports

    Parallel

    Printer

    These connections areon the back of the Duotesters. Older Vistaseries have the same

    connections on the frontkick panel.

    upport ModuleTrigger in and outjacks

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    NOTES:

    Software / Workstation Introduction

    Standard dot Files for Each User

    There are several files in the user account that the user may want or needto modify.

    1. .login

    This is a standard setup file. Some of the items you will need tochange are printer settings and library paths.

    2. .ccenterinit

    This file is used as an initial setting file for the CodeCenter debug

    tool. During class you will be given a .ccenterinitfile that has a fewhooks in it to make debugging with CodeCenter on the Duo easier.

    3. .Xdefaults

    This file is used to setup colors for the graphical debugger. The userwill want to change colors and font size.

    4. .xinitrc

    This file is used to customize the users X Windows settings.

    5. .cshrc

    This file is a personal C shell run command file, and is read eachtime a C shell is initiated. The file contains aliases, environmentvariables, and other C shell commands.

    6. app-defaults

    This isnt a file, but a directory pointed to by a setting in the users.loginor .cshrc file.

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    Software / Workstation Introduction

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    NOTES:

    Common UNIX Operations

    File description:

    /net/toolbox/vteach1/test.c

    Common file types:

    .a Object library files.

    .o Object files created automatically by the vtccommand.

    .pat Binary files created by the Credence swav2pat converter.

    .swav Contain the ASCII pattern data.

    Help:

    man ls Gives help on the lscommand.

    man man Gives help on the mancommand.

    which Shows the path of a command.

    Disk Information

    df

    du List all of the files in the users directory and their size.

    Directory(listing and creating):

    ls Lists all of the users files except for the files star ting with a .

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    NOTES:

    ls -a Lists the users files, including the hidden files.

    ls -l Lists all the files showing their protection.

    ls~bobby/xxxLists all files in bobbys account called xxx.

    ls~/ Lists all the files in users home directory.

    mkdirtemp Makes a directory called temp at the current path level.

    Locating files with the find command:

    The dot (.) says: look in all directories.

    find . -namebasic_377.c-print

    Searching files for words:

    egrepSUPPOR *.hSearches all the.hfiles for occurrences of SUPPOR.

    Finding differences between files:

    diffxyz.c abc.c

    Setting Defaults:

    cd Sets the directory to home.

    cd~stu5 Sets the directory to user stu5.

    cd / Sets the directory to root.

    pwd Shows the current path.

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    Software / Workstation Introduction

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    NOTES:

    Copying files:

    cpxxx c.c Copies xxxto a file called c.c.

    cpxxx~/train/temp/bob.cCopies xxxto a path in the home directory.

    Deleting files:

    rmtemp/*.* Deletes the contents of the directory temp.

    rmbobs/anyfile.c Deletes the file anyfile.c.

    rmdirtemp Deletes the directory temp.

    Looking at files:

    cattemp_1.txtTypes the whole file at one time.

    moretemp_1.txtPauses every 20 lines; use the space bar to continue.

    wc Shows the number of words in a file.

    Redirection (sends or gets information from a file during run time):

    anyfile>bob.text Sends the output of the anyfileprogram to the file bob.text.

    anyfile>>bob.text Appends the output of anyfileto the file bob.text.

    anyfile

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    DAY 1: Hardware and Software Overview

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    NOTES:

    Compiling simple c programs:

    ccxx.c Compiles xxinto an executable file called a.out. To execute, typea.out.

    cc-obobxx.cCompiles xxinto an executable file called bob.

    cc-obobxx.cyy.cCompiles and links xxand yyinto a run file bob.

    Listing and stopping processes:

    ps -c Lists current processes and their process number.

    kill -91878 Stops process 1878.

    Who and finger commands:

    who Shows who is doing what on the system.

    fingerbob Shows information about user bob.

    Line printer and line printer que commands:

    lpq -Plw Lists the current jobs in the laser writer que.

    lprm -Plw234Deletes job 234 from the print que.

    lpr -Plpxxx Prints xxx on a line printer.

    Looking at your environment set-up:

    printenv Prints environment variables to the screen.

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    Software / Workstation Introduction

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    NOTES:

    Creating aliases and symbols in your .cshrcfile:

    aliasxccodecenter&

    Defines xc as the command that invokes CodeCenter and runs it inthe background.

    setday2=~/programs/duo_digital/day2

    Defines day2 as the directory name; type cd day2.

    aliasday2cd;cdprograms/duo_digital/day2

    Sets alias to change directory and go to day2 directory.

    cp$day2/anyfile.c.

    The alias allows the user to go to a directory by simply typing day2.

    Using system calls:

    You can perform UNIX operations from your program using system calls.For a list of all the system calls available, type man 2 introand look for alist at the end of the man page. For help on a particular system, call typeman 2 stat.

    Finding unresolved symbols in c files:

    If, after linking, you get the following message:

    undefined symbol _bob

    Use this command to find out which C file contained the symbol bob(theunderscore is not part of the symbol):

    nm-o*.o|egrep_bob$

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    DA