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Quantitative Phase Analysis by X-ray Diffraction Robert L. Snyder School of Materials Science and Engineering Georgia Institute of Technology Denver X-ray Conference 2009

Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

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Page 1: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Quantitative Phase Analysis by X-ray Diffraction

Robert L. SnyderSchool of Materials Science and Engineering

Georgia Institute of Technology

Denver X-ray Conference 2009

Page 2: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Outline of Talk

• Vegard’s Law Analysis• Spiking or Method of Standard Additions• Absorption Diffraction Method• Internal Standard Method• I/Ic and the RIR• The Generalized RIR Method• Normalized or “Standardless” Analysis• Whole Pattern Fitting and Rietveld Analysis

Page 3: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Vegard’s Law Analysis

Quantitative Analysis using the Lattice parameter

Page 4: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Substitutional Solid Solution

Page 5: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Retained Austenite Analysis

Page 6: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Deviations from Vegard’s Law

Page 7: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Quantitative Analysis using Line Intensities

• First done by L. Navias (GE) in 1925 on sillimanite and mullite.

• Today typical accuracy worse than 10%• Best RIR analysis ~3%• Best multi-line Copland-Bragg Analysis

~1%• Routine Rietveld Analysis ~1%

Page 8: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Factors affecting line intensities

Table 13.1

Page 9: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Selection of Background locations

Figure 13.2

Page 10: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Trace of the Si(111) peak using Cr radiation – Tails > 1 degree each

Figure 13.3

Page 11: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Variation in RIR as a function of scan width

Figure 13.4

Page 12: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Types of line measured in quantitative analysis: Peak Height, Peak Area, Overlapped

Figure 13.5

Page 13: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Foundation of quantitative phase analysis

Equation 13.1

( )

23 2 22 20( )( 2 2 2 2)

1 cos 2 cos 264 sin cos

hk mhkl ahk

e

s

M XI eI Fr m c V

α

αα

αλ θ θπ θ θ μρ

ρ

⎡ ⎤⎢ ⎥⎡ ⎤ ⎡ ⎤⎛ ⎞ ⎛ ⎞+ ⎢ ⎥⎢ ⎥= ⎢ ⎥⎜ ⎟ ⎜ ⎟ ⎢ ⎥⎛ ⎞⎢ ⎥ ⎢ ⎥⎝ ⎠⎝ ⎠ ⎣ ⎦⎣ ⎦ ⎢ ⎥⎜ ⎟

⎝ ⎠⎣ ⎦

l

l

Page 14: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.2

For line hkl of phase alpha

( )( )

hkIe hk

s

K K Xα

αα

αμρ ρ

⎛ ⎞⎜ ⎟⎜ ⎟⎜ ⎟⎝ ⎠

=l

l

( )

23 2 22 20( )( 2 2 2 2)

1 cos 2 cos 264 sin cos

hk mhkl ahk

e

s

M XI eI Fr m c V

α

αα

αλ θ θπ θ θ μρ

ρ

⎡ ⎤⎢ ⎥⎡ ⎤ ⎡ ⎤⎛ ⎞ ⎛ ⎞+ ⎢ ⎥⎢ ⎥= ⎢ ⎥⎜ ⎟ ⎜ ⎟ ⎢ ⎥⎛ ⎞⎢ ⎥ ⎢ ⎥⎝ ⎠⎝ ⎠ ⎣ ⎦⎣ ⎦ ⎢ ⎥⎜ ⎟

⎝ ⎠⎣ ⎦

l

l

Kexperiment Kspecimen

Page 15: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.3

The Problem: X is not an independent variable. All wt. fractions must be known to compute the mass absorption coefficient.

1

n

ii i

Xs

μρ

μρ

⎛ ⎞⎜ ⎟⎜ ⎟ =⎜ ⎟

=⎝ ⎠

⎛ ⎞⎜ ⎟⎝ ⎠

For a specimen containing n elements:

Page 16: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Nonlinearity due to matrix absorption

Page 17: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Compare Ihkl of a line in a mixture to its value in pure alpha

Page 18: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

The case of polymorphs

( )0( )

hk

hk

IX

αα

=l

l

Page 19: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Zirconia oxygen sensor

Page 20: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

High Mg stabilized sensor

Page 21: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Worry about assumptions in peak fitting!

Page 22: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Use of Klug’s Equation for any two phase mixture

Equation 13.8

( )( ) [ ( / ) ( / ) ]

e hkhk

K K XI

X Xα α

αα α α β βρ μ ρ μ ρ

=+l

l

( )

( )0 1( / )hk

e hkK KI

α

α

α αρ μ ρ=

l

l

For the pure α

phase:

Page 23: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.10

Comparison of any I to that in the pure phase

( )

( )0

( / )( / ) ( / )

hk

hkI XI X X

α

α α α

α α β β

μ ρμ ρ μ ρ

=+

l

l

Page 24: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

But, since

X + X = 1

Page 25: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.11

Equation 13.12

Then

( )

( )0

( / )[( / ) ( / ) ] ( / )

hk

hkI XI X

α

α α α

α α β β

μ ρμ ρ μ ρ μ ρ

=− +

l

l

( )

( )

( )0

( )0

( / )

( / ) [( / ) ( / ) ]

hk

hk

hk

hk

II

X II

α

α

αα

αα

α α β

μ ρ

μ ρ μ ρ μ ρ=

− −

l

l

l

l

This equation can be used to plot a standard curve of I/I0

vs XαIt can also be rearranged to give Klug’s equation:

Page 26: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Use of measured mass attenuation coefficients

Figure 13.7

Page 27: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Use of mass absorption coef’s derived from elemental chemical analysis data

Shale Analysis using Spray- dried specimens and

standardsPhase Prepared Measuredillite 47.2% 45.1(4.1)quartz 34.1% 31.1(1.9)feldspar 11.4% 11.6(1.7)chlorite 7.3% 7.4(0.6)

Page 28: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

The Basis of the Method of Standard Additions

The ratio of a line from phase to a line from any phase in aspecimen causes the mass absorption coefficient to cancel!

( )( ) ( / )

e hkhk

s

K K XI α α

ααρ μ ρ

= l

l

( ) '( ) ' ( / )

e hkhk

s

K K XI β β

ββρ μ ρ

= l

l

Page 29: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Method of standard additions or the Spiking Method

Equation 13.15

( ) ( )

( ) ' ( ) '

( )( )( )hk hk

hk hk

I K XI K X

α α β α

β β α β

ρρ

=l l

l l

Page 30: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

If we add Y grams of pure phase to the original specimen

Equation 13.16

( ) ( )

( ) ( ) '

( )hkl hk

hkl hk

I K X YI K X

α α β α α

β β α β

ρρ′

+= l

l

Where Xβ

is the original weight fraction of the reference phase

Page 31: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.17

I(hkl )α

I(hkl ′ ) β

= K (Xα + Yα )

Thus we have a linear equation

Page 32: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Spiking Method

Iα/Iref

= grams of α added per gram of original specimen Xα

= concentration of α in original specimen

Page 33: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

The Basis of the Internal Standard Method

The ratio of a line from phase to a line from phase in anyspecimen causes the mass absorption coefficient to cancel!

( )( ) ( / )

e hkhk

s

K K XI α α

ααρ μ ρ

= l

l

( ) '( ) ' ( / )

e hkhk

s

K K XI β β

ββρ μ ρ

= l

l

Page 34: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

The internal standard method The ratio of two I’s is a direct measure of the wt. ratio

I(hkl)α

I(hkl ′ ) β

= kXα

XβEquation 13.18

Thus, adding a phase of known concentration to the specimenwill permit the evaluation of k for a known and then the evaluation of the wt. fraction of alpha in any unknown

Page 35: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Internal Standard Method

Page 36: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

I/Icorundum

• The slope of the Internal Standard curve is a materials constant.

• DeWolf and Visser (1966) proposed that all materials be mixed 50:50 with corundum and the ratio of the 100% lines be published with reference patterns.

• ICDD has a great number in the current PDF

Page 37: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Generalized Reference Intensity Ratio

Equation 13.19

RIRα ,β =I(hkl)α

I(hkl ′ ) β

⎝ ⎜ ⎜

⎠ ⎟ ⎟

I( hkl ′ ) β

rel

I(hkl )α

rel

⎝ ⎜ ⎜

⎠ ⎟ ⎟

⎝ ⎜ ⎜

⎠ ⎟ ⎟

Page 38: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Quantitative analysis with RIR’sEquation 13.20

Equation 13.21

Equation 13.22

Xα =I(hkl )α

I(hkl ′ ) β

⎝ ⎜ ⎜

⎠ ⎟ ⎟

I( hkl ′ ) β

rel

I(hkl )α

rel

⎝ ⎜ ⎜

⎠ ⎟ ⎟

RIRα ,β

⎝ ⎜ ⎜

⎠ ⎟ ⎟

Xα =I(hkl )α

I(hkl ′ ) β

⎝ ⎜ ⎜

⎠ ⎟ ⎟

I( hkl ′ ) β

rel

I(hkl )α

rel

⎝ ⎜ ⎜

⎠ ⎟ ⎟

RIRβ ,c

RIRα ,c

⎝ ⎜ ⎜

⎠ ⎟ ⎟

RIRα ,β =RIRα ,γ

RIRβ,γ

Page 39: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

The Normalized RIR method, Chung Method, “Standardless Method”, Matrix flushing method, etc.

Equation 13.23

Equation 13.24

Equation 13.25

=I(hkl )α

I(hkl ′ ) β

⎝ ⎜ ⎜

⎠ ⎟ ⎟

I( hkl ′ ) β

rel

I(hkl )α

rel

⎝ ⎜ ⎜

⎠ ⎟ ⎟

RIRβ ,c

RIRα ,c

⎝ ⎜ ⎜

⎠ ⎟ ⎟

X j =1j =1

n

Xα =I(hkl )α

RIRα I(hkl )α

rel1

I(hkl )' j RIRj I( hkl ′ ) j

rel( )j=1

No.of phases∑

⎢ ⎢ ⎢

⎥ ⎥ ⎥

Page 40: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Constrained XRD phase analysis Generalized internal standard method

Equation 13.26

In

I(hkl)'std

=I(hkl)1

rel

I(hkl)' stdrel RIR1,std

⎝ ⎜ ⎜

⎠ ⎟ ⎟

X1

Xstd

+I(hkl )2

rel

I(hkl)' stdrel RIR2,std

⎝ ⎜ ⎜

⎠ ⎟ ⎟

X2

Xstd

+...+I(hkl) j

rel

I(hkl )'stdrel RIR j,std

⎝ ⎜ ⎜

⎠ ⎟ ⎟

Xj

Xstd

+ ε

Page 41: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Copland Bragg Analysis

Page 42: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Copeland-Bragg Analysis

Spray-dried fly-ash specimens and standards with and without use of overlapped lines

Phase Prepared OnlyRes.Lines

Found AllLines

Found

Mullite 0.50 1 0.530(20) 6 0.506(22)quartz 0.15 1 0.171(10) 4 0.166(7)hematite 0.10 2 0.101(3) 5 0.104(5)glass 0.25 - 0.198(23) - 0.224(24)

Page 43: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Quantitative analysis using the calculated diffraction pattern

Figure 13.9

Page 44: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Use of total pattern Rietveld Quant

Equation 13.27

Equation 13.28

Equation 13.29

R = wj I j (0) − I j(c )j

∑ 2

I j(c ) = Sα K(hkl)α G(Δθ j ,(hkl )α )P(hkl) + Ib(c )(hkl)∑

Sα =I(hkl )α

K(hkl )α

Page 45: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.30

Equation 13.31

Equation 13.32

The Rietveld scale factor contains the wt. fraction of each phase

For a pure phase:

For a mixture:

Comparing to our fundamental I eq.we can substitute tosolve for S.

Page 46: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.33

The Rietveld method with an internal standard

Equation 13.34

Page 47: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Normalized internal standard analysis using Rietveld

Equation 13.35

Equation 13.36

Page 48: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Equation 13.37

Equation 13.38

Normalization equation only valid when amorphous phases are absent

Page 49: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Rietveld Quantitative Analysis 93% sanidine, 7% albite, R=26%

Page 50: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Cordierite

Auto Catalyst Raw Data

Page 51: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Tetragonally Stabilized Zirconia~ 100 A Crystallites

Zirconia simulations25 A

Experimental100 A250 A1000 A

Page 52: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Rietveld Analysis – PANalytical HighScore Plus

75% Cordierite, 25% Stabilized ZirconiaExperimentally Refined Cell Parameters

Page 53: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Full pattern fitting with experimental patterns

Equation 13.39

Page 54: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Detection of low concentrations

Figure 13.11

Sigmas are for 95% confidence (i.e. 2 )

Page 55: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Palaboora South Africa

Page 56: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Phosphate mine

Page 57: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Tubing carrying phosphate slurry

Page 58: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Apatite slurry in real-time XRD

Page 59: Quantitative Phase Analysis by X-ray Diffraction · The internal standard method The ratio of two I’s is a direct measure of the wt. ratio I (hkl)α I (hkl) ′ β = k X α X β

Real-time analysis fed back to control surfactant concentration