Quality Reliability Technology - qrtkr. · PDF file6 Quality Reliability Technology 7 AEC-Q100 Integrated Circuits AEC-Q101 Discrete Semiconductors AEC-Q200 Passive Components

Quality Reliability Technology

QRT Inc.

Professional company in reliability test and failure analysis

www.qrtkr.com 3

Create success to customers with technology and devotion

our future with challenge and innovation.

VISION

Exciting

Experts with long experiences and abundant know-hows will support your company in production innovation and im-provement of product quality and reliability.

Operating Life & Environmental Reliability Test

Physical & Mechanical Test

Electrical Stress Test

FIB(Focused Ion Beam)Solution

Material Analysis

Training & Consulting

ESD · EMI · EOS

Physical Test / Vibration, Shock, Tensile Shear and Fracture

FIB Service Circuit Repair Precision Analysisa

Micro Structure Analysis, Surface Analysis, Organic/Inorganic Analysis

The reliability test provides various life/environmental evaluation test services such as the temperature, humidity and bias(THB) test, which evaluates endurance in an environment of high temperature and humidity, and thermal shock test in-cluding the high temperature operating life(HTOL) test, high temperature/low temperature storage test(HTSL/LTSL), which evaluates the operating life in its user environment after completing product development.

The environmental test is one to accelerate user environments such as temperature and humidity, but the physical test is an area to apply physical stresses such as bending a product or dropping it to the � oor. Evaluation services are provided such as the shock test and vibration test which evaluates physical characteristics (tensile force, shearing force) of products or simulates physical stresses produced in a manufacturing process and user environment, particularly portable devices or automotive environment.

The endurance is evaluated against electrical stress such as static electricity and overvoltage at the semiconductor compo-nent, module and set levels, and the EMC conformity assessment service is provided for automotive semiconductor.

The micro circuit repair is provided with the accumulated technological know-how and the latest equipment so that can reduce the cost and period required for R&D and veri� cation of characteristics.

Provides a structure & chemical analysis solution for materials that are used in products such as semiconductors, polymers and electronic components, using various analysis equipment and newest analysis tools.

Failure Analysis Destructive/Nondestructive Physical Property Analysis Specimen Pretreatment

The analysis technology which has been accumulated for the defective occurred in the R&D, manufacturing process and user environments, and new analysis tools are used to provide the failure analysis service to � nd a root cause of the failure.

CEO Message Business Part

CEO of QRT Inc.

Kim, Young-boo

Dear customer, How do you do?I am Kim, Young-boo, CEO of QRT Inc.Over the past few decades, the world electronics industry has grown very rapidly, par-ticularly technology in the semiconductor fi eld which is more widely applied for every new product.In spite of this remarkable growth and development, the reliability evaluation and fail-ure analysis technology service fi eld, which is needed for securing quality of various components and parts including semiconductor, is so inadequate that many compa-nies are currently experiencing a number of diffi culties in several stages of business such as reliability evaluation of new products, mass production quality assurance and responding to customer claims.Accordingly, our QRT Inc. has contributed to the reliability improvement and quality advancement of every industry related to electronic components including domestic and foreign mobile, display, automotive electric components and eco-friendly market on the basis of the quality evaluation technology and professional technology man-power which has been developed as a core specialized fi eld for over 30 years in SK Hynix Semiconductor, the country’s representative enterprise.So far, QRT Inc. has provided the reliability evaluation and failure analysis services to a lot of customers with cutting-edge technology and equipment, fast service, and these eff orts have led to realizing customer satisfaction and opportunities for our company

also to grow along with, so we heartily thank our customers, and these all results can be achieved by our customers’ constant interest and support.We are building the diversifi ed foundation of growth to jump up to be a valuable company giving greater satisfaction consist-ently also in the future, and trying to be a companion who can create a greater impression to customers by strengthening activities such as investing in new technology development and equipment, effi cient management of organization, procuring and cultivating outstanding talented personnel.We, QRT Inc., will do always our best to achieve mutual progress through customers’ development and business success with the world’s highest quality and competitive service as an everlasting partner of our customers now and for ever.Our customers are at the center of QRT Inc.A better future we will make based on our management philosophy of creating a community, with all our hearts, to pleasantly work with customers will be always with our customers.Please keep an eye with encouragement and support on QRT Inc. making constant eff orts to jump up to a new look.Thank you.

Reliability Test / Life & Environmental Test

Quality Reliability Technology www.qrtkr.com4 5

X-Ray Analysis

Scanning Acoustic Analysis(SAT/SAM)

Electrical Characteristic Analysis (Curve Tracing)

Decapsulation(Decap)

Chip Delayering

Cross Section

Examination of delamination and crack in IC

Preparation such as IC inside and PCB cross section processing

Micro circuit edit of IC

TEM sample preparation

�-

�-

�-

�-

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· Production and Process Management

· Quality Guarantee and Reliability Establishment

· Certi� cation and Diagnosis of Quality Management System

· Internal Audit/Leadership/Coaching

Scanning Electron Microscope(SEM)

Energy Dispersion Spectroscope(EDS)

EMMl(PHEMOS/THEMOS)

Dye & Pry

External Inspection (Optical Scope)

IC Counterfeit Analysis

Scanning Electron Microscopy(FE-SEM)

Dual Focused Ion Beam (Dual FIB)

Transmission Electron Microscope(TEM)

Energy Dispersion Spectroscope(EDS)

Electron Energy Loss Spectroscope(EELS)

Atomic Force Microscope(AFM)

Secondary Ion Mass Spectrometer(TOF-SIMS)

Auger Electron Microscope(AES)

X-Ray Photoelectron Spectroscopy(XPS)

X-Ray Di� raction(XRD)

Gas Chromatography(GC)

Gas Chromatography-Mass Spectrometry(GC-MS)

Fourier Transform Infrared Spectroscopy(FT-IR)

Ultraviolet Visible Spectroscopy(UV/VIS)

Inductively Coupled Plasma Optical Emission Spectroscopy(ICP-OES)

Inductively Coupled Plasma Mass Spectrometry(ICP-MS)

X-Ray Fluorescence Spectrometry(XRF)

Ion Chromatography(IC)

�M�e�t�a�l� �C�u�t�/�D�e�p�o�s�i�t�i�o�n

�I�n�s�u�l�a�t�i�o�n� �C�u�t�/�D�e�p�o�s�i�t�i�o�n

Training

Consulting

Factory Audit

Non-destructive Analysis

Destructive Analysis

Sample Preparation

Micro Structure Analysis

Surface Analysis

Organic Analysis

Inorganic Analysis

Failure Analysis

Service Items For respective test/analysis items, it can be carried out a standard test such as JEDEC/MIL/AEC/KS and customized test. Please refer to our homepage for further details.(Scan QR Code)

Category Category

Reliability Test

Integrated Analysis

FIB Analysis

Material Analysis

Training & Consulting

Physical & Mechanical

Test

Life Test

Vibration/Combined Environment

Early Life Failure Rate Test(ELFR)

High Temperature Operating Life Test(HTOL)

Low Temperature Operating Life Test(LTOL)

High Temperature Gate Bias Test(HTGB)

High Temperature Forward Bias Test(HTFB)

High Temperature Reverse Bias Test(HTRB)

Non-volatile memory(Flash) Reliability Test

Vibration Test(VIB)

Combined Environmental Reliability Test(CERT)

High Accelerated Life Test(HALT)

Mechanical Shock Test(MS)

Package/Box Drop Test(Drop)

Veri� cation of durability and forecast of life time through operating and environ-mental acceleration tests, considering user environment

●� Applicable Standards�

- International Standard for IEC, ISO, etc

- Product Standard for JEDEC, AEC, MIL-STD, etc

- OEM Requirements for automotive such as ES, GM, etc

Veri� cation of durability in regard to vibra-tion, complex environment(temperature, humidity & vibration) and shock(drop)


- International Standard for IEC, ISO, etc



Reproducing Tensile/Shear/Compression Stress using the newest UTM system

●� Objects for Application�

- Die, Wire Bonding, etc.

- PKG Body, Lead, Solder Ball, etc.

- PCB, Module, etc.

Veri� cation of compatibility for various electrical stress(from IC to end products of system)


- International Standard for IEC, ISO, etc.



Veri� cation of reliability and characteristics ofsolder joint of elements and boards


- IPC, JEDEC

Moisture Sensitivity Classi� cation(MSL)

Preconditioning Test

High/Low Temperature Storage Test(HTSL/LTSL)

Temperature Humidity Bias Test(THB)

Temperature Humidity Storage Test(THS)

Temperature Cycle Test (TC)

Power Temperature Cycle Test(PTC)

Liquid Thermal Shock Test(Liquid TS)

Highly Accelerated Stress Test(HAST/uHAST)

Pressure Cooker Test(PCT)

Board Level Drop/Bending/Temperature Cycle/Vibration

Tensile/Shear

Torque/Twist/Bending

Solderability/Resistance to Solder Heat (SD/RSH)

Environment Test

Shock/Drop

Board Level

Tensile/Shear,Solder, etc.

Subcategory SubcategoryRemarks Remarks

ESD/EOS/IC-EMI

IC ESD Test(HBM/MM/CDM)

Latch-up

System Level Gun ESD Test(Gun-ESD)

Electrical Overstress Test(EOS)

IC Level EMI Test(IC-EMI)

Electrical Load Test for Automotive Application

Electrical Stress Test


AEC-Q100Integrated Circuits

AEC-Q101Discrete Semiconductors

AEC-Q200Passive Components

Evaluation of Lead-free Solder Applied Electrical

Components

JEDEC, AEC-Q100,101,200, OEM in-house spec.

AEC-Q101Discrete Semiconductors

AEC-Q200Passive Components

OEM Components Qualification SpecificationES95400 / ES95910 / ES90000 Series and etc

AEC-Q100Integrated Circuits

Component LevelQualification

Automotive LevelMechanical Durability

Sub. System LevelQualification

Driver informationDashboard displayCar navigation

ChassisPower steeringBrakingVDM

Body electricalsIBCMCAN gatewayLight controls

SecurityImmobilizerCar alarm

PowertrainEngine control systemTransmissionFuel injectionFuel pump

SafetyAirbagsSeat occupation detectionPedestrian protectionNight visionTire air pressure detection

Ultracapacitors

Hydtogen tanks

Electric motor

Power Control Unit

Fuel cell system box

Fuel cell stack

Powertrain radiator

Fuel cell systemradiator

Quali� cation Requirements for High Quality and Reliability of Automotive Electronic Components

Quality Certi� cation for Automotive Electronic Components

Main Automotive application components

Composition of main Automotive application components

Automotive Electronics Quali� cation

Certi� cations, AEC Standards & OEM Speci� cation Required for Automotive Electrical Components


AEC-Q100, the reliability evaluation standard for integrated circuit(IC), de�nes 4 classes in regard to available temperature range. It is composed of various reliability tests that target not only information on design and production but also core failure mechanism. It is a suitable standard for automotive semiconductor evaluation that requires high reliability.

AEC-Q101 is the standard for evaluating discrete components that consist of only one component,such as FET, Diode, IGBT, and Transistor. It consists of tests that can evaluate the physical durability and characteristics of high heat power semiconductors or optical semiconductors

AEC Q100 AEC Q101

Qualification Test Definitions for Discrete Semiconductors

Qualification Test Flow for Integrated Circuits

Fault Detection Test

Reliability Test Electrical Characteristic Test

Life Test Mechanical Test

Suitability Test for Package

Process FAB ProcessReliability

Test Electrical Characteristic Test

-40℃ to +125℃ discrete semiconductors except for LEDs

-40℃ to +85℃ all LEDs

Grade 0 -40℃ to +150℃

Grade 1 -40℃ to +125℃

Grade 2 -40℃ to +105℃

Grade 3 -40℃ to +85℃

Stress Abrv Datatype Note

SampleSize

per lot

# oflots

Accepton #

failed

Reference(currentrevision)

1

Pre- and Post-Stress Electrical

Test

TEST 1 NGparts tested per therequirements of the

appropriate part0

User

supplier’sstandard

Test is performed as specifi ed in the applicable stress reference at room temperature.

2 Pre- PC 1 GS parts before Test # 7,8, 9, & 10.

0 JESD22A-113

Performed on surface mount parts (SMDs) prior to Test #

Any replacement of parts must be reported.

3 External Visual EV 1 NG parts 0 JESD22

B-101 marking and workmanship.

4 Parametric PV 1 N 25 3Note A 0 Individual AEC over the part temperature range to insure

5High

TemperatureReverse Bias

HTRB 1 CDGKUVPX 77 3

Note B 0 MIL-STD-750-1M1038 Method A

1000 hours at the maximum DC Reverse Voltage rated

The ambient temperature TA is to be adjusted

HTRB as a minimum. (See note X HTRB.)To be implemented on, or before, April 1, 2014.

27 Dielectric Integrity DI 3 DM 5 1 0 AEC-Q101-004

Pre- & Post-process change comparison to evaluate process change robustness.All parts must exceed gate breakdown voltage minimum (Power MOS & IGBT only).

28

Short CircuitReliability

Characteriza- SCR 3 DP 10 3Note B 0 AEC-Q101-006 For smart power parts only.

29 Lead Free LF 3 - - - AEC-Q005For all related solderability, solder heat resistance and whisker requirements.To be implemented on, or before, April 1, 2014.

Design Production

Reliability Test

Transistor

LED


Grade Level Ambient Operating Temp. Range Minimum Temp. Range

QUALIFICATION TEST DEFINITIONS

Discrete Semiconductor Type


0 -50℃ to +150℃ Flat chip ceramic Resistors, X8R ceramic capacitors

1 -40℃ to +125℃Capacitor Networks, Resistors, Inductors, Transformers, Thermistors, Resonators, Crystals and Varistors, all other ceramic and tantalum capacitors

2 -40℃ to +105℃

3 -40℃ to +85℃Film capacitors, Ferrites, R/R-C Networks and Trimmer capacitors

Stress NO. Note Sample Size Per Lot

Numberof lots

Accept onNumber

failedPre-and Post-StressElectrical Test 1 G 0

High TemperatureExposure 3 DG 77

Note B 1 0

Temperature Cycling 4 DG 77Note B 1 0

Analysis 5 DG 77Note B 1 0

Shear Strength 31 DG 30 1 0

Short Circuit FaultCurrent Durability 32 DG 30 1 0

Fault Current Durability 33 DG 30 1 0

End-of-Life Mode 34 DG 30 1 0

Jump Start Endurance 35 DG 30 1 0

Load Dump Endurance 36 DG 30 1 0

Inductor

Resistor

Capacitor

QRT Inc. AEC Standard Full Coverage Service

Qualification Test Definitions for Passive Components

AEC Q200 AEC-Q200 is the evaluation standard for passive elements such as Capacitor, Inductor, and Resistor. The minimum temperature range that is required for each product is provided in the table below, and this consists of tests that take into account the characteristics of passive elements such as �ammability and lead integrity The certi�cation test demands that follow AEC standards are increasing as the demand for high-reliability semiconductors are

mounting. However, it was not easy to �nd a laboratory at home and abroad that provides all the tests de�ned in each standard. QRT Inc. has been putting e�orts into constructing the requirements of the AEC standard, and is now providing Full Coverage Quali�cation Services for customer satisfaction.

QRT Inc. can execute tests in regard to the conditions of each class required for automobile electronic components, and we also have a system to evaluate environment tests, life tests, electrical characteristics and mechanical characteristics for reliability evaluation that satis�es the AEC-Q Standard. Furthermore, we can give a quick feedback since we are running a failure analysis lab that can instantly analyze the occurred failure. In regard to the AEC Inc Test, the person in charge provides a 1-on-1 One Stop Service to minimize customer inconvenience and increase e�ciency of the work procedure.


Grade Temp. Range Passive Component Type

QUALIFICATION SAMPLE SIZE REQUIREMENTS


Semiconductor & Electronic Component

Smart Appliance

Smartphone

Internet of Things (IOT)

Smart Medical System

Wearable Device

Aerospace/Defense

The electronic system for Automotives is gradually turning into smart electronic equipment, from equipment that pas-sively assists driving or driver’s condition to equipment that predicts the situation and controls the system with the goal of achieving a complete automated driving system. Following this trend, the regulations of ISO 26262 de� ne systematic safety requirements to minimize physical damage due to failure in electronic devices. Since functional stability can be es-tablished with component reliability as the foundation, the OEM standards for certi� cation and evaluation of components is getting reinforced.

The test that is demanded in the ES standard requires conducting sequential tests and the use of special/large equipment. Thus, it is important whether laboratory capacity and the equipment can be provided all at once. In addition, with the 24/7/365 operating system as the foundation, functional tests can be provided and custom sequence operation is pos-sible at any time that the consumer prefers, be it before, during, or after the test.

ES90000-01 ‘Inspection of Solder Joint’

ES90000-04 ‘Reliability Tests for Pb-free Soldering’

ES90000-02 ‘Delamination Inspection for Mounted Part’

ES90000-03 ‘Reliability Test for bare PCB’

ES90000-05 ‘Highly Accelerated Life Test’

ES95400-10 ‘Environmental Tests for Electronic Equipment’ES95910-93 ‘Environmental Tests for Air Bag System’

Required Automotive environmental test/audit standard for the classi� cations and parts electronic components

Provides ES standards for Hyundai Motors

Quality Evaluation of the environmental durability of Automotive Module

Reliability Test Service in the Key ICT Fields


One-Stop Integrated Analysis Service

Failure Analysis Service

Material Analysis Service

■ Analysis of material microstructure and fine cross section of micro area

■ Component analysis of material surface, distribution chart and survey depth profiling

■ Qualitative and quantitative analysis of inorganic compounds

■ Qualitative and quantitative analysis of organic compounds

LED Quantum Well Stucture_TEM Nano Cellulose_FE-SEM Bump Grain Orientation_Dual FIB

Micro Structure Analysis

Organic Analysis

▶ FE-SEM Analysis▶ Dual FIB Analysis▶ TEM Analysis▶ EDS Analysis▶ EELS Analysis

▶ GC Analysis▶ GC-MS Analysis▶ FT-IR Analysis▶ UV/VIS Analysis

▶ AFM Analysis▶ TOF-SIMS Analysis▶ AES Analysis▶ XPS Analysis▶ XRD Analysis

▶ ICP-OES Analysis▶ ICP-MS Analysis▶ XRF Analysis▶ IC Analysis

Surface Analysis

Inorganic Analysis

SMT / PCB Analysis

PCB Module

Material Analysis

Manufacturing Process

FIB Circuit Edit

Design

Elec

tron

ic C

ompo

nent

s / P

arts

Ana

lysis

Com

pone

nts

Reve

rse

Engi

neer

ingRe

sear

ch &

Devel

opm

ent

Solderability Test

Assembly Process

FAILURE ANALYSISSERVICE

Integrated Analysis Service


■ Training

Provides comprehensive and essential core programs that includes not only basic theories to improve the reliability and quality of the product, but also on-site training(training process open for negotiation)

•Production and Process Management�

•Management of Factory Static and ‘3Jung’

•Productivity Improvement and Cost Control

•Management/Analysis of Factory Yield

•Quality Control system(6 sigma/TPM/SPC etc.)

•Quality Guarantee and Reliability Evaluation system

•� � Certification and Diagnosis of Quality Manage-ment System(ISO 9000/9001, KOLAS, ISO 26262 etc.)

•Planning and Management of Business

•Internal Audit / Leadership / Coaching

•� � Equipment Management System (preventive main-tenance system etc.)

•� � Development of system(equipment) for special evaluation or objectives

■ Application Period� � � � By the end of December of the year the business started(early deadline when the budget is exhausted)

■ Application method�-� During business period, regular online application available at www.smtech.go.kr �-� Apply by writing equipment utilization plan and application form at www.smtech.go.kr �-� � � The participating � rm that has once been approved can continue to participate in the business until the end

date (end of December of the year) unless additional restrictions are imposed

■ People in chargeSenior Researcher Lee, Seonghun : +82-31-8094-8253 [email protected]

Researcher Ahn, Minkue : +82-31-8094-8251 [email protected]

■ Consulting

Provides guidelines for the innovation of product production process and quality improvement

■ Factory Audit

Helps for a clear understanding of the suppliers’ production capacity, quality control system, and manage-ment and operation procedures

Main categories

Training and Consulting National Support Project

Training, Consulting and Factory Audit Business to support Co-utilization of Research Equipment Audit

Business classi� cation Government subsidy Expense share for company Total Voucher

Startup companies(companies under 7 years)

Under 70%(Max. 70million Won)

Over 30%(Cash)

100%

General companies(companies over 7 years)

Under 60%(Max. 70million Won)

Over 40% (Cash)

100%Provides comprehensive and essential core programs that includes not only basic theories to improve the

Money

Time

Quality

Reduce Costs, Improve ProductivitySecurement of Quality and Reliability

■ Business PurposeEstablish the foundation for boosting the utilization of the equipment in institutions and improving the technology com-petitiveness of small and medium-sized businesses, by supporting co-utilization of the research equipment and software that universities and research institutions possess in the research & development of the small and medium-sized � rms www.smtech.go.kr (comprehensive management system) ▶ refer to business announcement for details

■ Target for SupportSmall and medium-sized businesses that plan on conducting research & development

■ Support RangeSupports equipment fees in the form of online vouchers(coupon) to small and medium-sized businesses, that use re-search equipment that universities and research institutions possess for research & development purposes (the upper bound for government subsidies has been increased in 2016)

�P�a�r�t�i�c�i�p�a�t�i�n�g� �f�i�r�m�s� � Information system on the status of small and medium-sized businesses� ▶� Identifying small and medium-sized businesses Guide to identifying the range of my small and medium-sized business

� �*� � � Only for certi� cation of new technology development such as NET(new technology), NEP(new product), new environmental technology, new construction technology

�*� For further details on this business, please contact the people in charge listed below

■ Standard for issuing test reportPermitted R&D results, for management of quality, for analysis of factors for failure, for certi� cation

(only for certi� cation of new technology)

unacceptable delivery, for certi� cation

National Support ProjectNational Support ProjectNational Support ProjectNational Support Project

i.e if a general company purchases 10 million Won worth of vouchers ▶ 6 million Won(60%/government subsidy) + 4milion Won(40%/expense share for company)


Reliability Test Service (AEC/JEDEC/OEM Speci� cation)

Analysis Service

Essential Certi� cation status and Support Business

Service Procedure / Accreditation Location & Contact Point

QRT Inc. had acquired the country’s � rst KOLAS international certi� ed testing institution quali� cation for industrial and automo-tive semiconductor � elds in 2004 and 2009, respectively. Because the products, which had passed test in QRT Inc. don’t need to undergo an extra additional test by mutual recognition for domestic and overseas sales, the cost of testing can be reduced and the development period can be shortened.

QRT Inc. is selected as a lead agency of the research equipment co-utilization support project, so small and medium-sized busi-nesses can be supported by 60~70% from the Small and Medium Business Administration when using our company’s equipment and service for the R&D purpose (see www.smtech.go.kr).

QRT Inc. acquired the Certi� ed IPC Specialist (IPC o� cially recognized engineer) quali� cation for IPC-A-610 (Acceptability of Electronics Assemblies) and IPC-A-600 (Acceptability of Printed Boards) of IPC (Institute for Printed Circuits), so contributes to improving quality/reliability in the ICT electronics industry.

Global Network

Main Task Person in Charge Contact E-mail

Semiconductor Test & AnalysisJeong, Hanchul� +82-31-8094-8212 [email protected]

Lee, Jinsu� +82-31-8094-8214 [email protected]

Automotive Application Component Test & Analysis

Kang, Jeonghoon +82-31-8094-8213 [email protected]

Lee, Hyunbae +82-31-8094-8256 [email protected]

Vibration / Mechanical Test Jung, Sukhwan� +82-31-8094-8228 [email protected]

Consulting/Technical Training Kim, Namho +82-31-8094-8221 [email protected]

Failure Analysis (Gwanggyo Open Lab) Kim, Hyunsoo

FIB Analysis (Gwanggyo Open Lab)� Kim, Chulsoo +82-31-546-7544 [email protected]

Material Analysis (Gwanggyo Open Lab)

ESD/EOS/EMI (Gwanggyo Open Lab) Kim, Dongseong� +82-31-546-7549 [email protected]

Customer and Technology Support

Contact Information of main people in charge

To cover the whole spectrum of the electronics industry from IC to end Products.

KOREA

CHINA-WUXI

JAPAN-TOKYO

USA-SAN JOSE

Construction of nationwide service network Securement of nationwide service infrastructure through construction of laboratory in key bases in Korea

Gwanggyo

Cheongju

Gumi

Icheon(Headquarters)

Sales Net-work

+82-31-546-7546 [email protected]

Product Information Receive Test Request Issuing Estimates

Accept Purchase Order (PO)

3~4 weeks are required for producing the board

Review of Test Board Manufacturing

Progress Manufacturing of Board

Test Board Receipt/Acceptance

Progress Reliability Test

Package Information

Consultation about Board Manufacturing Condition

Datasheet/Pin Layout Test ItemReview of Conditions

HTOLLTOL THB ESDTest Vector

Operation TimingOperating Voltage

Bias Con� gurationBiasing Voltage

Zapping VoltageZapping ModeZapping Pin/Group

HTOL:

T H B :

E S D :

Pin count / Dimension

Client RemarksQRT Inc.

Check the requested items Accept the request and specimen

Review of analysis information

Sending the analysis result

Sending the estimate

Issuing the tax invoice

Carrying out the analysis

Preparing the request and sending specimens

Review of Analysis Results

Troubleshooting

Client QRT Inc.

Telephone Enquiry +82-31-8094-8211

A Global Leading-edge Company

for Reilablity Engineering and Failure Analysis

Documents

Quality Reliability Technology - qrtkr. · PDF file6 Quality Reliability Technology 7 AEC-Q100 Integrated Circuits AEC-Q101 Discrete Semiconductors AEC-Q200 Passive Components