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Qualification Test of UFE Board
· Schematic diagram of UFE · Board types and current status · Qualification test procedures · VA & UFE test setup · Test results · Conclusion
C. H. ChungAMS TRD Meeting, July 16 ~17. 2002 @CERN
Schematic Diagram of UFE
VA32 HDR12Preamp.ShapingMultiplexingPeak. T = 2.4msPower:55mW
Applied Power
HCC Chip
12 bit ADC AD7476
UFE Board Types
UFE45M21 UFE45S17
UFE90S96 UFE90M18
UFE development made up to the present
ADC Op. AmpVA
Test Procedures
Measurements : Gain, Pedestals, Noise, Linearity, Connectivity
VA Hybrid
UFE w.o VA
· Peaking Time = 2.4 ms · Gain = 2.0 [ADC counts / fC] · Pedestals and Noise · All channels within ± 1% of the mean gain · All channels within 3% non-linearity · Connection test with external CAL
Production More Qualification Tests · Mechanical Vibration ·Thermo Vacuum · EMI
VA Hybrid Test Setup
VA-DAQ setup* IDE Co.* Type of VA-chip: VA32HDR12* Number of channels/chip: 32* Number of chips/board: 1* Value (pF) of calibration capacitor:10.00E+0
Labview w. ROOTVA DAQ PCB and Adapter board
VA Test Results(1)
Peaking time & Linearity / channel
Signal waveform of channel Oscilloscope
Gain fitting vs. input charge
VA Test Results (3)
Click to add text
Typically all channels within 1% of the mean gainMean = 1.198 [mV/fC], Sigma = 0.00337
UFE Board Test Setup
Board Box Block diagram of DAQ system
Control signal
WIN NTCVI, ROOT
Real mode : Pedestal and NoiseCAL mode : Gain and Nonlinearity
4m
UFE Test Results (1)
One Channel Pedestals and Gain linearity
Noise = 1.705 ADC counts
Gain = 2.01 [ADC counts/fC]
MIP signal in TRD = 55 [fC] @80% Xe + 20%CO
2, gain = 3000(3.5´105 e-)
S/N = 55/0.86 = 64
UFE Test Results (3)
Non-Linearity = [Fit-Measured]/Fit upto 1.5[pC]Linear range : 0~1.5pC within 2% nonlinearity
Conclusion
Qualification test setup for VA and UFE board is ready and working successfully.
40 VA Hybrid were tested and two chips were malfunctioning.
12 UFE boards were produced and tested. Pedestal, Noise, Gain, Linearity, Nonlinearity, Peaking Time, Connectivity /Channel/ VA chip/ UFE-Board
Some problems are under investigation. Defect on VAs after soldering with UFE, connectivity improvement.
Calibration const. DB : data sheet in ASCII format on the WWW. http://accms04.physik.rwth-aachen.de/~chchung/ams/trd/ufe/