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PREPARED BY: Anbu Malar.S. (QA Reliability Technician, ASEM) REVIEWED BY: KC CHEN (QA Lab Engineer, ASEM) APPROVED BY: SK LEE (QA Lab Manager, ASEM)

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Page 1: (QA Reliability Technician, ASEM) REVIEWED BY: KC …customerportal.asemal.com.my/ShareReport/QUARTERLY... · (QA Reliability Technician, ASEM) REVIEWED BY: ... 4TH QUARTER RELIABILITY

PREPARED BY: Anbu Malar.S.

(QA Reliability Technician, ASEM)

REVIEWED BY: KC CHEN

(QA Lab Engineer, ASEM)

APPROVED BY: SK LEE

(QA Lab Manager, ASEM)

Page 2: (QA Reliability Technician, ASEM) REVIEWED BY: KC …customerportal.asemal.com.my/ShareReport/QUARTERLY... · (QA Reliability Technician, ASEM) REVIEWED BY: ... 4TH QUARTER RELIABILITY

4TH QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

1.0 INTRODUCTION 1

2.0 EXECUTIVE SUMMARY 2 2.1 MOISTURE SOAKING FOR PACKAGE BUILT IN ASEM……………………..…… 2 2.2 TEMPERATURE CYCLE (@1000CYCLES)………………………………………… 3 2.3 PRESSURE COOKER TEST (121°C/100%/15PSI @168HRS………………………… 4 2.4 HIGHLY ACCELERATED STRESS TEST – UHAST (130°C/85%RH/33.3, PSIA) 4

2.5 HIGHLY ACCELERATED STRESS TEST – UHAST (110°C/85%RH/17.7psia,) 5 2.6 HIGHLY ACCELERATED STRESS TEST - (BHAST) - 110°C/85%RH/17.7psia.…5

2.7 HIGH TEMPERATURE STORAGE – HTS(150°C)………………………………… 5

3.0 PACKAGE QUALIFICATIONS AND EVALUATIONS 6 3.1 GOLD WIRE (AU) RELIABILITY MONITORING……………………..…… 6 3.2 COPPER WIRE (CU) RELIABILITY MONITORING ...……………………… 6

4.0 RELIABILITY MONITOR PROGRAM (RMP) 7 4.1 DESCRIPTION & PURPOSE OF TEST……………………………………… 7

4.2 FIT MATHEMATICAL CALCULATION…………………………………… 8 4.3 RELIABILITY MONITOR PROGRAM FLOW CHART……………………….8

5.0 FIT VALUE FOR AU WIRE PRODUCTS 9 5.1 TEST DATA FOR MOISTURE SOAKING 9

5.1.1 MOISTURE SOAKING LEVEL 3 (MSL-3)………………………………9 5.1.2 MOISTURE SOAKING LEVEL 1 (MSL-1)………………………………13

5.2 TEST DATA FOR TEMPERATURE CYCLING (TC) 14 5.2.1 CONDITION B…………………………………………………………….14 5.2.2 CONDITION C…………………………………………………………….18

5.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) 23

5.4 HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C/85%RH 28

5.5 HIGH TEMPERATURE STORAGE (HTS) 33

6.0 FIT VALUE FOR CU WIRE PRODUCTS 38 6.1 TEST DATA FOR MOISTURE SOAKING 38

6.1.1 MOISTURE SOAKING LEVEL 3 (MSL-3)……………………………….38 6.1.2 MOISTURE SOAKING LEVEL 1 (MSL-1)……………………………….41

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4TH QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

6.2 TEST DATA FOR TEMPERATURE CYCLING (TC) 41 6.2.1 CONDITION C…………………………………………………………………41 6.2.2 CONDITION B…………………………………………………………………44

6.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) 45

6.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 48 CONDITION ( 130°C / 85%RH – CU ) ……………………………………………48

6.5 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 52

CONDITION ( 110°C / 85%RH – CU ) ……………………………………………52 6.6 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST- BIAS (BHAST) 53

CONDITION ( 110°C / 85%RH – CU ) ……………………………………………53

6.7 HIGH TEMPERATURE STORAGE (HTS) 53

7.0 SCANNING ACOUSTIC MICROSCOPE (SAM) ANALYSIS DATA 57

8.0 SOLDERABILITY TEST DATA 60

9.0 MARK PERMANANCY DATA 63

10.0 ATTACHMENT 65 10.1 ACOUSTIC TOPOGRAPHY ANALYSIS…………………………………………………65

Page 4: (QA Reliability Technician, ASEM) REVIEWED BY: KC …customerportal.asemal.com.my/ShareReport/QUARTERLY... · (QA Reliability Technician, ASEM) REVIEWED BY: ... 4TH QUARTER RELIABILITY

4TH QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

1.0 INTRODUCTION This Reliability Report is expected to provide cus tomers with an overview of ASEM’s product quality which we are committed to achieve a high level of confidence & respect from our customers resulting from highly reliable & quality product. Product qualit y an d reliab ility have always b een sig nificant fa ctors at ASEM, and t hey are built i nto th e product right from the initial set-up of the product. These 4th quarter reports summarize the reliability test data from the reliability evaluation, qualification and reliability monitoring prog ram (R MP). The data w ill be i n a series o f continuing upd ates and i s present ed by environ mental stress test which to sh ow enhancements in product quality and reli ability. It is als o aimed to highlight the reliability failure for improvement. The RMP test samples are taken from production lots on a generic basis to represent ASEM standard process flow for that given package type. For qualification or evaluation of pr ocess/material chan ge of package, e ngineering o r originator will prepare the sample and submit to reliability for testing. In general, Q uality is a characteristic which makes a de vice good or ba d, irr espective to meet the manufacturers / customers specifications at time of delivery. The failure are generally measured in DPM or PPM (Defects per million or Parts per million). Reliab ility is defined as a req uired f unction over ti me in response to varied (s pecified) stat e condition. It i s generally measured in Fa ilure in ti me (FIT). One FIT represents ONE FAILURE IN ONE BILL ION DEVICE HOURS. "Pre-conditioning" test that intent to identify those devices that are sensitive to moisture induced stress is performed. This test is closely simulate the environmental conditions of a device exposed to when mounted onto a PCB (customer premises). The defects such as delamination, cracks and “popcorn” caused by expanding moisture inside may not be visible with naked eye. Delamination, cracks and “popcorn” can cause short-term reliability failure, even though the chip initially passes an electrical test. The Scanning Acoustics Micrography (SAM) technique is used to monitor for these types of defects. This non-destructive and " real time" test met hod is also used to mo nitor t hrough ass embly processing t hat can cause die surf ace delamination. All Surface Mount Devices (SMD) are now being subjected t o "Preconditioning" prior to reliability stress test. If a device f ailure w ere encountered, they are s ubjected t o failure analysis f or r oot-cause ide ntification. An improvement action plan will b e then be re quested from respective department(s) as part of our con tinuous improvement. The new competitive environment in the packaging industry and other semiconductor sectors, present ASEM with the challenge of maintaining product quality and reliability while producing products at competitive prices. To achieve the goal, ASEM has focused strictly adherence to quality and reliability standards and practices.

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

2.0 EXECUTIVE SUMMARY

2.1 MOISTURE SOAKING FOR PACKAGE BUILT IN ASEM

2.1 ( a ) MOISTURE SENSITIVITY LEVEL 3 ( MSL-3 )

Current packages built in ASEM qualified to MSL "3" of JOINT IPC/JEDEC STD 020 spec which able to withstand preconditioning at 30ºC/60%RH moisture soak for 192hrs.

PRODUCT FAMILY

FIT VALUES ( Au )

FIT VALUES ( Cu )

CUM Q4 '16 CUM Q4 '16

PLCC 684 1811

LQFP 348 1563

PQFP 1570 N.A

PBGA 575 1286

QFP 607 1334

QFN 487 1380

TQFP 1137 1424

LBGA 464 1000

PQFN 9942 N.A

HSBGA 1521 2841

SOPW 3984 N.A

TSSOP 1711 N.A

SBGA N/A 1591

CSBGA 2360 N.A

2.1 ( b ) MOISTURE SENSITIVITY LEVEL 1 ( MSL-1 ) Current packages built in ASEM qualified to MSL "1" of JOINT IPC/JEDEC STD 020 spec which able to withstand preconditioning at 85ºC / 85%RH moisture soak for 168hrs.

PRODUCT FAMILY

FIT VALUES CUM Q4’16 ( Au )

FIT VALUES CUM Q4’16 ( Cu )

QFN 5405 21210

PLCC 15150 N/A

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

2.2 TEMPERATURE CYCLE ( TC ) @ 1000cycles

All packages were submitted for preconditioning test except for PDIP as per moisture sensitivity level Table 1 and passed with zero failures by testing through 1000 cycle at condition "B" or condition "C" as requested.

PRODUCT FAMILY

FIT VALUES ( Au ) FIT VALUES ( Cu )

Condition 'B' Condition 'C' Condition 'B' Condition 'C'

CUM Q4'16 CUM Q4'16 CUM Q4'16 CUM Q4'16

PQFP 326 276 N/A N/A

PQFN 323 15272 N/A N/A

LQFP 220 101 2545 1859

PBGA 402 192 1553 1742

CSBGA 736 1870 N/A N/A

SBGA N/A N/A 1222 N/A

LBGA 2257 476 1222 1315

PLCC 797 206 N/A 1388

QFN 176 309 N/A 931

TQFP 2405 382 4581 1178

QFP 747 1782 N/A 5091

SOPW N/A 3054 N/A N/A

HSBGA 1150 667 N/A 2182

TSSOP 390 542 N/A N/A

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

2.3 PRESSURE COOKER TEST (PCT) - 121°C/100%/15psig @ 168hrs

PRODUCT FAMILY

FIT VALUES ( Au )

FIT VALUES ( Cu )

CUM Q4'16 CUM Q4'16

PLCC 1844 8671

LQFP 793 12312

PBGA 1460 22725

QFP 1781 25972

QFN 516 5717

TQFP 1741 7836

PQFP 66514 N/A

LBGA 2281 12120

PQFN 60601 N/A

HSBGA 5141 12986

SBGA N/A 7272

CSBGA 9774 N/A

SOPW 20200 N/A

TSSOP 8589 N/A

2.4 HIGHLY ACCELERATED STRESS TEST (UHAST) - 130°C/85%RH/33.3psia.

PRODUCT FAMILY

FIT VALUES ( Au )

FIT VALUES ( Cu )

CUM Q4'16 CUM Q4'16

LQFP 962 7047

PBGA 1068 8941

QFP 2031 17044

QFN 1605 5487

TQFP 2589 5588

PQFP 65715 N/A

LBGA 3733 6284

PQFN 60601 N/A

HSBGA 6532 12986

PLCC 1886 8276

CSBGA 15628 N/A

SBGA N/A 7272

TSSOP 30301 N/A

SOPW 18241 N/A

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

2.5 HIGHLY ACCELERATED STRESS TEST (UHAST) - 110°C/85%RH/17.7psia.

PRODUCT FAMILY FIT VALUES

( Cu ) CUM Q4’16

PBGA 6345

LBGA 5785

2.6 HIGHLY ACCELERATED STRESS TEST – BIAS (BHAST) - 110°C/85%RH/17.7psia.

PRODUCT FAMILY FIT VALUES

( Cu ) CUM Q4’16

PBGA 115693

2.7 HIGH TEMPERATURE STORAGE (HTS) - 150°C

PRODUCT FAMILY

FIT VALUES ( Au ) FIT VALUES ( Cu )

CUM Q4 '16 CUM Q4 ‘16

PLCC 409 1393

LQFP 204 1126

PBGA 503 792

QFP 435 4363

QFN 103 921

TQFP 476 5024

PQFN 10181 N/A

PQFP 11454 N/A

LBGA 400 633

SBGA N/A 1478

CSBGA 2386 N/A

HSBGA 1198 2182

SOPW 3065 N/A

TSSOP 1636 N/A

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

3.0 PACKAGE BOM INFORMATION

Refer to the BOM information on the selected packages for Q3’ 16 REL MON.

3.1 GOLD WIRE ( Au ) REL MONITORING :

3.2 COPPER WIRE (Cu) REL MONITORING:

Page 10: (QA Reliability Technician, ASEM) REVIEWED BY: KC …customerportal.asemal.com.my/ShareReport/QUARTERLY... · (QA Reliability Technician, ASEM) REVIEWED BY: ... 4TH QUARTER RELIABILITY

4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

4.0 RELIABILITY MONITOR PROGRAM ( RMP )

4.1 DESCRIPTION & PURPOSE OF TESTS

STRESS TEST PURPOSE

PRE-CONDITIONING To simulate the thermal & mechanical stresses imposed on a device when mounted on PCB. (J-STD-020)

TEMP CYCLE (TC)

To evaluate the package & die interface mechanical resistance to alternate exposures of high & low temperature changes. Evaluate stress integrity of die attach to lead frame & wire bond to die and lead. (JESD22-A104)

AUTOCLAVE / PRESSURE COOKER

UNBIASED HAST

HIGH TEMPERATURE STORAGE(HTS)

To evaluate the stress integrity of mold compound & lead frame interfaces. To evaluate the moisture resistance of package in moisture condensing or moisture saturated steam environment. (JESD22-A102) To evaluate the stress integrity of mold compound & lead frame interfaces. To evaluate the moisture resistance of package in non-condensing moisture or Humid environment. (JESD22-A118) To evaluate the package under storage condition with the effect of time and temperature. (JESD22-A103)

C-SAM

To non-destructively study the package delamination through the measure of acoustic signal. (J-STD-035 & J-STD-020)

SOLDERABILITY To examine the solderability of termination/external leadfinger. (J-STD-002)

MARK PERMANANCY TEST(MPT)

To examine the capabilities of marking process. (MIL-STD-883 METHOD 2015.11)

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4th QUARTER RELIABILITY REPORT FOR 2016

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ASEM RELIABILITY LAB

4.2 FIT MATHEMATICAL CALCULATION

1. 60% Confidence Level is utilized. 2. Chi Square Distribution Value, which approximates to the number of failures is used. 3. The Failure Rate (FR) is calculated by :

X2 = Chi Square Distribution CL = Confidence Level r = Total number of failures n = Total number of sample tested t = Total device hours applied

4.3 RELIABILITY MONITOR PROGRAM FLOW CHART

PROCESS FLOW

FR = X² (1 - CL², 2r + 2) 2nt

FIT = X² (1 - CL², 2r + 2) x10E + 9 2nt

STRESS TEST

FINAL REPORT

PRE-COND MSL

FINAL ATE(FROM ASSEMBLY)

RMP LOT FOR RELIABILITY TEST

FAILURE ANALYSIS

PASS?NO

YES

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

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5.0 FIT CHARTS FOR AU WIRE PRODUCTS. 5.1 TEST DATE FOR MOISTURE SOAKING - (Au ) 5.1.1 MOISTURE SOAK LEVEL 3 (MSL-3) 30°C / 60%RH, 192 HOURS

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10̂ 9 Device Cycles)

Cum Q3'16

8298 0 0 1593216 0.000058% 575.12

Oct'16 0 0 0 1593216 0.000058% 575.12

Nov'16 0 0 0 1593216 0.000058% 575.12

Dec'16 0 0 0 1593216 0.000058% 575.12

8298 0 0 1593216 0.000058% 575.12

PBGA Product Family

Total

FIT Chart

0

100

200

300

400

500

600

700

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

10157 0 0 1950144 0.000047% 469.86

Oct'16 120 0 0 1973184 0.000046% 464.37

Nov'16 0 0 0 1973184 0.000046% 464.37

Dec'16 0 0 0 1973184 0.000046% 464.37

10277 0 0 1973184 0.000046% 464.37Total

LBGA Product Family

FIT Chart

461

462

463

464

465

466

467

468

469

470

471

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

13726 0 0 2635392 0.000035% 347.69

Oct'16 0 0 0 2635392 0.000035% 347.69

Nov'16 0 0 0 2635392 0.000035% 347.69

Dec'16 0 0 0 2635392 0.000035% 347.69

13726 0 0 2635392 0.000035% 347.69Total

LQFP Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10̂ 9 Device Cycles)

Cum Q3'16

3040 0 0 583680 0.000157% 1569.85

Oct'16 0 0 0 583680 0.000157% 1569.85

Nov'16 0 0 0 583680 0.000157% 1569.85

Dec'16 0 0 0 583680 0.000157% 1569.85

3040 0 0 583680 0.000157% 1569.85

PQFP Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10̂ 9 Device Cycles)

Cum Q3'16

480 0 0 92160 0.000994% 9942.39

Oct'16 0 0 0 92160 0.000994% 9942.39

Nov'16 0 0 0 92160 0.000994% 9942.39

Dec'16 0 0 0 92160 0.000994% 9942.39

480 0 0 92160 0.000994% 9942.39

PQFN Product Family

Total

FIT Chart

0

2000

4000

6000

8000

10000

12000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9

Device Cycles)

Cum Q3'16

7857 0 0 1508544 0.000061% 607.40

Oct'16 0 0 0 1508544 0.000061% 607.40

Nov'16 0 0 0 1508544 0.000061% 607.40

Dec'16 0 0 0 1508544 0.000061% 607.40

7857 0 0 1508544 0.000061% 607.40

QFP Product Family

Total

FIT Chart

0

100

200

300

400

500

600

700

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

6861 0 0 1317312 0.000070% 695.58

Oct'16 120 0 0 1340352 0.000068% 683.62

Nov'16 0 0 0 1340352 0.000068% 683.62

Dec'16 0 0 0 1340352 0.000068% 683.62

6981 0 0 1340352 0.000068% 683.62

PLCC Product Family

Total

FIT Chart

676

678

680

682

684

686

688

690

692

694

696

698

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

4198 0 0 806016 0.000114% 1136.81

Oct'16 0 0 0 806016 0.000114% 1136.81

Nov'16 0 0 0 806016 0.000114% 1136.81

Dec'16 0 0 0 806016 0.000114% 1136.81

4198 0 0 806016 0.000114% 1136.81

TQFP Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

Cum Q3'16 Oct'16 Nov'16 Dec'16MonthF

IT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2022 0 0 388224 0.000236% 2360.21

Oct'16 0 0 0 388224 0.000236% 2360.21

Nov'16 0 0 0 388224 0.000236% 2360.21

Dec'16 0 0 0 388224 0.000236% 2360.21

2022 0 0 388224 0.000236% 2360.21

CSBGA Product Family

Total

FIT Chart

0

500

1000

1500

2000

2500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

9688 0 0 1860096 0.000049% 492.60

Oct'16 120 0 0 1883136 0.000049% 486.58

Nov'16 0 0 0 1883136 0.000049% 486.58

Dec'16 0 0 0 1883136 0.000049% 486.58

9808 0 0 1883136 0.000049% 486.58

QFN Product Family

Total

FIT Chart

483

484

485

486

487

488

489

490

491

492

493

494

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3138 0 0 602496 0.000152% 1520.82

Oct'16 0 0 0 602496 0.000152% 1520.82

Nov'16 0 0 0 602496 0.000152% 1520.82

Dec'16 0 0 0 602496 0.000152% 1520.82

3138 0 0 602496 0.000152% 1520.82

HSBGA Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2790 0 0 535680 0.000171% 1710.52

Oct'16 0 0 0 535680 0.000171% 1710.52

Nov'16 0 0 0 535680 0.000171% 1710.52

Dec'16 0 0 0 535680 0.000171% 1710.52

2790 0 0 535680 0.000171% 1710.52

TSSOP Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1198 0 0 230016 0.000398% 3983.60

Oct'16 0 0 0 230016 0.000398% 3983.60

Nov'16 0 0 0 230016 0.000398% 3983.60

Dec'16 0 0 0 230016 0.000398% 3983.60

1198 0 0 230016 0.000398% 3983.60

SOPW Product Family

Total

FIT Chart

0

500

1000

1500

2000

2500

3000

3500

4000

4500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

5.1.2 MOISTURE SOAK LEVEL 1 (MSL-1) 85°C/85%RH, 168HOURS.

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1009 0 0 169512 0.000541% 5405.46

Oct'16 0 0 0 169512 0.000541% 5405.46

Nov'16 0 0 0 169512 0.000541% 5405.46

Dec'16 0 0 0 169512 0.000541% 5405.46

1009 0 0 169512 0.000541% 5405.46Total

QFN Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

360 0 0 60480 0.001515% 15150.31

Oct'16 0 0 0 60480 0.001515% 15150.31

Nov'16 0 0 0 60480 0.001515% 15150.31

Dec'16 0 0 0 60480 0.001515% 15150.31

360 0 0 60480 0.001515% 15150.31Total

PLCC Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

16000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

- 14 -

5.2 TEST DATA FOR TEMPERATURE CYCLE - (Au)

5.2.1 CONDITION B (-55°C / 125°C )

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

797 0 0 797000 0.000115% 1149.67

Oct'16 0 0 0 797000 0.000115% 1149.67

Nov'16 0 0 0 797000 0.000115% 1149.67

Dec'16 0 0 0 797000 0.000115% 1149.67

797 0 0 797000 0.000115% 1149.67Total

HSBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2277 0 0 2277000 0.000040% 402.41

Oct'16 0 0 0 2277000 0.000040% 402.41

Nov'16 0 0 0 2277000 0.000040% 402.41

Dec'16 0 0 0 2277000 0.000040% 402.41

2277 0 0 2277000 0.000040% 402.41Total

PBGA Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

450

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 15 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1245 0 0 1245000 0.000074% 735.98

Oct'16 0 0 0 1245000 0.000074% 735.98

Nov'16 0 0 0 1245000 0.000074% 735.98

Dec'16 0 0 0 1245000 0.000074% 735.98

1245 0 0 1245000 0.000074% 735.98Total

CSBGA Product Family

FIT Chart

0

100

200

300

400

500

600

700

800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2351 0 0 2351000 0.000039% 389.75

Oct'16 0 0 0 2351000 0.000039% 389.75

Nov'16 0 0 0 2351000 0.000039% 389.75

Dec'16 0 0 0 2351000 0.000039% 389.75

2351 0 0 2351000 0.000039% 389.75Total

TSSOP Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

450

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

406 0 0 406000 0.000226% 2256.87

Oct'16 0 0 0 406000 0.000226% 2256.87

Nov'16 0 0 0 406000 0.000226% 2256.87

Dec'16 0 0 0 406000 0.000226% 2256.87

406 0 0 406000 0.000226% 2256.87Total

LBGA Product Family

FIT Chart

0

500

1000

1500

2000

2500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 16 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

5199 0 0 5199000 0.000018% 176.24

Oct'16 0 0 0 5199000 0.000018% 176.24

Nov'16 0 0 0 5199000 0.000018% 176.24

Dec'16 0 0 0 5199000 0.000018% 176.24

5199 0 0 5199000 0.000018% 176.24Total

QFN Product Family

FIT Chart

0

20

40

60

80

100

120

140

160

180

200

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1150 0 0 1150000 0.000080% 796.77

Oct'16 0 0 0 1150000 0.000080% 796.77

Nov'16 0 0 0 1150000 0.000080% 796.77

Dec'16 0 0 0 1150000 0.000080% 796.77

1150 0 0 1150000 0.000080% 796.77Total

PLCC Product Family

FIT Chart

0

100

200

300

400

500

600

700

800

900

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1226 0 0 1226000 0.000075% 747.38

Oct'16 0 0 0 1226000 0.000075% 747.38

Nov'16 0 0 0 1226000 0.000075% 747.38

Dec'16 0 0 0 1226000 0.000075% 747.38

1226 0 0 1226000 0.000075% 747.38Total

QFP Product Family

FIT Chart

0

100

200

300

400

500

600

700

800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 17 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

381 0 0 381000 0.000240% 2404.96

Oct'16 0 0 0 381000 0.000240% 2404.96

Nov'16 0 0 0 381000 0.000240% 2404.96

Dec'16 0 0 0 381000 0.000240% 2404.96

381 0 0 381000 0.000240% 2404.96Total

TQFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2810 0 0 2810000 0.000033% 326.08

Oct'16 0 0 0 2810000 0.000033% 326.08

Nov'16 0 0 0 2810000 0.000033% 326.08

Dec'16 0 0 0 2810000 0.000033% 326.08

2810 0 0 2810000 0.000033% 326.08Total

PQFP Product Family

FIT Chart

0

50

100

150

200

250

300

350

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2840 0 0 2840000 0.000032% 322.64

Oct'16 0 0 0 2840000 0.000032% 322.64

Nov'16 0 0 0 2840000 0.000032% 322.64

Dec'16 0 0 0 2840000 0.000032% 322.64

2840 0 0 2840000 0.000032% 322.64n

PQFN Product Family

FIT Chart

0

50

100

150

200

250

300

350

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

- 18 -

5.2.2 CONDITION C ( -65°C / 150°C )

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1893 0 0 1893000 0.000048% 484.04

Oct'16 30 0 0 1923000 0.000048% 476.49

Nov'16 0 0 0 1923000 0.000048% 476.49

Dec'16 0 0 0 1923000 0.000048% 476.49

1923 0 0 1923000 0.000048% 476.49Total

LBGA Product Family

FIT Chart

472

474

476

478

480

482

484

486

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

4774 0 0 4774000 0.000019% 191.93

Oct'16 0 0 0 4774000 0.000019% 191.93

Nov'16 0 0 0 4774000 0.000019% 191.93

Dec'16 0 0 0 4774000 0.000019% 191.93

4774 0 0 4774000 0.000019% 191.93Total

PBGA Product Family

FIT Chart

0

50

100

150

200

250

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

9039 0 0 9039000 0.000010% 101.37

Oct'16 0 0 0 9039000 0.000010% 101.37

Nov'16 0 0 0 9039000 0.000010% 101.37

Dec'16 0 0 0 9039000 0.000010% 101.37

9039 0 0 9039000 0.000010% 101.37Total

LQFP Product Family

FIT Chart

0

20

40

60

80

100

120

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 19 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

4425 0 0 4425000 0.000021% 207.07

Oct'16 30 0 0 4455000 0.000021% 205.68

Nov'16 0 0 0 4455000 0.000021% 205.68

Dec'16 0 0 0 4455000 0.000021% 205.68

4455 0 0 4455000 0.000021% 205.68Total

PLCC Product Family

FIT Chart

205

205

206

206

207

207

208

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3320 0 0 3320000 0.000028% 275.99

Oct'16 0 0 0 3320000 0.000028% 275.99

Nov'16 0 0 0 3320000 0.000028% 275.99

Dec'16 0 0 0 3320000 0.000028% 275.99

3320 0 0 3320000 0.000028% 275.99Total

PQFP Product Family

FIT Chart

0

50

100

150

200

250

300

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

60 0 0 60000 0.001527% 15271.51

Oct'16 0 0 0 60000 0.001527% 15271.51

Nov'16 0 0 0 60000 0.001527% 15271.51

Dec'16 0 0 0 60000 0.001527% 15271.51

60 0 0 60000 0.001527% 15271.51Total

PQFN Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

16000

18000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 20 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

4103 0 0 4103000 0.000022% 223.32

Oct'16 0 0 0 4103000 0.000022% 223.32

Nov'16 0 0 0 4103000 0.000022% 223.32

Dec'16 0 0 0 4103000 0.000022% 223.32

4103 0 0 4103000 0.000022% 223.32Total

QFP Product Family

FIT Chart

0

50

100

150

200

250

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2399 0 0 2399000 0.000038% 381.95

Oct'16 0 0 0 2399000 0.000038% 381.95

Nov'16 0 0 0 2399000 0.000038% 381.95

Dec'16 0 0 0 2399000 0.000038% 381.95

2399 0 0 2399000 0.000038% 381.95Total

TQFP Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

450

Cum Q3'16 Oct'16 Nov'16 Dec'16MonthF

IT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

490 0 0 490000 0.000187% 1869.98

Oct'16 0 0 0 490000 0.000187% 1869.98

Nov'16 0 0 0 490000 0.000187% 1869.98

Dec'16 0 0 0 490000 0.000187% 1869.98

490 0 0 490000 0.000187% 1869.98Total

CSBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

2000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 21 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2940 0 0 2940000 0.000031% 311.66

Oct'16 30 0 0 2970000 0.000031% 308.52

Nov'16 0 0 0 2970000 0.000031% 308.52

Dec'16 0 0 0 2970000 0.000031% 308.52

2970 0 0 2970000 0.000031% 308.52Total

QFN Product Family

FIT Chart

307

307

308

308

309

309

310

310

311

311

312

312

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1373 0 0 1373000 0.000067% 667.36

Oct'16 0 0 0 1373000 0.000067% 667.36

Nov'16 0 0 0 1373000 0.000067% 667.36

Dec'16 0 0 0 1373000 0.000067% 667.36

1373 0 0 1373000 0.000067% 667.36Total

HSBGA Product Family

FIT Chart

0

100

200

300

400

500

600

700

800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

1690 0 0 1690000 0.000054% 542.18

Oct'16 0 0 0 1690000 0.000054% 542.18

Nov'16 0 0 0 1690000 0.000054% 542.18

Dec'16 0 0 0 1690000 0.000054% 542.18

1690 0 0 1690000 0.000054% 542.18Total

TSSOP Product Family

FIT Chart

0

100

200

300

400

500

600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 22 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

300 0 0 300000 0.000305% 3054.30

Oct'16 0 0 0 300000 0.000305% 3054.30

Nov'16 0 0 0 300000 0.000305% 3054.30

Dec'16 0 0 0 300000 0.000305% 3054.30

300 0 0 300000 0.000305% 3054.30Total

SOPW Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

3500

300 0 0 0

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 23 -

5.2 TEST DATA FOR PRESSURE COOKER TEST (PCT) - 121°C / 100% / 15PSIG, 168HRS - ( Au )

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

82 0 0 13776 0.006651% 66513.56

Oct'16 0 0 0 13776 0.006651% 66513.56

Nov'16 0 0 0 13776 0.006651% 66513.56

Dec'16 0 0 0 13776 0.006651% 66513.56

82 0 0 13776 0.006651% 66513.56Total

PQFP Product Family

FIT Chart

0

10000

20000

30000

40000

50000

60000

70000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

90 0 0 15120 0.006060% 60601.24

Oct'16 0 0 0 15120 0.006060% 60601.24

Nov'16 0 0 0 15120 0.006060% 60601.24

Dec'16 0 0 0 15120 0.006060% 60601.24

90 0 0 15120 0.006060% 60601.24Total

PQFN Product Family

FIT Chart

0

10000

20000

30000

40000

50000

60000

70000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

6847 0 0 1150296 0.000080% 796.57

Oct'16 30 0 0 1155336 0.000079% 793.09

Nov'16 0 0 0 1155336 0.000079% 793.09

Dec'16 0 0 0 1155336 0.000079% 793.09

6877 0 0 1155336 0.000079% 793.09Total

LQFP Product Family

FIT Chart

791

792

793

794

795

796

797

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 24 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

3736 0 0 627648 0.000146% 1459.88

Oct'16 0 0 0 627648 0.000146% 1459.88

Nov'16 0 0 0 627648 0.000146% 1459.88

Dec'16 0 0 0 627648 0.000146% 1459.88

3736 0 0 627648 0.000146% 1459.88Total

PBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

10530 0 0 1769040 0.000052% 517.96

Oct'16 30 0 0 1774080 0.000052% 516.49

Nov'16 0 0 0 1774080 0.000052% 516.49

Dec'16 0 0 0 1774080 0.000052% 516.49

10560 0 0 1774080 0.000052% 516.49Total

QFN Product Family

FIT Chart

516

516

517

517

518

518

519

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2927 0 0 491736 0.000186% 1863.38

Oct'16 30 0 0 496776 0.000184% 1844.47

Nov'16 0 0 0 496776 0.000184% 1844.47

Dec'16 0 0 0 496776 0.000184% 1844.47

2957 0 0 496776 0.000184% 1844.47Total

PLCC Product Family

FIT Chart

1835

1840

1845

1850

1855

1860

1865

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

- 25 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

3133 0 0 526344 0.000174% 1740.86

Oct'16 0 0 0 526344 0.000174% 1740.86

Nov'16 0 0 0 526344 0.000174% 1740.86

Dec'16 0 0 0 526344 0.000174% 1740.86

3133 0 0 526344 0.000174% 1740.86Total

TQFP Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

2000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

3060 0 0 514080 0.000178% 1782.39

Oct'16 0 0 0 514080 0.000178% 1782.39

Nov'16 0 0 0 514080 0.000178% 1782.39

Dec'16 0 0 0 514080 0.000178% 1782.39

3060 0 0 514080 0.000178% 1782.39Total

QFP Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

2000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2361 0 0 396648 0.000231% 2310.09

Oct'16 30 0 0 401688 0.000228% 2281.10

Nov'16 0 0 0 401688 0.000228% 2281.10

Dec'16 0 0 0 401688 0.000228% 2281.10

2391 0 0 401688 0.000228% 2281.10Total

LBGA Product Family

FIT Chart

2265

2270

2275

2280

2285

2290

2295

2300

2305

2310

2315

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 26 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

1061 0 0 178248 0.000514% 5140.54

Oct'16 0 0 0 178248 0.000514% 5140.54

Nov'16 0 0 0 178248 0.000514% 5140.54

Dec'16 0 0 0 178248 0.000514% 5140.54

1061 0 0 178248 0.000514% 5140.54Total

HSBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

635 0 0 106680 0.000859% 8589.15

Oct'16 0 0 0 106680 0.000859% 8589.15

Nov'16 0 0 0 106680 0.000859% 8589.15

Dec'16 0 0 0 106680 0.000859% 8589.15

635 0 0 106680 0.000859% 8589.15Total

TSSOP Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

9000

10000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

558 0 0 93744 0.000977% 9774.39

Oct'16 0 0 0 93744 0.000977% 9774.39

Nov'16 0 0 0 93744 0.000977% 9774.39

Dec'16 0 0 0 93744 0.000977% 9774.39

558 0 0 93744 0.000977% 9774.39Total

CSBGA Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

270 0 0 45360 0.002020% 20200.41

Oct'16 0 0 0 45360 0.002020% 20200.41

Nov'16 0 0 0 45360 0.002020% 20200.41

Dec'16 0 0 0 45360 0.002020% 20200.41

270 0 0 45360 0.002020% 20200.41Total

SOPW Product Family

FIT Chart

0

5000

10000

15000

20000

25000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 28 -

5.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C / 85%RH / 33.3 psia, 168hrs - ( Au ).

Package Type

DateSample

Size# of

FailuresCum # of Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

5670 0 0 952560 0.000096% 961.92

Oct'16 0 0 0 952560 0.000096% 961.92

Nov'16 0 0 0 952560 0.000096% 961.92

Dec'16 0 0 0 952560 0.000096% 961.92

5670 0 0 952560 0.000096% 961.92Total

LQFP Product Family

FIT Chart

0

200

400

600

800

1000

1200

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

5107 0 0 857976 0.000107% 1067.97

Oct'16 0 0 0 857976 0.000107% 1067.97

Nov'16 0 0 0 857976 0.000107% 1067.97

Dec'16 0 0 0 857976 0.000107% 1067.97

5107 0 0 857976 0.000107% 1067.97Total

PBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

1431 0 0 240408 0.000381% 3811.40

Oct'16 30 0 0 245448 0.000373% 3733.14

Nov'16 0 0 0 245448 0.000373% 3733.14

Dec'16 0 0 0 245448 0.000373% 3733.14

1461 0 0 245448 0.000373% 3733.14Total

LBGA Product Family

FIT Chart

3680

3700

3720

3740

3760

3780

3800

3820

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 29 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

835 0 0 140280 0.000653% 6531.87

Oct'16 0 0 0 140280 0.000653% 6531.87

Nov'16 0 0 0 140280 0.000653% 6531.87

Dec'16 0 0 0 140280 0.000653% 6531.87

835 0 0 140280 0.000653% 6531.87Total

HSBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

3368 0 0 565824 0.000162% 1619.39

Oct'16 30 0 0 570864 0.000161% 1605.09

Nov'16 0 0 0 570864 0.000161% 1605.09

Dec'16 0 0 0 570864 0.000161% 1605.09

3398 0 0 570864 0.000161% 1605.09Total

QFN Product Family

FIT Chart

1595

1600

1605

1610

1615

1620

1625

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

2107 0 0 353976 0.000259% 2588.57

Oct'16 0 0 0 353976 0.000259% 2588.57

Nov'16 0 0 0 353976 0.000259% 2588.57

Dec'16 0 0 0 353976 0.000259% 2588.57

2107 0 0 353976 0.000259% 2588.57Total

TQFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 30 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

2686 0 0 451248 0.000203% 2030.57

Oct'16 0 0 0 451248 0.000203% 2030.57

Nov'16 0 0 0 451248 0.000203% 2030.57

Dec'16 0 0 0 451248 0.000203% 2030.57

2686 0 0 451248 0.000203% 2030.57Total

QFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

180 0 0 30240 0.003030% 30300.62

Oct'16 0 0 0 30240 0.003030% 30300.62

Nov'16 0 0 0 30240 0.003030% 30300.62

Dec'16 0 0 0 30240 0.003030% 30300.62

180 0 0 30240 0.003030% 30300.62Total

TSSOP Product Family

FIT Chart

0

5000

10000

15000

20000

25000

30000

35000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

83 0 0 13944 0.006571% 65712.19

Oct'16 0 0 0 13944 0.006571% 65712.19

Nov'16 0 0 0 13944 0.006571% 65712.19

Dec'16 0 0 0 13944 0.006571% 65712.19

83 0 0 13944 0.006571% 65712.19Total

PQFP Product Family

FIT Chart

0

10000

20000

30000

40000

50000

60000

70000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

90 0 0 15120 0.006060% 60601.24

Oct'16 0 0 0 15120 0.006060% 60601.24

Nov'16 0 0 0 15120 0.006060% 60601.24

Dec'16 0 0 0 15120 0.006060% 60601.24

90 0 0 15120 0.006060% 60601.24Total

PQFN Product Family

FIT Chart

0

10000

20000

30000

40000

50000

60000

70000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2862 0 0 480816 0.000191% 1905.70

Oct'16 30 0 0 485856 0.000189% 1885.93

Nov'16 0 0 0 485856 0.000189% 1885.93

Dec'16 0 0 0 485856 0.000189% 1885.93

2892 0 0 485856 0.000189% 1885.93Total

PLCC Product Family

FIT Chart

1875

1880

1885

1890

1895

1900

1905

1910

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

349 0 0 58632 0.001563% 15627.83

Oct'16 0 0 0 58632 0.001563% 15627.83

Nov'16 0 0 0 58632 0.001563% 15627.83

Dec'16 0 0 0 58632 0.001563% 15627.83

349 0 0 58632 0.001563% 15627.83Total

CSBGA Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

16000

18000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 32 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

299 0 0 50232 0.001824% 18241.18

Oct'16 0 0 0 50232 0.001824% 18241.18

Nov'16 0 0 0 50232 0.001824% 18241.18

Dec'16 0 0 0 50232 0.001824% 18241.18

299 0 0 50232 0.001824% 18241.18Total

SOPW Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

16000

18000

20000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 33 -

5.5 TEST DATA FOR HIGH TEMPERATURE STORAGE (HTS) - 150°C – ( Au )

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

1925 0 0 1925000 0.000048% 476.00

Oct'16 0 0 0 1925000 0.000048% 476.00

Nov'16 0 0 0 1925000 0.000048% 476.00

Dec'16 0 0 0 1925000 0.000048% 476.00

1925 0 0 1925000 0.000048% 476.00Total

TQFP Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

450

500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

4498 0 0 4498000 0.000020% 203.71

Oct'16 0 0 0 4498000 0.000020% 203.71

Nov'16 0 0 0 4498000 0.000020% 203.71

Dec'16 0 0 0 4498000 0.000020% 203.71

4498 0 0 4498000 0.000020% 203.71Total

LQFP Product Family

FIT Chart

0

50

100

150

200

250

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

384 0 0 384000 0.000239% 2386.17

Oct'16 0 0 0 384000 0.000239% 2386.17

Nov'16 0 0 0 384000 0.000239% 2386.17

Dec'16 0 0 0 384000 0.000239% 2386.17

384 0 0 384000 0.000239% 2386.17Total

CSBGA Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 34 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2108 0 0 2108000 0.000043% 434.67

Oct'16 0 0 0 2108000 0.000043% 434.67

Nov'16 0 0 0 2108000 0.000043% 434.67

Dec'16 0 0 0 2108000 0.000043% 434.67

2108 0 0 2108000 0.000043% 434.67Total

QFP Product Family

FIT Chart

0

50

100

150

200

250

300

350

400

450

500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2212 0 0 2212000 0.000041% 414.24

Oct'16 30 0 0 2242000 0.000041% 408.69

Nov'16 0 0 0 2242000 0.000041% 408.69

Dec'16 0 0 0 2242000 0.000041% 408.69

2242 0 0 2242000 0.000041% 408.69Total

PLCC Product Family

FIT Chart

405

406

407

408

409

410

411

412

413

414

415

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

8898 0 0 8898000 0.000010% 102.98

Oct'16 30 0 0 8928000 0.000010% 102.63

Nov'16 0 0 0 8928000 0.000010% 102.63

Dec'16 0 0 0 8928000 0.000010% 102.63

8928 0 0 8928000 0.000010% 102.63Total

QFN Product Family

FIT Chart

102

103

103

103

103

103

103

103

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 35 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

1852 0 0 1852000 0.000049% 494.76

Oct'16 0 0 0 1852000 0.000049% 494.76

Nov'16 0 0 0 1852000 0.000049% 494.76

Dec'16 0 0 0 1852000 0.000049% 494.76

1852 0 0 1852000 0.000049% 494.76Total

PBGA Product Family

FIT Chart

0

100

200

300

400

500

600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

765 0 0 765000 0.000120% 1197.77

Oct'16 0 0 0 765000 0.000120% 1197.77

Nov'16 0 0 0 765000 0.000120% 1197.77

Dec'16 0 0 0 765000 0.000120% 1197.77

765 0 0 765000 0.000120% 1197.77Total

HSBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

2260 0 0 2260000 0.000041% 405.44

Oct'16 30 0 0 2290000 0.000040% 400.13

Nov'16 0 0 0 2290000 0.000040% 400.13

Dec'16 0 0 0 2290000 0.000040% 400.13

2290 0 0 2290000 0.000040% 400.13Total

LBGA Product Family

FIT Chart

397

398

399

400

401

402

403

404

405

406

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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ASEM RELIABILITY LAB

- 36 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

80 0 0 80000 0.001145% 11453.63

Oct'16 0 0 0 80000 0.001145% 11453.63

Nov'16 0 0 0 80000 0.001145% 11453.63

Dec'16 0 0 0 80000 0.001145% 11453.63

80 0 0 80000 0.001145% 11453.63Total

PQFP Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

560 0 0 560000 0.000164% 1636.23

Oct'16 0 0 0 560000 0.000164% 1636.23

Nov'16 0 0 0 560000 0.000164% 1636.23

Dec'16 0 0 0 560000 0.000164% 1636.23

560 0 0 560000 0.000164% 1636.23Total

TSSOP Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

299 0 0 299000 0.000306% 3064.52

Oct'16 0 0 0 299000 0.000306% 3064.52

Nov'16 0 0 0 299000 0.000306% 3064.52

Dec'16 0 0 0 299000 0.000306% 3064.52

299 0 0 299000 0.000306% 3064.52Total

SOPW Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

3500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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3RD QUARTER RELIABILITY REPORT FOR 2016

ASEM RELIABILITY LAB

- 37 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

90 0 0 90000 0.001018% 10181.01

Oct'16 0 0 0 90000 0.001018% 10181.01

Nov'16 0 0 0 90000 0.001018% 10181.01

Dec'16 0 0 0 90000 0.001018% 10181.01

90 0 0 90000 0.001018% 10181.01Total

PQFN Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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4th QUARTER RELIABILITY REPORT FOR 2016

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6.0 FITS CHARTS FOR CU WIRE PRODUCTS.

6.1 TEST DATA FOR MOISTURE SOAKING - ( Cu ) 6.1.1 MOISTURE SOAK LEVEL 3 (MSL-3) 30°C / 60%RH, 192 HOURS

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2934 0 0 563328 0.000163% 1626.57

Oct'16 120 0 0 586368 0.000156% 1562.65

Nov'16 0 0 0 586368 0.000156% 1562.65

Dec'16 0 0 0 586368 0.000156% 1562.65

3054 0 0 586368 0.000156% 1562.65Total

LQFP Product Family

FIT Chart

1520

1540

1560

1580

1600

1620

1640

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

2635 0 0 505920 0.000181% 1811.14

Oct'16 0 0 0 505920 0.000181% 1811.14

Nov'16 0 0 0 505920 0.000181% 1811.14

Dec'16 0 0 0 505920 0.000181% 1811.14

2635 0 0 505920 0.000181% 1811.14

PLCC Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

2000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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4th QUARTER RELIABILITY REPORT FOR 2016

- 39 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3231 4 4 620352 0.000844% 8441.37

Oct'16 120 0 4 643392 0.000814% 8139.08

Nov'16 0 0 4 643392 0.000814% 8139.08

Dec'16 0 0 4 643392 0.000814% 8139.08

3351 4 4 643392 0.000814% 8139.08

TQFP Product Family

Total

FIT Chart

7950

8000

8050

8100

8150

8200

8250

8300

8350

8400

8450

8500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3457 0 0 663744 0.000138% 1380.49

Oct'16 120 0 0 686784 0.000133% 1334.18

Nov'16 0 0 0 686784 0.000133% 1334.18

Dec'16 0 0 0 686784 0.000133% 1334.18

3577 0 0 686784 0.000133% 1334.18

QFN Product Family

Total

FIT Chart

1310

1320

1330

1340

1350

1360

1370

1380

1390

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3000 0 0 576000 0.000159% 1590.78

Oct'16 0 0 0 576000 0.000159% 1590.78

Nov'16 0 0 0 576000 0.000159% 1590.78

Dec'16 0 0 0 576000 0.000159% 1590.78

3000 0 0 576000 0.000159% 1590.78

SBGA Product Family

Total

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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4th QUARTER RELIABILITY REPORT FOR 2016

- 40 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

4654 0 0 893568 0.000103% 1025.43

Oct'16 120 0 0 916608 0.000100% 999.65

Nov'16 0 0 0 916608 0.000100% 999.65

Dec'16 0 0 0 916608 0.000100% 999.65

4774 0 0 916608 0.000100% 999.65

LBGA Product Family

Total

FIT Chart

985

990

995

1000

1005

1010

1015

1020

1025

1030

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

920 0 0 176640 0.000519% 5187.33

Oct'16 0 0 0 176640 0.000519% 5187.33

Nov'16 0 0 0 176640 0.000519% 5187.33

Dec'16 0 0 0 176640 0.000519% 5187.33

920 0 0 176640 0.000519% 5187.33

QFP Product Family

Total

FIT Chart

0

1000

2000

3000

4000

5000

6000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

3590 0 0 689280 0.000133% 1329.34

Oct'16 120 0 0 712320 0.000129% 1286.35

Nov'16 0 0 0 712320 0.000129% 1286.35

Dec'16 0 0 0 712320 0.000129% 1286.35

3710 0 0 712320 0.000129% 1286.35

PBGA Product Family

Total

FIT Chart

1260

1270

1280

1290

1300

1310

1320

1330

1340

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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6.1.2 MOISTURE SOAK LEVEL 1 (MSL-1) 85°C / 85%RH , 168 HOURS (Cu)

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

240 0 0 40320 0.002273% 22725.46

Oct'16 0 0 0 40320 0.002273% 22725.46

Nov'16 0 0 0 40320 0.002273% 22725.46

Dec'16 0 0 0 40320 0.002273% 22725.46

240 0 0 40320 0.002273% 22725.46Total

QFN Product Family

FIT Chart

0

5000

10000

15000

20000

25000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

6.2 TEST DATA FOR TEMPERATURE CYCLE - (Cu ) 6.2.1 CONDITION C (-65°C / 150°C)

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

453 0 0 453000 0.000202% 2022.72

Oct'16 40 0 0 493000 0.000186% 1858.60

Nov'16 0 0 0 493000 0.000186% 1858.60

Dec'16 0 0 0 493000 0.000186% 1858.60

493 0 0 493000 0.000186% 1858.60Total

LQFP Product Family

FIT Chart

1750

1800

1850

1900

1950

2000

2050

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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- 42 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

660 0 0 660000 0.000139% 1388.32

Oct'16 0 0 0 660000 0.000139% 1388.32

Nov'16 0 0 0 660000 0.000139% 1388.32

Dec'16 0 0 0 660000 0.000139% 1388.32

660 0 0 660000 0.000139% 1388.32Total

PLCC Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

748 0 0 748000 0.000122% 1224.99

Oct'16 30 0 0 778000 0.000118% 1177.75

Nov'16 0 0 0 778000 0.000118% 1177.75

Dec'16 0 0 0 778000 0.000118% 1177.75

778 0 0 778000 0.000118% 1177.75Total

TQFP Product Family

FIT Chart

1150

1160

1170

1180

1190

1200

1210

1220

1230

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

954 0 0 954000 0.000096% 960.47

Oct'16 30 0 0 984000 0.000093% 931.19

Nov'16 0 0 0 984000 0.000093% 931.19

Dec'16 0 0 0 984000 0.000093% 931.19

984 0 0 984000 0.000093% 931.19Total

QFN Product Family

FIT Chart

915

920

925

930

935

940

945

950

955

960

965

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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4th QUARTER RELIABILITY REPORT FOR 2016

- 43 -

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

667 0 0 667000 0.000137% 1373.75

Oct'16 0 0 0 667000 0.000137% 1373.75

Nov'16 0 0 0 667000 0.000137% 1373.75

Dec'16 0 0 0 667000 0.000137% 1373.75

667 0 0 667000 0.000137% 1373.75Total

LBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

180 0 0 180000 0.000509% 5090.50

Oct'16 0 0 0 180000 0.000509% 5090.50

Nov'16 0 0 0 180000 0.000509% 5090.50

Dec'16 0 0 0 180000 0.000509% 5090.50

180 0 0 180000 0.000509% 5090.50Total

QFP Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

526 0 0 526000 0.000174% 1742.00

Oct'16 0 0 0 526000 0.000174% 1742.00

Nov'16 0 0 0 526000 0.000174% 1742.00

Dec'16 0 0 0 526000 0.000174% 1742.00

526 0 0 526000 0.000174% 1742.00Total

PBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

1800

2000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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6.2.2 CONDITION B ( -55°C / 125°C ) Package

TypeDate

Sample Size

# of Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

750 0 0 750000 0.000122% 1221.72

Oct'16 0 0 0 750000 0.000122% 1221.72

Nov'16 0 0 0 750000 0.000122% 1221.72

Dec'16 0 0 0 750000 0.000122% 1221.72

750 0 0 750000 0.000122% 1221.72Total

SBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package

TypeDate

Sample Size

# of Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

360 0 0 360000 0.000255% 2545.25

Oct'16 0 0 0 360000 0.000255% 2545.25

Nov'16 0 0 0 360000 0.000255% 2545.25

Dec'16 0 0 0 360000 0.000255% 2545.25

360 0 0 360000 0.000255% 2545.25Total

LQFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package

TypeDate

Sample Size

# of Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

550 0 0 550000 0.000167% 1665.98

Oct'16 40 0 0 590000 0.000155% 1553.04

Nov'16 0 0 0 590000 0.000155% 1553.04

Dec'16 0 0 0 590000 0.000155% 1553.04

590 0 0 590000 0.000155% 1553.04Total

PBGA Product Family

FIT Chart

1480

1500

1520

1540

1560

1580

1600

1620

1640

1660

1680

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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4th QUARTER RELIABILITY REPORT FOR 2016

- 45 -

Package

TypeDate

Sample Size

# of Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

750 0 0 750000 0.000122% 1221.72

Oct'16 40 0 0 790000 0.000116% 1159.86

Nov'16 0 0 0 790000 0.000116% 1159.86

Dec'16 0 0 0 790000 0.000116% 1159.86

790 0 0 790000 0.000116% 1159.86Total

LBGA Product Family

FIT Chart

1120

1130

1140

1150

1160

1170

1180

1190

1200

1210

1220

1230

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Cycles

Cum Failure

Rate (%)

Cum FIT (10^9 Device Cycles)

Cum Q3'16

200 0 0 200000 0.000458% 4581.45

Oct'16 0 0 0 200000 0.000458% 4581.45

Nov'16 0 0 0 200000 0.000458% 4581.45

Dec'16 0 0 0 200000 0.000458% 4581.45

200 0 0 200000 0.000458% 4581.45Total

TQFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

3500

4000

4500

5000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

6.3 TEST DATA FOR PRESSURE COOKER TEST (PCT) - 121°C / 100% / 15PSIG, 168HRS – ( Cu )

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

443 0 0 74424 0.001231% 12311.76

Oct'16 0 0 0 74424 0.001231% 12311.76

Nov'16 0 0 0 74424 0.001231% 12311.76

Dec'16 0 0 0 74424 0.001231% 12311.76

443 0 0 74424 0.001231% 12311.76Total

LQFP Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

924 0 0 155232 0.000590% 5902.72

Oct'16 30 0 0 160272 0.000572% 5717.10

Nov'16 0 0 0 160272 0.000572% 5717.10

Dec'16 0 0 0 160272 0.000572% 5717.10

954 0 0 160272 0.000572% 5717.10Total

QFN Product Family

FIT Chart

5600

5650

5700

5750

5800

5850

5900

5950

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

659 0 0 110712 0.000828% 8276.35

Oct'16 0 0 0 110712 0.000828% 8276.35

Nov'16 0 0 0 110712 0.000828% 8276.35

Dec'16 0 0 0 110712 0.000828% 8276.35

659 0 0 110712 0.000828% 8276.35Total

PLCC Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

9000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

666 1 1 111888 0.001807% 18074.44

Oct'16 30 0 1 116928 0.001730% 17295.37

Nov'16 0 0 1 116928 0.001730% 17295.37

Dec'16 0 0 1 116928 0.001730% 17295.37

696 1 1 116928 0.001730% 17295.37Total

TQFP Product Family

FIT Chart

16800

17000

17200

17400

17600

17800

18000

18200

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

750 0 0 126000 0.000727% 7272.15

Oct'16 0 0 0 126000 0.000727% 7272.15

Nov'16 0 0 0 126000 0.000727% 7272.15

Dec'16 0 0 0 126000 0.000727% 7272.15

750 0 0 126000 0.000727% 7272.15Total

SBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

420 0 0 70560 0.001299% 12985.98

Oct'16 0 0 0 70560 0.001299% 12985.98

Nov'16 0 0 0 70560 0.001299% 12985.98

Dec'16 0 0 0 70560 0.001299% 12985.98

420 0 0 70560 0.001299% 12985.98Total

LBGAProduct Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

210 0 0 35280 0.002597% 25971.96

Oct'16 0 0 0 35280 0.002597% 25971.96

Nov'16 0 0 0 35280 0.002597% 25971.96

Dec'16 0 0 0 35280 0.002597% 25971.96

210 0 0 35280 0.002597% 25971.96Total

QFP Product Family

FIT Chart

0

5000

10000

15000

20000

25000

30000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

240 0 0 40320 0.002273% 22725.46

Oct'16 0 0 0 40320 0.002273% 22725.46

Nov'16 0 0 0 40320 0.002273% 22725.46

Dec'16 0 0 0 40320 0.002273% 22725.46

240 0 0 40320 0.002273% 22725.46Total

PBGA Product Family

FIT Chart

0

5000

10000

15000

20000

25000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

6.4 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 130°C / 85%RH /33.3 psia, 168hrs – ( Cu ).

Package Type

DateSample

Size# of

FailuresCum # of Failures

Cum Device Hours

Cum Failure Rate (%)

Cum FIT (10̂ 9 Device hrs)

Cum Q3'16

734 0 0 123312 0.000743% 7430.67

Oct'16 40 0 0 130032 0.000705% 7046.66

Nov'16 0 0 0 130032 0.000705% 7046.66

Dec'16 0 0 0 130032 0.000705% 7046.66

774 0 0 130032 0.000705% 7046.66Total

LQFP Product Family

FIT Chart

6800

6900

7000

7100

7200

7300

7400

7500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

750 0 0 126000 0.000727% 7272.15

Oct'16 0 0 0 126000 0.000727% 7272.15

Nov'16 0 0 0 126000 0.000727% 7272.15

Dec'16 0 0 0 126000 0.000727% 7272.15

750 0 0 126000 0.000727% 7272.15Total

SBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

964 0 0 161952 0.000566% 5657.79

Oct'16 30 0 0 166992 0.000549% 5487.03

Nov'16 0 0 0 166992 0.000549% 5487.03

Dec'16 0 0 0 166992 0.000549% 5487.03

994 0 0 166992 0.000549% 5487.03Total

QFN Product Family

FIT Chart

5400

5450

5500

5550

5600

5650

5700

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

946 0 0 158928 0.000577% 5765.45

Oct'16 30 0 0 163968 0.000559% 5588.23

Nov'16 0 0 0 163968 0.000559% 5588.23

Dec'16 0 0 0 163968 0.000559% 5588.23

976 0 0 163968 0.000559% 5588.23Total

TQFP Product Family

FIT Chart

5450

5500

5550

5600

5650

5700

5750

5800

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

659 0 0 110712 0.000828% 8276.35

Oct'16 0 0 0 110712 0.000828% 8276.35

Nov'16 0 0 0 110712 0.000828% 8276.35

Dec'16 0 0 0 110712 0.000828% 8276.35

659 0 0 110712 0.000828% 8276.35Total

PLCC Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

9000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

838 0 0 140784 0.000651% 6508.49

Oct'16 0 0 0 140784 0.000651% 6508.49

Nov'16 0 0 0 140784 0.000651% 6508.49

Dec'16 0 0 0 140784 0.000651% 6508.49

838 0 0 140784 0.000651% 6508.49Total

LBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

320 0 0 53760 0.001704% 17044.10

Oct'16 0 0 0 53760 0.001704% 17044.10

Nov'16 0 0 0 53760 0.001704% 17044.10

Dec'16 0 0 0 53760 0.001704% 17044.10

320 0 0 53760 0.001704% 17044.10Total

QFP Product Family

FIT Chart

0

2000

4000

6000

8000

10000

12000

14000

16000

18000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

610 0 0 102480 0.000894% 8941.17

Oct'16 0 0 0 102480 0.000894% 8941.17

Nov'16 0 0 0 102480 0.000894% 8941.17

Dec'16 0 0 0 102480 0.000894% 8941.17

610 0 0 102480 0.000894% 8941.17Total

PBGA Product Family

FIT Chart

0

1000

2000

3000

4000

5000

6000

7000

8000

9000

10000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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6.5 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (UHAST) 110°C / 85%RH /17.7 psia, 264hrs – ( Cu ).

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

640 0 0 168960 0.000542% 5423.12

Oct'16 40 0 0 179520 0.000510% 5104.12

Nov'16 0 0 0 179520 0.000510% 5104.12

Dec'16 0 0 0 179520 0.000510% 5104.12

680 0 0 179520 0.000510% 5104.12Total

LBGA Product Family

FIT Chart

4900

5000

5100

5200

5300

5400

5500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

507 0 0 133848 0.000685% 6845.76

Oct'16 40 0 0 144408 0.000635% 6345.15

Nov'16 0 0 0 144408 0.000635% 6345.15

Dec'16 0 0 0 144408 0.000635% 6345.15

547 0 0 144408 0.000635% 6345.15Total

PBGA Product Family

FIT Chart

6000

6100

6200

6300

6400

6500

6600

6700

6800

6900

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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6.6 TEST DATA FOR HIGHLY ACCELERATED STRESS TEST (BHAST) - 110°C / 85%RH/17.7 psia, 264hrs - (Cu ).

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

30 0 0 7920 0.011569% 115693.28

Oct'16 0 0 0 7920 0.011569% 115693.28

Nov'16 0 0 0 7920 0.011569% 115693.28

Dec'16 0 0 0 7920 0.011569% 115693.28

30 0 0 7920 0.011569% 115693.28Total

PBGA Product Family

FIT Chart

0

20000

40000

60000

80000

100000

120000

140000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

6.7 TEST DATA FOR HIGH TEMPERATURE STORAGE (HTS) - 150°C (Cu ).

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device hrs)

Cum Q3'16

907 1 1 152376 0.001327% 13271.86

Oct'16 30 0 1 182376 0.001109% 11088.70

Nov'16 0 0 1 182376 0.001109% 11088.70

Dec'16 0 0 1 182376 0.001109% 11088.70

937 1 1 182376 0.001109% 11088.70Total

TQFP Product Family

FIT Chart

9500

10000

10500

11000

11500

12000

12500

13000

13500

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

774 0 0 774000 0.000118% 1183.84

Oct'16 40 0 0 814000 0.000113% 1125.66

Nov'16 0 0 0 814000 0.000113% 1125.66

Dec'16 0 0 0 814000 0.000113% 1125.66

814 0 0 814000 0.000113% 1125.66Total

LQFP Product Family

FIT Chart

1090

1100

1110

1120

1130

1140

1150

1160

1170

1180

1190

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

658 0 0 658000 0.000139% 1392.54

Oct'16 0 0 0 658000 0.000139% 1392.54

Nov'16 0 0 0 658000 0.000139% 1392.54

Dec'16 0 0 0 658000 0.000139% 1392.54

658 0 0 658000 0.000139% 1392.54Total

PLCC Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

965 0 0 965000 0.000095% 949.52

Oct'16 30 0 0 995000 0.000092% 920.90

Nov'16 0 0 0 995000 0.000092% 920.90

Dec'16 0 0 0 995000 0.000092% 920.90

995 0 0 995000 0.000092% 920.90Total

QFN Product Family

FIT Chart

905

910

915

920

925

930

935

940

945

950

955

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

620 0 0 620000 0.000148% 1477.89

Oct'16 0 0 0 620000 0.000148% 1477.89

Nov'16 0 0 0 620000 0.000148% 1477.89

Dec'16 0 0 0 620000 0.000148% 1477.89

620 0 0 620000 0.000148% 1477.89Total

SBGA Product Family

FIT Chart

0

200

400

600

800

1000

1200

1400

1600

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

1417 0 0 1417000 0.000065% 646.64

Oct'16 40 0 0 1457000 0.000063% 628.89

Nov'16 0 0 0 1457000 0.000063% 628.89

Dec'16 0 0 0 1457000 0.000063% 628.89

1457 0 0 1457000 0.000063% 628.89Total

LBGA Product Family

FIT Chart

620

625

630

635

640

645

650

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

210 0 0 210000 0.000436% 4363.29

Oct'16 0 0 0 210000 0.000436% 4363.29

Nov'16 0 0 0 210000 0.000436% 4363.29

Dec'16 0 0 0 210000 0.000436% 4363.29

210 0 0 210000 0.000436% 4363.29Total

QFP Product Family

FIT Chart

0

500

1000

1500

2000

2500

3000

3500

4000

4500

5000

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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Package Type

DateSample

Size# of

Failures

Cum # of

Failures

Cum Device Hours

Cum Failure

Rate (%)

Cum FIT (10^9 Device Hours)

Cum Q3'16

1117 0 0 1117000 0.000082% 820.31

Oct'16 40 0 0 1157000 0.000079% 791.95

Nov'16 0 0 0 1157000 0.000079% 791.95

Dec'16 0 0 0 1157000 0.000079% 791.95

1157 0 0 1157000 0.000079% 791.95Total

PBGA Product Family

FIT Chart

775

780

785

790

795

800

805

810

815

820

825

Cum Q3'16 Oct'16 Nov'16 Dec'16Month

FIT

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-57- ASEM RELIABILITY LAB

7.0 SCANNING ACOUSTIC MICROSCOPE (SAM) ANALYSIS DATA Delamination Criteria (Ref:Joint IPC/JEDEC Standard J-STD-020) The delamination changes are measured from premoisture soak to post reflow. A measurable delamination change is defined as a 10% absolute change between pre- and post- reflow. The absolute percentage (%) of delamination change is calculated in relation to the total area being evaluated.

Package Type

Lead Count

Q1'16 Q2'16 Q3'16 Q4'16

LQFP

32 0/0 0/0 0/0 0/0

44 0/0 0/0 0/0 0/0

48 0/0 0/0 0/120 0/0

64 0/0 0/0 0/0 0/0

80 0/0 0/120 0/0 0/0

100 0/120 0/120 0/0 0/120

120 0/0 0/0 0/0 0/0

128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

176 0/0 0/0 0/0 0/0

LBGA

36 0/0 0/0 0/0 0/0

49 0/0 0/0 0/0 0/0

56 0/0 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

132 0/0 0/0 0/0 0/120

144 0/0 0/0 0/0 0/0

160 0/0 0/0 0/0 0/0

176 0/0 0/0 0/0 0/0

184 0/0 0/0 0/0 0/0

196 0/0 0/0 0/0 0/0

256 0/120 0/0 0/120 0/120

277 0/0 0/0 0/0 0/0

324 0/0 0/0 0/0 0/0

400 0/0 0/0 0/0 0/0

484 0/0 0/0 0/0 0/0

564 0/0 0/0 0/0 0/0

SOPW

16 0/0 0/0 0/0 0/0

20 0/0 0/0 0/0 0/0

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28 0/0 0/0 0/0 0/0

EBGA 652 0/0 0/0 0/0 0/0

SBGA

233 0/0 0/0 0/0 0/0

256 0/0 0/0 0/0 0/0

564 0/120 0/120 0/0 0/0

729 0/120 0/120 0/0 0/0

PBGA

208 0/0 0/0 0/0 0/0

256 0/120 0/0 0/0 0/0

272 0/0 0/0 0/0 0/0

324 0/0 0/0 0/0 0/0

388 0/0 0/0 0/0 0/0

484 0/0 0/0 0/120 0/120

672 0/0 0/0 0/0 0/0

900 0/0 0/0 0/0 0/0

1156 0/120 0/0 0/0 0/0

PLCC

20 0/0 0/0 0/0 0/0

28 0/0 0/0 0/0 0/120

32 0/0 0/0 0/0 0/0

44 0/0 0/120 0/0 0/0

52 0/0 0/0 0/0 0/0

68 0/120 0/0 0/0 0/0

84 0/0 0/0 0/120 0/0

PQFP

100 0/0 0/0 0/0 0/0

132 0/0 0/0 0/0 0/0

PQFN 26 0/0 0/0 0/0 0/0

30 0/0 0/120 0/0 0/0

QFP

100 0/0 0/0 0/0 0/0

128 0/0 0/0 0/0 0/0

160 0/0 0/0 0/0 0/0

208 0/120 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

TQFP

44 0/0 0/0 0/0 0/0

48 0/120 0/240 0/240 0/0

64 0/0 0/0 0/0 0/120

80 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

176 0/0 0/0 0/0 0/0

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-59- ASEM RELIABILITY LAB

MCQFP

144 0/0 0/0 0/0 0/0

208 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

TSSOP 48 0/0 0/0 0/0 0/0

CSBGA

256 0/0 0/0 0/0 0/0

304 0/0 0/0 0/0 0/0

672 0/0 0/0 0/0 0/0

836 0/0 0/0 0/0 0/0

1140 0/0 0/0 0/0 0/0

HSBGA

312 0/0 0/0 0/0 0/0

380 0/0 0/0 0/0 0/0

564 0/0 0/0 0/0 0/0

680 0/0 0/0 0/0 0/0

729 0/0 0/0 0/0 0/0

LGA

6 0/0 0/0 0/0 0/0

8 0/0 0/0 0/0 0/0

10 0/0 0/0 0/0 0/0

QFN

16 0/0 0/0 0/0 0/0

24 0/0 0/0 0/0 0/0

28 0/0 0/0 0/0 0/0

32 0/120 0/0 0/0 0/120

44 0/0 0/0 0/0 0/0

48 0/0 0/120 0/120 0/120

56 0/0 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

84 0/120 0/0 0/0 0/0

132 0/120 0/0 0/120 0/0

164 0/0 0/0 0/0 0/0

TOTAL 0/1800 0/1080 0/960 0/960

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ASEM RELIABILITY LAB

- 60 -

8.0 SOLDERABILITY TEST DATA

Package type

Lead count

REJ / SS

CUM Q1’16

CUM Q2'16

CUM Q3'16

CUM Q4'16

LQFP 20 0/0 0/0 0/0 0/0

28 0/0 0/0 0/0 0/0

32 0/20 0/5 0/0 0/10

44 0/60 0/130 0/20 0/30

48 0/70 0/60 0/40 0/50

64 0/20 0/40 0/30 0/50

68 0/0 0/50 0/0 0/0

80 0/60 0/0 0/40 0/60

84 0/0 0/0 0/0 0/0

100 0/400 0/300 0/50 0/280

128 0/60 0/80 0/20 0/60

132 0/0 0/0 0/0 0/0

144 0/320 0/350 0/120 0/550

160 0/0 0/0 0/0 0/0

176 0/60 0/100 0/0 0/60

208 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

PDIP 8 0/0 0/0 0/0 0/0

16 0/0 0/0 0/0 0/0

PLCC 20 0/0 0/10 0/0 0/0

28 0/20 0/50 0/10 0/50

32 0/0 0/10 0/0 0/80

40 0/0 0/0 0/0 0/0

42 0/0 0/0 0/0 0/0

44 0/390 0/510 0/200 0/420

50 0/0 0/0 0/0 0/0

52 0/0 0/0 0/0 0/0

68 0/40 0/5 0/0 0/70

84 0/110 0/140 0/0 0/20

100 0/0 0/0 0/0 0/0

132 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

208 0/0 0/0 0/0 0/0

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ASEM RELIABILITY LAB

- 61 -

PQFN 8 0/220 0/20 0/280 0/790

25 0/5 0/0 0/0 0/175

26 0/0 0/0 0/0 0/0

28 0/90 0/0 0/0 0/0

30 0/675 0/0 0/85 0/1185

32 0/5 0/0 0/0 0/0

PQFP 30 0/0 0/0 0/0 0/0

32 0/0 0/0 0/0 0/0

44 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

132 0/0 0/0 0/0 0/0

QFP 20 0/0 0/0 0/0 0/0

24 0/0 0/0 0/0 0/0

30 0/0 0/0 0/0 0/0

44 0/0 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

84 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

120 0/0 0/0 0/0 0/0

128 0/15 0/30 0/0 0/60

132 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

160 0/10 0/10 0/10 0/30

208 0/245 0/160 0/20 0/290

240 0/0 0/0 0/0 0/0

256 0/0 0/0 0/0 0/0

304 0/0 0/0 0/0 0/0

MQFP 128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

132 0/0 0/0 0/0 0/0

196 0/0 0/0 0/0 0/0

208 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

SOIC 28 0/0 0/0 0/0 0/0

TQFP 32 0/0 0/0 0/0 0/0

44 0/100 0/100 0/40 0/80

48 0/80 0/60 0/50 0/130

64 0/110 0/110 0/10 0/20

100 0/150 0/230 0/190 0/310

128 0/0 0/0 0/0 0/0

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144 0/0 0/0 0/0 0/0

QFN 3 0/0 0/10 0/0 0/0

12 0/0 0/0 0/10 0/0

16 0/30 0/5 0/0 0/0

22 0/0 0/0 0/5 0/0

24 0/20 0/10 0/40 0/10

28 0/80 0/30 0/10 0/10

32 0/65 0/10 0/10 0/60

36 0/0 0/0 0/0 0/0

40 0/70 0/160 0/20 0/110

44 0/0 0/0 0/0 0/10

48 0/220 0/0 0/90 0/90

54 0/0 0/10 0/0 0/10

56 0/50 0/80 0/60 0/60

58 0/0 0/10 0/0 0/0

64 0/90 0/130 0/10 0/50

68 0/0 0/0 0/0 0/0

72 0/10 0/20 0/10 0/40

80 0/0 0/0 0/0 0/0

84 0/10 0/0 0/0 0/0

88 0/0 0/0 0/0 0/0

102 0/0 0/0 0/0 0/0

132 0/125 0/0 0/0 0/0

156 0/0 0/10 0/0 0/10

TSSOP 48 0/0 0/0 0/0 0/30

LBGA 256 0/0 0/0 0/0 0/0

MCLQFP 144 0/5 0/10 0/0 0/0

148 0/0 0/0 0/0 0/0

MCQFP 208 0/20 0/10 0/0 0/0

240 0/35 0/0 0/0 0/0

DFN 10 0/0 0/0 0/0 0/10

12 0/0 0/0 0/0 0/0

TOTAL 0/4165 0/3145 0/1470 0/5360

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9.0 MARK PERMANENCY TEST DATA

Package Type

Lead Count

REJ / SS

CUM Q1'16

CUM Q2'16

CUM Q3'16

CUM Q4'16

LBGA 100 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

256 0/0 0/0 0/0 0/0

324 0/0 0/0 0/0 0/0

LQFP 32 0/0 0/0 0/0 0/0

44 0/0 0/0 0/0 0/0

48 0/0 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

80 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

176 0/0 0/0 0/0 0/0

208 0/0 0/0 0/0 0/0

PBGA 208 0/0 0/0 0/0 0/0

256 0/0 0/0 0/0 0/0

272 0/0 0/0 0/0 0/0

304 0/0 0/0 0/0 0/0

388 0/0 0/0 0/0 0/0

324 0/0 0/0 0/0 0/0

365 0/0 0/0 0/0 0/0

484 0/0 0/0 0/0 0/0

PLCC 16 0/0 0/0 0/0 0/0

20 0/0 0/0 0/0 0/0

28 0/0 0/0 0/0 0/0

44 0/0 0/0 0/0 0/0

68 0/0 0/0 0/0 0/0

84 0/0 0/0 0/0 0/0

QFP 100 0/0 0/0 0/0 0/0

128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

160 0/0 0/0 0/0 0/0

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208 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

SOPW 16 0/0 0/0 0/0 0/0

20 0/0 0/0 0/0 0/0

28 0/0 0/0 0/0 0/0

TQFP 44 0/0 0/0 0/0 0/0

48 0/0 0/0 0/0 0/0

64 0/0 0/0 0/0 0/0

100 0/0 0/0 0/0 0/0

126 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

SOIC 16 0/0 0/0 0/0 0/0

PQFP 48 0/0 0/0 0/0 0/0

CSBGA 232 0/0 0/0 0/0 0/0

380 0/0 0/0 0/0 0/0

564 0/0 0/0 0/0 0/0

680 0/0 0/0 0/0 0/0

HSBGA 380 0/0 0/0 0/0 0/0

564 0/0 0/0 0/0 0/0

680 0/0 0/0 0/0 0/0

MCLQ 128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

MCLQF 128 0/0 0/0 0/0 0/0

144 0/0 0/0 0/0 0/0

MCQFP 208 0/0 0/0 0/0 0/0

240 0/0 0/0 0/0 0/0

TOTAL 0/0 0/0 0/0 0/0

Note: No Mark Permanency data for Q4 ’ 2016

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10.0 ATTACHMENT. 10.1 ACOUSTIC TOPOGRAPHY ANALYSIS

Figure 2: Top Scanning on LQFP 100L, shows no delamination noted on Die and Substrate region.

Figure 3: Top Scanning on QFN 48L shows no delamination noted on Die and Die Attached Pad (DAP) region.

Figure 1: Top Scanning on PBGA 484L shows no delamination noted on Die and Substrate region.