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8/8/2019 Principles of Semiconductor Devices -Lecture37
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www.nanohub.org
NCN
ECE606:SolidStateDevicesLecture37:NonidealEffectsinMOSFET
1AlamECE606S09
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TopicMap
AlamECE606S09 2
Equilibrium DC Small
signal
Large
Signal
Circuits
Diode
Schoky
BJT/HBT
MOS
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Outline
AlamECE606S09 3
1. Flatbandvoltage2. ThresholdvoltageshiNduetotrappedcharges3. Physicsofinterfacetraps4. Conclusion
REF.Chapter18,SDF
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(1)IdealizedMOSCapacitor
AlamECE606S09 4
Substrate(p)ycs
Fm
ci
EC
EVEF
psemiconductormetal insulator
Vacuumlevel
Recallthat
8/8/2019 Principles of Semiconductor Devices -Lecture37
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Poten\al,Field,Charges
AlamECE606S09 5
cs
Fm
ci
V
E
Vbi=0r
x
x
x
8/8/2019 Principles of Semiconductor Devices -Lecture37
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RealMOSCapacitor withM
8/8/2019 Principles of Semiconductor Devices -Lecture37
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PhysicalInterpreta\onofFlatbandVoltage
AlamECE606S09 7
flatband
EC
EV
EF
EC
EV
EF
8/8/2019 Principles of Semiconductor Devices -Lecture37
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HowtoCalculateBuiltinorFlatbandVoltage
AlamECE606S09 8
cs
Fm
Vacuumlevel
EV
EF
EC
qVbi
Therefore,
8/8/2019 Principles of Semiconductor Devices -Lecture37
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MeasureofFlatbandshiNfromCVCharacteris\cs
AlamECE606S09 9
C/Cox
VG
IdealVth
ActualVth
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Outline
AlamECE606S09 10
1. Flatbandvoltage2. VTshiHduetotrappedcharges3. Physicsofinterfacetraps4. Conclusion
8/8/2019 Principles of Semiconductor Devices -Lecture37
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(2)IdealizedMOSCapacitor
AlamECE606S09 11
cs
Fm
ci
EC
EV
EF
p semiconductormetal insulator
Vacuum level
Recall that
Substrate(p)y
Qox=0
8/8/2019 Principles of Semiconductor Devices -Lecture37
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DistributedTrappedchargeintheOxide
AlamECE606S09 12
EC
EV
EF
8/8/2019 Principles of Semiconductor Devices -Lecture37
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AnIntui\veView
AlamECE606S09 13
Idealchargefreeoxide
E
0
Bulkcharge
E
0
E
Interfacecharge
0
Reducedgatecharge
8/8/2019 Principles of Semiconductor Devices -Lecture37
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GateVoltageandOxideCharge
AlamECE606S09 14
E
0
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GateVoltageandOxideCharge
AlamECE606S0915
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Interpreta\onforBulkCharge
AlamECE606S0916
C/Cox
VG
IdealVT
ewVT
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Interpreta\onforInterfaceCharge
AlamECE606S0917
C/Cox
VG
IdealVT
ewVT
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TimedependentshiNofTrappedCharge
18
E
Sodium related bias temperature instability (BTI) issue
C/Cox
VG
IdealVT
8/8/2019 Principles of Semiconductor Devices -Lecture37
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BiasTemperatureInstability(Experiment)
AlamECE606S0919
+++++
+++++
M O S
()biases
0 xo
0.1xo
x
ion
M O S
+++++
+++++
(+)biases
x
0 xo
ion
0.9xo
8/8/2019 Principles of Semiconductor Devices -Lecture37
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Outline
AlamECE606S0920
1. Flatbandvoltage2. VTshiNduetotrappedcharges3. Physicsofinterfacetraps4. Conclusion
8/8/2019 Principles of Semiconductor Devices -Lecture37
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SiOandSiHBonds
AlamECE606S0921
Googleimage
8/8/2019 Principles of Semiconductor Devices -Lecture37
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InterfaceStates
22
HW: Unpassivated bonds ~10
14
cm
-2
8/8/2019 Principles of Semiconductor Devices -Lecture37
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AnnealingofInterfaceStates
AlamECE606S0923
HH H
Forminggasanneal
8/8/2019 Principles of Semiconductor Devices -Lecture37
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CVStretchOut
AlamECE606S0924
HH H
Forminggasanneal
8/8/2019 Principles of Semiconductor Devices -Lecture37
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atureofDonorandAcceptorTraps
AlamECE606S0925
Acceptorlevel
eutralwhenempty
ega\vewhenfull
Donorlevel
Posi\vewhenempty
eutralwhenfull
Combina\onwhen
botharepresent
8/8/2019 Principles of Semiconductor Devices -Lecture37
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DonorlikeInterfaceStates
AlamECE606S0926
C/Cox
VG
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8/8/2019 Principles of Semiconductor Devices -Lecture37
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AcceptorandDonorTrapsCombined
AlamECE606S0928
C/Cox
VG
28
Donor-related
stretchoutAcceptor-related
stretchout
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Conclusion
AlamECE606S0929
1) onidealthresholdcharacteris\csareimportantconsidera\onofMOSFETdesign.
2) Thenonideali\esarisefromdifferencesingateandsubstrateworkfunc\on,trappedcharges,interface
states.
3) AlthoughnonindealeffectsoNenarisefromtransistordegrada\on,therearemanycaseswheretheseeffects
canbeusedtoenhancedesirablecharacteris\cs.