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POWER ANALYSIS OF D FLIP-FLOP USING LEAKAGE REDUCTION TECHNIQUE Ayesha Firdous 1 , Dr.M.Anand 2 , A.Mohammed Ishak 3 , 1 Research Scholar, 2 Professor, ECE Department, Dr. M.G.R. Educational and Research Institute 3 Assistant Professor, ECE Department, Saveetha School of Engineering July 8, 2018 Abstract The fast advance in semiconductor innovation has driven the element sizes to be contracted using profound submicron forms; along these lines, the amazingly complex usefulness is empowered to be incorporated on a solitary chip. In the developing business sector of versatile hand-held gadgets utilized everywhere throughout the world today, the battery controlled electronic framework shapes the spine. With scaling down and the developing pattern towards remote correspondence, control scattering has turned into an extremely basic outline metric. The more extended the battery keeps going, the better is the gadget. Power reduction in CMOS circuit is achieved by combining two leakage reduction techniques Sleep mode approach with LECTOR technique and the simulation is carried out with and without power reduction technique using microwind DSCH software. This leakage power 1 International Journal of Pure and Applied Mathematics Volume 120 No. 6 2018, 2487-2508 ISSN: 1314-3395 (on-line version) url: http://www.acadpubl.eu/hub/ Special Issue http://www.acadpubl.eu/hub/ 2487

POWER ANALYSIS OF D FLIP-FLOP USING LEAKAGE ...M2 is o , pull-down path is disabled and static current will not ow in the circuit. When s=1, PMOS transistor M1 is o and NMOS transistor

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Page 1: POWER ANALYSIS OF D FLIP-FLOP USING LEAKAGE ...M2 is o , pull-down path is disabled and static current will not ow in the circuit. When s=1, PMOS transistor M1 is o and NMOS transistor

POWER ANALYSIS OF D FLIP-FLOPUSING LEAKAGE REDUCTION

TECHNIQUE

Ayesha Firdous1, Dr.M.Anand2,A.Mohammed Ishak3,

1Research Scholar, 2Professor,ECE Department,

Dr. M.G.R. Educational and Research Institute3Assistant Professor,ECE Department,

Saveetha School of Engineering

July 8, 2018

Abstract

The fast advance in semiconductor innovation hasdriven the element sizes to be contracted using profoundsubmicron forms; along these lines, the amazingly complexusefulness is empowered to be incorporated on a solitarychip. In the developing business sector of versatilehand-held gadgets utilized everywhere throughout theworld today, the battery controlled electronic frameworkshapes the spine. With scaling down and the developingpattern towards remote correspondence, control scatteringhas turned into an extremely basic outline metric. Themore extended the battery keeps going, the better is thegadget. Power reduction in CMOS circuit is achieved bycombining two leakage reduction techniques Sleep modeapproach with LECTOR technique and the simulation iscarried out with and without power reduction techniqueusing microwind DSCH software. This leakage power

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International Journal of Pure and Applied MathematicsVolume 120 No. 6 2018, 2487-2508ISSN: 1314-3395 (on-line version)url: http://www.acadpubl.eu/hub/Special Issue http://www.acadpubl.eu/hub/

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reduction technique is applied to design D flip-flop and theperformance and power consumption was measured. Theresults clearly provide the data that the power has beenreduced drastically.

Keywords: LECTOR, sleep transistor, D flip-flop,Leakage power

1 INTRODUCTION

In this modern world, due to advancement of battery-baseddevices with limited power capabilities needs major requirementof power efficiency and power-delay product. These two factorsare of great challenge to the electronic designers. Similarly, inVLSI circuit design power consumption of circuit is of majorconcern. The demand for low power device is not because ofdevelopment of mobile application alone. The problem of powerconsumption is major issue before the evolution of mobile era. Toresolve power dissipation issue numerous techniques and methodshas been proposed by researchers in terms of architectural, devicelevel and even some higher levels. Till today there is not standardapproach is evolved for factors to overcome problem of areaconsumption, delay and power utilization of the designed circuit.Based on the product and the application requirements the userneeds to select most appropriate technique. In case of highperformance portable devices power dissipation is the majorconcern. Three components in the circuit plays a vital role forpower consumption which are all leakage current, short circuitand dissipation of power from dynamic switching. In CMOScircuit total power dissipation becomes a dominant componentbecause of continuous scaling of threshold voltage. Through therecycling of stored energy in the nodes dynamic dissipation getsreduced in adiabatic computing. Even in adiabatic processdissipation of energy occurred for constant input values. However,energy dissipation occurs even for constant input signals of theadiabatic circuits where power clocks are used for charging anddischarging of output nodes. Due to continuous scaling in CMOStechnology in adiabatic process dissipation, leakage in the circuitdesign will perform as dominant component for overall dissipationof power same as traditional logic function of the CMOS devices.

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In adiabatic circuit power gating approach is adopted forminimizing leakage and dynamic power of the system. In thistechnique at idle state power gating system shut down the units.The adiabatic circuit is significantly differing from CMOS circuitdue to signal waveforms and clocking schemes in conventionalapproaches. In this scheme it is necessary that their need to beenough distinguish between switch with Power-gating and powerclock utilized for turning-off. In adiabatic schemes various powergating are applied. Among the numerous gating approachesvoltage scaling approach outperforms in case of adiabatic basedCMOS logic circuits. In the mid performance ranges from (5MHzto 100MHz) supply voltage scaling in medium-voltage regionperforms effectively. Based on this numerous adiabatic circuitwith near-threshold has been proposed without the use of gatingpower. Switching power dissipation is minimized to quadratic inthis scenario minimization of power consumption by the use ofsupply voltage technique. This technique has the serious issues ofperformance degradation. Subsequently, the high performancerequirements were fulfilled by scaled value of threshold voltage.But this technique has the serious drawback of increased leakagecurrent which put forth the major concern for high performancecircuit with low power utilization.

2 VARIOUS TECHNIQUES TO

REDUCE LEAKAGE POWER

In this section various leakage reduction techniques are summarized.Each practice provides a proficient way to decrease leakage power

2.1 Sleep Transistor Technique

This is a State-ruinous method which cuts off either pull-up orpull-down or both the systems from supply voltage or ground orboth utilizing rest transistors. This procedure includes high-Vthrest transistors between pull-up systems and Vdd and pull-downsystems and gnd while for quick exchanging speeds, low-Vthtransistors are utilized as a part of rationale circuits discussed inPowell et al. (2000). Secluding the rationale arranges, this

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method significantly diminishes spillage control amid rest mode.Be that as it may, the range and deferral are expanded because ofextra rest transistors. Amid the rest mode, the state will be lostas the pull-up and pull-down systems will have drifting esteems.These qualities affect the wake-up time and vitality fundamentallybecause of the prerequisite to energize transistors which lost stateamid rest.

2.2 Forced Stack

In this method, each transistor in the system is copied with boththe transistors bearing a large portion of the first transistor widthis said by Deepak Subramanyan and Nunez (2007). Copiedtransistors cause a slight invert predisposition between the gateand source when the two transistors are killed. Since asubthreshold current is exponentially subject to gate inclination,it acquires significant current decrease. It beats the constraintwith rest system by holding state however it requires morewake-up investment.

2.3 Dual Vt Technique

Dual Vt was the most punctual recommended system to diminishthe spillage control. Dual Vt method is a variety in MTCMOS, inwhich low threshold voltage and high threshold voltage gates areused in critical and non critical path respectively. Both thetechniques require extra cover layers for each estimation of Vt increation, which is a muddled assignment storing two distinctoxides thickness, consequently making the manufacture procedurecomplex. In addition, the systems additionally experience the illeffects of turning on idleness i.e., the sit out of gear circuit can’tbe utilized promptly after reactivated since some time is expectedto come back to ordinary working condition.

The inertness is commonly a couple of cycles for the previousstrategy, and for Dual innovation, is significantly higher. At thepoint when the circuit is dynamic, these systems are not viable incontrolling the spillage control.

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2.4 LECTOR Technique

This is one of the low power maintenance strategies. This methodproposed a CMOS circuit in which two additional LeakageControl Transistors are embedded, in which the gate terminal ofevery Leakage Control Transistor is controlled by the wellspring ofthe other. The circuit can be seen in the Fig. 1 given below

Figure 1: LECTOR circuit design

The fundamental thought behind this approach was for thedecrease of spillage control is the powerful stacking of transistorsin the way from the supply voltage to ground. It is watched that“a state with more than one transistor OFF in a way from asupply voltage to ground is far less flawed than a state with just asingle transistor OFF in any supply to the ground way”. In theirtechnique, they presented two spillage control transistors (LCTs)in each CMOS gate to such an extent that one of the LCTs isclose to its cutoff area of operation.

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3 COMBINED EFFECT OF SLEEP

MODE APPROACH AND

LECTOR TECHNIQUE FOR

REDUCING LEAKAGE POWER

The power consumption could be migrated at different levels suchas Layout level, Circuit Level, Architectural level and FabricationProcess Technology Level. The significant method to minimizethe level of power usage is to disable part of the circuit when thepart is not under operation. By reducing the switching activity ofa circuit, the power dissipation could be minimized. Variousmethods are used to optimize the power such as MTCMOS, Bodybiasing, Sleep, Zigzag, Leakage Feedback Approach, DualThreshold Transistor Stacking, etc., In addition consumption ofpower in the circuit is data dependent. In this section powerreduction is achieved by combining two leakage reductiontechniques and the simulation is carried out with and withoutpower reduction technique using microwind and DSCH software.

In sleep mode approach, PMOS transistor is placed betweensupply voltage to pull up network and NMOS transistor is placedin between pull down network and GND. Sleep transistor is turnedon when the circuit is in active mode. Sleep transistor is turnedoff when it is in standby mode. To prevent high leakage currentthreshold voltage of sleep transistor is kept high. Fig. 2 shows theblock diagram of sleep mode approach. The proposed work takes anadvantage of sleep mode approach. Number of transistor needed todesign a circuit in this approach is 2+2N. Where, N is the numberof transistor. Compare to CMOS technology, sleep mode approachuses two more transistors in addition to the normal circuit.

The noteworthy feature of LECTOR is that it works well inboth active and idle states of the circuit, this leads in betterleakage reduction. In this approach NMOS and PMOS transistorsare added in between pull up network and pull down network.Gate terminal of PMOS, NMOS transistors are controlled bysource of the other. LECTOR method is more effective in bothactive and standby mode. The block diagram of LECTORapproach is shown in Fig. 3.

In the proposed circuit (Fig. 4), when s=0, NMOS transistor

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Figure 2: Sleep Mode Approach

Figure 3: LECTOR Approach

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M2 is off, pull-down path is disabled and static current will not flowin the circuit. When s=1, PMOS transistor M1 is off and NMOStransistor M2 is turned on. Based on the input values and pulldown topology circuit output is conditionally discharged. LCT1and LCT2 are Leakage control transistors it is controlled by sourceof the other. This ensures that one of the Leakage control transistoralways operates in its near cut-off region. From supply voltage toground, if more than one transistor is OFF in a path the leakagecurrent of the circuit will be less compare to only one transistorOFF in the path from supply to ground.

Figure 4: Sleep mode with LECTOR circuit

4 D FLIP-FLOP DESIGN

4.1 D flip-flop without sleep transistors

D flip-flop is used as a delay element. In this section D flip-flop isdesigned using conventional method. The design is implemented inDSCH software. Using two inputs CMOS NAND gate the circuitis designed. Fig.5 shows the D flip-flop implementation in DSCH

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software. Fig. 6 shows the layout diagram of D flip-flop withoutsleep transistors.

Figure 5: D flip-flop without sleep transistors

Figure 6: Layout diagram of D flip-flop without sleep transistors

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4.2 D flip-flop with Sleep Transistors

Two input CMOS NAND gate is designed using sleep modeapproach and it is used to implement D flip-flop. Fig 4.13 showsimplementation of D flip-flop with Sleep Transistors. Fig 4.14shows the layout diagram of D flip-flop with Sleep Transistors.

Figure 7: D flip-flop with Sleep Transistors

Figure 8: Layout diagram of D flip-flop with Sleep Transistors

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4.3 D flip-flop with LECTOR Configuration

LECTOR configuration is used to design D flip-flop for this twoinput NAND gate is designed by LECTOR approach. Fig 4.15shows D flip-flop with LECTOR configuration the implementationin DSCH software. Fig 4.16 shows layout diagram of D flip-flopwith LECTOR configuration

Figure 9: D flip-flop with LECTOR configuration

4.4 Proposed D flip-flop

Two leakage current techniques sleep mode approach andLECTROR approach are combined to design D flip-flop. Fig. 11shows proposed D flip-flop implementation in DSCH software.Fig. 12 shows layout diagram of proposed D flip-flop

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Figure 10: Layout diagram of D flip-flop with LECTORconfiguration

Figure 11: Proposed D flip-flop

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Figure 12: Layout diagram of proposed D flip-flop

5 RESULTS

5.1 Power consumption analysis of D flip-flopfor various configurations

Figure 13: Power consumption analysis of D flip-flop with No SleepTransistors

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Figure 14: Power consumption analysis of D flip-flop with SleepTransistors

Figure 15: Power consumption analysis of D flip-flop with LECTORConfiguration

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Figure 16: Power consumption analysis of D flip-flop of proposedcircuit

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Figure 17: Power consumption of D flip-flop with differenttechnologies

From the experimental evaluation the power reductiontechnique for VLSI circuits is verified as efficient. D flip-flop isdesigned using the leakage reduction technique. The experimentalresults show the proposed circuit provides a better solution forleakage reduction.

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