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Improve Design Performance & Yield © Copyright by MunEDA GmbH - All rights reserved - www.muneda.com Parameterize behavioral models using WiCkeD Modeling Demonstrator: Charge Pump Phase Locked Loop (CP-PLL) Dr. Volker Glöckel

Parameterize behavioral models using WiCkeD · PDF fileBut, model generation using WiCkeD Modeling is identical!

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Improve Design Performance & Yield

© Copyright by MunEDA GmbH - All rights reserved - www.muneda.com

Parameterize behavioral models using

WiCkeD Modeling

Demonstrator:

Charge Pump Phase Locked Loop (CP-PLL)

Dr. Volker Glöckel

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© Copyright by MunEDA GmbH - All rights reserved - www.muneda.com

Overview

Introduction

– Motivation and Documented Use Cases

– Demonstrator: CP-PLL

– Starting Point

– Purpose of applying WiCkeD Modeling

– Used tools

Block level

– Block Level Work Flow

– Frequency Divider Behavioral Model

– Phase Frequency Detector Behavioral Model

– Charge Pump Behavioral Model

– Voltage Controlled Oscillator Behavioral Model

CP-PLL

– Simulation setup

– Work flow

– Results

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Motivation

Transistor level simulation

Takes hours for large blocks like PLL (e.g. to calculate settling time).

This is a problem for design and verification.

Behavioral model (e.g. VerilogA, VHDL-AMS)

Reduces simulation time (hours to minutes)

But, it has typically static parameters

– No temperature, no VDD, no process variation effects

– Sizing is not possible

To overcome this limitation

Parameterize behavioral models with

WiCkeD generated Response Surface Models (RSM)

WiCkeD generates higher order Response Surface Models (RSM) based on

transistor level simulations

Simulation time still fast, but with improved accuracy

Enable sizing and analysis on behavioral level

– WiCkeD can also be applied to behavioral simulations

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Documented Use Cases

Refer to http://www.muneda.com/MUGM-MTF-MTS

Modeling of Multi-stage Amplifiers with WiCkeD

– Wolfgang Schneider, Atmel

– MunEDA User Group Meeting 2009

WiCkeD based simulation and modeling approach:

A ring oscillator in 65nm non-volatile memory technolgy and

low emission I/O pad buffer in 90nm CMOS

– Elena Raciti, STMicroelectronics

– MunEDA User Group Meeting 2009

WiCkeD 6.0 Modeling: industrial application cases

Analysis and Optimization of replica path of SRAM (90nm) and

Optimization of dual port SRAM (180nm)

– Elena Raciti, STMicroelectronics

– MunEDA User Group Meeting 2008

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Supported Circuit Performance and Modeling Parameters

WiCkeD Modeling supports all

WiCkeD Performances and parameters types

This means:

Circuit performance

– Scalar HSPICE/Eldo measurements and Spectre+Ocean outputs

– Analyses: DC, AC, TRAN, PSS, PAC, PNOISE, …

Modeling parameters

– WiCkeD operating parameters

• Modeling operating conditions of the test-bench, e.g. supply voltage

– WiCkeD design parameters

• Device properties, e.g. width and length, allowing sizing of the behavioral model

– WiCkeD global process parameters

• Process variation affecting all instances on the die in the same way

– WiCkeD local process parameters

• Instance specific process variation causing mismatch effects

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Supported Circuit Performance and Modeling Parameters

The motivation of adding operating, design and/or process parameters to

a behavioral model is different!

– E.g. for sizing

– or statistical analysis

But, model generation using WiCkeD Modeling is identical!

The following demonstration uses WiCkeD operating parameters

Little differences while adding the WiCkeD generated models to the

behavioral model

– Process parameters (global and local):

• Definition of parameter variation (e.g. Spectre vary or HSPICE/Eldo gauss

statements) needs to be copied from transistor to behavioral level

– Device specific local process variation (mismatch)

• Transistor level devices do no longer exist in behavioral model

Transistor level local process parameter definitions need to become global

process definitions on behavioral level

– Spectre: a mismatch vary statement becomes a process vary statement

– Eldo: a dev/gauss statement becomes a lot/gauss statement

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Demonstrator: Charge Pump Phase Locked Loop (CP-PLL)

* LF: ideal C and R elements so far - no modeling necessary

Phase

Frequency

Detector

Charge

Pump

Loop

Filter

Voltage

Controlled

Oscillator

Frequency

Divider

:2

250MHz up (active low)

down

500MHz

ctrl

Descriptions PFD CP LF VCO FD

Transistor level

VerilogA + WiCkeD RSM *

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Starting point

Transistor level description and simulation setup available for:

– All 5 blocks of CP-PLL: PFD, CP, LF, VCO, FD

– Complete CP-PLL

Behavioral models (VerilogA without WiCkeD RSM) available for:

– 4/5 blocks of CP-PLL: PFD, CP, VCO, FD (excluding LF)

– Simulation setups apply both to transistor and behavioral level

Simulation time of whole CP-PLL:

Drawback: behavioral simulation does not consider operating conditions:

– Temperature

– Supply voltage

Transistor level VerilogA

Power on settling time 5h 25min 2 min

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Purpose

Show a possible flow to generate a more accurate behavioral level circuit

description

Apply WiCkeD RSM Model Generation

– CP-PLL: add supply voltage VDD and temperature (Temp) dependency to

existing VerilogA models

• Supply voltage (VDD) range: nominal 3V ± 10%

• Temperature (Temp) range: 10°C to 70°C, nominal 27°C

Apply WiCkeD to behavioral CP-PLL netlist (VerilogA + WiCkeD RSM)

– Shows that WiCkeD can be used to analyze and/or optimize at

behavioral level

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Used Tools

Cadence

– DFII IC5.1.41USR5 (Virtuoso + Analog Design Environment ADE)

– MMSIM 6.11.487 (Spectre + VerilogA)

MunEDA

– WiCkeD 6.3 (Modeling, Worst-Case Analysis, Parameter Sweeps)

VerilogA models templates

– http://www.designers-guide.org/VerilogAMS/

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Overview

Introduction

– Motivation and Documented Use Cases

– Demonstrator: CP-PLL

– Starting Point

– Purpose

– Used tools

Block level

– Block Level Work Flow

– Frequency Divider Behavioral Model

– Phase Frequency Detector Behavioral Model

– Charge Pump Behavioral Model

– Voltage Controlled Oscillator Behavioral Model

CP-PLL

– Simulation setup

– Work flow

– Results

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Block Level Work Flow

For each block of CP-PLL: FD, PFD, CP and VCO:

1. Generate test-bench and simulation setup for outputs to be modeled

with WiCkeD

– Delays, Resistance, Frequency

2. Introduce parameters to be used as model parameters

– VDD, Temp, VCtrl

3. Apply WiCkeD to the transistor level netlist

4. Generate Response Surface Models (RSM)

– Based on transistor level simulations

5. Verify accuracy of RSM models

– E.g. compare Worst-Case Operation Analysis and Parameter Sweeps of

transistor level and model simulations in WiCkeD

6. Export the WiCkeD RSM models

7. Add the WiCkeD RSM models to existing VerilogA models

8. Verify block simulations of VerilogA + WiCkeD RSM models

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Frequency Divider Behavioral Model

VerilogA

– Model of a rising edge triggered T flip-flop

– For each rising edge of the input signal a transition of the output signal

is generated

– Constant delay from rising edges of input to rising/falling edges of

output

WiCkeD RSM add-on

– Both delays depend on supply voltage and temperature:

delays(VDD, Temp)

in

out

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Phase Frequency Detector Behavioral Model

VerilogA

– Generates none-overlapping

rectangular up or down signals

between rising edges of

reference clock and feedback clock

– Constant delays

from rising edges of input to

rising/falling edges of output

WiCkeD RSM add-on

– All 4 delays depend on

supply voltage and temperature:

delays(VDD, Temp)

reference

feedback

clock

up

(active low)

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Charge Pump Behavioral Model

VerilogA

– Calculating charge/discharge current

– Resistance is constant

– e.g. charge current:

ICTRL = (VDD - VCTRL) / RCHARGE

WiCkeD RSM add-on

– 2 separate models for

charge and discharge resistance:

RCHARGE(VDD, Temp, VCTRL)

RDISCHARGE(VDD, Temp, VCTRL)

– As VCTRL changes over time,

the model is evaluated at

each simulation step

up

(active low)

down

(active high

RCHARGE

RDISCHARGE

CTRL

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Voltage Controlled Oscillator Behavioral Model

VerilogA

– Linear gain model

– Linearization point at

center frequency

– freqVCO = freqCF +

KVCO (VCNTL – VCF)

WiCkeD RSM add-on

– Gain: KVCO(VDD, Temp)

– Center Frequency: freqCF(VDD, Temp)

KVCO

(freqCF, VCF)

freq

VCTRL

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Overview

Introduction

– Motivation and Documented Use Cases

– Demonstrator: CP-PLL

– Starting Point

– Purpose

– Used tools

Block level

– Block Level Work Flow

– Frequency Divider Behavioral Model

– Phase Frequency Detector Behavioral Model

– Charge Pump Behavioral Model

– Voltage Controlled Oscillator Behavioral Model

CP-PLL

– Simulation setup

– Work flow

– Results

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CP-PLL Power-on Settling Transistor Level Simulation

Power on settling simulation

– 250MHz input reference source with

accumulating normal distributed

phase jitter (1% period equals 3σ)

– Switching VDD from 0V to 3V PLL reference:

250MHz ± jitter

Output

oscillations

start

Output

frequency

VCO Control

voltage

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Work Flow for the whole CP-PLL

1. Compare nominal (VDD=3V, Temp=27°C) simulations of

transistor level and

behavioral level (VerilogA + WiCkeD RSM)

2. Show that WiCkeD can be applied to behavioral models (VerilogA +

WiCkeD RSM)

– Identify worst-case operation conditions (VDD, Temp) for settling time

– If design parameters have been added to the WiCkeD RSM models,

behavioral netlists can also be optimized (sized)

3. Compare simulation results at worst-case operating conditions of

transistor level and

behavioral level (VerilogA + WiCkeD RSM)

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Comparison of CP-PLL Simulation Results

Nominal operating conditions of CP-PLL

Results fit very well

VDD=3.0V, Temp=27°C Transistor Level Behavioral Model

VerilogA + WiCkeD RSM

Simulation time 5h 25min 10min

Settling time (500MHz ±5MHz) 48.1μs 45.6μs

Voltage(VCTRL) 1.488V 1.485V

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CP-PLL simulation at Behavioral Level

WiCkeD can be applied again to

analyze (and size) quickly on behavioral level

Example:

Settling Time analysis

at worst-case operating

conditions

Next step with CP-PLL:

Verify simulations

at worst-case

operating conditions

with transistor level

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CP-PLL Simulation Results Comparison

Slow operating conditions of CP-PLL

Fast operating conditions of CP-PLL

Both results fit very well

Behavioral model now include supply voltage and temperature influence

VDD=2.7V, Temp=50°C Transistor Level Behavioral Level

VerilogA + WiCkeD RSM

Settling time (500MHz ±5MHz) 60.7μs 59.0μs

Voltage(VCTRL) 1.524V 1.527V

VDD=3.3V, Temp=10°C Transistor Level Behavioral Level

VerilogA + WiCkeD RSM

Settling time (500MHz ±5MHz) 39.6μs 35.3μs

Voltage(VCTRL) 1.429V 1.312V

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Optimization Flow Úsing Behavioral Model(s)

To use behavioral models for all blocks of the CP-PLL in simulation:

1. Size each block at transistor level.

2. Create/update behavioral models for each block including selected

design parameters.

3. Size CP-PLL on the behavioral level.

4. Verify result w.r.t. transistor level.

To define block level specifications:

1. Start with a CP-PLL model at behavioral level

2. Optimize it (e.g. in nominal case)

3. Derive block specifications

4. Continue with the above flow and iteratively improve the design and

update specifications

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Another Optimization Flow Using Behavioral Model(s)

Use transistor level for a specific block to be sized and behavioral models

for all other blocks of the CP-PLL:

1. Size each single block at transistor level.

2. Create/update behavioral models for each block.

3. Setup simulation using transistor level description for one block (e.g.

VCO) and behavioral level for all other blocks.

4. Apply WiCkeD to size the block at transistor level

5. Update the behavioral model of the sized block

6. Continue with 3. to size another block at transistor level (e. g. round

robin)

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Summary

We applied WiCkeD Modeling to speed up the simulation process of a

Charge Pump PLL.

Settling time was simulated. Input reference jitter can be simulated, as

well.

Simulation time was significantly reduced from 5h25m to 10m thanks to

VerilogA.

Behavioral simulation results well match transistor level simulation over

temperature and supply voltage thanks to WiCkeD RSM.

Possibility to apply WiCkeD to behavioral level netlists for sizing and

analysis.