Page 1 Component Industry Trends Driven by New End-User Equipment VHS 32 1 4 5 6 7 8 9 0 * #

Page 1

Component Industry TrendsDriven by New End-User

Equipment

VHS

321

4 5 6

7 8 9

0* #

Page 2

Agenda

Impedance Measurement Basics

Measurement Discrepancies

Measurement Techniques Error Compensation

Page 3

Impedance Definition

Impedance is the total opposition a deviceor circuit offers to the flow of a periodic current

AC test signal (amplitude and frequency)

Includes real and imaginary elements

Z = R + j X Z = R + j B

B

G

R X

Page 4

Impedance Measurement Plane

O-

Z = R + jX = |Z|

= ARCTANXR

|Z|

Resistive

Real Axis

Ima

gin

ary

Axi

s

Ca

pac

itive

Ind

uct

ive

+j

-j

|Z| = R + X 2 2

D U T

( )

O-

-O

Page 5

Admittance Measurement Plane

O-

Y = G + jB = |Y|

= ARCTANBG

|Y|

Conductive

Real Axis

Ima

gin

ary

Axi

s

Ind

uct

ive

Ca

pac

itive

+j

-j

|Y| = G + B 2 2

D U T

( )

O-

-O

Y=1/Z

Page 6

Agenda


Measurement Discrepancies

Measurement Techniques Error Compensation

Page 7

Which Value is Correct?

Z Analyzer

Q : 165Q : 165

Q = 120

LCR meter

L : 5.231 uH?

?Q : 120

LCR meter

LCR meter

D U T

D U T

L : 5.310 uH

5.310 uH5.231 uH

Page 8

Measurement Discrepancy Reasons

Component Dependency Factors

Measurement Errors

True, Effective, and Indicated Values

Circuit Mode (Translation Equations)

Page 9Kobe Instrument Division

Back to Basics - LCRZ Module

Measurement Discrepancy Reasons


Test signal level

Test signal frequency

DC bias, voltage and current

Environment (temperature, humidity, etc.)

Page 10

Component ParasiticsComplicate the Measurements

Page 11

Real World Capacitor Model Includes Parasitics

Page 12

Quality and Dissipation Factors

Q =

R

Energy lost

Energy stored=

X

R

0 Q O

s

s

O

Different from the Q associated

with resonators and filters

The better the component, then

D = 1

Q , mainly used for capacitors

Page 13

Capacitor Reactance vs. Frequency

Capacitor Model|X|

Frequency

X = wL

X =1

wC

L

C

Page 14

Example Capacitor ResonanceImpedance vs. Frequency

A: |Z|A MAX 50.00B MAX 100.0 deg

B: MKR 6 320 000.000 Hz

MAG 47.2113

PHASE 659.015 mdeg

A MIN 20.00 START 1 000 000.000 Hz STOP 15 000 000.000 Hz

0

B MIN -100.0 deg

m

m



C Variations with Test Signal Level

SMD Capacitors, Various dielectric constants K

Vac

C

Low K

Mid K

High K

C vs DC Voltage BiasType I and II SMD Capacitors

Vdc

Type I

Type II

C / %

0 50 100

0

2

-2

-4

-6

-8

-10

-20

NPO (low K)

X7R (high K)

C vs AC Test Signal Level



C vs. Temperature

Type I and II SMD Capacitors

T / C

Type I

Type II

C / %

-60 60 140

10

15

5

0

-5

-10

-15

-20

NPO (low K)

X7R (high K)

-20 20 100

Page 17

L vs. DC Current Bias LevelPower Inductors

Idc

L / %

0 50 100

0

2

-2

-4

-6

-8

-10

-20

Page 18


Test signal frequency

Test signal level

DC bias, voltage and current

Environment ( temperature, humidity, etc.)

Aging

Component's current state

Page 19

Which Value Do We Measure?

TRUE

EFFECTIVE

INDICATED +/-

Instrument Test fixture Real world device

%

Page 20

Measurement Set-Up

DUT

R + jXx x

Test

FixtureInstrument

Port

Extension

Page 21

Sources of Measurement Errors

Measurement technique inaccuracies

Fixture residuals

RFI and other noise

DUT stray and lead parasitics

Port Extension complex residuals

Page 22

Sources of Measurement Errors

DUT

R + jXx x

Test

FixtureInstrument

Port

Extension

TechniqueInaccuracies Residuals Noise

Parasitics

ComplexResiduals

Page 23

Actions for Limiting Measurement Errors

DUT

R + jXx x

Test

FixtureInstrument

Port

Extension

CalibrationCompensation

Guarding

LOADCompensation

EShielding

Page 24

What Do Instruments...

I-V Method Reflection CoefficientMethod

Measured

Direct

I, V

Z =

Ls , Lp, Cs, Cp, Rs or ESR, Rp, D, Q

Calculations

Model basedApproximations

C

R

CR

p

p

ss

D U T ?

x,y

Z = Zo1 +1 -I

V

Measure ? Calculate ? Approximate ?

Page 25

Circuit Mode

Requires Simplified Models

No L Capacitor Model

Complete Capacitor ModelRs,Ls,Rp,Cp ?

TOO C

OMPLEX

Page 26

Circuit Mode

Large C Small C

No L Capacitor Model

Series model Parallel model

Rs

Rp

C

Rs Cs

Rp

Cp

Small L Large L

Rs vs Rp , who wins ?

SMD

Page 27

Which Model is Correct ?

Both are correct

One is a better approximation

For high Q or low D components,

Cs Cp

C

R

CRC = C (1 + D )

p

p

sss p

2

Page 28

Agenda


Measurement Discrepancies Measurement Techniques Error Compensation

Page 29

Measurement Techniques

Auto Balancing Bridge

Resonant (Q-adapter / Q-Meter)

RF I-V

Network Analysis (Reflection Coefficient)

TDR (Time Domain Reflectometry)

I-V (Probe)

Page 30

Measurement Technique Topics

Technique Selection Criteria

Theory of Operation

Advantages and Disadvantages of each technique

Expanded connection information and theory for auto balancing bridge (r4 terminal pair) instruments

Error Compensation to minimize measurement error

Page 31

Measurement Technique Selection Criteria

Frequency

DUT Impedance

Required measurement accuracy

Electrical test conditions

Measurement parameters

Physical characteristics of the DUT

Page 32

Frequency vs. Measurement Techniques

Network Analysis

100KHz

1 10 100 1K 10K 100K 1M 10M 100M 1G 10G

Frequency (Hz)


5HZ 40MHz

22KHz 70MHz

Resonant

I-V

10KHz 110MHz

30MHz

RF I-V

1 MHz 1.8 GHz

Page 33

Z and C vs. Frequency

1 10 100 1K 10K 100K 1M 10M 100M 1G

10M

1M

100K

10K

1K

100

10

1

100m

1mF

10mF

100mF

100uF

10uF

1uF

100nF

10nF1nF

10pF100fF

1fF

Frequency (Hz)

Impe

danc

e (O

hms)

160

100pF1pF

10fF

Page 34

Reactance Chart

1 10 100 1K 10K 100K 1M 10M 100M 1G

10M

1M

100K

10K

1K

100

10

1

100m

10nH

1nH

100p

H

100n

H1u

H

10uH

100u

H1m

H10m

H10

0mH

10H

1KH

100K

H

1mF

10mF

100mF

100uF

10uF

1uF

100nF

10nF1nF

10pF100fF

1fF

Frequency (Hz)

Impe

danc

e (O

hms)

Page 35

Solution by Frequency Comparison

Frequency

10M

1M

100K

10K

1K

100101

100m

Impedance

(O

hm

s)

10m1m

100M

100K 1M 10M 100M 1G Hz10G

Network Analysis

RF I-V

10 100 1K 10K

I-V (Probe)


Page 36

Which is the Best ?

All are good

Each has advantages and disadvantages

Multiple techniques may be required

Page 37

Auto Balancing BridgeTheory of Operation

V

-

+

2

V1

DUT

V = I R2 2 2

Z = V

I

1

2 =

V R

V

21

2

H L R2

I2

Virtual ground

II = I2

Page 38


Most accurate, basic accuracy 0.05%

Widest measurement range

Widest range of electrical test conditions

Simple-to-use

Advantages and Disadvantages

Low frequency, f < 40MHz

C,L,D,Q,R,X,G,B,Z,Y,O,...

Page 39

Performing High Q / Low D Measurement is Difficult

Q = X

R

l

-jX

+jX

R

Impedance of very high Q device

Very small R, difficult to measure

R1

X1

Page 40

Resonance (Q - Meter) Technique

Theory of OperationTune C so the circuit resonates

At resonance X = -X , only R remainsD C D

V~OSC

Tuning C (X c) V

L (X ), RD DDUT

e I= eZ

X = = (at resonance)C VI

R VeD

Q = = =|V|

e|X |

RD

D |X |

RD

C

Page 41

Resonant Method


requires experienced user

Vector Scalar

automatic and fast manual and slow

easy to use

No compensationlimited compensation

75kHz - 30MHz 22kHz - 70MHz

Very good for high Q - low D measurements

Requires reference coil for capacitors

Limited L,C values accuracy

Page 42

I - V Probe TechniqueTheory of Operation

V2

V 1

DUT

V = I R2 2 2

Z = V

I

1

2

= V R

V

21

2

I2

R2

Page 43

I-V (Probe)

Medium frequency, 10kHz < f < 110MHz

Moderate accuracy and measurement range


Grounded and in-circuit measurements

Simple-to-use

Page 44

RF I-VTheory of Operation

Vi

Vv

Ro

Ro

Vi

Vv

Ro

Ro DUT DUT

Voltage

Current Voltag

eDetection

Detection

CurrentDetection Detectio

n

High Impedance Test Head Low Impedance Test Head

Page 45

RF I-V

High frequency, 1MHz < f < 1.8GHz

Most accurate method at > 100 MHz

Grounded device measurement


Page 46

Network Analysis (Reflection) Technique

Theory of Operation

DUT

V

VINC

R

V

VINC

RZ - ZL O

Z + ZL O

==

Page 47

Network Analysis

High frequency

- Suitable, f > 100 kHz

Moderate accuracy

Limited impedance measurement range(DUT should be around 50 ohms)


- Best, f > 1.8 GHz

Page 48H

TDRTheory of Operation

V

VINC

RZ - Z

L O

Z + ZL O

==

ZL

DUT

Oscilloscope

Step Generator

VVINC R

Series R & L

Parallel R & C

0t

Page 49

TDNA (TDR)

Reflection and transmission measurements

Single and multiple discontinuities or impedance


DUT impedance should be around 50 ohms

mismatches ("Inside" look at devices)

Good for test fixture design, transmission lines,

high frequency evaluations

Not accurate for m or M DUTs

or with multiple reflections

Page 50

Simple Selection RulesSummary

Auto balancing bridge,

I-V, in-circuit and grounded measurements,medium frequency, 10KHz < f < 110MHz

low frequency, f < 40MHz

Network analysis,

Resonant, high Q and low D

TDNA, discontinuities and distributed

characteristics

high frequency, f > 1.8 GHz

RF I-V, high frequency impedance measurement,1MHz < f < 1.8GHz

Page 51

Measurement Methods and HP products

Auto Balancing Bridge(Four-Terminal Pair)

Resonant (Q-Meter)

RF I-V

Measurement Method HP Products Frequency range

HP 41941A Impedance Probe (withHP 4194A)HP 4193A Vector Impedance Meter

HP 42851A Q Adapter ( with HP 4285A)

10KHz to 100MHz

400KHz to 110MHz

10Hz to 40MHz

5Hz to 13MHz

20Hz to 1MHz spot

100Hz to 10MHz spot

75KHz to 30MHz

75KHz to 30 MHz

HP 4263A LCR Meter

HP 4284A Precision LCR Meter

HP 4192A LF Impedance Analyzer

HP 4194A Impedance/Gain-Phase Analyzer

HP 4285A Precision LCR Meter

HP 427xA LCR Meters

HP 4286A RF LCR MeterHP 4291A Impedance/Material Analyzer

100Hz to 100 kHz spot

1 MHz to 1 GHz1 MHz to 1.8 GHz

I-V (Probe)

Page 52

Measurement Methods and HP products (cont.)

Network Analysis (Reflection Coefficient)

TDNA (TDR)

Measurement Method HP Products Frequency range

300KHz to 1.3GHz/6GHz

130MHz to 13.5GHz/20GHz

45 MHz to 100GHz

5Hz to 500MHz

100 kHz to 500MHz

100 kHz to 1.8 GHz

HP 8751A Network Analyzer

HP 8752C/8753D RF Network Analyzers

HP 8510B Network Analyzer

HP 54121T Digitizing Oscilloscope and TDR

HP 4195A Network/Spectrum Analyzerwith HP 41951A Impedance Test Set

HP 8752C/8753D RF Network Analyzers

HP 8719C/8720C Network Analyzers

HP 8510B Network Analyzer

HP 8719C/8720C Network Analyzers

HP 4396A Network/Spectrum Analyzerwith HP 43961A Impedance Test Kit

Page 53

Selecting a Test Frequency

Ideal case is at operating conditions

Reality, must make trade-offs

Too high a frequency adds measurement,

test fixture and instrument errors

m and M DUTs more diffucult to measure

Page 54

Measurement Tradeoff Example

1 10 100 1K 10K100K1M 10M100M1G

10M

1M

100K

10K

1K

100

10

1

100m

1mF

10mF100mF

100uF

10uF

1uF

100nF

10nF1nF

10pF100fF

1fF

F (Hz)

100pF1pF

10fFZ ( )

4284A @ 1MHz (1600 ) : 0.05%

42

84

A

41

94

A

41

94

1

41

95

A

Want to measure 100 pF ideal capacitor @ 200 MHz

4194A @ 10MHz (160 ) : 1.3 %

4194A @ 40MHz ( 40 ) : 5.2 %

41941A @ 40MHz ( 40 ) : 3.6 %

41941A @ 100MHz ( 16 ) : 6.2 %

4195A @ 200MHz ( 8 ) : 1.9 %

Accuracy comparison

Page 55

Auto Balancing BridgeA: CpA MAX 13.00 pFB MAX 350.0 m

B: D MKR 1 006 570.375 Hz

Cp 10.0742 pF

A/DIV 500.0 fF START 1 000.000 Hz STOP 40 000 000.000 HzB\DIV 50.00 m

D

Page 56

I - VA: CpA MAX 13.00 pFB MAX 1.000

B: D MKR 1 011 579.454 Hz

Cp 10.4523 pF

A/DIV 500.0 fF START 100 000.000 Hz STOP 100 000 000.000 HzB MIN 0.000

D

Page 57

Network Analysis

A: REF13.00p

[ F ]

B: REF MKR 1 018 519.448 Hz Cp 10.7531p F

DIV START 100 000.000 Hz STOP 500 000 000.000 Hz500.0f

D

IMPEDANCE

180.0 [ F ]

RBW: 3 KHZ ST: 6.15 sec RANGE: A= 0, T= 0dBm

36.00

DIV

Page 58

Agenda


Measurement Discrepancies Measurement Techniques Error Compensation

Page 59

Error Compensation to Minimize Measurement Errors

Compensation and Calibration (Compensation = Calibration)–Definition of Compensation and Calibration–Cable correction

OPEN/SHORT Compensation–Basic Theory–Problems which can not be eliminated by OPEN/SHORT compensation

OPEN/SHORT/LOAD Compensation–Basic Theory–Load device selection

Practical Examples Summary

Page 60

To define the "Calibration Plane" at which measurement accuracy is specified

Definition of Calibration

Z Analyzer

LCR Meter

Standard Device

100

Calibration Plane

(Measurement accuracy is specified.)

!

100

Page 61

Cable Correction

Definition : Calibration Plane extension

using specified HP cables

(HP 16048A/B/D/E)

LCR

Meter

LCR

Meter

HP Measurement Cable

Calibration Plane Calibration Plane

Page 62

Definition of CompensationTo reduce the effects of error sources existing

between the DUT and the instrument's "Calibration Plane".

Z Analyzer

LCR Meter

Fixture

Cables

Scanner, etc.

100

+ZZ DUT

100

2 types of compensation

- OPEN/SHORT compensation

- OPEN/SHORT/LOAD compensation

Calibration Plane

Page 63

OPEN/SHORT Compensation- Basic Theory -

Zdut

Rs Ls

Co Go

Hc

Hp

Lp

Lc

Zm

StrayResidual

Test Fixture Residuals

Admittance ( Yo )Impedance ( Zs )Zs = Rs + jLs

Yo = Go + jCo

Zdut =1 - (Zm - Zs)Yo

Zm - Zs

Page 64

OPEN/SHORT Compensation Issues Problem 1

SCANNER ComplicatedResiduals

Stray capacitance

Residual inductance

Residual resistance

DUT

Difficulty to eliminate complicated residuals

LCR Meter

Page 65

OPEN/SHORT Compensation Issue

Problem 2

Difficulty to eliminate Phase Shift Error

LCR MeterDUT

Test Fixture

Not a standard length cable*

* Or not an HP cable

Page 66

OPEN/SHORT Compensation Issue

Problem 3Difficulty to have correlation among instruments.

Discrepancy in Measurement Value

100 pF

100 pF

100 pF

99.7pF

101 pF

102 pF

Ideal Case Real World

0.01

0.01

0.01

0.02

0.005

0.0003

Instrument

#1

Instrument

#2

Instrument

#3

Page 67

OPEN/SHORT/LOAD Compensation

- Basic Theory -

ZdutA B

C DDUTV 2V1

Unknown 2-terminal

Impedance

Instrument

I1 I2

pair circuit

Page 68


- Basic Theory -

Zstd (Zo - Zsm) (Zxm - Zs) *

Zxm - Zs) (Zo - Zxm)Zdut =

Zo : OPEN measurement value

Zs : SHORT measurement vaue

Zsm : Measurement value of LOAD device

Zstd : True value of LOAD device

Zxm : Measurement value of DUT

Zdut : Corrected value of DUT

* These are complex vectors. Conversions to

real and imaginary components are necessary

Page 69


Eliminates phase shift error

Maximizes correlation between instruments

Eliminates complicated residuals

Page 70

OPEN/SHORT/LOAD Compensation Effects

)(

1

2

C-m

ea

sure

me

nt

err

or

[%]

Frequency [kHz]

800 1000600400200

OPEN/SHORT compensation

OPEN/SHORT/LOAD compensation)(

3

Page 71

Procedure of OPEN/SHORT/LOAD Compensation

1. Measure LOAD device

2. Input LOAD measurement value

as a reference value.

Direct-connected test fixture

as accurately as possible.

Page 72

Procedure of OPEN/SHORT/LOAD Compensation

3. Perform OPEN/SHORT/LOAD compensation at the test terminal.

4. Measure DUT at the test terminal.

Test Terminal

Test Fixture with complicated residuals

Page 73

LOAD Device Selection- Consideration 1 -

When you measure DUTs which have various impedance values,

Select a LOAD device whose impedance value is 100 ~ 1k.

When you measure a DUT which has only one impedance value,

Select a LOAD device whose impedance value is close to that of the DUT to be measured.

Page 74

LOAD Device Selection- Consideration 2 -

Select pure and stable capacitance or resistance

LOAD value must be accurately known.

loads (low D capacitors - i.e. mica)

Page 75

Practical Examples

4284A

16047C

DUT

DUT

4285A

16048D

16047A

(A) (B)

(1) (1)

(2)

Page 76

Practical Examples

4285A

DUT

4285A

16048A

(C) (D)

DUT

16047A

Non-HP

Cable

SCANNER

(1) (1)

(2) (2)

Page 77

Practical Example

(E)

4195A 16092A

41951A

(2)

(1)

Page 78

SummaryCalibration and Compensation Comparison

Theory

Calibration

Cable correction

Compensation

OPEN/SHORT

Compensation

OPEN/SHORT/LOAD

Compensation

Eliminate instrument system errorsDefine the "Calibration Plane using a CAL standard

Eliminate the effects of cable errorExtend "Calibration Plane" to the end of the cable

Eliminate the effects of error sources existing between "Calibration Plane" and DUT

Eliminate the effects of simple fixture residuals

Eliminate the effects of complex fixture residuals

Page 79

SummaryWhich compensation technique should you select?

- Selection Guideline -

InstrumentsFixture Connection

Primary Fixture Secondary Fixture

Residual

Compensation

OPEN/SHORT only

Cable correction + OPEN/SHORT

OPEN/SHORT/LOAD

OPEN/SHORTor

OPEN/SHORT/LOAD

Direct Test Fixture

Complicated FixtureScanner, etc.

Direct Test Fixture

Other Fixtures

DirectTest Fixture

Specified HP Cable

Non-specified HP cable

Non-HP cable

Self-made Test Fixture

(4284A, 4285A etc.)

Z Analyzer

LCR Meter Cable correction + OPEN/SHORT/LOAD

Documents

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