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OBSERVATION OF THE DALITZ DECAY OF THEFIRST EXCITED STATE OF THECHARMED-STRANGE MESON
A Dissertation
Presented to the Faculty of the Graduate School
of Cornell University
in Partial Fulfillment of the Requirements for the Degree of
Doctor of Philosophy
by
Souvik Das
January 2011
c© 2011 Souvik Das
ALL RIGHTS RESERVED
OBSERVATION OF THE DALITZ DECAY OF THE FIRST EXCITED STATE OF
THE CHARMED-STRANGE MESON
Souvik Das, Ph.D.
Cornell University 2011
The branching fraction for a previously unobserved decay D∗+s → D+s e+e− is pre-
dicted theoretically in this dissertation to be 0.65% of the branching fraction for
the decay D∗+s → D+s γ. We conduct a search for the D∗+s → D+s e+e− in 586 pb−1
of e+e− collision data collected with the CLEO-c detector at the Cornell Elec-
tron Storage Ring (CESR) operating at a center of mass energy of 4170 MeV
and observe it with a significance of 6.4 σ over estimated backgrounds. The
ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) is measured to be
(0.72 ± 0.14(stat) ± 0.06(syst))%, which is within one standard deviation of un-
certainty from the predicted value.
BIOGRAPHICAL SKETCH
Souvik Das was born to Tapan and Tanusri Das on August 20, 1982 in Kolkata,
India. Bred on an abundance of books, toys and love in a family of humble
means, he was soon convinced in spite of the stagnant life of Kolkata that the
world, in the larger scheme of things, is a magical place that bears investigation.
He gravitated towards physics and at 14 declared to his father that he had to be
a physicist.
In 2000, he graduated from Don Bosco School Park Circus in Kolkata and
enrolled in the undergraduate physics program at St. Stephen’s College in
Delhi. There his interest in physics blossomed and besides curricular studies
he worked with physicists across the country on a variety of projects ranging
from condensed matter physics to complex systems and biophysics.
He joined Cornell University as a graduate student in 2003 and continued
his tradition of wandering between physics groups till he converged on exper-
imental high energy physics for his Ph.D. research in 2006. He worked on the
pixel detector for the Compact Muon Solenoid (CMS) experiment at the Large
Hadron Collider (LHC), sometimes living for months at Fermilab, Illinois where
a part of it was being fabricated. In early 2007, he along with parts of the pixel
detector was shipped out to CERN, Geneva. He worked on various aspects
of the CMS experiment till the LHC suffered a breakdown in September 2008.
Thereafter, he switched to the CLEO-c experiment where he worked on the elec-
tromagnetic Dalitz decay of the D∗+s meson, which is the content of this disser-
tation.
Souvik looks forward to resuming work at the LHC where he hopes to oc-
cupy himself with searching for the mechanism of electroweak symmetry break-
ing.
iii
To my parents, Tapan and Tanusri,
and my grandparents, Phalguni and Haripada,
who taught me to value knowledge above all else
iv
ACKNOWLEDGEMENTS
I must acknowledge that any result in contemporary high energy physics,
especially from large collaborations like CLEO, owes a lot to many people. This
analysis is no different and sits at the end of decades of effort, drawing on the
labor and expertise of hundreds who built, maintained, and operated the CLEO-
c detector and the CESR collider. I must also acknowledge the efforts that went
into making sense of the data, in particular the efforts of those who measured
the hadronic branching fractions of the D+s meson that this analysis explicitly
depends on.
Onto more personal acknowledgements, I must first thank my advisor, An-
ders Ryd, for guiding me through this and many other projects in the course of
my graduate career in high energy physics with exceptional involvement. This
document would not exist were it not for his patient guidance and encourage-
ment. I have learned much from him in the fields of particle phenomenology,
detector hardware, software development, statistics and collaboration politics,
and I hope to learn more in the years ahead.
I thank David Cassel and Jim Alexander for following the progress of this
analysis with so much interest and offering very helpful advice at various junc-
tures of the effort. I am grateful to Werner Sun for helping me familiarize myself
with CLEO-c software. Werner, Dan Riley, David Kreinick and Brian Heltsley
must be thanked for helping me reprocess large CLEO-c datasets. I thank Peter
Onyisi for lending us his expertise on the hadronic decay of D+s mesons. Brian,
Matthew Shepherd and Richard Ehrlich were tasked with reviewing this anal-
ysis internally within the CLEO collaboration and for that I thank them. Brian
must also be thanked for answering my questions regarding CLEO-c calorime-
try and offering great suggestions for improving the analysis. I also thank Paras
v
Naik for fielding random questions about the detector and software at equally
random times of the day or night. I am grateful to Pattie Place, the Thesis Ad-
visor of the Graduate School at Cornell University, for weeding out typesetting
errors from this document.
Finally, I thank Cornell University, the Department of Physics and the Lab-
oratory for Elementary Particle Physics for accepting my candidacy and giving
me such an extraordinary opportunity to work at the very frontiers of physics.
vi
TABLE OF CONTENTS
Biographical Sketch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . iiiDedication . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ivAcknowledgements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . vTable of Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . viiList of Tables . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xList of Figures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xvii
1 Introduction 1
2 A Theoretical Prediction for the Ratio of Branching Fractions B(D∗+s →D+s e+e−)/B(D∗+s → D+s γ) 62.1 Rate for D∗+s → D+s γ . . . . . . . . . . . . . . . . . . . . . . . . . . . 82.2 Rate for D∗+s → D+s e+e− . . . . . . . . . . . . . . . . . . . . . . . . . 10
3 The CLEO-c Detector 163.1 The Tracking System . . . . . . . . . . . . . . . . . . . . . . . . . . 213.2 The Calorimeter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
4 Analysis Method to Search for the D∗+s → D+s e+e− and Measure the Ratioof Branching Fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) 264.1 Backgrounds for D∗+s → D+s e+e− . . . . . . . . . . . . . . . . . . . . 314.2 Selection Criteria for Reconstructing D∗+s → D+s e+e− . . . . . . . . . 33
4.2.1 Track Quality Requirements for the Soft e+e− Pair . . . . . 334.2.2 Mass of the D+s Meson, mD+s . . . . . . . . . . . . . . . . . . 344.2.3 Beam Constrained Mass of the D∗+s Meson, mBC . . . . . . . 344.2.4 Mass Difference between the D∗+s and the D+s Mesons, δm . 354.2.5 ∆d0 between the e+ and e− Tracks . . . . . . . . . . . . . . . 364.2.6 ∆φ0 between the e+ and e− Tracks . . . . . . . . . . . . . . . 37
4.3 Selection Criteria for Reconstructing D∗+s → D+s γ . . . . . . . . . . 384.3.1 Shower Criteria for the Photon . . . . . . . . . . . . . . . . 39
4.4 Datasets Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 404.4.1 Generic Monte Carlo . . . . . . . . . . . . . . . . . . . . . . 414.4.2 Continuum Monte Carlo . . . . . . . . . . . . . . . . . . . . 42
4.5 Reprocessing Data to Fit Tracks with the Electron Mass Hypothesis 434.6 Monte Carlo Generation and Validation . . . . . . . . . . . . . . . 454.7 Optimization of Selection Criteria for the D∗+s → D+s e+e− . . . . . . 47
4.7.1 D+s → K+K−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . 504.7.2 D+s → KS K+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 624.7.3 D+s → ηπ+; η→ γγ . . . . . . . . . . . . . . . . . . . . . . . . 644.7.4 D+s → η′π+; η′ → π+π−η; η→ γγ . . . . . . . . . . . . . . . . . 664.7.5 D+s → K+K−π+π0 . . . . . . . . . . . . . . . . . . . . . . . . . 684.7.6 D+s → π+π−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 70
vii
4.7.7 D+s → K∗+K∗0; K∗+ → K0Sπ+,K∗0 → K−π+ . . . . . . . . . . . . 72
4.7.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0 . . . . . . . . . . . . . . . . . 744.7.9 D+s → η′π+; η′ → ρ0γ . . . . . . . . . . . . . . . . . . . . . . . 76
4.8 Efficiency of Selection Criteria for the Reconstruction of D∗+s →D+s e+e− . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 78
4.9 Estimation of Background in the Signal Region of D∗+s → D+s e+e− . 844.9.1 Determining the Shape of the mBC Distribution . . . . . . . 864.9.2 Determining the Shape of the δm Distribution . . . . . . . 884.9.3 Estimating the Background in the D+s → K+K−π+ Mode . . 904.9.4 Estimating the Background in the D+s → KS K+ Mode . . . 934.9.5 Estimating the Background in the D+s → ηπ+; η→ γγ Mode 954.9.6 Estimating the Background in the D+s → η′π+; η′ →
π+π−η; η→ γγ Mode . . . . . . . . . . . . . . . . . . . . . . 974.9.7 Estimating the Background in the D+s → K+K−π+π0 Mode . 994.9.8 Estimating the Background in the D+s → π+π−π+ Mode . . . 1024.9.9 Estimating the Background in the D+s → K∗+K∗0; K∗+ →
K0S π+; K∗0 → K−π+ Mode . . . . . . . . . . . . . . . . . . . . 104
4.9.10 Estimating the Background in the D+s → ηρ+; η→ γγ; ρ+ →π+π0 Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . 107
4.9.11 Estimating the Background in the D+s → η′π+; η′ → ρ0γ Mode1104.9.12 Summary of Estimated Background in the Various Modes 1134.9.13 Predicted Signal Significances . . . . . . . . . . . . . . . . . 113
4.10 Signal Yields and Selection Efficiencies for D∗+s → D+s γ . . . . . . . 1174.10.1 D+s → K+K−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . 1204.10.2 D+s → KS K+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 1294.10.3 D+s → ηπ+; η→ γγ . . . . . . . . . . . . . . . . . . . . . . . . 1354.10.4 D+s → η′π+; η′ → π+π−η; η→ γγ . . . . . . . . . . . . . . . . . 1414.10.5 D+s → K+K−π+π0 . . . . . . . . . . . . . . . . . . . . . . . . . 1474.10.6 D+s → π+π−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 1534.10.7 D+s → K∗+K∗0; K∗+ → K0
Sπ+; K∗0 → K−π+ . . . . . . . . . . . . 159
4.10.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0 . . . . . . . . . . . . . . . . . 1654.10.9 D+s → η′π+; η′ → ρ0γ . . . . . . . . . . . . . . . . . . . . . . . 171
4.11 Un-blinding Data and Results . . . . . . . . . . . . . . . . . . . . . 1774.11.1 D+s → K+K−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . 1844.11.2 D+s → KS K+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 1854.11.3 D+s → ηπ+; η→ γγ . . . . . . . . . . . . . . . . . . . . . . . . 1864.11.4 D+s → η′π+; η′ → π+π−η; η→ γγ . . . . . . . . . . . . . . . . . 1874.11.5 D+s → K+K−π+π0 . . . . . . . . . . . . . . . . . . . . . . . . . 1884.11.6 D+s → π+π−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . . 1894.11.7 D+s → K∗+K∗0; K∗+ → K0
Sπ+; K∗0 → K−π+ . . . . . . . . . . . . 190
4.11.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0 . . . . . . . . . . . . . . . . . 1914.11.9 D+s → η′π+; η′ → ρ0γ . . . . . . . . . . . . . . . . . . . . . . . 1924.11.10 Comparison of me+e− between Data and Monte Carlo Sim-
ulation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193
viii
4.11.11 A Re-evaluation of All D∗+s Branching Fractions . . . . . . 1944.12 Systematic Uncertainties from the Tracking of Soft Electrons and
Photons . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1964.12.1 Method 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1994.12.2 Method 2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 210
5 Results and Conclusion 213
A Plots Used to Optimize Selection Criteria for D∗+s → D+s e+e− 215A.1 D+s → KS K+ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 216A.2 D+s → ηπ+; η→ γγ . . . . . . . . . . . . . . . . . . . . . . . . . . . . 222A.3 D+s → η′π+; η′ → π+π−η; η→ γγ . . . . . . . . . . . . . . . . . . . . . 228A.4 D+s → K+K−π+π0 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 234A.5 D+s → π+π−π+ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 240A.6 D+s →→ K∗+K∗0; K∗+ → K0
S π+,K∗0 → K−π+ . . . . . . . . . . . . . . . 246
A.7 D+s → ηρ+; η→ γγ; ρ+ → π+π0 . . . . . . . . . . . . . . . . . . . . . . 252A.8 D+s → η′π+; η′ → ρ0γ . . . . . . . . . . . . . . . . . . . . . . . . . . . 258
Bibliography 264
ix
LIST OF TABLES
1.1 Branching fractions of the known decays of the D∗+s . . . . . . . . . 4
4.1 Integrated luminosity corresponding to the CLEO-c datasetsused in this analysis. The statistical uncertainties are added inquadrature, while the systematic uncertainties are added lin-early. Thereafter, these two forms of uncertainties are added inquadrature to give us the total uncertainty we use for the analy-sis and the remainder of this document. . . . . . . . . . . . . . . . 40
4.2 Numbers of signal and background events retained by opti-mized selection criteria in signal and background Monte Carlosimulations where electron tracks have been fitted to the pionmass hypothesis. The numbers are normalized to 586 pb−1 ofintegrated luminosity. . . . . . . . . . . . . . . . . . . . . . . . . . 49
4.3 Numbers of signal and background events retained by opti-mized selection criteria in signal and background Monte Carlosimulations where electron tracks have been fitted to the elec-tron mass hypothesis. The numbers are normalized to 586 pb−1
of integrated luminosity. . . . . . . . . . . . . . . . . . . . . . . . . 504.4 Selection criteria for data with electron tracks fitted to the pion
and electron mass hypotheses in the D+s → K+K−π+ decay mode. 614.5 Numbers of signal and background events left in 586 pb−1 of
pion and electron-fitted simulation samples in the D+s → K+K−π+decay mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
4.6 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → KS K+ decay mode. . . 62
4.7 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → KS K+ decay mode. . . . . . . . . 63
4.8 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → ηπ+; η → γγ decaymode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64
4.9 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → ηπ+; η→ γγ decay mode. . . . . . 65
4.10 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → η′π+; η′ → π+π−η; η →γγ decay mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66
4.11 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → η′π+; η′ → π+π−η; η → γγ decaymode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67
4.12 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → K+K−π+π0 decay mode. 68
4.13 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → K+K−π+π0 decay mode. . . . . . . 69
x
4.14 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → π+π−π+ decay mode. . 70
4.15 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → π+π−π+ decay mode. . . . . . . . 71
4.16 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → K∗+K∗0 decay mode. . 72
4.17 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → K∗+K∗0 decay mode. . . . . . . . 73
4.18 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → ηρ+; η → γγ; ρ+ →π+π0 decay mode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
4.19 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → ηρ+; η → γγ; ρ+ → π+π0 decaymode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
4.20 Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → η′π+; η′ → ρ0γ decaymode. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
4.21 Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → η′π+; η′ → ρ0γ decay mode. . . . . 77
4.22 Selection efficiencies for reconstructing the D∗+s → D+s e+e− signalin each of the hadronic decay modes of the D+s that this analysisdeals with. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 79
4.23 Maximum likelihood fit parameters for the MC shape in mBC dis-tribution. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
4.24 Maximum likelihood fit parameters for the data shape in mBCdistribution. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86
4.25 Maximum likelihood fit parameters for the MC shape in δm dis-tribution. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 88
4.26 Maximum likelihood fit parameters for the Data shape in δm dis-tribution. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 89
4.27 Maximum likelihood fit parameters to estimate background inthe D+s → K+K−π+ mode . . . . . . . . . . . . . . . . . . . . . . . . 91
4.28 Estimates of the background in the signal region of the D+s →K+K−π+ mode using four fits outlined above. . . . . . . . . . . . . 92
4.29 Maximum likelihood fit parameters to estimate background inthe D+s → KS K+ mode . . . . . . . . . . . . . . . . . . . . . . . . . 94
4.30 Estimates of the background in the signal region of the D+s →KS K+ mode using four fits outlined above. . . . . . . . . . . . . . 94
4.31 Maximum likelihood fit parameters to estimate background inthe D+s → ηπ+; η→ γγ mode . . . . . . . . . . . . . . . . . . . . . . 96
4.32 Estimates of the background in the signal region of the D+s →ηπ+; η→ γγ mode using four fits outlined above. . . . . . . . . . . 96
4.33 Estimates of the background in the signal region of the D+s →η′π+; η′ → π+π−η; η→ γγ mode using four fits outlined above. . . 98
xi
4.34 Maximum likelihood fit parameters to estimate background inthe D+s → K+K−π+π0 mode . . . . . . . . . . . . . . . . . . . . . . . 99
4.35 Estimates of the background in the signal region of the D+s →K+K−π+π0 mode using four fits outlined above. . . . . . . . . . . . 100
4.36 Maximum likelihood fit parameters to estimate background inthe D+s → π+π−π+ mode . . . . . . . . . . . . . . . . . . . . . . . . . 103
4.37 Estimates of the background in the signal region of the D+s →π+π−π+ mode using four fits outlined above. . . . . . . . . . . . . 103
4.38 Maximum likelihood fit parameters to estimate background inthe D+s → K∗+K∗0 mode . . . . . . . . . . . . . . . . . . . . . . . . . 105
4.39 Estimates of the background in the signal region of the D+s →K∗+K∗0 mode using four fits outlined above. . . . . . . . . . . . . 106
4.40 Maximum likelihood fit parameters to estimate background inthe D+s → ηρ+; η→ γγ; ρ+ → π+π0 mode . . . . . . . . . . . . . . . 108
4.41 Estimates of the background in the signal region of the D+s →ηρ+; η→ γγ; ρ+ → π+π0 mode using four fits outlined above. . . . 109
4.42 Maximum likelihood fit parameters to estimate background inthe D+s → η′π+; η′ → ρ0γ mode . . . . . . . . . . . . . . . . . . . . . 111
4.43 Estimates of the background in the signal region of the D+s →η′π+; η′ → ρ0γ mode using four fits outlined above. . . . . . . . . 112
4.44 Summary of the estimates for the background in the signal re-gion for all the modes we have studied. . . . . . . . . . . . . . . . 114
4.45 The projected signal significance expected for each individualhadronic decay mode of the D+s , as well as modes combined. . . . 116
4.46 Signal yields and efficiencies for D∗+s → D+s γ from all the modesof decay of the D+s relevant for our measurement of the ratioB(D∗+s → D+s e+e−)/B(D∗+s → D+s γ). B(D+s → i) is the known branch-ing fraction for D+s to decay via the ith hadronic mode we arestudying. ε i
Dsγis the efficiency of our selection criteria for the
mode. N iDsγ
is the signal yield observed for this mode. . . . . . . . 1184.47 Signal yields and efficiencies for D∗+s → D+s γ from all the modes
of decay of the D+s relevant for our measurement of the ra-tio B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) in Generic Monte Carlo.B(D+s → i) is the known branching fraction for D+s to decay viathe ith hadronic mode we are studying. ε i
Dsγis the efficiency of
our selection criteria for the mode. N iDsγ
is the signal yield ob-served for this mode. B(D∗+s → D+s γ) is the branching fraction forD∗+s → D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Error[2] encapsulates the systematic uncertainties from the signal ef-ficiency and the uncertainty in the number of produced genericMC events as described in Section 4.4.1. . . . . . . . . . . . . . . . 119
xii
4.48 Selection criteria for D∗+s → D+s γ events where D+s → K+K−π+.The δm cut has been widened to accommodate the wider peakfor the signal in this distribution. . . . . . . . . . . . . . . . . . . . 120
4.49 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsu-lates the systematic uncertainties from the signal efficiency andthe uncertainty in the number of produced generic MC events. . 127
4.50 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield in data observed for this mode. . . . . . . . . . . 128
4.51 Selection criteria for D∗+s → D+s γ events where D+s → KS K+. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution. . . . . . . . . . . . . . . . . . . . . . . . 129
4.52 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield in generic Monte Carlo observed for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsu-lates the systematic uncertainties from the signal efficiency andthe uncertainty in the number of produced generic MC events. . 131
4.53 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield in data observed for this mode. . . . . . . . . . . 132
4.54 Selection criteria for D∗+s → D+s γ events where D+s → ηπ+; η→ γγ.The δm cut has been widened to accomodate the wider peak forthe signal in this distribution. . . . . . . . . . . . . . . . . . . . . . 135
4.55 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield in generic Monte Carlo observed for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 137
4.56 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 140
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4.57 Selection criteria for D∗+s → D+s γ events where D+s → η′π+; η′ →π+π−η; η → γγ. The δm cut has been widened to accomodate thewider peak for the signal in this distribution. . . . . . . . . . . . . 141
4.58 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 143
4.59 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in data observed for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 146
4.60 Selection criteria for D∗+s → D+s γ events where D+s → K+K−π+π0.The δm cut has been widened to accomodate the wider peak forthe signal in this distribution. . . . . . . . . . . . . . . . . . . . . . 147
4.61 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 149
4.62 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 152
4.63 Selection criteria for D∗+s → D+s γ events where D+s → π+π−π+. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution. . . . . . . . . . . . . . . . . . . . . . . . 153
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4.64 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 155
4.65 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 158
4.66 Selection criteria for D∗+s → D+s γ events where D+s → K∗+K∗0. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution. . . . . . . . . . . . . . . . . . . . . . . . 159
4.67 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 161
4.68 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 164
4.69 Selection criteria for D∗+s → D+s γ events where D+s → ηρ+. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution. . . . . . . . . . . . . . . . . . . . . . . . 165
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4.70 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 167
4.71 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 170
4.72 Selection criteria for D∗+s → D+s γ events where D+s → η′π+; η′ →ρ0γ. The δm cut has been widened to accomodate the wider peakfor the signal in this distribution. . . . . . . . . . . . . . . . . . . . 171
4.73 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
isthe signal yield observed in generic Monte Carlo for this mode.B(D∗+s → D+s γ) is the branching fraction for D∗+s → D+s e+e− in-ferred from this mode. Error [1] on the inferred branching frac-tion is the statistical error from the final fit. Error [2] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s . . . 173
4.74 ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statisti-cal error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulates thesystematic uncertainties from the signal efficiency, the integratedluminosity and the production cross section for D∗±s D∓s . Error [4]encapsulates the systematic error arising from the fit. . . . . . . . 176
4.75 Data and estimated backgrounds in the signal region used to es-timate the numbers of signal events found in each mode and thecorresponding significance of the signal. Expected numbers ofsignal events from Monte Carlo simulations also listed. . . . . . . 178
4.76 The ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ)inferred from the signal yields and efficiencies of each and allmodes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 180
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LIST OF FIGURES
2.1 A Feynman diagram for the D∗+s → D+s γ process. . . . . . . . . . . 82.2 A Feynman diagram for the D∗+s → D+s e+e− process. . . . . . . . . 10
3.1 Cutaway schematic of the CLEO-c detector. . . . . . . . . . . . . 173.2 Quarter-view schematic of the CLEO-c detector. . . . . . . . . . . 183.3 The inner drift chamber. . . . . . . . . . . . . . . . . . . . . . . . . 203.4 Stereo angles in the outer drift chamber. . . . . . . . . . . . . . . . 20
4.1 A schematic showing a e+e− collision producing a D∗+s D−s pairwhere the D∗+s decays to a D+s and a e+e− via the decay we aresearching for in this dissertation. . . . . . . . . . . . . . . . . . . . 28
4.2 An illustration of ∆d0 between the soft e+e− tracks of the signaland conversion events. . . . . . . . . . . . . . . . . . . . . . . . . 37
4.3 An illustration of ∆φ0 between the soft e+e− tracks of the signaland conversion events. . . . . . . . . . . . . . . . . . . . . . . . . 38
4.4 (Left) The difference between the reconstructed and Monte Carlogenerated electron energy plotted against the generated electronenergy when the electrons have been fitted to tracks using thepion mass hypothesis. (Right) The difference when the electronsare fitted to tracks using the electron mass hypothesis. . . . . . . 44
4.5 (a) The analytical expression for the distribution of k2 overlaidwith the distribution of the corrected m2
ee from the Monte Carlo.(b) A zoom into the region betweeen 0 GeV and 20m2
e to illustratethe close match near the peak. . . . . . . . . . . . . . . . . . . . . 46
4.6 Optimization plots for the mD+s selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated samples.The top left plot is the distribution of mD+s in the signal MonteCarlo sample. The top right plot graphs the number of signalMC sample events accepted by the criterion as we increase thecut width plotted on the x-axis. The plots in the second and thirdrows correspond to the generic and continuum MC samples. Thebottom left shows the significance of the signal over background.The bottom right plot shows the precision of the signal. . . . . . 51
4.7 Optimization plots for the mBC selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated samples.The top left plot is the distribution of mBC in the signal MonteCarlo sample. The top right plot graphs the number of signalMC sample events accepted by the criterion as we increase thecut width plotted on the x-axis. The plots in the second and thirdrows correspond to the generic and continuum MC samples. Thebottom left shows the significance of the signal over background.The bottom right plot shows the precision of the signal. . . . . . 52
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4.8 Optimization plots for the δm selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated samples.The top left plot is the distribution of δm in the signal MonteCarlo sample. The top right plot graphs the number of signalMC sample events accepted by the criterion as we increase thecut width plotted on the x-axis. The plots in the second andthird rows correspond to the generic and continuum MC sam-ples. The bottom left shows the significance of the signal overbackground. The bottom right plot shows the precision of thesignal. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
4.9 Optimization plots for the ∆d0 selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated samples.The top left plot is the distribution of ∆d0 between the e+e− tracksin the signal Monte Carlo sample. The top right plot graphs thenumber of signal MC sample events accepted by the criterion aswe vary the cut on the x-axis. The plots in the second and thirdrows correspond to the generic and continuum MC samples. Thebottom left shows the significance of the signal over background.The bottom right plot shows the precision of the signal. . . . . . 54
4.10 Optimization plots for the ∆φ0 selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated samples.The top left plot is the distribution of ∆φ0 between the e+e− tracksin the signal Monte Carlo sample. The top right plot graphs thenumber of signal MC sample events accepted by the criterion aswe vary the cut on the x-axis. The plots in the second and thirdrows correspond to the generic and continuum MC samples. Thebottom left shows the significance of the signal over background.The bottom right plot shows the precision of the signal. . . . . . 55
4.11 Optimization plots for the mD+s selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulated sam-ples. The top left plot is the distribution of mD+s in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we increasethe cut width plotted on the x-axis. The plots in the second, thirdand fourth rows correspond to the D∗+s → D+s γ, generic and con-tinuum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal. . . . . . . . . . . . . . . . . . . . . . . . . . 56
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4.12 Optimization plots for the mBC selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulated sam-ples. The top left plot is the distribution of mBC in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we increasethe cut width plotted on the x-axis. The plots in the second, thirdand fourth rows correspond to the D∗+s → D+s γ, generic and con-tinuum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal. . . . . . . . . . . . . . . . . . . . . . . . . . 57
4.13 Optimization plots for the δm selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulated sam-ples. The top left plot is the distribution of δm in the signal MonteCarlo sample. The top right plot graphs the number of signalMC sample events accepted by the criterion as we increase thecut width plotted on the x-axis. The plots in the second, thirdand fourth rows correspond to the D∗+s → D+s γ, generic and con-tinuum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal. . . . . . . . . . . . . . . . . . . . . . . . . . 58
4.14 Optimization plots for the ∆d0 selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulated sam-ples. The top left plot is the distribution of ∆d0 between thee+e− tracks in the signal Monte Carlo sample. The top right plotgraphs the number of signal MC sample events accepted by thecriterion as we vary the cut on the x-axis. The plots in the second,third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples. The bottom left shows the significanceof the signal over background. The bottom right plot shows theprecision of the signal. . . . . . . . . . . . . . . . . . . . . . . . . . 59
4.15 Optimization plots for the ∆φ0 selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulated sam-ples. The top left plot is the distribution of ∆φ0 between thee+e− tracks in the signal Monte Carlo sample. The top right plotgraphs the number of signal MC sample events accepted by thecriterion as we vary the cut on the x-axis. The plots in the second,third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples. The bottom left shows the significanceof the signal over background. The bottom right plot shows theprecision of the signal. . . . . . . . . . . . . . . . . . . . . . . . . . 60
4.16 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K+K−π+ as represented in the mBC distribution. . . . . . . . . . . . 78
4.17 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s → KS K+as represented in the mBC distribution. . . . . . . . . . . . . . . . . 79
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4.18 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s → ηπ+ asrepresented in the mBC distribution. . . . . . . . . . . . . . . . . . 80
4.19 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →η′π+; η′ → π+π−η; η→ γγ as represented in the mBC distribution. . 80
4.20 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K+K−π+π0 as represented in the mBC distribution. . . . . . . . . . . 81
4.21 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →π+π−π+ as represented in the mBC distribution. . . . . . . . . . . . 81
4.22 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K∗+K∗0 as represented in the mBC distribution. . . . . . . . . . . . 82
4.23 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →ηρ+; η→ γγ; ρ+ → π+π0 as represented in the mBC distribution. . . 82
4.24 Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →η′π+; η′ → ρ0γ as represented in the mBC distribution. . . . . . . . 83
4.25 Distributions of mBC in Monte Carlo and data. The blue region isdistribution of mBC in Continuum MC. On top of that, in green, isstacked the Generic MC with Conversion type events excluded.The Conversion MC is stacked on top of that in red. The blackcurve is fitted to the sum of the aforementioned background dis-tributions. The Signal MC is stacked on top of the backgroundMC to show roughly what expect to see when we unblind data.Data points, blinded in the signal region, are overlaid in ma-genta. The magenta curve is fitted to the data in the sidebandregions, as described in the text. . . . . . . . . . . . . . . . . . . . 87
4.26 Distributions of δm in Monte Carlo and data. The blue region isdistribution of δm in Continuum MC. On top of that, in green, isstacked the Generic MC with Conversion type events excluded.The Conversion MC is stacked on top of that in red. The blackcurve is fitted to the sum of the aforementioned background dis-tributions. The Signal MC is stacked on top of the backgroundMC to show roughly what expect to see when we unblind data.Data points, blinded in the signal region, are overlaid in ma-genta. The magenta curve is fitted to the data in the sidebandregions, as described in the text. . . . . . . . . . . . . . . . . . . . 89
4.27 The various backgrounds and signal MC expected in the vicin-ity of the signal region in mBC distribution of the D+s → K+K−π+mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
xx
4.28 The various backgrounds and signal MC expected in the vicin-ity of the signal region in δm distribution of the D+s → K+K−π+mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
4.29 The various backgrounds and signal MC expected in the vicin-ity of the signal region in mBC distribution of the D+s → KS K+mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 93
4.30 The various backgrounds and signal MC expected in the vicinityof the signal region in δm distribution of the D+s → KS K+ mode.The data, blinded in the signal region, is overlaid in magentapoints. The black and magenta curves are MC and data shapesscaled by maximum likelihood to the points of data in the side-band regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
4.31 The various backgrounds and signal MC expected in the vicinityof the signal region in mBC distribution of the D+s → ηπ+; η →γγ mode. The data, blinded in the signal region, is overlaid inmagenta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
4.32 The various backgrounds and signal MC expected in the vicinityof the signal region in δm distribution of the D+s → ηπ+; η → γγ
mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 96
4.33 The various backgrounds and signal MC expected in the vicinityof the signal region in mBC distribution of the D+s → η′π+; η′ →π+π−η; η → γγ mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curves areMC and data shapes scaled by maximum likelihood to the pointsof data in the sideband regions. . . . . . . . . . . . . . . . . . . . . 97
4.34 The various backgrounds and signal MC expected in the vicinityof the signal region in δm distribution of the D+s → η′π+; η′ →π+π−η; η → γγ mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curves areMC and data shapes scaled by maximum likelihood to the pointsof data in the sideband regions. . . . . . . . . . . . . . . . . . . . . 98
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4.35 The various backgrounds and signal MC expected in the vicinityof the signal region in mBC distribution of the D+s → K+K−π+π0
mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100
4.36 The various backgrounds and signal MC expected in the vicin-ity of the signal region in δm distribution of the D+s → K+K−π+π0
mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 101
4.37 The various backgrounds and signal MC expected in the vicin-ity of the signal region in mBC distribution of the D+s → π+π−π+
mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 102
4.38 The various backgrounds and signal MC expected in the vicin-ity of the signal region in δm distribution of the D+s → π+π−π+
mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 103
4.39 The various backgrounds and signal MC expected in the vicin-ity of the signal region in mBC distribution of the D+s → K∗+K∗0mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104
4.40 The various backgrounds and signal MC expected in the vicin-ity of the signal region in δm distribution of the D+s → K∗+K∗0mode. The data, blinded in the signal region, is overlaid in ma-genta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 105
4.41 The various backgrounds and signal MC expected in the vicinityof the signal region in mBC distribution of the D+s → ηρ+; η →γγ; ρ+ → π+π0 mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curves areMC and data shapes scaled by maximum likelihood to the pointsof data in the sideband regions. . . . . . . . . . . . . . . . . . . . . 107
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4.42 The various backgrounds and signal MC expected in the vicin-ity of the signal region in δm distribution of the D+s → ηρ+; η →γγ; ρ+ → π+π0 mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curves areMC and data shapes scaled by maximum likelihood to the pointsof data in the sideband regions. . . . . . . . . . . . . . . . . . . . . 108
4.43 The various backgrounds and signal MC expected in the vicinityof the signal region in mBC distribution of the D+s → η′π+; η′ →ρ0γ mode. The data, blinded in the signal region, is overlaid inmagenta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 110
4.44 The various backgrounds and signal MC expected in the vicinityof the signal region in δm distribution of the D+s → η′π+; η′ →ρ0γ mode. The data, blinded in the signal region, is overlaid inmagenta points. The black and magenta curves are MC and datashapes scaled by maximum likelihood to the points of data in thesideband regions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 111
4.45 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion. . . . 121
4.46 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+. The plot is normalized so as todirectly read out the efficiency of the mBC selection criterion. . . . 122
4.47 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+. . . . . . . . . . . . . . . . . . . 123
4.48 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and where both the D−s and the γ have beenmatched to their generated counterparts in the Monte Carlo sim-ulation. This distribution has been fitted to a shape described byEq. 4.24. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 124
4.49 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
4.50 Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+ in586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . . . 127
4.51 Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+ in586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128
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4.52 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion. . . . 129
4.53 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+. The plot is normalized so as todirectly read out the efficiency of the mBC selection criterion. . . . 130
4.54 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+. . . . . . . . . . . . . . . . . . . . . 131
4.55 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 132
4.56 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 133
4.57 Distribution of mBC of D∗+s → D+s γ events where D+s → KS K+ in586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . . . 133
4.58 Distribution of mBC of D∗+s → D+s γ events where D+s → KS K+ in586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 134
4.59 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η → γγ. The plot is normalized soas to directly read out the efficiency of the δm selection criterion. 135
4.60 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η → γγ. The plot is normalized soas to directly read out the efficiency of the mBC selection criterionfrom the area under the fit within the signal region. . . . . . . . . 136
4.61 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η→ γγ. . . . . . . . . . . . . . . . . 137
4.62 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 138
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4.63 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139
4.64 Distribution of mBC of D∗+s → D+s γ events where D+s → ηπ+; η→ γγ
in 586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . 1394.65 Distribution of mBC of D∗+s → D+s γ events where D+s → ηπ+; η→ γγ
in 586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . 1404.66 Distribution of δm in the signal Monte Carlo sample of D∗+s →
D+s γ events where D+s → η′π+; η′ → π+π−η; η → γγ. The plotis normalized so as to directly read out the efficiency of the δmselection criterion. . . . . . . . . . . . . . . . . . . . . . . . . . . . 141
4.67 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → π+π−η; η → γγ. The plot isnormalized so as to directly read out the efficiency of the mBCselection criterion from the area under the fit within the signalregion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 142
4.68 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → π+π−η; η→ γγ. . . . . . . . . . 143
4.69 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 144
4.70 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 145
4.71 Distribution of mBC of D∗+s → D+s γ events where D+s → η′π+; η′ →π+π−η; η→ γγ in 586 pb−1 of Generic Monte Carlo. . . . . . . . . . 145
4.72 Distribution of mBC of D∗+s → D+s γ events where D+s → η′π+; η′ →π+π−η; η→ γγ in 586 pb−1 of data. . . . . . . . . . . . . . . . . . . . 146
4.73 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0. The plot is normalized so asto directly read out the efficiency of the δm selection criterion. . . 147
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4.74 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0. The plot is normalized so asto directly read out the efficiency of the mBC selection criterionfrom the area under the fit within the signal region. . . . . . . . . 148
4.75 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0. . . . . . . . . . . . . . . . . . 149
4.76 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 150
4.77 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151
4.78 Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+π0
in 586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . 1514.79 Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+π0
in 586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . 1524.80 Distribution of δm in the signal Monte Carlo sample of D∗+s →
D+s γ events where D+s → π+π−π+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion. . . . 153
4.81 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → π+π−π+. The plot is normalized so as todirectly read out the efficiency of the mBC selection criterion fromthe area under the fit within the signal region. . . . . . . . . . . . 154
4.82 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → π+π−π+. . . . . . . . . . . . . . . . . . . . 155
4.83 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 156
4.84 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 157
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4.85 Distribution of mBC of D∗+s → D+s γ events where D+s → π+π−π+ in586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . . . 157
4.86 Distribution of mBC of D∗+s → D+s γ events where D+s → π+π−π+ in586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158
4.87 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion. . . . 159
4.88 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0. The plot is normalized so as todirectly read out the efficiency of the mBC selection criterion fromthe area under the fit within the signal region. . . . . . . . . . . . 160
4.89 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0. . . . . . . . . . . . . . . . . . . . 161
4.90 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 162
4.91 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 163
4.92 Distribution of mBC of D∗+s → D+s γ events where D+s → K∗+K∗0 in586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . . . . . 163
4.93 Distribution of mBC of D∗+s → D+s γ events where D+s → K∗+K∗0 in586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164
4.94 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηρ+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion. . . . 165
4.95 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηρ+; η → γγ; ρ+ → π+π0. The plot isnormalized so as to directly read out the efficiency of the mBCselection criterion from the area under the fit within the signalregion. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 166
4.96 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D∗+s → D+s γ events where D+s → ηρ+; η →γγ; ρ+ → π+π0. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 167
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4.97 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 168
4.98 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 169
4.99 Distribution of mBC of D∗+s → D+s γ events where D+s → ηρ+; η →γγ; ρ+ → π+π0 in 586 pb−1 of Generic Monte Carlo. . . . . . . . . . 169
4.100 Distribution of mBC of D∗+s → D+s γ events where D+s → ηρ+; η →γγ; ρ+ → π+π0 in 586 pb−1 of data. . . . . . . . . . . . . . . . . . . . 170
4.101 Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → ρ0γ. The plot is normalizedso as to directly read out the efficiency of the δm selection criterion.171
4.102 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → ρ0γ. The plot is normalized soas to directly read out the efficiency of the mBC selection criterionfrom the area under the fit within the signal region. . . . . . . . . 172
4.103 Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D∗+s → D+s γ events where D+s → η′π+; η′ → ρ0γ. . 173
4.104 Combinatorial background in the mBC distribution consisting ofevents where the D∗+s has been reconstructed out of the D−s andthe γ, and where both the D−s and the γ have been matched totheir generated counterparts in the Monte Carlo simulation. Thisdistribution has been fitted to a shape described by Eq. 4.24. . . . 174
4.105 Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simula-tion. This distribution has been fitted to a shape described by Eq.4.25. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 175
4.106 Distribution of mBC of D∗+s → D+s γ events where D+s → η′π+; η′ →ρ0γ in 586 pb−1 of Generic Monte Carlo. . . . . . . . . . . . . . . . 175
4.107 Distribution of mBC of D∗+s → D+s γ events where D+s → η′π+; η′ →ρ0γ in 586 pb−1 of data. . . . . . . . . . . . . . . . . . . . . . . . . . 176
4.108 Distribution of mBC in data after unblinding. . . . . . . . . . . . . 1834.109 Distribution of δm in data after unblinding. . . . . . . . . . . . . . 183
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4.110 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 184
4.111 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 184
4.112 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 185
4.113 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 185
4.114 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 186
4.115 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 186
4.116 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 187
4.117 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 187
4.118 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 188
4.119 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 188
4.120 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 189
4.121 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 189
4.122 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 190
4.123 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 190
4.124 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 191
4.125 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 191
4.126 Distribution of mBC in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 192
4.127 Distribution of δm in data after unblinding overlaid with predic-tion from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . . 192
4.128 Distribution of me+e− in data after unblinding overlaid with pre-diction from Monte Carlo. . . . . . . . . . . . . . . . . . . . . . . . 193
4.129 Invariant mass of the J/ψ reconstructed from its decay to e+e−(top plots) and µ+µ− (bottom plots). The column on the left isfrom signal MC of Type I events. The column at the center isfrom signal MC of Type II events. The column on the right isfrom data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200
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4.130 The invariant mass of the first π0. The column on the left is fromsignal MC of Type I events. The column at the center is from MCof Type II events. The column on the right is from data. . . . . . . 201
4.131 The invariant mass of the second π0. The column on the left isfrom signal MC of Type I events. The column at the center isfrom MC of Type II events. The column on the right is from data. 201
4.132 The distribution of energy of the positron and the electron fromthe Dalitz decay of the π0 in the MC. Events containing positronand electrons with energy less than 144 MeV, as indicated, areaccepted. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 202
4.133 Four momenta of ψ(2S ) relative to the e+e− collision four mo-menta. The column on the left is from signal MC of Type I events.The column at the center is from MC of Type II events. The col-umn on the right is from data. . . . . . . . . . . . . . . . . . . . . 203
4.134 Difference between the invariant masses of the ψ(2S ) and theJ/ψ. The column on the left is from signal MC of Type I events.The column at the center is from MC of Type II events. The col-umn on the right is from data. . . . . . . . . . . . . . . . . . . . . 204
4.135 The ∆d0 between the e+e− pair from the second π0. The columnon the left is from signal MC of Type I events. The column at thecenter is from MC of Type II events. The column on the right isfrom data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 204
4.136 The ∆φ0 between the e+e− pair from the second π0. The columnon the left is from signal MC of Type I events. The column at thecenter is from MC of Type II events. The column on the right isfrom data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 204
4.137 Invariant mass of the J/ψ reconstructed from its decay to e+e−(top plots) and µ+µ− (bottom plots). The column on the left isfrom signal MC of Type II events. The column on the right isfrom data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 206
4.138 The invariant mass of the first π0. The column on the left is fromsignal MC of Type II events. The column on the right is from data. 207
4.139 The invariant mass of the second π0. The column on the left isfrom signal MC of Type II events. The column on the right isfrom data. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 207
4.140 Four momenta of ψ(2S ) relative to the e+e− collision four mo-menta. The column on the left is from signal MC of Type IIevents. The column on the right is from data. . . . . . . . . . . . . 208
4.141 Difference between the invariant masses of the ψ(2S ) and theJ/ψ. The column on the left is from signal MC of Type II events.The column on the right is from data. . . . . . . . . . . . . . . . . 209
xxx
4.142 The ∆φ0 between the e+e− pair. Now we accept events with ∆φ0greater than 0.12. These were previously rejected as likely to beconversion-type events. The column on the left is from signalMC of Type I events. The column at the center is from MC ofType II events. The column on the right is from data. . . . . . . . 210
A.1 mD+s , KS K+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 217A.2 mD+s , KS K+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 217A.3 mBC , KS K+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 218A.4 mBC , KS K+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 218A.5 δm, KS K+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 219A.6 δm, KS K+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 219A.7 ∆d0, KS K+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 220A.8 ∆d0, KS K+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 220A.9 ∆φ0, KS K+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 221A.10 ∆φ0, KS K+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 221A.11 mD+s , ηπ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 223A.12 mD+s , ηπ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 223A.13 mBC , ηπ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 224A.14 mBC , ηπ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 224A.15 δm, ηπ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 225A.16 δm, ηπ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 225A.17 ∆d0, ηπ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 226A.18 ∆d0, ηπ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 226A.19 ∆φ0, ηπ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 227A.20 ∆φ0, ηπ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 227A.21 mD+s , η′π+; η′ → π+π−η, pion-fit . . . . . . . . . . . . . . . . . . . . . 229A.22 mD+s , η′π+; η′ → π+π−η, e-fit . . . . . . . . . . . . . . . . . . . . . . . 229A.23 mBC , η′π+; η′ → π+π−η, pion-fit . . . . . . . . . . . . . . . . . . . . . 230A.24 mBC , η′π+; η′ → π+π−η, e-fit . . . . . . . . . . . . . . . . . . . . . . . 230A.25 δm, η′π+; η′ → π+π−η, pion-fit . . . . . . . . . . . . . . . . . . . . . 231A.26 δm, η′π+; η′ → π+π−η, e-fit . . . . . . . . . . . . . . . . . . . . . . . . 231A.27 ∆d0, η′π+; η′ → π+π−η, pion-fit . . . . . . . . . . . . . . . . . . . . . 232A.28 ∆d0, η′π+; η′ → π+π−η, e-fit . . . . . . . . . . . . . . . . . . . . . . . 232A.29 ∆φ0, η′π+; η′ → π+π−η, pion-fit . . . . . . . . . . . . . . . . . . . . . 233A.30 ∆φ0, η′π+; η′ → π+π−η, e-fit . . . . . . . . . . . . . . . . . . . . . . . 233A.31 mD+s , K+K−π+π0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . 235A.32 mD+s , K+K−π+π0, electron-fit . . . . . . . . . . . . . . . . . . . . . . 235A.33 mBC , K+K−π+π0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . 236A.34 mBC , K+K−π+π0, electron-fit . . . . . . . . . . . . . . . . . . . . . . 236A.35 δm, K+K−π+π0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . 237A.36 δm, K+K−π+π0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . 237A.37 ∆d0, K+K−π+π0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . 238A.38 ∆d0, K+K−π+π0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . 238
xxxi
A.39 ∆φ0, K+K−π+π0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . 239A.40 ∆φ0, K+K−π+π0, electron-fit . . . . . . . . . . . . . . . . . . . . . . 239A.41 mD+s , π+π−π+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 241A.42 mD+s , π+π−π+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 241A.43 mBC , π+π−π+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 242A.44 mBC , π+π−π+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 242A.45 δm, π+π−π+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 243A.46 δm, π+π−π+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 243A.47 ∆d0, π+π−π+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 244A.48 ∆d0, π+π−π+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 244A.49 ∆φ0, π+π−π+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 245A.50 ∆φ0, π+π−π+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 245A.51 mD+s , K∗+K∗0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 247A.52 mD+s , K∗+K∗0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 247A.53 mBC , K∗+K∗0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 248A.54 mBC , K∗+K∗0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 248A.55 δm, K∗+K∗0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 249A.56 δm, K∗+K∗0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . 249A.57 ∆d0, K∗+K∗0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 250A.58 ∆d0, K∗+K∗0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 250A.59 ∆φ0, K∗+K∗0, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 251A.60 ∆φ0, K∗+K∗0, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . 251A.61 mD+s , ηρ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 253A.62 mD+s , ηρ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 253A.63 mBC , ηρ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 254A.64 mBC , ηρ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 254A.65 δm, ηρ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 255A.66 δm, ηρ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . 255A.67 ∆d0, ηρ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 256A.68 ∆d0, ηρ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 256A.69 ∆φ0, ηρ+, pion-fit . . . . . . . . . . . . . . . . . . . . . . . . . . . . 257A.70 ∆φ0, ηρ+, electron-fit . . . . . . . . . . . . . . . . . . . . . . . . . . 257A.71 mD+s , η′π+; η′ → ρ0γ, pion-fit . . . . . . . . . . . . . . . . . . . . . . 259A.72 mD+s , η′π+; η′ → ρ0γ, e-fit . . . . . . . . . . . . . . . . . . . . . . . . 259A.73 mBC , η′π+; η′ → ρ0γ, pion-fit . . . . . . . . . . . . . . . . . . . . . . 260A.74 mBC , η′π+; η′ → ρ0γ, e-fit . . . . . . . . . . . . . . . . . . . . . . . . 260A.75 δm, η′π+; η′ → ρ0γ, pion-fit . . . . . . . . . . . . . . . . . . . . . . . 261A.76 δm, η′π+; η′ → ρ0γ, e-fit . . . . . . . . . . . . . . . . . . . . . . . . . 261A.77 ∆d0, η′π+; η′ → ρ0γ, pion-fit . . . . . . . . . . . . . . . . . . . . . . 262A.78 ∆d0, η′π+; η′ → ρ0γ, e-fit . . . . . . . . . . . . . . . . . . . . . . . . . 262A.79 ∆φ0, η′π+; η′ → ρ0γ, pion-fit . . . . . . . . . . . . . . . . . . . . . . 263A.80 ∆φ0, η′π+; η′ → ρ0γ, e-fit . . . . . . . . . . . . . . . . . . . . . . . . 263
xxxii
CHAPTER 1
INTRODUCTION
1
What is the world made of?
What holds it together?
The tale of human civilization is a testament to the gullibility of a pattern
seeking social species, challenged perhaps only by its insatiable curiosity. Con-
temporary particle physics represents the culmination and cutting-edge of our
most organized and ambitious attempt at answering some of our biggest ques-
tions, becoming at once a signature of and remedy to this curiosity. Recorded
history is littered with attempts at coming to an understanding of what the
world is made of, from the ancient patterns of classification of the world into
fundamental elements to the atomic hypotheses of the Ionian Greeks and the
Vaisheshika and Jain schools of India in the 5th century BC. However, it is dif-
ficult to associate the thrust of empiricism and the scientific method with any
atomic understanding of the fundamental constituents of matter prior to the
works of John Dalton between 1800 and 1805, which in turn paved the way for
the periodic table of elements. The patterns in the properties of the elements
compiled by Dmitri Mendeleev in the late 1860s was a powerful suggestion of
sub-atomic structure. Thereafter, a series of experiments and insights lead not
only to our archetypical image of the atom with a nucleus at the center and elec-
trons in orbit, but also to some understanding of the nature of the electron and
the nucleus itself.
A similar train of events occurred in the 1960s. A menagerie of new and
short-lived particles were discovered by experiments on cosmic rays and with
particle accelerators designed to probe the sub-nuclear structure of matter. The
first sense of order emerged with the realization that there are two distinct types
of matter. There are particles like the electron that do not experience the strong
2
nuclear force; they were named leptons from the Greek for lightweight. There
exist 6 of them and they appear to be truly fundamental. Then there are hadrons
(Greek for bulky) that do feel the strong nuclear force, and we have discov-
ered well over 200 of them. Hadrons may be usefully divided into baryons and
mesons. Baryons are particles of spin 1/2 that are unstable and decay, ultimately
returning to a proton. Mesons are particles with integer spin that ultimately
decay to electrons, photons and neutrinos. This proliferation of hadrons even-
tually gave hint of an underlying pattern called the Eightfold Way. Identification
of such patterns lead to the proposal that hadrons are not fundamental but are
composed of at least three varieties of quarks; the up (u), the down (d) and the
strange (s).
This served to explain most thus far observed hadronic phenomena except
for a few, among which was the observed rate of K0L → µ+µ− that was lower
than expected. Introducing a fourth quark, the charm c, within the Glashow-
Iliopoulos-Maiani (GIM) mechanism produced the required interference with
the u being exchanged between the d and s quarks of the K0L meson to lower the
theoretical rate [13]. The mass of the charm quark required to lower this theoret-
ical rate to the observed value was calculated to be in the range of a few GeVs.
Bound states of the charm quark were subsequently discovered, the almost si-
multaneous discovery of the J/ψ (cc) meson at SLAC and BNL in November
1974 being among the most prominent. This was followed by discoveries of the
D0(cu) and the D+(cd). The D+s (cs) bound state was discovered at CLEO in 1983
[8].
A D+s meson is the 0− (L=0, S =0) bound state of a charm and strange quark
system, while a D∗+s is the 1− (L=0, S =1) excited state of the same. While the
3
Table 1.1: Branching fractions of the known decays of the D∗+s .
Mode Branching Fraction
B(D∗+s → D+s γ) (94.2 ± 0.7)%
B(D∗+s → D+s π0) (5.8 ± 0.7)%
D+s decays via the weak interaction into a rich spectrum of particles, the D∗+s is
known to decay via an electromagnetic and an isospin-suppressed strong decay
as recorded by the Review of Particle Physics 2008 [4] and listed in Table 1.1.
It is important to note that the branching fractions listed in the table are
derived from the ratio
Γ(D∗+s → D+s π0)Γ(D∗+s → D+s γ) = 0.062 ± 0.008
assuming that the branching fractions of D∗+s → D+s γ and D∗+s → D+s π0 decays
sum to 100% [5].
In this dissertation, we propose a new electromagnetic decay of the D∗+s , the
D∗+s → D+s e+e−, and search for it using data collected by the CLEO-c detector.
Since this decay does not violate any rigorous or semi-rigorous conservation
principle, it is expected to occur at the rate of D∗+s → D+s γ suppressed by ap-
proximately a factor of the electromagnetic structure constant, α. Such decays
where a virtual photon is internally converted to a e+e− pair are known in high
energy physics as Dalitz decays [11]. Dalitz decays have not been observed in
the electromagnetic decays of mesons containing the heavy charm or bottom
quark. This dissertation documents the first observation of such a decay.
A theoretical derivation of the ratio of branching fractions
B(D∗+s → D+s e+e−)B(D∗+s → D+s γ) (1.1)
4
is presented in Chapter 2. Chapter 3 presents a description of the components
of the CLEO-c detector relevant for following the analysis technique outlined
in Chapter 4 towards making an observation of the D∗+s → D+s e+e− decay and
measuring the ratio of branching fractions in Eq. 1.1. An observation of this
decay and a measurement of the ratio of branching fractions would lead to a
re-evaluation of the fractions listed in Table 1.1.
5
CHAPTER 2
A THEORETICAL PREDICTION FOR THE RATIO OF BRANCHING
FRACTIONS B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ)
6
The electromagnetic decay D∗+s → D+s γ supercedes the strong decay D∗+s →
D+s π0 in rate because the latter is suppressed by isospin violation of the strong
interaction. The currently known branching fractions of the D∗+s are listed in Ta-
ble 1.1 of the Introduction. In this section, we propose the existence of a hitherto
unobserved electromagnetic decay, the D∗+s → D+s e+e−. It is separated from the
D∗+s → D+s γ process by one vertex of the electromagnetic interaction, as can be
seen by comparing Fig. 2.1 and 2.2, and does not violate any known symmetry.
In this section, we estimate the ratio of branching fractions B(D∗+s →
D+s e+e−)/B(D∗+s → D+s γ) through a prediction of the ratio of rates for the D∗+s →
D+s e+e− and D∗+s → D+s γ processes.
B(D∗+s → D+s e+e−)B(D∗+s → D+s γ) =
Γ(D∗+s → D+s e+e−)Γ(D∗+s → D+s γ) (2.1)
With reference to Fig. 2.1, the quantum mechanical amplitude for the D∗+s →
D+s γ decay may be written schematically as
M(D∗+s → D+s γ) = εµD∗sε∗νγ Tµν(P, k), (2.2)
where εµD∗s is the polarization vector of the decaying D∗+s meson with three de-
grees of freedom indexed by µ, ε∗νγ is the polarization vector of the photon with
two degrees of freedom indexed by ν, P is the four-momentum of the D∗+s , k is
the four-momentum of the photon and Tµν(P, k) encodes the coupling between
the meson and the photon.
Tµν(P, k) may be expressed, most generally, in the form:
Tµν(P, k) = Agµν + BkµPν + CεµναβPαkβ. (2.3)
The D∗+s meson has JP= 1−, the D+s has JP
= 0− and the emitted γ has spin
7
s = 1 with intrinsic odd parity. The angular momentum of the D+s γ state, L,
could be 0, 1 or 2 depending on the projection of the spin of the photon on the
Jz of the D∗+s . If sz = Jz, then L = 0. If sz = 0 then L = 1, Lz = Jz. And if sz = −Jz,
then L = 2, Lz = 2Jz. However, in order to conserve the odd parity of the initial
state, given P = −1 for both the D+s and the γ, L must be equal to 1. This narrows
down the kind of terms that may constitute Tµν(P, k) to
Tµν(P, k) = CεµναβPαkβ, (2.4)
where α and β keep track of the four-momentum components of the D∗+s and
photon respectively. We consider C to be a constant as the range of k2 is small
compared to the ρ mass.
In order to model the D∗+s → D+s e+e− process, we change the final state photon
to a virtual photon and couple it to a e+e− pair as depicted in Fig. 2.2. We may
then write the invariant amplitude as
M(D∗+s → D+s e+e−) = εµD∗s Tµν(P, k)−igναk2 〈u(p)|ieγα|v(p′)〉, (2.5)
where u(p) and v(p′) are the spinors of the electron and positron respectively as
functions of their four-momenta, k is the four-momentum of the virtual photon
and gνα is the metric tensor of flat spacetime.
2.1 Rate for D∗+s → D+s γ
D∗+s
D+s
γ
ie
Figure 2.1: A Feynman diagram for the D∗+s → D+s γ process.
8
We now proceed to express the rate for D∗+s → D+s γ in terms of the normal-
ization constant C used to express Tµν(P, k) in Eq. 2.4 and other constants in this
process such as the masses of the D∗+s and D+s which we denote by mD∗+s and mD+s
respectively.
Inserting the expression for the coupling in Eq. 2.4 into the expression for
the invariant amplitude in Eq. 2.2, we may write
M = εµD∗sε∗νγ CεµναβPαkβ. (2.6)
This may be squared to get
|M2| = |C2|εµD∗sε∗νγ εµναβPαkβε∗µ
′
D∗sεν′
γ εµ′ν′α′β′Pα′kβ′ , (2.7)
where µ′, ν′, α′ and β′ are indices of four momentum distinguished from their
un-primed cousins.
We now sum over final state polarizations and average over initial state po-
larizations, recalling for photons that
∑
λ=1,2ε∗νγλε
ν′
γλ= −gνν′ , (2.8)
and for massive vector bosons that
13
∑
λ=1,3ε∗νD∗sλε
ν′
D∗sλ =13
−gνν′ + PµPµ′
m2D∗s
. (2.9)
Thus, we get
|M2| = |C2|
3 gνν′
gµµ′ − PµPµ′
m2D∗s
εµναβPαkβεµ′ν′α′β′Pα′kβ′ (2.10)
which may be simplified to
|M2| = 2|C2|3 (P · k)2
=2|C2|
3 m2D∗s E
2γ (2.11)
9
where we have used the tensorial relationship εµν
αβεµνα′β′ = −2gαα′gββ′ + 2gαβ′gα′β′
and Eγ is the energy component of the photon in the rest frame of the D∗+s .
For a two-body decay, we may write the differential decay rate as
dΓ = 132π2 |M2|
Eγ
m2D∗s
dΩ (2.12)
where dΩ is the differential element of the solid angle subtended from the point
of decay of the D∗+s in its rest frame. Since the invariant amplitude in the simpli-
fied expression of Eq. 2.11 does not have any angular dependence, our expres-
sion for the rate of D∗+s → D+s γ simplifies to
Γ =|C2|12π
E3γ. (2.13)
2.2 Rate for D∗+s → D+s e+e−
γD∗+s
D+s
e+e−
Figure 2.2: A Feynman diagram for the D∗+s → D+s e+e− process.
The rate for the D∗+s → D+s e+e− is a bit more involved as it is a three-body
decay. The amplitude for this process may be expressed by what we had for
D∗+s → D+s e+e− except now with the photon coupled to a e+e− pair. We express it
as presented in Eq. 2.14.
M(D∗+s → D+s e+e−) = εµD∗sCεµναβPαkβ−igνρ
k2 u(p)ieγρv(p′). (2.14)
10
We square this to get:
|M2| = |C2|εµD∗sε∗µ′D∗s εµναβP
αkβεµ′ν′α′β′Pα′kβ′ gνρgν′ρ′
k4 u(p)eγρv(p′)v(p′)eγρ′u(p). (2.15)
Summing over final state spins of the e+e− and averaging over initial state
polarizations of the D∗+s , we may write
|M2| = −4e2|C2|3k4 ε
µ
ναβεµν′α′β′PαkβPα′kβ′
[
pνp′ν′ + p′νpν′ − gνν′(p · p′ + m2)]
(2.16)
which may then be expressed succinctly as
|M2| = 4e2|C2|3k4
[
k2(P · k)2+ 2X2 − m2
D∗s k4]
, (2.17)
where
Xµ ≡ εµναβ
Pαp′βpν
Using the following contraction of the Levi Civita tensor,
εµαβγεµα′β′γ′ = −gαα′gβ
β′gγ
γ′ − gαβ′gβ
γ′gγ
α′ − gαγ′gβ
α′gγ
β′ (2.18)
+gαα′gβ
γ′gγ
β′ + gαγ′gβ
β′gγ
α′ + gαβ′gβ
α′gγ
γ′ ,
X2 evaluates to
X2= −k2(P · p′)(P · p) + m2
D∗s
(
k4
4 − k2m2)
+m2
4(
m2D∗s − m2
Ds+ k2
)2, (2.19)
where m represents the mass of the electron, mDs the mass of the D+s meson and
mD∗s the mass of the D∗+s . The physical relationships
p · p′ = k2
2− m2 (2.20)
and
P · k =(m2
D∗s − m2Ds+ k2)
2. (2.21)
have also been used to obtain the aforementioned expression for X2.
11
Now, P·p′ and P·p may be expressed in a more convenient form for the phase
space integral by boosting our inertial frame of reference to the rest frame of the
center of mass of the e+e−. Quantities marked by an asterix (∗) in the following
equations are those evaluated in the e+e− center of mass frame. We define θ∗
to be the angle that the electron makes with the direction of the D+s in the e+e−
center of mass frame. Thus, we may write:
P · p = P∗ · p∗ = E∗D∗s E∗e − |P∗D∗s ||p
∗e | cos θ∗, (2.22)
P · p′ = P∗ · p′∗ = E∗D∗s E∗e + |P∗D∗s ||p
∗e | cos θ∗. (2.23)
The energies of the D+s and e− in the center of mass frame of the e+e− may
be expressed simply by recognizing that in this frame, kµ =(√
k2, 0, 0, 0)
. Thus,
they are
E∗D∗s =P · k√
k2(2.24)
E∗e =p · k√
k2. (2.25)
Using this and
p · k = k2
2, (2.26)
we may rewrite Eq. 2.22 and 2.23 as follows.
P · p =P · k
2 +
√
(P · k)2
k2 − m2D∗s
√
k2
4 − m2 cos θ∗ (2.27)
P · p′ = P · k2−
√
(P · k)2
k2 − m2D∗s
√
k2
4− m2 cos θ∗. (2.28)
and thus arrive at the expression for (P · p)(P · p′):
(P · p)(P · p′) = (P · k)2
4 −(
(P · k)2
k2 − m2D∗s
) (
k2
4 − m2)
cos2 θ∗. (2.29)
We may insert this into the expression for X in Eq. 2.19 to obtain:
X2= −k2 (P · k)2
4 +
(
(P · k)2 − k2m2D∗s
)
(
k2
4 − m2)
cos2 θ∗ + m2D∗s
(
k4
4 − k2m2)
(2.30)
12
+m2
4(
m2D∗s − m2
Ds+ k2
)2.
This may be inserted into the expression for the invariant amplitude |M|2
obtained in Eq. 2.16 to give us
|M2| = 4e2|C2|3k4
[
A2k2
8 − m2D∗s
(
k4
2 + 2k2m2)
+m2
2 A2+
(
A2
4 − k2m2D∗s
) (
k2
2 − 2m2)
cos2 θ∗]
,
(2.31)
which can be simplified to
|M2| = 4e2|C2|3k4
[
A2
4− k2m2
D∗s
k2
2(
1 + cos2 θ∗)
+ 2m2(
1 − cos2 θ∗)
]
(2.32)
where we define
A ≡ m2D∗s − m2
Ds+ k2. (2.33)
Having thus obtained the averaged invariant amplitude for our process, we
must now set up the integral over the available phase space. This being a three-
body decay, we may write the decay rate in terms of the |M|2 thus:
dΓ = 1(2π)3
116m2
D∗s
|M2|dEedk2. (2.34)
where dEe is evaluated in the rest frame of the D∗s.
Now we need to express the differential of the energy of the electron, dEe, in
terms of d(cos θ∗). Using the relationship expressed in Eq. 2.22 and recognizing
that P · p = mD∗s Ee− in the rest frame of the D∗s, we may write
Ee =P · pmD∗s
=
E∗D∗s E∗e
mD∗s−|P∗D∗s ||p
∗e |
mD∗scos θ∗. (2.35)
We note that the quantities E∗D∗s , E∗e , |P∗D∗s |, and |p∗e | depend only on k2 and not on
cos θ∗. Therefore, we can differentiate the above expression to obtain
dEe = −|P∗D∗s ||p
∗e |
mD∗sd(cos θ∗). (2.36)
13
In the center of mass frame of the e+e−, P ·k = E∗D∗s k∗0. Therefore, we may write
E∗D∗s =P · kk∗0=
P · k2E∗e
. (2.37)
Using this expression for the energy of the D∗s in the center of mass frame of the
e+e−, we may write its momentum thus:
|P∗D∗s | =√
E∗2D∗s − m2D∗s =
√
(P · k)2
4E∗2e− m2
D∗s . (2.38)
Thus we may simplify the Jacobian of the differential,|P∗D∗s ||p
∗e |
mD∗s=
|P∗D∗s |E∗e
mD∗s
√
1 − 4m2
k2 (2.39)
=
√
(P · k)2
4m2D∗s
− E∗2e
√
1 − 4m2
k2 (2.40)
=12
√
k20 − k2
√
1 − 4m2
k2 (2.41)
=|PDs |
2
√
1 − 4m2
k2 (2.42)
Using this in Eq. 2.36, we arrive at a simple expression for dEe:
dEe =|PDs |
2
√
1 − 4m2
k2 d(cos θ∗). (2.43)
Now we substitute our expression for |M|2 in Eq. 2.32 and dEe in Eq. 2.43
into Eq. 2.34 and integrate over d(cos θ∗) from -1 to +1 to obtain the differential
rate of decay
dΓdk2 =
|PDs |α|C2|144π2m2
D∗s k4
(
A2 − 4k2m2D∗s
) (
k2+ 2m2
)
√
1 − 4m2
k2 (2.44)
where A is defined in Eq. 2.33. α is the fine structure constant.
We integrate this numerically with k2 ranging from 4m2 to(
mD∗+s − mD+s
)2to
obtain our prediction for the ratio of branching fractions:
Γ(D∗+s → D+s e+e−)Γ(D∗+s → D+s γ) =
B(D∗+s → D+s e+e−)B(D∗+s → D+s γ) = 0.89α = 0.65%. (2.45)
14
The following chapters deal with an experimental observation of the D∗+s →
D+s e+e− process and a measurement of this ratio at the CLEO-c experiment.
15
CHAPTER 3
THE CLEO-C DETECTOR
16
Solenoid Coil Barrel Calorimeter
Drift ChamberInner Drift Chamber /
Beampipe
EndcapCalorimeter
IronPolepiece
Barrel MuonChambers
MagnetIron
Rare EarthQuadrupole
SC Quadrupoles
SC QuadrupolePylon
2230104-002
CLEO-c
Ring Imaging CherenkovDetector
Figure 3.1: Cutaway schematic of the CLEO-c detector.
CLEO-c was the last upgrade to CLEO, a general purpose particle detec-
tor for high energy physics used to collect data on electron-positron collisions
at the Cornell Electron Storage Ring (CESR) facility. The name CLEO is not
an acronym and was derived from Cleopatra, to go with CESR which is pro-
nounced as Caesar. The iteration of the collider used for studying the charm
quark was called CESR-c. Counter-rotating beams of positrons and electrons in
CESR-c were made to collide at the center of the CLEO-c detector with center of
mass energies between 3 and 5 GeV that are required for studies of the charm
quark. The nearly hermetic CLEO-c detector with several layers of subdetectors
tracked and measured the energy and momenta of particles produced at these
collisions.
17
CsIElectromagnetic
Calorimeter(End Cap)
CsI Electromagnetic
Calorimeter
Drift ChamberOuter Endplate
Drift Chamber EndplateSmall Radius Section
Drift ChamberInner Skin
cos = 0.93
Interaction Point
CESR
2230204-003
ZD Inner DriftChamber
Ring Imaging CherenkovDetector
Figure 3.2: Quarter-view schematic of the CLEO-c detector.
A cutaway schematic of the CLEO-c detector is presented in Fig. 3.1. The
sub-detectors closest to the interaction point were the inner drift chamber and
the main drift chamber which were used together to reconstruct the 3 dimen-
sional trajectories of charged particles. A solenoidal magnetic field of 1 T in the
direction of the beampipe curved these trajectories and enabled us to deduce
the momenta and charges of these particles. Outside the drift chamber lay the
Ring Imaging Cerenkov (RICH) subdetector dedicated to particle identification.
It used the Cerenkov radiation left in the wake of a charged particle traveling
through a medium of high refractive index (LiF) to measure the velocity of the
particle. This velocity combined with the momentum measured by the drift
chambers allowed us to determine the mass, and hence the identity of the par-
ticle. Surrounding the RICH was the electromagnetic calorimeter made out of
18
CsI crystals arranged in the central barrel region and endcap regions flanking
the drift chamber. It measured the energy of electromagnetic showers, thus al-
lowing the reconstruction of photons and the identification of electrons. The
superconducting solenoid used to maintain the 1 T magnetic field was located
external to these subdetectors. All of this was encased in iron yokes to return
the magnetic field, also known as the magnet iron. Interlaced within the magnet
iron lay the muon drift chambers.
The following sections describe the sub-detectors that were used in the anal-
ysis presented in this dissertation.
19
Figure 3.3: The inner drift chamber.
back FRONT
a track pointing toward the FRONT of the detectorwire projection
z
stereo angles
exaggerated
stere
o wire
s tilted counter−clockwise
stere
o wire
s tilted clockwise
axial wire
s (untilted)
FRONT
view
Figure 3.4: Stereo angles in the outer drift chamber.
20
3.1 The Tracking System
The CLEO-c tracking system consisted of two cylindrical, concentric drift cham-
bers – an inner drift chamber between the radii of 5.3 cm and 10.5 cm, and an
outer drift chamber between 12 cm and 82 cm. Longitudinally, they extended
to cover the region in polar angle | cos θ| < 0.93 subtended from the interaction
point as depicted in Fig. 3.2. A 3:2 mixture of He and C3H8 gas, chosen for
its long radiation length, filled the volume of the detector. Tens of thousands
of wires were strung along the length of the sub-detector as shown in Fig. 3.2,
arranged in 6 layers within the inner chamber and 47 layers in the outer cham-
ber. Sense wires were maintained at a 2,000 V positive electric potential relative
to the field wires which were grounded. The sense wires were 20 µm in diam-
eter made of gold-plated tungsten. The field wires were 130 µm in diameter
and made of gold-plated aluminum. The minimum distance between sense and
field wires were 5 mm for the inner chamber and 7 mm for the outer chamber.
A detailed physical description of the tracking system may be found in Sections
2.1.1 and 2.2.2 of the Yellow Book [9].
An energetic charged particle traversing the chamber would ionize a track of
gas and electrons liberated thus would be accelerated towards the sense wires.
In the vicinity of the sense wires, the electrons would be energetic enough to
induce local ionization in the gas, thereby releasing more electrons and ampli-
fying the total charge deposited on the wires. The precise time of each such
deposition event and the total charge collected would be recorded by the appa-
ratus.
The temporal information was used to measure the distance of closest ap-
21
proach of the energetic particle to each sense wire. This could be done because
the exact time of the electron-positron collisions at the center of CLEO-c was
well known from the CESR-c machine and the drift velocities of the liberated
electrons well understood. The distances of closest approach from multiple
sense wires were fitted with a minimum χ2-fit as well as Kalman-fits encod-
ing physical models of various particles in a 1 T magnetic field to reconstruct
the particle’s 3-dimensional trajectory through the sub-detector. The curvature
of the fitted track in the magnetic field allowed us to measure the momentum of
the charged particle. This procedure is especially relevant for our analysis be-
cause we rely on an accurate reconstruction of electron-positron pairs that test
the low-energy limits of this procedure. CLEO-c had decided not to store tracks
reconstructed using the physical model of electrons, under the assumption that
electron tracks reconstructed using the physical model of charged pions would
do fine for most analyses and the fact that doing so would save some disk-space.
As described in our analysis, the accuracy of pion-fitted tracks did not suffice
and a campaign to reconstruct tracks to the physical model of electrons had to
be undertaken.
The charge collected by the sense wire at each deposition event corresponds
to the energy lost by the charged particle in ionizing a segment of the track, the
dE/dx. We know from the Bethe-Bloch equation that this dE/dx varies with the
mass and momentum of the incident particle. Thus, informed with the track’s
momentum and dE/dx we may deduce the particle’s mass and hence its identity.
If the wires of the drift chamber were all aligned strictly parallel to the beam-
axis, only dimensions of the track perpendicular to this axis, i.e. the azimuthal
and radial directions, could be reconstructed. To enable reconstruction of the
22
longitudinal dimension, all 6 layers of sense wires in the inner drift chamber
and 16 out of the 47 layers in the outer drift chamber were oriented at a small
“stereo” angle to the beam-axis. The 16 layers were divided into groups of 4
and alternated in stereo angle. The timing pattern from such wires staggered
in stereo angle allowed us to determine the longitudinal parameters of tracks.
This afforded the tracker a spatial resolution of 85 µm for 2.5 GeV tracks in
the dimensions perpendicular to the beam-axis and 5-7 mm in the dimension
parallel.
23
3.2 The Calorimeter
The CLEO-c calorimeter, located outside the drift chambers and the RICH, was
divided into a barrel section and two encap sections together covering 95%
of the solid angle subtended from the interaction point. Thallium-doped ce-
sium iodide crystals were used for showering and scintillation material in this
calorimeter. CsI (Tl) crystals have a density of 4, 510 kg/m3, a radiation length χ0
of 1.83 cm and a Moliere radius of 3.8 cm, and this provided excellent shower-
ing material for the experiment. Each crystal was 30 cm (16.4 radiation lengths)
long in the direction away from interaction point with a 5 cm × 5 cm face point-
ing inwards. Four photodiodes mounted at the back of each crystal measured
the scintillation light.
The barrel consisted of an array of 6,144 CsI crystals, 128 along the azimuthal
direction and 48 along the longitudinal. The crystals were tilted to point a few
centimeters away from the interaction point so as to minimize the loss of par-
ticles in the cracks between crystals. The barrel calorimeter extended from a
radius of 1.02 m to 1.32 m, and was 3.26 m long at the inner radius. This covers
the region in polar angle | cos θ| < 0.85.
The two endcaps consisted of 820 crystals each, aligned parallel to the beam-
pipe. The front faces of each endcap lay 1.308 m along the beam-line from the
interaction point, and the back faces extended to 1.748 m. Each endcap extended
from 43.3 cm to 95.8 cm in radius. Together, they covered the region in polar
angle 0.83 < | cos θ| < 0.95.
The energy of a typical electromagnetic shower produced by a photon, as
used in our analysis, is spread over multiple adjacent crystals. Interpolating the
24
“center-of-mass” of this energy deposit offers us a much better resolution for
the shower position and hence the direction of the photon than could be naively
expected from the 5 cm face width of an individual crystal. A small fraction of
crystals are known to be noisy and their contributions have been ignored in this
analysis. The pattern of energy deposits in the crystals was used to distinguish
between showers from electrons, hadrons and photons.
25
CHAPTER 4
ANALYSIS METHOD TO SEARCH FOR THE D∗+s → D+s e+e− AND
MEASURE THE RATIO OF BRANCHING FRACTIONS
B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ)
26
As described in the Introduction, this chapter documents a search for and
observation of the decay D∗+s → D+s e+e− along with a measurement of the ratio
of branching fractionsB(D∗+s → D+s e+e−)
B(D∗+s → D+s γ)
at the CLEO-c experiment. We choose to measure and present this ratio of
branching fractions instead of an absolute branching fraction for the D∗+s →
D+s e+e− in order to minimize systematic uncertainties arising from the recon-
struction and selection of D+s mesons. When we refer to the positively charged
D∗+s or the D+s in this document, we imply the negatively charged particle or the
charge-conjugate process unless otherwise specified. This search and measure-
ment was conducted in 586 pb−1 of e+e− collision data collected by the CLEO-c
experiment at a center of mass energy of 4,170 MeV. At this energy, the total
charm cross section is known to be ' 9 nb, of which about 10% produces D±s D∗∓s
events. More accurately, the cross section for producing D±s D∗∓s at this energy
has been experimentally measured in two papers, [10] and [3], that we average
to quote 948 ± 36 pb. How we arrive at this number is covered in more detail in
Section 4.4 where we discuss the datasets used. Using the quoted values of inte-
grated luminosity and production cross section we conclude that approximately
556 thousand events were at our disposal for this analysis.
In our search and measurement we employ a blind-analysis technique to
search for our signal process, the D∗+s → D+s e+e−, where we reconstruct the D∗+s
through the D+s on the same side as the D∗+s and the soft e+e− pair. The D+s is
reconstructed exclusively through the nine hadronic decay channels outlined
in Eqs. 4.1 - 4.9. Selection criteria are optimized, their efficiencies noted and
the background levels estimated from data outside the signal region before we
proceed to unblind data within the signal region.
27
+e -e
-sD
*+sD
+sD
-e
+e
Figure 4.1: A schematic showing a e+e− collision producing a D∗+s D−s pairwhere the D∗+s decays to a D+s and a e+e− via the decay we aresearching for in this dissertation.
D+s → K+K−π+ (4.1)
D+s → KS K+ (4.2)
D+s → ηπ+; η→ γγ (4.3)
D+s → η′π+; η′ → π+π−η; η→ γγ (4.4)
D+s → K+K−π+π0 (4.5)
D+s → K∗+K∗0; K∗+ → K0S π+,K∗0 → K−π+ (4.6)
D+s → π+π−π+ (4.7)
D+s → ηρ+; η→ γγ; ρ+ → π+π0 (4.8)
D+s → η′π+; η′ → ρ0γ (4.9)
Selection criteria on the reconstructed D∗+s , D+s and soft e+e− candidates are
designed to reject background events described in Section 4.1. These selection
28
criteria are described in Section 4.2. Of note are the criteria on the helix pa-
rameters of the soft e+e− tracks that are used to discriminate our signal against
backgrounds that come from D∗+s → D+s γ where the γ converted to an e+e− pair
in material. These selection criteria are optimized for each of the nine hadronic
decay modes of the D+s using Monte Carlo simulations of the signal and back-
grounds as described in Section 4.7.
The e+e− pair from the D∗+s decay share ∼ 144 MeV of energy and are hence
anticipated to be very soft. The Kalman-filter based track fitter used in CLEO-c
did not, by default, store track fits with the electron mass hypothesis, storing
tracks fitted to the charged pion mass hypothesis instead. Section 4.7 that doc-
uments our effort to converge on optimal sets of parameters for our selection
criteria also documents our realization that tracks fitted to the electron mass
hypothesis offers us considerably higher signal significances for observing the
D∗+s → D+s e+e− than tracks fitted to the pion mass hypothesis. Therefore, a cam-
paign to reprocess several datasets to include track fits with the electron mass
hypothesis was launched and this is described in Section 4.5. Henceforth, the
analysis focuses on data with electron tracks fitted to the electron mass hypoth-
esis in searching for the D∗+s → D+s e+e−.
Having narrowed down on a signal region for each of the hadronic decay
modes of the D+s in the course of our optimization procedure, we estimate the
expected number of background events within this region for each mode by ex-
trapolating Monte Carlo simulation and data points from the sideband regions.
This is described in Section 4.9. Before we unblind data within the signal re-
gions, we establish that our predicted signal and estimated background levels
are adequate to obtain maximal signal significance if we are to unblind data in
29
all the modes.
Thereafter, we measure the efficiencies of our selection criteria for D∗+s →
D+s e+e− reconstruction in each of the hadronic decay channels in Section 4.8. We
could at this point proceed to unblind data and use the number of observed
events in conjunction with the selection efficiencies to present a measurement
for the absolute branching fraction of D∗+s → D+s e+e−. Such a measurement, how-
ever, would have large unquantified systematic errors from the reconstruction
of the D+s and we choose not to present such a measurement.
Using criteria similar to those used to select D∗+s → D+s e+e− events, except
without the track helix criteria for the e+e− and including criteria on the photon
from the D∗+s , we reconstruct D∗+s → D+s γ events where the D+s decays through
the hadronic modes specified in Eq. 4.1 - 4.9. The efficiency of our selection
criteria is noted, as is our signal yield for each of the channels. This is described
in Section 4.10.
We then unblind data in the signal regions of the D∗+s → D+s e+e− reconstruc-
tion in each of the chosen decay modes of the D+s taking into account the back-
ground for each mode estimated in Section 4.9. Using the numbers of observed
signal events, the efficiencies for our selection criteria and the signal yields and
efficiencies for the D∗+s → D+s γ reconstruction, we proceed to compute the ratio
of branching fractions we set out to measure. This is described in Section 4.11
of the document. Also motivated in this section is the requirement for quanti-
fying systematic uncertainties in the selection efficiencies that stem from devi-
ations between data and Monte Carlo in the reconstruction of soft e+e− pairs in
D∗+s → D+s e+e− and the photon in D∗+s → D+s γ.
30
The systematic uncertainties associated with the selection and reconstruc-
tion efficiencies of soft e+e− pairs in D∗+s → D+s e+e− and the photon in D∗+s → D+s γ
is measured in Section 4.12. We estimate the systematic deviation between re-
construction efficiencies in Monte Carlo simulation and data by measuring the
ratio of the numbers of events where one of the π0 Dalitz decays to γe+e− to the
number of events where both π0 decay to γγ and comparing this to the ratio ex-
pected from currently accepted branching fractions for π0 → γe+e− and π0 → γγ.
This uncertainty is propagated into the ratio of branching fractions reported in
Section 4.11.
4.1 Backgrounds for D∗+s → D+s e+e−
A significant background to the observation of this decay is expected from
D∗+s → D+s γ events where the γ converts in the material of the apparatus or
the beam-pipe to form an e+e− pair. The material of the beam-pipe is known to
have been approximately 1% of a radiation length thick for photons incident on
it closest to the interaction region and higher for photons incident at steeper an-
gles. If we accept the theoretical estimate of the rate of the D∗+s → D+s e+e− process
with respect to the D∗+s → D+s γ as described in Section 2, we conclude that this
conversion process occurred at roughly the same rate as the signal. This back-
ground is called the conversion background in this document. The electrons from
such conversions will have the same range of energies as those from signal pro-
cesses. However, their tracks would appear to originate at a distance away from
the primary interaction point. Selection criteria for selecting and reconstructing
the D∗+s → D+s e+e− are designed to exploit this fact.
31
Another source of background, also seen to be significant from Monte Carlo
simulation studies, arises from π0 mesons that were produced at the primary
interaction point which then decayed through the Dalitz channel: π0 → γe+e−
[11]. Such e+e− pairs would typically have had the same range of energies as
those expected from the signal process and their tracks would seem to have
originated from the primary interaction point. Though the rate of Dalitz decays
of the π0 is ∼ 1.2% [4], the prodigious production of π0 mesons makes this a sig-
nificant background to our rare signal. We recognize that such a combinatorial
background would not peak in the variables of any of our selection criteria and
estimate the frequency of its occurrence from the sidebands of the signal region
in our data. We call this the Dalitz decay background in the rest of the document.
Combinatorial backgrounds necessarily result from combining candidate
daughters of the D+s and candidate e−s and e+s. Such backgrounds are not ex-
pected to be structured in the kinematic variables used to select signal events
and we estimate them from the sidebands around the signal region in our data.
We also account for backgrounds that arise from light quark (u, d, s) produc-
tion at the interaction point. These backgrounds are seen, from Monte Carlo
simulations, to dominate, though not peak, in the π+π−π+ and η′π+; η′ → ρ0γ
decay channels of the D+s after applying our selection criteria. Therefore, we
choose to estimate their contributions from the sidebands of the signal region in
our data. They are collectively called the continuum background in the rest of this
document.
32
4.2 Selection Criteria for Reconstructing D∗+s → D+s e+e−
The entities directly measured by the CLEO-c detector that is relevant for our
analysis are charged tracks and electromagnetic showers. The sub-detectors
used for their detection have been described in Sections 3.1 and 3.2 respectively.
Relatively stable particles like the soft e+ and e− in the final state of our signal
process or the π+, K+ and γ from decays of the D+s could be detected directly
by the detector. Short-lived particles like the D+s and the D∗+s must be recon-
structed by analyzing the signatures of their decays into particles that left tracks
or shower in the detector. As we have mentioned earlier, we choose to recon-
struct the D+s through 9 hadronic final states as listed in Eq. 4.1 - 4.9, and the D∗+sthrough the D+s and the soft e+e− pair.
We construct three kinematic variables from reconstructed D+s and D∗+s candi-
dates based on which we select events most likely to contain our signal. We also
construct two combinations of track parameters of the e+ and e− which gives us
criteria to powerfully reject conversion backgrounds.
4.2.1 Track Quality Requirements for the Soft e+e− Pair
Quality requirements are imposed on the soft e+e− tracks in order to reject poorly
reconstructed tracks and tracks that cannot correspond to our signal process.
These tracks are required to fit hits in the drift chambers with χ2 less than
100,000. The measured energy, which is derived from the momentum, that in
turn is inferred from the curvature of the track’s helix in the 1 T magnetic field, is
required to be between 10 MeV and 150 MeV. The upper limit is set by consider-
33
ing the mass difference between the D∗+s and D+s mesons, which is approximately
144 MeV. A single electron cannot carry more than that amount of energy. Be-
low 10 MeV, electron tracks curl in a way that cannot be well reconstructed by
the drift chamber. Next, we require tracks to pass within 5 cm of the interaction
point in the dimension parallel to the beam-axis and within 5 mm of the beam-
axis in the transverse dimensions. Finally, in order to reject particles that are not
electrons, we require the dE/dx as computed from the track fit to be within 3σ
of that expected for electrons.
These criteria remain identical for all the hadronic decay modes of the D+s as
the e+e− pair is independent of the D+s .
4.2.2 Mass of the D+s Meson, mD+s
The D+s meson is reconstructed using the tight Ds-tagging criteria outlined in the
document “Developments in D(s)-Tagging” [18]. We select events which con-
tain D+s candidates with invariant mass within tens of MeV from 1.969 GeV.
The current world standard for the D+s mass as recorded in the Review of Par-
ticle Physics 2008 is 1.96849 ± 0.00034 GeV [4]. This criterion rejects most false
combinations of D+s daughters. The exact width of this criterion was optimized
individually for each mode.
4.2.3 Beam Constrained Mass of the D∗+s Meson, mBC
The energy of a D∗+s meson produced from the e+e− collisions in CESR may be
determined with higher precision from the measured energy of the beam than
34
from the sum of the energies of its decay constituents as measured by the CLEO-
c detector. It may be calculated from:
ED∗+s (beam) =4s − m2
D+s(RPP) + m2
D∗+s(RPP)
4√
s, (4.10)
where ED∗+s (beam) is the energy of the D∗+s we calculate from the beam energy,
s is the square of the center of mass energy of the beam, and mD+s (RPP) and
mD∗+s (RPP) are the current world standards for the D+s and D∗+s masses respec-
tively as recorded in the Review of Particle Physics 2008 [4].
Having thus calculated the energy of the D∗+s meson, we can now define a
more precise variant of the invariant mass of the D∗+s as follows:
mBC =√
E2D∗+s
(beam) − p2D∗+s
(constituents) (4.11)
where pD∗+s (constituents) is the momentum of the D∗+s calculated from the mo-
menta of the daughters of its decay. mBC is called the beam constrained mass in
CLEO literature.
For this selection criterion, we accept events with candidates having mBC
within tens of MeV from 2.112 GeV. The current world standard for the D∗+smass as recorded in the Review of Particle Physics 2008 is 2.1123 ± 0.0005 GeV
[4]. This criterion is meant to reject most false combinations of D∗+s daughters.
4.2.4 Mass Difference between the D∗+s and the D+s Mesons, δm
We define δm as the mass difference between the reconstructed D∗+s and D+smesons.
δm = mD∗+s − mD+s (4.12)
35
This mass difference is known to be 143.8 MeV [4]. By accepting events with
δm within a narrow range of these values around 143.8 MeV we reject most
combinations where the e− or e+ that are used to reconstruct the D∗+s did not, in
fact, come from decays of the D∗+s .
4.2.5 ∆d0 between the e+ and e− Tracks
In CLEO, the d0 of a track is defined as the distance of closest approach of the
track to the z-axis. It is a signed quantity, whose sign depends on the charge of
the track (inferred from the sense of the track helix) and whether the origin of
the x − y plane falls within the circle made by the track in that plane. For more
details, one may see Section 6 of the “How and Why Wonder Book of CLEO
Tracking Conventions” [14].
Now, for e+ and e− tracks that come from the origin, as they do for our signal,
it may be seen from Fig. 4.2 that de−0 − de+
0 is 0. Hence, in data, our signal will
have ∆d0 centered around 0.
However, for e+ and e− tracks that come from a point away from the origin,
as they do for the conversion background, it is clear from Fig. 4.2 that de−0 − de+
0
will be negative.
For our selection criterion, we define:
∆d0 = de−0 − de+
0 (4.13)
and require ∆d0 to be greater than -5 mm. This criterion efficiently rejects con-
version background events.
36
-signal e
+signal e
~00d∆
-conversion e
+conversion e
-e0d
+e0d
Figure 4.2: An illustration of ∆d0 between the soft e+e− tracks of the signaland conversion events.
4.2.6 ∆φ0 between the e+ and e− Tracks
The azimuthal angle of the e+ and e− tracks measured at the point of closest
approach of the track to the z-axis, denoted by φ0, appears to be very effective in
rejecting conversion background events.
For events where the e+ and e− tracks come from the origin, as they do for
our signal, it may be noted from Fig. 4.3 that if we define:
∆φ0 = φe−0 − φe+
0 , (4.14)
∆φ0 will be centered around 0 for the signal. However, for conversion events
where the tracks do not emanate from the origin, it may be inferred from Fig.
4.3 that ∆φ0 will always be positive.
Requiring ∆φ0 to be less than 0.12 in this selection criterion rejects a signifi-
cant portion of our conversion background events.
37
-signal e
+signal e
~00
φ∆
-conversion e
+conversion e
-e0
φ
+e0
φ
Figure 4.3: An illustration of ∆φ0 between the soft e+e− tracks of the signaland conversion events.
4.3 Selection Criteria for Reconstructing D∗+s → D+s γ
As mentioned earlier, we seek to measure the ratio of branching fractions
B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) in order to minimize systematics arising from
the reconstructing of D+s mesons, and therefore we must have a way to measure
yields and efficiencies for a B(D∗+s → D+s γ) measurement. We do this, again,
by reconstructing the D∗+s through the D+s and the γ. The D+s is reconstructed
exclusively through the nine hadronic decay channels listed in Eq. 4.1 - 4.9.
Selection criteria used to separate the D∗+s → D+s γ signal from backgrounds
are similar to those used for the D∗+s → D+s e+e−. The kinematic variables mD+s ,
mBC and δm retain their definitions from the previous section, except the four-
momenta of the e+e− pair is replaced by that of the γ. Selection criteria on the
e+e− pair are obviously inapplicable and are replaced by criteria on the γ. These
are described in the following section. Furthermore, we plot the distribution
of mBC after applying all other criteria, and the large rate of this channel that
38
translates to a large number of data points allows us to compute the signal yields
and efficiencies from a fit instead of cutting and counting within a range. The
procedure is described in detail for the K+K−π+ decay mode of the D+s in Section
4.10.
4.3.1 Shower Criteria for the Photon
As described briefly in Section 3.2, photons are reconstructed from electromag-
netic showers in the calorimeter that distribute their energies over multiple crys-
tals. The direction of the photon is determined by interpolating between crystals
and the total energy is determined by summing the energy deposited in the re-
gion identified as part of an electromagnetic shower. The shower is required
to have total energy between 10 MeV and 2 GeV. No part of the shower may
deposit its energy in a known noisy, i.e. “hot”, crystal or an under-performing
one. The shower may not lie in the path of a track since such a shower would
almost certainly have been produced by a charged particle and therefore can-
not be a photon candidate. Electromagnetic showers tend to deposit a narrower
distribution of energy than a hadronic shower. The collimation of energy depo-
sition is measured by a quantity known as E9/E25. It is the ratio of energy in
the 3 × 3 block of crystal surrounding the cluster-center of the shower energy
to the energy deposited in the 5 × 5 block. E9/E25 is required to be close to 1
for a photon shower. We also require that energies in this 5 × 5 block that are
associated with any other photon be subtracted. We select on a range for this
unfolded E9/E25 variable, limited by 1, such that 99% of showers are accepted.
And finally, the shower is required to be from a region of the barrel or endcap
calorimeter known to be good.
39
Table 4.1: Integrated luminosity corresponding to the CLEO-c datasetsused in this analysis. The statistical uncertainties are addedin quadrature, while the systematic uncertainties are added lin-early. Thereafter, these two forms of uncertainties are added inquadrature to give us the total uncertainty we use for the analy-sis and the remainder of this document.
Dataset Integrated Luminosity ± stat ± syst (pb−1)
39 55.1 ± 0.03 ± 0.56
40 123.9 ± 0.05 ± 1.3
41 119.1 ± 0.05 ± 1.3
47 109.8 ± 0.05 ± 1.1
48 178.3 ± 0.06 ± 1.9
Total 586.2 ± 0.11 ± 6.1
4.4 Datasets Used
Data taken by the CLEO-c detector at e+e− center of mass collision energy of
4,170 MeV that is used for this analysis correspond to the datasets enumerated
in Table 4.1. The center of mass collision energy is usually represented in high
energy physics as√
s. We add the integrated luminosities of each of the datasets
to converge on the value of 586 ± 6 pb−1 as the total luminosity of our data. This
value is used for the rest of this dissertation.
Electron-positron collisions at a center of mass energy of √s= 4,170 MeV
have been measured to produce D±s D∗∓s pairs with a cross section of 916 ± 11(sta-
tistical) ± 49(systematic) pb in [10] and 983 ± 46(statistical) ± 21(systematics of
measurement) ± 10 (systematics of luminosity) in [3]. These being independent
measurements, we use the uncertainty-weighted average value of 948 ± 36 pb
for the cross section in this analysis.
40
Dataset 42 containing 48.1 pb−1 of data collected at the ψ(2S ) resonance en-
ergy was used to measure the systematic uncertainty in the reconstruction effi-
ciencies of soft e+e− and γ in this analysis.
Monte Carlo samples modeling known physical processes expected in these
datasets had been produced and are available as the Generic and Continuum
samples described in the following sections.
4.4.1 Generic Monte Carlo
By Generic Monte Carlo, we mean a Monte Carlo (MC) simulation of all known
physics processes that follow from the production of charm quarks at 4,170 MeV
e+e− collisions. The D∗+s → D+s e+e− process which we are searching for, conse-
quently, is not a part of this simulation. In order to decrease statistical uncer-
tainties, the Generic MC was created with approximately 20 events for every 1
event of data. This scale factor of 20 was aimed for, but not necessarily achieved
due to computational errors. We re-evaluate the scale factor achieved as follows:
According to
https://www.lepp.cornell.edu/˜c3mc/private/genmc_decs/20080404_MCGEN_1/ddmix_4170_isr.dec
which is the EVTGEN decay file used to set the branching fractions of the vari-
ous charm quark states possible at 4,170 MeV, the branching fraction of produc-
ing D±s D∗∓s is 0.1014. Also, from the “Samples” section of
https://wiki.lepp.cornell.edu/lepp/bin/view/CLEO/Private/SW/CLEOcMCstatus
we see that the total number of produced events is 105.2 million. Therefore, we
may write:
(586 ± 3)pb−1 × (948 ± 36)pb0.1014 × scale = (105.2 ± 0.1) × 106 (4.15)
41
From this, we deduce that the achieved scale factor for the Generic MC sample
has been 19.2 ± 0.8. The uncertainty in the luminosity contributes most to the
uncertainty in this scale. Since we will be mostly dividing the number of events
in Generic MC by this scale factor, it is useful to record the inverse of this scale:
0.052 ± 0.002.
4.4.2 Continuum Monte Carlo
By Continuum Monte Carlo, we mean a Monte Carlo simulation of all physics
processes that follow from the production of up, down and strange quarks at√
s = 4,170 MeV e+e− collisions. The scale factor for this MC sample is read off
as 5 from the website:
https://wiki.lepp.cornell.edu/lepp/bin/view/CLEO/Private/SW/CLEOcMCstatus
42
4.5 Reprocessing Data to Fit Tracks with the Electron Mass Hy-
pothesis
Tracks in CLEO-c are fitted to various particle mass hypotheses with a Kalman
filter as described in [20]. In order to conserve disk-space, however, CLEO-c
had chosen to not store track fits made with the electron mass hypothesis in
the reconstruction process. Electrons tracks were stored with fits made with the
charged pion mass hypothesis. This is found to work fine for energies above a
few hundred MeVs, but not in our analysis which deals with average electron
energies of 70 MeV and goes down to 40 MeV. A plot of the difference between
the reconstructed and generated electron energy as a function of the generated
energy for electron tracks fitted with the pion mass hypothesis is presented in
Fig. 4.4(Left). We find a systematic and significant over-estimation of the elec-
tron energy with lower generated energies. This is directly related to the signif-
icantly larger mass of the charged pion being used to model the energy loss for
an electron in the Kalman filter used to fit the tracks.
This systematic deviation disappears when we switch to the electron mass
hypothesis for our track fits as presented in Fig. 4.4(Right). Simply re-
parameterizing the energy of the tracks using a fit to Fig. 4.4(Left) was found to
not improve our results as significantly as reconstructing tracks with the elec-
tron mass fit.
All datasets listed in Table 4.1 and dataset 42, which is used for comput-
ing systematic uncertainties in the low-energy electron tracking efficiency, were
reprocessed to have events with D+s candidates decaying to one of the nine
hadronic modes specified in Eq. 4.1 - 4.9 also contain tracks fitted to the electron
43
MC Electron Energy (GeV)0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16
Reco
- M
C El
ectro
n En
ergy
(GeV
)
0
0.005
0.01
0.015
0.02
0.025
Electron Energy Resolution
MC Electron Energy (GeV)0 0.02 0.04 0.06 0.08 0.1 0.12 0.14 0.16
Reco
- M
C El
ectro
n En
ergy
(GeV
)
-0.002
0
0.002
0.004
0.006
Electron Energy Resolution
Figure 4.4: (Left) The difference between the reconstructed and MonteCarlo generated electron energy plotted against the generatedelectron energy when the electrons have been fitted to tracksusing the pion mass hypothesis. (Right) The difference whenthe electrons are fitted to tracks using the electron mass hy-pothesis.
mass hypothesis. The execution of this procedure was a major technical chal-
lenge, given the sheer volume of data that had to be sifted through, and failed to
reproduce 0.2% of the D+s candidates while producing 0.1% new D+s candidates
in the reprocessed datasets. This was attributed to virtually intractable changes
in software since the first processing of this data and is incorporated in our final
measurement as a source of uncertainty.
44
4.6 Monte Carlo Generation and Validation
In order to calibrate our selection criteria for selecting D∗+s → D+s e+e− and D∗+s →
D+s γ events over background processes, we produce Monte Carlo simulations of
these events. Monte Carlo simulations also help us estimate the efficiencies for
our thus tuned selection criteria in retaining such events in data.
These simulations begin by modeling the physics of e+e− collisions which
produces intermediate particles, which in turn decay to D∗+s D−s pairs and ul-
timately down to known stable particles. The invariant quantum mechanical
amplitude which captures the essential dynamics of this process is programmed
into the EvtGen [15] software package. The package uses this information along
with the Lorentz-invariant phase space factor which encodes the kinematics of
the process to populate the available phase space. Thus, distributions of final
state particles in momenta are generated. The behavior and detection of these fi-
nal state particles in CLEO-c are computed by another software package known
as GEANT [12]. It accounts for the decay of short lived particles in flight, the
interaction of particles with the material of the detector and energy loss due to
bremsstrahlung.
The decay of a vector boson (D∗+s ) to a scalar boson (D+s and two leptons (e+e−)
had not previously been modeled in the EvtGen package. A software plug-in
to accomplish this within EvtGen, based on the invariant amplitude computed
in Eq. 2.14, was implemented. This was used to generate signal Monte Carlo
samples for the D∗+s → D+s e+e− process, and this included accounting for all
angular correlations. However, it remained for us to ensure that the form for
dΓ/dk2 of the D∗+s → D+s e+e− process which we arrived at analytically in Eq.
45
2.44 that was used in the computation of Γ(D∗+s → D+s e+e−)/Γ(D∗+s → D+s γ) in Eq.
2.45 matched with that produced by the Monte Carlo simulation of EvtGen. k2
represents the invariant mass squared of the e+e− pair as it did in Chapter 2.
To do this, we plotted the dΓ/dk2 as a function of k2 that was written down in
Eq. 2.44 overlaid with an appropriately normalized histogram of the k2 from
EvtGen as presented in Fig. 4.5. The match is found to be satisfactory with
discrepancies well beyond the capacity for our detector to resolve.
)2 (GeV2ee m
-610 -510 -410
2/d
qΓ
d
0
0.01
0.02
0.03
0.04
0.05
0.06
0.07
0.08
0.09Analytical Distribution
Distribution from Corrected Monte Carlo
(a)
Distribution2q
)2 (GeV2ee m
0 1 2 3 4 5-610×
2/d
qΓ
d
0
0.0005
0.001
0.0015
0.002
0.0025
0.003
0.0035Analytical Distribution
Distribution from Corrected Monte Carlo
(b)
Distribution2q
Figure 4.5: (a) The analytical expression for the distribution of k2 overlaidwith the distribution of the corrected m2
ee from the Monte Carlo.(b) A zoom into the region betweeen 0 GeV and 20m2
e to illus-trate the close match near the peak.
Monte Carlo samples were generated for both D∗+s → D+s e+e− and D∗+s → D+s γ
processes. The former served as the signal sample for the D∗+s → D+s e+e−
reconstruction. The latter served as one of the background samples for the
D∗+s → D+s e+e− reconstruction (where the γ converted to e+e− pairs in the material
of the detector) and as the signal sample for reconstruction of the D∗+s → D+s γ
itself. Separate samples were generated for the D+s decaying to each of the 9
hadronic decay modes listed between Eq. 4.1 and 4.9.
46
4.7 Optimization of Selection Criteria for the D∗+s → D+s e+e−
In this section, we describe our method of calibrating the selection criteria out-
lined in Section 4.2 to optimally select D∗+s → D+s e+e− events in data while re-
jecting background events. This is done using Monte Carlo samples for both
the signal and background events. The various kinds of expected background
events, as described in Section 4.1, had been simulated as part of the Generic
and Continuum Monte Carlo samples accompanying each dataset as described
in Section 4.4. A crude measure of signal significance, defined as:
σcrude =s√
b(4.16)
where s and b are the numbers of signal and background events observed after
all selection criteria have been applied, is maximized in the course of our op-
timization effort. We optimize the selection criteria for each of the 9 hadronic
decay modes of the D+s separately using Monte Carlo samples that contain elec-
tron tracks fitted to both the charged pion and electron mass hypotheses. Im-
provements in the signal yields (observed number of signal events after selec-
tion criteria) and significances (as defined crudely above) are noted as we go
from the pion-fitted to the electron-fitted samples, and this is summarized in
Tables 4.2 and 4.3. They are a compilation of results obtained in the following
sub-sections that deals with the optimization of the modes individually. The
numbers in these tables are not used as final expectations of the background in
data. A data driven method is used to achieve that in Section 4.9 and summa-
rized in Section 4.9.12. The numbers here are merely representative and were
used to converge on an optimized set of parameters for our selection criteria.
A problem arises in making optimization plots for the electron-fitted sam-
ples because the generic and the continuum Monte Carlo samples do not contain
47
tracks that are electron-fitted. To get around this, we recognize that electron-
fitting tracks is most important for separating conversion events from signal. It
does not change distributions of the Dalitz decay or other combinatoric back-
grounds appreciably for the purposes of this analysis. Therefore, we privately
produce electron-fitted Monte Carlo samples of D∗+s → D+s γ events where the D+s
decays generically, and use them in place of Generic Monte Carlo events which
have D∗+s → D+s γ excluded at the generator (EvtGen) level.
To create the plots for optimization in the following sub-sections for each
hadronic decay of the D+s , it is assumed that D±s D∗∓s pairs are produced at√
s= 4170 MeV with a cross section of 948 ± 36 pb, the branching fraction of
D∗+s → D+s γ is 94.2%, the branching fraction of D∗+s → D+s e+e− is 0.65%, the scale
of generic Monte Carlo is 1/19.2, and the scale of continuum Monte Caro is 1/5.
The plots for a particular selection criterion are made having applied all other
selection criteria. This allows us to assess the performance of a particular crite-
rion when applied in conjunction with all other criteria. We may take the set of
plots in Fig. 4.6 as an illustration of our procedure. We plot the distribution of
the variable that we are selecting on, the mass of the D+s in this example, for the
signal on the top left plot in each set of plots. The plot on the right in the same
row graphs the increase in accepted signal as we increase the width of our se-
lection criterion in mD+s . The number of produced signal events are normalized
to what we expect in 586 pb−1 of data. The second row displays the same for
a generic MC sample. The third row displays the same for the continuum MC
sample. They too are normalized to a luminosity of 586 pb−1. The first column
on the last row plots the crude significance as defined in Eq. 4.16 against an
increasing acceptance of the selection criterion. The second column on the last
row plots a crude precision, as defined in Eq. 4.17 against an increasing accep-
48
tance of the selection criterion. For each selection criterion we try to maximize
the crude significance while ensuring that we are not too far from the maximum
in the crude precision.
pcrude =s
√s + b
(4.17)
Optimization of the selection criteria for each hadronic decay mode of the D+sis described separately in the following sub-sections. In the interest of reading
clarity, the plots used to converge on optimized parameters are only presented
for the D+s → K+K−π+ mode in this section. Plots for all other modes are rele-
gated to Appendix A. The parameters converged upon for the selection criteria
and their performances against signal and background Monte Carlo samples,
however, are presented in the sub-sections corresponding to each of the modes.
Table 4.2: Numbers of signal and background events retained by opti-mized selection criteria in signal and background Monte Carlosimulations where electron tracks have been fitted to the pionmass hypothesis. The numbers are normalized to 586 pb−1 ofintegrated luminosity.
Mode Signal Generic Background Continuum Background Total Background s/√
b
K+K−π+ 11.7 2.03 0.00 2.03 8.2
KS K+ 3.12 0.78 0.00 0.78 3.5
ηπ+ 1.57 0.21 0.20 0.41 6.3
η′π+; η′ → π+π−η 1.02 0.47 0.00 0.47 1.5
K+K−π+π0 4.62 3.49 0.40 3.89 2.3
π+π−π+ 2.99 0.73 0.60 1.33 2.6
K∗+K∗0 1.78 1.35 0.00 1.35 1.5
ηρ+ 5.54 2.40 3.60 6.00 2.3
η′π+; η′ → ρ0γ 2.17 0.83 1.60 2.43 1.4
Total 36.94 12.29 6.4 18.69 8.6
49
Table 4.3: Numbers of signal and background events retained by opti-mized selection criteria in signal and background Monte Carlosimulations where electron tracks have been fitted to the elec-tron mass hypothesis. The numbers are normalized to 586 pb−1
of integrated luminosity.
Mode Signal Conversion Background Generic Background Continuum Background Total Background s/√
b
Conversions Vetoed
K+K−π+ 13.36 1.04 0.42 0.00 1.45 11.1
KS K+ 3.05 0.34 0.21 0.00 0.54 4.13
ηπ+ 1.79 0.17 0.10 0.20 0.47 6.6
η′π+; η′ → π+π−η 0.74 0.00 0.00 0.00 0.00 ∞
K+K−π+π0 4.86 0.63 1.46 0.20 2.29 3.2
π+π−π+ 3.67 0.28 0.21 1.60 2.09 2.5
K∗+K∗0 2.02 0.23 0.63 0.20 1.05 2.0
ηρ+ 5.71 0.85 0.99 1.00 2.84 3.4
η′π+; η′ → ρ0γ 2.41 0.34 0.21 1.80 2.35 1.6
Total 40.36 3.88 4.23 5.00 13.08 11.2
4.7.1 D+s → K+K−π+
Given that the branching fraction of D+s → K+K−π+ is 0.055 ± 0.0028 [3, 4], we
study the plots in 4.6, 4.7, 4.8, 4.9 and 4.10 to arrive at the selection criteria for
data with electron tracks fitted to the pion mass hypothesis, and the plots in 4.11,
4.12, 4.13, 4.14 and 4.15 to arrive at the selection criteria for data with electron
tracks fitted to the electron mass hypothesis. These are summarized in Table
4.4. The optimization plots for any given selection criteria are produced after
having applied all other criteria on the simulated samples. All plots correspond
to 586 pb−1 of integrated luminosity.
When the selection criteria outlined in Table 4.4 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.5.
50
(GeV)±SD m
1.94 1.95 1.96 1.97 1.98 1.99 2
# E
vent
s
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
Signal Sample±SDm h_dsPlusM_signal
Entries 1377Mean 1.968RMS 0.005849
Signal Sample±SDm
Cut Width (GeV)0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
# E
vent
s
0
2
4
6
8
10
12
Signal Sample vs Cut Width±SDm h_dsPlusM_signal_range
Entries 20167Mean 0.01104RMS 0.004838
Signal Sample vs Cut Width±SDm
(GeV)±SD m1.9 1.92 1.94 1.96 1.98 2 2.02 2.04
# E
vent
s
0
0.05
0.1
0.15
0.2
0.25
0.3
Generic MC Background Sample±SDm h_dsPlusM_generic
Entries 115Mean 1.969RMS 0.03579
Generic MC Background Sample±SDm
GeV±SD m0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
# E
vent
s
00.20.40.60.8
11.21.4
1.61.8
22.22.4
Generic MC Background Sample vs Cut Width±SDm h_dsPlusM_generic_range
Entries 606Mean 0.01149RMS 0.004725
Generic MC Background Sample vs Cut Width±SDm
(GeV)±SD m
1.9 1.92 1.94 1.96 1.98 2 2.02 2.04
# E
vent
s
0
0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
0.18
0.2
Continuum MC Background Sample±SDm h_dsPlusM_continu
Entries 5Mean 1.999RMS 0.03948
Continuum MC Background Sample±SDm
Cut Width GeV0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
# E
vent
s
-1
-0.5
0
0.5
1
Continuum MC Background Sample vs Cut Width±SDm h_dsPlusM_continu_range
Entries 0Mean 0RMS 0
Continuum MC Background Sample vs Cut Width±SDm
Cut Width (GeV)0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
σ
0
1
2
3
4
5
6
7
8
Signal Significance vs Cut Width±SDm h_dsPlusM_significance
Entries 20Mean 0.0101RMS 0.005191
Signal Significance vs Cut Width±SDm
Cut Width (GeV)0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.020
0.5
1
1.5
2
2.5
3
Signal Precision vs Cut Width±SDm h_dsPlusM_precision
Entries 20Mean 0.01038RMS 0.005128
Signal Precision vs Cut Width±SDm
Figure 4.6: Optimization plots for the mD+s selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated sam-ples. The top left plot is the distribution of mD+s in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we in-crease the cut width plotted on the x-axis. The plots in thesecond and third rows correspond to the generic and contin-uum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal.
51
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
# E
vent
s
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
Signal SampleBCm h_MBC_signalEntries 1539Mean 2.113RMS 0.004745
Signal SampleBCm
Cut Width (GeV)0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
# E
vent
s
0
2
4
6
8
10
12
14
Signal Sample vs Cut WidthBCm h_MBC_signal_range
Entries 23634Mean 0.01063RMS 0.004995
Signal Sample vs Cut WidthBCm
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
# E
vent
s
0
0.05
0.1
0.15
0.2
0.25
0.3
0.35
0.4
Generic MC BackgroundBCm h_MBC_genericEntries 253Mean 2.106RMS 0.02604
Generic MC BackgroundBCm
Cut Width (GeV)0 0.0020.0040.0060.008 0.010.0120.0140.0160.0180.02
# E
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3
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7
Generic MC Background vs Cut WidthBCm h_MBC_generic_range
Entries 1399Mean 0.01247RMS 0.00452
Generic MC Background vs Cut WidthBCm
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
# E
vent
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0.02
0.04
0.06
0.08
0.1
0.12
0.14
0.16
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Figure 4.7: Optimization plots for the mBC selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated sam-ples. The top left plot is the distribution of mBC in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we in-crease the cut width plotted on the x-axis. The plots in thesecond and third rows correspond to the generic and contin-uum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal.
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Figure 4.8: Optimization plots for the δm selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated sam-ples. The top left plot is the distribution of δm in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we in-crease the cut width plotted on the x-axis. The plots in thesecond and third rows correspond to the generic and contin-uum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal.
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Figure 4.9: Optimization plots for the ∆d0 selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated sam-ples. The top left plot is the distribution of ∆d0 between thee+e− tracks in the signal Monte Carlo sample. The top rightplot graphs the number of signal MC sample events acceptedby the criterion as we vary the cut on the x-axis. The plots inthe second and third rows correspond to the generic and con-tinuum MC samples. The bottom left shows the significance ofthe signal over background. The bottom right plot shows theprecision of the signal.
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Figure 4.10: Optimization plots for the ∆φ0 selection criterion in the D+s →K+K−π+ mode using pion-fitted tracks in the simulated sam-ples. The top left plot is the distribution of ∆φ0 between thee+e− tracks in the signal Monte Carlo sample. The top rightplot graphs the number of signal MC sample events acceptedby the criterion as we vary the cut on the x-axis. The plots inthe second and third rows correspond to the generic and con-tinuum MC samples. The bottom left shows the significanceof the signal over background. The bottom right plot showsthe precision of the signal.
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Figure 4.11: Optimization plots for the mD+s selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulatedsamples. The top left plot is the distribution of mD+s in thesignal Monte Carlo sample. The top right plot graphs thenumber of signal MC sample events accepted by the crite-rion as we increase the cut width plotted on the x-axis. Theplots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples. The bottomleft shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
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Figure 4.12: Optimization plots for the mBC selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulatedsamples. The top left plot is the distribution of mBC in thesignal Monte Carlo sample. The top right plot graphs thenumber of signal MC sample events accepted by the crite-rion as we increase the cut width plotted on the x-axis. Theplots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples. The bottomleft shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
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Figure 4.13: Optimization plots for the δm selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulatedsamples. The top left plot is the distribution of δm in the signalMonte Carlo sample. The top right plot graphs the number ofsignal MC sample events accepted by the criterion as we in-crease the cut width plotted on the x-axis. The plots in thesecond, third and fourth rows correspond to the D∗+s → D+s γ,generic and continuum MC samples. The bottom left showsthe significance of the signal over background. The bottomright plot shows the precision of the signal.
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(m)0d∆ -0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
# E
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.4 m
m
00.020.040.060.08
0.10.120.140.160.18
0.20.220.24
Conversion MC Sample0d∆ h_diffD0_converEntries 26Mean -0.0009811RMS 0.003759
Conversion MC Sample0d∆
Cut Width (m)-0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
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Entries 234Mean -0.0047RMS 0.003508
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(m)0d∆ -0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
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m
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Cut Width (m)-0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
# E
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Entries 96Mean -0.003458RMS 0.004098
Generic MC Background Sample vs Cut Width0d∆
(m)0d∆ -0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
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Cut Width (m)-0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
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Continuum MC Background Sample vs Cut Width0d∆ h_diffD0_continu_range
Entries 0Mean 0RMS 0
Continuum MC Background Sample vs Cut Width0d∆
Cut Width (m)-0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
# E
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Significance vs Cut Width0d∆ h_diffD0_significanceEntries 19Mean -0.004282RMS 0.003426
Significance vs Cut Width0d∆
Cut Width (m)-0.01 -0.008-0.006-0.004-0.002 0 0.002 0.004 0.006 0.008 0.01
# E
vent
s
0
0.5
1
1.5
2
2.5
3
3.5
Precision vs Cut Width0d∆ h_diffD0_precisionEntries 19Mean -0.004092RMS 0.003631
Precision vs Cut Width0d∆
Figure 4.14: Optimization plots for the ∆d0 selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulatedsamples. The top left plot is the distribution of ∆d0 betweenthe e+e− tracks in the signal Monte Carlo sample. The topright plot graphs the number of signal MC sample events ac-cepted by the criterion as we vary the cut on the x-axis. Theplots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples. The bottomleft shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
59
(GeV)Φ∆ -1.5 -1 -0.5 0 0.5 1 1.5
# E
vent
s / 0
.063
0
0.5
1
1.5
2
2.5
3
3.5
4
Signal SampleΦ∆ h_dPhi_signalEntries 1842Mean -0.0009114RMS 0.2938
Signal SampleΦ∆
Cut Width (GeV)-0.1 -0.05 0 0.05 0.1 0.15 0.2
# E
vent
s
0
2
4
6
8
10
12
14
Signal Sample vs Cut WidthΦ∆ h_dPhi_signal_range
Entries 31899Mean 0.07592RMS 0.07445
Signal Sample vs Cut WidthΦ∆
(GeV)Φ∆ -1.5 -1 -0.5 0 0.5 1 1.5
# E
vent
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.063
00.2
0.40.6
0.8
11.2
1.4
1.61.8
2
Conversion MC SampleΦ∆ h_dPhi_converEntries 195Mean 0.2367RMS 0.2307
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Entries 566Mean 0.08679RMS 0.07792
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0.14
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Entries 218Mean 0.05968RMS 0.08153
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vent
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Continuum MC Background vs Cut WidthΦ∆ h_dPhi_continu_range
Entries 0Mean 0RMS 0
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Significance vs Cut WidthΦ∆ h_dPhi_significanceEntries 30Mean 0.06166RMS 0.07688
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vent
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1.5
2
2.5
3
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Precision vs Cut WidthΦ∆ h_dPhi_precisionEntries 30Mean 0.06189RMS 0.07929
Precision vs Cut WidthΦ∆
Figure 4.15: Optimization plots for the ∆φ0 selection criterion in the D+s →K+K−π+ mode using electron-fitted tracks in the simulatedsamples. The top left plot is the distribution of ∆φ0 betweenthe e+e− tracks in the signal Monte Carlo sample. The topright plot graphs the number of signal MC sample events ac-cepted by the criterion as we vary the cut on the x-axis. Theplots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples. The bottomleft shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
60
Table 4.4: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → K+K−π+ decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.011 GeV 1.969 ± 0.011 GeV
mBC 2.112 ± 0.005 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.009 GeV 0.144 ± 0.006 GeV
∆d0 -0.002 m -0.006 m
∆φ0 0.06 0.1
Table 4.5: Numbers of signal and background events left in 586 pb−1 ofpion and electron-fitted simulation samples in the D+s → K+K−π+decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 11.7 13.36
Conversion Background - 1.04
Generic Background (without Conversions in e-fit) 2.03 0.42
Continuum Background 0.00 0.00
Total Background (b) 2.03 1.45
s/√
b 8.2 11.1
61
4.7.2 D+s → KS K+
The optimization plots for this decay mode may be found in Appendix A.1.
Given that the branching fraction of D+s → KS K+ is 0.0149 ± 0.0009 [3, 4], we
study the plots in A.1, A.3, A.5, A.7 and A.9 to arrive at the selection criteria
for data with electron tracks fitted to the pion mass hypothesis, and the plots
in A.2, A.4, A.6, A.8 and A.10 to arrive at the selection criteria for data with
electron tracks fitted to the electron mass hypothesis. These are summarized in
Table 4.6.
Table 4.6: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → KS K+ decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.012 GeV 1.969 ± 0.008 GeV
mBC 2.112 ± 0.006 GeV 2.112 ± 0.007 GeV
δm 0.158 ± 0.010 GeV 0.144 ± 0.006 GeV
∆d0 -0.002 m -0.004 m
∆φ0 0.09 0.14
When the selection criteria outlined in Table 4.6 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.7.
62
Table 4.7: Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → KS K+ decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 3.12 3.05
Conversion Background - 0.34
Generic Background (without Conversions in e-fit) 0.78 0.21
Continuum Background 0.00 0.00
Total Background (b) 0.78 0.54
s/√
b 3.5 4.13
63
4.7.3 D+s → ηπ+; η→ γγ
The optimization plots for this decay mode may be found in Appendix A.2.
Given that the branching fraction of D+s → ηπ+ is 0.0158±0.0021 [3, 4] and η→ γγ
is 0.3931± 0.0020 [1, 16, 4], we study the plots in A.11, A.13, A.15, A.17 and A.19
to arrive at the selection criteria for data with electron tracks fitted to the pion
mass hypothesis, and the plots in A.12, A.14, A.16, A.18 and A.20 to arrive at
the selection criteria for data with electron tracks fitted to the electron mass
hypothesis. These are summarized in Table 4.8.
Table 4.8: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → ηπ+; η → γγ decaymode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.015 GeV 1.969 ± 0.016 GeV
mBC 2.112 ± 0.007 GeV 2.112 ± 0.008 GeV
δm 0.155 ± 0.013 GeV 0.144 ± 0.008 GeV
∆d0 -0.007 m -0.004 m
∆φ0 0.07 0.12
When the selection criteria outlined in Table 4.8 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.9.
64
Table 4.9: Numbers of signal and background events expected in pion andelectron-fitted data in the D+s → ηπ+; η→ γγ decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 1.57 1.79
Conversion Background - 0.17
Generic Background (without Conversions in e-fit) 0.21 0.10
Continuum Background 0.20 0.20
Total Background (b) 0.41 0.47
s/√
b 6.3 6.6
65
4.7.4 D+s → η′π+; η′ → π+π−η; η→ γγ
The optimization plots for this decay mode may be found in Appendix A.3.
Given that the branching fraction of D+s → η′π+ is 0.038± 0.004 [3, 4], the branch-
ing fraction of η′ → π+π−η is 0.446 ± 0.0014 [19, 4], and the branching fraction of
η→ γγ is 0.3931± 0.0020 [1, 16, 4], we studied the plots in A.21, A.23, A.25, A.27
and A.29 to arrive at the selection criteria for data with electron tracks fitted to
the pion mass hypothesis, and the plots in A.22, A.24, A.26, A.28 and A.30 to
arrive at the selection criteria for data with electron tracks fitted to the electron
mass hypothesis. These are tabulated in Table 4.10
Table 4.10: Selection criteria for data with electron tracks fitted to thepion and electron mass hypotheses in the D+s → η′π+; η′ →π+π−η; η→ γγ decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.011 GeV 1.969 ± 0.008 GeV
mBC 2.112 ± 0.011 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.013 GeV 0.144 ± 0.008 GeV
∆d0 -0.003 m -0.004 m
∆φ0 0.07 0.1
When the selection criteria outlined in Table 4.10 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.11.
66
Table 4.11: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → η′π+; η′ → π+π−η; η → γγ
decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 1.02 0.74
Conversion Background - 0.00
Generic Background (without Conversions in e-fit) 0.47 0.00
Continuum Background 0.00 0.00
Total Background (b) 0.47 0.00
s/√
b 1.50 ∞
67
4.7.5 D+s → K+K−π+π0
The optimization plots for this decay mode may be found in Appendix A.4.
Given that the branching fraction of D+s → K+K−π+π0 is 0.056 ± 0.005 [3, 4], we
study the plots in A.31, A.33, A.35, A.37 and A.39 to arrive at the selection cri-
teria for data with electron tracks fitted to the pion mass hypothesis, and the
plots in A.32, A.34, A.36, A.38 and A.40 to arrive at the selection criteria for data
with electron tracks fitted to the electron mass hypothesis. These are tabulated
in Table 4.12
Table 4.12: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → K+K−π+π0 decaymode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.009 GeV 1.969 ± 0.010 GeV
mBC 2.112 ± 0.007 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.011 GeV 0.144 ± 0.006 GeV
∆d0 -0.002 m -0.006 m
∆φ0 0.07 0.12
When the selection criteria outlined in Table 4.12 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.13.
68
Table 4.13: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → K+K−π+π0 decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 4.62 4.86
Conversion Background - 0.63
Generic Background (without Conversions in e-fit) 3.49 1.46
Continuum Background 0.40 0.20
Total Background (b) 3.89 2.29
s/√
b 2.3 3.2
69
4.7.6 D+s → π+π−π+
The optimization plots for this decay mode may be found in Appendix A.5.
Given that the branching fraction of D+s → π+π−π+ is 0.0111±0.0008 [4], we study
the plots in A.41, A.43, A.45, A.47 and A.49 to arrive at the selection criteria for
data with electron tracks fitted to the pion mass hypothesis, and the plots in
A.42, A.44, A.46, A.48 and A.50 to arrive at the selection criteria for data with
electron tracks fitted to the electron mass hypothesis. These are tabulated in
Table 4.14.
Table 4.14: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → π+π−π+ decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.013 GeV 1.969 ± 0.012 GeV
mBC 2.112 ± 0.005 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.009 GeV 0.144 ± 0.006 GeV
∆d0 -0.001 m -0.006 m
∆φ0 0.06 0.1
When the selection criteria outlined in Table 4.14 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.15.
70
Table 4.15: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → π+π−π+ decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 2.99 3.67
Conversion Background - 0.28
Generic Background (without Conversions in e-fit) 0.73 0.21
Continuum Background 0.60 1.60
Total Background (b) 1.33 2.09
s/√
b 2.6 2.5
71
4.7.7 D+s → K∗+K∗0; K∗+ → K0Sπ+,K∗0 → K−π+
The optimization plots for this decay mode may be found in Appendix A.6.
Given that the branching fraction of D+s → K∗+K∗0; K∗+ → K0Sπ+,K∗0 → K−π+
is 0.0164 ± 0.0012 [2, 4], we study the plots in A.51, A.53, A.55, A.57 and A.59
to arrive at the selection criteria for data with electron tracks fitted to the pion
mass hypothesis, and the plots in A.52, A.54, A.56, A.58 and A.60 to arrive at
the selection criteria for data with electron tracks fitted to the electron mass
hypothesis. These are tabulated in Table 4.16.
Table 4.16: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → K∗+K∗0 decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.007 GeV 1.969 ± 0.006 GeV
mBC 2.112 ± 0.007 GeV 2.112 ± 0.005 GeV
δm 0.155 ± 0.009 GeV 0.144 ± 0.008 GeV
∆d0 -0.004 m -0.005 m
∆φ0 0.07 0.13
When the selection criteria outlined in Table 4.16 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.17.
72
Table 4.17: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → K∗+K∗0 decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 1.78 2.02
Conversion Background - 0.23
Generic Background (without Conversions in e-fit) 1.35 0.63
Continuum Background 0.00 0.20
Total Background (b) 1.35 1.05
s/√
b 1.5 2.0
73
4.7.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0
The optimization plots for this decay mode may be found in Appendix A.7.
Given that the branching fraction of D+s → ηρ+ is 0.130 ± 0.022 [17, 4], and the
branching fraction of η → γγ is 0.3931 ± 0.0020 [1, 16, 4], we study the plots in
A.61, A.63, A.65, A.67 and A.69 to arrive at the selection criteria for data with
electron tracks fitted to the pion mass hypothesis, and the plots in A.62, A.64,
A.66, A.68 and A.70 to arrive at the selection criteria for data with electron tracks
fitted to the electron mass hypothesis. These are tabulated in Table 4.18.
Table 4.18: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → ηρ+; η → γγ; ρ+ →π+π0 decay mode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.014 GeV 1.969 ± 0.015 GeV
mBC 2.112 ± 0.006 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.009 GeV 0.144 ± 0.005 GeV
∆d0 -0.003 m -0.007 m
∆φ0 0.07 0.13
When the selection criteria outlined in Table 4.18 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.19.
74
Table 4.19: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → ηρ+; η → γγ; ρ+ → π+π0
decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 5.54 5.71
Conversion Background - 0.85
Generic Background (without Conversions in e-fit) 2.40 0.99
Continuum Background 3.60 1.00
Total Background (b) 6.00 2.84
s/√
b 2.3 3.4
75
4.7.9 D+s → η′π+; η′ → ρ0γ
The optimization plots for this decay mode may be found in Appendix A.8.
Given that the branching fraction of D+s → η′π+ is 0.038 ± 0.004 [3, 4], and the
branching fraction of η′ → ρ0γ is 0.294± 0.009 [19, 4], we study the plots in A.71,
A.73, A.75, A.77 and A.79 to arrive at the selection criteria for data with electron
tracks fitted to the pion mass hypothesis, and we studied the plots in A.72, A.74,
A.76, A.78 and A.80 to arrive at the selection criteria for data with electron tracks
fitted to the electron mass hypothesis. These are tabulated in Table 4.20.
Table 4.20: Selection criteria for data with electron tracks fitted to the pionand electron mass hypotheses in the D+s → η′π+; η′ → ρ0γ decaymode.
Selection Criterion Pion-Fitted Data Electron-Fitted Data
Cut Center ±Width Cut Center ±Width
mD+s 1.969 ± 0.018 GeV 1.969 ± 0.012 GeV
mBC 2.112 ± 0.004 GeV 2.112 ± 0.004 GeV
δm 0.155 ± 0.008 GeV 0.144 ± 0.007 GeV
∆d0 -0.004 m -0.006 m
∆φ0 0.09 0.11
When the selection criteria outlined in Table 4.20 are applied to Monte Carlo
simulation samples corresponding to 586 pb−1 of integrated luminosity, with the
pion mass hypothesis and the electron mass hypothesis for electron tracks, we
are left with signal and background yields as presented in Table 4.21.
76
Table 4.21: Numbers of signal and background events expected in pionand electron-fitted data in the D+s → η′π+; η′ → ρ0γ decay mode.
Expected Number of Pion-Fitted Samples Electron-Fitted Samples
Events in 586 pb−1 and Criteria and Criteria
Signal (s) 2.17 2.41
Conversion Background - 0.34
Generic Background (without Conversions in e-fit) 0.83 0.21
Continuum Background 1.60 1.80
Total Background (b) 2.43 2.35
s/√
b 1.4 1.6
77
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.005
0.01
0.015
0.02
0.025
±π - K+ K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 1783Mean 2.114RMS 0.005737
±π - K+ K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.16: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K+K−π+ as represented in the mBC distribution.
4.8 Efficiency of Selection Criteria for the Reconstruction of
D∗+s → D+s e+e−
In order to estimate the ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ),
we need to measure the efficiencies of our selection criteria for accepting D∗+s →
D+s e+e− events for each hadronic decay mode of the D+s . This is determined by
applying our selection criteria on the Monte Carlo simulation samples of our
signal in each of the modes. The efficiency is calculated by dividing the num-
ber of events remaining within the signal region of the mBC distribution, having
applied all other criteria, by the number of produced sample events. Such dis-
tributions of the mBC for each mode with marked signal regions are presented
in Fig. 4.16 - 4.24. Measurements of these selection efficiencies are presented in
Table 4.22.
78
Table 4.22: Selection efficiencies for reconstructing the D∗+s → D+s e+e− sig-nal in each of the hadronic decay modes of the D+s that thisanalysis deals with.
Mode Signal Selection Efficiency
K+K−π+ 0.0729 ± 0.0019
KS K+ 0.0597 ± 0.0017
ηπ+ 0.0855 ± 0.0021
η′π+; η′ → π+π−η, η→ γγ 0.0530 ± 0.0016
K+K−π+π0 0.0255 ± 0.0011
π+π−π+ 0.0992 ± 0.0022
K∗+K∗0 0.0356 ± 0.0013
ηρ+ 0.0316 ± 0.0013
η′π+; η′ → ρ0γ 0.0638 ± 0.0018
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.005
0.01
0.015
0.02
0.025
0.03
0.035
0.04
± K0S K→ ±
s, D- e+ e±s D→ ±*
s Distribution for DBC
Signal Monte Carlo mh_MBC_signal
Entries 1335Mean 2.114RMS 0.005896
± K0S K→ ±
s, D- e+ e±s D→ ±*
s Distribution for DBC
Signal Monte Carlo m
Figure 4.17: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →KS K+ as represented in the mBC distribution.
79
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.005
0.01
0.015
0.02
0.025
0.03
γ γ → η, η ±π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 1913Mean 2.114RMS 0.005952
γ γ → η, η ±π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.18: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s → ηπ+
as represented in the mBC distribution.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.005
0.01
0.015
0.02γ γ → η, η -π +π →’ η’, η ±π → ±
s, D- e+ e±s D→ ±*
s Distribution for DBC
Signal Monte Carlo mh_MBC_signal
Entries 1141Mean 2.114RMS 0.00567
γ γ → η, η -π +π →’ η’, η ±π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.19: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →η′π+; η′ → π+π−η; η → γγ as represented in the mBC distribu-tion.
80
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.001
0.002
0.003
0.004
0.005
0.006
0.007
0.008
0π ±π - K+ K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 697Mean 2.113RMS 0.01252
0π ±π - K+ K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.20: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K+K−π+π0 as represented in the mBC distribution.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
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MeV
0
0.005
0.01
0.015
0.02
0.025
0.03
±π -π +π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 2407Mean 2.114RMS 0.006755
±π -π +π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.21: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →π+π−π+ as represented in the mBC distribution.
81
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.002
0.004
0.006
0.008
0.01
*0K*pm K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 870Mean 2.113RMS 0.01063
*0K*pm K→ ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.22: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →K∗+K∗0 as represented in the mBC distribution.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.002
0.004
0.006
0.008
0.01
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 953Mean 2.113RMS 0.01029
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.23: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →ηρ+; η→ γγ; ρ+ → π+π0 as represented in the mBC distribution.
82
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / 2
MeV
0
0.005
0.01
0.015
0.02
γ 0ρ →’ η’, η ±π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
h_MBC_signalEntries 1620Mean 2.114RMS 0.007987
γ 0ρ →’ η’, η ±π → ±s, D- e+ e±
s D→ ±*s Distribution for D
BCSignal Monte Carlo m
Figure 4.24: Signal efficiency for reconstructing D∗+s → D+s e+e− in D+s →η′π+; η′ → ρ0γ as represented in the mBC distribution.
83
4.9 Estimation of Background in the Signal Region of D∗+s →
D+s e+e−
In this section we estimate the number of background events expected in the sig-
nal region for each of the hadronic decay modes of the D+s . To do this, we study
the sidebands of the signal regions in the mBC and δm distributions of Monte
Carlo simulated backgrounds and data. When we refer to either of the kine-
matic distributions, we imply that all other selection criteria have been applied
before plotting the distribution.
The signal regions in the mBC and δm distributions are kept blinded in data
for this procedure. The regions in the distributions corresponding to values of
the mBC and δm greater than or less than the signal region are called the sideband
regions. The distributions of the mBC and δm in the sideband regions of data are
extrapolated into the signal region using two pre-determined shapes to estimate
the number of background events we expect there. The first shape is obtained
by fitting the distributions of mBC and δm in the simulated background Monte
Carlo. We refer to this as the “MC shape” in the rest of this section. The second
shape is determined by fitting the distributions of mBC and δm in the sideband
regions of data. This is referred to as the “data shape” in the rest of this section.
The backgrounds are estimated for each of the hadronic decay modes of the
D+s . However, there are not enough data and Monte Carlo simulation points at
the end our selection criteria in the distributions for each of the modes to make a
meaningful fit that may be normalized to extract a shape. Therefore, we add the
contributions from each mode to produce a summed distribution of mBC and a
summed distribution of δm. These distributions are used to determine the data
84
and MC shapes for the mBC and δm distributions as described in Sections 4.9.1
and 4.9.2 respectively.
The data and MC shapes are then scaled to fit the sideband regions of data
in each of the individual modes, for both the mBC and δm distributions. This
is described, mode by mode, in the following sub-sections between 4.9.3 and
4.9.11. For each mode, we obtain four numbers for the estimated background
from our fits extrapolating into the signal region – one for the data shape in the
mBC distribution, one for the MC shape in the mBC distribution, one for the data
shape in the δm distribution and one for the MC shape in the δm distribution.
The average of the values and statistical uncertainties obtained from the the
data and MC shapes in the mBC distribution is used as the primary estimate
for the background in each mode. The difference between this value and the
average of the data and MC shape numbers for the δm distribution is quoted
as the systematic uncertainty of our method for each mode. These numbers are
summarized in Section 4.9.12.
Having thus obtained a summary of the background numbers expected for
each of the modes, we are in a position to quantify the signal significance that
can be achieved for a predicted number of signal events found in a given mode.
This is described in Section 4.9.13.
85
Table 4.23: Maximum likelihood fit parameters for the MC shape in mBCdistribution.
Fit Parameters Value
p0 -3.91135e+02
p1 1.91233e+02
Table 4.24: Maximum likelihood fit parameters for the data shape in mBCdistribution.
Fit Parameters Value
p0 -2.79836e+02
p1 1.38607e+02
4.9.1 Determining the Shape of the mBC Distribution
The distributions of mBC in data and the Monte Carlo simulations are added up
for all modes and presented in Fig. 4.25. The Monte Carlo distribution is fitted
to the function given in Eq. 4.18 between 2.060 GeV and 2.155 GeV. It is depicted
in the figure as a black curve and shall be called the MC shape. The data is also
fitted to the same function, but between the disconnected domains of 2.060 to
2.100 GeV and 2.124 to 2.155 GeV. It is depicted in the figure as a magenta curve
and shall be referred to as the data shape. Each sideband region, it may be
noted, is separated from the signal region by half the width of the signal region.
This is done in order to avoid contaminating the sideband region with signal.
y = (p0 + p1x)√
2.155 − x/GeV (4.18)
The maximum likelihood fit parameters of the MC shape and data shape are
tabulated in Tables 4.23 4.24, respectively.
86
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18
h_MBC_physicsEntries 138Mean 2.087RMS 0.03765
h_MBC_conver_DspEntries 1696Mean 2.092RMS 0.03909
- e+ e±s D→ ±*
s Distribution for Sum of Backgrounds in DBCmSignal MC
Continuum MC
Generic-Conversions MC
Conversions MC
Data
Figure 4.25: Distributions of mBC in Monte Carlo and data. The blue regionis distribution of mBC in Continuum MC. On top of that, ingreen, is stacked the Generic MC with Conversion type eventsexcluded. The Conversion MC is stacked on top of that inred. The black curve is fitted to the sum of the aforementionedbackground distributions. The Signal MC is stacked on top ofthe background MC to show roughly what expect to see whenwe unblind data. Data points, blinded in the signal region, areoverlaid in magenta. The magenta curve is fitted to the datain the sideband regions, as described in the text.
87
Table 4.25: Maximum likelihood fit parameters for the MC shape in δm dis-tribution.
Fit Parameters Value
p0 -2.45787e+03
p1 6.02306e+03
p2 -2.39666e+03
p3 1.65951e+03
4.9.2 Determining the Shape of the δm Distribution
As we have done in the case of the mBC distribution, the distributions of δm in
data and the Monte Carlo simulations are added up for all modes and presented
in Fig. 4.26. However, to further increase the sample sizes, the width of the mBC
criterion for each of the modes has been doubled. The Monte Carlo distribution
is fitted to the third order Chebyshev polynomial given in Eq. 4.19 between
0.100 GeV and 0.250 GeV. It is depicted in the figure as a black curve and shall
be called the MC shape. The data is also fitted to the same function, but between
the disconnected domains of 0.1000 to 0.1298 GeV and 0.1578 to 0.2500 GeV.
It is depicted in the figure as a magenta curve and shall be referred to as the
data shape. Each sideband region, it may be noted, is separated from the signal
region by half the width of the signal region.
y = p0 + p1T1 + p2T2 + p3T3 (4.19)
The maximum likelihood fit parameters of the MC shape and data shape are
tabulated in Tables 4.25 4.26, respectively.
88
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20
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35
- e+ e±s D→ ±*
sm Distribution for Sum of Backgrounds in Dδh_DeltaM_physicsEntries 342Mean 0.1821RMS 0.05878
h_DeltaM_conver_DspEntries 3415Mean 0.1855RMS 0.0513Signal MC
Continuum MC
Generic-Conversions MC
Conversions MC
Data
Figure 4.26: Distributions of δm in Monte Carlo and data. The blue re-gion is distribution of δm in Continuum MC. On top of that, ingreen, is stacked the Generic MC with Conversion type eventsexcluded. The Conversion MC is stacked on top of that inred. The black curve is fitted to the sum of the aforementionedbackground distributions. The Signal MC is stacked on top ofthe background MC to show roughly what expect to see whenwe unblind data. Data points, blinded in the signal region, areoverlaid in magenta. The magenta curve is fitted to the datain the sideband regions, as described in the text.
Table 4.26: Maximum likelihood fit parameters for the Data shape in δm dis-tribution.
Fit Parameters Value
p0 2.38215e+03
p1 -8.89072e+03
p2 2.35325e+03
p3 -2.76871e+03
89
4.9.3 Estimating the Background in the D+s → K+K−π+ Mode
Having found the generic MC shape and data shape in the mBC distribution in
Section 4.9.1, we now proceed to scale these shapes to fit data in the sideband
regions of the D+s → K+K−π+ mode. The signal region is centered at 2.112 GeV
with a width of 0.008 GeV. The sideband regions are separated from the signal
region by half the width of the signal region. The sideband regions extend from
2.060 to 2.104 GeV and 2.120 to 2.155 GeV. The maximum likelihood fits are
displayed in Fig. 4.27 and the values for the scale parameters are presented in
Table 4.27.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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7
8
±π - K+ K→ ±s Distributions in Mode DBCm
Signal MC: 16 Entries
Continuum MC: 1 Entries
Generic MC: 4 Entries
Continuum MC: 1 Entries
Data: 11 Entries
Figure 4.27: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →K+K−π+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
Also, having found the generic MC and data shapes in the δm distribution
in Section 4.9.2, we can now scale those to fit data in the sideband regions of
δm in the D+s → K+K−π+ mode. The signal region is centered at 0.1438 GeV
with a width of 0.012 GeV. The sideband regions are separated from the signal
90
Table 4.27: Maximum likelihood fit parameters to estimate background inthe D+s → K+K−π+ mode
Scale for Shape Value
mBC MC shape 1.03798e-01
δm MC shape 9.35684e-02
mBC data shape 7.75452e-02
δm data shape 6.54773e-02
region by half the width of the signal region. The sideband regions extend from
0.1000 to 0.1318 GeV and 0.1558 to 0.2500 GeV. The maximum likelihood fits are
displayed in Fig. 4.28 and the values for the scale parameters are presented in
Table 4.27.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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6
8
10
±π - K+ K→ ±sm Distributions in Mode Dδ
Signal MC: 16 Entries
Continuum MC: 2 Entries
Generic MC: 4 Entries
Conversion MC: 8 Entries
Data: 24 Entries
Figure 4.28: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →K+K−π+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
The four different fits give us four estimates of the background in the signal
91
Table 4.28: Estimates of the background in the signal region of the D+s →K+K−π+ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
K+K−π+ 1.10 ± 0.39 1.00 ± 0.35 2.06 ± 0.49 1.61 ± 0.38
region. These are tabulated in Table 4.28. The uncertainties noted in the table
are statistical and are estimated by assuming Poisson statistics on the number
of data points in the sidebands. It is calculated as given in Eq. 4.20 where b is
the estimated number of background events and Nside is the number of events
observed in the data sidebands.
∆b = b√
Nside(4.20)
92
4.9.4 Estimating the Background in the D+s → KS K+ Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.014 GeV. The sideband regions extend from 2.060 to 2.098 GeV
and 2.126 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.29
and the values for the scale parameters are presented in Table 4.29.
The signal region in the δm distribution is centered at 0.1438 GeV with a
width of 0.012 GeV. The sideband regions extend from 0.1000 to 0.1318 GeV and
0.1558 to 0.2500 GeV. The maximum likelihood fits are displayed in Fig. 4.30
and the values for the scale parameters are presented in Table 4.29.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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0.6
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1.8
± K0S K→ ±
s Distributions in Mode DBCm
Signal MC: 3 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Continuum MC: 0 Entries
Data: 5 Entries
Figure 4.29: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →KS K+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
The four different fits give us four estimates of the background in the signal
region. These are tabulated in Table 4.30.
93
Table 4.29: Maximum likelihood fit parameters to estimate background inthe D+s → KS K+ mode
Scale for Shape Value
mBC MC shape 4.86292e-02
δm MC shape 4.29587e-02
mBC data shape 5.25423e-03
δm data shape 4.28206e-03
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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0
0.5
1
1.5
2
2.5
± K0S K→ ±
sm Distributions in Mode Dδ
Signal MC: 3 Entries
Continuum MC: 0 Entries
Generic MC: 1 Entries
Conversion MC: 2 Entries
Data: 1 Entries
Figure 4.30: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →KS K+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
Table 4.30: Estimates of the background in the signal region of the D+s →KS K+ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
KS K+ 0.90 ± 0.45 0.80 ± 0.40 0.12 ± 0.12 0.10 ± 0.10
94
4.9.5 Estimating the Background in the D+s → ηπ+; η→ γγ Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.016 GeV. The sideband regions extend from 2.060 to 2.096 GeV
and 2.128 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.31
and the values for the scale parameters are presented in Table 4.31.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.016 GeV. The sideband regions extend from 0.1000 to
0.1278 GeV and 0.1598 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.32 and the values for the scale parameters are presented in
Table 4.31.
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1.4
1.6
γ γ → η, η ±π → ±s Distributions in Mode DBCm
Signal MC: 2 Entries
Continuum MC: 4 Entries
Generic MC: 0 Entries
Continuum MC: 4 Entries
Data: 6 Entries
Figure 4.31: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →ηπ+; η → γγ mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
The four different fits give us four estimates of the background in the signal
region. These are tabulated in Table 4.32.
95
Table 4.31: Maximum likelihood fit parameters to estimate background inthe D+s → ηπ+; η→ γγ mode
Scale for Shape Value
mBC MC shape 7.05486e-02
δm MC shape 6.18039e-02
mBC data shape 3.33356e-02
δm data shape 2.68789e-02
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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2
2.5
3
γ γ → η, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 4 Entries
Generic MC: 0 Entries
Conversion MC: 1 Entries
Data: 9 Entries
Figure 4.32: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →ηπ+; η → γγ mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
Table 4.32: Estimates of the background in the signal region of the D+s →ηπ+; η→ γγ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
ηπ+ 1.48 ± 0.74 1.32 ± 0.66 1.02 ± 0.39 0.79 ± 0.30
96
4.9.6 Estimating the Background in the D+s → η′π+; η′ →
π+π−η; η→ γγ Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.022 GeV. The sideband regions extend from 2.060 to 2.090 GeV
and 2.134 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.33
and since no data point fell within our sideband region, no fit could be made.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.026 GeV. The sideband regions extend from 0.1000 to
0.1178 GeV and 0.1698 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.34.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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0.1
0.2
0.3
0.4
0.5
γ γ → η, η -π +π →’ η’, η ±π → ±s Distributions in Mode DBCm
Signal MC: 1 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Continuum MC: 0 Entries
Data: 0 Entries
Figure 4.33: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →η′π+; η′ → π+π−η; η→ γγ mode. The data, blinded in the signalregion, is overlaid in magenta points. The black and magentacurves are MC and data shapes scaled by maximum likelihoodto the points of data in the sideband regions.
Not much could be estimated of the background expected in the signal re-
gion. This is tabulated in Table 4.33.
97
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0.8
1
1.2
1.4
1.6
γ γ → η, η -π +π →’ η’, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 1 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Conversion MC: 1 Entries
Data: 1 Entries
Figure 4.34: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →η′π+; η′ → π+π−η; η→ γγ mode. The data, blinded in the signalregion, is overlaid in magenta points. The black and magentacurves are MC and data shapes scaled by maximum likelihoodto the points of data in the sideband regions.
Table 4.33: Estimates of the background in the signal region of the D+s →η′π+; η′ → π+π−η; η→ γγ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
η′π+ 0.00 + 0.68 0.00 + 0.59 0.00 + 0.34 0.00 + 0.26
98
Table 4.34: Maximum likelihood fit parameters to estimate background inthe D+s → K+K−π+π0 mode
Scale for Shape Value
mBC MC shape 1.68672e-01
δm MC shape 1.52049e-01
mBC data shape 1.10339e-01
δm data shape 8.99227e-02
4.9.7 Estimating the Background in the D+s → K+K−π+π0 Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.008 GeV. The sideband regions extend from 2.060 to 2.104 GeV
and 2.120 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.35
and the values for the scale parameters are presented in Table 4.34.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.012 GeV. The sideband regions extend from 0.1000 to
0.1318 GeV and 0.1558 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.36 and the values for the scale parameters are presented in
Table 4.34.
The four different fits give us four estimates of the background in the signal
region. These are tabulated in Table 4.35.
99
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2
2.5
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0π ±π - K+ K→ ±s Distributions in Mode DBCm
Signal MC: 6 Entries
Continuum MC: 3 Entries
Generic MC: 19 Entries
Continuum MC: 3 Entries
Data: 21 Entries
Figure 4.35: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →K+K−π+π0 mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
Table 4.35: Estimates of the background in the signal region of the D+s →K+K−π+π0 mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
K+K−π+π0 1.78 ± 0.49 1.63 ± 0.45 2.54 ± 0.54 1.99 ± 0.43
100
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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0π ±π - K+ K→ ±sm Distributions in Mode Dδ
Signal MC: 5 Entries
Continuum MC: 2 Entries
Generic MC: 18 Entries
Conversion MC: 4 Entries
Data: 31 Entries
Figure 4.36: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →K+K−π+π0 mode. The data, blinded in the signal region, isoverlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
101
4.9.8 Estimating the Background in the D+s → π+π−π+ Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.008 GeV. The sideband regions extend from 2.060 to 2.104 GeV
and 2.120 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.37
and the values for the scale parameters are presented in Table 4.36.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.012 GeV. The sideband regions extend from 0.1000 to
0.1318 GeV and 0.1558 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.38 and the values for the scale parameters are presented in
Table 4.36.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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±π -π +π → ±s Distributions in Mode DBCm
Signal MC: 4 Entries
Continuum MC: 17 Entries
Generic MC: 3 Entries
Continuum MC: 17 Entries
Data: 17 Entries
Figure 4.37: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →π+π−π+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
The four different fits give us four estimates of the background in the signal
region. These are tabulated in Table 4.37.
102
Table 4.36: Maximum likelihood fit parameters to estimate background inthe D+s → π+π−π+ mode
Scale for Shape Value
mBC MC shape 1.55698e-01
δm MC shape 1.40353e-01
mBC data shape 1.05085e-01
δm data shape 8.56409e-02
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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5
6
±π -π +π → ±sm Distributions in Mode Dδ
Signal MC: 4 Entries
Continuum MC: 11 Entries
Generic MC: 2 Entries
Conversion MC: 2 Entries
Data: 29 Entries
Figure 4.38: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →π+π−π+ mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
Table 4.37: Estimates of the background in the signal region of the D+s →π+π−π+ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
π+π−π+ 1.64 ± 0.48 1.50 ± 0.43 2.42 ± 0.53 1.90 ± 0.41
103
4.9.9 Estimating the Background in the D+s → K∗+K∗0; K∗+ →
K0Sπ+; K∗0 → K−π+ Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.010 GeV. The sideband regions extend from 2.060 to 2.102 GeV
and 2.122 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.39
and the values for the scale parameters are presented in Table 4.38.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.016 GeV. The sideband regions extend from 0.1000 to
0.1278 GeV and 0.1598 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.40 and the values for the scale parameters are presented in
Table 4.38.
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*0K*pm K→ ±s Distributions in Mode DBCm
Signal MC: 2 Entries
Continuum MC: 1 Entries
Generic MC: 8 Entries
Continuum MC: 1 Entries
Data: 15 Entries
Figure 4.39: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →K∗+K∗0 mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
The four different fits give us four estimates of the background in the signal
104
Table 4.38: Maximum likelihood fit parameters to estimate background inthe D+s → K∗+K∗0 mode
Scale for Shape Value
mBC MC shape 1.25192e-01
δm MC shape 1.12174e-01
mBC data shape 7.22271e-02
δm data shape 5.82375e-02
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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*0K*pm K→ ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 0 Entries
Generic MC: 5 Entries
Conversion MC: 1 Entries
Data: 20 Entries
Figure 4.40: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →K∗+K∗0 mode. The data, blinded in the signal region, is over-laid in magenta points. The black and magenta curves are MCand data shapes scaled by maximum likelihood to the points ofdata in the sideband regions.
region. These are tabulated in Table 4.39.
105
Table 4.39: Estimates of the background in the signal region of the D+s →K∗+K∗0 mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
K∗+K∗0 1.65 ± 0.55 1.50 ± 0.50 2.21 ± 0.61 1.72 ± 0.48
106
4.9.10 Estimating the Background in the D+s → ηρ+; η →
γγ; ρ+ → π+π0 Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.008 GeV. The sideband regions extend from 2.060 to 2.104 GeV
and 2.120 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.41
and the values for the scale parameters are presented in Table 4.40.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.010 GeV. The sideband regions extend from 0.1000 to
0.1338 GeV and 0.1538 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.42 and the values for the scale parameters are presented in
Table 4.40.
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0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Distributions in Mode DBCm
Signal MC: 8 Entries
Continuum MC: 24 Entries
Generic MC: 8 Entries
Continuum MC: 24 Entries
Data: 32 Entries
Figure 4.41: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →ηρ+; η → γγ; ρ+ → π+π0 mode. The data, blinded in the signalregion, is overlaid in magenta points. The black and magentacurves are MC and data shapes scaled by maximum likelihoodto the points of data in the sideband regions.
The four different fits give us four estimates of the background in the signal
107
Table 4.40: Maximum likelihood fit parameters to estimate background inthe D+s → ηρ+; η→ γγ; ρ+ → π+π0 mode
Scale for Shape Value
mBC MC shape 2.59496e-01
δm MC shape 2.33921e-01
mBC data shape 1.65995e-01
δm data shape 1.36454e-01
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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5
0π ±π → ±ρ, γ γ → η, ±ρ η → ±sm Distributions in Mode Dδ
Signal MC: 7 Entries
Continuum MC: 22 Entries
Generic MC: 8 Entries
Conversion MC: 6 Entries
Data: 49 Entries
Figure 4.42: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →ηρ+; η → γγ; ρ+ → π+π0 mode. The data, blinded in the signalregion, is overlaid in magenta points. The black and magentacurves are MC and data shapes scaled by maximum likelihoodto the points of data in the sideband regions.
region. These are tabulated in Table 4.41.
108
Table 4.41: Estimates of the background in the signal region of the D+s →ηρ+; η→ γγ; ρ+ → π+π0 mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
ηρ+ 2.74 ± 0.61 2.50 ± 0.56 3.19 ± 0.54 2.52 ± 0.43
109
4.9.11 Estimating the Background in the D+s → η′π+; η′ → ρ0γ
Mode
The signal region in the mBC distribution of this mode is centered at 2.112 GeV
with a width of 0.008 GeV. The sideband regions extend from 2.060 to 2.104 GeV
and 2.12 to 2.155 GeV. The maximum likelihood fits are displayed in Fig. 4.43
and the values for the scale parameters are presented in Table 4.42.
The signal region in the δm distribution of this mode is centered at 0.1438
GeV with a width of 0.014 GeV. The sideband regions extend from 0.1000 to
0.1298 GeV and 0.1578 to 0.2500 GeV. The maximum likelihood fits are dis-
played in Fig. 4.44 and the values for the scale parameters are presented in
Table 4.42.
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γ 0ρ →’ η’, η ±π → ±s Distributions in Mode DBCm
Signal MC: 3 Entries
Continuum MC: 16 Entries
Generic MC: 4 Entries
Continuum MC: 16 Entries
Data: 22 Entries
Figure 4.43: The various backgrounds and signal MC expected in thevicinity of the signal region in mBC distribution of the D+s →η′π+; η′ → ρ0γ mode. The data, blinded in the signal region,is overlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
The four different fits give us four estimates of the background in the signal
110
Table 4.42: Maximum likelihood fit parameters to estimate background inthe D+s → η′π+; η′ → ρ0γ mode
Scale for Shape Value
mBC MC shape 1.81647e-01
δm MC shape 1.63745e-01
mBC data shape 6.66708e-02
δm data shape 5.37577e-02
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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γ 0ρ →’ η’, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 15 Entries
Generic MC: 4 Entries
Conversion MC: 2 Entries
Data: 19 Entries
Figure 4.44: The various backgrounds and signal MC expected in thevicinity of the signal region in δm distribution of the D+s →η′π+; η′ → ρ0γ mode. The data, blinded in the signal region,is overlaid in magenta points. The black and magenta curvesare MC and data shapes scaled by maximum likelihood to thepoints of data in the sideband regions.
region. These are tabulated in Table 4.43.
111
Table 4.43: Estimates of the background in the signal region of the D+s →η′π+; η′ → ρ0γ mode using four fits outlined above.
Mode mBC δm
MC shape data shape MC shape data shape
η′π+ 1.92 ± 0.51 1.75 ± 0.47 1.79 ± 0.52 1.39 ± 0.40
112
4.9.12 Summary of Estimated Background in the Various
Modes
Given that we determined the shape of the mBC distribution in Section 4.9.1 with-
out loosening other cuts, that the distribution itself is less peaked, and that the
difference between the predictions of the MC shape and data shape is lower
than in the δm distribution, we choose to use the predictions of this distribution
as the primary estimate of the backgrounds in each mode.
For each mode, we quote the mean of the MC shape and data shape predic-
tions in the mBC distribution as the estimate of the background we expect in the
signal region for that mode. The statistical errors from these two predictions
are averaged to obtain the statistical error for this estimate. The absolute value
of the difference between this estimate and the mean of the predictions from
the two shapes in the δm distribution is quoted as the systematic error. This is
tabulated for each mode in Table 4.44
4.9.13 Predicted Signal Significances
It is clear from our optimization and background estimation studies that we do
not expect equally significant results from each of the hadronic decay modes
we are studying. For instance, it is clear that the D+s → K+K−π+ decay mode will
contribute more significantly than any other mode due to the marked excess
of expected signal yield over the estimated background in its signal region. It
therefore behooves us to establish a clear measure of signal significance over es-
timated background, calculate what signal significance we expect in each mode
113
Table 4.44: Summary of the estimates for the background in the signal re-gion for all the modes we have studied.
Mode mBC δmBackground ± (Stat) ± (Syst)
MC Shape Data Shape MC Shape Data Shape
K+K−π+ 1.10 ± 0.39 1.00 ± 0.35 2.06 ± 0.49 1.61 ± 0.38 1.05 ± 0.37 ± 0.79
KS K+ 0.90 ± 0.45 0.80 ± 0.40 0.12 ± 0.12 0.10 ± 0.10 0.85 ± 0.43 ± 0.74
ηπ+ 1.48 ± 0.74 1.32 ± 0.66 1.02 ± 0.39 0.79 ± 0.30 1.40 ± 0.70 ± 0.49
η′π+; η′ → π+π−η 0.00 + 0.68 0.00 + 0.59 0.00 + 0.34 0.00 + 0.26 0.00 + 0.63 + 0.00
K+K−π+π0 1.78 ± 0.49 1.63 ± 0.45 2.54 ± 0.54 1.99 ± 0.43 1.70 ± 0.47 ± 0.56
π+π−π+ 1.64 ± 0.48 1.50 ± 0.43 2.42 ± 0.53 1.90 ± 0.41 1.57 ± 0.45 ± 0.59
K∗+K∗0 1.65 ± 0.55 1.50 ± 0.50 2.21 ± 0.61 1.72 ± 0.48 1.58 ± 0.53 ± 0.40
ηρ+ 2.74 ± 0.61 2.50 ± 0.56 3.19 ± 0.54 2.52 ± 0.43 2.62 ± 0.59 ± 0.23
η′π+; η′ → ρ0γ 1.92 ± 0.51 1.75 ± 0.47 1.79 ± 0.52 1.39 ± 0.40 1.84 ± 0.49 ± 0.25
based on a Monte Carlo estimate of the signal and the background we’ve esti-
mated from data in section 4.9.12, and converge on a group of modes to unblind
together in order to achieve the most significant result.
In order to establish a measure of our signal significance, we assume that
the uncertainty in our estimated background is shaped as a Gaussian with a
standard deviation equal to the quadrature sum of the statistical and systematic
uncertainties in the estimated background. Then we calculate the Poisson prob-
ability of such a background fluctuating to higher than the number of events
we find in the signal region on unblinding. In effect, we convolute a Gaussian
smeared background with a Poisson distribution to model the probability of it
fluctuating to the yield we see in data. So, if we call the background estimate b
with a standard deviation of σ, and unblind our data to discover n events in the
signal region, we may estimate the probability for it to be a fluctuation of the
background as P given in Eq. 4.21. We may express this probability, P, in terms
114
of the number of standard deviations in a Gaussian that one must go out to in
order to exclude a region of such probability, and we will use this number as a
measure of signal significance.
P(b, σ, n) =∑i=∞
i=n∫ x=∞
x=0xi
i! e−[x+ 12 ( x−b
σ )2]dx∫ x=∞
x=0 e− 12 ( x−b
σ)2
dx(4.21)
The signal significance projected for each individual hadronic decay mode of
the D+s is tabulated in Table 4.45. The uncertainty on the estimated background is
the quadrature sum of the statistical and systematic uncertainties. The projected
signal is estimated by Monte Carlo simulation. As expected, the D+s → K+K−π+
mode is projected to give us the highest signal significance among individual
modes of 5.40. However, we notice that summing all modes can give us a sig-
nificance of 6.39, which is higher than any of the individual mode. Therefore,
we choose to unblind data in all the modes in order to attain the highest signal
significance if we make an observation.
115
Table 4.45: The projected signal significance expected for each individualhadronic decay mode of the D+s , as well as modes combined.
Hadronic Decay Mode Estimated Background Projected Signal Signal Significance
K+K−π+ 1.05 ± 0.37 ± 0.79 13.65 5.40
KS K+ 0.85 ± 0.43 ± 0.74 3.02 1.95
ηπ+ 1.40 ± 0.70 ± 0.49 1.81 1.25
η′π+; η′ → π+π−η 0.00 + 0.63 + 0.00 1.20 0.98
K+K−π+π0 1.70 ± 0.47 ± 0.56 4.85 2.71
π+π−π+ 1.57 ± 0.45 ± 0.59 3.75 2.03
K∗+K∗0 1.58 ± 0.53 ± 0.40 1.99 1.65
ηρ+; η→ γγ 2.62 ± 0.59 ± 0.23 5.49 2.59
η′π+; η′ → ρ0γ 1.84 ± 0.49 ± 0.25 2.42 1.52
Combination of All Modes 12.60 ± 2.50 ± 1.08 38.18 6.39
116
4.10 Signal Yields and Selection Efficiencies for D∗+s → D+s γ
In this section, we measure the selection efficiencies and yields for D∗+s → D+s γ
where the D+s decays through the 9 hadronic decays modes we have focused on
for this analysis. For all modes, we begin by generating a Monte Carlo sample of
D∗+s → D+s γ where the D+s is forced to decay through the mode we are investigat-
ing while the D−s is allowed to decay generically. Selection criteria very similar
to those used for the corresponding D∗+s → D+s e+e− analysis are used, though
with a wider δm selection criterion. The reason for this can be seen from the δm
distribution of the K+K−π+ channel as shown in Fig. 4.45. The low-end tail im-
plies that a loss in the reconstructed energy of photons is expected. This may not
be well modeled in Monte Carlo simulations, and to avoid possible discrepan-
cies between simulations and data in that region, a larger region containing the
peak is selected. Next, we study the mBC distribution of various backgrounds
where the D∗+s is incorrectly reconstructed using the D−s . These backgrounds are
accounted for in data before calculating the signal yield for each mode, as sum-
marized in Table 4.46 along with the signal selection efficiencies. A similar sum-
mary for the generic MC is presented in Table 4.47. Discrepancies between the
recovered branching fractions and the value for it programmed into the Generic
Monte Carlo simulation result from inconsistencies between the decay models
of the D+s in the Generic Monte Carlo and our signal Monte Carlo simulations.
The manner in which we measure our signal selection efficiency and evaluate
the various backgrounds before we estimate the signal yield is described in de-
tail for the K+K−π+ mode.
117
Table 4.46: Signal yields and efficiencies for D∗+s → D+s γ from all the modesof decay of the D+s relevant for our measurement of the ratioB(D∗+s → D+s e+e−)/B(D∗+s → D+s γ). B(D+s → i) is the knownbranching fraction for D+s to decay via the ith hadronic modewe are studying. ε i
Dsγis the efficiency of our selection criteria
for the mode. N iDsγ
is the signal yield observed for this mode.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ± (stat) ± (syst)
K+K−π+ 0.055 ± 0.0028 0.339 ± 0.002 9114 ± 110 ± 201
KS K+ 0.0149 ± 0.0009 0.2573 ± 0.0004 1902 ± 57 ± 45
D+s → ηπ+; η→ γγ 0.00621 ± 0.00083 0.3310 ± 0.0015 1037 ± 46 ± 37
D+s → η′π+; η′ → π+π−η; η→ γγ 0.00666 ± 0.00070 0.2101 ± 0.0013 691 ± 34 ± 40
D+s → K+K−π+π0 0.056 ± 0.005 0.1225 ± 0.0010 3592 ± 118 ± 72
D+s → π+π−π+ 0.0111 ± 0.0008 0.4583 ± 0.0018 2745 ± 93 ± 52
D+s → K∗+K∗0 0.0164 ± 0.0012 0.1913 ± 0.0012 1570 ± 74 ± 13
D+s → ηρ+; η→ γγ; ρ+ → π+π0 0.0348 ± 0.0031 0.1839 ± 0.0013 3170 ± 161 ± 313
D+s → η′π+; η′ → ρ0γ 0.0112 ± 0.0012 0.3171 ± 0.0015 1531 ± 80 ± 122
118
Table 4.47: Signal yields and efficiencies for D∗+s → D+s γ from all the modesof decay of the D+s relevant for our measurement of the ra-tio B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) in Generic Monte Carlo.B(D+s → i) is the known branching fraction for D+s to decay viathe ith hadronic mode we are studying. ε i
Dsγis the efficiency of
our selection criteria for the mode. N iDsγ
is the signal yield ob-served for this mode. B(D∗+s → D+s γ) is the branching fractionfor D∗+s → D+s e+e− inferred from this mode. Error [1] on theinferred branching fraction is the statistical error from the fi-nal fit. Error [2] encapsulates the systematic uncertainties fromthe signal efficiency and the uncertainty in the number of pro-duced generic MC events as described in Section 4.4.1.
i (Mode) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ)
K+K−π+ 0.0537 0.339 ± 0.002 9364 ± 40 0.9259 ± 0.0040[1] ± 0.0043[2]
KS K+ 0.01465 0.25727 ± 0.00043 2006 ± 17 0.9581 ± 0.0083[1] ± 0.0018[2]
D+s → ηπ+; η→ γγ 0.0061 0.3310 ± 0.0015 998 ± 27 0.8933 ± 0.0240[1] ± 0.0043[2]
D+s → η′π+; η′ → π+π−η; η→ γγ 0.00633 0.2101 ± 0.0013 690 ± 11 0.9341 ± 0.0149[1] ± 0.0058[2]
D+s → K+K−π+π0 0.0525 0.1225 ± 0.0010 3178 ± 49 0.8894 ± 0.0138[1] ± 0.0073[2]
D+s → π+π−π+ 0.0103 0.4583 ± 0.0018 2706 ± 43 1.0327 ± 0.0162[1] ± 0.0041[2]
D+s → K∗+K∗0 0.01628 0.1913 ± 0.0012 1644 ± 22 0.9502 ± 0.0129[1] ± 0.0058[2]
D+s → ηρ+; η→ γγ; ρ+ → π+π0 0.0298 0.1839 ± 0.0013 2993 ± 87 0.9829 ± 0.0284[1] ± 0.0070[2]
D+s → η′π+; η′ → ρ0γ 0.0111 0.3171 ± 0.0015 1930 ± 45 0.9886 ± 0.0231[1] ± 0.0049[2]
119
Table 4.48: Selection criteria for D∗+s → D+s γ events where D+s → K+K−π+.The δm cut has been widened to accommodate the wider peakfor the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.011 GeV
δm 0.140 ± 0.02 GeV
γ Shower Energy 10 MeV to 2.0 GeV
γ Hot Crystals None
Tracks Matched to γ None
γ E9/E25 Unfolded 99 percentile
4.10.1 D+s → K+K−π+
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s
decays to K+K−π+ and the D−s is allowed to decay generically. The selection
criteria applied are tabulated in Table 4.48. Instead of the cuts on ∆d0 and ∆φ0,
which are applicable to the soft e+e− pair, we have some selection criteria on
the γ that is kept common across all modes of decay of the D+s and shall not be
repeated in subsequent tables of this section. A plot of the δm distribution is
presented in Fig. 4.45.
To obtain the selection efficiency using the condition on mBC as our last se-
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.46. For a handle on the
shape of the peak in this plot, we produce one more plot – that of mBC where the
D+s and the photon are matched to their generated counterparts in the Monte
Carlo simulation. This plot, shown in Fig. 4.47, is fitted to a Crystal Ball func-
tion of the form given in Eq. 4.22 that has the power law shoulder on the higher
120
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
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0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018
0.02
KKpi→ s, Dγ s D→ *sm Distribution in Signal Sample of Dδ
h_DeltaM_converEntries 123021Mean 0.1328RMS 0.02796
KKpi→ s, Dγ s D→ *sm Distribution in Signal Sample of Dδ
Figure 4.45: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+. The plot is normalized so asto directly read out the efficiency of the δm selection criterion.
side of the central peak and also contains a wide Gaussian on this shoulder. The
shape of this peak is attenuated by a scaling factor and added to a background
shape modeled by Eq. 4.23 to fit the mBC distribution of the signal Monte Carlo
between 2.08 and 2.15 GeV as shown in 4.46. The signal efficiency of our selec-
tion criteria is read off from this plot as the integral of the fit to the data within
the marked region minus the background curve within that region.
f (x; x0, σ0, α, n,N0, x1, σ1,N1) = N1 exp(
− (x − x1)2
2σ21
)
+ N0 ·
A ·(
B + x−x0σ0
)−n, for α <
x−x0σ0
exp(
− (x−x0)2
2σ20
)
, for x−x0σ0≤ α
(4.22)
where
A =(nα
)nexp
(
−α2
2
)
,
B = nα− α
121
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0
0.01
0.02
0.03
0.04
0.05
0.06
±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 131187Mean 2.112RMS 0.01754
±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.46: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+. The plot is normalized so asto directly read out the efficiency of the mBC selection criterion.
f (x; x0, p,C0,C1,C2,C3) = (C0 + C1x + C2x2+ C3x3)(x − x0)p, 0 < p < 1 (4.23)
The mBC distribution in data contains more features than just a signal peak.
A structured background emerges from events where our selection criteria re-
constructs the D∗+s incorrectly using the D−s and the γ. The D−s would then have
been reconstructed from its decay to K+K−π−. A Monte Carlo sample where the
D∗+s decays to D+s γ but only the D−s is forced to decay to K+K−π− is generated
to help us model this background in data. For reasons that will soon become
clear, this background is decomposed into two components. The first includes
cases where the D−s and the photon are matched to their generated counterparts
in Monte Carlo. The mBC distribution of these events is shown in Fig. 4.48. The
second component includes cases where the D−s has been matched but the pho-
ton failed to match the photon from the D∗+s decay at the generator level of the
122
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eV
0
0.01
0.02
0.03
0.04
0.05
0.06
±π - K+ K→ ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 67120Mean 2.114RMS 0.005232
±π - K+ K→ ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.47: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+.
Monte Carlo simulation. These events have mBC distributed as shown in Fig.
4.49. These two components are cleft apart and fitted separately in data because
there is no reason for such combinatorial backgrounds to maintain the same
ratio to one another as modeled in our privately produced Monte Carlo.
Fig. 4.48 is fitted to a function that contains a Crystal Ball shape with the
power law on the high side, a wide Gaussian on the high side, and another
Gaussian on the lower side of the center of the Crystal Ball as described by Eq.
4.24. The fit is restricted to 2.08 GeV < mBC < 2.15 GeV.
f (x; x0, σ0, α, n,N0, x1, σ1,N1, x2, σ2,N2) = N1 exp(
− (x − x1)2
2σ21
)
+ N0 ·
A ·(
B + x−x0σ0
)−n, for α < x−x0
σ0
exp(
− (x−x0)2
2σ20
)
, for x−x0σ0≤ α
123
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0
0.00005
0.0001
0.00015
0.0002
0.00025
±π - K+ K→ ±s Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 58236Mean 2.114RMS 0.009616
±π - K+ K→ ±s Wrong Sign with Matched Photon of DBCm
Figure 4.48: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and where both the D−s and the γ havebeen matched to their generated counterparts in the MonteCarlo simulation. This distribution has been fitted to a shapedescribed by Eq. 4.24.
+ N2 exp(
− (x − x2)2
2σ22
)
(4.24)
where
A =(nα
)nexp
(
−α2
2
)
,
B = nα− α
Fig. 4.49 is fitted to a function that contains a Crystal Ball centered around
the higher edge of the trapezoidal shape with the power law on the higher side
of the Gaussian, and continued analytically on the lower side with a straight
line as described by Eq. 4.25. The fit is restricted to 2.08GeV < mBC < 2.15GeV
124
GeV2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.00005
0.0001
0.00015
0.0002
0.00025
0.0003
0.00035
0.0004
±π - K+ K→ ±s Wrong Sign with Unmatched Photon of DBCm h_MBC_wrongConver_unmatched
Entries 150840Mean 2.108RMS 0.01801
±π - K+ K→ ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.49: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
f (x; x, σ, α, n, β,N) = N0 ·
A ·(
B + x−xσ
)−n, for α < x−x
σ
exp(
− (x−x)2
2σ2
)
, for β ≥ x−xσ≤ α
C + D x−xσ, for x−x
σ< β
(4.25)
where
A =(nα
)nexp
(
−α2
2
)
,
B = nα− α,
C =(
1 + β2
σ2
)
exp(
− β2
2σ2
)
,
D = −βσ2 exp
(
− β2
2σ2
)
125
Having established the shapes of the signal and various backgrounds, we
first study the mBC distribution of the Generic Monte Carlo sample to see how
well our fits fare in reproducing the branching fraction for B(D∗+s → D+s γ) that
had been programmed into the simulation. The plot of mBC and the fits of the
signal and various backgrounds to it are presented in Fig. 4.50. The lowest
curve is a function of the form given in Eq. 4.23 that models the continuum and
featureless combinatorial backgrounds. The curve above that is a scaled version
of the shape fitted to the plot in Fig. 4.48. Above that is a scaled version of
the shape fitted to the plot in Fig. 4.49. On top of these backgrounds lies the
signal peak, which is a scaled version of the shape fitted to Fig. 4.47. The fit is
restricted to the range 2.08 GeV < mBC < 2.15 GeV. The signal yield is measured
by the integral of the highest curve that includes the signal peak minus the in-
tegral of all the backgrounds between 2.08 and 2.15 GeV. This may be combined
with the efficiency of our selection criteria ε iDsγ
, the integrated luminosity of data
being used L, the cross section for producing D∗±s D∓s (values given in Section 4.4)
and the value for B(D+s → K+K−π+) programmed into the simulation to give us
an estimate for B(D∗+s → D+s γ) as tabulated in Table 4.49. We find the thus esti-
mated value for B(D∗+s → D+s γ) equal to 0.9259 ± 0.0058 to be 2.8σ away from the
programmed value of 0.942 in the Monte Carlo simulation.
We present the distribution of mBC in data in Fig. 4.51. It is fitted to the sig-
nal and background shapes as described in the previous paragraph. The ratio
of amplitudes for the signal peak shape to the shape for the incorrectly recon-
structed D∗+s with the photon strictly unmatched (second curve from the top) is
carried over as a constant from the fit to the generic MC. A systematic uncer-
tainty is evaluated by repeating this fit without such constraints on the ratio.
The signal yield is measured by subtracting the integral of all the backgrounds
126
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
500
1000
1500
2000
±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 984743Mean 2.105RMS 0.02466
h_MBC_genericEntries 984743Mean 2.105RMS 0.02466
±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.50: Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+in 586 pb−1 of Generic Monte Carlo.
Table 4.49: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Error[2] encapsulates the systematic uncertainties from the signal ef-ficiency and the uncertainty in the number of produced genericMC events.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
K+K−π+ 0.0537 0.339 ± 0.002 9364 ± 40 0.9259 ± 0.0040[1] ± 0.0043[2]
from the integral of the total fit between 2.08 and 2.15 GeV, as described earlier.
We do not present any calculation of the branching fraction B(D∗+s → D+s γ) as we
have no measure of the systematic uncertainty arising from the reconstruction
of the D+s . We expect this systematic uncertainty to cancel in our final calculation
of the ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ). Arriving at a
result for this ratio will only require us to report the signal yields and efficiencies
for D∗+s → D+s γ for each of the decay modes of the D+s .
127
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0200400600800
1000120014001600180020002200
±π - K+ K→ ±s
, Dγ ±s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 57324Mean 2.105RMS 0.02503
±π - K+ K→ ±s
, Dγ ±s D→±*
s Distribution in Data for DBCm
Figure 4.51: Distribution of mBC of D∗+s → D+s γ events where D+s → K+K−π+in 586 pb−1 of data.
Table 4.50: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in data observed for this mode.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ± (stat) ± (syst)
K+K−π+ 0.055 ± 0.0028 0.339 ± 0.002 9114 ± 110 ± 201
128
Table 4.51: Selection criteria for D∗+s → D+s γ events where D+s → KS K+. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.008 GeV
δm 0.140 ± 0.02 GeV
4.10.2 D+s → KS K+
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s →
KS K+ and the D−s is allowed to decay generically. The selection criteria applied
are tabulated in Table 4.51. Fig. 4.52 depicts the δm distribution of this signal
sample and the region selected by our criterion.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
± K0S K→ ±
s, Dγ±s D→
±*sm Distribution in Signal Sample of Dδ
h_DeltaM_converEntries 1228275Mean 0.1306RMS 0.03036
± K0S K→ ±
s, Dγ±s D→
±*sm Distribution in Signal Sample of Dδ
Figure 4.52: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion.
To obtain the selection efficiency using the condition on mBC as our last se-
lection criterion, we produce a plot of the mBC distribution of the signal sample,
129
having applied all other criteria, as shown in Fig. 4.53. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.54. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.01
0.02
0.03
0.04
0.05
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Signal Sample of DBCm
h_MBC_converEntries 837283Mean 2.113RMS 0.01593
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Signal Sample of DBCm
Figure 4.53: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+. The plot is normalized so as todirectly read out the efficiency of the mBC selection criterion.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.55 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.56 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
4.57. Our measurement of the signal selection efficiency and the signal yield
130
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ienc
y / M
eV
0
0.005
0.01
0.015
0.02
0.025
0.03
0.035
0.04
0.045
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Matched Signal Sample ofDBCm
h_MBC_conver_matched
Entries 485944Mean 2.114RMS 0.005168
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Matched Signal Sample ofDBCm
Figure 4.54: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → KS K+.
Table 4.52: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in generic Monte Carlo observed for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Error[2] encapsulates the systematic uncertainties from the signal ef-ficiency and the uncertainty in the number of produced genericMC events.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
KS K+ 0.01465 0.25727 ± 0.00043 2006 ± 17 0.9581 ± 0.0083[1] ± 0.0018[2]
is presented in Table 4.52. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.9616 ± 0.0085 to be 2.3σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.51. Our
measurements of the signal efficiency and signal yield are presented in Table
131
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ienc
y / M
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0
0.00001
0.00002
0.00003
0.00004
0.00005
0.00006
± K0S K→ ±
s Wrong Sign with Matched Photon of DBCmh_MBC_wrongConver_matched
Entries 12498Mean 2.114RMS 0.009609
± K0S K→ ±
s Wrong Sign with Matched Photon of DBCm
Figure 4.55: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
Table 4.53: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in data observed for this mode.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
KS K+ 0.0149 ± 0.0009 0.2573 ± 0.0004 1902 ± 57 ± 45
4.53.
132
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ienc
y / M
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0
0.00001
0.00002
0.00003
0.00004
0.00005
0.00006
0.00007
0.00008
± K0S K→ ±
s Wrong Sign with Unmatched Photon of DBCmh_MBC_wrongConver_unmatched
Entries 25672Mean 2.11RMS 0.01763
± K0S K→ ±
s Wrong Sign with Unmatched Photon of DBCm
Figure 4.56: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
100
200
300
400
500
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in generic for DBCm
h_MBC_genericEntries 165846Mean 2.106RMS 0.02408
h_MBC_genericEntries 165846Mean 2.106RMS 0.02408
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in generic for DBCm
Figure 4.57: Distribution of mBC of D∗+s → D+s γ events where D+s → KS K+ in586 pb−1 of Generic Monte Carlo.
133
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
100
200
300
400
500
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Data for DBCm
h_MBC_physicsEntries 9954Mean 2.106RMS 0.02385
± K0S K→ ±
s, Dγ ±s D→
±*s Distribution in Data for DBCm
Figure 4.58: Distribution of mBC of D∗+s → D+s γ events where D+s → KS K+ in586 pb−1 of data.
134
Table 4.54: Selection criteria for D∗+s → D+s γ events where D+s → ηπ+; η →γγ. The δm cut has been widened to accomodate the wider peakfor the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.016 GeV
δm 0.140 ± 0.02 GeV
4.10.3 D+s → ηπ+; η→ γγ
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s →
ηπ+; η → γγ and the D−s is allowed to decay generically. The selection criteria
applied are tabulated in Table 4.54. Fig. 4.59 depicts the δm distribution of this
signal sample and the region selected by our criterion.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018
0.02
0.022γ γ → η, η ±π → ±
s, Dγ±s D→
±*sm Distribution in Signal Sample of Dδ
h_DeltaM_converEntries 168203Mean 0.1301RMS 0.03074
γ γ → η, η ±π → ±s, Dγ±
s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.59: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η → γγ. The plot is normalizedso as to directly read out the efficiency of the δm selection cri-terion.
To obtain the selection efficiency using the condition on mBC as our last se-
135
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.60. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.61. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
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0.005
0.01
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0.02
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0.03
0.035
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γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 108925Mean 2.113RMS 0.01554
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.60: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η → γγ. The plot is normalizedso as to directly read out the efficiency of the mBC selectioncriterion from the area under the fit within the signal region.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.62 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.63 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
136
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ienc
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0
0.005
0.01
0.015
0.02
0.025
0.03
0.035
0.04
0.045γ γ → η, η ±π → ±
s, Dγ ±s D→
±*s Distribution in Matched Signal Sample ofDBCm
h_MBC_conver_matched
Entries 65111Mean 2.114RMS 0.005679
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.61: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηπ+; η→ γγ.
Table 4.55: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in generic Monte Carlo observed for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → ηπ+; η→ γγ 0.0061 0.3310 ± 0.0015 998 ± 27 0.8933 ± 0.0240[1] ± 0.0043[2]
4.64. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.55. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.893 ± 0.024 to be 2σ away from the programmed value of 0.942 in the
Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.65. Our
137
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0.000005
0.00001
0.000015
0.00002
0.000025
0.00003
0.000035
γ γ → η, η ±π → ±s Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 6635Mean 2.114RMS 0.009729
γ γ → η, η ±π → ±s Wrong Sign with Matched Photon of DBCm
Figure 4.62: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
measurements of the signal efficiency and signal yield are presented in Table
4.56.
138
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ienc
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eV
0
0.000005
0.00001
0.000015
0.00002
0.000025
0.00003
0.000035
γ γ → η, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm h_MBC_wrongConver_unmatched
Entries 11435Mean 2.11RMS 0.01772
γ γ → η, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.63: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
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ents
/ M
eV
0
50
100
150
200
250
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 101863Mean 2.103RMS 0.02774
h_MBC_genericEntries 101863Mean 2.103RMS 0.02774
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.64: Distribution of mBC of D∗+s → D+s γ events where D+s → ηπ+; η→γγ in 586 pb−1 of Generic Monte Carlo.
139
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150
200
250
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 9048Mean 2.103RMS 0.02694
γ γ → η, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCm
Figure 4.65: Distribution of mBC of D∗+s → D+s γ events where D+s → ηπ+; η→γγ in 586 pb−1 of data.
Table 4.56: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → ηπ+; η→ γγ 0.00621 ± 0.00083 0.3310 ± 0.0015 1037 ± 46 ± 37
140
Table 4.57: Selection criteria for D∗+s → D+s γ events where D+s → η′π+; η′ →π+π−η; η→ γγ. The δm cut has been widened to accomodate thewider peak for the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.011 GeV
δm 0.140 ± 0.020 GeV
4.10.4 D+s → η′π+; η′ → π+π−η; η→ γγ
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where
D+s → η′π+; η′ → π+π−η; η → γγ and the D−s is allowed to decay generically.
The selection criteria applied are tabulated in Table 4.57. Fig. 4.66 depicts the
δm distribution of this signal sample and the region selected by our criterion.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.002
0.004
0.006
0.008
0.01
0.012
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδh_DeltaM_converEntries 128441Mean 0.1274RMS 0.03308
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.66: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → π+π−η; η → γγ. The plot isnormalized so as to directly read out the efficiency of the δmselection criterion.
To obtain the selection efficiency using the condition on mBC as our last se-
141
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.67. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.68. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.005
0.01
0.015
0.02
0.025
0.03
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→
±*
s Distribution in Signal Sample of DBCm
h_MBC_converEntries 62602Mean 2.113RMS 0.01554
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→
±*
s Distribution in Signal Sample of DBCm
Figure 4.67: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → π+π−η; η → γγ. The plot isnormalized so as to directly read out the efficiency of the mBCselection criterion from the area under the fit within the signalregion.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.69 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.70 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
142
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ienc
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eV
0
0.005
0.01
0.015
0.02
0.025
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→
±*s
Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 37270Mean 2.114RMS 0.005654
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→
±*s
Distribution in Matched Signal Sample ofDBCm
Figure 4.68: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → π+π−η; η→ γγ.
Table 4.58: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → η′π+; η′ → π+π−η; η→ γγ 0.00633 0.2101 ± 0.0013 690 ± 11 0.9341 ± 0.0149[1] ± 0.0058[2]
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
4.71. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.58. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.934 ± 0.016 to be 0.5σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
143
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ienc
y / M
eV
0
0.000005
0.00001
0.000015
0.00002
γ γ → η, η -π +π →’ η’, η ±π → ±s Wrong Sign with Matched Photon of DBCm
h_MBC_wrongConver_matched
Entries 4171Mean 2.114RMS 0.009844
γ γ → η, η -π +π →’ η’, η ±π → ±s Wrong Sign with Matched Photon of DBCm
Figure 4.69: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.72. Our
measurements of the signal efficiency and signal yield are presented in Table
4.59.
144
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ienc
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eV
0
0.000005
0.00001
0.000015
0.00002
0.000025
γ γ → η, η -π +π →’ η’, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm
h_MBC_wrongConver_unmatched
Entries 8087Mean 2.11RMS 0.01773
γ γ → η, η -π +π →’ η’, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.70: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
20
40
60
80
100
120
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 44473Mean 2.11RMS 0.02106
h_MBC_genericEntries 44473Mean 2.11RMS 0.02106
γ γ → η, η -π +π →’ η’, η ±π → ±s
, Dγ ±s D→±*
s Distribution in generic for DBCm
Figure 4.71: Distribution of mBC of D∗+s → D+s γ events where D+s →η′π+; η′ → π+π−η; η→ γγ in 586 pb−1 of Generic Monte Carlo.
145
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ents
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0
20
40
60
80
100
120
140
γ γ → η, η -π +π →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 2410Mean 2.11RMS 0.01924
γ γ → η, η -π +π →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCm
Figure 4.72: Distribution of mBC of D∗+s → D+s γ events where D+s →η′π+; η′ → π+π−η; η→ γγ in 586 pb−1 of data.
Table 4.59: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield in data observed for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → η′π+; η′ → π+π−η; η→ γγ 0.00666 ± 0.00070 0.2101 ± 0.0013 691 ± 34 ± 40
146
Table 4.60: Selection criteria for D∗+s → D+s γ events where D+s → K+K−π+π0.The δm cut has been widened to accomodate the wider peak forthe signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.010 GeV
δm 0.140 ± 0.020 GeV
4.10.5 D+s → K+K−π+π0
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where
D+s → K+K−π+π0 and the D−s is allowed to decay generically. The selection crite-
ria applied are tabulated in Table 4.60. Fig. 4.73 depicts the δm distribution of
this signal sample and the region selected by our criterion.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.001
0.002
0.003
0.004
0.005
0.006
0.007
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδh_DeltaM_converEntries 52730Mean 0.1299RMS 0.03119
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.73: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0. The plot is normalized soas to directly read out the efficiency of the δm selection crite-rion.
To obtain the selection efficiency using the condition on mBC as our last se-
147
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.74. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.75. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
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0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018
0.02
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 65905Mean 2.11RMS 0.02151
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.74: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0. The plot is normalizedso as to directly read out the efficiency of the mBC selectioncriterion from the area under the fit within the signal region.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.76 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.77 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
148
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ienc
y / M
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0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 23505Mean 2.114RMS 0.006885
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.75: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K+K−π+π0.
Table 4.61: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → K+K−π+π0 0.0525 0.1225 ± 0.0010 3178 ± 49 0.8894 ± 0.0138[1] ± 0.0073[2]
4.78. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.61. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.889 ± 0.016 to be 3.3σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.79. Our
149
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ienc
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eV
0
0.00002
0.00004
0.00006
0.00008
0π ±π - K+ K→ ±s Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 19753Mean 2.113RMS 0.01085
0π ±π - K+ K→ ±s Wrong Sign with Matched Photon of DBCm
Figure 4.76: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
measurements of the signal efficiency and signal yield are presented in Table
4.62.
150
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ienc
y / M
eV
0
0.00002
0.00004
0.00006
0.00008
0.0001
0.00012
0.00014
0π ±π - K+ K→ ±s
Wrong Sign with Unmatched Photon of DBCm h_MBC_wrongConver_unmatched
Entries 59537Mean 2.106RMS 0.01931
0π ±π - K+ K→ ±s
Wrong Sign with Unmatched Photon of DBCm
Figure 4.77: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
200
400
600
800
1000
1200
1400
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 2012532Mean 2.099RMS 0.02981
h_MBC_genericEntries 2012532Mean 2.099RMS 0.02981
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.78: Distribution of mBC of D∗+s → D+s γ events where D+s →K+K−π+π0 in 586 pb−1 of Generic Monte Carlo.
151
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ents
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0
200
400
600
800
1000
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1400
1600
1800
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 131164Mean 2.099RMS 0.02989
0π ±π - K+ K→ ±s, Dγ ±
s D→±*
s Distribution in Data for DBCm
Figure 4.79: Distribution of mBC of D∗+s → D+s γ events where D+s →K+K−π+π0 in 586 pb−1 of data.
Table 4.62: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → K+K−π+π0 0.056 ± 0.005 0.1225 ± 0.0010 3592 ± 118 ± 72
152
Table 4.63: Selection criteria for D∗+s → D+s γ events where D+s → π+π−π+.The δm cut has been widened to accomodate the wider peakfor the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.012 GeV
δm 0.140 ± 0.020 GeV
4.10.6 D+s → π+π−π+
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s →
π+π−π+ and the D−s is allowed to decay generically. The selection criteria applied
are tabulated in Table 4.63. Fig. 4.80 depicts the δm distribution of this signal
sample and shows why the corresponding selection criterion had to be widened
relative to the D∗+s → D+s e+e− signal selection.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.005
0.01
0.015
0.02
0.025
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδh_DeltaM_converEntries 160419Mean 0.1341RMS 0.02688
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.80: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → π+π−π+. The plot is normalized so asto directly read out the efficiency of the δm selection criterion.
To obtain the selection efficiency using the condition on mBC as our last se-
153
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.81. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.82. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
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±π -π +π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 158636Mean 2.112RMS 0.01631
±π -π +π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.81: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → π+π−π+. The plot is normalized so asto directly read out the efficiency of the mBC selection criterionfrom the area under the fit within the signal region.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.83 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.84 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
154
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0.01
0.02
0.03
0.04
0.05
0.06
0.07
0.08
±π -π +π → ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 90795Mean 2.114RMS 0.005252
±π -π +π → ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.82: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → π+π−π+.
Table 4.64: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → π+π−π+ 0.0103 0.4583 ± 0.0018 2706 ± 43 1.0327 ± 0.0162[1] ± 0.0041[2]
4.85. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.64. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 1.0327 ± 0.0167 to be 5.4σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.86. Our
155
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0.00001
0.00002
0.00003
0.00004
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0.00007
0.00008
±π -π +π → ±s
Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 16878Mean 2.113RMS 0.009599
±π -π +π → ±s
Wrong Sign with Matched Photon of DBCm
Figure 4.83: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
measurements of the signal efficiency and signal yield are presented in Table
4.65.
156
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eV
0
0.00002
0.00004
0.00006
0.00008
0.0001
±π -π +π → ±s Wrong Sign with Unmatched Photon of DBCm h_MBC_wrongConver_unmatched
Entries 34669Mean 2.109RMS 0.01784
±π -π +π → ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.84: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
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ents
/ M
eV
0
200
400
600
800
1000
±π -π +π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 636947Mean 2.099RMS 0.02969
h_MBC_genericEntries 636947Mean 2.099RMS 0.02969
±π -π +π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.85: Distribution of mBC of D∗+s → D+s γ events where D+s → π+π−π+
in 586 pb−1 of Generic Monte Carlo.
157
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/ M
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0
200
400
600
800
1000
±π -π +π → ±s
, Dγ ±s D→
±*s Distribution in Data for DBCm
h_MBC_physicsEntries 64136Mean 2.099RMS 0.02951
±π -π +π → ±s
, Dγ ±s D→
±*s Distribution in Data for DBCm
Figure 4.86: Distribution of mBC of D∗+s → D+s γ events where D+s → π+π−π+
in 586 pb−1 of data.
Table 4.65: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → π+π−π+ 0.0111 ± 0.0008 0.4583 ± 0.0018 2745 ± 93 ± 52
158
Table 4.66: Selection criteria for D∗+s → D+s γ events where D+s → K∗+K∗0.The δm cut has been widened to accomodate the wider peakfor the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.006 GeV
mBC 2.112 ± 0.005 GeV
δm 0.140 ± 0.020 GeV
4.10.7 D+s → K∗+K∗0; K∗+ → K0Sπ+; K∗0 → K−π+
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s →
K∗+K∗0 and the D−s is allowed to decay generically. The selection criteria applied
are tabulated in Table 4.66. Fig. 4.87 depicts the δm distribution of this signal
sample and shows why the corresponding selection criterion had to be widened
relative to the D∗+s → D+s e+e− signal selection.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.002
0.004
0.006
0.008
0.01
0.012
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδh_DeltaM_converEntries 88847Mean 0.1308RMS 0.03006
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.87: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0. The plot is normalized so asto directly read out the efficiency of the δm selection criterion.
159
To obtain the selection efficiency using the condition on mBC as our last se-
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.88. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.89. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
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ienc
y / M
eV
0
0.005
0.01
0.015
0.02
0.025
0.03
0.035
*0K*pm K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 79839Mean 2.111RMS 0.01884
*0K*pm K→ ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.88: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0. The plot is normalized so asto directly read out the efficiency of the mBC selection criterionfrom the area under the fit within the signal region.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.90 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.91 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
160
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eV
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0.005
0.01
0.015
0.02
0.025
0.03
*0K*pm K→ ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 38056Mean 2.114RMS 0.00568
*0K*pm K→ ±s
, Dγ ±s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.89: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → K∗+K∗0.
Table 4.67: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → K∗+K∗0 0.01628 0.1913 ± 0.0012 1644 ± 22 0.9502 ± 0.0129[1] ± 0.0058[2]
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
4.92. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.67. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.950 ± 0.014 to be 0.6σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
We present the distribution of mBC in data and our fits to estimate the signal
161
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0
0.00001
0.00002
0.00003
0.00004
0.00005
*0K*pm K→ ±s Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 10429Mean 2.113RMS 0.01033
*0K*pm K→ ±s Wrong Sign with Matched Photon of DBCm
Figure 4.90: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.93. Our
measurements of the signal efficiency and signal yield are presented in Table
4.68.
162
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ienc
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eV
0
0.00001
0.00002
0.00003
0.00004
0.00005
0.00006
0.00007
*0K*pm K→ ±s Wrong Sign with Unmatched Photon of DBCm
h_MBC_wrongConver_unmatched
Entries 26422Mean 2.108RMS 0.01821
*0K*pm K→ ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.91: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
100
200
300
400
500
*0K*pm K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 468239Mean 2.101RMS 0.02853
h_MBC_genericEntries 468239Mean 2.101RMS 0.02853
*0K*pm K→ ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.92: Distribution of mBC of D∗+s → D+s γ events where D+s → K∗+K∗0in 586 pb−1 of Generic Monte Carlo.
163
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/ M
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0
100
200
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400
500
600
*0K*pm K→ ±s
, Dγ ±s D→
±*s Distribution in Data for DBCm
h_MBC_physicsEntries 31276Mean 2.101RMS 0.0289
*0K*pm K→ ±s
, Dγ ±s D→
±*s Distribution in Data for DBCm
Figure 4.93: Distribution of mBC of D∗+s → D+s γ events where D+s → K∗+K∗0in 586 pb−1 of data.
Table 4.68: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → K∗+K∗0 0.0164 ± 0.0012 0.1913 ± 0.0012 1570 ± 74 ± 13
164
Table 4.69: Selection criteria for D∗+s → D+s γ events where D+s → ηρ+. Theδm cut has been widened to accomodate the wider peak for thesignal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.015 GeV
δm 0.140 ± 0.020 GeV
4.10.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0
We begin with a Monte Carlo signal sample of D∗+s → D+s γ events where D+s →
ηρ+; η→ γγ; ρ+ → π+π0 and the D−s is allowed to decay generically. The selection
criteria applied are tabulated in Table 4.69. Fig. 4.94 depicts the δm distribution
of this signal sample and shows why the corresponding selection criterion had
to be widened relative to the D∗+s → D+s e+e− signal selection.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.001
0.002
0.003
0.004
0.005
0.006
0.007
0.008
0.009
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδh_DeltaM_converEntries 70624Mean 0.1301RMS 0.03088
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.94: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηρ+. The plot is normalized so as todirectly read out the efficiency of the δm selection criterion.
To obtain the selection efficiency using the condition on mBC as our last se-
165
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.95. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.96. The equations that parameterize all fits and the range they are fitted in are
identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
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ienc
y / M
eV
0
0.005
0.01
0.015
0.02
0.0250π ±π → ±ρ, γ γ → η, ±ρ η → ±
s, Dγ ±s D→
±*s Distribution in Signal Sample of DBCm
h_MBC_converEntries 86609Mean 2.112RMS 0.01977
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.95: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → ηρ+; η → γγ; ρ+ → π+π0. The plot isnormalized so as to directly read out the efficiency of the mBCselection criterion from the area under the fit within the signalregion.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.97 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.98 along with our fit to parameterize the shape.
As a check on how well our background and signal estimation performs, we
166
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ienc
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eV
0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018
0.02
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s
, Dγ ±s D→
±*s
Distribution in Matched Signal Sample ofDBCmh_MBC_conver_matched
Entries 35675Mean 2.114RMS 0.007945
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s
, Dγ ±s D→
±*s
Distribution in Matched Signal Sample ofDBCm
Figure 4.96: Distribution of mBC in the signal Monte Carlo sample of D∗+s →D+s γ events where D∗+s → D+s γ events where D+s → ηρ+; η →γγ; ρ+ → π+π0.
Table 4.70: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → ηρ+; η→ γγ; ρ+ → π+π0 0.0298 0.1839 ± 0.0013 2993 ± 87 0.9829 ± 0.0284[1] ± 0.0070[2]
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
4.99. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.70. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.983 ± 0.029to be 1.4σ away from the programmed value of 0.942 in
the Monte Carlo simulation.
167
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0.00001
0.00002
0.00003
0.00004
0.00005
0.00006
0.00007
0.00008
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 18269Mean 2.113RMS 0.01172
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Wrong Sign with Matched Photon of DBCm
Figure 4.97: Combinatorial background in the mBC distribution consistingof events where the D∗+s has been reconstructed out of the D−sand the γ, and where both the D−s and the γ have been matchedto their generated counterparts in the Monte Carlo simulation.This distribution has been fitted to a shape described by Eq.4.24.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.100.
Our measurements of the signal efficiency and signal yield are presented in Ta-
ble 4.71.
168
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ienc
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0
0.00002
0.00004
0.00006
0.00008
0.0001
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Wrong Sign with Unmatched Photon of DBCm
h_MBC_wrongConver_unmatched
Entries 36095Mean 2.109RMS 0.01926
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.98: Combinatorial background structured in the mBC distributionconsisting of events where the D∗+s has been reconstructed outof the D−s and the γ, and the D−s has been matched to its gener-ated counterpart but the γ has failed to match the photon fromthe D∗+s decay at the generator level of the Monte Carlo simu-lation. This distribution has been fitted to a shape describedby Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
200
400
600
800
1000
1200
1400
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s
, Dγ ±s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 1141283Mean 2.102RMS 0.02981
h_MBC_genericEntries 1141283Mean 2.102RMS 0.02981
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s
, Dγ ±s D→±*
s Distribution in generic for DBCm
Figure 4.99: Distribution of mBC of D∗+s → D+s γ events where D+s → ηρ+; η→γγ; ρ+ → π+π0 in 586 pb−1 of Generic Monte Carlo.
169
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200
400
600
800
1000
1200
1400
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 102004Mean 2.102RMS 0.02961
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCm
Figure 4.100: Distribution of mBC of D∗+s → D+s γ events where D+s →ηρ+; η→ γγ; ρ+ → π+π0 in 586 pb−1 of data.
Table 4.71: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → ηρ+; η→ γγ; ρ+ → π+π0 0.0348 ± 0.0031 0.1839 ± 0.0013 3170 ± 161 ± 313
170
Table 4.72: Selection criteria for D∗+s → D+s γ events where D+s → η′π+; η′ →ρ0γ. The δm cut has been widened to accomodate the widerpeak for the signal in this distribution.
Selection Criterion Cut Center ±Width
mD+s 1.969 ± 0.012 GeV
δm 0.140 ± 0.020 GeV
4.10.9 D+s → η′π+; η′ → ρ0γ
We begin with a Monte Carlo signal sample of D+s → η′π+; η′ → ρ0γ and the
D−s is allowed to decay generically. The selection criteria applied are tabulated
in Table 4.72. Fig. 4.101 depicts the δm distribution of this signal sample and
shows why the corresponding selection criterion had to be widened relative to
the D∗+s → D+s e+e− signal selection.
m (GeV)δ 0.06 0.08 0.1 0.12 0.14 0.16 0.18 0.2
Effic
ienc
y / M
eV
0
0.002
0.004
0.006
0.008
0.01
0.012
0.014
0.016
0.018 → ±
s, Dγ±
s D→±*sm Distribution in Signal Sample of Dδ
h_DeltaM_converEntries 115574Mean 0.1328RMS 0.02824
→ ±s
, Dγ±s D→±*
sm Distribution in Signal Sample of Dδ
Figure 4.101: Distribution of δm in the signal Monte Carlo sample of D∗+s →D+s γ events where D+s → η′π+; η′ → ρ0γ. The plot is normal-ized so as to directly read out the efficiency of the δm selec-tion criterion.
171
To obtain the selection efficiency using the condition on mBC as our last se-
lection criterion, we produce a plot of the mBC distribution of the signal sample,
having applied all other criteria, as shown in Fig. 4.102. We extract the shape
of the peak from the plot of mBC where the D+s and the photon are matched to
their generated counterparts in the Monte Carlo simulation as shown in Fig.
4.103. The equations that parameterize all fits and the range they are fitted in
are identical to those used in the K+K−π+ mode.
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.01
0.02
0.03
0.04
0.05
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCmh_MBC_converEntries 120133Mean 2.112RMS 0.01761
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Signal Sample of DBCm
Figure 4.102: Distribution of mBC in the signal Monte Carlo sample ofD∗+s → D+s γ events where D+s → η′π+; η′ → ρ0γ. The plotis normalized so as to directly read out the efficiency of themBC selection criterion from the area under the fit within thesignal region.
Structured backgrounds arising from incorrectly reconstructed D∗+s are sim-
ulated as done previously for the K+K−π+ mode. Fig. 4.104 shows the structure
of the D−s matched and photon matched background, and our fit to parameter-
ize this shape. The background with the D−s matched and a photon that failed
matching is shown in Fig. 4.105 along with our fit to parameterize the shape.
172
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.01
0.02
0.03
0.04
0.05γ 0ρ →’ η’, η ±π → ±
s, Dγ ±s D→
±*s Distribution in Matched Signal Sample ofDBCm
h_MBC_conver_matched
Entries 60580Mean 2.114RMS 0.006421
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Matched Signal Sample ofDBCm
Figure 4.103: Distribution of mBC in the signal Monte Carlo sample ofD∗+s → D+s γ events where D∗+s → D+s γ events where D+s →η′π+; η′ → ρ0γ.
Table 4.73: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in generic Monte Carlo for thismode. B(D∗+s → D+s γ) is the branching fraction for D∗+s →D+s e+e− inferred from this mode. Error [1] on the inferredbranching fraction is the statistical error from the final fit. Er-ror [2] encapsulates the systematic uncertainties from the signalefficiency, the integrated luminosity and the production crosssection for D∗±s D∓s .
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
B(D∗+s → D+s γ) Inferred
D+s → η′π+; η′ → ρ0γ 0.0111 0.3171 ± 0.0015 1930 ± 45 0.9886 ± 0.0231[1] ± 0.0049[2]
As a check on how well our background and signal estimation performs, we
present the overall fit to generic MC, as described for the K+K−π+ mode, in Fig.
4.106. Our measurement of the signal selection efficiency and the signal yield
is presented in Table 4.73. We find the thus estimated value for B(D∗+s → D+s γ)
equal to 0.989 ± 0.024 to be about 2σ away from the programmed value of 0.942
in the Monte Carlo simulation.
173
(GeV)BC m2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.00001
0.00002
0.00003
0.00004
0.00005
γ 0ρ →’ η’, η ±π → ±s
Wrong Sign with Matched Photon of DBCm h_MBC_wrongConver_matched
Entries 11431Mean 2.113RMS 0.01065
γ 0ρ →’ η’, η ±π → ±s
Wrong Sign with Matched Photon of DBCm
Figure 4.104: Combinatorial background in the mBC distribution consist-ing of events where the D∗+s has been reconstructed out ofthe D−s and the γ, and where both the D−s and the γ have beenmatched to their generated counterparts in the Monte Carlosimulation. This distribution has been fitted to a shape de-scribed by Eq. 4.24.
We present the distribution of mBC in data and our fits to estimate the signal
yield over the backgrounds, as described for the K+K−π+ mode, in Fig. 4.107.
Our measurements of the signal efficiency and signal yield are presented in Ta-
ble 4.74.
174
GeV2.04 2.06 2.08 2.1 2.12 2.14 2.16
Effic
ienc
y / M
eV
0
0.00001
0.00002
0.00003
0.00004
0.00005
0.00006
0.00007
γ 0ρ →’ η’, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm
h_MBC_wrongConver_unmatched
Entries 24519Mean 2.109RMS 0.01865
γ 0ρ →’ η’, η ±π → ±s Wrong Sign with Unmatched Photon of DBCm
Figure 4.105: Combinatorial background structured in the mBC distribu-tion consisting of events where the D∗+s has been recon-structed out of the D−s and the γ, and the D−s has beenmatched to its generated counterpart but the γ has failed tomatch the photon from the D∗+s decay at the generator levelof the Monte Carlo simulation. This distribution has beenfitted to a shape described by Eq. 4.25.
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
100
200
300
400
500
600
700
800
900
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCmh_MBC_genericEntries 691787Mean 2.099RMS 0.02988
h_MBC_genericEntries 691787Mean 2.099RMS 0.02988
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in generic for DBCm
Figure 4.106: Distribution of mBC of D∗+s → D+s γ events where D+s →η′π+; η′ → ρ0γ in 586 pb−1 of Generic Monte Carlo.
175
(GeV)BCm2.04 2.06 2.08 2.1 2.12 2.14 2.16
# Ev
ents
/ M
eV
0
100
200
300
400
500
600
700
800
900
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCmh_MBC_physicsEntries 65190Mean 2.1RMS 0.02984
γ 0ρ →’ η’, η ±π → ±s, Dγ ±
s D→±*
s Distribution in Data for DBCm
Figure 4.107: Distribution of mBC of D∗+s → D+s γ events where D+s →η′π+; η′ → ρ0γ in 586 pb−1 of data.
Table 4.74: ε iDsγ
is the efficiency of our selection criteria for the mode. N iDsγ
is the signal yield observed in data for this mode. B(D∗+s → D+s γ)is the branching fraction for D∗+s → D+s e+e− inferred from thismode. Error [1] on the inferred branching fraction is the statis-tical error from the final fit. Error [2] arises from the uncertaintyin the branching fraction for D+s → i. Error [3] encapsulatesthe systematic uncertainties from the signal efficiency, the inte-grated luminosity and the production cross section for D∗±s D∓s .Error [4] encapsulates the systematic error arising from the fit.
i (Decay Mode of D+s ) B(D+s → i) ε iDsγ
N iDsγ
D+s → η′π+; η′ → ρ0γ 0.0112 ± 0.0012 0.3171 ± 0.0015 1531 ± 80 ± 122
176
4.11 Un-blinding Data and Results
Having estimated, for each decay mode of the D+s , the background levels in the
signal region for the reconstruction of D∗+s → D+s e+e− (Section 4.9), the efficiency
of our selection criteria in reconstructing the D∗+s → D+s e+e− (Section 4.8), and the
yields and efficiencies of our selection criteria in reconstructing the D∗+s → D+s γ
(Section 4.10), we are now in a position to unblind our data and observe the
yield in the signal region of D∗+s → D+s e+e−. We unblind our data in the mBC
kinematic variable, as that is the variable we obtained our primary estimate of
the background from. We count the yield in the signal region and subtract off
the estimated background to determine the background subtracted yield. This
is tabulated in Table 4.75, along with the significance of observing such a signal
over the background and the number of signal events expected from Monte
Carlo simulations. The unblinded distributions of mBC for the individual modes
are presented in the following sub-sections.
The statistical and systematic uncertainties in the estimated backgrounds
have been derived in Section 4.9. The systematic uncertainties from the esti-
mated backgrounds simply carry over as the systematic uncertainties in the es-
timated number of signal events. The statistical uncertainties in the estimated
number of signal events is the quadrature sum, denoted by the symbol ⊕, of the
statistical uncertainties in the estimated background and one standard devia-
tion of the Poisson distribution with mean equal to the yields. That is,
∆N ie+e−(stat) = ∆Bi
e+e−(stat) ⊕ ∆Y ie+e−
where i refers to a hadronic decay mode of the D+s , ∆Y ie+e− =
√
Y ie+e− is the sta-
tistical uncertainty in the signal yield of data found in the signal region for the
ith mode, ∆Bie+e−(stat) is the statistical uncertainty in the number of background
177
Table 4.75: Data and estimated backgrounds in the signal region used toestimate the numbers of signal events found in each mode andthe corresponding significance of the signal. Expected numbersof signal events from Monte Carlo simulations also listed.
Mode Yield Found in the Estimated Background Subtracted Expected Signal Yield Signal
Signal Region Background Yield in Signal Region from Monte Carlo Significance
i Y ie+e− Bi
e+e− N ie+e−
± stat ± syst ± stat ± syst ± stat
K+K−π+ 14 1.05 ± 0.37 ± 0.79 12.95 ± 3.76 ± 0.79 13.65 ± 0.65 5.13
KS K+ 1 0.85 ± 0.43 ± 0.74 0.15 ± 1.09 ± 0.74 3.02 ± 0.15 0.73
ηπ+ 4 1.40 ± 0.70 ± 0.49 2.60 ± 2.12 ± 0.49 1.81 ± 0.08 1.66
η′π+; η′ → π+π−η 4 0.00 + 0.63 + 0.00 4.00 ± 2.10 ± 0.00 1.20 ± 0.06 2.68
K+K−π+π0 6 1.70 ± 0.47 ± 0.56 4.30 ± 2.49 ± 0.56 4.85 ± 0.29 2.34
π+π−π+ 7 1.57 ± 0.45 ± 0.59 5.43 ± 2.68 ± 0.59 3.75 ± 0.17 2.79
K∗+K∗0 4 1.58 ± 0.53 ± 0.40 2.42 ± 2.07 ± 0.40 1.99 ± 0.11 1.65
ηρ+ 7 2.62 ± 0.59 ± 0.23 4.38 ± 2.71 ± 0.23 5.49 ± 0.31 2.23
η′π+; η′ → ρ0γ 4 1.84 ± 0.49 ± 0.25 2.16 ± 2.06 ± 0.25 2.42 ± 0.12 1.52
Sum of all modes 51 12.61 ± 2.50 ± 1.08 38.39 ± 7.32 ± 1.53 38.18 ± 0.83 6.39
events to D∗+s → D+s e+e− we expected in the signal region for the ith mode, and
∆N ie+e−(stat) is the statistical uncertainty in the background subtracted yield in
our signal region for the ith mode.
We tabulate the signal yields and efficiencies for D∗+s → D+s e+e− and D∗+s →
D+s γ in Table 4.76. In it we compute and tabulate the ratio of branching fractions
K =B(D∗+s → D+s e+e−)
B(D∗+s → D+s γ)
for each mode using Eq. 4.26 and with all modes using Eq. 4.27.
K =(N i
e+e−
N iγ
)
ε iD+s γ
ε iD+s e+e−
(4.26)
K =(∑
i N ie+e−
∑
i N iγ
)
∑
i εiD+s γ
B(D+s → i)∑
i εiD+s e+e−B(D+s → i)
(4.27)
178
where K is the aforementioned ratio of branching fractions we’re trying to
measure, N iγ is the background subtracted yield of D∗+s → D+s γ events we find
in our signal region for the ith mode of D+s decay, and ε iD+s γ
encodes the detection
and selection efficiency for the D∗+s → D+s γ selection criteria, for the ith mode of
D+s decay.
Uncertainties in the ratio of branching fractions, K, are calculated for each
mode using Eq. 4.28 and Eq. 4.29.
(
∆K(stat)K
)2
=
(
∆N ie+e−(stat)N i
e+e−
)2
+
∆N iγ(stat)Nγ
2
(4.28)
(
∆K(syst)K
)2
=
(
∆N ie+e−(syst)N i
e+e−
)2
+
∆N iγ(syst)N iγ
2
+
∆ε iD+s e+e−
ε iD+s e+e−
2
+
∆ε iD+s γ
ε iD+s γ
2
(4.29)
Uncertainties in the ratio of branching fractions, K, are calculated using the
sum of all modes as follows. The statistical uncertainty depends solely on the
statistical uncertainties associated with the signal yields, N ie+e− and N i
γ. These
statistical uncertainties for each mode are tabulated in Table 4.76. Therefore, the
statistical uncertainty in K is calculated using Eq. 4.30.
(
∆K(stat)K
)2
=
∑
i(∆N ie+e−(stat))2
(∑i N ie+e−)2 +
∑
i(∆N iγ)2
(∑
i Nγ)2 (4.30)
For an estimate of the systematic error, we decompose Eq. 4.27 as
K =(∑
i N ie+e−
∑
i N iγ
) (
εγ
εe+e−
)
∑
i εiD+s
B(D+s → i)∑
i εiD+s
B(D+s → i)
(4.31)
where εγ and εe+e− are the reconstruction efficiencies for the photon and the e+e−
which are common to all modes of the D+s decay, and ε iD+s
is the reconstruction
179
Table 4.76: The ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s →D+s γ) inferred from the signal yields and efficiencies of each andall modes.
D+s Decay B(D+s → i) D∗+s → D+s e+e− D∗+s → D+s γ
K = B(D∗+s →D+s e+e−)B(D∗+s →D+s γ)Mode Signal Events Selection Efficiency Signal Events Selection Efficiency
i N ie+e− ε i
D+s e+e− N iγ ε i
D+s γ
± stat ± syst ± stat ± syst ± stat ± syst
K+K−π+ 0.0550 ± 0.0028 12.95 ± 3.76 ± 0.79 0.0730 ± 0.0019 9114 ± 110 ± 201 0.339 ± 0.002 0.0066 ± 0.0019 ± 0.0005
KS K+ 0.0149 ± 0.0009 0.15 ± 1.09 ± 0.74 0.0597 ± 0.0017 1902 ± 57 ± 45 0.2573 ± 0.0004 0.0003 ± 0.0025 ± 0.0017
ηπ+; η→ γγ 0.0062 ± 0.0008 2.60 ± 2.12 ± 0.49 0.0855 ± 0.0021 1037 ± 46 ± 37 0.3310 ± 0.0015 0.0097 ± 0.0079 ± 0.0019
η′π+; η′ → π+π−η; η→ γγ 0.0067 ± 0.0007 4.00 ± 2.10 ± 0.00 0.0530 ± 0.0016 691 ± 34 ± 40 0.2101 ± 0.0013 0.023 ± 0.0123 ± 0.0015
K+K−π+π0 0.056 ± 0.005 4.30 ± 2.49 ± 0.56 0.0255 ± 0.0011 3592 ± 118 ± 72 0.1225 ± 0.0010 0.0058 ± 0.0033 ± 0.0008
π+π−π+ 0.0111 ± 0.0008 5.43 ± 2.68 ± 0.59 0.0992 ± 0.0022 2745 ± 93 ± 52 0.4583 ± 0.0018 0.0091 ± 0.0045 ± 0.0010
K∗+K∗0 0.0164 ± 0.0012 2.42 ± 2.07 ± 0.40 0.0356 ± 0.0013 1570 ± 74 ± 13 0.1913 ± 0.0012 0.0083 ± 0.0071 ± 0.0014
ηρ+; η→ γγ; ρ+ → π+π0 0.0298 ± 0.0051 4.38 ± 2.71 ± 0.23 0.0316 ± 0.0013 3170 ± 161 ± 313 0.1839 ± 0.0013 0.0080 ± 0.0050 ± 0.0010
η′π+; η′ → ρ0γ 0.0112 ± 0.0012 2.16 ± 2.06 ± 0.25 0.064 ± 0.0018 1531 ± 80 ± 122 0.3171 ± 0.0015 0.0070 ± 0.0067 ± 0.0010
Sum of all modes 38.39 ± 7.32 ± 1.53 25351.03 ± 280.93 0.0072 ± 0.0014 ± 0.0003
180
efficiency for the D+s as it decays into the ith hadronic decay mode. This can be
simplified to
K =(∑
i N ie+e−
∑
i N iγ
) (
εγ
εe+e−
)
(4.32)
Therefore, we may estimate the systematic uncertainty in K as given in Eq. 4.33.(
∆K(syst)K
)2
=
∑
i(∆N ie+e−(syst))2
(∑i N ie+e−)2 ⊕
∑
i(∆N iγ(syst))2
(∑
i N iγ)2 ⊕
(
∆(εγ/εe+e−)εγ/εe+e−
)2
(4.33)
A plot of the mBC and δm distributions in unblinded data summed over all
modes are presented in Fig. 4.108 and Fig. 4.109. The data points are marked
by magenta points with error bars. The data-driven estimated backgrounds
are marked by the black and magenta curves. The cyan histograms mark the
expected signal yield. The agreement with data is remarkable. Histograms of
unblinded data in each of the individual modes are presented in the following
subsections.
Table 4.75 summarizes the signal yield observed in all modes and their sig-
nificances. The total signal yield of 51 events carries a significance of 6.39 σ.
The signal yields and efficiencies for D∗+s → D+s e+e− that we just unblinded and
D∗+s → D+s γ discussed in Section 4.10 are tabulated together in Table 4.75. The
ratio of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ) are calculated from
each mode and with all modes combined. The measurement of this ratio us-
ing the combination of all modes is given in Eq. 4.34. However, the systematic
uncertainty in K has been estimated only using the systematic uncertainties in
the signal yields for D∗+s → D+s e+e− and D∗+s → D+s γ. We must also include the
systematic uncertainty arising from the reconstruction of soft e+e− pairs and the
γ as indicated in Eq. 4.33 for a complete result.
K =B(D∗+s → D+s e+e−)
B(D∗+s → D+s γ) = (0.72 ± 0.14(stat) ± 0.03(syst))% (4.34)
181
This last source of systematic uncertainty is estimated in Section 4.12. There we
measure this fractional uncertainty to be 6.51%. 6.51% of 0.72% is 0.047% and
therefore, our final result stands to be:
K =B(D∗+s → D+s e+e−)
B(D∗+s → D+s γ) = (0.72 ± 0.14(stat) ± 0.06(syst))% (4.35)
where
• (stat) is the statistical uncertainty arising from the limited signal yields of
D∗+s → D+s e+e− and D∗+s → D+s γ. Larger datasets will decrease this error.
• (syst) is the systematic uncertainty arising from systematic uncertainties in
the estimated background for the D∗+s → D+s e+e− signal, systematic uncer-
tainties in the signal yield for D∗+s → D+s γ, and the systematic uncertainty
arising from the e+e− and γ reconstruction efficiencies in the energy range
relevant for this analysis.
182
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f Eve
nts
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eV
0
5
10
15
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25
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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10
15
20
25
h_MBC_physicsEntries 180Mean 2.094RMS 0.03387
h_MBC_conver_DspEntries 1661Mean 2.092RMS 0.03909
- e+ e±s D→ ±*
s Distribution for Sum of Backgrounds in DBCmSignal MC
Continuum MC
Generic-Conversions MC
Conversions MC
Data
Figure 4.108: Distribution of mBC in data after unblinding.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
5
10
15
20
25
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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nts
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eV
0
5
10
15
20
25
- e+ e±s D→ ±*
sm Distribution for Sum of Backgrounds in Dδh_DeltaM_conver_DspEntries 1312Mean 0.1827RMS 0.05072Signal MC
Continuum MC
Generic-Conversions MC
Conversions MC
Data
Figure 4.109: Distribution of δm in data after unblinding.
183
4.11.1 D+s → K+K−π+
The distributions of mBC and δm in data after unblinding are presented overlaid
with Monte Carlo in Fig. 4.110 and 4.111. A mean of 14.7 events were expected
from Monte Carlo simulations and 14 events were observed. The significance
for this observation is 5.13 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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f Eve
nts
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eV
0
2
4
6
8
10
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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nts
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0
2
4
6
8
10
±π - K+ K→ ±s Distributions in Mode DBCm
Signal MC: 16 Entries
Continuum MC: 1 Entries
Generic MC: 4 Entries
Continuum MC: 1 Entries
Data: 25 Entries
Figure 4.110: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
2
4
6
8
10
12
14
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
2
4
6
8
10
12
14
±π - K+ K→ ±sm Distributions in Mode Dδ
Signal MC: 16 Entries
Continuum MC: 2 Entries
Generic MC: 4 Entries
Conversion MC: 8 Entries
Data: 38 Entries
Figure 4.111: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
184
4.11.2 D+s → KS K+
The distributions of mBC and δm in data after unblinding are presented overlaid
with Monte Carlo in Fig. 4.112 and 4.113. A mean of 3.87 events were expected
from Monte Carlo simulations and 1 events was observed. The significance for
this observation is 0.73 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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f Eve
nts
/ 2 M
eV
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
± KS K→ ±s Distributions in Mode DBCm
Signal MC: 3 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Continuum MC: 0 Entries
Data: 6 Entries
Figure 4.112: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
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f Eve
nts
/ 5 M
eV
0
0.5
1
1.5
2
2.5
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
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eV
0
0.5
1
1.5
2
2.5
± KS K→ ±sm Distributions in Mode Dδ
Signal MC: 3 Entries
Continuum MC: 0 Entries
Generic MC: 1 Entries
Conversion MC: 2 Entries
Data: 2 Entries
Figure 4.113: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
185
4.11.3 D+s → ηπ+; η→ γγ
The distributions of mBC and δm in data after unblinding are presented overlaid
with Monte Carlo in Fig. 4.114 and 4.115. A mean of 3.21 events were expected
from Monte Carlo simulations and 4 events were observed. The significance for
this observation is 1.66 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
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0.5
1
1.5
2
2.5
3
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0
0.5
1
1.5
2
2.5
3
γ γ → η, η ±π → ±s Distributions in Mode DBCm
Signal MC: 2 Entries
Continuum MC: 4 Entries
Generic MC: 0 Entries
Continuum MC: 4 Entries
Data: 10 Entries
Figure 4.114: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
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0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
γ γ → η, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 4 Entries
Generic MC: 0 Entries
Conversion MC: 1 Entries
Data: 14 Entries
Figure 4.115: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
186
4.11.4 D+s → η′π+; η′ → π+π−η; η→ γγ
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.116 and 4.117. 1.20 events were expected from
Monte Carlo simulations and 4 events were observed. The significance for this
observation is 2.68 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
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nts
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0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
γ γ → η, η -π +π →’ η’, η ±π → ±s Distributions in Mode DBCm
Signal MC: 1 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Continuum MC: 0 Entries
Data: 4 Entries
Figure 4.116: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
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0
0.5
1
1.5
2
2.5
3
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
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/ 5 M
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0
0.5
1
1.5
2
2.5
3
γ γ → η, η -π +π →’ η’, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 1 Entries
Continuum MC: 0 Entries
Generic MC: 0 Entries
Conversion MC: 1 Entries
Data: 5 Entries
Figure 4.117: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
187
4.11.5 D+s → K+K−π+π0
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.118 and 4.119. 6.55 events were expected from
Monte Carlo simulations and 6 events were observed. The significance for this
observation is 2.34 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
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nts
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eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
0π ±π - K+ K→ ±s Distributions in Mode DBCm
Signal MC: 6 Entries
Continuum MC: 3 Entries
Generic MC: 19 Entries
Continuum MC: 3 Entries
Data: 27 Entries
Figure 4.118: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
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0
1
2
3
4
5
6
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
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nts
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0
1
2
3
4
5
6
0π ±π - K+ K→ ±sm Distributions in Mode Dδ
Signal MC: 5 Entries
Continuum MC: 2 Entries
Generic MC: 18 Entries
Conversion MC: 4 Entries
Data: 37 Entries
Figure 4.119: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
188
4.11.6 D+s → π+π−π+
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.120 and 4.121. 5.32 events were expected from
Monte Carlo simulations and 7 events were observed. The significance for this
observation is 2.79 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
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0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
±π -π +π → ±s Distributions in Mode DBCm
Signal MC: 4 Entries
Continuum MC: 17 Entries
Generic MC: 3 Entries
Continuum MC: 17 Entries
Data: 24 Entries
Figure 4.120: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
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0
1
2
3
4
5
6
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
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0
1
2
3
4
5
6
m Sidebands in pipipiδ
Signal MC: 4 Entries
Continuum MC: 11 Entries
Generic MC: 2 Entries
Conversion MC: 2 Entries
Data: 37 Entries
Figure 4.121: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
189
4.11.7 D+s → K∗+K∗0; K∗+ → K0Sπ+; K∗0 → K−π+
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.122 and 4.123. 3.57 events were expected from
Monte Carlo simulations and 4 events were observed. The significance for this
observation is 1.65 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
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nts
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0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
*0K*+ K→ ±s Distributions in Mode DBCm
Signal MC: 2 Entries
Continuum MC: 1 Entries
Generic MC: 8 Entries
Continuum MC: 1 Entries
Data: 19 Entries
Figure 4.122: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
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0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
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nts
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eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
*0K*+ K→ ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 0 Entries
Generic MC: 5 Entries
Conversion MC: 1 Entries
Data: 24 Entries
Figure 4.123: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
190
4.11.8 D+s → ηρ+; η→ γγ; ρ+ → π+π0
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.124 and 4.125. 8.11 events were expected from
Monte Carlo simulations and 7 events were observed. The significance for this
observation is 2.23 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
1
2
3
4
5
6
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
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nts
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eV
0
1
2
3
4
5
6
0π ±π → ±ρ, γ γ → η, ±ρ η → ±s Distributions in Mode DBCm
Signal MC: 8 Entries
Continuum MC: 24 Entries
Generic MC: 8 Entries
Continuum MC: 24 Entries
Data: 39 Entries
Figure 4.124: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
1
2
3
4
5
6
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
nts
/ 5 M
eV
0
1
2
3
4
5
6
0π ±π → ±ρ, γ γ → η, ±ρ η → ±sm Distributions in Mode Dδ
Signal MC: 7 Entries
Continuum MC: 22 Entries
Generic MC: 8 Entries
Conversion MC: 6 Entries
Data: 56 Entries
Figure 4.125: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
191
4.11.9 D+s → η′π+; η′ → ρ0γ
The distributions of mBC and δm in data after unblinding are presented over-
laid with Monte Carlo in Fig. 4.126 and 4.127. 4.26 events were expected from
Monte Carlo simulations and 4 events were observed. The significance for this
observation is 1.52 σ.
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.5
1
1.5
2
2.5
3
(GeV)BCm2 2.02 2.04 2.06 2.08 2.1 2.12 2.14 2.16
Num
ber o
f Eve
nts
/ 2 M
eV
0
0.5
1
1.5
2
2.5
3
γ 0ρ →’ η’, η ±π → ±s Distributions in Mode DBCm
Signal MC: 3 Entries
Continuum MC: 16 Entries
Generic MC: 4 Entries
Continuum MC: 16 Entries
Data: 26 Entries
Figure 4.126: Distribution of mBC in data after unblinding overlaid withprediction from Monte Carlo.
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
f Eve
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/ 5 M
eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
m (GeV)δ0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4
Num
ber o
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nts
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eV
0
0.5
1
1.5
2
2.5
3
3.5
4
4.5
γ 0ρ →’ η’, η ±π → ±sm Distributions in Mode Dδ
Signal MC: 2 Entries
Continuum MC: 15 Entries
Generic MC: 4 Entries
Conversion MC: 2 Entries
Data: 23 Entries
Figure 4.127: Distribution of δm in data after unblinding overlaid with pre-diction from Monte Carlo.
192
4.11.10 Comparison of me+e− between Data and Monte Carlo
Simulation
Fig. 4.128 shows the distribution of the invariant mass of the e+e− in the 51 data
points uncovered when compared to the general shape predicted by our Monte
Carlo simulations. It must be noted that we did not depend on the numbers
from Monte Carlo for our estimation of the backgrounds. This plot is presented
as a rough check. The Kolmogorov probability for the data and Monte Carlo
points to have come from the same distribution is found to be 0.86.
(GeV)ee m0 0.02 0.04 0.06 0.08 0.1 0.12 0.14
# E
vent
s / 5
MeV
0
2
4
6
8
10
12
14
16
18
(GeV)ee m0 0.02 0.04 0.06 0.08 0.1 0.12 0.14
# E
vent
s / 5
MeV
0
2
4
6
8
10
12
14
16
18Signal MC
Continuum MC
Generic-Conversions MC
Conversions MC
Data
pair-e+Invariant mass of e
Figure 4.128: Distribution of me+e− in data after unblinding overlaid withprediction from Monte Carlo.
193
4.11.11 A Re-evaluation of All D∗+s Branching Fractions
Now that we have a measurement of the ratio of branching fractions B(D∗+s →
D+s e+e−)/B(D∗+s → D+s γ), we may combine it with the measurement of B(D∗+s →
D+s π0)/B(D∗+s → D+s γ) as measured by the BABAR collaboration [5] to re-evaluate
the absolute branching fractions B(D∗+s → D+s γ), B(D∗+s → D+s π0) and B(D∗+s →
D+s e+e−). For notational convenience, we shall denote B(D∗+s → D+s γ) by bγ,
B(D∗+s → D+s π0) by bπ0 and B(D∗+s → D+s e+e−) by be+e− . If we call our measure-
ments of the ratios m1 and m2 as indicated in Eq. 4.36 & 4.37,
m1 =bπ0
bγ= 0.062 ± 0.005 ± 0.006 (4.36)
m2 =be+e−
bγ= 0.0072 ± 0.0014 ± 0.0006 (4.37)
and have the absolute branching fractions add up to unity, we may write
bγ =1
1 + m1 + m2(4.38)
∆bγ =∂bγ∂m1∆m1 ⊕
∂bγ∂m2∆m2 (4.39)
where∂bγ∂m1=∂bγ∂m2=
−1(1 + m1 + m2)2
In a similar vein, one may write the solutions for bπ0 and be+e− as follows.
bπ0 =m1
1 + m1 + m2(4.40)
∆bπ0 =∂bπ0
∂m1∆m1 ⊕
∂bπ0
∂m2∆m2 (4.41)
where∂bπ0
∂m1=
1 + m2
(1 + m1 + m2)2
194
∂bπ0
∂m2=
−m1
(1 + m1 + m2)2
and
be+e− =m2
1 + m1 + m2(4.42)
∆be+e− =∂be+e−
∂m1∆m1 ⊕
∂be+e−
∂m2∆m2 (4.43)
where∂be+e−
∂m1=
−m2
(1 + m1 + m2)2
∂be+e−
∂m2=
1 + m1
(1 + m1 + m2)2
We evaluate these derivatives using the central values of the measurements
m1 and m2 and propagate the statistical and systematic errors independently to
give us absolute measures for the branching fractions of the D∗+s thus far discov-
ered.
B(D∗+s → D+s γ) = (93.5 ± 0.5 ± 0.5)% (4.44)
B(D∗+s → D+s π0) = (5.8 ± 0.4 ± 0.5)% (4.45)
B(D∗+s → D+s e+e−) = (0.67 ± 0.13 ± 0.05)% (4.46)
195
4.12 Systematic Uncertainties from the Tracking of Soft Elec-
trons and Photons
As reported in Section 4.11, systematic errors in the measurement of εe+e−/εγ
will contribute to the systematic uncertainty in our measurement of the ratio
of branching fractions B(D∗+s → D+s e+e−)/B(D∗+s → D+s γ). In this section, we seek
to estimate the systematic uncertainty in the measurement of εe+e−/εγ in the en-
ergy range relevant for our analysis by studying the decay of ψ(2S ) mesons to
J/ψπ0π0. We estimate this systematic error by measuring the ratio of the num-
bers of events where one of the π0 Dalitz decays to γe+e− to the number of events
where both π0 decay to γγ and comparing this to the ratio expected from the cur-
rently accepted branching fractions for π0 → γe+e− and π0 → γγ.
Dataset 42, which contains 53 pb−1 of data taken at the ψ(2S ) resonance, was
used for this study. Since soft electrons from the Dalitz decay of the π0 would
also suffer from the systematic deviation in their energy and other track pa-
rameters if their tracks are fitted to the pion mass hypothesis, we reprocessed
this dataset to include track fits to the electron mass hypothesis. This has been
described in Section 4.5.
In the following paragraphs, we describe a method that completely recon-
structs the ψ(2S ) from its decay into J/ψπ0π0 in order to estimate our systematic
error in the measurement of εe+e−/εγ.
For our convenience, events where one of the π0 Dalitz decays to e+e−γ will
be called events of Type I. Events where both π0 decay to γγ will be called events
of Type II. The latest fit in the Review of Particle Physics 2010 establishes the
196
ratio B(π0 → γe+e−)/B(π0 → γγ) to be (1.188 ± 0.034) × 10−2 [11, 3]. From this, we
can establish that the ratio of numbers of these two types of events produced in
our dataset should be (2.376 ± 0.068) × 10−2 from Eq. 4.47.
r = nI
nII= 2 × B(π0 → γe+e−)
B(π0 → γγ= 0.02376 ± 0.00068 (4.47)
In our method, we obtain a measurement of this ratio from data and com-
pute the branching fraction B(π0 → γe+e−). The deviation of this measurement
from the currently accepted value of the branching fraction translates to the sys-
tematic uncertainty in our measurement of εe+e−/εγ:
∆εe+e−/εγ
εe+e−/εγ=∆B(π0 → γe+e−)B(π0 → γe+e−) (4.48)
Our method reconstructs the ψ(2S ) through events of Type I (ψ(2S ) →
J/ψπ0π0; π0 → γγ; π0 → e+e−γ) and events of Type II (ψ(2S ) → J/ψπ0π0; π0 →
γγ; π0 → γγ). We estimate the reconstruction efficiencies for both types of events
using Monte Carlo samples. First, we establish a set of criteria to reconstruct
Type I events in our data. To illustrate our method, we shall call the efficiency
of selecting Type I events from an MC sample of Type I events εs. The efficiency
of keeping Type II events in the signal region of these criteria from an MC sam-
ple of Type II events shall be called εc. For nI produced Type I and nII produced
Type II events, we can expect an yield of y events after applying this set of se-
lection criteria to our data as expressed in Eq. 4.49.
nIεs + nI Iεc = y (4.49)
Using the currently accepted ratio of nI/nII from Eq. 4.47, we may calculate nI,
the number of Type I events in our data, from this.
197
Hereafter, we construct a set of selection criteria to reconstruct Type II events
in our data. Using Type II Monte Carlo event samples, we find the reconstruc-
tion efficiency εγ for this set of criteria. Then we estimate the number of pro-
duced Type II events in our data with this method as nII using
nIIεγ = yγ (4.50)
where yγ is the yield of our set of criteria on data to isolate Type II events.
Having estimated the numbers of Type I and II events in our data, we may
estimate the branching fraction B(π0 → e+e−γ) using
B(π0 → e+e−γ) = B(π0 → γγ)2
nI
nII. (4.51)
.
In order to establish a systematic uncertainty in our measurement of B(π0 →
e+e−γ), we implement a second method for measuring this branching fraction.
In this method, we use Type I and Type II events in our data that are most likely
conversion events, events where one of the photons from the π0 converts to a
e+e− in material, in combination with Eq. 4.49 to estimate the total number of
Type I and Type II events in the data. In order to select events that are most
likely to be conversion events, we select events that are rejected by the ∆d0 and
∆φ0 criteria on the tracks of the e+e− pair. These selection criteria have been de-
scribed in Sections 4.2.5 and 4.2.6. The efficiency of selecting such conversion-
type events from a Monte Carlo sample of Type I events shall be called ε ′s. The
efficiency of selecting such events from a Monte Carlo sample of Type II events
shall be called ε′c. Thus, upon the application of our selection criteria (that in-
198
verts the standard ∆d0 and δφ0 requirements), the yield in data may be denoted
by y′ as expressed in Eq. 4.52.
nIε′s + nIIε
′c = y′ (4.52)
Solving Equations 4.49 and 4.50 simultaneously gives us the number of Type
I events in the data. The number of Type II events is used as deduced earlier
from the selection of Type II events. This ratio, nI/nII, is plugged into Equation
4.51 to give us a second estimate for the π0 Dalitz decay branching fraction.
Now we shall discuss the details of implementation of the two methods.
4.12.1 Method 1
First, we shall describe the selection criteria used to select events from data in
our first method.
The J/ψ is reconstructed from its decays to e+e− and µ−µ+. The tracks of these
leptons are fitted with the Kalman fitter using electron and muon mass hypothe-
ses respectively. 50% of the expected number of hits on a track are required to be
present. The momentum of each track is required to be between 500 MeV and
10 GeV. They may be reconstructed upto a cos θ of 0.93. The track parameter d0
must be less than 5 mm and z0 must be less than 5 cm. The dE/dx of electron
and muon tracks are required to be within 3 σ of their expected values. The J/ψ
has a mass of 3096.92 ± 0.001 MeV and a full natural width of 93.2 ± 2.1 keV. In
our study, we require the invariant mass of the e+e− pair to be within 30 MeV
of 3.09200 GeV, and the invariant mass of the µ−µ+ pair to be within 30 MeV of
199
h_jPsi_m_eEntries 10422Mean 3.093RMS 0.01752
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
100
200
300
400
500
h_jPsi_m_eEntries 10422Mean 3.093RMS 0.01752
-e+ Mass from eψJ/
h_jPsi_m_mEntries 11716Mean 3.094RMS 0.01653
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
100
200
300
400
500
600
700
800
h_jPsi_m_mEntries 11716Mean 3.094RMS 0.01653
-µ+µ Mass from ψJ/
h_jPsi_m_eEntries 1082Mean 3.093RMS 0.01829
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
10
20
30
40
50
60
70
80
90
h_jPsi_m_eEntries 1082Mean 3.093RMS 0.01829
-e+ Mass from eψJ/
h_jPsi_m_mEntries 1094Mean 3.096RMS 0.01808
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
10
20
30
40
50
60
70
80
90
h_jPsi_m_mEntries 1094Mean 3.096RMS 0.01808
-µ+µ Mass from ψJ/
h_jPsi_m_eEntries 5994Mean 3.091RMS 0.01728
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
50
100
150
200
250
300
350
h_jPsi_m_eEntries 5994Mean 3.091RMS 0.01728
-e+ Mass from eψJ/
h_jPsi_m_mEntries 10660Mean 3.095RMS 0.0162
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
100
200
300
400
500
600
h_jPsi_m_mEntries 10660Mean 3.095RMS 0.0162
-µ+µ Mass from ψJ/
Figure 4.129: Invariant mass of the J/ψ reconstructed from its decay to e+e−(top plots) and µ+µ− (bottom plots). The column on the left isfrom signal MC of Type I events. The column at the center isfrom signal MC of Type II events. The column on the right isfrom data.
3.09692 GeV as depicted in Fig 4.129.
The first π0 in Type I events is reconstructed from its decay to two photons.
The photons must not have showered in known noisy crystals and must not
have tracks matched to them. Each of their shower energies are required to be
between 10 Mev and 2 Gev. The pull mass of the π0 is required to be within ±
2.5 σ. This is shown in Fig. 4.130.
The second π0 in Type II events is reconstructed from its decay to a photon
and a soft e+e− pair. Requirements on the photon are identical to those of the
photons from the first π0. The electron is Kalman fitted using the electron mass
hypothesis and is required to have a momentum between 10 Mev and 2 GeV. It
must be reconstructed within an angle of cos θ = 0.93. The track parameter d0
200
h_pi0Mass_PullEntries 21302Mean -0.09217RMS 1.376
σ -3 -2 -1 0 1 2 3100
200
300
400
500
600
700
800
h_pi0Mass_PullEntries 21302Mean -0.09217RMS 1.376
Pull Mass0π h_pi0Mass_PullEntries 2070Mean 0.01718RMS 1.425
σ -3 -2 -1 0 1 2 3
10
20
30
40
50
60
70
80
h_pi0Mass_PullEntries 2070Mean 0.01718RMS 1.425
Pull Mass0π h_pi0Mass_PullEntries 16046Mean -0.08606RMS 1.468
σ -3 -2 -1 0 1 2 3
150
200
250
300
350
400
450
500
h_pi0Mass_PullEntries 16046Mean -0.08606RMS 1.468
Pull Mass0π
Figure 4.130: The invariant mass of the first π0. The column on the left isfrom signal MC of Type I events. The column at the center isfrom MC of Type II events. The column on the right is fromdata.
h_pi0_2_Reco_m
Entries 19560Mean 0.1596RMS 0.07295
m (GeV)0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.40
200
400
600
800
1000
1200
1400
1600
h_pi0_2_Reco_m
Entries 19560Mean 0.1596RMS 0.07295
0πInvariant Mass of Second h_pi0_2_Reco_m
Entries 1892Mean 0.158RMS 0.07016
m (GeV)0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.40
20
40
60
80
100
120
140
160
180
h_pi0_2_Reco_m
Entries 1892Mean 0.158RMS 0.07016
0πInvariant Mass of Second h_pi0_2_Reco_m
Entries 14362Mean 0.1597RMS 0.07091
m (GeV)0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.40
100
200
300
400
500
600
700
800
900
h_pi0_2_Reco_m
Entries 14362Mean 0.1597RMS 0.07091
0πInvariant Mass of Second
Figure 4.131: The invariant mass of the second π0. The column on the leftis from signal MC of Type I events. The column at the centeris from MC of Type II events. The column on the right is fromdata.
must be less than 5 mm and z0 must be less than 5 cm. The dE/dx of the track
is required to be within 3 σ of the value expected of an electron. The invariant
mass of the γe+e− is required to be within 18 MeV of the nominal mass of the π0
which is 134.9766 MeV. The distribution of this invariant mass and the selection
range is shown in Fig. 4.131.
The electron and the positron are each required to have an energy less than
144 MeV as indicated in Fig. 4.132. This is the range of energies of the positron
and the electron from the decay D∗+s → D+s e+e−.
201
h_e_Reco_eEntries 39120Mean 0.09512RMS 0.05038
E (GeV)0 0.05 0.1 0.15 0.2 0.25 0.30
200
400
600
800
1000
1200
1400
h_e_Reco_eEntries 39120Mean 0.09512RMS 0.05038
Energy of the Electron
Figure 4.132: The distribution of energy of the positron and the electronfrom the Dalitz decay of the π0 in the MC. Events contain-ing positron and electrons with energy less than 144 MeV, asindicated, are accepted.
Next, we combine the four-momenta of the J/ψ and two π0 to get the four-
momentum of the ψ(2S ) meson. This must be close to the four-momentum of
the colliding e+e− pair at the center of the CLEO-c detector. Hence, we apply
selection criteria constraining each component of the momentum of the ψ(2S )
to be within 40 MeV of that of the collision momentum. This is shown in Fig.
4.133.
We select events where the difference between the invariant masses of the
reconstructed ψ(2S ) candidate and the J/ψ candidate is within 30 MeV of the
nominal difference in masses. This is depicted in Fig. 4.134.
A background to the selection of Type I events are Type II events where one
of the photons from a π0 converts in material to produce an e+e− pair. We reject
this background using the ∆d0 > −5mm and ∆φ0 < 0.12 criteria used in our
D∗+s → D+s e+e− reconstruction. This is shown in Fig. 4.135 and 4.136.
The aforementioned selection criteria are found to accept 1,069 Type I events
out of a Monte Carlo sample of 299,794. Thus, we record the efficiency εs =
0.0357 ± 0.0011 as applicable in Eq. 4.49. They are also found to accept 10 Type
202
h_diffPsi_pxEntries 4740Mean 0.001794RMS 0.0527
(GeV)xp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
50
100
150
200
250
300
350
400
450
h_diffPsi_pxEntries 4740Mean 0.001794RMS 0.0527
Beam-px
(2S)Ψpx
h_diffPsi_pyEntries 4740Mean 0.0008798
RMS 0.05109
(GeV)yp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
100
200
300
400
500
h_diffPsi_pyEntries 4740Mean 0.0008798
RMS 0.05109
Beam-py
(2S)Ψpy
h_diffPsi_pzEntries 4740Mean -0.001182RMS 0.0479
(GeV)zp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
50
100
150
200
250
300
350
400
450
h_diffPsi_pzEntries 4740Mean -0.001182RMS 0.0479
Beam-pz
(2S)Ψpz
h_diffPsi_pxEntries 414Mean 0.00217RMS 0.04692
(GeV)xp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
10
20
30
40
50
60
h_diffPsi_pxEntries 414Mean 0.00217RMS 0.04692
Beam-px
(2S)Ψpx
h_diffPsi_pyEntries 414Mean 0.006086RMS 0.05818
(GeV)yp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
5
10
15
20
25
30
35
40
h_diffPsi_pyEntries 414Mean 0.006086RMS 0.05818
Beam-py
(2S)Ψpy
h_diffPsi_pzEntries 414Mean 0.0084RMS 0.04552
(GeV)zp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
10
20
30
40
50
h_diffPsi_pzEntries 414Mean 0.0084RMS 0.04552
Beam-pz
(2S)Ψpz
h_diffPsi_pxEntries 3210Mean -0.003273RMS 0.05564
(GeV)xp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
50
100
150
200
250
h_diffPsi_pxEntries 3210Mean -0.003273RMS 0.05564
Beam-px
(2S)Ψpx
h_diffPsi_pyEntries 3210Mean 0.003707RMS 0.05737
(GeV)yp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
50
100
150
200
250
h_diffPsi_pyEntries 3210Mean 0.003707RMS 0.05737
Beam-py
(2S)Ψpy
h_diffPsi_pzEntries 3210Mean -0.0001413
RMS 0.05366
(GeV)zp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
50
100
150
200
250
h_diffPsi_pzEntries 3210Mean -0.0001413
RMS 0.05366
Beam-pz
(2S)Ψpz
Figure 4.133: Four momenta of ψ(2S ) relative to the e+e− collision four mo-menta. The column on the left is from signal MC of TypeI events. The column at the center is from MC of Type IIevents. The column on the right is from data.
II events out of a Monte Carlo sample of 149,888 and thus we may write εc =
2/149, 888 = (1.33 ± 0.94) × 10−5. When these selection criteria are applied to our
data, we get an yield of y = 306 events.
Assuming the established ratio of Type I to Type II events detailed in Eq.
4.47 to hold true, we may solve Eq. 4.49 for nI . The solution is given in Eq. 4.53
and 4.54. The ⊕ symbol is used to denote addition in quadrature. This gives us
203
h_diffPsiEntries 3212Mean 0.5888RMS 0.01359
(GeV)ψJ/-m(2S)ψ m0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.90
100
200
300
400
500
600
700
800
900
h_diffPsiEntries 3212Mean 0.5888RMS 0.01359
Massψ(2S)-J/ψ h_diffPsiEntries 284Mean 0.5911RMS 0.01107
(GeV)ψJ/-m(2S)ψ m0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.90
20
40
60
80
100
h_diffPsiEntries 284Mean 0.5911RMS 0.01107
Massψ(2S)-J/ψ h_diffPsiEntries 1798Mean 0.5849RMS 0.02303
(GeV)ψJ/-m(2S)ψ m0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.90
50
100
150
200
250
300
350
400
450
h_diffPsiEntries 1798Mean 0.5849RMS 0.02303
Massψ(2S)-J/ψ
Figure 4.134: Difference between the invariant masses of the ψ(2S ) andthe J/ψ. The column on the left is from signal MC of TypeI events. The column at the center is from MC of Type IIevents. The column on the right is from data.
h_diffD0Entries 3122Mean 5.593e-05RMS 0.002031
m0d∆ -0.01-0.008-0.006-0.004-0.002 0 0.0020.0040.0060.0080.010
50
100
150
200
250
300
h_diffD0Entries 3122Mean 5.593e-05RMS 0.002031
0d∆ h_diffD0Entries 278Mean -0.004284RMS 0.002687
m0d∆ -0.01-0.008-0.006-0.004-0.002 0 0.0020.0040.0060.0080.0102468
10121416182022
h_diffD0Entries 278Mean -0.004284RMS 0.002687
0d∆ h_diffD0Entries 1712Mean -0.001865RMS 0.00296
m0d∆ -0.01-0.008-0.006-0.004-0.002 0 0.0020.0040.0060.0080.010
20
40
60
80
100
120
140
h_diffD0Entries 1712Mean -0.001865RMS 0.00296
0d∆
Figure 4.135: The ∆d0 between the e+e− pair from the second π0. The col-umn on the left is from signal MC of Type I events. The col-umn at the center is from MC of Type II events. The columnon the right is from data.
h_dPhiEntries 3080Mean -5.588e-05RMS 0.3647
0φ∆ -1.5 -1 -0.5 0 0.5 1 1.50
100
200
300
400
500
600
h_dPhiEntries 3080Mean -5.588e-05RMS 0.3647
0φ∆ h_dPhi
Entries 158Mean 0.2479RMS 0.08649
0φ∆ -1.5 -1 -0.5 0 0.5 1 1.50
10
20
30
40
50
60
h_dPhiEntries 158Mean 0.2479RMS 0.08649
0φ∆ h_dPhi
Entries 1394Mean 0.09293RMS 0.2724
0φ∆ -1.5 -1 -0.5 0 0.5 1 1.50
20
40
60
80
100
120
140
160
180
200
h_dPhiEntries 1394Mean 0.09293RMS 0.2724
0φ∆
Figure 4.136: The ∆φ0 between the e+e− pair from the second π0. The col-umn on the left is from signal MC of Type I events. The col-umn at the center is from MC of Type II events. The columnon the right is from data.
204
nI = 8447 ± 554.
nI =y
εs + εc/r(4.53)
∆nI
nI=∆yy ⊕
∆εs ⊕ (εc/r)(∆εc/εc ⊕ ∆r/r)εs + εc/r
(4.54)
Having calculated the number of Type I events in our data, we may now
estimate the number of Type II events present in the data sample. The recon-
struction of Type II events is similar to the reconstruction of Type I events. The
second π0 is reconstructed from photons with the same selection criteria as the
first π0. The ∆d0 and ∆φ0 cuts are not used as they are clearly inapplicable. A
signal MC for Type II events was generated to calculate the signal efficiency of
our criteria. Distributions of the J/ψ mass, the pull masses of the two π0, the
momentum of the ψ(2S ) relative to the collision momentum and the mass dif-
ference between the ψ(2S ) and the J/ψ are presented in Fig. 4.137, 4.138, 4.139,
4.140 and 4.141.
25,713 events out of 149,888 signal MC events were seen to be accepted by
our criteria. This gives a signal efficiency εγ = 0.1716 ± 0.0011. We find the yield
in data to be yII = 58, 602 events. Using Eq. 4.50 we infer that the number of
Type II events is our data is nII = 341, 607 ± 2, 555.
Now, we may calculate the ratio of Type I to Type II events in our data as
nI/nII and from that estimate the branching fraction B(π0 → γe+e−) thus:
nI
nII=
8447 ± 554341607 ± 2555 =
2B(π0 → e+e−γ)(98.823 ± 0.034) × 10−2 . (4.55)
205
h_jPsi_m_eEntries 15125Mean 3.093RMS 0.01736
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
100
200
300
400
500
600
700
h_jPsi_m_eEntries 15125Mean 3.093RMS 0.01736
-e+ Mass from eψJ/
h_jPsi_m_mEntries 18965Mean 3.096RMS 0.01545
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
200
400
600
800
1000
1200
h_jPsi_m_mEntries 18965Mean 3.096RMS 0.01545
-µ+µ Mass from ψJ/
h_jPsi_m_eEntries 38814Mean 3.092RMS 0.01682
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
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1400
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2000
h_jPsi_m_eEntries 38814Mean 3.092RMS 0.01682
-e+ Mass from eψJ/
h_jPsi_m_mEntries 82069Mean 3.096RMS 0.01571
m (GeV)3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12 3.13 3.140
500
1000
1500
2000
2500
3000
3500
4000
4500
h_jPsi_m_mEntries 82069Mean 3.096RMS 0.01571
-µ+µ Mass from ψJ/
Figure 4.137: Invariant mass of the J/ψ reconstructed from its decay to e+e−(top plots) and µ+µ− (bottom plots). The column on the left isfrom signal MC of Type II events. The column on the right isfrom data.
From this, we calculate B(π0 → e+e−γ) = 0.01222 ± 0.00081(stat). In order to
establish a systematic uncertainty in this measurement, we use a second method
to estimate B(π0 → e+e−γ).
206
h_pi0_1_Mass_Pull
Entries 32975Mean -0.105RMS 1.163
σ -3 -2 -1 0 1 2 3
200
400
600
800
1000
1200
1400
h_pi0_1_Mass_Pull
Entries 32975Mean -0.105RMS 1.163
Pull Mass10π h_pi0_1_Mass_Pull
Entries 116738Mean -0.08567RMS 1.337
σ -3 -2 -1 0 1 2 3
1000
1500
2000
2500
3000
3500
4000
h_pi0_1_Mass_Pull
Entries 116738Mean -0.08567RMS 1.337
Pull Mass10π
Figure 4.138: The invariant mass of the first π0. The column on the left isfrom signal MC of Type II events. The column on the right isfrom data.
h_pi0_2_Mass_Pull
Entries 31776Mean -0.1688RMS 1.192
σ -3 -2 -1 0 1 2 30
200
400
600
800
1000
1200
h_pi0_2_Mass_Pull
Entries 31776Mean -0.1688RMS 1.192
Pull Mass20π h_pi0_2_Mass_Pull
Entries 109152Mean -0.224RMS 1.352
σ -3 -2 -1 0 1 2 3
500
1000
1500
2000
2500
3000
3500
h_pi0_2_Mass_Pull
Entries 109152Mean -0.224RMS 1.352
Pull Mass20π
Figure 4.139: The invariant mass of the second π0. The column on the leftis from signal MC of Type II events. The column on the rightis from data.
207
h_diffPsi_pxEntries 30421Mean -0.000243RMS 0.02238
(GeV)xp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
500
1000
1500
2000
2500
3000
3500
4000
4500
h_diffPsi_pxEntries 30421Mean -0.000243RMS 0.02238
Beam-px
(2S)Ψpx
h_diffPsi_pyEntries 30421Mean -0.0001139
RMS 0.02214
(GeV)yp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
500
1000
1500
2000
2500
3000
3500
4000
4500
h_diffPsi_pyEntries 30421Mean -0.0001139
RMS 0.02214
Beam-py
(2S)Ψpy
h_diffPsi_pzEntries 30421Mean 3.68e-05RMS 0.02309
(GeV)zp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
500
1000
1500
2000
2500
3000
3500
4000
h_diffPsi_pzEntries 30421Mean 3.68e-05RMS 0.02309
Beam-pz
(2S)Ψpz
h_diffPsi_pxEntries 101439Mean -0.000171RMS 0.04734
(GeV)xp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
2000
4000
6000
8000
h_diffPsi_pxEntries 101439Mean -0.000171RMS 0.04734
Beam-px
(2S)Ψpx
h_diffPsi_pyEntries 101439Mean 0.0005182
RMS 0.04748
(GeV)yp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
2000
4000
6000
8000
h_diffPsi_pyEntries 101439Mean 0.0005182
RMS 0.04748
Beam-py
(2S)Ψpy
h_diffPsi_pzEntries 101439Mean -0.0002602
RMS 0.04899
(GeV)zp∆ -0.2 -0.15 -0.1 -0.05 -0 0.05 0.1 0.15 0.20
2000
4000
6000
8000
h_diffPsi_pzEntries 101439Mean -0.0002602
RMS 0.04899
Beam-pz
(2S)Ψpz
Figure 4.140: Four momenta of ψ(2S ) relative to the e+e− collision four mo-menta. The column on the left is from signal MC of Type IIevents. The column on the right is from data.
208
h_diffPsiEntries 27992Mean 0.5892RMS 0.009239
(GeV)ψJ/-m(2S)ψ m0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.90
2000
4000
6000
8000
h_diffPsiEntries 27992Mean 0.5892RMS 0.009239
Massψ(2S)-J/ψ h_diffPsiEntries 66812Mean 0.5851RMS 0.02235
(GeV)ψJ/-m(2S)ψ m0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.90
2000
4000
60008000
h_diffPsiEntries 66812Mean 0.5851RMS 0.02235
Massψ(2S)-J/ψ
Figure 4.141: Difference between the invariant masses of the ψ(2S ) and theJ/ψ. The column on the left is from signal MC of Type IIevents. The column on the right is from data.
209
h_n_dPhiEntries 42Mean 0.1881RMS 0.6087
-1.5 -1 -0.5 0 0.5 1 1.50
1
2
3
4
5
6
h_n_dPhiEntries 42Mean 0.1881RMS 0.6087
0φ∆Conversion Type h_n_dPhi
Entries 120Mean 0.3565RMS 0.06916
-1.5 -1 -0.5 0 0.5 1 1.50
5
10
15
20
25
30
35
40
h_n_dPhiEntries 120Mean 0.3565RMS 0.06916
0φ∆Conversion Type h_n_dPhi
Entries 318Mean 0.3443RMS 0.1199
-1.5 -1 -0.5 0 0.5 1 1.50
20
40
60
80
100
120
h_n_dPhiEntries 318Mean 0.3443RMS 0.1199
0φ∆Conversion Type
Figure 4.142: The ∆φ0 between the e+e− pair. Now we accept events with∆φ0 greater than 0.12. These were previously rejected aslikely to be conversion-type events. The column on the left isfrom signal MC of Type I events. The column at the center isfrom MC of Type II events. The column on the right is fromdata.
4.12.2 Method 2
Our second method for estimating B(π0 → e+e−γ) uses conversion-type events
found in data. Conversion-type events are those where both π0 decay to γγ but
at least one photon converts in material to form a e+e− pair. We select for such
events by requiring all the criteria on J/ψ and the invariant masses of the π0 used
to select Type I events, except now we look at the “wrong side” of the ∆d0 and
∆φ0 criteria. In other words, we keep events which were previously rejected
by both the ∆d0 and the ∆φ0 criteria. The distribution of ∆d0 is the same as
Fig. 4.135 since all preceding criteria are identical. The distribution of ∆φ0 after
having accepted tracks on the ”wrong side” of ∆d0 is presented in Fig. 4.142.
The efficiency of such a set of selection criteria for Type I events is found to
be ε′s = 10/29, 974 = (3.34 ± 1.1(stat)) × 10−4. The efficiency for Type II events
is found to be ε′c = 54/149, 888 = (3.60 ± 0.49(stat)) × 10−4. On applying these
selection criteria to our data, we are left with an yield of y′ = 141 events. These
values may be plugged into Eq. 4.52 and solved simultaneously with Eq. 4.49
210
to get nI = 8437 ± 342. The solution for nI is given in Eq. 4.56 and 4.57.
nI =yε′c − y′εc
εsε′c − εcε′s(4.56)
∆nI =δnI
δy ∆y ⊕ δnI
δy′ ∆y′ ⊕ δnI
δεc∆εc ⊕
δnI
δεs∆εs ⊕
δnI
δε′c∆ε′c ⊕
δnI
δε′s∆ε′s (4.57)
where
δnI
δy = ε′c
δnI
δy′ = −εc
δnI
δεc=
−yεsε′c − εcε′s
+yε′c − y′εc
(εsε′c − εcε′s)2 ε′s
δnI
δεs= − yε′c − y′εc
(εsε′c − εcε′s)2 ε′c
δnI
δε′c=
yεsε′c − εcε′s
− yε′c − y′εc
(εsε′c − εcε′s)2 εs
δnI
δε′s=
yε′c − y′εc
(εsε′c − εcε′s)2 εc
Now, we may calculate the ratio of Type I to Type II events in our data as
nI/nII and from that estimate the branching fraction B(π0 → γe+e−) thus:
211
nI
nII=
8437 ± 342341607 ± 2555 =
2B(π0 → e+e−γ)(98.823 ± 0.034) × 10−2 . (4.58)
From this, we calculate B(π0 → e+e−γ) = 0.01220 ± 0.00050(stat).
Now, we may combine our results from the two methods to establish a sys-
tematic error. Result from method 1: B(π0 → e+e−γ) = 0.01222 ± 0.00081(stat).
Result from method 2: B(π0 → e+e−γ) = 0.01220 ± 0.00050(stat). The result of
method 2 has the smaller uncertainty and will, therefore, be quoted as the cen-
tral value of our measurement. The statistical uncertainty will quoted as the
quadrature sum of the uncertainties in the two results. The absolute differ-
ence between the central values of the two results will be quoted as the sys-
tematic uncertainty in our measurement. Hence, we report B(π0 → e+e−γ) =
(1.222 ± 0.081(stat) ± 0.002(syst)) × 10−2.
The currently accepted branching fraction for the Dalitz decay of the π0 is
(1.174 ± 0.035) × 10−2 [6, 22, 21, 7, 3]. The difference between this and our result
is 0.046%. Hence, we cannot motivate a correction to the tracking efficiency and
must settle for an uncertainty. We add the difference between our measured
branching fraction and the currently accepted measurement, and the uncertain-
ties in our result in quadrature to get a total uncertainty of 0.077%. Thus, the
fractional uncertainty that we set out to estimate is found to be 6.51% as shown
in Eq. 4.59.
∆εe+e−/εγ
εe+e−/εγ=∆B(π0 → γe+e−)B(π0 → γe+e−) =
0.077%1.174%
= 6.51% (4.59)
212
CHAPTER 5
RESULTS AND CONCLUSION
213
We conclude this dissertation with a compilation of the results of our analy-
sis.
We have observed the Dalitz decay D∗+s → D+s e+e− with a signal significance
of 6.4 σ using nine hadronic decays of the D+s as tabulated in Table 4.75. It is
the first instance of a Dalitz decay that has been observed in the electromagnetic
decay of mesons containing the heavy charm or bottom quark.
We have also measured the ratio of branching fractions B(D∗+s →
D+s e+e−)/B(D∗+s → D+s γ) to be (0.72 ± 0.14(stat) ± 0.06(syst))% as presented in Eq.
4.35 of Section 4.11. The statistical uncertainty arises from the limited signal
yields of D∗+s → D+s e+e− and D∗+s → D+s γ. Larger datasets will decrease this error.
The systematic uncertainty arises from systematic uncertainties in the estimated
background for the D∗+s → D+s e+e− yield, systematic uncertainties in the signal
yield for D∗+s → D+s γ, and the systematic uncertainty from the e+e− and γ recon-
struction efficiencies in the energy range relevant for this analysis.
Finally, in Section 4.11.11 we have recomputed the absolute branching frac-
tions of the D∗+s meson in light of our discovery and measurement as follows.
B(D∗+s → D+s γ) = (93.5 ± 0.5 ± 0.5)%
B(D∗+s → D+s π0) = (5.8 ± 0.4 ± 0.5)%
B(D∗+s → D+s e+e−) = (0.67 ± 0.13 ± 0.05)%
214
APPENDIX A
PLOTS USED TO OPTIMIZE SELECTION CRITERIA FOR D∗+s → D+s e+e−
215
A.1 D+s → KS K+
216
Optimization plots for the mD+s selection criterion in the D+s → KS K+ mode. Plotson the left grouped as Fig. A.1 correspond to pion-fitted tracks in the simulatedsamples. Plots on the right grouped as Fig. A.2 correspond to electron-fittedtracks in the samples. The top left plots, for both samples, is the distributionof mD+s in the signal Monte Carlo sample. The top right plot graphs the signalMC sample accepted by the criterion as we increase the cut width plotted onthe x-axis. For the pion-fitted samples on the left, the plots in the second andthird rows correspond to the generic and continuum MC samples, respectively.For the electron-fitted samples on the right, the plots in the second, third andfourth rows correspond to the D∗+s → D+s γ, generic and continuum MC samples,respectively. For both sets of plots, the bottom left shows the significance of thesignal over background. The bottom right plot shows the precision of the signal.
(GeV)±SD m
1.94 1.95 1.96 1.97 1.98 1.99 2
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Entries 6Mean 1.967RMS 0.03537
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σ
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Entries 20Mean 0.009959RMS 0.0049
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Figure A.1: mD+s , KS K+, pion-fit
(GeV)±SD
m1.94 1.95 1.96 1.97 1.98 1.99 2 #
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Entries 20Mean 0.01064RMS 0.00506
Signal Precision vs Cut Width±SDm
Figure A.2: mD+s , KS K+, electron-fit
217
Optimization plots for the mBC selection criterion in the D+s → KS K+ decaymode. Plots on the left grouped as Fig. A.3 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.4 correspondto electron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mBC in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.3: mBC, KS K+, pion-fit
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.4: mBC, KS K+, electron-fit
218
Optimization plots for the δm selection criterion in the D+s → KS K+ decaymode. Plots on the left grouped as Fig. A.5 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.6 correspondto electron-fitted tracks in the samples. The top left plots, for both samples,is the distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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Figure A.5: δm, KS K+, pion-fit
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Figure A.6: δm, KS K+, electron-fit
219
Optimization plots for the selection criterion on the ∆d0 between the e+e− inthe D+s → KS K+ decay mode. Plots on the left grouped as Fig. A.7 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.8 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆d0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.7: ∆d0, KS K+, pion-fit
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Figure A.8: ∆d0, KS K+, electron-fit
220
Optimization plots for the selection criterion on the ∆φ0 between the e+e− inthe D+s → KS K+ decay mode. Plots on the left grouped as Fig. A.9 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.10 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆φ0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.9: ∆φ0, KS K+, pion-fit
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Figure A.10: ∆φ0, KS K+, electron-fit
221
A.2 D+s → ηπ+; η→ γγ
222
Optimization plots for the mD+s selection criterion in the D+s → ηπ+ mode. Plotson the left grouped as Fig. A.11 correspond to pion-fitted tracks in the simulatedsamples. Plots on the right grouped as Fig. A.12 correspond to electron-fittedtracks in the samples. The top left plots, for both samples, is the distributionof mD+s in the signal Monte Carlo sample. The top right plot graphs the signalMC sample accepted by the criterion as we increase the cut width plotted onthe x-axis. For the pion-fitted samples on the left, the plots in the second andthird rows correspond to the generic and continuum MC samples, respectively.For the electron-fitted samples on the right, the plots in the second, third andfourth rows correspond to the D∗+s → D+s γ, generic and continuum MC samples,respectively. For both sets of plots, the bottom left shows the significance of thesignal over background. The bottom right plot shows the precision of the signal.
(GeV)±SD m
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Figure A.11: mD+s , ηπ+, pion-fit
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Figure A.12: mD+s , ηπ+, electron-fit
223
Optimization plots for the mBC selection criterion in the D+s → ηπ+ decay mode.Plots on the left grouped as Fig. A.13 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.14 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mBC in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.13: mBC, ηπ+, pion-fit
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Figure A.14: mBC, ηπ+, electron-fit
224
Optimization plots for the δm selection criterion in the D+s → ηπ+ decay mode.Plots on the left grouped as Fig. A.15 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.16 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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Figure A.15: δm, ηπ+, pion-fit
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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m Signal Precision vs Cut Widthδ h_DeltaM_precisionEntries 19Mean 0.009911RMS 0.005222
m Signal Precision vs Cut Widthδ
Figure A.16: δm, ηπ+, electron-fit
225
Optimization plots for the selection criterion on the ∆d0 between the e+e− inthe D+s → ηπ+ decay mode. Plots on the left grouped as Fig. A.17 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.18 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆d0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.17: ∆d0, ηπ+, pion-fit
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Figure A.18: ∆d0, ηπ+, electron-fit
226
Optimization plots for the selection criterion on the ∆φ0 between the e+e− inthe D+s → ηπ+ decay mode. Plots on the left grouped as Fig. A.19 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.20 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆φ0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.19: ∆φ0, ηπ+, pion-fit
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Figure A.20: ∆φ0, ηπ+, electron-fit
227
A.3 D+s → η′π+; η′ → π+π−η; η→ γγ
228
Optimization plots for the mD+s selection criterion in the D+s → η′π+; η′ →π+π−η; η → γγ mode. Plots on the left grouped as Fig. A.21 correspond topion-fitted tracks in the simulated samples. Plots on the right grouped as Fig.A.22 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of mD+s in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe increase the cut width plotted on the x-axis. For the pion-fitted sampleson the left, the plots in the second and third rows correspond to the genericand continuum MC samples, respectively. For the electron-fitted samples onthe right, the plots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples, respectively. For both sets ofplots, the bottom left shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
(GeV)±SD m
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Figure A.21: mD+s , η′π+; η′ → π+π−η, pion-fit
(GeV)±SD
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Figure A.22: mD+s , η′π+; η′ → π+π−η, e-fit
229
Optimization plots for the mBC selection criterion in the D+s → η′π+; η′ →π+π−η; η → γγ decay mode. Plots on the left grouped as Fig. A.23 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.24 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of mBC in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe increase the cut width plotted on the x-axis. For the pion-fitted sampleson the left, the plots in the second and third rows correspond to the genericand continuum MC samples, respectively. For the electron-fitted samples onthe right, the plots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples, respectively. For both sets ofplots, the bottom left shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.23: mBC, η′π+; η′ → π+π−η,pion-fit
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Figure A.24: mBC, η′π+; η′ → π+π−η, e-fit
230
Optimization plots for the δm selection criterion in the D+s → η′π+; η′ →π+π−η; η → γγ decay mode. Plots on the left grouped as Fig. A.25 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.26 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of δm in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe increase the cut width plotted on the x-axis. For the pion-fitted sampleson the left, the plots in the second and third rows correspond to the genericand continuum MC samples, respectively. For the electron-fitted samples onthe right, the plots in the second, third and fourth rows correspond to theD∗+s → D+s γ, generic and continuum MC samples, respectively. For both sets ofplots, the bottom left shows the significance of the signal over background. Thebottom right plot shows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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Figure A.25: δm, η′π+; η′ → π+π−η, pion-fit
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Figure A.26: δm, η′π+; η′ → π+π−η, e-fit
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Figure A.28: ∆d0, η′π+; η′ → π+π−η, e-fit
232
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Figure A.29: ∆φ0, η′π+; η′ → π+π−η, pion-fit
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Figure A.30: ∆φ0, η′π+; η′ → π+π−η, e-fit
233
A.4 D+s → K+K−π+π0
234
Optimization plots for the mD+s selection criterion in the D+s → K+K−π+π0 mode.Plots on the left grouped as Fig. A.31 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.32 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mD+s in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)±SD m
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Figure A.31: mD+s , K+K−π+π0, pion-fit
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Figure A.32: mD+s , K+K−π+π0, electron-fit
235
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Figure A.33: mBC, K+K−π+π0, pion-fit
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Figure A.34: mBC, K+K−π+π0, electron-fit236
Optimization plots for the δm selection criterion in the D+s → K+K−π+π0 decaymode. Plots on the left grouped as Fig. A.35 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.36 correspondto electron-fitted tracks in the samples. The top left plots, for both samples,is the distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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m Signal Precision vs Cut Widthδ h_DeltaM_precision
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Figure A.35: δm, K+K−π+π0, pion-fit
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m Signal Sampleδ h_DeltaM_signalEntries 682Mean 0.1442RMS 0.004895
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m Continuum MC Background vs Cut Widthδ h_DeltaM_continu_range
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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m Signal Precision vs Cut Widthδ h_DeltaM_precisionEntries 19Mean 0.009666RMS 0.005272
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Figure A.36: δm, K+K−π+π0, electron-fit237
Optimization plots for the selection criterion on the ∆d0 between the e+e− in theD+s → K+K−π+π0 decay mode. Plots on the left grouped as Fig. A.37 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.38 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆d0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Signal Sample0d∆ h_diffD0_signalEntries 537Mean 0.001635RMS 0.002179
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Figure A.37: ∆d0, K+K−π+π0, pion-fit
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Figure A.38: ∆d0, K+K−π+π0, electron-fit
238
Optimization plots for the selection criterion on the ∆φ0 between the e+e− in theD+s → K+K−π+π0 decay mode. Plots on the left grouped as Fig. A.39 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.40 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆φ0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.39: ∆φ0, K+K−π+π0, pion-fit
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Figure A.40: ∆φ0, K+K−π+π0, electron-fit
239
A.5 D+s → π+π−π+
240
Optimization plots for the mD+s selection criterion in the D+s → π+π−π+ mode.Plots on the left grouped as Fig. A.41 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.42 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mD+s in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)±SD m
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Figure A.41: mD+s , π+π−π+, pion-fit
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Figure A.42: mD+s , π+π−π+, electron-fit
241
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(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.43: mBC, π+π−π+, pion-fit
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Figure A.44: mBC, π+π−π+, electron-fit
242
Optimization plots for the δm selection criterion in the D+s → π+π−π+ decaymode. Plots on the left grouped as Fig. A.45 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.46 correspondto electron-fitted tracks in the samples. The top left plots, for both samples,is the distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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Figure A.45: δm, π+π−π+, pion-fit
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Figure A.46: δm, π+π−π+, electron-fit
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Optimization plots for the selection criterion on the ∆d0 between the e+e− in theD+s → π+π−π+ decay mode. Plots on the left grouped as Fig. A.47 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.48 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆d0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.47: ∆d0, π+π−π+, pion-fit
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Figure A.48: ∆d0, π+π−π+, electron-fit
244
Optimization plots for the selection criterion on the ∆φ0 between the e+e− in theD+s → π+π−π+ decay mode. Plots on the left grouped as Fig. A.49 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.50 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆φ0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.49: ∆φ0, π+π−π+, pion-fit
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Figure A.50: ∆φ0, π+π−π+, electron-fit
245
A.6 D+s →→ K∗+K∗0; K∗+ → K0Sπ+,K∗0 → K−π+
246
Optimization plots for the mD+s selection criterion in the D+s → K∗+K∗0 mode.Plots on the left grouped as Fig. A.51 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.52 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mD+s in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.51: mD+s , K∗+K∗0, pion-fit
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Figure A.52: mD+s , K∗+K∗0, electron-fit247
Optimization plots for the mBC selection criterion in the D+s → K∗+K∗0 decaymode. Plots on the left grouped as Fig. A.53 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.54 correspondto electron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mBC in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.53: mBC, K∗+K∗0, pion-fit
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Figure A.54: mBC, K∗+K∗0, electron-fit248
Optimization plots for the δm selection criterion in the D+s → K∗+K∗0 decaymode. Plots on the left grouped as Fig. A.55 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.56 correspondto electron-fitted tracks in the samples. The top left plots, for both samples,is the distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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m Signal Sample vs Cut Widthδ h_DeltaM_signal_range
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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Figure A.55: δm, K∗+K∗0, pion-fit
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Figure A.56: δm, K∗+K∗0, electron-fit249
Optimization plots for the selection criterion on the ∆d0 between the e+e− in theD+s → K∗+K∗0 decay mode. Plots on the left grouped as Fig. A.57 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.58 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆d0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.57: ∆d0, K∗+K∗0, pion-fit
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Figure A.58: ∆d0, K∗+K∗0, electron-fit
250
Optimization plots for the selection criterion on the ∆φ0 between the e+e− in theD+s → K∗+K∗0 decay mode. Plots on the left grouped as Fig. A.59 correspondto pion-fitted tracks in the simulated samples. Plots on the right grouped asFig. A.60 correspond to electron-fitted tracks in the samples. The top left plots,for both samples, is the distribution of ∆φ0 in the signal Monte Carlo sample.The top right plot graphs the signal MC sample accepted by the criterion aswe vary the cut on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.59: ∆φ0, K∗+K∗0, pion-fit
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Figure A.60: ∆φ0, K∗+K∗0, electron-fit
251
A.7 D+s → ηρ+; η→ γγ; ρ+ → π+π0
252
Optimization plots for the mD+s selection criterion in the D+s → ηρ+; η→ γγ; ρ+ →π+π0 mode. Plots on the left grouped as Fig. A.61 correspond to pion-fittedtracks in the simulated samples. Plots on the right grouped as Fig. A.62correspond to electron-fitted tracks in the samples. The top left plots, for bothsamples, is the distribution of mD+s in the signal Monte Carlo sample. The topright plot graphs the signal MC sample accepted by the criterion as we increasethe cut width plotted on the x-axis. For the pion-fitted samples on the left, theplots in the second and third rows correspond to the generic and continuumMC samples, respectively. For the electron-fitted samples on the right, the plotsin the second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)±SD m
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Figure A.61: mD+s , ηρ+, pion-fit
(GeV)±SD
m1.94 1.95 1.96 1.97 1.98 1.99 2
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Figure A.62: mD+s , ηρ+, electron-fit
253
Optimization plots for the mBC selection criterion in the D+s → ηρ+ decay mode.Plots on the left grouped as Fig. A.63 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.64 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mBC in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.63: mBC, ηρ+, pion-fit
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Figure A.64: mBC, ηρ+, electron-fit
254
Optimization plots for the δm selection criterion in the D+s → ηρ+ decay mode.Plots on the left grouped as Fig. A.65 correspond to pion-fitted tracks in thesimulated samples. Plots on the right grouped as Fig. A.66 correspond toelectron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of δm in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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Figure A.65: δm, ηρ+, pion-fit
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Figure A.66: δm, ηρ+, electron-fit
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Figure A.67: ∆d0, ηρ+, pion-fit
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Figure A.68: ∆d0, ηρ+, electron-fit
256
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Figure A.69: ∆φ0, ηρ+, pion-fit
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Figure A.70: ∆φ0, ηρ+, electron-fit
257
A.8 D+s → η′π+; η′ → ρ0γ
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Optimization plots for the mD+s selection criterion in the D+s → η′π+; η′ → ρ0γ
mode. Plots on the left grouped as Fig. A.71 correspond to pion-fitted tracksin the simulated samples. Plots on the right grouped as Fig. A.72 correspondto electron-fitted tracks in the samples. The top left plots, for both samples, isthe distribution of mD+s in the signal Monte Carlo sample. The top right plotgraphs the signal MC sample accepted by the criterion as we increase the cutwidth plotted on the x-axis. For the pion-fitted samples on the left, the plotsin the second and third rows correspond to the generic and continuum MCsamples, respectively. For the electron-fitted samples on the right, the plots inthe second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)±SD m
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Figure A.71: mD+s , η′π+; η′ → ρ0γ, pion-fit
(GeV)±SD
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m h_dsPlusM_generic_range
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Figure A.72: mD+s , η′π+; η′ → ρ0γ, e-fit259
Optimization plots for the mBC selection criterion in the D+s → η′π+; η′ → ρ0γ
decay mode. Plots on the left grouped as Fig. A.73 correspond to pion-fittedtracks in the simulated samples. Plots on the right grouped as Fig. A.74correspond to electron-fitted tracks in the samples. The top left plots, for bothsamples, is the distribution of mBC in the signal Monte Carlo sample. The topright plot graphs the signal MC sample accepted by the criterion as we increasethe cut width plotted on the x-axis. For the pion-fitted samples on the left, theplots in the second and third rows correspond to the generic and continuumMC samples, respectively. For the electron-fitted samples on the right, the plotsin the second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Entries 19Mean 0.008834RMS 0.005304
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Entries 19Mean 0.00936RMS 0.005241
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Figure A.73: mBC, η′π+; η′ → ρ0γ, pion-fit
(GeV)BC m2.1 2.105 2.11 2.115 2.12 2.125 2.13 2.135 2.14
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Figure A.74: mBC, η′π+; η′ → ρ0γ, e-fit260
Optimization plots for the δm selection criterion in the D+s → η′π+; η′ → ρ0γ
decay mode. Plots on the left grouped as Fig. A.75 correspond to pion-fittedtracks in the simulated samples. Plots on the right grouped as Fig. A.76correspond to electron-fitted tracks in the samples. The top left plots, for bothsamples, is the distribution of δm in the signal Monte Carlo sample. The topright plot graphs the signal MC sample accepted by the criterion as we increasethe cut width plotted on the x-axis. For the pion-fitted samples on the left, theplots in the second and third rows correspond to the generic and continuumMC samples, respectively. For the electron-fitted samples on the right, the plotsin the second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
m (GeV)δ 0.12 0.125 0.13 0.135 0.14 0.145 0.15 0.155 0.16
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m Signal Sampleδ h_DeltaM_signalEntries 1581Mean 0.1529RMS 0.005226
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m Signal Sample vs Cut Widthδ h_DeltaM_signal_range
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m Generic MC Background Sampleδ h_DeltaM_generic
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m Contiuum MC Background Sampleδ h_DeltaM_continu
Entries 99Mean 0.1607RMS 0.02265
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m Signal Significance vs Cut Widthδ h_DeltaM_significance
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Entries 19Mean 0.01005RMS 0.00503
m Signal Precision vs Cut Widthδ
Figure A.75: δm, η′π+; η′ → ρ0γ, pion-fit
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m Signal Sampleδ h_DeltaM_signalEntries 1600Mean 0.1443RMS 0.0048
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Entries 19Mean 0.009279RMS 0.005081
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Figure A.76: δm, η′π+; η′ → ρ0γ, e-fit261
Optimization plots for the selection criterion on the ∆d0 between the e+e− inthe D+s → η′π+; η′ → ρ0γ decay mode. Plots on the left grouped as Fig. A.77correspond to pion-fitted tracks in the simulated samples. Plots on the rightgrouped as Fig. A.78 correspond to electron-fitted tracks in the samples. Thetop left plots, for both samples, is the distribution of ∆d0 in the signal MonteCarlo sample. The top right plot graphs the signal MC sample accepted by thecriterion as we vary the cut on the x-axis. For the pion-fitted samples on the left,the plots in the second and third rows correspond to the generic and continuumMC samples, respectively. For the electron-fitted samples on the right, the plotsin the second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
(m)0d∆ -0.01-0.008-0.006-0.004-0.002 0 0.0020.0040.0060.008 0.01
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Signal Sample0d∆ h_diffD0_signalEntries 1220Mean 0.001642RMS 0.002028
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Signal Sample vs Cut Width0d∆ h_diffD0_signal_range
Entries 14202Mean -0.003999RMS 0.003634
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Entries 19Mean -0.003194
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Entries 19Mean -0.003253
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Figure A.77: ∆d0, η′π+; η′ → ρ0γ, pion-fit
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Conversion MC Sample vs Cut Width0d∆ h_diffD0_conver_range
Entries 59Mean -0.004957RMS 0.003086
Conversion MC Sample vs Cut Width0d∆
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Entries 54Mean -0.002759RMS 0.004636
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Figure A.78: ∆d0, η′π+; η′ → ρ0γ, e-fit
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Optimization plots for the selection criterion on the ∆φ0 between the e+e− inthe D+s → η′π+; η′ → ρ0γ decay mode. Plots on the left grouped as Fig. A.79correspond to pion-fitted tracks in the simulated samples. Plots on the rightgrouped as Fig. A.80 correspond to electron-fitted tracks in the samples. Thetop left plots, for both samples, is the distribution of ∆φ0 in the signal MonteCarlo sample. The top right plot graphs the signal MC sample accepted by thecriterion as we vary the cut on the x-axis. For the pion-fitted samples on the left,the plots in the second and third rows correspond to the generic and continuumMC samples, respectively. For the electron-fitted samples on the right, the plotsin the second, third and fourth rows correspond to the D∗+s → D+s γ, generic andcontinuum MC samples, respectively. For both sets of plots, the bottom leftshows the significance of the signal over background. The bottom right plotshows the precision of the signal.
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Figure A.80: ∆φ0, η′π+; η′ → ρ0γ, e-fit
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BIBLIOGRAPHY
[1] R. Abegg et al. Direct measurement of the branching ratio for the decay ofthe η meson into two photons. Phys. Rev., D53:11–19, 1996.
[2] H. Albrecht et al. The Measurement of D+s and D+ meson decays into¯K∗+K∗0. Z. Phys., C53:361–365, 1992.
[3] J. P. Alexander et al. Absolute Measurement of Hadronic Branching Frac-tions of the D+s Meson. Phys. Rev. Lett., 100:161804, 2008.
[4] C. Amsler, M. Doser, M. Antonelli, D.M. Asner, K.S. Babu, H. Baer, H.R.Band, R.M. Barnett, E. Bergren, J. Beringer, G. Bernardi, W. Bertl, H. Bich-sel, O. Biebel, P. Bloch, E. Blucher, S. Blusk, R.N. Cahn, M. Carena, C. Caso,A. Ceccucci, D. Chakraborty, M.-C. Chen, R.S. Chivukula, G. Cowan,O. Dahl, G. D’Ambrosio, T. Damour, A. de Gouvła, T. DeGrand, B. Do-brescu, M. Drees, D.A. Edwards, S. Eidelman, V.D. Elvira, J. Erler, V.V.Ezhela, J.L. Feng, W. Fetscher, B.D. Fields, B. Foster, T.K. Gaisser, L. Garren,H.-J. Gerber, G. Gerbier, T. Gherghetta, G.F. Giudice, M. Goodman, C. Grab,A.V. Gritsan, J.-F. Grivaz, D.E. Groom, M. Grnewald, A. Gurtu, T. Gutsche,H.E. Haber, K. Hagiwara, C. Hagmann, K.G. Hayes, J.J. Hernndez-Rey,K. Hikasa, I. Hinchliffe, A. Hcker, J. Huston, P. Igo-Kemenes, J.D. Jack-son, K.F. Johnson, T. Junk, D. Karlen, B. Kayser, D. Kirkby, S.R. Klein,I.G. Knowles, C. Kolda, R.V. Kowalewski, P. Kreitz, B. Krusche, Yu.V.Kuyanov, Y. Kwon, O. Lahav, P. Langacker, A. Liddle, Z. Ligeti, C.-J. Lin,T.M. Liss, L. Littenberg, J.C. Liu, K.S. Lugovsky, S.B. Lugovsky, H. Mahlke,M.L. Mangano, T. Mannel, A.V. Manohar, W.J. Marciano, A.D. Martin,A. Masoni, D. Milstead, R. Miquel, K. Mnig, H. Murayama, K. Nakamura,M. Narain, P. Nason, S. Navas, P. Nevski, Y. Nir, K.A. Olive, L. Pape, C. Pa-trignani, J.A. Peacock, A. Piepke, G. Punzi, A. Quadt, S. Raby, G. Raffelt,B.N. Ratcliff, B. Renk, P. Richardson, S. Roesler, S. Rolli, A. Romaniouk,L.J. Rosenberg, J.L. Rosner, C.T. Sachrajda, Y. Sakai, S. Sarkar, F. Sauli,O. Schneider, D. Scott, W.G. Seligman, M.H. Shaevitz, T. Sjstrand, J.G.Smith, G.F. Smoot, S. Spanier, H. Spieler, A. Stahl, T. Stanev, S.L. Stone,T. Sumiyoshi, M. Tanabashi, J. Terning, M. Titov, N.P. Tkachenko, N.A.Trnqvist, D. Tovey, G.H. Trilling, T.G. Trippe, G. Valencia, K. van Bibber,M.G. Vincter, P. Vogel, D.R. Ward, T. Watari, B.R. Webber, G. Weiglein, J.D.Wells, M. Whalley, A. Wheeler, C.G. Wohl, L. Wolfenstein, J. Womersley,C.L. Woody, R.L. Workman, A. Yamamoto, W.-M. Yao, O.V. Zenin, J. Zhang,R.-Y. Zhu, P.A. Zyla, G. Harper, V.S. Lugovsky, and P. Schaffner. Review ofparticle physics. Physics Letters B, 667(1-5):1 – 6, 2008. Review of ParticlePhysics.
264
[5] Bernard Aubert et al. Measurement of the branching ratios Γ(D∗+s →D+s π0)/Γ(D∗+s → D+s γ) and Γ(D∗0 → D0π0)/Γ(D∗0 → D0γ). Phys. Rev.,D72:091101, 2005.
[6] A. Beddall and A. Beddall. Measurement of the Dalitz-decay branchingratio of the π0. Eur. Phys. J., C54:365–370, 2008.
[7] Y. A. Budagov, S. Viktor, V. P. Dzhelepov, and P. F. Ermolov. Internal Con-version Pairs in the Decay of Neutral π Mesons. Sov. Phys. JETP, 11:755,1960.
[8] A. Chen, M. Goldberg, N. Horwitz, A. Jawahery, P. Lipari, G. C. Moneti,C. G. Trahern, H. Van Hecke, M. S. Alam, S. E. Csorna, L. Garren, M. D.Mestayer, R. S. Panvini, Xia Yi, R. Giles, J. Hassard, M. Hempstead, K. Ki-noshita, W. W. MacKay, F. M. Pipkin, Richard Wilson, H. Kagan, P. Avery,C. Bebek, K. Berkelman, D. G. Cassel, J. W. DeWire, R. Ehrlich, T. Fergu-son, R. Galik, M. G. D. Gilchriese, B. Gittelman, H. Halling, D. L. Har-till, D. Herrup, S. Holzner, M. Ito, J. Kandaswamy, V. Kistiakowsky, D. L.Kreinick, Y. Kubota, N. B. Mistry, F. Morrow, E. Nordberg, M. Ogg, R. Per-chonok, R. Plunkett, A. Silverman, P. C. Stein, S. Stone, D. Weber, R. Wilcke,A. J. Sadoff, S. Behrends, K. Chadwick, J. Chauveau, P. Ganci, T. Gen-tile, Jan M. Guida, Joan A. Guida, R. Kass, A. C. Melissinos, S. L. Olsen,G. Parkhurst, D. Peterson, R. Poling, C. Rosenfeld, G. Rucinski, P. Tipton,E. H. Thorndike, J. Green, R. G. Hicks, F. Sannes, P. Skubic, A. Snyder, andR. Stone. Evidence for the f meson at 1970 mev. Phys. Rev. Lett., 51(8):634–637, Aug 1983.
[9] CLEO Collaboration. CLEO Yellow Book. Internal, 2001.
[10] D. Cronin-Hennessy et al. Measurement of Charm Production Cross Sec-tions in e+e− Annihilation at Energies between 3.97 and 4.26 GeV. Phys.Rev. D, 80:072001, 2009.
[11] R. H. Dalitz. On an alternative decay process for the neutral π- meson,Letters to the Editor. Proc. Phys. Soc., A64:667–669, 1951.
[12] R. Brun et al. Geant detector description and simulation tool. CERN Pro-gram Library Long Writeup W5013, 1993.
[13] S. L. Glashow, J. Iliopoulos, and L. Maiani. Weak interactions with lepton-hadron symmetry. Phys. Rev. D, 2(7):1285–1292, Oct 1970.
265
[14] Rob Kutschke. How and Why Wonder Book of CLEO Tracking Conven-tions. CSN 94-334, 1996.
[15] David J. Lange. The EvtGen particle decay simulation package. Nu-clear Instruments and Methods in Physics Research Section A: Accelera-tors,Spectrometers,Detectors and Associated Equipment, 462(1-2):152 – 155,2001.
[16] A. Lopez et al. Measurement of Prominent eta Decay Branching Fractions.Phys. Rev. Lett., 99:122001, 2007.
[17] P. Naik et al. Measurement of the Pseudoscalar Decay Constant fDs UsingD+s → τ+ν, τ+ → ρ+ν Decays. Phys. Rev., D80:112004, 2009.
[18] Peter Onyisi and Werner Sun. Developments in D(s)-Tagging. CBX 06-11,2006.
[19] T. K. Pedlar et al. Charmonium decays to γπ0, γη, and γη′. Phys. Rev.,D79:111101, 2009.
[20] A. Ryd et al. Tracking at CLEO. CBX, 2003.
[21] N. P. Samios. Dynamics of Internally Converted Electron-Positron Pairs.Phys. Rev., 121:275–281, 1961.
[22] M. A. Schardt et al. A New Measurement of the Dalitz-decay branchingratio of the π0. Phys. Rev., D23:639, 1981.
266