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NI Technical Symposium 2015 Professional Development Conference for Engineers, Scientists and Educators 3 March Cape Town 5 March Johannesburg southafrica.ni.com/techsym

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NI TechnicalSymposium 2015Professional Development Conferencefor Engineers, Scientists and Educators

3 March Cape Town5 March Johannesburg

southafrica.ni.com/techsym

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Please Join Us at the 2015 NI Technical Symposiums

The 2015 NI Technical Symposium is a free, annual graphical system design technical conference and exhibition that brings together hundreds of engineers, scientists and educators representing a spectrum of industries, from medical devices, transportation and telecommunications to robotics and energy. Learn about the latest technology to accelerate productivity for software-defined systems in test, measurement, embedded systems and control, and select from over 13 technical sessions from local and international NI and domain experts at this free, multi-track event.

This year’s conference highlights include:

■■ Over 12 hours of technical sessions to choose from

■■ International Guest speakers from NI, including Stuart Gillen, Principal Marketing Manager,

Condition Monitoring Platform

■■ Guest presentations from organisations including SAAB, CSIR, Eskom, Aerosud, Kiaros and PCT

■■ Multiple tracks featuring introductory through intermediate and advanced topics

■■ Keynote presentation: You and NI Will

■■ Interactive hands-on Test-Drive stations and Exhibition area

■■ Free Certification exams

Media Partners

Speakers

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NI Technical Symposiums will feature presentations from a variety of guest speakers from industry, academia and abroad including:

Guest Speakers*

Stuart Gillen, Principal Product Manager, NIFor the past 15 years, Stuart has worked for NI, headquartered in Austin, TX. He is currently the Principal Marketing Manager for their Condition Monitoring platform and has held a variety of leadership roles including support, product management, and Senior Group Manager of the R&D team responsible for NI’s hardware and software vibration monitoring product line. Stuart is a graduate of Kansas State University in Electrical Engineering. He also holds an M.B.A from Kansas State University and a Vibration Level III Certification from the Vibration Institute of America.

Rejwan Ali, Technical Marketing Engineer, NIRejwan joined NI Oceania in 2009 as an Application Engineer, and moved into a Technical Marketing role in 2013, which sees him work on product and marketing strategy for key industries. He is a Certified LabVIEW Developer and has a wealth of knowledge in Embedded Systems for monitoring and control. Ali regularly presents at industry conferences, including the NI Technical Symposiums, LabVIEW Developer Days, Comms Connect and the IDC Remote Monitoring and Control Conference. Exposure in the field working with a vast array of customers on their application challenges has given Rejwan great insight into the demands and challenges of engineering applications.

Local Experts

Fanie Coetzer, Field Sales Engineer, NI South AfricaFanie completed his degree in Electronic Engineering at the Central University of Technology in Bloemfontein, during which he participated in a 3 month exchange program in Germany, where he expanded his knowledge on robotic and industrial communication systems. He started his career as a Systems Engineer at a commercial radio station, where he gained experience in RF communication, signal analysis and system monitoring. Fanie joined the NI team in 2011 as an Applications Engineer, focusing on providing support and training to customers. During his time at NI, Fanie gained significant experience in finding solutions for customer application requirements, and building proof of concept models in a number of industries including; food and beverage, research and military environment. In 2013 Fanie took the role of Field Sales Engineer and currently services all industries in Gauteng, Mpumalanga, North West and Limpopo.

Stephen Plumb, Branch Manager, NI South AfricaStephen obtained his bachelor’s degree in science from the University of Natal (KZN). While completing his education, Stephen worked in the Applied Physics Group on several projects relating to industrial applications of physics, most notably the application of image processing techniques and neural network solutions to conveyor belt monitoring. Based on this research, Stephen formed a company with a graduating partner, specializing in conveyor belt monitoring and other image processing related problems. During this time, projects were undertaken ranging from acoustic measurement systems to towing dynamometers. Working on such a wide variety of complex and interesting applications led to a close association with NI and, in 2006, Stephen joined the company directly when he was appointed as the Branch Manager of the South African branch.

Jacques Cilliers, Application Engineer, NI South AfricaJacques completed degrees in Electronic Engineering and Computer Science at the University of Johannesburg. During his studies Jacques gained experience in the fields of robotics and large scale software development. Jacques joined the NI team in 2010 and currently works as an Application Engineer. He is actively involved in customer education, technical support and proof of concept development for multiple industries across the country.

Nicholas Haripersad, Field Applications Engineer, NI South AfricaNicholas completed his Electronic Engineering Diploma at the Durban University of Technology. During his studies Nicholas gained experience in the fields Communication Systems, Process Control and Instrumentation. He then started his career at a Vehicle Tracking and Manufacturing company which he mainly focused with R&D, Automated Test and Control systems of test equipment. Nicholas joined NI in 2012 and has continued adding to his experience within Control and Monitoring Applications in South Africa and has now moved on to the Sub-Saharan Africa Region.

*Speakers vary per location and more guest speakers will be announced. Keep up to date at southafrica.ni.com/techsym

Agenda

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8:30 Registration, Arrival Tea/Coffee

9:00 Keynote Presentation: You and NI

10:15 What’s New in LabVIEW 2014

10:45 Morning Tea

11:00 Choosing the Right Data Acquisition Platform and Making the Most of It

11:35 Automating Stand-alone Instruments

12:10 Don’t Think You Need an FPGA? Think Again!

12:50Guest Case Study Presentations

Johannesburg - Hennie Lewies, Aerosud; John Gush, KiarosCape Town - Wallace Vosloo, Eskom

13:05 Lunch

Track 1 Track 2

13:45 Simplifying System Design With New Embedded Technologies Introduction to PXI- A Look Under The Hood and Tips For Application Development

14:25Guest Case Study Presentations

Johannesburg - Dwain Dunn, CSIRCape Town - Lourens van Dyk, PCT

Guest Case Study PresentationsJohannesburg - Percy Hobkirk, SAAB

Cape Town: More details to be announced

14:40 New Enterprise Solution for Condition Monitoring Applications Advances in RF and Microwave Measurement Technology

15:20 Afternoon Tea

15:30Tips for Code Re-use – Bringing Your .dll, .m, and .mdl Files

Into the LabVIEW FoldAre MI Right for Me? An Introduction to Modular Instrumentation

16:15 Free Certified LabVIEW Associate Developer (CLAD) Exams Customising Your Test Instrumentation With New Software-Designed Instruments

16:50 Wrap Up

Software Development RF and Communications Measurements Breaks/Meals

Automated Test Industrial Control and Embedded Design Keynote

Session D

escriptions

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Keynote Presentation: You and NI Together, you and NI are redefining the ways in which engineers solve key business applications like production test, data acquisition, and embedded control and monitoring while striving to find insight in data. The keynote will feature live demonstrations of newly released products and inspiring real-life customer applications that are making Industry 4.0 and Cyber Physical Systems a reality. Join us as we explore the latest technologies driving this evolution and see how NI’s powerful, hardware and software offering can tailor to your needs, now and in the future.

What’s New in LabVIEW 2014 IntroductoryDiscover the significant improvements LabVIEW 2014 makes in the areas of acquiring, analyzing, and visualizing data so that you can take any data set and make an informed decision fast.

Choosing the right Data Acquisition Platform and Making the Most of It Introductory/IntermediateTrue experimentation should be lead by the results needed not the measurement hardware provided. But no engineer has the budget or space to have infinite hardware options to hand. This session introduces the NI DAQ platforms and explains the trade-offs made when choosing hardware for your measurement application by exploring both the advantageous technologies available, and platform limitations, to ensure you invest in the correct device.

Introduction to Automating Standalone Instruments Introductory/IntermediateEvery day, engineers work with a variety of benchtop instruments from oscilloscopes to more specialised instruments such as radiometers. Explore connectivity options including GPIB, USB and Ethernet and learn how to get started automating multiple measurements quickly with LabVIEW and certified instrument drivers..

Don’t think you need an FPGA? Think again! IntroductoryFPGAs are at the heart of a wide range of applications, from data loggers to particle accelerators. However, many system designers are unfamiliar with these incredibly powerful and reconfigurable chips and the benefits they could deliver to their applications. In this session, learn how you can easily harness the performance, reliability and flexibility of FPGAs without prior knowledge of hardware description languages like VHDL or Verilog.

Track 1

Simplifying System Design With New Embedded Technologies Introductory“The newest CompactRIO controller delivers unrivaled performance and a diverse feature set, including improved integration with vision systems and integrated display output. Discover how this new CompactRIO controller--based on an Intel Atom processor, the latest Xilinx Kintex-7 FPGA and NI Linux Real-Time--can outperform the competition and

simplify the design of your next embedded system.“

New Enterprise Solution for Condition Monitoring Applications IntermediateLearn about NI’s new enterprise software suite for online condition monitoring to gain insight into the health of rotating machinery and improve maintenance programs. NI InsightCM(tm) Enterprise integrates ready-to-deploy hardware and software that acquires condition indicators, handles management and analysis of analog data, and offers remote systems management to monitor health and simplify deployment and configuration on 100s of CompactRIO systems at once.

Tips for Code Re-use - Bringing Your.dll, .m, and .mdl Files into the LabVIEW Fold IntermediateGot code that you want to reuse? At this session, discover how to integrate different models of computation within LabVIEW. Learn how to incorporate C DLLs and .NET assemblies along with your .m algorithms and .mdl models into the LabVIEW environment. Example applications include embedded systems, automated test, RF/communications, and control systems..

Guest Case StudiesHear from domain experts from industry as they explore innovative approaches to their application challenges using graphical system design. Guest speakers are confirmed from organisations including SAAB, CSIR, Eskom, Aerosud, Kiaros and PCT. For more information, visit southafrica.ni.com/techsym

Session D

escriptions

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Track 2

Introduction to PXI Introductory/IntermediateExplore the PXI platform and learn how it has evolved over the years to help thousands of companies meet their test, measurement, and control needs. Also get a sneak peek at new products and customer solutions.

Advances in RF and Microwave Measurement Technology IntroductoryTake a look at NI’s biggest RF launch of 2014. We are taking PXI beyond 20 GHz in both generation and analysis w/ real-time analysis bandwidth exceeding 500 MHz. The spectral performance is designed to meet the challenging requirements of modern RF & Microwave test. Don’t miss this opportunity to learn about these brand new products.

Are MI Right for Me? An Introduction to Modular Instrumentation Introductory/IntermediateDoes your current test architecture meet your quality and cost goals while keeping up with growing product complexity? If it is time for a change but you don’t know where to start, attend this session to demystify the conversion to a modular testing approach and see how it can better meet your test needs.

Customising Your Test Instrumentation With New Software-Designed Instruments AdvancedToday’s incredibly complex products require an ever-growing amount of test. Traditional test instruments aren’t proportionally scaling to keep up. Each subsequent generation of technology includes more pieces and more sophisticated technology and the cost of using traditional instrumentation to test these devices is only increasing. Learn how customizing your test instrumentation through the user-programmable FPGA in software-designed instrumentation can enhance your test systems.

Certification E

xams/H

ands-On

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Certification Exams

Free Certification ExamsSign up to sit your Certified LabVIEW Associate Developer (CLAD) Exam for free at the conference. National Instruments certifications are industry-recognised credentials that distinguish expertise in using NI software for developing measurement and automation solutions. The Certified LabVIEW Associate Developer (CLAD), Certified LabVIEW Developer (CLD) and Certified LabVIEW Architect (CLA) designations represent basic, advanced and expert knowledge in using NI products for test and

measurement applications.

Benefits of NI Certification■■ Gain recognition from the industry, employers, clients and peers

■■ Differentiate technical competency for career advancement

■■ Distinguish expertise with professional credentials

■■ Learn more at ni.com/training

Reserve Your PlaceTo register to sit your Certified LabVIEW Associate Developer exam (CLAD) at the NI Technical Symposium:

Email: [email protected]

Web: Visit southafrica.ni.com/techsym

Freecall: 0800 203 199

Places are limited, so please book early to avoid disappointment.

Interactive Demo Stations Take the opportunity to gain demo experience with LabVIEW and NI measurement and control systems with the support of NI engineers at our interactive demo stations in the

exhibition area.

Test-Drive LabVIEW and CompactDAQ for Computer-Based Measurements CompactDAQ is a portable, rugged DAQ platform that integrates connectivity and signal conditioning into modular I/O for directly interfacing to any sensor or signal. The breadth of bus, chassis, and I/O conditioning options combined with the customisable nature of LabVIEW software provide the best solution to meet the needs of your medium-channel-count application. ni.com/compactdaq

Test-Drive LabVIEW Real-Time, LabVIEW FPGA and CompactRIO for Embedded Monitoring and Control NI CompactRIO combines an open embedded architecture with small size, extreme ruggedness, hot-swappable industrial I/O modules, and is powered by the LabVIEW reconfigurable I/O (RIO) architecture. ni.com/compactrio

Registration Form

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Fax Registration Form

Please register me for the following 2015 NI Technical Symposium:o3 March—Cape Towno5 March—Johannesburg

Name/Job Title

Company/Department

Address

City Postcode

Tel. Cell

Email

Please register my colleague for the following 2015 NI Technical Symposium:o3 March—Cape Towno5 March—Johannesburg

Name/Job Title

Company/Department

Address

City Postcode

Tel. Cell

Email

VenuesCape Town: Garden Court Nelson Mandela Boulevard021 448 4123 Tsogo Sun/ Garden Court NMBCnr. Melbourne and Coronation RoadsWalmer EstateCape Town

Johannesburg Bytes Conference Centre011 205 7000www.bytes.co.zaBytes Business ParkBlock C 241 Third RoadMidrand

Each event runs from 9am to 5pm. For venue, parking and transportation information visit southafrica.ni.com/techsym

2015 NI Technical Symposiums

Free RegistrationAdmission to the NI Technical Symposiums is free. For more details and to register:

NI South AfricaWeb: southafrica.ni.com/techsymEmail: [email protected]: 0800 209 199Fax: 011 805 8194

©2015 National Instruments. All rights reserved. Big Analog Data, CompactRIO, CVI, DIAdem, LabVIEW, Multisim, National Instruments, NI, ni.com, NI CompactDAQ, NI-DAQ, NI FlexRIO, NI TestStand, NI VeriStand, NIWeek, and USRP are trademarks of National Instruments. The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries. LEGO is a trademark of the LEGO Group. Other product and company names listed are trademarks or trade names of their respective companies. A National Instruments Alliance Partner is a business entity independent from National Instruments and has no agency, partnership, or joint-venture relationship with National Instruments. 20012