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National Facility for Atom Probe Tomography (NFAPT)HSB-134, Indian Institute Institute of Technology Madras, Chennai – 600036, India
www.nfapt.iitm.ac.in, Ph: +91-44-22575798; email: [email protected]
National Facility for Atom Probe Tomography(NFAPT) houses the state of art atom probetomography (APT), latest cutting edgetechnology "Local Electrode Atom Probe (LEAP5000 XR)" along with "Helios Dual BeamScanning Electron Microscope with Focussed IonBeam (FIB)" for LEAP sample preparation. Thegroup of eight founding partner institutions (IITMadras, IIT Bombay, IIT Delhi, IIT Kanpur, IITKharagpur, IIT Ropar, ARCI Hyderabad/Chennaiand BRNS) have the remotely operable moduleempowering independent online operationalcapability of LEAP.
This is the first remotely operable LEAP facility inthe world. Any researcher in India is welcome touse the facility by contacting the coordinator ofthe specific zone he/she belongs to, with a one-page proposal (format attached) that brings outthe need for using the facility for his/herresearch. Once the proposal is approved, a slotwill be provided for the use of the facility
About National Facility for Atom Probe Tomography (NFAPT)
Atom probe tomography (APT) exhibits unique advantages and capabilities such as atomicresolution (lateral resolution: 0.3-0.5 nm and depth resolution 0.1-0.3 nm), 3D informationabout the position of the each atom in the analysed sample and chemical sensitivity down toatomic parts per million.
The laser assisted LEAP 5000 XR extends the advantages to characterize range of materialswith improved detection sensitivity and efficiency making this as a versatile atom probe.
LEAP 5000 XR
Focused Ion beam facility
Introduction to Atom Probe Tomography
APT sample preparation using FIB
LEAP Applications
Cutting-edge LEAP 5000XR installed at NFAPT enables materials analysis
with nanoscale resolution with high sensitivity
Are you interested in performing APT for your samples?
Steels & ODS steels
Clusters, precipitates & interfaces
Non-ferrous alloys, Superalloys
High entropy alloys & Glasses
Ceramics & Polymers
Thermoelectric materials
Energy capture and storage materials
Geochemistry
Magnetic, Ferroelectric & ME Materials
Biomaterials
Semiconductors multilayers & devices
Catalytic materials
Sprintronic & Photovoltaic materials
Nano wires and tubes, quantum dots
Grain boundary analysis
APT of ferritic ODS alloys
a) Bright field STEM b)
nanobeam diffraction
and c) APT result
showing carbon
segregation at grains
a b
c
APT of FeNiAlCr alloy
Soft magnet cluster analysis
Please contact:
Research Manager
National Facility for Atom Probe Tomography
Dept., of Metallurgical and Materials Engineering
Indian Institute of Technology - Madras
Chennai - 600036, Tamil Nadu, India
Phone: +91-44-22575798,
Mail: [email protected]
Web: www.nfapt.iitm.ac.in
Courtesy: www.cameca.com, Dr. Krishana Rajan and Dr. K.G.Pradeep
NFAPT welcomes APT
proposals from universities,
research institutes and from
industry
