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1Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer interference coatings
2Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Scattering by density variations within a
multilayer coating
3Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Scattering of radiation by a sinusoidal
density distribution (atoms or electrons)
4Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Scattering from density variations
5Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer mirrors satisfy the Bragg condition
6Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
An angular scan of a multilayer mirror performs a
Fourier-transform of the density profile
7Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer mirrors satisfy the Bragg condition
8Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
High reflectivity multilayer coatings require
• Refractive index contrast at the interfaces
• Minimal absorption in the low-Z material
• Thin high-Z layer where possible ! ! "#H /("#H + "#L)
• Interfaces which are chemically stable with time
• Minimal interdiffusion at the interfaces
• Minimal interfacial roughness (no crystallite formation
within the layers, no shadowing in the coating process,
surface mobility)
• Thermal stability during illumination
• Chemically stable vacuum interface(e.g., Si02 or capping
layer)
• Uniform coating thickness
9Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Computed reflectivity of a W/C x-ray multilayer mirror
10Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
High order reflections from a multilayer coating
11Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer interface mirrors computational model
www.cxro.LBL.gov
12Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Atomic scattering factors for Silicon (Z = 14)
13Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Atomic scattering factors for Molybdenum
(Z = 42)
14Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Optimized reflectivity with thin “high-Z” layers
15Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
A high quality Mo/Si multilayer mirror
16Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Mo/Si multilayer interference coating
Molybdenum as the “scattering layer”
Silicon as the non-absorbing “spacing layer”
Actually an exaggeration, the complex
refractive index
of each material plays a role in the reflection
process
The absorption edge Si-L3 = 99.2 eV
(12.5 nm)
Higher photon energies are absorbed in Si,
lower photon energies (longer wavelengths)
are not.
Typically $ = 13.4 nm or more.
Molybdenum has relatively good scattering
properties in this
photon energy (wavelength) region, with
limited absorption.
17Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
High reflectivity, thermally and environmentally robust
multilayer coating for high throughput EUV lithography
18Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer mirrors have achieved a reflectivity of 70%
19Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Recent progress in multilayer mirrors
20Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Sputtered deposition of a multilayer coating
21Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
DC magnetron sputtering is used to reliably deposit multilayer
coatings of predictable center wavelength and excellent uniformity
22Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Buried, trace amounts of iron in a defective
silicon solar cell
23Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Microprobe analysis of contaminated soil
24Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Polarization studies of magnetic materials
25Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Photoemission microscopy for surface science and
characterization
26Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Photoemission spectroscopy reveals characteristic
electron binding energies
27Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Photoemission spectroscopy as a tool
for surface science
28Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Observation of varied chemical states by
photoemission spectromicroscopy
29Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Photoemission microscopy of a AIGaN film – “Monet”
30Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
High resolution x-ray diffraction under high
pressure using multilayer coated focusing optics
31Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
32Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
The Cassegrain telescope
33Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Extreme ultraviolet astronomy
34Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
EUV image of the solar corona showing loops near the
solar limb
35Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Dynamics of the solar corona
36Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
37Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
38Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
39Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Extreme ultraviolet (EUV) lithography
40Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Smooth multilayer coatings are required to minimize
wavefront errors in EUV optical systems
41Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt
Multilayer coatings for the ETS projection optics
approach production specifications
Systematic d-space variations suggest path to further improvements.
(Courtesy of R. Soufli and E. Spiller, LLNL)
42Prof. David Attwood / UC Berkeley EE213 & AST210 / Spring 2009 05_Multilayers_2009.ppt