M E A S U R E M E N T SCIENCE C O N F E R E N C E

Pasadena Convention Center, CaliforniaJanuary 27 and 28, 1994

NOTICE

The material included in these proceedings MAY besubject to copyright. The Measurement ScienceConference recommends that no material beduplicated without prior release of the authors.

MSC SUPPORTING ORGANIZATIONSAmerican Society for Quality ControlCalifornia State University, Dominguez Hills, MSQAGovernment Industry Data Exchange ProgramIEEE Instrumentation and Measurement SocietyInstrument Society of America — Test and Measurement Div.Instrument Society of America — Aerospace DivisionNational Conference of Standards LaboratoriesNational Institute of Standards and Technology (NIST)Precision Measurements Association (PMA)Precision Time and Time Interval

UB/TIB Hannover113 289 537

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1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 1-A

TITLE: The Impact of The North American Free Trade AqrefmRnt OnThe Measurement Ocmmunity.

DEVELOPER: John DonaldsonNational Institute of Standards and TechnologyGaithersburg, Maryland

PANEL DISCUSSION: This Panel of Government and Industry expertswill discuss the effects of the North AmericanFree Trade Agreement (NAFTA) on Standards andTechnology in the measurement community.

SESSION 1-B

TITLE: DC and low Frequency

DEVELOPER: Miriah ArtherRockwell InternationalAnaheim, California

PAPER : Application of the NIST Testing Strategies to aMultirange Instrument.

AUTHCR: Andrew KoffmanNational Institute of Standards and Technology,Gaithersburg, Maryland

PAPER : Low-Level DC Measurement TechniquesA17IHCR: Tom Mego

Keithley Instruments,Solon, Ohio

PAPER : A Fast Autobalancing, Direct-ReadingTVC for AC Calibration.

AUTHCR : Loeb JulieJulie Research Laboratories, Inc.New York, New York

SESSION 1-C

TITLE: New Techniques in Optical Alignment and Measur it

DEVELOPER: Kevin ConnellMcDonnell Douglas Helocopter Co.Mesa, Arizona

PAPER : Advanced Boresightinq TechnologyAUTHCR: Jim Jaclitch

AAI Corperation,Hunt valley, Maryland

PAPER : Principles of Laser Tracking SystemsAUTHOR: Lori Price

Leica Ind.Narcross, Georgia

SESSION 1-D

TITLE: Environmental Measurement Technology Part One

DEVELOPER: Rolf B.F. SchumacherCoast Quality Metrology Systems, Inc.San Clemente, California

PAPER : The Certification and Use of NIST Reference

AUTHCR:

PAPER

Materials in Environmental Analysis.Thomas E. GillsNational Institute of Standards and Technology,Gaithersburg, Maryland

Sampling Inspection and Survey Interpretation:A Comparison of Methods

AUTHCR: Robert J. Tuttle and G. SubbaramanRockwell International, Rocketdyne Div.Canoga Park, California

PAPER : Conducting the Measurements and Analyses Required forDetermination of Compliance with Contemporary WaterQuality Standards.

AUTHCR: Steven R. Cvendale and M.D. RobertsonRockwell International, Rccketdyne Div.Canoga Park, California

1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 2-A

TITLE: Progress and Problems with the Implementation ofThe ISO Guide on Uncertainty

DEVELOPER: Carroll CroarkinNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Progress Report On The Implementation Of TheISO Guide To The Expression Of Uncertainty in Measurement

AUTHCR: Dr. Barry TaylorNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : A Statistican Looks at ISO/CIPM Uncertainty AnalysesAUTHCR: Dr. Keith Eberhardt

National Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Problems and Remedies For NIST Calibration ServicesAUTHCR: Ms. Carroll Croarkin

National Institute of Standards and TechnologyGaithersburg, Maryland

SESSION 2-B

TITLE: Resistance Measurements

DEVELOPER: David AllenRockwell InternationalAnaheim, California

PAPER : Resistance MeasurementsAUTHCR: Duane Brown

Measurements International,Prescott, Onterio, Canada

PAPER : Constant Current Loop: A New Paradigm ForResistance Measurements

AUTHOR: Karl AndersonNASA Dryden Flight Research FacilityEdwards, California

SESSION 2-C

TITLE: Screw Thread Measurements

DEVELOPER: Ralph VealeNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Screw Thread MeasurementsAUTHOR: Bill Hatzman

Southern California EdisonWestminster, California

PAPER : Position Measurement of Internal ThreadsAUTHCR: Bruce Armstrong

Naval Warfare Assessment CenterCorona, California

PAPER : Thread MeasurementAUTHCR: Joe Greenslade

Greenslade GagesFt. Worth, Texas

PAPER : A Preliminary Report on NIST Research On The CalibrationOf Thread Gages Under Five mm in Size

AUTHOR: Ralph VealeNational Institute of Standards and TechnologyGaithersburg, Maryland

SESSION

TITLE: Enviromental Measurements Part Two

DEVELOPER: John FerlingClaremont McKenna CollegeClaremont, California

PAPER : Spatial and Measurement Bias and Variability inEnviromental Measurements

AUTHOR: J. Jeffrey van Ee and Evan J. EnglundU.S. Enviromental Protection AgencyLas Vegas, Nevada

PAPER : Fjiviromental Measurements Conducted at theEPA Region 9 Laboratory

AUTHCR: Brenda BettencourtU.S. Enviromental Protection AgencySan Fransisco, California

PAPER : Speciation of Ambient Hydrocarbon Compounds in theSouth Coast Air Basin 1993 Pilot Program Results

AUTHCR: Steve Barbosa and Bill BopeSouth Coast Air Quality Management DistrictDiamond Bar, California

1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 3-A

TITLE: Equipment Management

DEVELOPER: Earl Amano

Hughes Aircraft Co.El Segundo, California

PAPER : Equipment Management Growing PainsAUTHCR: James P. Tavernier

Aerojet Electronic System DivisionAzusa, California

PAPER : Functional Requirements for Warehouse Computer SupportAUTHOR: Charles A Motzko

TELOGY, Inc.Redwood City, California

AUTHOR: Don WyattDIVERSIFIED DATA SYSTEMSTucson, Arizona

SESSION 3-B

TITLE: Biomedical and Phar"g><"**Ttical MetrologyDEVELOPER: John Miche'

Marine InstrumentsRichmond, California

PAPER: Biomedical and Pharmaceutical MetrologyAUTHCR: John Miche'

Marine InstrumentsRichmond, California

Panel:Presentation by the Food and Drug Administrationon the role of measurement science in the Bicroedicalindustry.

SESSION 3-C

TITLE: Unique Dimensional Measurement Problems

DEVELOPER: Frank HajneyMe Donnell Douglas Aerospace-WestHuntington Beach, California

PAPER : length Metrology of Canplementary Small Plastic RulersAUTHCR: Theodore D. Doiron and Daniel T. Doiron

National Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Uncertainties in Dimensional MeasurementsMade at Nonstandard Temperatures

AUTHCR: Dennis A. SwytNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Laser Rotary Encoders in Smallest Computer Disk Drivesand Largest Telescope

AUTHCR : Charles WangOptodyne, Inc.Compton, California

SESSION

TITLE: Pressure and Vacuum Metrology

DEVELOPER: Laurie BakerRockwell InternationalAnaheim, California

PAPER : Accurate Calibrations of Low Pressure InstrumentsAUTHCR: Charles Reed

Ametek - Mansfield & Green DivisionLargo, Florida

PAPER : An Overview of International Pressure MetrologyAUTHCR: Charles Ehrlich

National Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : Interested in a Pressure Round Robin?AUTHOR: Don Francis

Ruska InstrumentsHouston, Texas

and Mike SalazarLos Alamos National LaboratoryLos Alamos, New Mexico

1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 4-A

TITLE: Measurement Process Control Beyond The Lab

DEVELOPER: J. Wade Keith IIIMcDonnell Douglas Aerospace-WestHuntington Beach, California

PANEL : A panel of government and industry representatives willdiscuss the measurement process control expectations ofequipment users as it applies to metrology systemrequirements from NASA and/or the ISO 9000 series ofdocuments.

SESSION 4-B

TTTLE: Electronic Potpourri

DEVELOPER: Jim HillHughes Aircraft Co.El Segundo, California

PAPER : A Revised Uncertainty Analysis for the NIST30 MHz Attenuation Calibration System

AUTHCR: Jeffrey A. JargonNational Institute of Standards and TechnologyBoulder, Colorado

PAPER : Polynomial Modeling of Analog-to-Digital ConvertersAUTHCR: Otis M. Solomon, Jr.

Sandia National LaboratoriesAlbuquerque, New Mexico

PAPER : An Intregrated Approach to Calibrating3 1/2 & 4 1/2 Digit Multimeters

AUTHCR: Richard RoddisWavetek/DatronNorwich, Norfolk, U.K.

SESSION 4-C

TITLE: Coordinate Measuring Machines

DEVELOPER: Bob TobiasTRWRedondo Beach, California

PAPER : Sampling Methods For Circles and Cylinders inCoordinate Measuring Machines

AUTHCR: Jay RajaUniversity of North Carolina-CharlotteCharlotte, North Carolina

PAPER : A Novel Artifact Developed by NIST forCMM Interim Testing

AUTHCR: Steven PhillipsNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : UNIX and Coordinate Measuring Machines: A Match?AUTHCR: Valerie Gasio

ConsultantCompton, California

SESSION 4-D

TTTLE: Mass Metrology Symposium Part One

DEVELOPER: John P. ClarkWestinghouse Savannah River Co.Aiken, South Carolina

PAPER : Mass Measurement Process Error Determination and ControlAUTHOR: Jerry L. Everhart

E.G.&G. Mound TechnologiesMiamisburg, Ohio

PAPER : Examination Of Parameters That Can Cause ErrorIn Mass Determinations

AUTHCR: Randall M. Schconover, NIST& Frank E. Jones, ConsultantGaithersburg, Maryland

PAPER : Measurement Instrument Surveillance and Traceability ForWeighing Machines Used In Production and Quality Control

AUTHCR: Arhend HelmsSartorius Corp,

. AG Germany

1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 5-A

TITLE: MulHTnpdia Applications in Measurement Science

DEVELOPER: James C. TriplettHart ScientificPleasent Grove, Utah

PAPER : Intelligent Tutoring For Customer ServiceAnd Customer Support

AUTHCR: James C. TriplettHart ScientificPleasent Grove, Utah

PAPER : Information Applications of Multimedia to IndustrialInformation Systems

AUTHOR: Jerry A. Van OsWestminster College of Salt Lake CitySalt Lake City, Utah

SESSION 5-B

TITLE: Metrology Publishing

DEVELOPER: Brian ConroyTeledyne Systems Co.Northridge, California

PAPER : Honestly - This is the last Change!AUTHCR: Frank Capell

Fluke CorperationEverett, Washington

SESSION 5-C

TTTLE: Measurement Uncertainty, Thearitical Principles

DEVELOPER: Rita KirchgraberTRWRedondo Beach, California

PAPER : Propagating UncertaintiesAUTHCR: Russell D. Brady

Scanivalve CorporationSan Deigo, California

PAPER : Method for Calculation of Correlation Factor BetweenComponents of Measurement Uncertainty

AUTHCR: Dr. Semyon G. RabinovichConsultantLos Angeles, California

SESSION

TITLE: Mass Metrology Symposium Part Two

DEVELOPER: John P. ClarkWestinghouse Savanna River Co.Aiken, South Carolina

PAPER : A State-Of-The Art Mass Metrology LaboratoryAUTHCR: Walter Kupper

Mettler-Toledo, Inc.Hightstown, New Jersey

PAPER : Overview of Weight CleaningAUTHCR: Mark KLine

Troemner, Inc.Philadelphia, Pennsylvania

PAPER : Mass Standards Behavior and Traceability AssuranceAUTHCR: Emil Hazarian

L.A. County Weights and Measures LaboratoryLos Angeles, California

PAPER : Traceability and Calibration, What Is The Difference?AUTHOR: Richard Calkins

Rice Lake Weighing Systems,Rice Lake, Wisconsin

1994 MEASUREMENT SCIENCE CONFERENCE

TECHNICAL PROGRAM

SESSION 6-A

TITLE: Software Applications in Metrology

DEVELOPER: Jim BoydMe Donnell Douglas Aerospace - WestHuntington Beach, California

PAPER : Calibration Automation Using Spreadsheet SoftwareAUTHOR: Jack C. Marion

Sverdrup Technology, Inc.John C. Stennis Space Center, Mississippi

PAPER : A Networked Software Approach To The Development Of AnIntegrated Metrology Operation

AUTHCR: Curt V. Casto & Harald Kochenderfer IIISouthern California EdisonWestminster, California

PAPER : ISC-9000 Calibration WorkstationAUTHCR: Warren Wong

John FlukeEverett, Washington

SESSION 6-B

TITLE: Implementation of International Accreditation

DEVELOPER: Earl HumphriesMcDonnell Douglas Areospace-WestHuntington Beach, California

PAPER : The Formal Accreditation of Automatic Measurement SystemsAUTHOR: Peter B. Crisp

Wavetek, Ltd. Datron Div.Norwich, Norfolk, U.K.

PAPER : Accreditation of a Daneish Laboratory in Field Acousticsand Vibration

AUTHCR: Torbin R. LichtDanish Primary Laboratory of AcousticsTechnical University of Denmark, Lyngby, Denmark

PAPER r Measurement Science! But at What Cost!AUTHOR: Peter Dack

Wavetek, Ltd. Datron Div.Norwich, Norfolk, U.K.

SESSION 6-C

TITLE: Measurement Potpourri

DEVELOPER: Gary OlsonMe Donnell Douglas Aerospace - WestHuntington Beach, California

PAPER : Quality Assurance in a Flow Calibration LaboratoryAUTHCR: Thomas M. Kegel

Colorado Engineering Experiment Station, Inc.Numm, Colorado

PAPER : Ultraviolet Radiometry, Pitfalls and ProgressAUTHOR: Dr. Eugene G. Arthurs

Oriel CorperationStratford, Connecticut

PAPER : Measurement Repeatability and Reproducibility EvaluationMethod of the Automotive Industry - A Critical Review

AUTHOR: Tsong-how ChangUniversity of Wisconsin - MilwaukeeMilwaukee, Wisconsin

SESSION 6-D

TITLE: Mass Metrology Symposium Part Three

DEVELOPER: William D. MooreL.A. County Weights and Measures LaboratoryLos Angeles, California

PAPER : The Mass Unit Disseminated To Surrogate LaboratoriesUsing The NIST Portable Mass Calibration Package

AUTHCR: Randall M. SchconoverNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : The Piggyback Balance Experiment: An Illustration OfArchimedes/ Principle and Newton7 s Third Law

AUTHCR: Randall M. SchconoverNational Institute of Standards and TechnologyGaithersburg, Maryland

PAPER : The Determination of Density of Mass Standards:Requirement and Method

AUTHCR: Randall M. SchconoverNational Institute of Standards and Technology' Gaithersburg, Maryland