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MR FOUCHER FREDERIC – CURRICULUM VITAE - …cbm.cnrs-orleans.fr/Documents/cv/CV_Foucher_eng.pdf · MR FOUCHER FREDERIC – CURRICULUM VITAE ... University of Poitiers, ... Observation

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Page 1: MR FOUCHER FREDERIC – CURRICULUM VITAE - …cbm.cnrs-orleans.fr/Documents/cv/CV_Foucher_eng.pdf · MR FOUCHER FREDERIC – CURRICULUM VITAE ... University of Poitiers, ... Observation

MR FOUCHER FREDERIC – CURRICULUM VITAE

INTRODUCTION

FOUCHER FrédéricBirth date : 06/02/1980Nationality : FrenchMarried, one child

Professionnal adress: Centre de Biophysique Moléculaire Rue Charles Sadron 45071 Orléans Cedex 2: 02 18 39 58 57Fax : 02 38 63 15 17@: [email protected]

PRESENT POSITION

Member of the team « Exobiology », Centre de Biophysique Moléculaire, Orléans.Team manager : Dr. Frances Westall

EDUCATION

• 2007

Material physics PhD, grade: highly commendable,Laboratoire de Métallurgie Physique (LMP), University of Poitiers,« Substrate influence on the buckling phenomenon of coated materials »Supervisors: Pr. C. Coupeau and Pr. J. Colin

• 2004 Master of Physical and Mechanical Properties of Materials, grade good, University of Poitiers.

• 2002 Licence of Physic, University of Poitiers.

Page 2: MR FOUCHER FREDERIC – CURRICULUM VITAE - …cbm.cnrs-orleans.fr/Documents/cv/CV_Foucher_eng.pdf · MR FOUCHER FREDERIC – CURRICULUM VITAE ... University of Poitiers, ... Observation

PROFESSIONAL EXPERIENCES

• Trainings and teachings

• 2008 Near probe microscopy meeting and introduction to non-contact microscopy La Londe les Maures, France.

• 2007 Communication and personal development, University of PoitiersInitiation to characterology

• 2007

Confocal-Raman microscopyWITec GmbH, Ulm, Germany.Principle of the technique and initiation to the work of a confocal-Raman microscope interfaced with an AFM.

• 2006-2007

Management of Master 1 trainees - Génie des MatériauxUniversities of Poitiers and La RochelleStudy of the mechanical behaviour of nickel oxide coating using different techniques: X ray, high precision polishing device, AFM, compression machine…

• 2006Project driving and its valorisation, University of PoitiersTools for project driving, communication, quality management.

• 2005-2007

Pratical work of material science, IUT (University Institute of Technology) Génie Mécanique et Productique, PoitiersThemes of the sessions: thermal annealing effects on mechanical properties of steel and copper/aluminium alloys, evolution of the mechanical behaviour of polymer with the temperature, brittle behaviour of ceramics and material fatigue.

• 2005

“Internal stresses: from their origin to their use in materials with electronic properties”, Nantes, France.This school led to the publication: « Contraintes mécaniques en micro, nano et optoélectronique », Mireille Mouis, Hermes Science publications, edited by Lavoisier, 2006.

• 2005 Management, University of Poitiers

• 2005

Precision polishing device.Logitech Ltd., Glasgow, Scotland, U.K.Use of the machine, sample preparation, learning of the experimental procedure and maintenance of the equipment.

• Training courses

• 2004

Laboratoire de Métallurgie Physique (LMP), University of Poitiers.«Study of thin film buckling phenomenon. »Comprehension of the basis of the buckling phenomenon and initiation to the AFM.Supervisors : Pr. C. Coupeau and Pr. J. Colin

Page 3: MR FOUCHER FREDERIC – CURRICULUM VITAE - …cbm.cnrs-orleans.fr/Documents/cv/CV_Foucher_eng.pdf · MR FOUCHER FREDERIC – CURRICULUM VITAE ... University of Poitiers, ... Observation

• Administration

• 2004-2007Treasurer of the Association of the Students in Material Science (AESM),University of Poitiers.

COLLABORATIONS

• 2006-2007

Study of microfossils included in submarine pillow lava.Collaboration between the CBM (Orléans): F. Westall and F. Foucher and the university of Bologne (Italy): B. CavalazziObservation by atomic force microscopy of these microstructures.

• 2006-2007

PPRIME projectCollaboration between the LMP (Poitiers): C. Coupeau, F. Foucher, P. Goudeau, and the LMS (Poitiers): P. DoumalinStudy of thin film buckling phenomenon: AFM measurement versus nano-deformations measurement using image treatment.

COMPETENCES

Technical competencesSurface characterisation by Scanning Probe Microscopy:

Atomic Force Microscopy (contact, tapping, LFM, force volume, liquid cell) and experience in Scanning Tunnelling MicroscopyConfocal Raman spectroscopySample deformation using nano-indentation and uni-axial testsSample preparation: cutting, polishing, surface preparationScanning Electron Microscopy (SEM)Optical microscopyExperience in thin film elaboration by physical vapour deposition (PVD) and magnetronExperience in Transmission Electron Microscopy (TEM)

Software usedCalculation and plotter: Mathematica, Origin, ExcelAFM imaging: Nanoscope, WSxMWord processing: LATEX, Word, PowerpointImage processing: Paint Shop Pro, MacBiophotonic Image J, GIMP, Photo Shop

PUBLICATIONS

6 publications published in reviews: See the detailed list. 3 proceedings 7 posters