MJE16204 NPN datasheet

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    SCANSWITCHNPN Bipolar Power Deflection TransistorFor High and Very High Resolution

    Monitors

    The MJE16204 is a stateoftheart SWITCHMODE bipolar

    power transistor. It is specifically designed for use in horizontal

    deflection circuits for 20 mm diameter neck, high and very resolution,

    full page, monochrome monitors.

    550 Volt CollectorBase Breakdown Capability

    Typical Dynamic Desaturation Specified (New TurnOff Characteristic)

    Application Specific StateoftheArt Die Design

    Isolated or NonIsolated TO220 Type Packages

    Fast Switching:65 ns Inductive Fall Time (Typ)

    680 ns Inductive Storage Time (Typ)

    Low Saturation Voltage:

    0.4 Volts at 3.0 Amps Collector Current and 400 mA Base Drive

    Low CollectorEmitter Leakage Current

    100 A Max at 550 Volts VCES

    High EmitterBase Breakdown Capability For High Voltage Off Drive

    Circuits 9.0 Volts (Min)

    Case 221D is UL Recognized at 3500 VRMS: File #E69369

    Preferred devices are ON Semiconductor recommended choices for future use and best overall value.

    ON Semiconductort

    Semiconductor Components Industries, LLC, 2001

    April, 2001 Rev. 21 Publication Order Number:

    MJE16204D

    MJE16204

    POWER TRANSISTORS

    6.0 AMPERES

    550 VOLTS VCES45 AND 80 WATTS

    CASE 221A09TO220ABMJE16204

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    MAXIMUM RATINGS

    Rating

    Symbol

    MJE16204

    Unit

    CollectorEmitter Breakdown Voltage

    VCES

    550

    Vdc

    CollectorEmitter Sustaining Voltage

    VCEO(sus)

    250

    Vdc

    EmitterBase Voltage

    VEBO

    8.0

    Vdc

    RMS Isolation Voltage(2) Per Fig. 14

    (for 1 sec, TA = 25_C, Per Fig. 15

    Rel. Humidity < 30%) Per Fig. 16

    VISOL

    V

    Collector Current Continuous

    Pulsed (1)

    ICICM

    6.0

    8.0

    Adc

    Base Current Continuous

    Pulsed (1)

    IBIBM

    2.0

    4.0

    Adc

    Repetitive EmitterBase Avalanche Energy

    W(BER)

    0.2

    mJ

    Total Power Dissipation @ TC = 25_C

    Total Power Dissipation @ TC = 100_C

    Derated above TC = 25_C

    PD

    80

    32

    0.64

    Watts

    W/_C

    Operating and Storage Temperature Range

    TJ, Tstg

    55 to 150

    _C

    THERMAL CHARACTERISTICS

    Characteristic

    Symbol

    Max

    Unit

    Thermal Resistance Junction to Case

    RJC

    1.56

    _C/W

    Lead Temperature for Soldering Purposes

    1/8 from the case for 5 seconds

    TL

    260

    _C

    (1) Pulse Test: Pulse Width = 5.0 ms, Duty Cyclev 10%.

    (2) Proper strike and creepage distance must be provided.

    *Measurement made with thermocouple contacting the bottom insulated mounting surface of the

    package (in a location beneath the die), the device mounted on a heatsink thermal grease applied,

    and a mounting torque of 6 to 8 inSlbs.

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    ELECTRICAL CHARACTERISTICS (TC= 25_C unless otherwise noted)

    Characteristic

    Symbol

    Min

    Typ

    Max

    Unit

    OFF CHARACTERISTICS (3)

    Collector Cutoff Current

    (VCE = 550 Vdc, VBE = 0 V)

    ICES

    100

    Adc

    EmitterBase Leakage

    (VEB = 8.0 Vdc, IC = 0)

    IEBO

    10

    Adc

    EmitterBase Breakdown Voltage

    (IE = 1.0 mA, IC = 0)

    V(BR)EBO

    8.0

    11

    Vdc

    CollectorEmitter Sustaining Voltage (Table 1)

    (IC = 10 mAdc, IB = 0)

    VCEO(sus)

    250

    325

    Vdc

    ON CHARACTERISTICS (3)

    CollectorEmitter Saturation Voltage

    (IC = 1.0 Adc, IB = 133 mAdc)

    (IC = 3.0 Adc, IB = 400 mAdc)

    VCE(sat)

    0.25

    0.4

    0.6

    1.0

    Vdc

    BaseEmitter Saturation Voltage

    (IC = 3.0 Adc, IB = 400 mAdc)

    VBE(sat)

    0.9

    1.5

    Vdc

    DC Current Gain

    (ICE = 6.0 Adc, VCE = 5.0 Vdc)

    hFE

    8.0

    14

    20

    DYNAMIC CHARACTERISTICS

    Dynamic Desaturation Interval (IC = 3.0 A, IB1 = 400 mA)

    tds

    50

    ns

    Output Capacitance

    (VCE = 10 Vdc, IE = 0, ftest = 100 kHz)

    Cob

    90

    150

    pF

    Gain Bandwidth Product

    (VCE = 10 Vdc, IC = 1.0 A, ftest = 1.0 MHz)

    fT

    10

    MHz

    EmitterBase TurnOff Energy

    (EB(avalanche) = 500 ns, RBE = 22 )

    EB(off)

    6.6

    J

    CollectorHeatsink Capacitance

    (Mounted on a 1x 2x 1/16Copper Heatsink, VCE = 0, ftest = 100

    kHz)

    Cchs

    3.0

    pF

    SWITCHING CHARACTERISTICS

    Inductive Load (Table 2) (IC = 3.0 A, IB = 400 mA)

    Storage

    Fall Time

    tsvtfi

    680

    65

    1500

    150

    ns

    (3) Pulse Test: Pulse Width = 300 s, Duty Cyclev 2.0%.

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    VCE,

    COLLECTO

    R-

    EMITTERVOLTAGE(VOLTS)

    Figure 1. Typical DC Current Gain

    IC, COLLECTOR CURRENT (AMPS)

    0.5 2 10

    20

    hFE,

    DCCURRENTGAIN

    1 53

    30

    7

    0.7

    TJ = 100C

    25C

    -55C

    7

    10

    5

    3

    50

    VCE = 5 V

    IC, COLLECTOR CURRENT (AMPS)

    Figure 2. Typical CollectorEmitter

    Saturation Voltage

    0.5

    3

    0.2

    5

    10

    1

    0.1

    7

    0.3

    2

    0.7

    0.5 32 50.7 10.1 0.2

    TJ = 25C

    TJ = 100C

    IC/IB1 = 10

    0.3 7

    60

    5

    7.5

    0.2

    C,C

    APACITANCE(pF)

    VBE,

    BASE-

    EMITTERVOLTAGE(VO

    LTS)

    VCE,

    COLLECTOR-

    EMITTERVOLTAGE

    (VOLTS)

    Figure 3. Typical CollectorEmitterSaturation Region

    IB, BASE CURRENT (AMPS)

    0.7

    0.1

    0.03 0.3

    0.3

    6 A

    0.05 1 2

    2 A 3 AIC = 1 A

    0.030.07 0.1 0.70.2 0.5

    30

    5

    10

    Figure 4. Typical BaseEmitterSaturation Voltage

    0.3 300.5

    5

    0.7

    0.10.7 201 10

    10

    2

    TJ = 25C

    2 3 5 7

    IC, COLLECTOR CURRENT (AMPS)

    TJ = 25C

    TJ = 100C

    0.3

    Figure 5. Typical Capacitance

    10K

    VR, REVERSE VOLTAGE (VOLTS)

    Cib

    0.1

    1K

    100

    101 10 100 1K

    2K

    200

    20

    3K

    300

    5K

    500

    50

    0.3 2 30 300200.5 5 50 500

    fT,

    TRANS

    ITIONFREQUENCY(MHz)

    IC, COLLECTOR CURRENT (AMPS)

    Figure 6. Typical Transition Frequency

    VCE = 10 V

    ftest = 1 MHz

    TC = 25C

    0 0.5 1 1.5 2 32.5

    20

    8

    2

    14

    0

    6

    16

    12

    0.5

    0.07

    0.2

    0.05

    20

    3

    7

    2

    1

    3

    IC/IB1 = 5 to 107

    1

    3

    0.5

    30

    0.2 3 200

    TC = 25C

    10

    4

    18

    Cob

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    IC,

    COLLECTORC

    URRENT(AMPS)

    VCE, COLLECTOR-EMITTER VOLTAGE (VOLTS)

    Figure 7. Maximum Forward Biased

    Safe Operating Area

    7

    3

    10

    1

    0.02

    70

    SECONDARY BREAK

    DOWN

    WIREBOND LIMIT

    THERMAL LIMITIC,

    COLLECTORC

    URRENT(AMPS)

    0.1

    7 20 250

    3

    0.30.2

    d

    c

    TC = 25C

    1ms

    10 s

    2

    5

    0.5

    50

    7

    0150 550

    IC/IB1 5

    TJ

    100C

    VBE(off) = 5 V

    50

    VCE(pk), PEAK COLLECTOR-EMITTER VOLTAGE (VOLTS)

    350

    VBE(off) = 0 V

    Figure 8. Maximum Reverse Biased

    Safe Operating Area

    3

    5

    2

    1

    250 450

    0.03

    0.070.05

    0.01

    0.7

    1005 10 20030

    MJE16204 6

    4

    SAFE OPERATING AREA

    SAFE OPERATING AREA INFORMATION

    FORWARD BIAS

    There are two limitations on the power handling ability of

    a transistor: average junction temperature and second

    breakdown. Safe operating area curves indicate IC VCElimits of the transistor that must be observed for reliable

    operation; i.e., the transistor must not be subjected to greater

    dissipation than the curves indicate.

    The data of Figure 7 is based on TC = 25_C; TJ(pk) is

    variable depending on power level. Second breakdown

    pulse limits are valid for duty cycles to 10% but must bederated when TC 25_C. Second breakdown limitations do

    not derate the same as thermal limitations. Allowable

    current at the voltages shown on Figure 7 may be found at

    any case temperature by using the appropriate curve on

    Figure 9.

    At high case temperatures, thermal limitations will reduce

    the power that can be handled to values less than the

    limitations imposed by second breakdown.

    REVERSE BIAS

    For inductive loads, high voltage and high current must be

    sustained simultaneously during turnoff, in most cases,with the basetoemitter junction reverse biased. Under

    these conditions the collector voltage must be held to a safe

    level at or below a specific value of collector current. This

    can be accomplished by several means such as active

    clamping, RCsnubbing, load line shaping, etc.

    TC, CASE TEMPERATURE (C)

    040 120 160

    0.6

    POWERDERATINGFACTOR

    SECOND BREAK

    DOWN DERATING

    1

    0.8

    0.4

    0.2

    60 100 14080

    THERMAL

    DERATING

    2

    0

    Figure 9. Power Derating

    The safe level for these devices is specified as Reverse

    Biased Safe Operating Area and represents the

    voltagecurrent condition allowable during reverse biased

    turnoff. This rating is verified under clamped conditions so

    that the device is never subjected to an avalanche mode.

    Figure 8 gives the RBSOA characteristics.

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    H.P. 214

    OR EQUIV.

    P.G.

    0

    -35 V

    5

    0

    50

    0 10

    0 -V

    2N533

    71 F

    + -

    +

    -

    0.02 F

    20

    10

    0

    +V 11 V

    2N619

    1

    A

    RB1

    RB2

    10 F

    0.02 F

    T1 +V

    0 V

    -V

    A

    50

    *IB

    *IC

    T.U.T

    .

    L

    MR856

    Vclamp VCC

    IC

    VCE

    IB

    IB1

    IB2

    IC(pk)

    VCE(pk)

    T1 [Lcoil (ICpk)

    VCC

    T1 adjusted to obtain IC(pk)

    V(BR)CEOL = 10 mH

    RB2 =

    VCC = 20 Volts

    RBSOA

    L = 200 H

    RB2 = 0

    VCC = 20 Volts

    RB1 selected for desired IB1

    Note: Adjust V to obtain desired VBE(off) at Point A.

    *Tektronix

    *P6042 or

    *Equivalent

    Table 1. RBSOA/V(BR)CEO(sus) Test Circuit

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    +24 V

    C1100 F

    +

    U2

    MC7812

    VI VOG

    N

    D

    C2

    10 F

    + Q2MJ11016

    (IB

    )

    R1

    1 k

    6.2

    V

    100 V

    C3

    10 F

    +R7

    2.7

    k

    R8

    9.1

    k

    R9

    470 R10

    47

    C5

    0.1

    C4

    0.005

    (DC)

    R2

    R510

    R3

    250

    SYN

    CQ

    1

    BS17

    0

    R6

    1 k 2

    18

    7 6

    G

    N

    D

    O

    S

    C

    VCC

    % OU

    T

    R10

    4701 W

    Q3

    MJE

    15031

    R12

    470

    1 W

    D1

    MUR11

    0

    T

    1

    R4

    22

    L

    B

    D2

    MUR460

    CY

    VCE

    Q4

    DUT

    LY

    C6

    100 F

    R51 k

    (IC) Q5

    MJ11016

    +

    T1: Ferroxcube Pot Core #1811 P3C8

    Primary/Sec. Turns Ratio = 18:6

    Primary Inductance Gap:

    LP = 250 H

    LB = 0.5 H

    CY = 0.01 F

    LY = 13 H

    U1

    MC1391P

    Table 2. High Resolution Deflection Application Simulator

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    IC, COLLECTOR CURRENT (AMPS)

    Figure 10. Typical Collector Current Storage

    Time in Deflection Circuit Simulator

    ts,

    STORAGETIME(ns)

    2K

    700

    200

    300

    ICI/B1 = 7.5

    500

    1K

    1 2 753

    10

    IC, COLLECTOR CURRENT (AMPS)

    Figure 11. Typical Collector Current Fall Time

    in Deflection Circuit Simulator

    tf,FALLTIME(ns) 100

    20

    50

    200

    2 3 5 71 10

    30

    70

    TC = 25C

    ICI/B1 = 7.5

    10

    TC = 25C

    Figure 12. Deflection Simulator Switching

    Waveforms From Circuit in Table 2

    IC

    0% IB

    VCE

    tsv

    VCE = 20 V

    tfi

    10% IC(pk)

    Figure 13. Definition of Dynamic

    Saturation Measurement

    TIME (ns)

    VCE

    DYNAMIC SATURATION TIME

    IS MEASURED FROM VCE = 1 V

    TO VCE = 5 V

    tds

    1

    4

    COLLECTOR-

    EMITTERVOLTAGE(VOLTS)

    5

    0

    3

    2

    0

    0

    90% IC(pk)

    DYNAMIC DESATURATIION

    The SCANSWITCH series of bipolar power transistors

    are specifically designed to meet the unique requirements of

    horizontal deflection circuits in computer monitor

    applications. Historically, deflection transistor design was

    focused on minimizing collector current fall time. While fall

    time is a valid figure of merit, a more important indicator of

    circuit performance as scan rates are increased is a newcharacteristic, dynamic desaturation. In order to assure a

    linear collector current ramp, the output transistor must

    remain in hard saturation during storage time and exhibit a

    rapid turnoff transition. A sluggish transition results in

    serious consequences. As the saturation voltage of the

    output transistor increases, the voltage across the yoke

    drops. Roll off in the collector current ramp results in

    improper beam deflection and distortion of the image at the

    right edge of the screen. Design changes have been made in

    the structure of the SCANSWITCH series of devices which

    minimize the dynamic desaturation interval. Dynamic

    desaturation has been defined in terms of the time required

    for the VCE to rise from 1.0 to 5.0 volts (Figures 12 and 13)

    and typical performance at optimized drive conditions hasbeen specified. Optimization of device structure results in a

    linear collector current ramp, excellent turnoff switching

    performance, and significantly lower overall power

    dissipation.

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    t, TIME (ms)

    0.010.01 0.05 1 2 5 10 20 50 5000.1 0.50.2

    1

    0.2

    0.1

    0.05r(t),T

    RANSIENTTHERMAL

    RJC(t) = r(t) RJCRJC = 1.56C/W MAX

    D CURVES APPLY FOR POWERPULSE TRAIN SHOWN

    READ TIME AT t1TJ(pk) - TC = P(pk)RJC(t)

    P(pk)

    t1t2

    DUTY CYCLE, D = t1/t2SINGLE PULSE

    RESISTANCE(NORMALIZED)

    Figure 14. Typical Thermal Response for MJE16204

    0.5D = 0.5

    0.7

    0.07

    0.02

    0.02 100 200 10 k

    0.2

    0.05

    0.1

    0.02

    0.01

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    PACKAGE DIMENSIONS

    CASE 221A09ISSUE AA

    TO220AB

    NOTES:1. DIMENSIONING AND TOLERANCING PER ANSI

    Y14.5M, 1982.2. CONTROLLING DIMENSION: INCH.3. DIMENSION Z DEFINES A ZONE WHERE ALL

    BODY AND LEAD IRREGULARITIES ARE

    ALLOWED.

    DIM MIN MAX MIN MAX

    MILLIMETERSINCHES

    A 0.570 0.620 14.48 15.75

    B 0.380 0.405 9.66 10.28

    C 0.160 0.190 4.07 4.82

    D 0.025 0.035 0.64 0.88

    F 0.142 0.147 3.61 3.73

    G 0.095 0.105 2.42 2.66

    H 0.110 0.155 2.80 3.93

    J 0.018 0.025 0.46 0.64

    K 0.500 0.562 12.70 14.27

    L 0.045 0.060 1.15 1.52

    N 0.190 0.210 4.83 5.33

    Q 0.100 0.120 2.54 3.04

    R 0.080 0.110 2.04 2.79

    S 0.045 0.055 1.15 1.39

    T 0.235 0.255 5.97 6.47

    U 0.000 0.050 0.00 1.27

    V 0.045 --- 1.15 ---

    Z --- 0.080 --- 2.04

    B

    Q

    H

    Z

    L

    V

    G

    N

    A

    K

    F

    1 2 3

    4

    D

    SEATINGPLANET

    C

    ST

    U

    R

    J

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    Notes

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    without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particularpurpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability,including without limitation special, consequential or incidental damages. Typical parameters which may be provided in SCILLC data sheets and/orspecifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including Typicals must bevalidated for each customer application by customers technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applicationsintended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury ordeath may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and holdSCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonableattorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claimalleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.

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    MJE16204D

    SCANSWITCH is a trademark of Semiconductor Components Industries, LLC.

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