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May 8, 2001 2
USB High Speed Compliance
Program Overview
USB High Speed Compliance
Program OverviewDan FroelichDan Froelich
Intel CorporationIntel Corporation
May 8, 2001 3
AgendaAgenda
USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests
– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates
HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary
May 8, 2001 4
HistoryHistory
USB-IF Full/Low Speed Compliance ProgramUSB-IF Full/Low Speed Compliance Program– Long evolution from 1996 (USB 1.0) to today (2001)Long evolution from 1996 (USB 1.0) to today (2001)
S3
Inrush
Signal Quality, S1
USBCheck, Hidview, Interoperability
Chap 11, OHCI, Current
Chap 9, UHCI, Drop/Droop
S3
Inrush
Signal Quality, S1
USBCheck, Hidview, Interoperability
Chap 11, OHCI, Current
Chap 9, UHCI, Drop/Droop
‘96‘96
YearYear
T e s ting
T e s ting
Level
Level
‘97‘97 ‘98‘98 ‘99‘99 ‘00‘00 ‘01‘01
May 8, 2001 5
Compliance Program EvolutionCompliance Program Evolution
The USB HS Compliance Program is an extension The USB HS Compliance Program is an extension of the USB FS/LS Compliance Programof the USB FS/LS Compliance Program– Years of experienceYears of experience– Tools already in placeTools already in place– Full Speed Tests Apply to Full Speed Tests Apply to – High Speed DevicesHigh Speed Devices
USB HS Compliance ProgramUSB HS Compliance ProgramWill Start at a High Level!Will Start at a High Level!
USB HS Compliance ProgramUSB HS Compliance ProgramWill Start at a High Level!Will Start at a High Level!
TodayToday TomorrowTomorrow
HSHS
FS/LSFS/LS
May 8, 2001 6
Goals of theCompliance ProgramGoals of theCompliance Program
High Quality USB 2.0 ProductsHigh Quality USB 2.0 Products Stable, Repeatable, Well Documented TestsStable, Repeatable, Well Documented Tests
– Documented Test ProceduresDocumented Test Procedures– Documented Test Assertions and DescriptionsDocumented Test Assertions and Descriptions
Instantly Available Testing (Qualified Test Houses)Instantly Available Testing (Qualified Test Houses) Leverage USB 1.1 Compliance ProgramLeverage USB 1.1 Compliance Program
– Reuse USB CheckReuse USB Check– Reuse Interoperability Test ProceduresReuse Interoperability Test Procedures– Reuse Full and Low Speed Electrical TestingReuse Full and Low Speed Electrical Testing
Minimize Test Equipment CostsMinimize Test Equipment Costs
May 8, 2001 7
AgendaAgenda
USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests
– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates
HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary
May 8, 2001 8
Full and Low Speed TestingFull and Low Speed Testing
Current ConsumptionCurrent Consumption USBCheckUSBCheck
– Chapter 9Chapter 9– Chapter 11Chapter 11– HidViewHidView
InteroperabilityInteroperability– HS Device and Hub HS Device and Hub
AdditionsAdditions– Power ManagementPower Management
USB FS/LS Test FixturesUSB FS/LS Test Fixtures– Droop/DropDroop/Drop– InrushInrush– FS/LS Signal QualityFS/LS Signal Quality– Backdrive voltageBackdrive voltage
May 8, 2001 9
Current ConsumptionCurrent Consumption
UnconfiguredUnconfigured– 100 ma max100 ma max
ConfiguredConfigured– 100 ma Max (Low Power)100 ma Max (Low Power)– 500 ma Max (High Power)500 ma Max (High Power)– < bMaxPower value< bMaxPower value
Active/Operating (Same as Configured)Active/Operating (Same as Configured) SuspendSuspend
– 500 ua max 500 ua max – 2.5 ma max for high power devices with remote wakeup enabled2.5 ma max for high power devices with remote wakeup enabled
May 8, 2001 10
USBCheck –Chapter 9 AdditionsUSBCheck –Chapter 9 Additions
Other Speed Device Qualifier andOther Speed Device Qualifier andConfiguration DescriptorsConfiguration Descriptors– HS/FS Devices Must Use In Either EnvironmentHS/FS Devices Must Use In Either Environment– Standard Configuration Descriptors OnlyStandard Configuration Descriptors Only
For Current EnvironmentFor Current Environment
Endpoint Packet Size and Interval RulesEndpoint Packet Size and Interval Rules HS Devices Tested At High and Full SpeedsHS Devices Tested At High and Full Speeds bcdUSB = 0200H for ANY device designed to 2.0 SpecbcdUSB = 0200H for ANY device designed to 2.0 Spec
HS Capable Devices Must FunctionHS Capable Devices Must Functionin FS Environmentsin FS Environments
May 8, 2001 11
Compliance Tool USBCheckCompliance Tool USBCheck
USB Check 5.0 Beta 3 ReleasedUSB Check 5.0 Beta 3 Released
May 8, 2001 12
Interoperability TestingInteroperability Testing
Same Tree For HS/FS/LS TestingSame Tree For HS/FS/LS Testing Similar To FS/LS InteropabilitySimilar To FS/LS Interopability
– All Transfer TypesAll Transfer Types– 5 hubs deep with 5 meter cables5 hubs deep with 5 meter cables
(i.e. Tier 6)(i.e. Tier 6)– Mix of speedsMix of speeds– Power Management (S3)Power Management (S3)
Test devices at both FullTest devices at both Fulland High Speedsand High Speeds
Current Test Procedures OnlineCurrent Test Procedures Online
RootRoot
HS HubHS Hub
DUTDUT
HS HubHS Hub
HS HubHS Hub
Other Devices
Other Devices
FS HubFS Hub HS HubHS Hub
HS HubHS Hub
May 8, 2001 13
Full and Low Speed Electrical TestsFull and Low Speed Electrical Tests
CurrentCurrent
InrushInrush DropDrop Backdrive VoltageBackdrive Voltage
DroopDroop
Full/Low Speed Full/Low Speed Signal QualitySignal Quality
USB Check 5.0 Beta 3 ReleasedUSB Check 5.0 Beta 3 Released
May 8, 2001 14
AgendaAgenda
USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests
– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite– USBCheck UpdatesUSBCheck Updates
HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary
May 8, 2001 15
Test SuiteDevelopment Process Test SuiteDevelopment Process
UniversalUniversalSerial BusSerial Bus
SpecificationSpecification
Revision 2.0Revision 2.0
April 27, 2000April 27, 2000
UniversalUniversalSerial BusSerial Bus
SpecificationSpecification
Revision 2.0Revision 2.0
April 27, 2000April 27, 2000
Transaction TranslatorTransaction TranslatorAnd Hub And Hub
Compliance TestCompliance TestSpecificationSpecification
Revision .91Revision .91
March 15, 2001March 15, 2001
Transaction TranslatorTransaction TranslatorAnd Hub And Hub
Compliance TestCompliance TestSpecificationSpecification
Revision .91Revision .91
March 15, 2001March 15, 2001
Test AssertionsTest Assertions
TestTest
SuiteSuite
Test Results Refer To AssertionsTest Results Refer To Assertions
May 8, 2001 16
Test Specification FormatTest Specification Format
Test AssertionsTest Assertions
Test DescriptionsTest Descriptions– Occupy All Non-Periodic Buffers *Occupy All Non-Periodic Buffers *– Issue Clear TT For One BufferIssue Clear TT For One Buffer– Attempt Transaction For Cleared EndpointAttempt Transaction For Cleared Endpoint
HS Electrical Test Spec version 1.0 and TT/Hub Test HS Electrical Test Spec version 1.0 and TT/Hub Test Specification Rev .91 Posted In Members SiteSpecification Rev .91 Posted In Members Site
1.6.71.6.7 A Transaction Translator must clear an asynchronous (non-periodic) A Transaction Translator must clear an asynchronous (non-periodic) buffer associated with the given endpoint in response to a valid Clear TT buffer associated with the given endpoint in response to a valid Clear TT Buffer request.Buffer request.Specification Ref: Specification Ref: Universal Serial Bus Specification, Revision 2.0. Universal Serial Bus Specification, Revision 2.0. Section 11.24.2.11.Section 11.24.2.11.Test Description: Test Description: TD.1.11TD.1.11
RequirementRequirement
SourceSource
Test Covering ReqTest Covering Req
May 8, 2001 17
Test ProceduresTest Procedures
Full and Low Speed Compliance Test ProcedureFull and Low Speed Compliance Test Procedure– Covers FS/LS Hub, Device, and Host/System TestingCovers FS/LS Hub, Device, and Host/System Testing
Drop/Droop, InRush, Signal Quality, Current ConsumptionDrop/Droop, InRush, Signal Quality, Current Consumption USBCheck, InteroperabilityUSBCheck, Interoperability
– 1.0 RC2 Release on 1.0 RC2 Release on www.USB.orgwww.USB.org– USBCheck HS Changes To Be AddedUSBCheck HS Changes To Be Added
High Speed Electrical Compliance ProcedureHigh Speed Electrical Compliance Procedure– Very Thorough CoverageVery Thorough Coverage– Initial Post for Member Review in JuneInitial Post for Member Review in June
May 8, 2001 18
AgendaAgenda
USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests
– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite
HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary
May 8, 2001 19
New Testing AreasNew Testing Areas
HS ElectricalsHS Electricals– High Speed Signal QualityHigh Speed Signal Quality– Time Domain Reflectometry Time Domain Reflectometry
(TDR)(TDR)– Receiver Sensitivity and Receiver Sensitivity and
SquelchSquelch– J and K Voltage LevelsJ and K Voltage Levels– ChIRPChIRP– Packet ParametersPacket Parameters– Suspend/ResumeSuspend/Resume
Transaction TranslatorTransaction Translator– Full Functional TestFull Functional Test– Protocol Response CasesProtocol Response Cases– Implementation RulesImplementation Rules
HS Hub RepeaterHS Hub Repeater– Sync BitsSync Bits– LatencyLatency– EOP DribbleEOP Dribble
May 8, 2001 20USB HS Test FixtureUSB HS Test Fixture
HS RelayHS RelayHS RelayHS RelayTest PortTest Port
InitializationInitializationPortPort
Diff ProbeDiff ProbeDataDataGeneratorGenerator
90 Ohms90 Ohms
PowerPowerSelectionSelection
CktCkt
PowerPowerSelectionSelection
CktCkt
Vbus1Vbus1 Vbus2Vbus2VccVcc
GndGnd
New Test Fixture(s)New Test Fixture(s)
High Speed Isolation RelayHigh Speed Isolation Relay Ideal TerminationsIdeal Terminations Selectable VBUS SourceSelectable VBUS Source USB-IF Will ProvideUSB-IF Will Provide
May 8, 2001 21
General HS ElectricalTest ProcedureGeneral HS ElectricalTest Procedure
Connect Device Under Test To Test Port on FixtureConnect Device Under Test To Test Port on Fixture Configure DUT With Test Mode SWConfigure DUT With Test Mode SW Isolate DUT from Host with High Speed RelayIsolate DUT from Host with High Speed Relay Make Appropriate Electrical MeasurementsMake Appropriate Electrical Measurements
May 8, 2001 22
Electrical Example – HS Receiver SensitivityElectrical Example – HS Receiver Sensitivity
DUT Placed In DUT Placed In Test_SEO_NAK ModeTest_SEO_NAK Mode
Data Generator Data Generator Generates IN PacketsGenerates IN Packets
Device Must Respond Device Must Respond For In Spec PacketsFor In Spec Packets
Device Must Not Device Must Not Respond to Out of Respond to Out of Spec Data Generator Spec Data Generator OutputOutput
Data GeneratorData GeneratorTest Mode
SW
USB 2.0 Test FixtureUSB 2.0 Test Fixture
HS RelayHS RelayHS RelayHS Relay
Device UnderDevice Under TestTest
SMASMA
May 8, 2001 23
Electrical Example – High Speed Repeater TestingElectrical Example – High Speed Repeater Testing
Put Hub Port in Put Hub Port in Test_Force_EnableTest_Force_Enable
Test SW Generates Test SW Generates Downstream Traffic Downstream Traffic
Capture Pre/Post Hub Capture Pre/Post Hub SignalsSignals
Analyze Data Analyze Data – Sync Truncation Sync Truncation – EOP DribbleEOP Dribble– LatencyLatency
Test Mode SW
OscilloscopeOscilloscope
Hub Under Hub Under TestTest
Breakout BoardBreakout Board Breakout BoardBreakout Board
HS Electrical Test Specification Rev 1.0 ReleasedHS Electrical Test Specification Rev 1.0 Released
May 8, 2001 24
AgendaAgenda
USB-IF Compliance Testing HistoryUSB-IF Compliance Testing History USB High Speed Compliance Program GoalsUSB High Speed Compliance Program Goals FS and LS Testing Summary and AdditionsFS and LS Testing Summary and Additions New Test Development ProcessNew Test Development Process New Compliance TestsNew Compliance Tests
– High Speed ElectricalsHigh Speed Electricals– Transaction Translator Test SuiteTransaction Translator Test Suite
HS Compliance Program MilestonesHS Compliance Program Milestones SummarySummary
May 8, 2001 25
Transaction TranslatorTransaction Translator
Sophisticated Sophisticated Functional UnitFunctional Unit
Bulk/Control Bulk/Control Transaction BuffersTransaction Buffers
Periodic PipelinePeriodic Pipeline New ProtocolsNew Protocols
TT/Hub Test Specification Rev .91 ReleasedTT/Hub Test Specification Rev .91 Released
HSHS DeviceDevice
LS LS DeviceDevice
Port 1Port 1
480 MHz480 MHz12 MHz12 MHz1.5 MHz1.5 MHz
Port 2Port 2 Port NPort N
FS FS DeviceDevice
HubHub Hub State Hub State RepeaterRepeater Machines Machines HubHub Hub State Hub State RepeaterRepeater Machines Machines
Hub Hub ControllerController
Hub Hub ControllerController
High Speed ConnectionHigh Speed Connection
TransactionTransaction TranslatorTranslator
TransactionTransaction TranslatorTranslator
Port Routing Logic
May 8, 2001 26
Test Suite ArchitectureTest Suite Architecture
Test ExecutiveTest ExecutiveTest ExecutiveTest Executive
Hub and TT Test DLLHub and TT Test DLLHub and TT Test DLLHub and TT Test DLL
Test ServicesTest ServicesTest ServicesTest Services
Intel Test StackIntel Test StackIntel Test StackIntel Test Stack MS USBDI InterfaceMS USBDI InterfaceMS USBDI InterfaceMS USBDI Interface
FS Test DeviceFS Test DeviceFS Test DeviceFS Test Device LS Test DeviceLS Test Device
May 8, 2001 27
Test Devices - OverViewTest Devices - OverView
Basic FunctionalityBasic Functionality– Full Speed Full Speed – Low SpeedLow Speed– All Transfer TypesAll Transfer Types– Multiple EndpointsMultiple Endpoints
Protocol Level ControlProtocol Level Control– Produce All Possible Device ResponsesProduce All Possible Device Responses– Allows Testing of Corner CasesAllows Testing of Corner Cases
Defined Device Interface (Test Device Class)Defined Device Interface (Test Device Class)– Allows Any Capable PDK/Device to Be UsedAllows Any Capable PDK/Device to Be Used– Vendor Command BasedVendor Command Based– Allows Dynamic Device ReconfigurationAllows Dynamic Device Reconfiguration
May 8, 2001 28
Test Services - ArchitectureTest Services - Architecture
Test ServicesTest Services
HostHostControllerController
PortPort
HostHostPortPort
Hub PortHub PortEndPoint
Test DeviceEndPoint
Stack InterfaceStack Interface
MS USBDIMS USBDIInterfaceInterface
Intel EHCI TestIntel EHCI TestStackStack
DeviceDeviceNodeNode
DeviceDeviceNode ListNode List
Minimal I/OMinimal I/OInterfaceInterface
ReadRead
WriteWrite
Select Host ControllerSelect Host Controller
EnumerateEnumerate
Do Control RequestDo Control Request
Set/Clear Port FeatureSet/Clear Port Feature
HubHubDeviceDevice
TestTestDeviceDevice
DeviceDevice
May 8, 2001 29
Test ExecutiveTest Executive
Standard GUIStandard GUI LoggingLogging
– Assertion Pass/FailAssertion Pass/Fail– Time/Date/Version StampsTime/Date/Version Stamps
Multi-Threading SupportMulti-Threading Support– Multiple Transfer StreamsMultiple Transfer Streams– Simpler TestsSimpler Tests
Robust - Well Tested EngineRobust - Well Tested Engine Tests are Simple DLL FunctionsTests are Simple DLL Functions
Several Third Party Test Several Third Party Test Executives Under Executives Under
EvaluationEvaluation
USBCheck Rewrite With Same Model PlannedUSBCheck Rewrite With Same Model Planned
May 8, 2001 30Note: all dates provided are for planning purposes only and are subject to changeNote: all dates provided are for planning purposes only and are subject to change
Compliance Program MilestonesCompliance Program Milestones
HS Logo Testing HS Logo Testing – Device Testing PreviewDevice Testing Preview October 2000October 2000– First Host Controller CertifiedFirst Host Controller Certified November 2000November 2000– First Device CertifiedFirst Device Certified December 2000December 2000– Full Device Testing Available At Compliance WorkshopsFull Device Testing Available At Compliance Workshops January 2001January 2001– Full Hub Testing Available at Intel Test LabFull Hub Testing Available at Intel Test Lab March 2001March 2001
Test Specifications Test Specifications – HS Electrical v. 1.0 Released To USB-IF MembersHS Electrical v. 1.0 Released To USB-IF Members March 2001March 2001– TT/Hub v .91 Released to USB-IF MembersTT/Hub v .91 Released to USB-IF Members March 2001March 2001– TT/Hub v 1.0 ReleaseTT/Hub v 1.0 Release June 2001June 2001
HS Electrical Test SuiteHS Electrical Test Suite– USB-IF Test Procedure ReleaseUSB-IF Test Procedure Release June 2001June 2001– USB-IF High Speed Test Fixture ReleaseUSB-IF High Speed Test Fixture Release October 2001October 2001– USB-IF Test Mode SW ReleaseUSB-IF Test Mode SW Release October 2001October 2001
May 8, 2001 31
Note: all dates provided are for planning purposes only and are subject to changeNote: all dates provided are for planning purposes only and are subject to change* Other brands and names may be claimed as the property of others.* Other brands and names may be claimed as the property of others.
Compliance Program MilestonesCompliance Program Milestones
TT/Hub Test SuiteTT/Hub Test Suite– Full/Low Seed Test Device SpecificationFull/Low Seed Test Device Specification June 2001June 2001 – Full Speed Compliance Test DeviceFull Speed Compliance Test Device October 2001October 2001– Low Speed Compliance Test DeviceLow Speed Compliance Test Device October 2001October 2001– USB-IF Automated Test Suite ReleaseUSB-IF Automated Test Suite Release October 2001October 2001
USBCheckUSBCheck– USB-IF 5.0 Beta 3 Windows 2000* Release - HS SupportUSB-IF 5.0 Beta 3 Windows 2000* Release - HS Support March 2001March 2001– USB-IF 5.0 Release for Windows XPUSB-IF 5.0 Release for Windows XP July 2001July 2001– USB-IF USBCheck Rewrite – Initial ReleaseUSB-IF USBCheck Rewrite – Initial Release October 2001October 2001
Test House CertificationTest House Certification– Formal HS Training BeginsFormal HS Training Begins June/July 2001June/July 2001– HS Certified Test HouseHS Certified Test House October 2001October 2001
May 8, 2001 32
SummarySummary
Thorough Electrical Tests Thorough Electrical Tests – High Speed ElectricalHigh Speed Electrical– High Speed Hub RepeaterHigh Speed Hub Repeater
Thorough Functional Test of Transaction TranslatorThorough Functional Test of Transaction Translator– Test SuiteTest Suite– Test DevicesTest Devices
Well Documented TestsWell Documented Tests– Test ProceduresTest Procedures– Test SpecificationsTest Specifications
Great Steps Being Taken To Ensure USB 2.0 SuccessGreat Steps Being Taken To Ensure USB 2.0 Success
May 8, 2001 33
Questions?Questions?