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Univ. of Patras. Modulated photocurrent as a powerful method to reveal transport by the majority carriers of disordered semiconductors and to resolve all the kinds of probed states. Maura Pomoni, Athina Giannopoulou and Panagiotis Kounavis. - PowerPoint PPT Presentation
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Modulated photocurrent as a powerful method to Modulated photocurrent as a powerful method to reveal transport by the majority carriers of reveal transport by the majority carriers of disordered semiconductors and to resolve disordered semiconductors and to resolve
all the kinds of probed statesall the kinds of probed states
MauraMaura Pomoni, Pomoni, AthinaAthina Giannopoulou Giannopoulou
and and PanagiotisPanagiotis Kounavis Kounavis
Department of Engineering Sciences, University of Department of Engineering Sciences, University of Patras, Patras,
26504 Patra, Greece26504 Patra, Greece
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Univ. of Patras
Possible contribution from both carriers complicates interpretation of photoconductivity measurements
This limitation is overcome in the modulated photocurrent (MPC)
Specific features in the MPC spectra can be used to reveal whether the transport of the majority carriers dominates
In this case, a DOS spectroscopy based on a general formula can be used to evaluate the DOS parameters of the various species of states with which the majority carriers interact
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Univ. of Patras
)(sin
ENeGYac
ac
The essential parameter of the MPC is the
out of phase Y signal
Phase shift
Modulated
photoconductivity
Modulated light Generation rate
Mobility of the majority carriers
Out of phase MPC Y signal
Experimental setup
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
LEDModulated+ bias light
Lock-In
Osciloscope
Amplifier
Vdc
a-Si:Helectrodes
Phase shift
Φ amplitude ofMPC
Φ iac
iacreference
signalMeasured
Univ. of Patras
DOS
nn
acoutinac jYX
Gjnnn
pp
acoutinac jYX
Gjppp
2/122 )()( inpinnoutpoutnac pnpnAi
inpinn
outpoutn
pn
pn
tan
nYY
The analysis have shown that
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
acaceGY
sin
pYY or
Y signal is related to the gap states with which the electrons and holes interact and contribute to Yn , Yp
nnnn YYYY 321
0.0 0.5 1.0 1.51011
1014
1017
1020
Etp
Etn E
ωn
EF
DO
S (e
V-1cm
-3)
Energy (eV)
ip
in
it pcnc
nnnn YYYY 321
ip
in
it pcnc
High Frequency (HF) regime Low Frequency (LF) regime
0.0 0.5 1.0 1.51011
1014
1017
1020
Etp
Eωn
Etn
EF
DO
S (e
V-1cm
-3)
Energy (eV)
Electrons the majority carriers n>>p
The states contributing Yn
In some cases Y2n + Y3n=0
and so Yn=Y1n
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Y1n>>Y2n + Y3n and so Yn=Y1n
Univ. of Patras
Trapping & detrapping
Deep trapping
electrons
holes electrons
holes
1011
1014
1017
1020
0.0 0.5 1.0 1.5
Etp
Eωp
Etn
EF
DO
S (e
V-1cm
-3)
Energy (eV)
pp YY 1
ip
in
it pcnc
ppppp YYYYY 1321
ip
in
it pcnc
High Frequency (HF) regime Low Frequency (LF) regime
Holes the minority carriers
The states contributing Yp
Y1p>>Y2p+Y3p and so Yp=Y1p
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
1011
1014
1017
1020
0.0 0.5 1.0 1.5
Etp E
tnEωp E
F
DO
S (e
V-1cm
-3)
Energy (eV)
Univ. of Patras
holes
holes
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
tpp EE 0.5 1.0 1.5
1016
1018
Eωp
Etp
Etn
Eωn
EF
DO
S (e
V-1cm
-3)
Energy (eV)
kTEDcHYY pvv
pvtpp )(),(
21
kTEDcHYY ncc
nctnn )(),(
21
2/12
0lnit
i kTE
ip
in
it pcnc
HF regime
ntn EE ip
in
it pcnc
LF regime
1)arctan(2
1),(
iti
tH
12
),( it
itH
n>>p
ntn EE ptp EE
=1/τωn
Effective trapping rate of holes
Effective trapping rate of electrons
=1/τωp
10-3 10-1 101 103 105
107
108
109ω
t
vω
t
c
LF HF
ω<<ωt
i ω>>ωt
i
1/τωp
1/τωn
1/τ
(s-1)
ω (rad/s)
Univ. of Patras
Yn=1/τωn Reflects the DOS of the CB side
Yp=1/τωp Reflects the DOS of the VB sideYn, Yp
do not reflect the DOS
The so-called H function
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
n>>pnp
Y
/1/1
Majority carriers (electrons) dominate
μpτωp<< μnτωn
μpτωp>> μnτωn
μpτωp= μnτωn
npY
/1/1
ωn/1/1
Y
p
Minority carriers (holes) dominate
Mixed contributionsFrom both carriers
How can we know whether the majority
carriers dominate
A DOS spectroscopy is impossible
A DOS spectroscopy can be achieved
?
DOS model
Comparable densities below and above EF
0.0 0.5 1.0 1.5
1017
1019
1021
E (eV)
Dv(E) Dc(E)E
F
DO
S (c
m-3 e
V-1)
EF is abοve midgap so that electrons the majority carriers
μp=μn
μp<<μn
μp>>μn
10-1 101 103 105
108
109
Y
1/τωp1/τ
ωn
μn=μ
p
ω (rad/s)
Y (
s-1)
10-2 100 102 104 106
107
108
109
Y
1/τωp
1/τωn
μn=10μ
p
Y (
s-1)
ω (rad/s)
10-1 101 103 105
108
109
Yμ
p=10μ
n
1/τωp
1/τωn
ω (rad/s)
Y (
s-1)
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
n>>p
Majority carriers (electrons) dominate Y signal
)arctan(2
1),(
HtH
tH
If the majority carriers dominate and Y signal follows 1/τωn
2/1),( ctH at ωt
Η=ωtc=ncn
c
This can be used to determine the
capture coefficient p
nHtc
n
ec
Bias light dependence
1),( ctH
kTEDcHY ncc
nct
n
)(),(2
1
kTEDcY ncc
n )(20
0),( YHY ct
),(0
HtH
Y
Y
Y moderate bias
0.1 1 10 1000.0
0.5
1.0
Y/Y0
Y
/Y0 (
r.u.
)
μnτ
ωn>>μ
pτ
ωp
H
ω/ωt
H (r.u.)
Y0 weak bias near dark equilibrium
Y follows 1/τωn
Two bias light levels
Normalized Y/Y0 spectrum
the normalized Y/Y0 ratio follows the universal H function
Univ. of Patras
Y signal drops by a factor of 2
…providing that the capture coefficient cnv of the states below EF for the
majority carriers is much lower than that cnc of the states above EF
1cn
vn
e c
cC
100 102 104
107
108
109
Y
Y0
2
1/τωn
ωt
c
ωt
H
μn=10μ
p
Y (
s-1)
ω (rad/s)
ct For
1cn
vn
e c
cC
1 10 1000.4
0.6
0.8
1.0
Y
/Y0 (
r.u.
)
μn=10μ
p
0.1 1 2
Ce
H
ω/ωt
H (r.u.)
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
For
The decay of Y signal in the LF regime is steeper than 1/τωn
10-1 101 103 105
107
108
109
0.1
1/τωn
Ce
12
μn=10μ
p
Y (
s-1)
ω (rad/s)
The normalized Y/Y0 spectrum is below the universal spectrum of
H function for Ce=cnv/cn
c≥1
nnYY
1
1
In general,
),(0
HtH
Y
Y
0.0 0.5 1.0 1.51011
1014
1017
1020
Etp
Eωn
Etn
EF
DO
S (e
V-1cm
-3)
Energy (eV)
nnn YYY 321
electrons holes
032 nn YYRecombination through thestates below EF increases
nnnnn YYYYY
1
1321 cn
vn cc 0.0 0.5 1.0 1.5
1017
1019
1021
E (eV)
Dv(E) Dc(E)E
F
DO
S (c
m-3 e
V-1)
cn
vn cc Majority carriers (electrons)
dominate Y signal, but Y<1/τωn
if Y differs from the 1/τωn the normalized Y/Y0 ratio does not follow the universal H function
because
μpτωp<< μnτωn
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Minority carriers(holes) dominate
Mixed contributions from electrons and holes
the normalized Y/Y0 ratio is above the universal H function for
Bias light dependence
),(0
HtH
Y
Y
),(0
HtH
Y
Y
μpτωp>> μnτωn
μpτωp= μnτωn
Majority carriers (electrons) do not dominate Y signal
Y does not follow 1/τωn
Univ. of Patras
μpτωp= μnτωn
μpτωp>> μnτωn
0YY
0YY
Ht For
Ht
0.1 1 10 1000.0
0.5
1.0
Y
/Y0 (
r.u.
)
H
ω/ωt
H (r.u.)
100 102 104
108
109
Y0
Y
2ω
t
H
μp=10μ
n
ω (rad/s)
Y (
s-1)
100 102 104 106
108Y
Y0
ωt
H
2
μn=μ
p
ω (rad/s)
Y (
s-1)
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
DOS spectroscopy
This formula can be used for a
DOS spectroscopy
& Y follows 1/τωn
The majority carriers (electrons) dominate
If the normalized Y/Y0 ratio follows H function
kTEDcHY ncc
nct
n
)(),(2
1
kTHe
YED
Ht
Ht
pn
c
),(
2)(
0.1 1 10 1000.0
0.5
1.0
Y/Y0
Y
/Y0 (
r.u.
)
μnτ
ωn>>μ
pτ
ωp
H
ω/ωt
H (r.u.)
100 102 104
107
108
109
Y
Y0
2
1/τωn
ωt
c
ωt
H
μn=10μ
p
Y (
s-1)
ω (rad/s)
2/1),( ctH
at ωtΗ=ωt
c=ncnc
the capture coefficient is obtained coefficient from
p
nHtc
n
ec
and Y signal drops by a factor of 2
1.0 1.1 1.2 1.3 1.4
1015
1016
introduced DOS
E (eV)
DO
S (c
m-3eV
-1)
Alternatively ωtc can be
obtained from the DOS in the frequency regime
at ωtL/4 =ωt
c/4
is the onset of LF regime (plateau)
10-1 101 103 105
1015
1016
LF regime
ωt
c
ωt
L
4
(b)introduced DOS
ω (rad/s)
DO
S (c
m-3eV
-1)
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Experimental spectra of a-As2Se3
the normalized Y/Y0 ratio follows the universal H function
The majority carriers (holes) dominate and Y signal follows 1/τωp
at ωtΗ=ωt
c=ncnc
p
Ht
p
vp ec
and Y signal drops by a factor of 2
2.8 Ǻ
101 102 103 104 105
108
109
1010
10-1 100 101 102
0.5
1.0
ω (rad/s)
Y0
Y
2ω
t
H
(a)
Y (
s-1)
H(b)
ω/ωt
H (r.u.)
Y
/Y0
(r.u
.)
101 103 105
1017
1018
1019
0.5 0.6 0.71017
1018
ωt
H
(a)
DO
S (
eV-1cm
-3)
ω (rad/s)
(b)
DO
S (
eV-1cm
-3)
Eω-E
V (eV)
kTHe
YED
Ht
Ht
pp
v
),(
2)(
Neutral centers
Exponential dependence
(valence band-tail)
DOS spectroscopy
Capture radius
Univ. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Various species of states
100 102 104 106
10-2
10-1
100
ω (rad/s)
2Y
0
ωt
H
(a)
Y (
r.u.
)
0.0 0.5 1.0 1.51014
1016
1018
1020
EF
Dc(E)Dv(E)
Energy (eV)
DO
S (
cm-3eV
-1)
0.0 0.5 1.0 1.51014
1016
1018
1020
EF
Dhc(E)
Dc(E)Dv(E)
Energy (eV)
DO
S (
cm-3eV
-1)
DOS model Experimental spectra of a-Si:HAdditional states
having a 100 times higher capture
coefficient
scme
cp
nHthc
n /10 36
cn
hcn cc 100
10-1 101 103 105 107106
107
108
109
ω (rad/s)
Dc(E)
Y (
s-1)
10-1 101 103 105 107106
107
108
109
ω (rad/s)
Dhc(E)Dc(E)
Y (
s-1)
10-1 101 103 105 107106
107
108
109ω
t
Hωt
hc
ω (rad/s)
Dhc(E)Dc(E)
Y (
s-1)
p
nHthc
n
ec
From the decay of Y signal by the
factor of 2ωt
H is determined
hcn
hct
Ht nc
hcn
hct
Ht ncFrom
kTEDcHY cccn
ct
nn)(),(
2
1
kTEDcH hchchcn
hct n
)(),(2
The highest capture coefficient
the experimental Y signal follows 1/τωn
kTHe
YED
Ht
Ht
pn
c
),(
2)(
cn
ct
Lt nc
at ωtL/4 =ωt
c/4
is the onset of LF (plateau)
p
nLtc
n
ec
scme
cp
nLtc
n /102 39
cn
ct
Lt nc
From
scmccn /102 39Normal db’s
scmchcn /10 36
db’s with a Si-H back bond
or a three center Si-H-Si bond
LF
HF
0.7 0.6 0.5 0.4 0.31015
1016
1017
Dhc(E)
Dlc(E)EFn
DO
S (
eV-1cm
-3)
EC-E (eV)
100 102 104 106
1015
1016
1017
ωt
H
ωt
L
Dhc(E)
DO
S (
eV-1cm
-3)
ω (rad/s)
Provides the DOS of both species of states
DOS spectroscopy
model
Dc(Eωn)
Dhc(Eωn)
Univ. of Patras
a-Si:H
1.0 1.2 1.4 1.61014
1016
1018
10-1 101 103 1051014
1015
1016
Dc(E)
Dhc(E)
170K
200K
250K300K
D
OS
(cm
-3eV
-1)
Energy (eV)
ωt
lc Dc(E)
Dhc(E)
300K
ωt
L
4
DO
S (c
m-3eV
-1)
ω (rad/s)
HF
LF
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
The states with the lowest capture coefficient
Vertical line the signature ofvarious species
of states
Various species of states
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
ppY
/1/1 Mixed
contributions from electrons and holes
reasonable for the the lightly p-type doped material
U. of Patras
Experimental spectra from the literature where the majority carriers do not dominate
from the MPC measurements of Kleider & Longeaud Sol. St. Phen.44&46 596 (1995)
The normalized Y/Y0 ratio does
not follow the universal H
function
kTEDcHY cccn
ct n
)(),(2
a-Si:H lightly p-type dopedfrom MPC measurements of
Bruggemann J Mat. Sc.14, 629 (2003)
μc-Si:H
Y does not follow 1/τωn
10-2 10-1 100 10110-2
10-1
100H
Y/Y
0 (r.
u.)
ω/ωt
H
The normalized Y/Y0 ratio at lowest ω does not follow the
universal H function
Y does not follow
1/τωn at lowest ω
Mixed contributions from electrons and
holes
103 104 105 106
100
101
102
103
ω (rad/s)
Y (
r. u
.)
103 104 105 106
100
101
102
103
ω (rad/s)
Y (
r. u
.)
103 104 105 106
100
101
102
103
ω (rad/s)
Y (
r. u
.)
A DOS spectroscopy is impossible
102 103 104 10510-1
100
2
ωt
H
Y
Y0
Y (
r.u.
)
ω (rad/s)102 103 104 10510-1
100
2
ωt
H
Y
Y0
Y (
r.u.
)
ω (rad/s)
10-1 100 101 1020.1
1
153 K 183 K
(b)
H
Y/Y
0 (r.
u.)
ω/ωt
H (r.u.)
Y signal exponential dependence
Bias light dependence
U. of Patras
Semic-LabSemiconductors Lab
Dep. of Eng. SciencesUniv. of Patras
Conclusions
the transport of the majority carriers dominates giving the highest mobility effective trapping time
Y signal follows the effective trapping rate of the majority carriers into the probed states.
A DOS spectroscopy using a general formula gives
If the Y signal deviates from the universal frequency dependence
of H function,
The applicability of our analysis was demonstrated
in a-As2Se3, undoped and lightly p-doped a-Si:H samples and μc-Si:H.
If Y signal follows the universal H function around each ωt
i.
The states with the highest capture coefficient
The states with the lowest capture coefficient
then there are possible contributions from both carriers.
HF
LF