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Materials Characterization
October 29, 2012
Graduate Center for Materials Research
$6.3M Renovation of Straumanis-James Hall Completed Spring 2012
Director
(Matt O’Keefe)
Administrative
Associate
(Patty Smith)
Sr. Secretary
(Sissy Edgar)
Sr. Clerk
(Sarah Henne)
Director
AMCL Labs
(Scott Miller)
Sr. Resrch Engr. Techn.
(Ron Haas)
Mechanic
Sr. Research Spclst.
(Eric Bohannan)
XRD/AFM/TGA
Electron Micr. Spclst
(Clarissa Wisner)
SEM
Sr. Research Spclst.
(vacant)
FIB/TEM
Sr. Electronic Techn.
(Brian Porter)
XPS
MRC Background •Annually >$5M shared credit expenditures, ~30 faculty, ~75 grad students, ~2000 samples run, ~30 external users
Majority of campus patents and royalty income • Maintains materials analytical equipment (AMCL)
Major Analytical Equipment
FIB SEM TEM
XRD XPS DTA/DSC
Helios Nanolab 600 Dual Beam FIB / HRSEM
Cross-sectional Analysis
5 µm
As-deposited Ce
O
Ga
Al
Cl
Pt
10 µm
(A) (B) (C)
With computer-controlled automatic milling, slicing and imaging, 3D
microstructure reconstruction can be generated by using the Helios.
3-Dimension sub-micron structure of shale gas rock Courtesy of Dr Baojun Bai and Malek Elgmati
3D Structure Reconstruction
Grain Orientation Mapping by EBSD
TEM Sample Preparation
TEM Chemical Composition of Multiple Layers on Steel Surface
Precipitates in Steel and Diffraction Analysis
Diffraction Analysis
Photo by Dr Kai Song
MC
M23C6
M3B2
Selected area diffraction analysis identifies three types of precipitates in a nickel-based superalloy
Thin Film Diffractometer Multi-Purpose Diffractometer (MPD)
X-Ray Diffraction
